Distribution of the MLP W+jets score in the CRs for the $T\overline{T}$ search. The observed data, predicted $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario, and the background are all shown. Statistical and systematic uncertainties in the background prediction before performing the fit to data are also shown.

Distribution of DeepAK8 jet tags in the DeepAK8 CR of the $T\overline{T}$ search. The observed data are shown using black markers, $T\overline{T}$ signals using solid lines, and background using filled histograms. Statistical and systematic uncertainties in the background prediction before performing the fit to data are shown by the hatched region.

Distribution of HT in the W+jets CR of the $T\overline{T}$ search. The observed data are shown using black markers, $T\overline{T}$ signals using solid lines, and background using filled histograms. Statistical and systematic uncertainties in the background prediction before performing the fit to data are shown by the hatched region.

Distribution of HT in the $T\overline{T}$ CR of the $T\overline{T}$ search. The observed data are shown using black markers, $T\overline{T}$ signals using solid lines, and background using filled histograms. Statistical and systematic uncertainties in the background prediction before performing the fit to data are shown by the hatched region.

Numbers of predicted and observed CR events in 2016--2018 data for the $T\overline{T}$ signal hypotheses in the single-lepton channel, after a background-only fit to data. Predicted numbers of signal events before the fit to data are included for comparison, using the singlet branching fraction scenario. Uncertainties include statistical and systematic components, and lepton flavor categories are combined with their uncertainties added in quadrature. Values in the DeepAK8 CR represent the number of large-radius jets rather than number of events.

Numbers of predicted and observed CR events in 2016--2018 data for the $B\overline{B}$ signal hypotheses in the single-lepton channel, after a background-only fit to data. Predicted numbers of signal events before the fit to data are included for comparison, using the singlet branching fraction scenario. Uncertainties include statistical and systematic components, and lepton flavor categories are combined with their uncertainties added in quadrature. Values in the DeepAK8 CR represent the number of large-radius jets rather than number of events.

Numbers of predicted and observed CR events in 2017--2018 data in the same-sign dilepton channel, after a background-only fit to data. Predicted numbers of signal events before the fit to data are included for comparison, using the singlet branching fraction scenario. Uncertainties include statistical and systematic components. Predictions for 2017 and 2018 are combined with their uncertainties added in quadrature.

Distribution of lepton $p_T$ in 2017 in the multilepton channel nonprompt lepton control region for all flavor categories, evaluated with the best-fit nonprompt rates. The uncertainty shown is the quadratic sum of statistical and systematics uncertainties.

Distribution of lepton $p_T$ in 2018 in the multilepton channel nonprompt lepton control region for all flavor categories, evaluated with the best-fit nonprompt rates. The uncertainty shown is the quadratic sum of statistical and systematics uncertainties.

Numbers of predicted and observed CR events in 2017--2018 data in the multilepton channel, after a background-only fit to data. Predicted numbers of signal events before the fit to data are included for comparison, using the singlet branching fraction scenario. Uncertainties include statistical and systematic components. Predictions for 2017 and 2018 are combined with their uncertainties added in quadrature.

Numbers of predicted and observed $T\overline{T}$ SR events in 2016--2018 data in the single-lepton channel, after a background-only fit to data. Predicted numbers of signal events before the fit to data are included for comparison, using the singlet branching fraction scenario. Uncertainties include statistical and systematic components, and lepton flavor categories are combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 1. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 2. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 3. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 4. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 5. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 6. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 7. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 8. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 9. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 10. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 11. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 12. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of $H_T^{\mathrm{lep}}$ in the same-sign dilepton signal region for $ee$ category. Data from 2017 and 2018 is shown using black markers, $T\overline{T}$ signals with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region.

Distribution of $H_T^{\mathrm{lep}}$ in the same-sign dilepton signal region for $e\mu$ category. Data from 2017 and 2018 is shown using black markers, $T\overline{T}$ signals with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region.

Distribution of $H_T^{\mathrm{lep}}$ in the same-sign dilepton signal region for $\mu\mu$ category. Data from 2017 and 2018 is shown using black markers, $T\overline{T}$ signals with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region.

Distribution of $S_T$ in the multilepton signal region for $eee$ category. Data from 2017 and 2018 is shown using black markers, $T\overline{T}$ signals with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region.

Distribution of $S_T$ in the multilepton signal region for $ee\mu$ category. Data from 2017 and 2018 is shown using black markers, $T\overline{T}$ signals with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region.

Distribution of $S_T$ in the multilepton signal region for $e\mu\mu$ category. Data from 2017 and 2018 is shown using black markers, $T\overline{T}$ signals with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region.

Distribution of $S_T$ in the multilepton signal region for $\mu\mu\mu$ category. Data from 2017 and 2018 is shown using black markers, $T\overline{T}$ signals with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region.

Numbers of predicted and observed $B\overline{B}$ SR events in 2016--2018 data in the single-lepton channel, after a background-only fit to data. Predicted numbers of signal events before the fit to data are included for comparison, using the singlet branching fraction scenario. Uncertainties include statistical and systematic components, and lepton flavor categories are combined with their uncertainties added in quadrature.

Numbers of predicted and observed SR events in 2017--2018 data in the same-sign dilepton channel, after a background-only fit to data. Predicted numbers of signal events before the fit to data are included for comparison, using the singlet branching fraction scenario. Uncertainties include statistical and systematic components. Predictions for 2017 and 2018 are combined with their uncertainties added in quadrature.

Numbers of predicted and observed SR events in 2017--2018 data in the multilepton channel, after a background-only fit to data. Predicted numbers of signal events before the fit to data are included for comparison, using the singlet branching fraction scenario. Uncertainties include statistical and systematic components. Predictions for 2017 and 2018 are combined with their uncertainties added in quadrature.

Expected and observed lower limits on the VLT quark masses.

Expected and observed lower limits on the VLB quark masses.

Expected 95% CL upper limits on $T\overline{T}$ production cross sections for the singlet combination.

Expected 95% CL upper limits on $T\overline{T}$ production cross sections for the doublet combination.

Expected 95% CL upper limits on $B\overline{B}$ production cross sections for the singlet combination.

Expected 95% CL upper limits on $B\overline{B}$ production cross sections for the doublet combination.

The 95% CL expected lower mass limits on pair-produced T quark masses as functions of their branching ratios to W and H bosons.

The 95% CL observed lower mass limits on pair-produced T quark masses as functions of their branching ratios to W and H bosons.

The 95% CL expected lower mass limits on pair-produced B quark masses as functions of their branching ratios to W and H bosons.

The 95% CL observed lower mass limits on pair-produced B quark masses as functions of their branching ratios to W and H bosons.

The unfolded differential charge asymmetry as a function of the transverse momentum of the top pair system. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NNLO in QCD and NLO in EW theory are listed. The scale uncertainty is obtained by varying renormalisation and factorisation scales independently by a factor of 2 or 0.5 around $\mu_0$ to calculate the maximum and minimum value of the asymmetry, respectively. The nominal value $\mu_0$ is chosen as $H_T/4$. The variations in which one scale is multiplied by 2 while the other scale is divided by 2 are excluded. Finally, the scale and MC integration uncertainties are added in quadrature.

The unfolded differential charge asymmetry as a function of the longitudinal boost of the top pair system. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NNLO in QCD and NLO in EW theory are listed. The scale uncertainty is obtained by varying renormalisation and factorisation scales independently by a factor of 2 or 0.5 around $\mu_0$ to calculate the maximum and minimum value of the asymmetry, respectively. The nominal value $\mu_0$ is chosen as $H_T/4$. The variations in which one scale is multiplied by 2 while the other scale is divided by 2 are excluded. Finally, the scale and MC integration uncertainties are added in quadrature.

The unfolded inclusive leptonic asymmetry. The unfolded $A_C^{\ell\bar{\ell}}$ is obtained in the reduced phase-space defined by the requirement $|\Delta |\eta_{\ell\bar{\ell}}||<2.5$. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NLO in QCD and NLO in EW theory are listed. The theory uncertainty is obtained by varying both scales by a factor of 0.5 or 2.0 to calculate the minimum and maximum value of the asymmetry, respectively.

The unfolded differential leptonic asymmetry as a function of the invariant mass of the di-lepton pair. The unfolded $A_C^{\ell\bar{\ell}}$ is obtained in the reduced phase-space defined by the requirement $|\Delta |\eta_{\ell\bar{\ell}}||<2.5$. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NLO in QCD and NLO in EW theory are listed. The theory uncertainty is obtained by varying both scales by a factor of 0.5 or 2.0 to calculate the minimum and maximum value of the asymmetry, respectively.

The unfolded differential leptonic asymmetry as a function of the transverse momentum of the di-lepton pair. The unfolded $A_C^{\ell\bar{\ell}}$ is obtained in the reduced phase-space defined by the requirement $|\Delta |\eta_{\ell\bar{\ell}}||<2.5$. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NLO in QCD and NLO in EW theory are listed. The theory uncertainty is obtained by varying both scales by a factor of 0.5 or 2.0 to calculate the minimum and maximum value of the asymmetry, respectively.

The unfolded differential leptonic asymmetry as a function of the longitudinal boost of the di-lepton pair. The unfolded $A_C^{\ell\bar{\ell}}$ is obtained in the reduced phase-space defined by the requirement $|\Delta |\eta_{\ell\bar{\ell}}||<2.5$. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NLO in QCD and NLO in EW theory are listed. The theory uncertainty is obtained by varying both scales by a factor of 0.5 or 2.0 to calculate the minimum and maximum value of the asymmetry, respectively.

Individual 68% and 95% CL bounds on the relevant Wilson coefficients of the SM Effective Field Theory in units of $\text{TeV}^{-2}$. The bounds are derived from the $A_C^{t\bar{t}}$ inclusive measurement. The experimental uncertainties are accounted for, in the form of the complete covariance matrix that keeps track of correlations between bins for the differential measurement. The theory uncertainty from the NNLO QCD + NLO EW calculation is included by explicitly varying the renormalization and factorization scales, or the parton density functions, in the calculation and registering the variations in the intervals.

Individual 68% and 95% CL bounds on the relevant Wilson coefficients of the SM Effective Field Theory in units of $\text{TeV}^{-2}$. The bounds are derived from the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement. The experimental uncertainties are accounted for, in the form of the complete covariance matrix that keeps track of correlations between bins for the differential measurement. The theory uncertainty from the NNLO QCD + NLO EW calculation is included by explicitly varying the renormalization and factorization scales, or the parton density functions, in the calculation and registering the variations in the intervals.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ inclusive measurement. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement for $\beta_{z,t\bar{t}}$ $\in$ [0,0.3]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement for $\beta_{z,t\bar{t}}$ $\in$ [0.3,0.6]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement for $\beta_{z,t\bar{t}}$ $\in$ [0.6,0.8]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement for $\beta_{z,t\bar{t}}$ $\in$ [0.8,1]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement for $m_{t\bar{t}}$ < 500 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement for $m_{t\bar{t}}$ $\in$ [500,750] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement for $m_{t\bar{t}}$ $\in$ [750,1000] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement for $m_{t\bar{t}}$ $\in$ [1000,1500] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement for $m_{t\bar{t}}$ > 1500 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $p_{T,t\bar{t}}$ measurement for $p_{T,t\bar{t}}$ < 30 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $p_{T,t\bar{t}}$ measurement for $p_{T,t\bar{t}}$ $\in$ [30,120] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $p_{T,t\bar{t}}$ measurement for $p_{T,t\bar{t}}$ > 120 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ inclusive measurement. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement for $\beta_{z,\ell\bar{\ell}}$ $\in$[0,0.3]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement for $\beta_{z,\ell\bar{\ell}}$ $\in$[0.3,0.6]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement for $\beta_{z,\ell\bar{\ell}}$ $\in$[0.6,0.8]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement for $\beta_{z,\ell\bar{\ell}}$ $\in$[0.8,1]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement for $m_{\ell\bar{\ell}}$ < 200 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement for $m_{\ell\bar{\ell}}$ $\in$ [200,300] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement for $m_{\ell\bar{\ell}}$ $\in$ [300,400] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement for $m_{\ell\bar{\ell}}$ > 400 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $p_{T,\ell\bar{\ell}}$ measurement for $p_{T,\ell\bar{\ell}}$ < 20 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $p_{T,\ell\bar{\ell}}$ measurement for $p_{T,\ell\bar{\ell}}$ $\in$ [20, 70] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $p_{T,\ell\bar{\ell}}$ measurement for $p_{T,\ell\bar{\ell}}$ > 70 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{t\bar{t}}$ inclusive measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{t\bar{t}}$ vs $p_{T,t\bar{t}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{\ell\ell}$ inclusive measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{\ell\ell}$ vs $p_{T,\ell\bar{\ell}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Covariance matrix for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement. The total (stat. + syst.) uncertainties are considered.

Covariance matrix for the $A_C^{t\bar{t}}$ vs $p_{T,t\bar{t}}$ measurement. The total (stat. + syst.) uncertainties are considered.

Covariance matrix for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement. The total (stat. + syst.) uncertainties are considered.

Covariance matrix for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement. The total (stat. + syst.) uncertainties are considered.

Covariance matrix for the $A_C^{\ell\ell}$ vs $p_{T,\ell\bar{\ell}}$ measurement. The total (stat. + syst.) uncertainties are considered.

Covariance matrix for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement. The total (stat. + syst.) uncertainties are considered.

Observed (points with error bars) and expected background (solid histograms) distributions for $E_{T}^{miss}$ in the signal region (a) SRL, (b) SRM and (c) SRH after the background-only fit applied to the CRs. The predicted signal distributions for the two models with a gluino mass of 2000 GeV and neutralino mass of 250 GeV (SRL), 1050 GeV (SRM) or 1950 GeV (SRH) are also shown for comparison. The uncertainties in the SM background are only statistical.

Observed and expected exclusion limit in the gluino-neutralino mass plane at 95% CL combined using the signal region with the best expected sensitivity at each point, for the full Run-2 dataset corresponding to an integrated luminosity of $139~\mathrm{fb}^{-1}$, for $\gamma/Z$ (a) and $\gamma/h$ (b) signal models. The black solid line corresponds to the expected limits at 95% CL, with the light (yellow) bands indicating the 1$\sigma$ exclusions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves, the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties. For each point in the higgsino-bino parameter space, the labels indicate the best-expected signal region, where L, M and H mean SRL, SRM and SRH, respectively.

Observed and expected exclusion limit in the gluino-neutralino mass plane at 95% CL combined using the signal region with the best expected sensitivity at each point, for the full Run-2 dataset corresponding to an integrated luminosity of $139~\mathrm{fb}^{-1}$, for $\gamma/Z$ (a) and $\gamma/h$ (b) signal models. The black solid line corresponds to the expected limits at 95% CL, with the light (yellow) bands indicating the 1$\sigma$ exclusions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves, the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties. For each point in the higgsino-bino parameter space, the labels indicate the best-expected signal region, where L, M and H mean SRL, SRM and SRH, respectively.

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Cutflow for the SRL selection, for two relevant signal points for both $\gamma/Z$ and $\gamma/h$ models, where the gluinos have mass of 2000 GeV and the neutralinos have a mass of 250 GeV (10000 generated events). The numbers are normalized to a luminosity of 139 $fb^{-1}$.

Cutflow for the SRM selection, for two relevant signal points for both $\gamma/Z$ and $\gamma/h$ models, where the gluinos have mass of 2000 GeV and the neutralinos have a mass of 1050 GeV (10000 generated events). The numbers are normalized to a luminosity of 139 $fb^{-1}$.

Cutflow for the SRH selection, for two relevant signal points for both $\gamma/Z$ and $\gamma/h$ models, where the gluinos have mass of 2000 GeV and the neutralinos have a mass of 1950 GeV (10000 generated events). The numbers are normalized to a luminosity of 139 $fb^{-1}$.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

SM background observation/prediction in the WH signal region

SM background prediction vs. observation in the W signal region

SM background observation/prediction in the W signal region

SM background prediction vs. observation in the H signal region

SM background observation/prediction in the H signal region

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

The 95% CL observed upper limits on the production cross sections for $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^\mp_1$ assuming that each $\widetilde{\chi}^\pm_1$ decays to a W boson and $\widetilde{\chi}^0_1$

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

The 95% CL observed upper limits on the production cross sections for $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^0_2$ assuming that each $\widetilde{\chi}^\pm_1$ decays to a W boson and $\widetilde{\chi}^0_1$ and the $\widetilde{\chi}^0_2$ decays to a Z boson and $\widetilde{\chi}^0_1$

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

The 95% CL observed upper limits on the production cross sections for $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^0_2$ assuming that each $\widetilde{\chi}^\pm_1$ decays to a W boson and $\widetilde{\chi}^0_1$ and the $\widetilde{\chi}^0_2$ decays to a H boson and $\widetilde{\chi}^0_1$

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

The 95% CL observed upper limits on the production cross sections for mass-degenerate higgsino-like$\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^\mp_1$, $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^0_2$, $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^0_3$ and $\widetilde{\chi}^0_2$ $\widetilde{\chi}^0_3$ as functions of the NLSP and LSP masses.

Efficiency of bb-tagger for H(bb), Z(bb) and Z(cc) decays.

Efficiency of W- and V-tagger for W(qq) and Z(qq) decays.

Acceptance times efficiency values with statistical uncertainties for TChiWW in the b-Veto region.

Acceptance times efficiency values with statistical uncertainties for TChiWZ in the b-Veto region.

Acceptance times efficiency values with statistical uncertainties for TChiWH in the b-Veto region.

Acceptance times efficiency values with statistical uncertainties for TChiHZ in the b-Veto region.

Acceptance times efficiency values with statistical uncertainties for TChiWW in the WHSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWW in the WSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWW in the HSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWZ in the WHSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWZ in the WSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWZ in the HSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWH in the WHSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWH in the WSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWH in the HSR region.

Acceptance times efficiency values with uncertainties for TChiHZ in the WHSR region.

Acceptance times efficiency values with uncertainties for TChiHZ in the WSR region.

Acceptance times efficiency values with statistical uncertainties for TChiHZ in the HSR region.

Covariance matrix for the signal regions, derived from a fit to the control regions only under the background-only hypothesis.

Correlation matrix for the signal regions, derived from a fit to the control regions only under the background-only hypothesis.

The observed and expected (in parentheses) 95% CL lower mass limits on RPV SUSY, Z′ ($\mathcal{B}=0.1$) , and QBH signals for the e$\mu$, e$\tau$, and $\mu\tau$ channels.

Expected and observed 95% CL upper limits on the product of cross section times branching fraction as a function of the $ au$ sneutrino mass in an RPV SUSY model for the e$\mu$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red and blue solid lines show the product of cross section times branching fraction as a function of the tau sneutrino mass for two different values of couplings.

Expected and observed 95% CL upper limits on the product of cross section times branching fraction as a function of the $ au$ sneutrino mass in an RPV SUSY model for the e$\tau$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red and blue solid lines show the product of cross section times branching fraction as a function of the tau sneutrino mass for two different values of couplings.

Expected and observed 95% CL upper limits on the product of cross section times branching fraction as a function of the $ au$ sneutrino mass in an RPV SUSY model for the $\mu\tau$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red and blue solid lines show the product of cross section times branching fraction as a function of the tau sneutrino mass for two different values of couplings.

Expected (black dashed line) and observed (black solid line) 95% CL upper limits on the product of cross section and branching fraction for a Z′ ($\mathcal{B}=0.1$) boson with LFV decays, in the e$\mu$ channel.The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red solid lines show the product of cross section times branching fraction as a function of the Z′ mass.

Expected (black dashed line) and observed (black solid line) 95% CL upper limits on the product of cross section and branching fraction for a Z′ ($\mathcal{B}=0.1$) boson with LFV decays, in the e$\tau$ channel.The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red solid lines show the product of cross section times branching fraction as a function of the Z′ mass.

Expected (black dashed line) and observed (black solid line) 95% CL upper limits on the product of cross section and branching fraction for a Z′ ($\mathcal{B}=0.1$) boson with LFV decays, in the $\mu\tau$ channel.The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red solid lines show the product of cross section times branching fraction as a function of the Z′ mass.

Expected (black dashed line) and observed (black solid line) 95% CL upper limits on the product of cross section and branching fraction for quantum black hole production in an ADD model with $n=4$ extra dimensions, in the e$\mu$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red solid lines show the product of cross section times branching fraction as a function of the QBH threshold mass.

Expected (black dashed line) and observed (black solid line) 95% CL upper limits on the product of cross section and branching fraction for quantum black hole production in an ADD model with $n=4$ extra dimensions, in the e$\tau$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red solid lines show the product of cross section times branching fraction as a function of the QBH threshold mass.

Expected (black dashed line) and observed (black solid line) 95% CL upper limits on the product of cross section and branching fraction for quantum black hole production in an ADD model with $n=4$ extra dimensions, in the $\mu\tau$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red solid lines show the product of cross section times branching fraction as a function of the QBH threshold mass.

Upper limits at 95% CL on the RPV SUSY model in the plane of $\tau$ sneutrino mass and $\lambda'$ coupling, for four values of $\lambda$ couplings for the e$\mu$ channel. The regions to the left of and above the curves are excluded.

Upper limits at 95% CL on the RPV SUSY model in the plane of $\tau$ sneutrino mass and $\lambda'$ coupling, for four values of $\lambda$ couplings for the e$\tau$ channel. The regions to the left of and above the curves are excluded.

Upper limits at 95% CL on the RPV SUSY model in the plane of $\tau$ sneutrino mass and $\lambda'$ coupling, for four values of $\lambda$ couplings for the $\mu\tau$ channel. The regions to the left of and above the curves are excluded.

Model-independent upper limits at 95% CL on the product of cross section, branching fraction, and acceptance are shown. Observed (expected) limits are shown in black solid (dashed) lines for the e$\mu$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits.

Model-independent upper limits at 95% CL on the product of cross section, branching fraction, and acceptance are shown. Observed (expected) limits are shown in black solid (dashed) lines for the e$\tau$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits.

Model-independent upper limits at 95% CL on the product of cross section, branching fraction, and acceptance are shown. Observed (expected) limits are shown in black solid (dashed) lines for the $\mu\tau$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits.

Background prediction and observed data yields in the signal region bins. The background yields are obtained from the background-only fit and serve as input to the simplified likelihood reinterpretation scheme. The naming of the bins is "channel_year_binnumber", following the binning from Figure 2.

Background prediction and observed data yields in the signal region bins. The background yields are obtained from the background-only fit and serve as input to the simplified likelihood reinterpretation scheme. The naming of the bins is "channel_year_binnumber", following the binning from Figure 2.

Background prediction and observed data yields in the signal region bins. The background yields are obtained from the background-only fit and serve as input to the simplified likelihood reinterpretation scheme. The naming of the bins is "channel_year_binnumber", following the binning from Figure 2.

Matrix of covariance coefficients between signal region bins. The coefficients are obtained from the background-only fit and serve as input to the simplified likelihood reinterpretation scheme. The naming of the bins is "channel_year_binnumber", following the binning used in Figure 2.

Matrix of covariance coefficients between signal region bins. The coefficients are obtained from the background-only fit and serve as input to the simplified likelihood reinterpretation scheme. The naming of the bins is "channel_year_binnumber", following the binning used in Figure 2.

Matrix of covariance coefficients between signal region bins. The coefficients are obtained from the background-only fit and serve as input to the simplified likelihood reinterpretation scheme. The naming of the bins is "channel_year_binnumber", following the binning used in Figure 2.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=1600\;\mathrm{GeV}$.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=2000\;\mathrm{GeV}$.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=2200\;\mathrm{GeV}$.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=2400\;\mathrm{GeV}$.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=2600\;\mathrm{GeV}$.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=2800\;\mathrm{GeV}$.

Expected event yields in each $m_{jj}$ bin for the different background processes in the SR of the VTR category, in the 2017 and 2018 samples. The background yields and the corresponding uncertainties are obtained after performing a combined fit across all of the CRs and SR. The expected signal contributions for a Higgs boson, produced in the non-VBF and VBF modes, decaying to invisible particles with a branching fraction of $\mathcal{B}(\text{H} \to \text{inv}) = 1$, and the observed event yields are also reported.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2017, signal region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2017, dimuon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2018, signal region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2018, dimuon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2017, signal region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2017, dimuon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2018, signal region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2018, single electron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2018, dielectron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2018, dimuon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2017, photon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2018, photon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2017, single electron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2017, single muon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2017, dielectron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2018, single electron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2018, single muon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2018, dielectron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2017, single electron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2017, single muon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2017, dielectron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2018, single muon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Trigger efficiency measured as a function of $p_{T}^{miss}$ in data for the 2017 and 2018 samples for the MTR category. The efficiency is measured in a phase space with at least two jets in which the leading (trailing) jet has $p_{T}>80~\text{GeV}$ ($>40~\text{GeV}$). The two jets are required to form a system with $m_{jj}>200~\text{GeV}$ and $\Delta\Phi_{jj}<1.5$.

Trigger efficiency measured as a function of $p_{T}^{miss}$ in data for the 2017 and 2018 samples for the MTR category. The efficiency is measured in a phase space with at least two jets in which the leading (trailing) jet has $p_{T}>140~\text{GeV}$ ($>70~\text{GeV}$). The two jets are required to form a system with $m_{jj}>900~\text{GeV}$ and $\Delta\Phi_{jj}<1.8$.

Observed and expected 95% CL lower limits on the $T$-quark mass as a function of the $T$-quark width-to-mass ratio and the branching fraction of the $T \rightarrow Ht$ decay ($\Gamma_{T}$ is the $T$-quark width).

Cutflow table listing the number of events passing each criterion for a $T$-quark hypothesis with a mass of 1.6 TeV and $\kappa_{T} = 0.5$. The initial signal event yield is the predicted number of $T$-quark events inclusive in the Higgs-boson and top-quark decays for 139 fb$^{-1}$.

Observed 95% CL upper limits on the single $T$-quark production cross-section as a function of the $T$-quark coupling $\kappa_{T}$ and $m_{T}$.

Expected 95% CL upper limits on the single $T$-quark production cross-section as a function of the $T$-quark coupling $\kappa_{T}$ and $m_{T}$.

Observed and expected 95% CL lower limits on the $T$-quark mass as a function of the $T$-quark width-to-mass ratio and the branching fraction of the $T \rightarrow Wb$ decay ($\Gamma_{T}$ is the $T$-quark width).

Measured inclusive fiducial $tt\gamma$ production cross section in the dilepton final state for the different dilepton-flavour channels and combined.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ .

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ . The values provided in the table are not divided by the bin width.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton measurement.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton and lepton+jets measurements combined.

One-dimensional 68 and 95% CL intervals obtained for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$, using the photon $p_{T}$ distribution from the dilepton analysis, or the combination of photon pT distributions from the dilepton and lepton+jets analyses.

Comparison of observed $95\%$ CL intervals for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$. Results are shown from a CMS ttZ measurement [JHEP 03 (2020) 056], from a CMS ttZ & tZq interpretation [arXiv:2107.13896], from a CMS ttG (lepton+jets) measurement [arXiv:2107.01508], from this measurement, and from a global fit by J. Ellis et al. [JHEP 04 (2021) 279].

Number of predicted signal events in the $\mu\mu X$ final states, for several benchmark signal hypotheses for Majorana HNL. The quoted uncertainties include statistical and systematic uncertainties.

The 95% CL limits on $|V_{Ne}|^2$ as a function of the HNL mass for a Majorana HNL. Values of $-1$ indicate that no limit is available for the mass point.

The 95% CL limits on $|V_{N\mu}|^2$ as a function of the HNL mass for a Majorana HNL. Values of $-1$ indicate that no limit is available for the mass point.

The 95% CL limits on $|V_{Ne}|^2$ as a function of the HNL mass for a Dirac HNL. Values of $-1$ indicate that no limit is available for the mass point.

The 95% CL limits on $|V_{N\mu}|^2$ as a function of the HNL mass for a Dirac HNL. Values of $-1$ indicate that no limit is available for the mass point.

Covariance matrix for the background prediction in the signal region bins for the $eeX$ final states. The bin labels specify the channel, the $m(\ell_2,\ell_3)$ bin, and the $\Delta_{\mathrm{2D}}$ bin.

Covariance matrix for the background prediction in the signal region bins for the $\mu\mu X$ final states. The bin labels specify the channel, the $m(\ell_2,\ell_3)$ bin, and the $\Delta_{\mathrm{2D}}$ bin.

Correlation matrix for the background prediction the signal region bins for the $eeX$ final states. The bin labels specify the channel, the $m(\ell_2,\ell_3)$ bin, and the $\Delta_{\mathrm{2D}}$ bin.

Correlation matrix for the background prediction the signal region bins for the $\mu\mu X$ final states. The bin labels specify the channel, the $m(\ell_2,\ell_3)$ bin, and the $\Delta_{\mathrm{2D}}$ bin.

Mean lifetime and production cross section for HNLs of Majorana nature, assuming the decay to three charged leptons and coupling to only electrons or muons, as evaluated from simulated event samples.