The impact of the eight most important systematic uncertainties on \(R_t\), in %.

The post-fit yields in the two SRs. All uncertainties applied in the analysis are included.

Limits on EFT parameters and Vtb extracted from the analysis. The upper and lower limits correspond to 95% CL.

Results of the main analysis.

Pre-fit distribution of the NN discriminant \(D_{\text{nn}}\) in SR plus.

Post-fit distribution of the NN discriminant \(D_{\text{nn}}\) in SR plus.

Post-fit distribution of the \(\Delta\phi(\vec{p}_{T}^{miss},\mu)\) variable in the muon-plus CR.

Pre-fit distribution of the NN discriminant \(D_{\text{nn}}\) in SR minus.

Post-fit distribution of the NN discriminant \(D_{\text{nn}}\) in SR minus.

Post-fit distribution of the \(\Delta\phi(\vec{p}_{T}^{miss},\mu)\) variable in the muon-minus CR.

Pre-fit distribution of the invariant mass of the untagged jet and the b-tagged jet, \(m(jb)\), in SR plus.

Pre-fit distribution of the absolute value of the pseudorapidity of the untagged jet, \(|\eta(j)|\), in SR plus.

Pre-fit distribution of the absolute value of the difference in \(p_{\text{T}}\) between the reconstructed W boson and the jet pair, \(|\Delta p_{\text{T}}(W, jb)|\), in SR plus.

Pre-fit distribution of the difference in azimuth angle between the reconstructed W boson and the jet pair, \(|\Delta\phi(W, jb)|\), in SR plus.

Pre-fit distribution of the invariant mass of the reconstructed top quark, \(m(t)\), in SR plus.

Pre-fit distribution of the absolute value of the difference in pseudorapidity between the charged lepton and the untagged jet, \(|\Delta\eta(\ell ,j)|\), SR plus.

Pre-fit distribution of the angular distance of the charged lepton and the untagged jet, \(\Delta R(\ell ,j)\), in SR plus.

Pre-fit distribution of the absolute value of the difference in pseudorapidity between the b-tagged jet and the charged lepton, \(|\Delta\eta(b,\ell )|\), in SR plus.

Systematic covariance matrix for the differential cross-section distribution.

Distribution of $E_{\text{T}}^{\text{miss}}$ in SROS-on-b-$e\mu\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. The hatched band includes all statistical and systematic uncertainties.

Distribution of $m_{\text{T}}^{\text{min}}$ in SROS-on-b-$e\mu\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. The hatched band includes all statistical and systematic uncertainties.

Distribution of $E_{\text{T}}^{\text{miss}}$ in SRSS-$2\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. The hatched band includes all statistical and systematic uncertainties.

Observed ($N_{\text{obs}}$) and expected ($N_{\text{exp}}$) yields after the background-only fit for the flavor-merged inclusive SRs. The third and fourth columns list the 95\% CL upper limits on the visible cross-section ($\sigma_{\text{vis}}^{95}$) and on the number of signal events ($S_\text{obs}^{95}$). The fifth column ($S_\text{exp}^{95}$) shows the 95\% CL upper limit on the number of signal events, given the expected number of background events and its $\pm 1\sigma$ variations. The last two columns indicate the CL$_{\text{b}}$ value, i.e. the confidence level observed for the background-only hypothesis, and the discovery $p$-value ($p(s = 0)$) with its associated statistical significance $Z$. If the observed yield is below the expected yield, the $p$-value is capped at 0.5.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Distribution of $E_{\text{T}}^{\text{miss}}$ in SROS-off-b-$e\mu\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. Ratio values outside the graph range are indicated by brown arrows. The hatched band includes all statistical and systematic uncertainties.

Distribution of $m_{\text{T}}^{\text{min}}$ in SROS-off-b-$e\mu\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. Ratio values outside the graph range are indicated by brown arrows. The hatched band includes all statistical and systematic uncertainties.

Distribution of $E_{\text{T}}^{\text{miss}}$ in SRSS-$eee$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. Ratio values outside the graph range are indicated by brown arrows. The hatched band includes all statistical and systematic uncertainties.

Distribution of $E_{\text{T}}^{\text{miss}}$ in SRSS-$ee\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. Ratio values outside the graph range are indicated by brown arrows. The hatched band includes all statistical and systematic uncertainties.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

The expected upper limits on the cross-section for each signal point. The gray numbers represent the values. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid. An asymptotic approximation is employed in the CL$_{\text{s}}$ calculation instead of the full calculation using pseudo-experiments.

The observed upper limits on the cross-section for each signal point. The gray numbers represent the values. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid. An asymptotic approximation is employed in the CL$_{\text{s}}$ calculation instead of the full calculation using pseudo-experiments.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Summary of the number of events passing each selection for the $m(\tilde{\ell}_{\text{L}}^{\pm},\tilde{\chi}^0_3,\tilde{\chi}^0_1)=(300, 200, 100)$, $(550, 300, 100)$, $(450, 180, 100)$ GeV signal points, including all production processes. After the initial selections, the table is split into row blocks per inclusive region, and then further for each SR channel. Flavor-binned SRs are shown for SROS-on-b for reference. The generator level selections require to have two or more leptons.

Summary of the number of events passing each selection for the $m(\tilde{\ell}_{\text{L}}^{\pm},\tilde{\chi}^0_3,\tilde{\chi}^0_1)=(300, 200, 100)$, $(550, 300, 100)$, $(450, 180, 100)$ GeV signal points, including all production processes. After the initial selections, the table is split into row blocks per inclusive region, and then further for each SR channel. Flavor-binned SRs are shown for SROS-off-b for reference. The generator level selections require to have two or more leptons.

Summary of the number of events passing each selection for the $m(\tilde{\ell}_{\text{L}}^{\pm},\tilde{\chi}^0_3,\tilde{\chi}^0_1)=(300, 200, 100)$, $(550, 300, 100)$, $(450, 180, 100)$ GeV signal points, including all production processes. After the initial selections, the table is split into row blocks per inclusive region, and then further for each SR channel. Flavor-binned SRs are shown. The generator level selections require to have two or more leptons.

The Charged-hadron yields as a function of pT in different y selections in p+Pb collisions.

The K^{0}_{S} yields as a function of pT in different y selections in Pb+Pb photo-nuclear collisions.

The #Lambda yields as a function of pT in different y selections in Pb+Pb photo-nuclear collisions.

The #Xi^{-} yields as a function of pT in different y selections in Pb+Pb photo-nuclear collisions.

The K^{0}_{S} yields as a function of pT in different y selections in p+Pb collisions.

The #Lambda yields as a function of pT in different y selections in p+Pb collisions.

The #Xi^{-} yields as a function of pT in different y selections in p+Pb collisions.

The Charged-hadron and identified-hadron yields as a function of y in Pb+Pb photo-nuclear collisions.

The Charged-hadron and identified-hadron yields as a function of y in Pb+Pb photo-nuclear collisions.

The Charged-hadron and identified-hadron yields as a function of y in p+Pb collisions.

The Charged-hadron and identified-hadron yields as a function of y in p+Pb collisions.

The meanpT of charged hadrons and identified hadrons as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The meanpT of charged hadrons and identified hadrons as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The meanpT of charged hadrons and identified hadrons as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The meanpT of charged hadrons and identified hadrons as a function of Nchrec in p+Pb collisions.

The meanpT of charged hadrons and identified hadrons as a function of Nchrec in p+Pb collisions.

The baryon to meson ratio as a function of pT in Pb+Pb photo-nuclear collisions.

The baryon to meson ratio as a function of pT in Pb+Pb photo-nuclear collisions.

The baryon to meson ratio as a function of pT in p+Pb collisions.

The baryon to meson ratio as a function of pT in p+Pb collisions.

The ratios of identified-strange-hadron yield to charged-hadron yields as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The ratios of identified-strange-hadron yield to charged-hadron yields as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The ratios of identified-strange-hadron yield to charged-hadron yields as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The ratios of identified-strange-hadron yield to charged-hadron yields as a function of Nchrec in p+Pb collisions.

The ratios of identified-strange-hadron yield to charged-hadron yields as a function of Nchrec in p+Pb collisions.

The observed EFT limits at 95% CL, shown for the linear+quadratic electron, muon, and combined fits.

The expected EFT limits at 95% CL, shown for the linear-only electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.

The expected EFT limits at 95% CL, shown for the linear+quadratic electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.

The observed EFT limits at 95% CL, shown for the linear-only electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.

The observed EFT limits at 95% CL, shown for the linear+quadratic electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.

Born-level single-differential cross section $\frac{d\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross section $\frac{d\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross section $\frac{d\sigma (W\to e\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross-section $\frac{d\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross-section $\frac{d\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross-section $\frac{d\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^+$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^-$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^+$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^-$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Ratio of the $e^\pm$- and $\mu^\pm$-channel single-differential cross sections including the absolute data statistical, $e$-$\mu$-uncorrelated (including signal and background statistical) and $e$-$\mu$-correlated systematic uncertainties and the total uncertainty.

Ratio of the $e^\pm$- and $\mu^\pm$-channel double-differential cross sections including the absolute data statistical, $e$-$\mu$-uncorrelated (including signal and background statistical) and $e$-$\mu$-correlated systematic uncertainties and the total uncertainty.

Asymmetry of the $\ell^+$- and $\ell^-$-channel single-differential cross-sections including the absolute total statistical and $\ell^+$-$\ell^-$-correlated systematic uncertainties and the total uncertainty.

Asymmetry of the $\ell^+$- and $\ell^-$-channel double-differential cross sections including the absolute total statistical and $\ell^+$-$\ell^-$-correlated systematic uncertainties and the total uncertainty.

Pre-fit MC statistical uncertainties per bin. These values are used to quantify the MC statistical uncertainty contributions to the total uncertainty in $m_t$ based on elements from the covariance matrix obtained in the profile likelihood fit. Each MC statistical contribution is estimated by dividing the relevant covariance matrix entry (see Table 2) by the corresponding pre-fit MC statistical uncertainty for that bin.

The contribution of each source of systematic uncertainty to the total uncertainty in $m_t$ is provided. Each source's contribution is taken directly from the relevant element of the covariance matrix for the profile likelihood fit to $\overline{m_J}$, $m_{jj}$, and $m_{tj}$ using data. The sign of the effect of each uncertainty is included.

The fitted $m_t$ is provided for each replica generated using bootstrapping. Each replica is a 3D histogram of $m_{J}$, $m_{jj}$, and $m_{tj}$, where $m_{J}$ has 50 bins between 145.0 GeV and 205.0 GeV. This method uses the BootstrapGenerator class in ROOT to initialise a pseudo-random number generator for each event, which is seeded by the value of the eventNumber and runNumber variables for a given event in the input dataset. The pseudo-random numbers are drawn from a Poisson distribution with rate parameter equal to 1. These are used to fluctuate the amount by which each replica histogram is filled. There are 1000 replicas, numbered from 0 to 999.

The contour for the excluded mass--lifetime region for stau pair production obtained with the di-track search. All masses and lifetimes shown that are below the curve and above 200 GeV are excluded by the observed data (while the expected exclusion is between the upper curve down to 210 GeV for lifetimes above 3000 ns). The sensitivity extends indefinitely to longer lifetimes.

The contour for the excluded mass--lifetime region for stau pair production obtained with the di-track search. All masses and lifetimes shown that are below the curve and above 200 GeV are excluded by the observed data (while the expected exclusion is between the upper curve down to 210 GeV for lifetimes above 3000 ns). The sensitivity extends indefinitely to longer lifetimes.

The contour for the excluded mass--lifetime region for stau pair production obtained with the di-track search. All masses and lifetimes shown that are below the curve and above 200 GeV are excluded by the observed data (while the expected exclusion is between the upper curve down to 210 GeV for lifetimes above 3000 ns). The sensitivity extends indefinitely to longer lifetimes.

The distribution of data and predicted background in the di-track Exclusion-SR. The observed data events are indicated as magenta circles if they are inside the mass-compatibility angle (shown as grey lines) and as orange diamonds if they are outside, while the blue area is the mass distribution of the expected background. The last bins include overflow events

The distribution of data and predicted background in the di-track Exclusion-SR. The observed data events are indicated as magenta circles if they are inside the mass-compatibility angle (shown as grey lines) and as orange diamonds if they are outside, while the blue area is the mass distribution of the expected background. The last bins include overflow events

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

Expected and observed upper limits for the b-quark-associated Higgs boson production cross section times branching fraction of the decay into a b quark pair at 95% CL as functions of $m_\phi$ for the 2018 FH category. The vertical dashed lines indicate the boundaries of usage of the different fit ranges, as reflected in the rightmost column of Table 2.

Expected and observed upper limits for the b-quark-associated Higgs boson production cross section times branching fraction of the decay into a b quark pair at 95% CL as functions of $m_\phi$, corresponding to the Run 2 combination. The vertical dashed line separates the mass range where only the 2017 SL category contributes on its left, from the region where also the 2017 FH and 2018 FH categories contribute on its right. The expected limits from the 2017 SL, 2017 FH, and 2018 FH datasets as well as from the previously published result based on the 2016 dataset are also shown as colored lines.

Interpretation in the $M_h^{125}$ scenario of the MSSM: observed and expected upper limits at 95% CL on the parameter tan(beta) as functions of the mass of the CP-odd boson, $m_{A}$. The higgsino mass parameter has been set to $\mu = +1$ TeV. The hashed area indicates the parameter region in which the mass of the lightest MSSM Higgs boson does not coincide with 125 GeV within a margin of 3 GeV.

Interpretation in the $M_h^{125}$ scenario of the MSSM: observed and expected upper limits at 95% CL on the parameter tan(beta) as functions of the mass of the CP-odd boson, $m_{A}$. The higgsino mass parameter has been set to $\mu = -1$ TeV. The hashed area indicates the parameter region in which the mass of the lightest MSSM Higgs boson does not coincide with 125 GeV within a margin of 3 GeV.

Interpretation in the $M_h^{125}$ scenario of the MSSM: observed and expected upper limits at 95% CL on the parameter tan(beta) as functions of the mass of the CP-odd boson, $m_{A}$. The higgsino mass parameter has been set to $\mu = -2$ TeV. The hashed area indicates the parameter region in which the mass of the lightest MSSM Higgs boson does not coincide with 125 GeV within a margin of 3 GeV.

Interpretation in the $M_h^{125}$ scenario of the MSSM: observed and expected upper limits at 95% CL on the parameter tan(beta) as functions of the mass of the CP-odd boson, $m_{A}$. The higgsino mass parameter has been set to $\mu = -3$ TeV. The hashed area indicates the parameter region in which the mass of the lightest MSSM Higgs boson does not coincide with 125 GeV within a margin of 3 GeV.

Interpretation in the $m_h^{mod+}$ scenario of the MSSM: observed and expected upper limits at 95% CL on the parameter tan(beta) as functions of the mass of the CP-odd boson, $m_{A}$. The hashed area indicates the parameter region in which the mass of the lightest MSSM Higgs boson does not coincide with 125 GeV within a margin of 3 GeV.

Interpretation in the hMSSM scenario of the MSSM: observed and expected upper limits at 95% CL on the parameter tan(beta) as functions of the mass of the CP-odd boson, $m_{A}$.

Interpretation in 2HDM scenarios: observed and expected upper limits at 95% CL on the parameter tan(beta) as a function of $m_{A}$ for cos(beta-alpha) = 0.1, for the 2HDM $\it Type-II$ scenario.

Interpretation in 2HDM scenarios: observed and expected upper limits at 95% CL on the parameter tan(beta) as functions of cos(beta-alpha) for masses of $m_{A} = m_{H} = 300$ GeV, for the 2HDM $\it Type-II$ scenario.

Interpretation in 2HDM scenarios: observed and expected upper limits at 95% CL on the parameter tan(beta) as a function of $m_{A}$ for cos(beta-alpha) = 0.1, for the 2HDM $\it Flipped$ scenario.

Interpretation in 2HDM scenarios: observed and expected upper limits at 95% CL on the parameter tan(beta) as functions of cos(beta-alpha) for masses of $m_{A} = m_{H} = 300$ GeV, for the 2HDM $\it Flipped$ scenario.

Interpretation in the 2HDM flipped scenario: observed and expected upper limits at 95% CL on the parameter tan(beta) as functions of cos(beta-alpha) for mass of $m_{A} = m_{H} = 140$ GeV.

Interpretation in the 2HDM flipped scenario: observed and expected upper limits at 95% CL on the parameter tan(beta) as functions of cos(beta-alpha) for mass of $m_{A} = m_{H} = 600$ GeV.

Interpretation in the 2HDM flipped scenario: observed and expected upper limits at 95% CL on the parameter tan(beta) as functions of cos(beta-alpha) for mass of $m_{A} = m_{H} = 900$ GeV.

Interpretation in the 2HDM flipped scenario: observed and expected upper limits at 95% CL on the parameter tan(beta) as functions of cos(beta-alpha) for mass of $m_{A} = m_{H} = 1200$ GeV.

Simulated signal shapes for three representative values of the Higgs boson mass $m_\phi$ in the 2017 SL channel.

Simulated signal shapes for three representative values of the Higgs boson mass $m_\phi$ in the 2017 FH channel.

Simulated signal shapes for three representative values of the Higgs boson mass $m_\phi$ in the 2018 FH channel.

Background-only fits to the M12 distribution in each fit range of the 2017 analysis in the SL category

Background-only fits to the M12 distribution in each fit range of the 2017 analysis in the SL category

Background-only fits to the M12 distribution in each fit range of the 2017 analysis in the SL category

Background-only fits to the M12 distribution in each fit range of the 2017 analysis in the FH category

Background-only fits to the M12 distribution in each fit range of the 2017 analysis in the FH category

Background-only fits to the M12 distribution in each fit range of the 2017 analysis in the FH category

Background-only fits to the M12 distribution in each fit range of the 2017 analysis in the FH category

Background-only fits to the M12 distribution in each fit range of the 2018 analysis in the FH category

Background-only fits to the M12 distribution in each fit range of the 2018 analysis in the FH category

Background-only fits to the M12 distribution in each fit range of the 2018 analysis in the FH category

Background-only fits to the M12 distribution in each fit range of the 2018 analysis in the FH category

Suppl. Fig. 7. The reconstructed shower angle for all single photon events. The individual signal and background event type categories added together form the unconstrained prediction.

Suppl. Fig. 7. The constrained covariance matrix for the reconstructed shower angle for all single-photon events. The matrix shows uncertainties and correlations between bins due to flux uncertainties, cross-section uncertainties, hadron reinteraction uncertainties, detector systematic uncertainties, Monte-Carlo statistical uncertainties, and dirt (outside cryostat) uncertainties. Data statistical uncertainties are not included. An example of how to add Pearson data statistical uncertainties can be found in the example code repository.

Suppl. Fig. 7. The unconstrained covariance matrix for reconstructed shower angle for all single-photon events. The matrix shows uncertainties and correlations between bins due to flux uncertainties, cross-section uncertainties, hadron reinteraction uncertainties, detector systematic uncertainties, Monte-Carlo statistical uncertainties, and dirt (outside cryostat) uncertainties. Data statistical uncertainties are not included. An example of how to add Pearson data statistical uncertainties can be found in the example code repository.

Fig. 3. The reconstructed number of protons, with a proton KE energy threshold of 35 MeV, for all single-photon events. The individual signal and background event type categories added together form the unconstrained prediction.

Fig. 4, Suppl. Fig. 8. The reconstructed shower energy for zero proton events binned from 0 to 600 MeV. The individual signal and background event type categories added together form the unconstrained prediction.

Fig. 4. The constrained covariance matrix for the reconstructed shower energy for zero proton events binned from 0 to 600 MeV. The matrix shows uncertainties and correlations between bins due to flux uncertainties, cross-section uncertainties, hadron reinteraction uncertainties, detector systematic uncertainties, Monte-Carlo statistical uncertainties, and dirt (outside cryostat) uncertainties. Data statistical uncertainties are not included. An example of how to add Pearson data statistical uncertainties can be found in the example code repository.

Fig. 4. The unconstrained covariance matrix for reconstructed shower energy for zero proton events binned from 0 to 600 MeV. The matrix shows uncertainties and correlations between bins due to flux uncertainties, cross-section uncertainties, hadron reinteraction uncertainties, detector systematic uncertainties, Monte-Carlo statistical uncertainties, and dirt (outside cryostat) uncertainties. Data statistical uncertainties are not included. An example of how to add Pearson data statistical uncertainties can be found in the example code repository.

Fig. 6. The reconstructed shower energy for zero proton events binned from 150 to 1250 MeV, with LEE prediction. The individual signal and background event type categories added together form the unconstrained prediction. The "LEE" category is the unfolded MiniBooNE LEE model prediction scaled under the neutrino-target nucleon interaction assumption.

Fig. 6. The constrained covariance matrix for the reconstructed shower energy for zero proton events binned from 150 to 1250 MeV. Both with and without the LEE model added. The matrix shows uncertainties and correlations between bins due to flux uncertainties, cross-section uncertainties, hadron reinteraction uncertainties, detector systematic uncertainties, Monte-Carlo statistical uncertainties, and dirt (outside cryostat) uncertainties. Data statistical uncertainties are not included. An example of how to add Pearson data statistical uncertainties can be found in the example code repository.

Fig. 6. The unconstrained covariance matrix for reconstructed shower energy for zero proton events binned from 150 to 1250 MeV. Both with and without the LEE model added. The matrix shows uncertainties and correlations between bins due to flux uncertainties, cross-section uncertainties, hadron reinteraction uncertainties, detector systematic uncertainties, Monte-Carlo statistical uncertainties, and dirt (outside cryostat) uncertainties. Data statistical uncertainties are not included. An example of how to add Pearson data statistical uncertainties can be found in the example code repository.

Suppl. Fig. 10. The reconstructed shower backwards projected distance for zero proton events. The individual signal and background event type categories added together form the unconstrained prediction.

Suppl. Fig. 9. The reconstructed shower angle for zero proton events. Includes LEE model prediction. The individual signal and background event type categories added together form the unconstrained prediction. The "LEE" category is the unfolded MiniBooNE LEE model prediction scaled under the neutrino-target nucleon interaction assumption.

Suppl. Fig. 9. The constrained covariance matrix for the reconstructed shower angle for zero proton events. The matrix shows uncertainties and correlations between bins due to flux uncertainties, cross-section uncertainties, hadron reinteraction uncertainties, detector systematic uncertainties, Monte-Carlo statistical uncertainties, and dirt (outside cryostat) uncertainties. Data statistical uncertainties are not included. An example of how to add Pearson data statistical uncertainties can be found in the example code repository.

Suppl. Fig. 9. The unconstrained covariance matrix for reconstructed shower angle for zero proton events. The matrix shows uncertainties and correlations between bins due to flux uncertainties, cross-section uncertainties, hadron reinteraction uncertainties, detector systematic uncertainties, Monte-Carlo statistical uncertainties, and dirt (outside cryostat) uncertainties. Data statistical uncertainties are not included. An example of how to add Pearson data statistical uncertainties can be found in the example code repository.

1$\gamma$Xp shower energy and angle selection efficiencies for true 1$\gamma$Xp events. NaN values indicate a "divide by zero" case where zero events were present in the bin before any selection was applied. Energy and Angle values represent bin lower edges.

1$\gamma$0p shower energy and angle selection efficiencies for true single-photon events with no other true particles of any energy. NaN values indicate a "divide by zero" case where zero events were present in the bin before any selection was applied. Energy and Angle values represent bin lower edges.