Bayesian upper exclusion limits on the ratio $g_{W'}/g_{W}$ for an SSM-like W$\prime$ boson are shown. The unity coupling ratio (blue dotted curve) corresponds to the SSM common benchmark. The 68 and 95% quantiles of the limits are represented by the green and yellow bands, respectively.

Bayesian lower exclusion limits on the NUGIM G(221) mixing angle $\cot(\theta_{E})$ are shown as a function of the W$\prime$ boson mass. The theoretically excluded region is shaded in grey. The 68 and 95% quantiles of the limits are represented by the green and yellow bands, respectively.

Bayesian upper exclusion limits at 95% CL on the product of the production cross section and branching fraction of a QBH in an associated $ au$ lepton and neutrino final state. Minimum threshold masses $m_{th}$ of up to 6.6 TeV are excluded at 95% CL. The observed limit (solid line) is obtained from the intersection with the LO QBH cross section (blue dotted curve). The 68 and 95% quantiles of the limits are represented by the green and yellow bands, respectively.

Bayesian upper limits at 95% CL on the cross section of the process $pp\rightarrow\tau\nu$ mediated via LQ exchange in the t-channel. The inner (green) band and the outer (yellow) band indicate the regions containing 68 and 95%, respectively, of the distribution of limits expected under the background-only hypothesis. The predicted LQ cross section at LO in the three coupling benchmark scenarios is depicted in different colors for $g_{U}=1$. The uncertainty bandy correspond to the sum in quadrature of PDF and scale variations. The first benchmark scenario considers only couplings to left-handed SM fermions (i.e. $\beta_{\text{R}}^{ij}=0$) and is referred to as "best fit LH". The second benchmark, referred to as "best fit LH+RH", considers $|\beta_{\text{R}}^{\text{b}\tau}|=1$ and all other $\beta_{\text{R}}^{ij}=0$. In the third "democratic" benchmark, equal couplings only to LH fermions are assumed, i.e. $\beta_{\text{L}}^{ij}=1$ and $\beta_{\text{R}}^{ij}=0$ for all $i$ and $j$.

Expected and observed lower limits of the LQ mass as a function of the coupling $g_{U}$ in the LH scenario. The blue band shows the 68% and 95% regions of $g_{U}$ preferred by the fit to the b anomalies data.

Expected and observed lower limits of the LQ mass as a function of the coupling $g_{U}$ in the LH+RH scenario. The blue band shows the 68% and 95% regions of $g_{U}$ preferred by the fit to the b anomalies data.

Expected and observed lower limits of the LQ mass as a function of the coupling $g_{U}$ in the democratic scenario. The blue band shows the 68% and 95% regions of $g_{U}$ preferred by the fit to the b anomalies data.

Bayesian upper exclusion limits at 95% CL on each of the Wilson coefficients described by the EFT model based on 2016-2018 data. The three different coupling types represent a left-handed vector coupling ($\epsilon^{cb}_{L}$), tensor-like coupling ($\epsilon^{cb}_{T}$), and scalar-tensor-like coupling ($\epsilon^{cb}_{S_{L}}$). The 68 and 95% quantiles of the limits are represented by the green and yellow bands, respectively.

Summary of exclusion limits (expected and observed) calculated at 95% CL for full Run-2 CMS data.

Background prediction and observed data yields in the signal region bins. The background yields are obtained from the background-only fit and serve as input to the simplified likelihood reinterpretation scheme. The naming of the bins is "year_binnumber", following the binning from Figure 4.

Matrix of covariance coefficients between signal region bins. The coefficients are obtained from the background-only fit and serve as input to the simplified likelihood reinterpretation scheme. The naming of the bins is "year_binnumber", following the binning used in Figure 4.

Predicted signal yields for the 2017 data-taking period, corresponding to 41.3 fb$^{-1}$, after the application of each search requirement (cumulative) for various signal hypothesis. The requirements listed are presented as total efficiencies w.r.t. the previous selection step.

The unfolded differential charge asymmetry as a function of the transverse momentum of the top pair system. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NNLO in QCD and NLO in EW theory are listed. The scale uncertainty is obtained by varying renormalisation and factorisation scales independently by a factor of 2 or 0.5 around $\mu_0$ to calculate the maximum and minimum value of the asymmetry, respectively. The nominal value $\mu_0$ is chosen as $H_T/4$. The variations in which one scale is multiplied by 2 while the other scale is divided by 2 are excluded. Finally, the scale and MC integration uncertainties are added in quadrature.

The unfolded differential charge asymmetry as a function of the longitudinal boost of the top pair system. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NNLO in QCD and NLO in EW theory are listed. The scale uncertainty is obtained by varying renormalisation and factorisation scales independently by a factor of 2 or 0.5 around $\mu_0$ to calculate the maximum and minimum value of the asymmetry, respectively. The nominal value $\mu_0$ is chosen as $H_T/4$. The variations in which one scale is multiplied by 2 while the other scale is divided by 2 are excluded. Finally, the scale and MC integration uncertainties are added in quadrature.

The unfolded inclusive leptonic asymmetry. The unfolded $A_C^{\ell\bar{\ell}}$ is obtained in the reduced phase-space defined by the requirement $|\Delta |\eta_{\ell\bar{\ell}}||<2.5$. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NLO in QCD and NLO in EW theory are listed. The theory uncertainty is obtained by varying both scales by a factor of 0.5 or 2.0 to calculate the minimum and maximum value of the asymmetry, respectively.

The unfolded differential leptonic asymmetry as a function of the invariant mass of the di-lepton pair. The unfolded $A_C^{\ell\bar{\ell}}$ is obtained in the reduced phase-space defined by the requirement $|\Delta |\eta_{\ell\bar{\ell}}||<2.5$. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NLO in QCD and NLO in EW theory are listed. The theory uncertainty is obtained by varying both scales by a factor of 0.5 or 2.0 to calculate the minimum and maximum value of the asymmetry, respectively.

The unfolded differential leptonic asymmetry as a function of the transverse momentum of the di-lepton pair. The unfolded $A_C^{\ell\bar{\ell}}$ is obtained in the reduced phase-space defined by the requirement $|\Delta |\eta_{\ell\bar{\ell}}||<2.5$. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NLO in QCD and NLO in EW theory are listed. The theory uncertainty is obtained by varying both scales by a factor of 0.5 or 2.0 to calculate the minimum and maximum value of the asymmetry, respectively.

The unfolded differential leptonic asymmetry as a function of the longitudinal boost of the di-lepton pair. The unfolded $A_C^{\ell\bar{\ell}}$ is obtained in the reduced phase-space defined by the requirement $|\Delta |\eta_{\ell\bar{\ell}}||<2.5$. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NLO in QCD and NLO in EW theory are listed. The theory uncertainty is obtained by varying both scales by a factor of 0.5 or 2.0 to calculate the minimum and maximum value of the asymmetry, respectively.

Individual 68% and 95% CL bounds on the relevant Wilson coefficients of the SM Effective Field Theory in units of $\text{TeV}^{-2}$. The bounds are derived from the $A_C^{t\bar{t}}$ inclusive measurement. The experimental uncertainties are accounted for, in the form of the complete covariance matrix that keeps track of correlations between bins for the differential measurement. The theory uncertainty from the NNLO QCD + NLO EW calculation is included by explicitly varying the renormalization and factorization scales, or the parton density functions, in the calculation and registering the variations in the intervals.

Individual 68% and 95% CL bounds on the relevant Wilson coefficients of the SM Effective Field Theory in units of $\text{TeV}^{-2}$. The bounds are derived from the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement. The experimental uncertainties are accounted for, in the form of the complete covariance matrix that keeps track of correlations between bins for the differential measurement. The theory uncertainty from the NNLO QCD + NLO EW calculation is included by explicitly varying the renormalization and factorization scales, or the parton density functions, in the calculation and registering the variations in the intervals.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ inclusive measurement. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement for $\beta_{z,t\bar{t}}$ $\in$ [0,0.3]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement for $\beta_{z,t\bar{t}}$ $\in$ [0.3,0.6]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement for $\beta_{z,t\bar{t}}$ $\in$ [0.6,0.8]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement for $\beta_{z,t\bar{t}}$ $\in$ [0.8,1]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement for $m_{t\bar{t}}$ < 500 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement for $m_{t\bar{t}}$ $\in$ [500,750] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement for $m_{t\bar{t}}$ $\in$ [750,1000] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement for $m_{t\bar{t}}$ $\in$ [1000,1500] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement for $m_{t\bar{t}}$ > 1500 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $p_{T,t\bar{t}}$ measurement for $p_{T,t\bar{t}}$ < 30 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $p_{T,t\bar{t}}$ measurement for $p_{T,t\bar{t}}$ $\in$ [30,120] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $p_{T,t\bar{t}}$ measurement for $p_{T,t\bar{t}}$ > 120 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ inclusive measurement. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement for $\beta_{z,\ell\bar{\ell}}$ $\in$[0,0.3]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement for $\beta_{z,\ell\bar{\ell}}$ $\in$[0.3,0.6]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement for $\beta_{z,\ell\bar{\ell}}$ $\in$[0.6,0.8]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement for $\beta_{z,\ell\bar{\ell}}$ $\in$[0.8,1]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement for $m_{\ell\bar{\ell}}$ < 200 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement for $m_{\ell\bar{\ell}}$ $\in$ [200,300] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement for $m_{\ell\bar{\ell}}$ $\in$ [300,400] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement for $m_{\ell\bar{\ell}}$ > 400 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $p_{T,\ell\bar{\ell}}$ measurement for $p_{T,\ell\bar{\ell}}$ < 20 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $p_{T,\ell\bar{\ell}}$ measurement for $p_{T,\ell\bar{\ell}}$ $\in$ [20, 70] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $p_{T,\ell\bar{\ell}}$ measurement for $p_{T,\ell\bar{\ell}}$ > 70 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{t\bar{t}}$ inclusive measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{t\bar{t}}$ vs $p_{T,t\bar{t}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{\ell\ell}$ inclusive measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{\ell\ell}$ vs $p_{T,\ell\bar{\ell}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Covariance matrix for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement. The total (stat. + syst.) uncertainties are considered.

Covariance matrix for the $A_C^{t\bar{t}}$ vs $p_{T,t\bar{t}}$ measurement. The total (stat. + syst.) uncertainties are considered.

Covariance matrix for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement. The total (stat. + syst.) uncertainties are considered.

Covariance matrix for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement. The total (stat. + syst.) uncertainties are considered.

Covariance matrix for the $A_C^{\ell\ell}$ vs $p_{T,\ell\bar{\ell}}$ measurement. The total (stat. + syst.) uncertainties are considered.

Covariance matrix for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement. The total (stat. + syst.) uncertainties are considered.

The expected 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with combined ${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production.

The observed 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production.

The expected 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production.

Observed 95% CL exclusion limits for simplified models with direct stau pair production in SR-lowMass.

Expected 95% CL exclusion limits for simplified models with direct stau pair production in SR-lowMass.

Observed 95% CL exclusion limits for simplified models with direct stau pair production in SR-highMass.

Expected 95% CL exclusion limits for simplified models with direct stau pair production in SR-highMass.

Signal acceptance in SR highMass for combined stau final states

Signal acceptance in SR lowMass for combined stau final states

Signal efficiency in SR highMass for combined stau final states

Signal efficiency in SR lowMass for combined stau final states

Signal acceptance*efficiency in SR highMass for combined stau final states

Signal acceptance*efficiency in SR lowMass for combined stau final states

Cutflow for two reference points (${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production) in SR. The column labelled $N_{weighted}$ shows the results including all correction factors applied to simulation, and is normalised to 139 fb$^{-1}$, while $N_{raw}$ in brackets shows the results for the generated number of events. The quoted uncertainties are statistical only. The "Generator filter" includes the requirements that two $\tau$ in the event have ${p}_{T} > 15$ GeV and $|\eta| <$ 2.6. The "Baseline Cut" includes the requirement of two baseline $\tau$ with a minimum value at 0.01 of the boosted decision tree discriminant (JetBDTSigTransMin $>$ 0.01) and ${p}_{T, \tau_{1}} > 50$ GeV and ${p}_{T, \tau_{2}} > 40$ GeV. At the step "Trigger & offline cuts", the following requirements are applied: the event is recorded using the asymmetric di-$\tau$ trigger (di-$\tau$ $E_{T}^{miss}$ trigger) in SR-lowMass (SR-highMass), and the lepton $p_{T}$ and $E_{T}^{miss}$ are required at plateau.

Observed and expected numbers of events in the control and signal regions where all control and signal region bins are included as constraints in the likelihood. The expected event yields of SM processes are given after the background-only fit. The entries marked as "--" are negligible. The uncertainties correspond to the sum in quadrature of statistical and systematic uncertainties. The correlation of systematic uncertainties among control regions and among background processes is fully taken into account.

The post-fit $m_{T2}$ distribution for SR-lowMass. The stacked histograms show the expected SM backgrounds. The multi-jet contribution is estimated from data using the ABCD method. The contributions of multi-jet and $W$+jets events are scaled with the corresponding normalization factors derived from the background-only fit. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distributions from the SUSY reference points are also shown as dashed lines. The last bin includes the overflow events.

The post-fit $m_{T2}$ distribution for SR-highMass. The stacked histograms show the expected SM backgrounds. The multi-jet contribution is estimated from data using the ABCD method. The contributions of multi-jet and $W$+jets events are scaled with the corresponding normalization factors derived from the background-only fit. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distributions from the SUSY reference points are also shown as dashed lines. The last bin includes the overflow events.

The $m_{T2}$ post-fit distributions in the multi-jet background validation region VR-F (lowMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $m_{T2}$ post-fit distributions in the multi-jet background validation VR-F (highMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $E_{T}^{miss}$ post-fit distributions in the multi-jet background validation region VR-F (lowMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $E_{T}^{miss}$ post-fit distributions in the multi-jet background validation region VR-F (highMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The pre-fit $m_{T2}$ distribution in the $WCR$. The SM backgrounds other than multi-jet production are estimated from MC simulation. The multi-jet contribution is estimated from data using the OS--SS method. The hatched bands represent the combined statistical and systematic uncertainties of the total SM background. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The post-fit yields in the $WVR$, $TVRs$, $ZVRs$ and $VVVRs$. The SM backgrounds other than multi-jet production are estimated from MC simulation. The multi-jet contribution is negligible and is estimated from data using the ABCD method, using CRs obtained with the same technique used for the SRs. The hatched bands represent the combined statistical and systematic uncertainties of the total SM background. For illustration, the distributions of the SUSY reference points are also shown as dashed lines. The lower panels show the ratio of data to the SM background estimate.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for slepton-pair production.

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via $W^{\pm}W^{\mp}$. The masses of the two charginos are 300 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 50 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via slepton-neutrino/sneutrino-lepton pair. The masses of the two charginos are 600 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 1 GeV. The slepton/sneutrino masses are 300 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde\ell\tilde\ell$ are produced. Only $\tilde{e}$ and $\tilde{\mu}$ are considered in this model. The masses of the two sleptons are 400 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 200 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Dependence of the overall signal efficiency on the pT of the long-lived Z' for Z' -> ee. The error bars indicate the total uncertainties.

Dependence of the overall signal efficiency on the transverse decay radius Rxy of the long-lived Z' for Z' -> emu. The error bars indicate the total uncertainties.

Dependence of the overall signal efficiency on the pT of the long-lived Z' for Z' -> emu. The error bars indicate the total uncertainties.

Dependence of the overall signal efficiency on the transverse decay radius Rxy of the long-lived Z' for Z' -> mumu. The error bars indicate the total uncertainties.

Dependence of the overall signal efficiency on the pT of the long-lived Z' for Z' -> mumu. The error bars indicate the total uncertainties.

Overall signal efficiency as a function of the mean proper lifetime (ctau) of the neutralino for the lambda121 scenario of the RPV SUSY model. The error bars indicate the total uncertainties.

Overall signal efficiency as a function of the mean proper lifetime (ctau) of the neutralino for the lambda122 scenario of the RPV SUSY model. The error bars indicate the total uncertainties.

95% CL upper limits on the squark-antisquark production cross-section as a function of the mean proper lifetime (ctau) of the neutralino for the lambda121 scenario of the RPV SUSY model and a 700 GeV squark. The uncertainties of the expected limit indicate the +-1sigma variations.

95% CL upper limits on the squark-antisquark production cross-section as a function of the mean proper lifetime (ctau) of the neutralino for the lambda122 scenario of the RPV SUSY model and a 700 GeV squark. The uncertainties of the expected limit indicate the +-1sigma variations.

95% CL upper limits on the squark-antisquark production cross-section as a function of the mean proper lifetime (ctau) of the neutralino for the lambda121 scenario of the RPV SUSY model and a 1600 GeV squark. The uncertainties of the expected limit indicate the +-1sigma variations.

95% CL upper limits on the squark-antisquark production cross-section as a function of the mean proper lifetime (ctau) of the neutralino for the lambda122 scenario of the RPV SUSY model and a 1600 GeV squark. The uncertainties of the expected limit indicate the +-1sigma variations.

Fraction of detector volume covered by the material veto as a function of z and Rxy of the displaced dilepton vertex.

Fraction of detector volume covered by the disabled pixel modules veto veto as a function of z and Rxy of the displaced dilepton vertex.

Observed Rxy distribution of vertices composed of two non-leptonic tracks in a control sample in the data and the predicted distribution obtained from the event mixing. The error bars indicate the statistical uncertainties.

Rxy distributions of Kshort vertices from the large radius tracking in the data and background MC samples. Data has been normalised such that the total number of Kshort from the standard tracking in the data agrees with the total number of Kshort from the standard tracking in the MC. The error bars indicate the statistical uncertainties.

Acceptance per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> eenu. The error bars indicate the statistical uncertainties.

Acceptance per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> emunu. The error bars indicate the statistical uncertainties.

Acceptance per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> mumunu. The error bars indicate the statistical uncertainties.

Detection efficiency per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> eenu. The error bars indicate the total uncertainties.

Detection efficiency per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> emunu. The error bars indicate the total uncertainties.

Detection efficiency per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> mumunu. The error bars indicate the total uncertainties.

Overall signal efficiency (acceptance times efficiency) per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> eenu. The error bars indicate the total uncertainties.

Overall signal efficiency (acceptance times efficiency) per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> emunu. The error bars indicate the total uncertainties.

Overall signal efficiency (acceptance times efficiency) per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> mumunu. The error bars indicate the total uncertainties.

Detection efficiency per decay for Rxy < 22 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for 22 <= Rxy < 38 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for 38 <= Rxy < 73 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for 73 <= Rxy < 111 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for 111 <= Rxy < 145 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for 145 <= Rxy < 300 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for Rxy < 22 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for 22 <= Rxy < 38 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for 38 <= Rxy < 73 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for 73 <= Rxy < 111 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for 111 <= Rxy < 145 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for 145 <= Rxy < 300 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for Rxy < 22 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay for 22 <= Rxy < 38 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay for 38 <= Rxy < 73 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay for 73 <= Rxy < 111 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay for 111 <= Rxy < 145 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay for 145 <= Rxy < 300 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 100 GeV and LLP -> ee.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 100 GeV and LLP -> emu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 100 GeV and LLP -> mumu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 250 GeV and LLP -> ee.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 250 GeV and LLP -> emu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 250 GeV and LLP -> mumu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 500 GeV and LLP -> ee.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 500 GeV and LLP -> emu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 500 GeV and LLP -> mumu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 750 GeV and LLP -> ee.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 750 GeV and LLP -> emu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 750 GeV and LLP -> mumu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 1000 GeV and LLP -> ee.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 1000 GeV and LLP -> emu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 1000 GeV and LLP -> mumu.

Acceptance, detection efficiency, and overall signal efficiency in the Z' toy model for mZ' = 100 GeV, three mean proper lifetimes (ctau) and the three decay modes of the Z'.

Acceptance, detection efficiency, and overall signal efficiency in the Z' toy model for mZ' = 250 GeV, three mean proper lifetimes (ctau) and the three decay modes of the Z'.

Acceptance, detection efficiency, and overall signal efficiency in the Z' toy model for mZ' = 500 GeV, three mean proper lifetimes (ctau) and the three decay modes of the Z'.

Acceptance, detection efficiency, and overall signal efficiency in the Z' toy model for mZ' = 750 GeV, three mean proper lifetimes (ctau) and the three decay modes of the Z'.

Acceptance, detection efficiency, and overall signal efficiency in the Z' toy model for mZ' = 1000 GeV, three mean proper lifetimes (ctau) and the three decay modes of the Z'.

Limit Plot

Limit Plot

Limit Plot

HVT WW Acceptance times Efficiency

HVT WZ Acceptance times Efficiency

RS Graviton WW Acceptance times Efficiency

RS Graviton ZZ Acceptance times Efficiency

Observed 95% confidence-level upper limits on the cross section for Drell-Yan spin-1/2 HECO production as a function of mass for various values of electric charge in the range $20\le|z|\le100$.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 200 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 500 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 1000 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 1500 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 2000 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 2500 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 3000 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 4000 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 200 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 500 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 1000 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 1500 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 2000 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 2500 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 3000 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 4000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 200 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 1000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 1500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 2000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 2500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 3000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 4000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 200 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 1000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 1500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 2000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 2500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 3000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 4000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 200 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 1000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 1500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 2000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 2500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 3000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 4000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 200 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 1000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 1500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 2000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 2500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 3000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 4000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 200 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 1000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 1500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 2000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 2500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 3000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 4000 GeV.

Displaced HNL search observed 95% confidence level exclusion contour in $|U_{\mu}|^2$ as a function of HNL mass (LNV case).

Prompt HNL search observed and expected 95% confidence level exclusion upper limits in $|U_{e}|^2$ as a function of HNL mass.

Prompt HNL search observed and expected 95% confidence level exclusion upper limits in $|U_{\mu}|^2$ as a function of HNL mass.

Displaced HNL search expected 95% confidence level exclusion contour in $|U_{\mu}|^2$ as a function of HNL mass (LNC case).

Displaced HNL search expected 95% confidence level exclusion contour in $|U_{\mu}|^2$ as a function of HNL mass (LNV case).

List of relative uncertainties in the measured cross sections of the $t\bar{t}Z$ and $t\bar{t}W$ processes from the fit, grouped in categories. All uncertainties are symmetrized. The sum in quadrature may not be equal to the total due to correlations between uncertainties introduced by the fit.

The expected and observed 68% and 95% confidence intervals, which include the value 0, for $\mathcal{C}_{i}/\Lambda^{2}$ for the EFT coefficients $\mathcal{C}_{\phi Q}^{(3)}$, $\mathcal{C}_{\phi t}$, $\mathcal{C}_{tB}$ and $\mathcal{C}_{tW}$. The intervals for $\mathcal{C}_{\phi Q}^{(3)}$ are derived setting $\mathcal{C}_{\phi Q}^{(1)}$ to zero; the measurement is sensitive to the difference $\mathcal{C}_{\phi Q}^{(3)}-\mathcal{C}_{\phi Q}^{(1)}$. All results are given in units of 1/TeV$^{2}$. Limits from fits for the EFT coefficients with only the linear term are also shown.