The charge asymmetry has been measured using $19,039W$ decays recorded by the CDF detector during the 1992-93 run of the Tevatron Collider. The asymmetry is sensitive to the ratio of $d$ and $u$ quark distributions to $x<0.01$ at $Q~2 \approx M_W~2$, where nonperturbative effects are minimal. It is found that of the two current sets of parton distributions, those of Martin, Roberts and Stirling (MRS) are favored over the sets most recently produced by the CTEQ collaboration. The $W$ asymmetry data provide a stronger constraints on $d/u$ ratio than the recent measurements of $F_2~{\mu n}/F_2~{\mu p}$ which are limited by uncertainties originating from deutron corrections.
Charge asymmetry defined as (DSIG(Q=L+)/DYRAP - DSIG(Q=L-)/DYRAP)/ (DSIG(Q=L+)/DYRAP + DSIG(Q=L-)/DYRAP). Here LEPTON are E and MU.
The charge asymmetry of leptons from W-boson decay has been measured using p¯p data from the Collider Detector at Fermilab at √s =1.8 TeV. The observed asymmetry is well described by most of the available parton distributions.
Electrons in the central region.
Muons in the central region.
Plug electrons.
Measurements of the differential cross sections for e + e − →μ + μ − and e + e − →τ + τ − at values of s from 52 to 57 GeV are reported. The forward-backward asymmetries and the total cross sections for these reactions are found to be in agreement with predictions of the standard model of the electro-weak interactions. These measurements are used to extract values of the weak coupling constant g v e g v l and g A e g A l , where l = μ or τ .
Axis error includes +- 5/5 contribution (Included in the quoted errors for the total cross sections. The main contribution to SYS-ERR are the systematic uncertainty in the luminosity measurement and the uncertainty in the computer modeling of the various efficiencies and backgrounds).
Axis error includes +- 5/5 contribution (Included in the quoted errors for the total cross sections. The main contribution to SYS-ERR are the systematic uncertainty in the luminosity measurement and the uncertainty in the computer modeling of the various efficiencies and backgrounds).
No description provided.