Distribution of $m_{T}(W)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $M_{3}$ in the $N_{jet}\geq 3$ signal region.

Distribution of $M_{3}$ in the $N_{jet}\geq 3$ signal region.

Distribution of $m(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $m(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(j,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(j,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for electrons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for electrons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for muons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for muons.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the e channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the e channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the $\mu$ channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the $\mu$ channel.

Extracted scale factors for the contribution from misidentified electrons for the three data-taking periods, and the Z$\gamma$, W$\gamma$ simulations.

Extracted scale factors for the contribution from misidentified electrons for the three data-taking periods, and the Z$\gamma$, W$\gamma$ simulations.

Predicted and observed yields in the control regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the control regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the signal regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the signal regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

The measured inclusive ttgamma cross section in the fiducial phase space compared to the prediction from simulation using Madgraph_aMC@NLO at a center-of-mass energy of 13 TeV.

The measured inclusive ttgamma cross section in the fiducial phase space compared to the prediction from simulation using Madgraph_aMC@NLO at a center-of-mass energy of 13 TeV.

Summary of the measured cross section ratios with respect to the NLO cross section prediction for signal regions binned in the electron channel, muon channel and the combined single lepton measurement.

Summary of the measured cross section ratios with respect to the NLO cross section prediction for signal regions binned in the electron channel, muon channel and the combined single lepton measurement.

The unfolded differential cross sections for $p_{T}(\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $p_{T}(\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $|\eta(\gamma)|$ and the comparison to simulations.

The unfolded differential cross sections for $|\eta(\gamma)|$ and the comparison to simulations.

The unfolded differential cross sections for $\Delta R(l,\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $\Delta R(l,\gamma)$ and the comparison to simulations.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

Summary of the one-dimensional intervals at 68 and 95% CL.

Summary of the one-dimensional intervals at 68 and 95% CL.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the muon channel.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the two-dimensional scan for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the two-dimensional scan for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$.

Measured inclusive fiducial $tt\gamma$ production cross section in the dilepton final state for the different dilepton-flavour channels and combined.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ .

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ . The values provided in the table are not divided by the bin width.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton measurement.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton and lepton+jets measurements combined.

One-dimensional 68 and 95% CL intervals obtained for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$, using the photon $p_{T}$ distribution from the dilepton analysis, or the combination of photon pT distributions from the dilepton and lepton+jets analyses.

Comparison of observed $95\%$ CL intervals for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$. Results are shown from a CMS ttZ measurement [JHEP 03 (2020) 056], from a CMS ttZ & tZq interpretation [arXiv:2107.13896], from a CMS ttG (lepton+jets) measurement [arXiv:2107.01508], from this measurement, and from a global fit by J. Ellis et al. [JHEP 04 (2021) 279].

The ratio between the observed data and the simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $p_T^{miss}$ after scaling the simulation to match the total yield in data.

Comparison between data and simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_t$ after scaling the simulation to match the total yield in data. The hatched region indicates the total shape uncertainty in the simulation.

The ratio between the observed data and the simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_t$ after scaling the simulation to match the total yield in data.

Comparison between data and simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_W$ after scaling the simulation to match the total yield in data. The hatched region indicates the total shape uncertainty in the simulation.

The ratio between the observed data and the simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_W$ after scaling the simulation to match the total yield in data.

Comparison between data and simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_{\text{res}}$ after scaling the simulation to match the total yield in data. The hatched region indicates the total shape uncertainty in the simulation.

The ratio between the observed data and the simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_{\text{res}}$ after scaling the simulation to match the total yield in data.

Observed event yields in data (black points) and predicted SM background (filled histograms) for the low $\Delta$m search bins 0--52. The signal models are denoted in the legend with the masses in GeV of the SUSY particles in parentheses: $(m_{\tilde{t}}, m_{\tilde{\chi}^0_1})$ or $(m_{\tilde{g}}, m_{\tilde{\chi}^0_1})$ for the T2 or T1 signal models, respectively. The hatched bands correspond to the total uncertainty in the background prediction. The (unstacked) distributions for two example signal models are also shown.

The ratio of the data to the total background prediction for the low $\Delta$m search bins 0--52. The hatched bands correspond to the total uncertainty in the background prediction.

Observed event yields in data (black points) and predicted SM background (filled histograms) for the high $\Delta$m search bins 53--104. The signal models are denoted in the legend with the masses in GeV of the SUSY particles in parentheses: $(m_{\tilde{t}}, m_{\tilde{\chi}^0_1})$ or $(m_{\tilde{g}}, m_{\tilde{\chi}^0_1})$ for the T2 or T1 signal models, respectively. The hatched bands correspond to the total uncertainty in the background prediction. The (unstacked) distributions for two example signal models are also shown.

The ratio of the data to the total background prediction for the high $\Delta$m search bins 53--104. The hatched bands correspond to the total uncertainty in the background prediction.

Observed event yields in data (black points) and predicted SM background (filled histograms) for the high $\Delta$m search bins 105--152 with ${N_b = 2}$. The signal models are denoted in the legend with the masses in GeV of the SUSY particles in parentheses: $(m_{\tilde{t}}, m_{\tilde{\chi}^0_1})$ or $(m_{\tilde{g}}, m_{\tilde{\chi}^0_1})$ for the T2 or T1 signal models, respectively. The hatched bands correspond to the total uncertainty in the background prediction. The (unstacked) distributions for two example signal models are also shown.

The ratio of the data to the total background prediction for the high $\Delta$m search bins 105--152 with ${N_b = 2}$. The hatched bands correspond to the total uncertainty in the background prediction.

Observed event yields in data (black points) and predicted SM background (filled histograms) for the high $\Delta$m search bins 153--182 with ${N_b \geq 3}$. The signal models are denoted in the legend with the masses in GeV of the SUSY particles in parentheses: $(m_{\tilde{t}}, m_{\tilde{\chi}^0_1})$ or $(m_{\tilde{g}}, m_{\tilde{\chi}^0_1})$ for the T2 or T1 signal models, respectively. The hatched bands correspond to the total uncertainty in the background prediction. The (unstacked) distributions for two example signal models are also shown.

The ratio of the data to the total background prediction for the high $\Delta$m search bins 153--182 with ${N_b \geq 3}$. The hatched bands correspond to the total uncertainty in the background prediction.

The observed 95% CL upper limit on the production cross section of the T2tt simplified model as a function of the top squark and LSP masses. No interpretation is provided for signal models for which ${|{m_{\tilde{t}} - m_{\tilde{\chi}^0_1} - m_t}| < 25 GeV}$ and ${m_{\tilde{t}} < 275 GeV}$ as described in the text.

The expected 95% CL upper limit on the production cross section of the T2tt simplified model as a function of the top squark and LSP masses. No interpretation is provided for signal models for which ${|{m_{\tilde{t}} - m_{\tilde{\chi}^0_1} - m_t}| < 25 GeV}$ and ${m_{\tilde{t}} < 275 GeV}$ as described in the text.

The observed exclusion contour of the T2tt simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$). No interpretation is provided for signal models for which ${|{m_{\tilde{t}} - m_{\tilde{\chi}^0_1} - m_t}| < 25 GeV}$ and ${m_{\tilde{t}} < 275 GeV}$ as described in the text.

The mean expected exclusion contour of the T2tt simplified model and the region containing 68 and 95\% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis. No interpretation is provided for signal models for which ${|{m_{\tilde{t}} - m_{\tilde{\chi}^0_1} - m_t}| < 25 GeV}$ and ${m_{\tilde{t}} < 275 GeV}$ as described in the text.

The observed 95% CL upper limit on the production cross section of the T2bW simplified model as a function of the top squark and LSP masses.

The expected 95% CL upper limit on the production cross section of the T2bW simplified model as a function of the top squark and LSP masses.

The observed exclusion contour of the T2bW simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T2bW simplified model and the region containing 68 and 95\% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T2tb simplified model as a function of the top squark and LSP masses.

The expected 95% CL upper limit on the production cross section of the T2tb simplified model as a function of the top squark and LSP masses.

The observed exclusion contour of the T2tb simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T2tb simplified model and the region containing 68 and 95\% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T2ttC simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The expected 95% CL upper limit on the production cross section of the T2ttC simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The observed exclusion contour of the T2ttC simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T2ttC simplified model and the region containing 68\% ($\pm 1\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T2bWC simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The expected 95% CL upper limit on the production cross section of the T2bWC simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The observed exclusion contour of the T2bWC simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T2bWC simplified model and the region containing 68\% ($\pm 1\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T2cc simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The expected 95% CL upper limit on the production cross section of the T2cc simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The observed exclusion contour of the T2cc simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T2cc simplified model and the region containing 68\% ($\pm 1\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T1tttt simplified model as a function of the gluino and LSP masses.

The expected 95% CL upper limit on the production cross section of the T1tttt simplified model as a function of the gluino and LSP masses.

The observed exclusion contour of the T1tttt simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T1tttt simplified model and the region containing 68 and 95\% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T1ttbb simplified model as a function of the gluino and LSP masses.

The expected 95% CL upper limit on the production cross section of the T1ttbb simplified model as a function of the gluino and LSP masses.

The observed exclusion contour of the T1ttbb simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T1ttbb simplified model and the region containing 68 and 95\% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T5ttcc simplified model as a function of the gluino and LSP masses. The upper limits do not take into account contributions from direct top squark pair production; however, its effect is small for $m_{\tilde{\chi}^0_1} > 600 GeV$, which corresponds to the phase space beyond the exclusions based on direct top squark pair production. The excluded regions based on direct top squark pair production from this search and earlier searches are indicated by the hatched areas.

The expected 95% CL upper limit on the production cross section of the T5ttcc simplified model as a function of the gluino and LSP masses. The uppser limits do not take into account contributions from direct top squark pair production; however, its effect is small for $m_{\tilde{\chi}^0_1} > 600 GeV$, which corresponds to the phase space beyond the exclusions based on direct top squark pair production. The excluded regions based on direct top squark pair production from this search and earlier searches are indicated by the hatched areas.

The observed exclusion contour of the T5ttcc simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$). The expected and observed upper limits do not take into account contributions from direct top squark pair production; however, its effect is small for $m_{\tilde{\chi}^0_1} > 600 GeV$, which corresponds to the phase space beyond the exclusions based on direct top squark pair production. The excluded regions based on direct top squark pair production from this search and earlier searches are indicated by the hatched areas.

The mean expected exclusion contour of the T5ttcc simplified model and the region containing 68% and 95% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis. The expected and observed upper limits do not take into account contributions from direct top squark pair production; however, its effect is small for $m_{\tilde{\chi}^0_1} > 600 GeV$, which corresponds to the phase space beyond the exclusions based on direct top squark pair production. The excluded regions based on direct top squark pair production from this search and earlier searches are indicated by the hatched areas.

SM background observation/prediction in the WH signal region

SM background prediction vs. observation in the W signal region

SM background observation/prediction in the W signal region

SM background prediction vs. observation in the H signal region

SM background observation/prediction in the H signal region

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

The 95% CL observed upper limits on the production cross sections for $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^\mp_1$ assuming that each $\widetilde{\chi}^\pm_1$ decays to a W boson and $\widetilde{\chi}^0_1$

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

The 95% CL observed upper limits on the production cross sections for $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^0_2$ assuming that each $\widetilde{\chi}^\pm_1$ decays to a W boson and $\widetilde{\chi}^0_1$ and the $\widetilde{\chi}^0_2$ decays to a Z boson and $\widetilde{\chi}^0_1$

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

The 95% CL observed upper limits on the production cross sections for $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^0_2$ assuming that each $\widetilde{\chi}^\pm_1$ decays to a W boson and $\widetilde{\chi}^0_1$ and the $\widetilde{\chi}^0_2$ decays to a H boson and $\widetilde{\chi}^0_1$

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

The 95% CL observed upper limits on the production cross sections for mass-degenerate higgsino-like$\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^\mp_1$, $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^0_2$, $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^0_3$ and $\widetilde{\chi}^0_2$ $\widetilde{\chi}^0_3$ as functions of the NLSP and LSP masses.

Efficiency of bb-tagger for H(bb), Z(bb) and Z(cc) decays.

Efficiency of W- and V-tagger for W(qq) and Z(qq) decays.

Acceptance times efficiency values with statistical uncertainties for TChiWW in the b-Veto region.

Acceptance times efficiency values with statistical uncertainties for TChiWZ in the b-Veto region.

Acceptance times efficiency values with statistical uncertainties for TChiWH in the b-Veto region.

Acceptance times efficiency values with statistical uncertainties for TChiHZ in the b-Veto region.

Acceptance times efficiency values with statistical uncertainties for TChiWW in the WHSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWW in the WSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWW in the HSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWZ in the WHSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWZ in the WSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWZ in the HSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWH in the WHSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWH in the WSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWH in the HSR region.

Acceptance times efficiency values with uncertainties for TChiHZ in the WHSR region.

Acceptance times efficiency values with uncertainties for TChiHZ in the WSR region.

Acceptance times efficiency values with statistical uncertainties for TChiHZ in the HSR region.

Covariance matrix for the signal regions, derived from a fit to the control regions only under the background-only hypothesis.

Correlation matrix for the signal regions, derived from a fit to the control regions only under the background-only hypothesis.