The $L_{T}$ distribution in the MisID-enriched region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L below-Z signal region. The last bin contains the overflow events.

The $M_{T}$ distribution in the 3L on-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L above-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF1 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF2 signal region. The last bin contains the overflow events.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The 95% confidence level exclusion limits for the flavor-democratic scenario on the total production cross section of heavy fermion pairs.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(PS).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(PS).

Product of the fiducial acceptance and the event selection efficiency for the type-III Seesaw signal model at various signal mass hypotheses calculated after all analysis selection requirements.

Product of the fiducial acceptance and the event selection efficiency for the tt$\phi$ signal models at various signal mass hypotheses calculated after all analysis selection requirements.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for bbA prodcution and the branching fraction $\mathrm{A} \rightarrow \tau\tau$, obtained from the combination of the $\mathrm{e}\tau_\mathrm{h}$ and $\mu\tau_\mathrm{h}$ channels in the 1 b tag category, as a function of the A boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for bbA prodcution and the branching fraction $\mathrm{A} \rightarrow \tau\tau$, obtained in the $\mathrm{e}\tau_\mathrm{h}$ channel of the 1 b tag category, as a function of the A boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for bbA prodcution and the branching fraction $\mathrm{A} \rightarrow \tau\tau$, obtained in the $\mu\tau_\mathrm{h}$ channel of the 1 b tag category, as a function of the A boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

The product of acceptance, efficiency, and branching fraction of the qbX signal with $\mathrm{X} \rightarrow \tau\tau$ and $m_{\mathrm{B}}=170~\mathrm{GeV}$ in $\mathrm{e}\tau_\mathrm{h}$ and $\mu\tau_\mathrm{h}$ channels of the 1b1f and 1b1c event categories, as a function of the X boson mass. The selections are as described in the paper. The uncertainty refers to the statistical uncertainty only.

Observed $m_{\tau\tau}$ distribution in the $\mathrm{e}\tau_\mathrm{h}$ channel of the 1b1f category, compared to the expected SM background contributions. The distributions of the qbX signal with $m_{\mathrm{B}}=170~\mathrm{GeV}$, and X boson mass 40 and 60 GeV are overlaid to illustrate the sensitivity. They are normalized to the cross section times branching fraction of 20 pb. The uncertainty band represents the sum in quadrature of statistical and systematic uncertainties obtained from the fit. The lower panel shows the ratio between the observed and expected events in each bin.

Observed $m_{\tau\tau}$ distribution in the $\mathrm{e}\tau_\mathrm{h}$ channel of the 1b1c category, compared to the expected SM background contributions. The distributions of the qbX signal with $m_{\mathrm{B}}=170~\mathrm{GeV}$, and X boson mass 40 and 60 GeV are overlaid to illustrate the sensitivity. They are normalized to the cross section times branching fraction of 20 pb. The uncertainty band represents the sum in quadrature of statistical and systematic uncertainties obtained from the fit. The lower panel shows the ratio between the observed and expected events in each bin.

Observed $m_{\tau\tau}$ distribution in the $\mu\tau_\mathrm{h}$ channel of the 1b1f category, compared to the expected SM background contributions. The distributions of the qbX signal with $m_{\mathrm{B}}=170~\mathrm{GeV}$, and X boson mass 40 and 60 GeV are overlaid to illustrate the sensitivity. They are normalized to the cross section times branching fraction of 20 pb. The uncertainty band represents the sum in quadrature of statistical and systematic uncertainties obtained from the fit. The lower panel shows the ratio between the observed and expected events in each bin.

Observed $m_{\tau\tau}$ distribution in the $\mu\tau_\mathrm{h}$ channel of the 1b1c category, compared to the expected SM background contributions. The distributions of the qbX signal with $m_{\mathrm{B}}=170~\mathrm{GeV}$, and X boson mass 40 and 60 GeV are overlaid to illustrate the sensitivity. They are normalized to the cross section times branching fraction of 20 pb. The uncertainty band represents the sum in quadrature of statistical and systematic uncertainties obtained from the fit. The lower panel shows the ratio between the observed and expected events in each bin.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 170 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained from the combination of the $\mathrm{e}\tau_\mathrm{h}$ and $\mu\tau_\mathrm{h}$ channels, and the 1b1f and 1b1c categories, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 300 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained from the combination of the $\mathrm{e}\tau_\mathrm{h}$ and $\mu\tau_\mathrm{h}$ channels, and the 1b1f and 1b1c categories, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 450 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained from the combination of the $\mathrm{e}\tau_\mathrm{h}$ and $\mu\tau_\mathrm{h}$ channels, and the 1b1f and 1b1c categories, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 170 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained in the $\mathrm{e}\tau_\mathrm{h}$ channel of the 1b1f category, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 170 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained in the $\mathrm{e}\tau_\mathrm{h}$ channel of the 1b1c category, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 170 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained in the $\mu\tau_\mathrm{h}$ channel of the 1b1f category, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 170 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained in the $\mu\tau_\mathrm{h}$ channel of the 1b1c category, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.