Measured integrated cross sections for the $Z\gamma\gamma$ process for neutrino final state at $\sqrt{s} = 8$ TeV in the extended fiducial regions defined in the paper, table 5. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The cross sections as a function of $N_{\mathrm{jets}}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The systematic uncertainties for the nominal muon-channel cross-section measurement. Some sources of uncertainty have both correlated and uncorrelated components. Correlated uncertainties arise from the uncertainty in the electroweak background contributions delta(e.w.)_cor, from corrections to the Monte Carlo modelling of the Z/gamma* pT spectra, and from the reconstruction, trigger and isolation efficiency corrections, given by delta(reco)_cor, delta(trig)_cor and delta(iso)_cor respectively. The uncertainty on the multijet and electroweak background cross sections, given by delta(multijet and delta(e.w.), respectively and muon momentum scale uncertainty, delta(pT_scale) are also correlated. Uncorrelated uncertainties are due to corrections for the trigger and isolation efficiencies, given by delta(trig)_unc and delta(iso)_unc respectively. The uncertainty from the muon resolution correction, delta(res), from the size of the signal Monte Carlo sample, delta(MC), and the uncertaintities due to corrections for the reconstruction, delta(reco)_unc, are also uncorrelated. The luminosity uncertainty 1.8% is not included.

The combined Born-level fiducial differential cross section dsigma/dm_ll, statistical delta(stat), total correlated delta(cor), uncorrelated delta(unc), and total delta(total) uncertainties, as well as individual correlated sources delta(cor)_i. The correlated uncertainties are a linear combination of the 13 correlated uncertainties in the nominal muon and electron channels. As the uncertainties on the combined result no longer originate from individual error sources they are numbered 1-13. Also shown is the correction factor used to derive the dressed cross section (D), and the NNLO extrapolation factor (A) used to derive the cross section for the full phase space, along with the uncertainties associated to variations in scale choice delta(A)_scale, and PDF uncertainty delta(A)_pdf_alpha_s. The luminosity uncertainty 1.8% is not included.

The extended muon channel Born-level fiducial differential cross section dsigma/dm_ll, with the statistical delta(stat), systematic delta(syst), and total delta(tot) uncertainties for each invariant mass bin. Also shown is the correction factor used to derive the dressed cross section (D), and the extrapolation factor (A) used to derive the cross section for the full phase space, along with the uncertainties associated to variations in scale delta(A)_scale, and PDF uncertainty delta(A)_pdf_alpha_s. The luminosity uncertainty 3.5% is not included.

The systematic uncertainties for the extended muon channel cross-section measurement in each invariant mass bin. Correlated uncertainties come from the reconstruction, trigger and isolation efficiency corrections, given by delta(reco), delta(trig) and delta(iso) respectively. The uncertainty on the multijet background cross section, delta(multijet) and the uncertainty on the muon momentum scale, delta(pT_scale), are also correlated across bins. Uncorrelated uncertainties are due to the uncertainty from the muon resolution correction, delta(res), and the sample size of the signal Monte Carlo sample, delta(MC). The luminosity uncertainty 3.5% is not included.

Theory predictions for NLO+LLPS and for fixed-order calculations at NLO and NNLO including higher-order electroweak corrections, for the nominal analysis of the differential cross section dsigma/dm_ll as a function of the invariant mass m_ll. The scale uncertainty is defined as the envelope of variations for 0.5< mu_R,mu_F<2.0 for Powheg. For Fewz the scale uncertainty is defined by the variation 0.5<mu_R=mu_F<2.0. The uncertainty labelled as "stat" in the table corresponds to the pdf+alpha_s uncertainty for Fewz or just the pdf uncertainty for Powheg.

Theory predictions for NLO+LLPS and for fixed-order calculations at NLO and NNLO including higher-order electroweak corrections, for the extended analysis of the differential cross section dsigma/dm_ll as a function of the invariant mass m_ll. The scale uncertainty is defined as the envelope of variations for 0.5<mu_R,mu_F<2.0 for Powheg. For Fewz the scale uncertainty is defined by the variation 0.5<mu_R=mu_F<2.0. The uncertainty labelled as "stat" in the table corresponds to the pdf+alpha_s uncertainty for Fewz or just the pdf uncertainty for Powheg.

Higher-order electroweak corrections in nominal analysis, Delta(HOEW), and the correction for the Photon Induced process, Delta(PI), together with its uncertainty derived from the uncertainty of the photon PDF as a function of the dilepton invariant mass m_ll. Also shown is the difference arising from the non-convergence of calculations derived with different electroweak schema, delta(scheme).

Higher-order electroweak corrections in extended analysis, Delta(HOEW), and the correction for the Photon Induced process, Delta(PI), together with its uncertainty derived from the uncertainty of the photon PDF as a function of the dilepton invariant mass m_ll. Also shown is the difference arising from the non-convergence of calculations derived with different electroweak schema, delta(scheme).

Values of chi^2 for the nominal and extended DY cross-section measurements for predictions based from Fewz at NLO and NNLO and Powheg using MSTW2008 PDFs accounting for the experimental correlated systematic uncertainties. The _pdf_scale columns show the chi^2 when the PDF and scale uncertainties on the theoretical predictions are taken into account.

The chi^2 values from NLO and NNLO QCD fits made using the ATLAS nominal and extended Drell--Yan cross-section measurements and the HERA-I dataset accounting for the experimental correlated systematic uncertainties.

Bin averaged hadron level differential cross section for diffractive dijet production as a function of X(C=POMERON). The first systematic error is the uncorrelated and the second the correlated uncertainty.

Bin averaged hadron level differential cross section for diffractive dijet production as a function of Z(C=POMERON). The first systematic error is the uncorrelated and the second the correlated uncertainty.

Bin averaged hadron level differential cross section for diffractive dijet production as a function of the average pseudorapidity of the dijet system. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Bin averaged hadron level differential cross section for diffractive dijet production as a function of the absolute difference of the pseudorapidities of the two jets. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Bin averaged hadron level differential cross section for diffractive dijet production as a function of W. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Bin averaged hadron level differential cross section for diffractive dijet production as a function of the dijet invariant mass. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Bin averaged hadron level differential cross section for diffractive dijet production as a function of mass of the diffractive system. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Bin averaged hadron level double-differential cross section for diffractive dijet production as a function of X(GAMMA) for 3 ranges of ET of jet 1. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Bin averaged hadron level double-differential cross section for diffractive dijet production as a function of Z(POMERON) for 2 ranges of X(GAMMA). The first systematic error is the uncorrelated and the second the correlated uncertainty.

Ratios of the diffractive to the inclusive single-differential hadron level dijet cross sections as a function of X(C=GAMMA). The first systematic error is the uncorrelated and the second the correlated uncertainty.

Ratios of the diffractive to the inclusive single-differential hadron level dijet cross sections as a function of ET of jet 1. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Ratios of the diffractive to the inclusive single-differential hadron level dijet cross sections as a function of the average pseudorapidity of the dijet system. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Ratios of the diffractive to the inclusive single-differential hadron level dijet cross sections as a function of the absolute difference in the pseudorapidities of the 2 jets. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Ratios of the diffractive to the inclusive single-differential hadron level dijet cross sections as a function of the invariant mass of the dijet system. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Ratios of the diffractive to the inclusive single-differential hadron level dijet cross sections as a function of W. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Measured cross section for kaon production as a function of W.