Observed (points with error bars) and expected background (solid histograms) distributions for $E_{T}^{miss}$ in the signal region (a) SRL, (b) SRM and (c) SRH after the background-only fit applied to the CRs. The predicted signal distributions for the two models with a gluino mass of 2000 GeV and neutralino mass of 250 GeV (SRL), 1050 GeV (SRM) or 1950 GeV (SRH) are also shown for comparison. The uncertainties in the SM background are only statistical.

Observed and expected exclusion limit in the gluino-neutralino mass plane at 95% CL combined using the signal region with the best expected sensitivity at each point, for the full Run-2 dataset corresponding to an integrated luminosity of $139~\mathrm{fb}^{-1}$, for $\gamma/Z$ (a) and $\gamma/h$ (b) signal models. The black solid line corresponds to the expected limits at 95% CL, with the light (yellow) bands indicating the 1$\sigma$ exclusions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves, the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties. For each point in the higgsino-bino parameter space, the labels indicate the best-expected signal region, where L, M and H mean SRL, SRM and SRH, respectively.

Observed and expected exclusion limit in the gluino-neutralino mass plane at 95% CL combined using the signal region with the best expected sensitivity at each point, for the full Run-2 dataset corresponding to an integrated luminosity of $139~\mathrm{fb}^{-1}$, for $\gamma/Z$ (a) and $\gamma/h$ (b) signal models. The black solid line corresponds to the expected limits at 95% CL, with the light (yellow) bands indicating the 1$\sigma$ exclusions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves, the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties. For each point in the higgsino-bino parameter space, the labels indicate the best-expected signal region, where L, M and H mean SRL, SRM and SRH, respectively.

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Cutflow for the SRL selection, for two relevant signal points for both $\gamma/Z$ and $\gamma/h$ models, where the gluinos have mass of 2000 GeV and the neutralinos have a mass of 250 GeV (10000 generated events). The numbers are normalized to a luminosity of 139 $fb^{-1}$.

Cutflow for the SRM selection, for two relevant signal points for both $\gamma/Z$ and $\gamma/h$ models, where the gluinos have mass of 2000 GeV and the neutralinos have a mass of 1050 GeV (10000 generated events). The numbers are normalized to a luminosity of 139 $fb^{-1}$.

Cutflow for the SRH selection, for two relevant signal points for both $\gamma/Z$ and $\gamma/h$ models, where the gluinos have mass of 2000 GeV and the neutralinos have a mass of 1950 GeV (10000 generated events). The numbers are normalized to a luminosity of 139 $fb^{-1}$.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

SM background observation/prediction in the WH signal region

SM background prediction vs. observation in the W signal region

SM background observation/prediction in the W signal region

SM background prediction vs. observation in the H signal region

SM background observation/prediction in the H signal region

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

The 95% CL observed upper limits on the production cross sections for $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^\mp_1$ assuming that each $\widetilde{\chi}^\pm_1$ decays to a W boson and $\widetilde{\chi}^0_1$

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

The 95% CL observed upper limits on the production cross sections for $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^0_2$ assuming that each $\widetilde{\chi}^\pm_1$ decays to a W boson and $\widetilde{\chi}^0_1$ and the $\widetilde{\chi}^0_2$ decays to a Z boson and $\widetilde{\chi}^0_1$

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

The 95% CL observed upper limits on the production cross sections for $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^0_2$ assuming that each $\widetilde{\chi}^\pm_1$ decays to a W boson and $\widetilde{\chi}^0_1$ and the $\widetilde{\chi}^0_2$ decays to a H boson and $\widetilde{\chi}^0_1$

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

The 95% CL observed upper limits on the production cross sections for mass-degenerate higgsino-like$\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^\mp_1$, $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^0_2$, $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^0_3$ and $\widetilde{\chi}^0_2$ $\widetilde{\chi}^0_3$ as functions of the NLSP and LSP masses.

Efficiency of bb-tagger for H(bb), Z(bb) and Z(cc) decays.

Efficiency of W- and V-tagger for W(qq) and Z(qq) decays.

Acceptance times efficiency values with statistical uncertainties for TChiWW in the b-Veto region.

Acceptance times efficiency values with statistical uncertainties for TChiWZ in the b-Veto region.

Acceptance times efficiency values with statistical uncertainties for TChiWH in the b-Veto region.

Acceptance times efficiency values with statistical uncertainties for TChiHZ in the b-Veto region.

Acceptance times efficiency values with statistical uncertainties for TChiWW in the WHSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWW in the WSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWW in the HSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWZ in the WHSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWZ in the WSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWZ in the HSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWH in the WHSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWH in the WSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWH in the HSR region.

Acceptance times efficiency values with uncertainties for TChiHZ in the WHSR region.

Acceptance times efficiency values with uncertainties for TChiHZ in the WSR region.

Acceptance times efficiency values with statistical uncertainties for TChiHZ in the HSR region.

Covariance matrix for the signal regions, derived from a fit to the control regions only under the background-only hypothesis.

Correlation matrix for the signal regions, derived from a fit to the control regions only under the background-only hypothesis.

The observed mass distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

List of expected and observed events, $p_{0}$-value and the corresponding $Z$ local significance, as well as the 95% CLs upper limit of the expected and observed signal events ($S^{95}_ ext{exp} and $S^{95}_ ext{obs}$ ) in each mass window for SR-Inclusive bins of the short lifetime regime.

List of expected and observed events, $p_{0}$-value and the corresponding $Z$ local significance, as well as the 95% CLs upper limit of the expected and observed signal events ($S^{95}_ ext{exp} and $S^{95}_ ext{obs}$ ) in each mass window for SR-Inclusive bins of the long lifetime regime.

The observed $p_{\rm T$ distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $|\eta|$ distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $|\eta|$ distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Trk-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Mu-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Trk-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Mu-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Trk-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Mu-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Trk-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Mu-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Trk-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Mu-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Trk-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Mu-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Trk-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Mu-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Trk-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Mu-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Trk-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Mu-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Trk-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Mu-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Trk-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Mu-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Trk-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Mu-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Trk-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Mu-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Trk-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Mu-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Trk-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Mu-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

Expected and observed distributions in SR-Inclusive_Low of missing transverse momentum. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of missing transverse momentum. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of relative phi-angle between pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of relative phi-angle between pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the transverse mass of pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the transverse mass of pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the relative phi-angle between the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track, and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the relative phi-angle between the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track, and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the relative phi-angle between pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the relative phi-angle between pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the transverse mass of pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the transverse mass of pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the effective mass, defined as the scalar sum pT of the signal candidate track, jets satisfying pT > 30 GeV, excluding ones within deltaR < 0.4 with respect to the signal candidate track, and pTmiss. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the effective mass, defined as the scalar sum pT of the signal candidate track, jets satisfying pT > 30 GeV, excluding ones within deltaR < 0.4 with respect to the signal candidate track, and pTmiss. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

Muon reconstruction efficiency as a function of β and |η| for (a) stable charginos and (b) stable charged R-hadrons. For weakly interacting LLPs with calorimeter materials the efficiency for the chargino is recommended to refer to. The muon reconstruction efficiency for R-hadrons is significantly lower due to having QCD interactions with materials.

Muon reconstruction efficiency as a function of β and |η| for (a) stable charginos and (b) stable charged R-hadrons. For weakly interacting LLPs with calorimeter materials the efficiency for the chargino is recommended to refer to. The muon reconstruction efficiency for R-hadrons is significantly lower due to having QCD interactions with materials.

Trigger and event selection efficiencies. The band on the marker indicates a typical size of fluctuation by the LLP mass and lifetime observed by the samples used in efficiency derivation, but it does not indicate the full envelope of model dependence.

Trigger and event selection efficiencies. The band on the marker indicates a typical size of fluctuation by the LLP mass and lifetime observed by the samples used in efficiency derivation, but it does not indicate the full envelope of model dependence.

Signal track selection efficiency as a function of CLLP $\beta\gamma$ for SR-Inclusive_Low and SR-Inclusive_High bins. The band on the marker indicates a typical size of fluctuation by the LLP mass and lifetime observed by the samples used in efficiency derivation, but it does not indicate the full envelope of model dependence.

Signal selection efficiency by the mass window for SR-Inclusive_Low and SR-Inclusive_High bins.

Acceptance for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |\eta| < 1.8 and r_decay > 500 mm.

Acceptance for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |eta| < 1.8 and r_decay > 500 mm.

Acceptance for the chargino pair-production model for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |\eta| < 1.8 and r_decay > 500 mm.

Acceptance for the stau pair-production model for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |\eta| < 1.8 and r_decay > 500 mm.

Event-level efficiency for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Event-level efficiency for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Event-level efficiency for the chargino pair-production model for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Event-level efficiency for the stau pair-production model for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Efficiency of SR-Inclusive_Highfor the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Highfor the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Highfor the chargino pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Highfor the stau pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the chargino pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the stau pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Passing events in event selection steps for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes.

Passing events in event selection steps for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes.

Passing events in event selection steps for the chargino pair-production model for various masses and lifetimes.

Passing events in event selection steps for the stau pair-production model for various masses and lifetimes.

Expected $+ 1$ s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Expected - 1 s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Observed lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR1.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR2.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR3.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR5.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR6.

Measured inclusive fiducial $tt\gamma$ production cross section in the dilepton final state for the different dilepton-flavour channels and combined.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ .

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ . The values provided in the table are not divided by the bin width.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton measurement.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton and lepton+jets measurements combined.

One-dimensional 68 and 95% CL intervals obtained for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$, using the photon $p_{T}$ distribution from the dilepton analysis, or the combination of photon pT distributions from the dilepton and lepton+jets analyses.

Comparison of observed $95\%$ CL intervals for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$. Results are shown from a CMS ttZ measurement [JHEP 03 (2020) 056], from a CMS ttZ & tZq interpretation [arXiv:2107.13896], from a CMS ttG (lepton+jets) measurement [arXiv:2107.01508], from this measurement, and from a global fit by J. Ellis et al. [JHEP 04 (2021) 279].

Distribution of $m_{\mathrm{jjj}}$ for preselected events with $\mathrm{N}_{j}$ = 3

Distribution of $m_{\mathrm{j}}$ for preselected events with $\mathrm{N}_{j}$ = 3

Distribution of the deep-WH value of the highest-mass jet with 60 < $m_{\mathrm{j}}$ < 100 GeV for preselected events with $\mathrm{N}_{j}$ = 3

scale factors (SFs) for W, $t^{2}$, and q/g matched jets in the low-$m_{\mathrm{j}}$ and low-$p_{\mathrm{T}}$ (LL) bin, as functions of the deep-W discriminant value.

scale factors (SFs) for W, $t^{2}$, and q/g matched jets in the low-$m_{\mathrm{j}}$ and high-$p_{\mathrm{T}}$ (LH) bin, as functions of the deep-W discriminant value.

scale factors (SFs) for $t^{2}$, $t^{3,4}$, and q/g matched jets in the high-$m_{\mathrm{j}}$ and low-$p_{\mathrm{T}}$ (HL) bin, as functions of the deep-WH discriminant value.

scale factors (SFs) for $t^{2}$, $t^{3,4}$, and q/g matched jets in the high-$m_{\mathrm{j}}$ and high-$p_{\mathrm{T}}$ (HH) bin, as functions of the deep-WH discriminant value.

The deep-W discriminant of the jet with highest mass in the single-lepton sideband for LL samples.

The deep-W discriminant of the jet with highest mass in the single-lepton sideband for LH samples.

The deep-WH discriminant of the jet with highest mass in the single-lepton sideband for HL samples.

The deep-WH discriminant of the jet with highest mass in the single-lepton sideband for HH samples.

Comparison of the distribution of data and simulated backgrounds, as a function of the deep-W discriminant value for the highest-mass jet in CR1, after the scale factors have been applied.

Comparison of the distribution of data and simulated backgrounds, as a function of the deep-WH discriminant value for the highest-mass jet in CR2, after the scale factors have been applied.

Comparison of the distribution of data and simulated backgrounds, as a function of the deep-WH discriminant value for the highest-mass jet in CR3, after the scale factors have been applied.

Comparison of the distribution of data and simulated backgrounds, as a function of the deep-W discriminant value for the highest-mass jet in CR45, after the scale factors have been applied.

Comparison of the distribution of data and simulated backgrounds, as a function of the deep-W discriminant value for the highest-mass jet in CR6, after the scale factors have been applied.

The $m_{\mathrm{j}^{\mathrm{max}}}$ distributions for different jet types for SR1–3 events of the signal with $m_{\mathrm{W}_{\mathrm{KK}}}$ = 2.5 TeV, $m_{\mathrm{R}}$ = 0.2 TeV$ without deep-W (WH) constraints.

The deep-W distribution normalized to unity for the shown components of of the signal with $m_{\mathrm{W}_{\mathrm{KK}}}$ = 2.5 TeV, $m_{\mathrm{R}}$ = 0.2 TeV. The $t^{3,4}$ jets from the preselected sample, normalized to unity, are superimposed to compare shapes with the $R^{3q}$ and $R^{4q}$ distributions.

The deep-WH distribution normalized to unity for the shown components of of the signal with $m_{\mathrm{W}_{\mathrm{KK}}}$ = 2.5 TeV, $m_{\mathrm{R}}$ = 0.2 TeV. The $t^{3,4}$ jets from the preselected sample, normalized to unity, are superimposed to compare shapes with the $R^{3q}$ and $R^{4q}$ distributions.

The $m_{\mathrm{jj}}$ distribution for CR1 for data and simulation.

The $m_{\mathrm{jj}}$ distribution for CR2 for data and simulation.

The $m_{\mathrm{jj}}$ distribution for CR3 for data and simulation.

The $m_{\mathrm{jjj}}$ distribution for CR45 for data and simulation.

The $m_{\mathrm{jjj}}$ distribution for CR6 for data and simulation.

Post-fit distributions of the reconstructed triboson system ($m_{\mathrm{jj}}$) in data and simulation for SR1.

Post-fit distributions of the reconstructed triboson system ($m_{\mathrm{jj}}$) in data and simulation for SR2.

Post-fit distributions of the reconstructed triboson system ($m_{\mathrm{jj}}$) in data and simulation for SR3.

Post-fit distributions of the reconstructed triboson system ($m_{\mathrm{jjj}}$) in data and simulation for SR4.

Post-fit distributions of the reconstructed triboson system ($m_{\mathrm{jjj}}$) in data and simulation for SR5.

Post-fit distributions of the reconstructed triboson system ($m_{\mathrm{jjj}}$) in data and simulation for SR6.

Observed upper limits at $95\%$ CL on the signal cross section $\times$ branching fraction as functions of the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ resonance masses.

Expected median lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane.

Expected $+ 1$ s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane.

Expected - 1 s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane.

Observed lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane.

The $1\sigma_{\text{exp}}$ variation of the expected exclusion contour at 95% CL as a function of the smuon and neutralino masses, for $\lambda_{231}^{'}=1.0$.

The observed exclusion contour at 95% CL as a function of the smuon and neutralino masses, for $\lambda_{231}^{'}=0.1$.

The expected exclusion contour at 95% CL as a function of the smuon and neutralino masses, for $\lambda_{231}^{'}=0.1$.

The observed exclusion contour at 95% CL as a function of the smuon and neutralino masses, for $\lambda_{231}^{'}=0.15$.

The expected exclusion contour at 95% CL as a function of the smuon and neutralino masses, for $\lambda_{231}^{'}=0.15$.

The observed exclusion contour at 95% CL as a function of the smuon and neutralino masses, for $\lambda_{231}^{'}=0.2$.

The expected exclusion contour at 95% CL as a function of the smuon and neutralino masses, for $\lambda_{231}^{'}=0.2$.

The observed exclusion contour at 95% CL as a function of the smuon and neutralino masses, for $\lambda_{231}^{'}=0.4$.

The expected exclusion contour at 95% CL as a function of the smuon and neutralino masses, for $\lambda_{231}^{'}=0.4$.

The observed exclusion contour at 95% CL as a function of the smuon and neutralino masses, for $\lambda_{231}^{'}=0.6$.

The expected exclusion contour at 95% CL as a function of the smuon and neutralino masses, for $\lambda_{231}^{'}=0p6$.

The observed exclusion contour at 95% CL as a function of the smuon and neutralino masses, for $\lambda_{231}^{'}=1.5$.

The expected exclusion contour at 95% CL as a function of the smuon and neutralino masses, for $\lambda_{231}^{'}=1.5$.

The observed exclusion contour at 95% CL as a function of the leptoquark mass and coupling strength.

The expected exclusion contour at 95% CL as a function of the leptoquark mass and coupling strength.

The minus $1\sigma_{\text{theory}}$ variation of the observed exclusion contour at 95% CL as a function of the leptoquark mass and coupling strength.

The plus $1\sigma_{\text{theory}}$ variation of the observed exclusion contour at 95% CL as a function of the leptoquark mass and coupling strength.

The $1\sigma_{\text{exp}}$ variation of the expected exclusion contour at 95% CL as a function of the leptoquark mass and coupling strength.

Observed yields, and fake lepton background yields in the $e^{+}\mu^{-}$ and $e^{-}\mu^{+}$ channels of SR-MET, along with the results of the $e^{+}\mu^{-}/e^{-}\mu^{+}$ ratio measurement and 1-sided p-value in SR-MET, binned in $M_{T2}$.

Observed yields, and fake lepton background yields in the $e^{+}\mu^{-}$ and $e^{-}\mu^{+}$ channels of SR-JET, along with the results of the $e^{+}\mu^{-}/e^{-}\mu^{+}$ ratio measurement and 1-sided p-value in SR-JET, binned in $H_{\text{P}}$.

Observed and expected 95% CL upper limits on the total number of signal events entering the $e^{+}\mu^{-}$ and $e^{-}\mu^{+}$ channels of each bin of SR-MET. The regions are binned in the same way as the ratio $\rho$ measurement. The limits are shown for a selection of 'z' values, where 'z' is the fraction of the total signal events entering the $e^{+}\mu^{-}$ channel.

Observed and expected 95% CL upper limits on the total number of signal events entering the $e^{+}\mu^{-}$ and $e^{-}\mu^{+}$ channels of each bin of SR-JET. The regions are binned in the same way as the ratio $\rho$ measurement. The limits are shown for a selection of 'z' values, where 'z' is the fraction of the total signal events entering the $e^{+}\mu^{-}$ channel.

Signal yields following each cut in the analysis, for representative $R$-parity-violating supersymmetry and leptoquark signals. All yields are MC generator-weighted and normalised to $139~\text{fb}^{-1}$. The cut labelled `Preselection' includes trigger requirements, and requires exactly one Baseline electron and one Baseline muon. At this point, the muon charge-bias correction weights are also applied. The $R$-parity-violating supersymmetry models were generated by specifying a top-quark in the final state and applying a two-lepton filter, hence the first row also includes events where the top quark decays to an electron.

Expected +- 1 sigma 95% CL exclusion limit for the Zprime-2HDM model.

Expected +- 2 sigma 95% CL exclusion limit for the Zprime-2HDM model.

Observed 95% CL exclusion limit for the 2HDM+a model ggF production.

Expected 95% CL exclusion limit for the 2HDM+a model ggF production.

Expected +- 1 sigma 95% CL exclusion limit for the 2HDM+a model ggF production.

Expected +- 2 sigma 95% CL exclusion limit for the 2HDM+a model ggF production.

Observed 95% CL exclusion limit for the 2HDM+a model bbA production.

Expected 95% CL exclusion limit for the 2HDM+a model bbA production.

Expected +- 1 sigma 95% CL exclusion limit for the 2HDM+a model bbA production.

Expected +- 2 sigma 95% CL exclusion limit for the 2HDM+a model bbA production.

Observed 95% CL exclusion limit for the Zprime-2HDM model with the benchmark used in arXiv:1707.01302.

Expected 95% CL exclusion limit for the Zprime-2HDM model with the benchmark used in arXiv:1707.01302.

Expected +- 1 sigma 95% CL exclusion limit for the Zprime-2HDM model with the benchmark used in arXiv:1707.01302.

Expected +- 2 sigma 95% CL exclusion limit for the Zprime-2HDM model with the benchmark used in arXiv:1707.01302.

Expected and observed upper limits at 95% CL on cross-section for Zprime-2HDM model.

Expected and observed upper limits at 95% CL on cross-section for ggF producton in the 2HDM+a model.

Expected and observed upper limits at 95% CL on cross-section for bbA producton in the 2HDM+a model.

Model-independent upper limits on the visible cross-section $σ_{vis, $h(\bar{b})+DM} ≡ σ_{h+DM} \times B(h \to b\bar{b}) \times \mathcal{A} \times \epsilon$ in the different signal regions.

Theory cross-section for Zprime-2HDM model.

Theory cross-section for bbA production in the 2HDM+a model.

Theory cross-section for ggF production in the 2HDM+a model.

Distribution of Higgs boson candidate mass in 2b region with MET=150-200 GeV.

Distribution of Higgs boson candidate mass in 2b region with MET=200-350 GeV.

Distribution of Higgs boson candidate mass in 2b region with MET=350-500 GeV.

Distribution of Higgs boson candidate mass in 2b region with MET=500-750 GeV.

Distribution of Higgs boson candidate mass in 2b region with MET > 750 GeV.

Distribution of Higgs boson candidate mass in 3b region with MET=150-200 GeV.

Distribution of Higgs boson candidate mass in 3b region with MET=200-350 GeV.

Distribution of Higgs boson candidate mass in 3b region with MET=350-500 GeV.

Distribution of Higgs boson candidate mass in 3b region with MET > 500 GeV.

Yields in 1-lepton control region.

Yields in 2-lepton control region.

MET distribution in 2b region of the 0-lepton channel.

MET distribution in 3b region of the 0-lepton channel.

Expected signal yields after certain selection cuts in 2b region with MET=150-200 GeV.

Expected signal yields after certain selection cuts in 2b region with MET=200-350 GeV.

Expected signal yields after certain selection cuts in 2b region with MET=350-500 GeV.

Expected signal yields after certain selection cuts in 2b region with MET=500-750 GeV.

Expected signal yields after certain selection cuts in 2b region with MET > 750 GeV.

Expected signal yields after certain selection cuts in 3b region with MET=150-200 GeV.

Expected signal yields after certain selection cuts in 3b region with MET=200-350 GeV.

Expected signal yields after certain selection cuts in 3b region with MET=350-500 GeV.

Expected signal yields after certain selection cuts in 3b region with MET > 500 GeV.

Acceptance times efficiency for bbA production in the 2HDM+a model - 2b region with MET=150-200 GeV.

Acceptance times efficiency for bbA production in the 2HDM+a model - 2b region with MET=200-350 GeV.

Acceptance times efficiency for bbA production in the 2HDM+a model - 2b region with MET=350-500 GeV.

Acceptance times efficiency for bbA production in the 2HDM+a model - 2b region with MET=500-750 GeV.

Acceptance times efficiency for bbA production in the 2HDM+a model - 2b region with MET > 750 GeV.

Acceptance times efficiency for bbA production in the 2HDM+a model - 3b region with MET=150-200 GeV.

Acceptance times efficiency for bbA production in the 2HDM+a model - 3b region with MET=200-350 GeV.

Acceptance times efficiency for bbA production in the 2HDM+a model - 3b region with MET=350-500 GeV.

Acceptance times efficiency for bbA production in the 2HDM+a model - 3b region with MET>500 GeV.

Acceptance times efficiency for ggF production in the 2HDM+a model - 2b region with MET=150-200 GeV.

Acceptance times efficiency for ggF production in the 2HDM+a model - 2b region with MET=200-350 GeV.

Acceptance times efficiency for ggF production in the 2HDM+a model - 2b region with MET=350-500 GeV.

Acceptance times efficiency for ggF production in the 2HDM+a model - 2b region with MET=500-750 GeV.

Acceptance times efficiency for ggF production in the 2HDM+a model - 2b region with MET > 750 GeV.

Acceptance times efficiency for ggF production in the 2HDM+a model - 3b region with MET=150-200 GeV.

Acceptance times efficiency for ggF production in the 2HDM+a model - 3b region with MET=200-350 GeV.

Acceptance times efficiency for ggF production in the 2HDM+a model - 3b region with MET=350-500 GeV.

Acceptance times efficiency for ggF production in the 2HDM+a model - 3b region with MET > 500 GeV.

Acceptance times efficiency for ggF production in the Zprime-2HDM model - 2b region with MET=150-200 GeV.

Acceptance times efficiency for ggF production in the Zprime-2HDM model - 2b region with MET=200-350 GeV.

Acceptance times efficiency for ggF production in the Zprime-2HDM model - 2b region with MET=350-500 GeV.

Acceptance times efficiency for ggF production in the Zprime-2HDM model - 2b region with MET=500-750 GeV.

Acceptance times efficiency for ggF production in the Zprime-2HDM model - 2b region with MET > 750 GeV.

Acceptance times efficiency for ggF production in the Zprime-2HDM model - 3b region with MET=150-200 GeV.

Acceptance times efficiency for ggF production in the Zprime-2HDM model - 3b region with MET=200-350 GeV.

Acceptance times efficiency for ggF production in the Zprime-2HDM model - 3b region with MET=350-500 GeV.

Acceptance times efficiency for ggF production in the Zprime-2HDM model - 3b region with MET > 500 GeV.

Distributions of $s_{\text{T}}$ in the single-tau one-bin SR. The stacked histograms show the various SM background contributions. The hatched band indicates the total statistical and systematic uncertainty of the SM background. The $t\bar{t}$ (2 real $\tau$) and $t\bar{t}$ (1 real $\tau$) as well as the single-top background contributions are scaled with the normalization factors obtained from the background-only fit. Minor backgrounds are grouped together and denoted as 'Other'. This includes $t\bar{t}$-fake, single top, and other top (di-tau channel) or $t\bar{t}$-fake, $t\bar{t}+H$, multiboson, and other top (single-tau channel). The overlaid dotted lines show the additional contributions for signal scenarios close to the expected exclusion contour with the particle type and the mass and $\beta$ parameters for the simplified models indicated in the legend. For the leptoquark signal model the shapes of the distributions for $\text{LQ}_{3}^{\text{d}}$ and $\text{LQ}_{3}^{\text{v}}$ (not shown) are similar to that of $\text{LQ}_{3}^{\text{u}}$. The rightmost bin includes the overflow.

Distributions of $m_{\text{T}}(\tau)$ in the single-tau one-bin SR. The stacked histograms show the various SM background contributions. The hatched band indicates the total statistical and systematic uncertainty of the SM background. The $t\bar{t}$ (2 real $\tau$) and $t\bar{t}$ (1 real $\tau$) as well as the single-top background contributions are scaled with the normalization factors obtained from the background-only fit. Minor backgrounds are grouped together and denoted as 'Other'. This includes $t\bar{t}$-fake, single top, and other top (di-tau channel) or $t\bar{t}$-fake, $t\bar{t}+H$, multiboson, and other top (single-tau channel). The overlaid dotted lines show the additional contributions for signal scenarios close to the expected exclusion contour with the particle type and the mass and $\beta$ parameters for the simplified models indicated in the legend. For the leptoquark signal model the shapes of the distributions for $\text{LQ}_{3}^{\text{d}}$ and $\text{LQ}_{3}^{\text{v}}$ (not shown) are similar to that of $\text{LQ}_{3}^{\text{u}}$. The rightmost bin includes the overflow.

Distributions of $\Sigma m_{\text{T}}(b_{1,2})$ in the single-tau $p_{\text{T}}(\tau)$-binned SR. The stacked histograms show the various SM background contributions. The hatched band indicates the total statistical and systematic uncertainty of the SM background. The $t\bar{t}$ (2 real $\tau$) and $t\bar{t}$ (1 real $\tau$) as well as the single-top background contributions are scaled with the normalization factors obtained from the background-only fit. Minor backgrounds are grouped together and denoted as 'Other'. This includes $t\bar{t}$-fake, single top, and other top (di-tau channel) or $t\bar{t}$-fake, $t\bar{t}+H$, multiboson, and other top (single-tau channel). The overlaid dotted lines show the additional contributions for signal scenarios close to the expected exclusion contour with the particle type and the mass and $\beta$ parameters for the simplified models indicated in the legend. For the leptoquark signal model the shapes of the distributions for $\text{LQ}_{3}^{\text{d}}$ and $\text{LQ}_{3}^{\text{v}}$ (not shown) are similar to that of $\text{LQ}_{3}^{\text{u}}$. The rightmost bin includes the overflow.

Distributions of $p_{\text{T}}(\tau)$ in the single-tau $p_{\text{T}}(\tau)$-binned SR. The stacked histograms show the various SM background contributions. The hatched band indicates the total statistical and systematic uncertainty of the SM background. The $t\bar{t}$ (2 real $\tau$) and $t\bar{t}$ (1 real $\tau$) as well as the single-top background contributions are scaled with the normalization factors obtained from the background-only fit. Minor backgrounds are grouped together and denoted as 'Other'. This includes $t\bar{t}$-fake, single top, and other top (di-tau channel) or $t\bar{t}$-fake, $t\bar{t}+H$, multiboson, and other top (single-tau channel). The overlaid dotted lines show the additional contributions for signal scenarios close to the expected exclusion contour with the particle type and the mass and $\beta$ parameters for the simplified models indicated in the legend. For the leptoquark signal model the shapes of the distributions for $\text{LQ}_{3}^{\text{d}}$ and $\text{LQ}_{3}^{\text{v}}$ (not shown) are similar to that of $\text{LQ}_{3}^{\text{u}}$. The rightmost bin includes the overflow.

Observed event yields in data ('Observed') and expected event yields for SM background processes obtained from the background-only fit ('Total bkg.' and rows below) in the signal regions of the di-tau and single-tau channels. The quoted uncertainties include both the statistical and systematic uncertainties and are truncated at zero yield. By construction, no $t\bar{t}$ (2 real $\tau$) events can pass the selections in the single-tau channel. As the individual uncertainties are correlated, they do not add in quadrature to equal the total background uncertainty.

From left to right: upper limits at the 95% confidence level (CL) on the visible cross section ($\sigma_\text{vis}$) and on the number of signal events ($S_{\text{obs}}^{95}$). The third column ($S_{\text{exp}}^{95}$) shows the upper limit at the 95% CL on the number of signal events, given the expected number (and $\pm 1\,\sigma$ excursions on the expectation) of background events. The last two columns indicate the confidence level observed for the background-only hypothesis ($\text{CL}_{b}$), the discovery $p$-value ($p(s=0)$) and the significance ($Z$). In the di-tau SR, where fewer events are observed than predicted by the fitted background estimate, the $p$-value is capped at 0.5.

Expected and observed exclusion contours at the 95% confidence level for the vector third-generation leptoquark signal model, as a function of the mass $m(\text{LQ}_{3}^{\text{v}})$ and the branching fraction $B(\text{LQ}_{3}^{\text{v}} \rightarrow b\tau)$ into a quark and a charged lepton. The plot shows the exclusion contour for the minimal-coupling scenario. The limits are derived from the binned single-tau signal region.

Expected and observed exclusion contours at the 95% confidence level for the vector third-generation leptoquark signal model, as a function of the mass $m(\text{LQ}_{3}^{\text{v}})$ and the branching fraction $B(\text{LQ}_{3}^{\text{v}} \rightarrow b\tau)$ into a quark and a charged lepton. The plot shows the exclusion contour for the minimal-coupling scenario. The limits are derived from the binned single-tau signal region.

Expected and observed exclusion contours at the 95% confidence level for the vector third-generation leptoquark signal model, as a function of the mass $m(\text{LQ}_{3}^{\text{v}})$ and the branching fraction $B(\text{LQ}_{3}^{\text{v}} \rightarrow b\tau)$ into a quark and a charged lepton. The plot shows the exclusion contour for vector leptoquarks with additional gauge couplings. The limits are derived from the binned single-tau signal region.

Expected and observed exclusion contours at the 95% confidence level for the vector third-generation leptoquark signal model, as a function of the mass $m(\text{LQ}_{3}^{\text{v}})$ and the branching fraction $B(\text{LQ}_{3}^{\text{v}} \rightarrow b\tau)$ into a quark and a charged lepton. The plot shows the exclusion contour for vector leptoquarks with additional gauge couplings. The limits are derived from the binned single-tau signal region.

Exclusion contours at the 95% confidence level for the stop-stau signal model as a function of the masses of the top squark $m(\tilde{t}_{1})$ and of the tau slepton $m(\tilde{\tau}_{1})$. Expected and observed limits are shown for the present search in comparison to observed limits from previous ATLAS analyses based on data from Run-1 of the LHC at $\sqrt{s} = 8$ TeV [Eur. Phys. J. C 76 (2016)] and on a partial dataset from Run 2 at $\sqrt{s} = 13$ TeV [Phys. Rev. D 98 (2018) 032008]. The green band indicates the limit on the mass of the tau slepton (for a massless LSP) from the LEP experiments.

Exclusion contours at the 95% confidence level for the stop-stau signal model as a function of the masses of the top squark $m(\tilde{t}_{1})$ and of the tau slepton $m(\tilde{\tau}_{1})$. Expected and observed limits are shown for the present search in comparison to observed limits from previous ATLAS analyses based on data from Run-1 of the LHC at $\sqrt{s} = 8$ TeV [Eur. Phys. J. C 76 (2016)] and on a partial dataset from Run 2 at $\sqrt{s} = 13$ TeV [Phys. Rev. D 98 (2018) 032008]. The green band indicates the limit on the mass of the tau slepton (for a massless LSP) from the LEP experiments.

Expected and observed exclusion contours at the 95% confidence level for the scalar third-generation leptoquark signal model, as a function of the mass $m(\text{LQ}_{3}^{\text{u}})$ and the branching fraction $B(\text{LQ}_{3}^{\text{u}} \rightarrow q\ell)$ into a quark and a charged lepton. The plot shows the exclusion contour for up-type leptoquarks $\text{LQ}_{3}^{\text{u}})$ with charge $+2/3e$. The limits are derived from the binned single-tau signal region. Shown in gray for comparison are the observed exclusion-limit contours from the previous ATLAS publication that targets the same leptoquark models but is based on a subset of the Run-2 data [JHEP 06 (2019) 144]. In this previous publication five different analyses are considered that target not only the final state studied here but also the final states that correspond to a branching fraction $B(\text{LQ}_{3}^{\text{u}} \rightarrow q\ell)$ of 0 or 1, leading to the concave shapes of the gray exclusion contours.

Expected and observed exclusion contours at the 95% confidence level for the scalar third-generation leptoquark signal model, as a function of the mass $m(\text{LQ}_{3}^{\text{u}})$ and the branching fraction $B(\text{LQ}_{3}^{\text{u}} \rightarrow q\ell)$ into a quark and a charged lepton. The plot shows the exclusion contour for up-type leptoquarks $\text{LQ}_{3}^{\text{u}})$ with charge $+2/3e$. The limits are derived from the binned single-tau signal region. Shown in gray for comparison are the observed exclusion-limit contours from the previous ATLAS publication that targets the same leptoquark models but is based on a subset of the Run-2 data [JHEP 06 (2019) 144]. In this previous publication five different analyses are considered that target not only the final state studied here but also the final states that correspond to a branching fraction $B(\text{LQ}_{3}^{\text{u}} \rightarrow q\ell)$ of 0 or 1, leading to the concave shapes of the gray exclusion contours.

Expected and observed exclusion contours at the 95% confidence level for the scalar third-generation leptoquark signal model, as a function of the mass $m(\text{LQ}_{3}^{\text{d}})$ and the branching fraction $B(\text{LQ}_{3}^{\text{d}} \rightarrow q\ell)$ into a quark and a charged lepton. The plot shows the exclusion contour for down-type leptoquarks $\text{LQ}_{3}^{\text{d}})$ with charge $-1/3e$. The limits are derived from the binned single-tau signal region. Shown in gray for comparison are the observed exclusion-limit contours from the previous ATLAS publication that targets the same leptoquark models but is based on a subset of the Run-2 data [JHEP 06 (2019) 144]. In this previous publication five different analyses are considered that target not only the final state studied here but also the final states that correspond to a branching fraction $B(\text{LQ}_{3}^{\text{d}} \rightarrow q\ell)$ of 0 or 1, leading to the concave shapes of the gray exclusion contours.

Expected and observed exclusion contours at the 95% confidence level for the scalar third-generation leptoquark signal model, as a function of the mass $m(\text{LQ}_{3}^{\text{d}})$ and the branching fraction $B(\text{LQ}_{3}^{\text{d}} \rightarrow q\ell)$ into a quark and a charged lepton. The plot shows the exclusion contour for down-type leptoquarks $\text{LQ}_{3}^{\text{d}})$ with charge $-1/3e$. The limits are derived from the binned single-tau signal region. Shown in gray for comparison are the observed exclusion-limit contours from the previous ATLAS publication that targets the same leptoquark models but is based on a subset of the Run-2 data [JHEP 06 (2019) 144]. In this previous publication five different analyses are considered that target not only the final state studied here but also the final states that correspond to a branching fraction $B(\text{LQ}_{3}^{\text{d}} \rightarrow q\ell)$ of 0 or 1, leading to the concave shapes of the gray exclusion contours.

Upper limits on the signal cross section at the 95 % confidence level for the stop-stau signal model.

Upper limits on the signal cross section at the 95 % confidence level for the scalar third-generation leptoquark signal model with up-type leptoquarks.

Upper limits on the signal cross section at the 95 % confidence level for the scalar third-generation leptoquark signal model with down-type leptoquarks.

Upper limits on the signal cross section at the 95 % confidence level for the vector third-generation leptoquark signal model with minimal coupling (MC).

Upper limits on the signal cross section at the 95 % confidence level for the vector third-generation leptoquark signal model with additional gauge couplings (YM).

Acceptance of the one-bin signal region of the single-tau channel for pair production of up-type leptoquarks $\text{LQ}_{3}^{\text{u}}$.

Efficiency of the one-bin signal region of the single-tau channel for pair production of up-type leptoquarks $\text{LQ}_{3}^{\text{u}}$. The plot does not show efficiencies for a branching fraction $B(\text{LQ}_{3}^{\text{u}} \rightarrow b\tau)$ of 0 or 1 because here the acceptance at generator level becomes zero and the efficiency is thus undefined.

Acceptance of the first bin of the multi-bin signal region (50 GeV $< p_{\text{T}}(\tau) <$ 100 GeV) of the single-tau channel for pair production of up-type leptoquarks $\text{LQ}_{3}^{\text{u}}$.

Efficiency of the first bin of the multi-bin signal region (50 GeV $< p_{\text{T}}(\tau) <$ 100 GeV) of the single-tau channel for pair production of up-type leptoquarks $\text{LQ}_{3}^{\text{u}}$. The plot does not show efficiencies for a branching fraction $B(\text{LQ}_{3}^{\text{u}} \rightarrow b\tau)$ of 0 or 1 because here the acceptance at generator level becomes zero and the efficiency is thus undefined.

Acceptance of the middle bin of the multi-bin signal region (100 GeV $< p_{\text{T}}(\tau) <$ 200 GeV) of the single-tau channel for pair production of up-type leptoquarks $\text{LQ}_{3}^{\text{u}}$.

Efficiency of the middle bin of the multi-bin signal region (100 GeV $< p_{\text{T}}(\tau) <$ 200 GeV) of the single-tau channel for pair production of up-type leptoquarks $\text{LQ}_{3}^{\text{u}}$. The plot does not show efficiencies for a branching fraction $B(\text{LQ}_{3}^{\text{u}} \rightarrow b\tau)$ of 0 or 1 because here the acceptance at generator level becomes zero and the efficiency is thus undefined.

Acceptance of the last bin of the multi-bin signal region (200 GeV $< p_{\text{T}}(\tau)$) of the single-tau channel for pair production of up-type leptoquarks $\text{LQ}_{3}^{\text{u}}$.

Efficiency of the last bin of the multi-bin signal region (200 GeV $< p_{\text{T}}(\tau)$) of the single-tau channel for pair production of up-type leptoquarks $\text{LQ}_{3}^{\text{u}}$. The plot does not show efficiencies for a branching fraction $B(\text{LQ}_{3}^{\text{u}} \rightarrow b\tau)$ of 0 or 1 because here the acceptance at generator level becomes zero and the efficiency is thus undefined.

Acceptance of the signal region of the di-tau channel for pair production of up-type leptoquarks $\text{LQ}_{3}^{\text{u}}$.

Efficiency of the signal region of the di-tau channel for pair production of up-type leptoquarks $\text{LQ}_{3}^{\text{u}}$. The plot does not show efficiencies for a branching fraction $B(\text{LQ}_{3}^{\text{u}} \rightarrow b\tau)$ of 0 because here the acceptance at generator level becomes zero and the efficiency is thus undefined.

Acceptance of the one-bin signal region of the single-tau channel for pair production of down-type leptoquarks $\text{LQ}_{3}^{\text{d}}$.

Efficiency of the one-bin signal region of the single-tau channel for pair production of down-type leptoquarks $\text{LQ}_{3}^{\text{d}}$. The plot does not show efficiencies for a branching fraction $B(\text{LQ}_{3}^{\text{d}} \rightarrow t\tau)$ of 0 or 1 because here the acceptance at generator level becomes zero and the efficiency is thus undefined.

Acceptance of the first bin of the multi-bin signal region (50 GeV $< p_{\text{T}}(\tau) <$ 100 GeV) of the single-tau channel for pair production of down-type leptoquarks $\text{LQ}_{3}^{\text{d}}$.

Efficiency of the first bin of the multi-bin signal region (50 GeV $< p_{\text{T}}(\tau) <$ 100 GeV) of the single-tau channel for pair production of down-type leptoquarks $\text{LQ}_{3}^{\text{d}}$. The plot does not show efficiencies for a branching fraction $B(\text{LQ}_{3}^{\text{d}} \rightarrow t\tau)$ of 0 or 1 because here the acceptance at generator level becomes zero and the efficiency is thus undefined.

Acceptance of the middle bin of the multi-bin signal region (100 GeV $< p_{\text{T}}(\tau) <$ 200 GeV) of the single-tau channel for pair production of down-type leptoquarks $\text{LQ}_{3}^{\text{d}}$.

Efficiency of the middle bin of the multi-bin signal region (100 GeV $< p_{\text{T}}(\tau) <$ 200 GeV) of the single-tau channel for pair production of down-type leptoquarks $\text{LQ}_{3}^{\text{d}}$. The plot does not show efficiencies for a branching fraction $B(\text{LQ}_{3}^{\text{d}} \rightarrow t\tau)$ of 0 or 1 because here the acceptance at generator level becomes zero and the efficiency is thus undefined.

Acceptance of the last bin of the multi-bin signal region (200 GeV $< p_{\text{T}}(\tau)$) of the single-tau channel for pair production of down-type leptoquarks $\text{LQ}_{3}^{\text{d}}$.

Efficiency of the last bin of the multi-bin signal region (200 GeV $< p_{\text{T}}(\tau)$) of the single-tau channel for pair production of down-type leptoquarks $\text{LQ}_{3}^{\text{d}}$. The plot does not show efficiencies for a branching fraction $B(\text{LQ}_{3}^{\text{d}} \rightarrow t\tau)$ of 0 or 1 because here the acceptance at generator level becomes zero and the efficiency is thus undefined.

Acceptance of the signal region of the di-tau channel for pair production of down-type leptoquarks $\text{LQ}_{3}^{\text{d}}$.

Efficiency of the signal region of the di-tau channel for pair production of down-type leptoquarks $\text{LQ}_{3}^{\text{d}}$. The plot does not show efficiencies for a branching fraction $B(\text{LQ}_{3}^{\text{d}} \rightarrow t\tau)$ of 0 because here the acceptance at generator level becomes zero and the efficiency is thus undefined.

Acceptance of the one-bin signal region of the single-tau channel for pair production of vector leptoquarks $\text{LQ}_{3}^{\text{v}}$ in the minimal-coupling scenario.

Efficiency of the one-bin signal region of the single-tau channel for pair production of vector leptoquarks $\text{LQ}_{3}^{\text{v}}$ in the minimal-coupling scenario. The plot does not show efficiencies for a branching fraction $B(\text{LQ}_{3}^{\text{v}} \rightarrow b\tau)$ of 0 or 1 because here the acceptance at generator level becomes zero and the efficiency is thus undefined.

Acceptance of the first bin of the multi-bin signal region (50 GeV $< p_{\text{T}}(\tau) <$ 100 GeV) of the single-tau channel for pair production of vector leptoquarks $\text{LQ}_{3}^{\text{v}}$ in the minimal-coupling scenario.

Efficiency of the first bin of the multi-bin signal region (50 GeV $< p_{\text{T}}(\tau) <$ 100 GeV) of the single-tau channel for pair production of vector leptoquarks $\text{LQ}_{3}^{\text{v}}$ in the minimal-coupling scenario. The plot does not show efficiencies for a branching fraction $B(\text{LQ}_{3}^{\text{v}} \rightarrow b\tau)$ of 0 or 1 because here the acceptance at generator level becomes zero and the efficiency is thus undefined.

Acceptance of the middle bin of the multi-bin signal region (100 GeV $< p_{\text{T}}(\tau) <$ 200 GeV) of the single-tau channel for pair production of vector leptoquarks $\text{LQ}_{3}^{\text{v}}$ in the minimal-coupling scenario.

Efficiency of the middle bin of the multi-bin signal region (100 GeV $< p_{\text{T}}(\tau) <$ 200 GeV) of the single-tau channel for pair production of vector leptoquarks $\text{LQ}_{3}^{\text{v}}$ in the minimal-coupling scenario. The plot does not show efficiencies for a branching fraction $B(\text{LQ}_{3}^{\text{v}} \rightarrow b\tau)$ of 0 or 1 because here the acceptance at generator level becomes zero and the efficiency is thus undefined.

Acceptance of the last bin of the multi-bin signal region (200 GeV $< p_{\text{T}}(\tau)$) of the single-tau channel for pair production of vector leptoquarks $\text{LQ}_{3}^{\text{v}}$ in the minimal-coupling scenario.

Efficiency of the last bin of the multi-bin signal region (200 GeV $< p_{\text{T}}(\tau)$) of the single-tau channel for pair production of vector leptoquarks $\text{LQ}_{3}^{\text{v}}$ in the minimal-coupling scenario. The plot does not show efficiencies for a branching fraction $B(\text{LQ}_{3}^{\text{v}} \rightarrow b\tau)$ of 0 or 1 because here the acceptance at generator level becomes zero and the efficiency is thus undefined.

Acceptance of the signal region of the di-tau channel for pair production of vector leptoquarks $\text{LQ}_{3}^{\text{v}}$ in the minimal-coupling scenario.

Efficiency of the signal region of the di-tau channel for pair production of vector leptoquarks $\text{LQ}_{3}^{\text{v}}$ in the minimal-coupling scenario. The plot does not show efficiencies for a branching fraction $B(\text{LQ}_{3}^{\text{v}} \rightarrow b\tau)$ of 0 because here the acceptance at generator level becomes zero and the efficiency is thus undefined.

Acceptance of the one-bin signal region of the single-tau channel for pair production of vector leptoquarks $\text{LQ}_{3}^{\text{v}}$ with additional gauge couplings.

Efficiency of the one-bin signal region of the single-tau channel for pair production of vector leptoquarks $\text{LQ}_{3}^{\text{v}}$ with additional gauge couplings. The plot does not show efficiencies for a branching fraction $B(\text{LQ}_{3}^{\text{v}} \rightarrow b\tau)$ of 0 or 1 because here the acceptance at generator level becomes zero and the efficiency is thus undefined.

Acceptance of the first bin of the multi-bin signal region (50 GeV $< p_{\text{T}}(\tau) <$ 100 GeV) of the single-tau channel for pair production of vector leptoquarks $\text{LQ}_{3}^{\text{v}}$ with additional gauge couplings.

Efficiency of the first bin of the multi-bin signal region (50 GeV $< p_{\text{T}}(\tau) <$ 100 GeV) of the single-tau channel for pair production of vector leptoquarks $\text{LQ}_{3}^{\text{v}}$ with additional gauge couplings. The plot does not show efficiencies for a branching fraction $B(\text{LQ}_{3}^{\text{v}} \rightarrow b\tau)$ of 0 or 1 because here the acceptance at generator level becomes zero and the efficiency is thus undefined.

Acceptance of the middle bin of the multi-bin signal region (100 GeV $< p_{\text{T}}(\tau) <$ 200 GeV) of the single-tau channel for pair production of vector leptoquarks $\text{LQ}_{3}^{\text{v}}$ with additional gauge couplings.

Efficiency of the middle bin of the multi-bin signal region (100 GeV $< p_{\text{T}}(\tau) <$ 200 GeV) of the single-tau channel for pair production of vector leptoquarks $\text{LQ}_{3}^{\text{v}}$ with additional gauge couplings. The plot does not show efficiencies for a branching fraction $B(\text{LQ}_{3}^{\text{v}} \rightarrow b\tau)$ of 0 or 1 because here the acceptance at generator level becomes zero and the efficiency is thus undefined.

Acceptance of the last bin of the multi-bin signal region (200 GeV $< p_{\text{T}}(\tau)$) of the single-tau channel for pair production of vector leptoquarks $\text{LQ}_{3}^{\text{v}}$ with additional gauge couplings.

Efficiency of the last bin of the multi-bin signal region (200 GeV $< p_{\text{T}}(\tau)$) of the single-tau channel for pair production of vector leptoquarks $\text{LQ}_{3}^{\text{v}}$ with additional gauge couplings. The plot does not show efficiencies for a branching fraction $B(\text{LQ}_{3}^{\text{v}} \rightarrow b\tau)$ of 0 or 1 because here the acceptance at generator level becomes zero and the efficiency is thus undefined.

Acceptance of the signal region of the di-tau channel for pair production of vector leptoquarks $\text{LQ}_{3}^{\text{v}}$ with additional gauge couplings.

Efficiency of the signal region of the di-tau channel for pair production of vector leptoquarks $\text{LQ}_{3}^{\text{v}}$ with additional gauge couplings. The plot does not show efficiencies for a branching fraction $B(\text{LQ}_{3}^{\text{v}} \rightarrow b\tau)$ of 0 because here the acceptance at generator level becomes zero and the efficiency is thus undefined.

Acceptance of the one-bin signal region of the single-tau channel for pair production of top squarks with decays via tau sleptons.

Efficiency of the one-bin signal region of the single-tau channel for pair production of top squarks with decays via tau sleptons.

Acceptance of the first bin of the multi-bin signal region (50 GeV $< p_{\text{T}}(\tau) <$ 100 GeV) of the single-tau channel for pair production of top squarks with decays via tau sleptons.

Efficiency of the first bin of the multi-bin signal region (50 GeV $< p_{\text{T}}(\tau) <$ 100 GeV) of the single-tau channel for pair production of top squarks with decays via tau sleptons.

Acceptance of the middle bin of the multi-bin signal region (100 GeV $< p_{\text{T}}(\tau) <$ 200 GeV) of the single-tau channel for pair production of top squarks with decays via tau sleptons.

Efficiency of the middle bin of the multi-bin signal region (100 GeV $< p_{\text{T}}(\tau) <$ 200 GeV) of the single-tau channel for pair production of top squarks with decays via tau sleptons.

Acceptance of the last bin of the multi-bin signal region (200 GeV $< p_{\text{T}}(\tau)$) of the single-tau channel for pair production of top squarks with decays via tau sleptons.

Efficiency of the last bin of the multi-bin signal region (200 GeV $< p_{\text{T}}(\tau)$) of the single-tau channel for pair production of top squarks with decays via tau sleptons.

Acceptance of the signal region of the di-tau channel for pair production of top squarks with decays via tau sleptons.

Efficiency of the signal region of the di-tau channel for pair production of top squarks with decays via tau sleptons.

Cutflow for the benchmark signal model $m(\tilde{t}_{1}) = 1350$ GeV, $m(\tilde{\tau}_{1}) = 1090$ GeV for the di-tau SR. The simulated sample contains 30,000 raw MC events. Weighted event yields are reported, normalized to an integrated luminosity of 139 fb$^{-1}$. 'Preselection' refers to the preselection for the di-tau channel.

Cutflow for the benchmark signal model $m(\tilde{t}_{1}) = 1350$ GeV, $m(\tilde{\tau}_{1}) = 1090$ GeV for the single-tau one-bin SR. The simulated sample contains 30,000 raw MC events. Weighted event yields are reported, normalized to an integrated luminosity of 139 fb$^{-1}$. 'Preselection' refers to the preselection for the single-tau channel.

Cutflow for the benchmark signal model $m(\tilde{t}_{1}) = 1350$ GeV, $m(\tilde{\tau}_{1}) = 1090$ GeV for the single-tau multi-bin SR. The simulated sample contains 30,000 raw MC events. Weighted event yields are reported, normalized to an integrated luminosity of 139 fb$^{-1}$. 'Preselection' refers to the preselection for the single-tau channel.

Cutflow for the benchmark signal model $m(\text{LQ}_{3}^{\text{u}}) = 1.2$ TeV, $\beta = 0.5$ for the di-tau SR. The simulated sample contains 210,000 raw MC events. Weighted event yields are reported, normalized to an integrated luminosity of 139 fb$^{-1}$. 'Preselection' refers to the preselection for the di-tau channel.

Cutflow for the benchmark signal model $m(\text{LQ}_{3}^{\text{u}}) = 1.2$ TeV, $\beta = 0.5$ for the single-tau one-bin SR. The simulated sample contains 210,000 raw MC events. Weighted event yields are reported, normalized to an integrated luminosity of 139 fb$^{-1}$. 'Preselection' refers to the preselection for the single-tau channel.

Cutflow for the benchmark signal model $m(\text{LQ}_{3}^{\text{u}}) = 1.2$ TeV, $\beta = 0.5$ for the single-tau multi-bin SR. The simulated sample contains 210,000 raw MC events. Weighted event yields are reported, normalized to an integrated luminosity of 139 fb$^{-1}$. 'Preselection' refers to the preselection for the single-tau channel.

Cutflow for the benchmark signal model $m(\text{LQ}_{3}^{\text{d}}) = 1.2$ TeV, $\beta = 0.5$ for the di-tau SR. The simulated sample contains 210,000 raw MC events. Weighted event yields are reported, normalized to an integrated luminosity of 139 fb$^{-1}$. 'Preselection' refers to the preselection for the di-tau channel.

Cutflow for the benchmark signal model $m(\text{LQ}_{3}^{\text{d}}) = 1.2$ TeV, $\beta = 0.5$ for the single-tau one-bin SR. The simulated sample contains 210,000 raw MC events. Weighted event yields are reported, normalized to an integrated luminosity of 139 fb$^{-1}$. 'Preselection' refers to the preselection for the single-tau channel.

Cutflow for the benchmark signal model $m(\text{LQ}_{3}^{\text{d}}) = 1.2$ TeV, $\beta = 0.5$ for the single-tau multi-bin SR. The simulated sample contains 210,000 raw MC events. Weighted event yields are reported, normalized to an integrated luminosity of 139 fb$^{-1}$. 'Preselection' refers to the preselection for the single-tau channel.

Cutflow for the benchmark signal model $m(\text{LQ}_{3}^{\text{v}}) = 1.4$ TeV, $\beta = 0.5$ in the minimal-coupling scenario for the di-tau SR. The simulated sample contains 50,000 raw MC events. Weighted event yields are reported, normalized to an integrated luminosity of 139 fb$^{-1}$. 'Preselection' refers to the preselection for the di-tau channel.

Cutflow for the benchmark signal model $m(\text{LQ}_{3}^{\text{v}}) = 1.4$ TeV, $\beta = 0.5$ in the minimal-coupling scenario for the single-tau one-bin SR. The simulated sample contains 50,000 raw MC events. Weighted event yields are reported, normalized to an integrated luminosity of 139 fb$^{-1}$. 'Preselection' refers to the preselection for the single-tau channel.

Cutflow for the benchmark signal model $m(\text{LQ}_{3}^{\text{v}}) = 1.4$ TeV, $\beta = 0.5$ in the minimal-coupling scenario for the single-tau multi-bin SR. The simulated sample contains 50,000 raw MC events. Weighted event yields are reported, normalized to an integrated luminosity of 139 fb$^{-1}$. 'Preselection' refers to the preselection for the single-tau channel.

Cutflow for the benchmark signal model $m(\text{LQ}_{3}^{\text{v}}) = 1.4$ TeV, $\beta = 0.5$ in the Yang--Mills scenario for the di-tau SR. The simulated sample contains 50,000 raw MC events. Weighted event yields are reported, normalized to an integrated luminosity of 139 fb$^{-1}$. 'Preselection' refers to the preselection for the di-tau channel.

Cutflow for the benchmark signal model $m(\text{LQ}_{3}^{\text{v}}) = 1.4$ TeV, $\beta = 0.5$ in the Yang--Mills scenario for the single-tau one-bin SR. The simulated sample contains 50,000 raw MC events. Weighted event yields are reported, normalized to an integrated luminosity of 139 fb$^{-1}$. 'Preselection' refers to the preselection for the single-tau channel.

Cutflow for the benchmark signal model $m(\text{LQ}_{3}^{\text{v}}) = 1.4$ TeV, $\beta = 0.5$ in the Yang--Mills scenario for the single-tau multi-bin SR. The simulated sample contains 50,000 raw MC events. Weighted event yields are reported, normalized to an integrated luminosity of 139 fb$^{-1}$. 'Preselection' refers to the preselection for the single-tau channel.

Distribution of $m_{T}(W)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $M_{3}$ in the $N_{jet}\geq 3$ signal region.

Distribution of $M_{3}$ in the $N_{jet}\geq 3$ signal region.

Distribution of $m(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $m(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(j,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(j,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for electrons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for electrons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for muons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for muons.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the e channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the e channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the $\mu$ channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the $\mu$ channel.

Extracted scale factors for the contribution from misidentified electrons for the three data-taking periods, and the Z$\gamma$, W$\gamma$ simulations.

Extracted scale factors for the contribution from misidentified electrons for the three data-taking periods, and the Z$\gamma$, W$\gamma$ simulations.

Predicted and observed yields in the control regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the control regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the signal regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the signal regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

The measured inclusive ttgamma cross section in the fiducial phase space compared to the prediction from simulation using Madgraph_aMC@NLO at a center-of-mass energy of 13 TeV.

The measured inclusive ttgamma cross section in the fiducial phase space compared to the prediction from simulation using Madgraph_aMC@NLO at a center-of-mass energy of 13 TeV.

Summary of the measured cross section ratios with respect to the NLO cross section prediction for signal regions binned in the electron channel, muon channel and the combined single lepton measurement.

Summary of the measured cross section ratios with respect to the NLO cross section prediction for signal regions binned in the electron channel, muon channel and the combined single lepton measurement.

The unfolded differential cross sections for $p_{T}(\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $p_{T}(\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $|\eta(\gamma)|$ and the comparison to simulations.

The unfolded differential cross sections for $|\eta(\gamma)|$ and the comparison to simulations.

The unfolded differential cross sections for $\Delta R(l,\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $\Delta R(l,\gamma)$ and the comparison to simulations.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

Summary of the one-dimensional intervals at 68 and 95% CL.

Summary of the one-dimensional intervals at 68 and 95% CL.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the muon channel.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the two-dimensional scan for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the two-dimensional scan for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$.