Comparison of the $m_{miss}$ shapes for the simulated signal events within the fiducial region and those outside it, after including the effect of PU protons as describe in the text, for a generated $m_{X}$ mass of 1000 GeV. The distributions are shown for single(+z)-single(−z) proton reconstruction categories.

Product of the acceptance times the combined reconstruction and identification efficiency, as a function of $m_{X}$ , for events generated inside the fiducial volume defined in Table 1. The curves shown panel display the different final states. The definition of the fiducial region and signal model used to estimate the acceptance is provided in the text.

Product of the acceptance times the combined reconstruction and identification efficiency, as a function of $m_{X}$ , for different proton reconstruction categories in the $Z \rightarrow \mu\mu $ analysis, and for events generated inside the fiducial volume defined in Table 1. The curves shown panel display the different final states. The definition of the fiducial region and signal model used to estimate the acceptance is provided in the text.

Distributions of the reconstructed proton $\xi$ in the negative arm from the proton mixing procedure with simulated MC events, are compared to data. The ee final states are shown.The ee events are displayed without the Z boson $p_T$ requirement.For illustration, the simulated signal distributions are superimposed for various choices of $m_{X}$ , normalised to a generated fiducial cross section of 100 pb.

Distributions of the reconstructed proton $\xi$ in the positive arm from the proton mixing procedure with simulated MC events, are compared to data. The ee final states are shown.The ee events are displayed without the Z boson $p_T$ requirement.For illustration, the simulated signal distributions are superimposed for various choices of $m_{X}$ , normalised to a generated fiducial cross section of 100 pb.

Distributions of the reconstructed di-proton rapidity from the proton mixing procedure with simulated MC events, are compared to data. The ee final states are shown.The ee events are displayed without the Z boson $p_T$ requirement.For illustration, the simulated signal distributions are superimposed for various choices of $m_{X}$ , normalised to a generated fiducial cross section of 100 pb.

Distributions of the reconstructed proton $\xi$ in the negative arm from the proton mixing procedure with simulated MC events, are compared to data. The $\mu\mu$ final states are shown.The $\mu\mu$ events are displayed without the Z boson $p_T$ requirement.For illustration, the simulated signal distributions are superimposed for various choices of $m_{X}$ , normalised to a generated fiducial cross section of 100 pb.

Distributions of the reconstructed proton $\xi$ in the positive arm from the proton mixing procedure with simulated MC events, are compared to data. The $\mu\mu$ final states are shown.The $\mu\mu$ events are displayed without the Z boson $p_T$ requirement.For illustration, the simulated signal distributions are superimposed for various choices of $m_{X}$ , normalised to a generated fiducial cross section of 100 pb.

Distributions of the reconstructed di-proton rapidity from the proton mixing procedure with simulated MC events, are compared to data. The $\mu\mu$ final states are shown.The $\mu\mu$ events are displayed without the Z boson $p_T$ requirement.For illustration, the simulated signal distributions are superimposed for various choices of $m_{X}$ , normalised to a generated fiducial cross section of 100 pb.

Distributions of the reconstructed proton $\xi$ in the negative arm from the proton mixing procedure with simulated MC events, are compared to data. The $\gamma$ final states are shown.For illustration, the simulated signal distributions are superimposed for various choices of $m_{X}$ , normalised to a generated fiducial cross section of 100 pb.

Distributions of the reconstructed proton $\xi$ in the positive arm from the proton mixing procedure with simulated MC events, are compared to data. The $\gamma$ final states are shown.For illustration, the simulated signal distributions are superimposed for various choices of $m_{X}$ , normalised to a generated fiducial cross section of 100 pb.

Distributions of the reconstructed di-proton rapidity from the proton mixing procedure with simulated MC events, are compared to data. The $\gamma$ final states are shown.For illustration, the simulated signal distributions are superimposed for various choices of $m_{X}$ , normalised to a generated fiducial cross section of 100 pb.

Validation of the background modelling method, using the $e\mu$ control sample. Selected $e\mu$ events are mixed with protons from $Z\rightarrow \mu \mu$ events with $p_{T}(Z)<10$ GeV to simulate the combinatorial background shape, while the data points are unaltered $e\mu$ events. The proton $\xi$ distribution for the positive CT-PPS arm is shown.

Validation of the background modelling method, using the $e\mu$ control sample. Selected $e\mu$ events are mixed with protons from $Z\rightarrow \mu \mu$ events with $p_{T}(Z)<10$ GeV to simulate the combinatorial background shape, while the data points are unaltered $e\mu$ events. The proton $\xi$ distribution for the negative CT-PPS arm is shown.

Validation of the background modelling method, using the $e\mu$ control sample. Selected $e\mu$ events are mixed with protons from $Z\rightarrow \mu \mu$ events with $p_{T}(Z)<10$ GeV to simulate the combinatorial background shape, while the data points are unaltered $e\mu$ events. The di-proton invariant mass is shown.

Validation of the background modelling method, using the $e\mu$ control sample. Selected $e\mu$ events are mixed with protons from $Z\rightarrow \mu \mu$ events with $p_{T}(Z)<10$ GeV to simulate the combinatorial background shape, while the data points are unaltered $e\mu$ events. The $m_{miss}$ is shown.

$m_{miss}$ distributions in the $pp\rightarrow ppZeeX$, with the protons reconstructed with the multi(+z)-multi(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 1 pb.

$m_{miss}$ distributions in the $pp\rightarrow ppZeeX$, with the protons reconstructed with the multi(+z)-single(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 1 pb.

$m_{miss}$ distributions in the $pp\rightarrow ppZeeX$, with the protons reconstructed with the single(+z)-multi(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 1 pb.

$m_{miss}$ distributions in the $pp\rightarrow ppZeeX$, with the protons reconstructed with the single(+z)-single(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 1 pb.

$m_{miss}$ distributions in the $pp\rightarrow ppZ\mu\mu X$, with the protons reconstructed with the multi(+z)-multi(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 1 pb.

$m_{miss}$ distributions in the $pp\rightarrow ppZ\mu\mu X$, with the protons reconstructed with the multi(+z)-single(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 1 pb.

$m_{miss}$ distributions in the $pp\rightarrow ppZ\mu\mu X$, with the protons reconstructed with the single(+z)-multi(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 1 pb.

$m_{miss}$ distributions in the $pp\rightarrow ppZ\mu\mu X$, with the protons reconstructed with the single(+z)-single(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 1 pb.

$m_{miss}$ distributions in the $pp\rightarrow pp\gamma X$, with the protons reconstructed with the multi(+z)-multi(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 10 pb.

$m_{miss}$ distributions in the $pp\rightarrow pp\gamma X$, with the protons reconstructed with the multi(+z)-single(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 10 pb.

$m_{miss}$ distributions in the $pp\rightarrow pp\gamma X$, with the protons reconstructed with the single(+z)-multi(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 10 pb.

$m_{miss}$ distributions in the $pp\rightarrow pp\gamma X$, with the protons reconstructed with the single(+z)-single(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 10 pb.

Upper limits on the $pp\rightarrow ppZ/\gamma X$ cross section at 95% CL, as a function of $m_X$. The 68 and 95% central intervals of the expected limits are represented by the green and yellow bands, respectively, while the observed limit is superimposed as a curve. The plot corresponds to the $Z\rightarrow ee$ analysis.

Upper limits on the $pp\rightarrow ppZ/\gamma X$ cross section at 95% CL, as a function of $m_X$. The 68 and 95% central intervals of the expected limits are represented by the green and yellow bands, respectively, while the observed limit is superimposed as a curve. The plot corresponds to the $Z\rightarrow \mu\mu$ analysis.

Upper limits on the $pp\rightarrow ppZ/\gamma X$ cross section at 95% CL, as a function of $m_X$. The 68 and 95% central intervals of the expected limits are represented by the green and yellow bands, respectively, while the observed limit is superimposed as a curve. The plot corresponds to the $Z$ analysis.

Upper limits on the $pp\rightarrow ppZ/\gamma X$ cross section at 95% CL, as a function of $m_X$. The 68 and 95% central intervals of the expected limits are represented by the green and yellow bands, respectively, while the observed limit is superimposed as a curve. The plot corresponds to the $\gamma$ analysis.

Electron $p_{T}$ distribution using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

$p_{T}^{miss}$ distribution in the electron channel using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

Muon $p_T$ distribution using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

$p_T^{miss}$ distribution in the muon channel using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

$M_T$ distribution for the E+INVISIBLE system using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

$M_T$ distribution for the MU+INVISIBLE system using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

Theoretical prediction for the production and decay cross-section of SSM WPRIME bosons (W --> LEPTON + NU) as a function of the WPRIME mass, for the range 200-6400 GeV and inclusive in phase-space (no cuts). The uncertainty shown covers PDF and ALPHAS uncertainties. These theoretical predictions are obtained with PYTHIA (LO) and corrected to NNLO in QCD using FEWZ program.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the product of WPRIME cross-section production and BF(WPRIME --> LEPTON + NU) for an SSM WPRIME boson, as a function of the boson mass, for the electron decay channel. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits. The theoretical predictions for the SSM at NNLO precision in QCD are shown with narrow gray bands corresponding to the PDF and ALPHAS uncertainties.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the product of WPRIME cross-section production and BF(WPRIME --> LEPTON + NU) for an SSM WPRIME boson, as a function of the boson mass, for the muon decay channel. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits. The theoretical predictions for the SSM at NNLO precision in QCD are shown with narrow gray bands corresponding to the PDF and ALPHAS uncertainties.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the product of WPRIME cross-section production and BF(WPRIME --> LEPTON + NU) for an SSM WPRIME boson, as a function of the boson mass, for the combined electron and muon decay channels. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits. The theoretical predictions for the SSM at NNLO precision in QCD are shown with narrow gray bands corresponding to the PDF and ALPHAS uncertainties.

The 95% CL observed (solid line) and expected (dashed line) model independent cross section upper limits as function of the $MT_{min}$ threshold, for the electron decay channel. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits.

The 95% CL observed (solid line) and expected (dashed line) model independent cross section upper limits as function of the $MT_{min}$ threshold, for the muon decay channel. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits.

The 95% CL observed (solid line) and expected (dashed line) model independent cross section upper limits as function of the $MT_{min}$ threshold, for the combined electron and muon decay channels. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the coupling strength ratio, gWprime/gW as a function of the mass of the WPRIME boson, for the electron channel. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The area above the limit curve is excluded. The dotted line represents the case of SSM coupling, gWprime, being equal to gW, the SM coupling.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the coupling strength ratio, gWprime/gW, as a function of the mass of the WPRIME boson, for the muon channel. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The area above the limit curve is excluded. The dotted line represents the case of SSM coupling, gWprime , being equal to gW, the SM coupling.

Exclusion limits in the 2D plane (1/R, $\mu$) for the split-UED interpretation for the n = 2 case, for the electron channel for the 2016-2018 data sets. R is the radius of the additional spatial dimension and $\mu$ the bulk mass for the fermion field in five dimensions. The expected limit is depicted as a black dashed line. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The experimentally excluded region is the entire area to the left of the solid black line.

Exclusion limits in the 2D plane (1/R, $\mu$) for the split-UED interpretation for the n = 2 case, for the muon channel for the 2016-2018 data sets. R is the radius of the additional spatial dimension and $\mu$ the bulk mass for the fermion field in five dimensions. The expected limit is depicted as a black dashed line. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The experimentally excluded region is the entire area to the left of the solid black line.

Exclusion limits in the 2D plane (1/R, $\mu$) for the split-UED interpretation for the n = 2 case, for the combined electron and muon channels for the 2016-2018 data sets. R is the radius of the additional spatial dimension and $\mu$ the bulk mass for the fermion field in five dimensions. The expected limit is depicted as a black dashed line. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The experimentally excluded region is the entire area to the left of the solid black line.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the ${\lambda}_{231}$ coupling in the RPV SUSY model with a STAU mediator, as a function of the mass of STAU, for the electron channel and for the production coupling, ${\lambda}^{'}_{3ij}$=0.5 . The couplings ${\lambda}^{'}_{3ij}$, ${\lambda}_{231}$, and ${\lambda}_{132}$ are defined in Fig. 1. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The area above the limit curve is excluded. Limits for other values of ${\lambda}^{'}_{3ij}$ are obtained multiplying the ones shown by the ratio ${\lambda}^{'}_{3ij}$/0.5

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the ${\lambda}_{132}$ coupling in the RPV SUSY model with a stau mediator, as a function of the mass of the stau, for the muon channel and for the production coupling, ${\lambda}^{'}_{3ij}$ = 0.5 . The couplings ${\lambda}^{'}_{3ij}$, ${\lambda}_{231}$, and ${\lambda}_{132}$ are defined in Fig. 1. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The area above the limit curve is excluded. Limits for other values of ${\lambda}^{'}_{3ij}$ are obtained multiplying these ones by the ratio ${\lambda}^{'}_{3ij}$/0.5

Region in the oblique (W,Y) parameter phase space allowed by the current analysis at 95% CL. The combination of the electron and muon channel distributions from the 2017 and 2018 data sets at sqrt(s) = 13 TeV is used, having 101 fb-1 of luminosity.

Negative Log-Likelihood for the determination of the oblique W parameter, for the combination of the electron and muon channel and for 2017 and 2018 data sets (L=101 fb-1) at sqrt(s) = 13 TeV.

Total background estimate and observed data in all bins used in the limit calculation for the SSM WPRIME limits. The total event sample is split into the three years of data taking and the two lepton flavors.The distributions being shown are $M_T$ ones. The associated integrated luminosities for each year are of 35.9, 41.5, and 59.4 fb$̣^{-1}. The mass bins are numbered in ascending order.

Observed and expected 95% CL upper limits on the product of the production cross section ($\sigma$) and the branching fraction, obtained after combining all categories with 138 $\mathrm{fb}^{−1}$ of data at $\sqrt{s}$ = 13 TeV for $\mathrm{V'}$ to $VV$ + $VH$ signal in HVT model C.

Total signal efficiency including all event categories as a function of the resonance mass $M_X$ for all DY/ggF signal models under consideration. The estimates from MC simulation (markers) are interpolated with a functional form (lines).

Total signal efficiency including all event categories as a function of the resonance mass $M_X$ for all VBF signal models under consideration. The estimates from MC simulation (markers) are interpolated with a functional form (lines).

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=1600\;\mathrm{GeV}$.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=2000\;\mathrm{GeV}$.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=2200\;\mathrm{GeV}$.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=2400\;\mathrm{GeV}$.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=2600\;\mathrm{GeV}$.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=2800\;\mathrm{GeV}$.

Expected event yields in each $m_{jj}$ bin for the different background processes in the SR of the VTR category, in the 2017 and 2018 samples. The background yields and the corresponding uncertainties are obtained after performing a combined fit across all of the CRs and SR. The expected signal contributions for a Higgs boson, produced in the non-VBF and VBF modes, decaying to invisible particles with a branching fraction of $\mathcal{B}(\text{H} \to \text{inv}) = 1$, and the observed event yields are also reported.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2017, signal region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2017, dimuon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2018, signal region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2018, dimuon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2017, signal region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2017, dimuon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2018, signal region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2018, single electron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2018, dielectron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2018, dimuon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2017, photon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2018, photon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2017, single electron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2017, single muon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2017, dielectron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2018, single electron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2018, single muon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2018, dielectron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2017, single electron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2017, single muon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2017, dielectron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2018, single muon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Trigger efficiency measured as a function of $p_{T}^{miss}$ in data for the 2017 and 2018 samples for the MTR category. The efficiency is measured in a phase space with at least two jets in which the leading (trailing) jet has $p_{T}>80~\text{GeV}$ ($>40~\text{GeV}$). The two jets are required to form a system with $m_{jj}>200~\text{GeV}$ and $\Delta\Phi_{jj}<1.5$.

Trigger efficiency measured as a function of $p_{T}^{miss}$ in data for the 2017 and 2018 samples for the MTR category. The efficiency is measured in a phase space with at least two jets in which the leading (trailing) jet has $p_{T}>140~\text{GeV}$ ($>70~\text{GeV}$). The two jets are required to form a system with $m_{jj}>900~\text{GeV}$ and $\Delta\Phi_{jj}<1.8$.

Theory cross sections vs m($\widetilde{\chi}^0_1$) for SMS model TChiHH-G, $\widetilde{\chi}^0_1, \widetilde{\chi}^0_2$ NLSPs only.

The 95% CL observed and expected upper limits on the production cross sections of the TChiHH signal model as a function of the $\widetilde{\chi}^0_2$ and $\widetilde{\chi}^0_1$ masses. Relative to Fig. 13, the binning of the table is adjusted to align with the model points that were sampled. In addition, a small correction has been applied that affects the cross section upper limits for points with $m(\widetilde{\chi}^0_1) = 1$ GeV. For that row of points in the figure, the small region of model phase space reached by both the resolved and boosted selections was inadvertently double counted in computing the signal contribution to the predicted yield.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Cross section, 95% CL upper limit plus theory vs m($\widetilde{g}$) for SMS model T5HH.

Pre-fit background covariance matrix $\sigma_{xy}$ for the 22 analysis bins, ordered as in Fig. 10.

Pre-fit background correlation matrix $\rho_{xy}$ for the 22 analysis bins, ordered as in Fig. 10.

Significance vs $(m(\widetilde{\chi}^0_2), m(\widetilde{\chi}^0_1))$ for SMS model TChiHH.

Significance vs $m(\widetilde{g})$ for SMS model T5HH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $275, $m(\widetilde{\chi}^0_1) = $1) for SMS model TChiHH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $300, $m(\widetilde{\chi}^0_1) = $1) for SMS model TChiHH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $300, $m(\widetilde{\chi}^0_1) = $50) for SMS model TChiHH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $450, $m(\widetilde{\chi}^0_1) = $1) for SMS model TChiHH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $750, $m(\widetilde{\chi}^0_1) = $1) for SMS model TChiHH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $750, $m(\widetilde{\chi}^0_1) = $200) for SMS model TChiHH.

Efficiency vs $m(\widetilde{\chi}^0_1)$ for SMS model TChiHH-G. The denominator includes all 22 signal regions, and assumes $\mathcal{B}(\mathrm{H}$-->$\mathrm{b}\overline{\mathrm{b}})=100\%$.

Efficiency vs $m(\widetilde{g})$ for SMS model T5HH. The denominator includes all 22 signal regions, and no constraint on $\mathcal{B}(\mathrm{H}$-->$\mathrm{b}\overline{\mathrm{b}})$.

Efficiency vs $(m(\widetilde{\chi}^0_2), m(\widetilde{\chi}^0_1))$ for SMS model TChiHH. The denominator includes all 22 signal regions, and assumes $\mathcal{B}(\mathrm{H}$-->$\mathrm{b}\overline{\mathrm{b}})=100\%$.

Signal and control region populations for the resolved signature.

Signal and control region populations for the boosted signature.

Cut flow table for the resolved topology showing expected event yields at 137 fb$^{-1}$ for selected signal models as successive selections are applied.

Cut flow table for the boosted topology showing expected event yields at 137 fb$^{-1}$ for selected signal model points as successive selections are applied. Here the hadronic baseline is defined by $N_{\mathrm{jet}}\geq$2, \ptmiss$>$300 GeV, $\Delta\phi$ cuts, and the isolated lepton and track vetoes.

Product of efficiency and acceptance of the event selection for T signal events as a function of the particle mass $m_\mathrm{T}$ and width $\Gamma$ for the different hypotheses considered.

Product of efficiency and acceptance of the event selection for T signal events as a function of the particle mass $m_\mathrm{T}$ and width $\Gamma$ for the different hypotheses considered.

Product of efficiency and acceptance of the event selection for T signal events as a function of the particle mass $m_\mathrm{T}$ and width $\Gamma$ for the different hypotheses considered.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Observed and expected 95% CL upper limits on the product of the cross section and branching fraction of a T decaying to a hadronic top quark and a Z boson to neutrinos as a function of the T mass, for a T with a width of 0.01 $ imes$ its mass.

Observed and expected 95% CL upper limits on the product of the cross section and branching fraction of a T decaying to a hadronic top quark and a Z boson to neutrinos as a function of the T mass, for a T with a width of 0.1 $ imes$ its mass.

Observed and expected 95% CL upper limits on the product of the cross section and branching fraction of a T decaying to a hadronic top quark and a Z boson to neutrinos as a function of the T mass, for a T with a width of 0.2 $ imes$ its mass.

Observed and expected 95% CL upper limits on the product of the cross section and branching fraction of a T decaying to a hadronic top quark and a Z boson to neutrinos as a function of the T mass, for a T with a width of 0.3 $ imes$ its mass.

Model independent observed 95% CL upper limits on the product of the cross section and branching fraction of a T decaying to a top quark and a Z boson as a function of the T mass and width.

Singlet model 95% CL excluded values of the product of the cross section and branching fraction for a T decaying to a top quark and a Z boson.

The normalized distribution of the characteristic variable $\Delta\phi_{\text{min}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the characteristic variable $\Delta\phi_{\text{min}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the characteristic variable $\Delta\phi_{\text{min}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $m_{\text{SD}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $m_{\text{SD}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $m_{\text{SD}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $D_{p_{\text{T}}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $D_{p_{\text{T}}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $D_{p_{\text{T}}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized BDT discriminator distribution for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models.

The normalized BDT discriminator distribution for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models.

The normalized BDT discriminator distribution for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The $m_{\text{T}}$ distribution for the high-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{3}(x) = \exp(p_{1}x)x^{p_{2}(1+p_{3}\ln(x))}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{3}(x) = \exp(p_{1}x)x^{p_{2}(1+p_{3}\ln(x))}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{3}(x) = \exp(p_{1}x)x^{p_{2}(1+p_{3}\ln(x))}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The 95% CL upper limits on the product of the cross section and branching fraction from the inclusive search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the inclusive search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the inclusive search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the BDT-based search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the BDT-based search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the BDT-based search for the $\alpha_{\text{dark}}$ variations.

The three two-dimensional signal model parameter scans.

The three two-dimensional signal model parameter scans.

The three two-dimensional signal model parameter scans.

Metrics representing the performance of the BDT for the benchmark signal model ($m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$), compared to each of the major SM background processes.

Metrics representing the performance of the BDT for the benchmark signal model ($m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$), compared to each of the major SM background processes.

Metrics representing the performance of the BDT for the benchmark signal model ($m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$), compared to each of the major SM background processes.

The range of effects on the signal yield for each systematic uncertainty and the total. Values less than 0.01% are rounded to 0.0%.

The range of effects on the signal yield for each systematic uncertainty and the total. Values less than 0.01% are rounded to 0.0%.

The range of effects on the signal yield for each systematic uncertainty and the total. Values less than 0.01% are rounded to 0.0%.

The normalized distribution of the variable $m_{\text{T}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $m_{\text{T}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $m_{\text{T}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $\Delta\eta(\text{J}_{1},\text{J}_{2})$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $\Delta\eta(\text{J}_{1},\text{J}_{2})$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $\Delta\eta(\text{J}_{1},\text{J}_{2})$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $p_{\text{T}}^{\text{miss}}$ for the simulated SM backgrounds and several signal models. The $R_{\text{T}}$ requirement is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $p_{\text{T}}^{\text{miss}}$ for the simulated SM backgrounds and several signal models. The $R_{\text{T}}$ requirement is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $p_{\text{T}}^{\text{miss}}$ for the simulated SM backgrounds and several signal models. The $R_{\text{T}}$ requirement is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\text{e}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\text{e}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\text{e}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\mu}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\mu}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\mu}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of $\Delta\eta(\text{J}_{1},\text{J}_{2})$ vs. $R_{\text{T}}$ for the simulated QCD background. The preselection requirements on both variables are omitted, but all other preselection requirements are applied.

The normalized distribution of $\Delta\eta(\text{J}_{1},\text{J}_{2})$ vs. $R_{\text{T}}$ for the simulated QCD background. The preselection requirements on both variables are omitted, but all other preselection requirements are applied.

The normalized distribution of $\Delta\eta(\text{J}_{1},\text{J}_{2})$ vs. $R_{\text{T}}$ for the simulated QCD background. The preselection requirements on both variables are omitted, but all other preselection requirements are applied.

The normalized distribution of $p_{\text{T}}^{\text{miss}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $p_{\text{T}}^{\text{miss}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $p_{\text{T}}^{\text{miss}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $R_{\text{T}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $R_{\text{T}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $R_{\text{T}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distributions of the BDT input variable $\tau_{21}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{21}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{21}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{32}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{32}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{32}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{2}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{2}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{2}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{3}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{3}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{3}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $g_{\text{jet}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $g_{\text{jet}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $g_{\text{jet}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{major}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{major}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{major}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{minor}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{minor}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{minor}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\Delta\phi(\vec{J},\vec{p}_{\text{T}}^{\text{miss}})$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\Delta\phi(\vec{J},\vec{p}_{\text{T}}^{\text{miss}})$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\Delta\phi(\vec{J},\vec{p}_{\text{T}}^{\text{miss}})$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{\pm}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{\pm}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{\pm}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{e}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{e}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{e}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\mu}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\mu}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\mu}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{0}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{0}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{0}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\gamma}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\gamma}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\gamma}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

Comparison of different the dijet mass $m_{\text{J}\text{J}}$, the transverse mass $m_{\text{T}}$, and the Monte Carlo (MC) mass $m_{\text{MC}}$ for a signal model with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. No selection is applied, except that there must be at least two jets. $m_{\text{MC}}$ is computed by adding the generator-level four-vectors for invisible particles to the dijet system, to represent the achievable resolution if the invisible component were fully measured. The last bin of each histogram includes the overflow events.

Comparison of different the dijet mass $m_{\text{J}\text{J}}$, the transverse mass $m_{\text{T}}$, and the Monte Carlo (MC) mass $m_{\text{MC}}$ for a signal model with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. No selection is applied, except that there must be at least two jets. $m_{\text{MC}}$ is computed by adding the generator-level four-vectors for invisible particles to the dijet system, to represent the achievable resolution if the invisible component were fully measured. The last bin of each histogram includes the overflow events.

Comparison of different the dijet mass $m_{\text{J}\text{J}}$, the transverse mass $m_{\text{T}}$, and the Monte Carlo (MC) mass $m_{\text{MC}}$ for a signal model with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. No selection is applied, except that there must be at least two jets. $m_{\text{MC}}$ is computed by adding the generator-level four-vectors for invisible particles to the dijet system, to represent the achievable resolution if the invisible component were fully measured. The last bin of each histogram includes the overflow events.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

The proportions of each SM background process in the high-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the high-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the high-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the low-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the low-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the low-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the high-SVJ2 signal region.

The proportions of each SM background process in the high-SVJ2 signal region.

The proportions of each SM background process in the high-SVJ2 signal region.

The proportions of each SM background process in the low-SVJ2 signal region.

The proportions of each SM background process in the low-SVJ2 signal region.

The proportions of each SM background process in the low-SVJ2 signal region.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

Relative efficiencies in % for each step of the event selection process for the major background processes. Statistical uncertainties, at most 1.8%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for the major background processes. Statistical uncertainties, at most 1.8%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for the major background processes. Statistical uncertainties, at most 1.8%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.5%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.5%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.5%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 2.6%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 2.6%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 2.6%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 1.2%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 1.2%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 1.2%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.9%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.9%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.9%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Measured diferential cross sections as a function of the transverse momentum of the lepton from the W decay.

Measured diferential cross sections ratio $R=\sigma(W^+ + \overline{c}) / \sigma(W^- + c)$ as a function of the absolute value of the pseudorapidity of the lepton from the W decay.

Measured diferential cross sections ratio $R=\sigma(W^+ + \overline{c}) / \sigma(W^- + c)$ as a function of the transverse momentum of the lepton from the W decay.

Distribution of the three leading leptons flavour in the SR-WZ with uncertainties evaluated after the inclusive cross section fit

Efficiency, acceptance, and proportion of events with leptonic tau decays in WZ production

WZ fiducial cross section in the four flavour exclusive and the flavour inclusive channels

WZ total cross section extrapolated from the four flavour exclusive and the flavour inclusive channels

Distribution of the total lepton charge in the SR-WZ with uncertainties evaluated after the inclusive cross section fit

W$^{+}$Z fiducial cross section in the four flavour exclusive and the flavour inclusive channels

W$^{-}$Z fiducial cross section in the four flavour exclusive and the flavour inclusive channels

WZ charge asymmetry ratio measured on each of the four flavour exclusive and the flavour inclusive channels

Distribution of the cosine of the W polarization angle times total lepton charge in the SR-WZ with uncertainties evaluated after the W polarization fit

Distribution of the cosine of the Z polarization angle in the SR-WZ with uncertainties evaluated after the Z polarization fit

Best fits to the W and Z polarization fractions

2D confidence regions at the 68, 95, and 99% CL in the $f_O^W$-$f_{L}^W-f_R^W$ plane

2D confidence regions at the 68, 95, and 99% CL in the $f_O^Z$-$f_{L}^Z-f_R^Z$ plane

Distribution of the invariant mass of the WZ system in the SR-WZ with uncertainties evaluated after the inclusive cross section fit

Best fit values and one dimensional confidence regions in several EFT coefficients obtained from the EFT fit considering both the SM interferences and purely BSM (order $\Lambda^{-2}$ and $\Lambda^{-4}$) terms

2D confidence regions at the 68, 95, and 99% CL in the $c_{www}$-$c_{w}$ plane

2D confidence regions at the 68, 95, and 99% CL in the $c_{w}$-$c_{b}$ plane

2D confidence regions at the 68, 95, and 99% CL in the $c_{www}$-$c_{w}$ plane

Best fit values and one dimensional confidence regions in several EFT coefficients obtained from the EFT fit considering only the SM-EFT interference (order $\Lambda^{-2}$) terms

Evolution of the best fit and expected and observed 95% CI for the $c_{w}$ parameter as a function of the cutoff scale

Evolution of the best fit and expected and observed 95% CI for the $c_{b}$ parameter as a function of the cutoff scale

Evolution of the best fit and expected and observed 95% CI for the $c_{www}$ parameter as a function of the cutoff scale

Evolution of the best fit and expected and observed 95% CI for the $\tilde{c}_{www}$ parameter as a function of the cutoff scale

Evolution of the best fit and expected and observed 95% CI for the $\tilde{c}_{w}$ parameter as a function of the cutoff scale

Differential cross section with respect to the transverse momentum of the Z boson

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the $p_{T}$ of the Z boson

Response matrix for the $p_{T}$ of the Z boson obtained with POWHEG

Differential cross section with respect to the transverse momentum of the leading jet

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the $p_{T}$ of the leading jet

Response matrix for the $p_{T}$ of the leading jet obtained with POWHEG

Differential cross section with respect to the jet multiplicity

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the jet multiplicity

Response matrix for the jet multiplicity obtained with POWHEG

Differential cross section with respect to the invariant mass of the WZ system

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the invariant mass of the WZ system

Response matrix for the invariant mass of the WZ system obtained with POWHEG

Differential cross section with respect to the transverse momentum of the lepton associated to the W boson

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the $p_{T}$ of the lepton associated to the W boson

Response matrix for the $p_{T}$ of the lepton associated to the W boson obtained with POWHEG

Differential cross section with respect to the transverse momentum of the lepton associated to the W boson, W$^{+}$Z only

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the $p_{T}$ of the lepton associated to the W boson, W$^{+}$Z only

Differential cross section with respect to the transverse momentum of the lepton associated to the W boson, W$^{-}$Z only

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the $p_{T}$ of the lepton associated to the W boson, W$^{-}$Z only

Differential cross section with respect to the cosine of the W polarization angle times total lepton charge

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the cosine of the W polarization angle times total lepton charge

Response matrix for the cosine of the W polarization angle times total lepton charge obtained with POWHEG

Differential cross section with respect to the cosine of the W polarization angle times total lepton charge, W$^{+}$Z only

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the cosine of the W polarization angle times total lepton charge, W$^{+}$Z only

Differential cross section with respect to the cosine of the W polarization angle times total lepton charge, W$^{-}$Z only

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the cosine of the W polarization angle times total lepton charge, W$^{-}$Z only

Differential cross section with respect to the cosine of the Z polarization angle

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the cosine of the Z polarization angle

Response matrix for the cosine of the Z polarization angle obtained with POWHEG

Differential cross section with respect to the cosine of the Z polarization angle, W$^{+}$Z only

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the cosine of the Z polarization angle, W$^{+}$Z only

Differential cross section with respect to the cosine of the Z polarization angle, W$^{-}$Z only

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the cosine of the Z polarization angle, W$^{-}$Z only