Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> e+e- final state.

Measured fiducial cross section times leptonic branching ratio for W+ production in the W+ -> mu+ nu final state.

Measured fiducial cross section times leptonic branching ratio for W- production in the W- -> mu- nubar final state.

Measured fiducial cross section times leptonic branching ratio for W+/- production in the combined W+ -> mu+ nu and W- -> mu- nubar final state.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> e+ nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> e- nubar final state.

Measured total cross section times leptonic branching ratio for W+/- production in the combined W+ -> e+ nu and W- -> e- nubar final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> e+ e- final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> mu+ nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> mu- nubar final state.

Measured total cross section times leptonic branching ratio for W+/- production in the combined W+ -> mu+ nu and W- -> mu- nubar final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> l+ nu (l = e, mu) final states.

Measured total cross section times leptonic branching ratio for W- production in the W- -> l- nubar (l = e, mu) final states.

Measured total cross section times leptonic branching ratio for W+/- production in the combined W+ -> l+ nu and W- -> l- nubar (l = e, mu) final states.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the combined Z/gamma* -> l+ l- (l = e, mu) final states.

Measured total cross-section ratio R_{W+/Z} = sigma (W+ -> e+ nu) / sigma (Z/gamma^* -> e+ e-).

Measured total cross-section ratio R_{W-/Z} = sigma (W- -> e- nubar) / sigma (Z/gamma^* -> e+ e-).

Measured total cross-section ratio R_{W+-/Z} = sigma (W+/- -> e+/- nu/nubar) / sigma (Z/gamma^* -> e+ e-).

Measured total cross-section ratio R_{W+/Z} = sigma (W+ -> mu+ nu) / sigma (Z/gamma^* -> mu+ mu-).

Measured total cross-section ratio R_{W-/Z} = sigma (W- -> mu- nubar) / sigma (Z/gamma^* -> mu+ mu-).

Measured total cross-section ratio R_{W+-/Z} = sigma (W+/- -> mu+/- nu/nubar) / sigma (Z/gamma^* -> mu+ mu-).

Measured total cross-section ratio R_{W+/Z} = sigma (W+ -> l+ nu) / sigma (Z/gamma^* -> l+ l-) where (l = e, mu).

Measured total cross-section ratio R_{W-/Z} = sigma (W- -> l- nubar) / sigma (Z/gamma^* -> l+ l-) where (l = e, mu).

Measured total cross-section ratio R_{W+-/Z} = sigma (W+/- -> l+/- nu/nubar) / sigma (Z/gamma^* -> l+ l-) where (l = e, mu).

Measured lepton asymmetry from W+ -> e+ nu and W- -> e- nubar, binned as a function pseudorapidity.

Measured lepton asymmetry from W+ -> e+ nu and W- -> e- nubar.

Measured lepton asymmetry from W+ -> mu+ nu and W- -> mu- nubar, binned as a function pseudorapidity.

Measured lepton asymmetry from W+ -> mu+ nu and W- -> mu- nubar.

Measured lepton asymmetry from W+ -> l+ nu and W- -> l- nubar (l = e, mu), binned as a function pseudorapidity.

Measured lepton asymmetry from W+ -> l+ nu and W- -> l- nubar (l = e, mu).

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 30-45 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 45-60 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 60-120 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 120-200 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 200-1500 GeV, as measured in the combined dilepton channel.

Measured ratio of the Drell-Yan normalized differential cross sections at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel for the full phase space.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 20-30 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 30-45 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 45-60 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 60-120 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 120-200 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 200-1500 GeV.

Measured cross sections for Z0 production.

Ratios of W to Z cross sections.

Measured cross sections in the restricted fiducial and kinematic acceptance for W and Z production in the electron decay channel.

Measured cross sections in the restricted fiducial and kinematic acceptance for W production in the muon decay channel.

Measured cross sections in the restricted fiducial and kinematic acceptance for Z production in the muon decay channel.

Measured cross sections for Z0 production.

Ratios of W to Z cross sections.

Ratios of W+ to W- cross sections.

Measured cross sections in the restricted fiducial and kinematicacceptance for W and Z production in the electron decay channel.

Measured cross sections in the restricted fiducial and kinematicacceptance for W and Z production in the muon decay channel.

Z0 total and fiducial production cross sections times branching fractions.

W+ to W- ratios of total and fiducial production cross sections times branching fractions.

(W+ + W-) to Z0 ratios of total and fiducial production cross sections times branching fractions.

The DY pre-FSR cross section measurements for the combined dimuon and dielectron channels normalized to the Z-peak region in the full acceptance.

The DY dimuon rapidity spectrum within the detector acceptance, normalized to the Z-peak region, for the mass bin 20-30 GeV. The two columns correspond to pre-FSR and post-FSR. The uncertainties are the total experimental uncertainties.

The DY dimuon rapidity spectrum within the detector acceptance, normalized to the Z-peak region, for the mass bin 30-45 GeV. The two columns correspond to pre-FSR and post-FSR. The uncertainties are the total experimental uncertainties.

The DY dimuon rapidity spectrum within the detector acceptance, normalized to the Z-peak region, for the mass bin 45-60 GeV. The two columns correspond to pre-FSR and post-FSR. The uncertainties are the total experimental uncertainties.

The DY dimuon rapidity spectrum within the detector acceptance, normalized to the Z-peak region, for the mass bin 60-120 GeV. The two columns correspond to pre-FSR and post-FSR. The uncertainties are the total experimental uncertainties.

The DY dimuon rapidity spectrum within the detector acceptance, normalized to the Z-peak region, for the mass bin 120-200 GeV. The two columns correspond to pre-FSR and post-FSR. The uncertainties are the total experimental uncertainties.

The DY dimuon rapidity spectrum within the detector acceptance, normalized to the Z-peak region, for the mass bin 200-1500 GeV. The two columns correspond to pre-FSR and post-FSR. The uncertainties are the total experimental uncertainties.

Breakdown of systematic uncertainties in percent for the measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+mu- final state at 13TeV.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the combined Z/gamma* -> l+l- (l = e, mu) final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the combined Z/gamma* -> l+ l- (l = e, mu) final state.

Measured total cross-section for ttbar events using e-mu events with b-tagged jets.

Correlation coefficients amongst the combined (Z/gamma^* -> l+ l-) where (l = e, mu) fiducial cross section and ttbar total cross section at 13, 8, and 7TeV.

Correlation coefficients amongst the combined (Z/gamma^* -> l+ l-) where (l = e, mu) fiducial cross section and ttbar total cross section at 13, 8, and 7TeV, omitting the common normalisation uncertainty due to the luminosity calibration and beam energy.

Z-boson and ttbar production cross-section single ratios at 13, 8, 7TeV. The beam-energy uncertainty, which largely cancels in the ratios, is included in the systematic uncertainty. In the first column, the total (TOT) cross sections are used for both numerator and denominator. In the second column, the total cross section is used for the numerator while the fiducial (FID) cross section is used for the denominator. In the third column, the fiducial cross sections are used for both numerator and denominator. Apart for the MZ requirement, the kinematic fiducial requirements listed below apply only to the fiducial cross sections. The luminosity uncertainty almost entirely cancels in some of the ratio measurements.

Z-boson and ttbar production cross-section double ratios at 13, 8, 7TeV. The beam-energy uncertainty, which largely cancels in the ratios, is included in the systematic uncertainty. In the first column, the total (TOT) cross sections are used for both ttbar and Z processes. In the second column, the total cross section is used for ttbar while the fiducial (FID) cross section is used for Z. In the third column, the fiducial cross sections are used for both ttbar and Z. Apart for the MZ requirement, the kinematic fiducial requirements listed below apply only to the fiducial cross sections.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

Fiducial cross sections at dressed level in the electron- and muon-pair channels. The statistical and systematic uncertainties are given as a percentage of the cross section. Leptons are required to have $p_T>20$ GeV and $|\eta|<2.4$. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $m_{\ell\ell}$ bins, pertains to these measurements.