Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the High-pT jet SR for observed data events

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the High-pT jet SR for expected signal events in the strong gluino pair pair production model with m(gluino)=1.8 TeV, m(chi0)=0.2 TeV, tau(chi0)=0.1 ns

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the Trackless jet SR for observed data events

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the Trackless jet SR for expected signal events in the electroweak pair production model

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Exclusion limits at 95% CL on the production cross section in the electroweak pair production model.

Exclusion limits at 95% CL on the production cross section in the strong gluino pair production models and m(gluino)=2.4 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Exclusion limits at 95% CL on the production cross section in the strong gluino pair production models and m($ ilde{\chi}^0_1$)=1.25 TeV

Acceptance cutflow for the High-pT SR for representative points in the strong gluino pair production model. See additional resources for more information.

Acceptance cutflow for the Trackless SR for representative points in the electroweak pair production model. See additional resources for more information.

Acceptance cutflow for the Trackless SR for representative points in the electroweak pair production model with heavy-flavor quarks final state. See additional resources for more information.

Acceptance cutflow for the High-pT SR for representative points in the electroweak pair production model with heavy-flavor quarks final state. See additional resources for more information.

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R < 1150 mm

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R [1150, 3870] mm

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R > 3870 mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R < 1150 mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R [1150, 3870] mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R > 3870 mm

Reinterpretation Material: Vertex-level Efficiency for R < 22 mm

Reinterpretation Material: Vertex-level Efficiency for R [22, 25] mm

Reinterpretation Material: Vertex-level Efficiency for R [25, 29] mm

Reinterpretation Material: Vertex-level Efficiency for R [29, 38] mm

Reinterpretation Material: Vertex-level Efficiency for R [38, 46] mm

Reinterpretation Material: Vertex-level Efficiency for R [46, 73] mm

Reinterpretation Material: Vertex-level Efficiency for R [73, 84] mm

Reinterpretation Material: Vertex-level Efficiency for R [84, 111] mm

Reinterpretation Material: Vertex-level Efficiency for R [111, 120] mm

Reinterpretation Material: Vertex-level Efficiency for R [120, 145] mm

Reinterpretation Material: Vertex-level Efficiency for R [145, 180] mm

Reinterpretation Material: Vertex-level Efficiency for R [180, 300] mm

Cutflow (acceptance x efficiency) for the High-pT SR for representative points in the strong gluino pair production model. See additional resources for more information.

Cutflow (acceptance x efficiency) for the Trackless SR for representative points in the electroweak pair production model. See additional resources for more information.

Cutflow (acceptance x efficiency) for the Trackless SR for representative points in the electroweak pair production model with heavy-flavor quarks. See additional resources for more information.

Cutflow (acceptance x efficiency) for the High-pT SR for representative points in the electroweak pair production model with heavy-flavor quarks. See additional resources for more information.

The minimum $\chi^2$ and the parameters $T_{fo}$ and $\beta^{max}_T$ for each of the five centrality selections. The best fit parameters are determined by averaging all parameter pairs within the 1$\sigma$ contour. The errors correspond to the standard deviation of the parameter pairs within the 1$\sigma$ $\chi^2$ contour.

Fit parameters for each particle species using Equations $\frac{dN}{dy}$ = $C \cdot$ ($N_{part}$)$^{\alpha_{part}}$ and $\frac{dN}{dy}$ = $C^{\prime} \cdot$ ($N_{coll}$)$^{\alpha_{coll}}$.

Values of the parameters $n_{pp}$ and $x$ from fitting Equation $R \equiv \frac{dN/dy}{N_{part}}$ = (1-$x$) $\cdot n_{pp} \frac{1}{2}$ + $x \cdot n_{pp} \frac{N_{coll}}{N_{part}}$ = $n_{pp}$ [$\frac{1}{2}$ + $x$($\frac{N_{coll}}{N_{part}}$ - $\frac{1}{2})$]to the observed $dN$/$dy$ per $N_{part}$.

Invariant yields for $\pi^{\pm}$ measured in minimum-bias events at midrapidity and normalized to one rapidity unit.

Invariant yields for $K^{\pm}$ measured in minimum-bias events at midrapidity and normalized to one rapidity unit.

Invariant yields for (anti)$p$ measured in minimum-bias events at midrapidity and normalized to one rapidity unit.

Pion invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

Pion invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

Kaon invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

Kaon invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

(Anti)proton invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

(Anti)proton invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

(Anti)proton invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

(Anti)proton invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

(Anti)proton invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

(Anti)proton invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

(Anti)proton invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

Minimum-bias invariant yields for $\pi^{\pm}$ in equal $p_T$ bins.

Minimum-bias invariant yields for $K^{\pm}$ in equal $p_T$ bins.

Minimum-bias invariant yields for (anti)$p$ in equal $p_T$ bins.

Pion invariant yields in each event centrality normalized to one rapidity unit at midrapidity.

Pion invariant yields in each event centrality normalized to one rapidity unit at midrapidity.

Kaon invariant yields in each event centrality normalized to one rapidity unit at midrapidity.

(Anti)proton invariant yields in each event centrality normalized to one rapidity unit at midrapidity.

(Anti)proton invariant yields in each event centrality normalized to one rapidity unit at midrapidity.

The integrated mean $p_T$ for pions, kaons, and (anti)protons produced in the five different classes of event centrality.

The expansion parameters $T_{fo}$ and $\beta^{max}_T$ as a function of the number of participants.

$z_{g}$ for Matched Trigger jets in pp$+$AuAu Data anti-kT R$=$0.4

$z_{g}$ for HardCore Recoil jets in AuAu Data anti-kT R$=$0.4

$z_{g}$ for HardCore Recoil jets in pp$+$AuAu Data anti-kT R$=$0.4

$z_{g}$ for Matched Recoil jets in AuAu Data anti-kT R$=$0.4

$z_{g}$ for Matched Recoil jets in pp$+$AuAu Data anti-kT R$=$0.4

$R_{g}$ for HardCore Trigger jets in AuAu Data anti-kT R$=$0.4

$R_{g}$ for HardCore Trigger jets in pp$+$AuAu Data anti-kT R$=$0.4

$R_{g}$ for Matched Trigger jets in AuAu Data anti-kT R$=$0.4

$R_{g}$ for Matched Trigger jets in pp$+$AuAu Data anti-kT R$=$0.4

$R_{g}$ for HardCore Recoil jets in AuAu Data anti-kT R$=$0.4

$R_{g}$ for HardCore Recoil jets in pp$+$AuAu Data anti-kT R$=$0.4

$R_{g}$ for Matched Recoil jets in AuAu Data anti-kT R$=$0.4

$R_{g}$ for Matched Recoil jets in pp$+$AuAu Data anti-kT R$=$0.4

Fully corrected two subjet $z_{sj}$ for $15 < p_{\rm{T, jet}} < 20$ GeV/c, R$=$0.4 anti-kT and R$=$0.1 subjets

Fully corrected two subjet $z_{sj}$ for $20 < p_{\rm{T, jet}} < 25$ GeV/c, R$=$0.4 anti-kT and R$=$0.1 subjets

Fully corrected two subjet $z_{sj}$ for $25 < p_{\rm{T, jet}} < 30$ GeV/c, R$=$0.4 anti-kT and R$=$0.1 subjets

Fully corrected two subjet $z_{sj}$ for $30 < p_{\rm{T, jet}} < 40$ GeV/c, R$=$0.4 anti-kT and R$=$0.1 subjets

Fully corrected two subjet $\theta_{sj}$ for $15 < p_{\rm{T, jet}} < 20$ GeV/c, R$=$0.4 anti-kT and R$=$0.1 subjets

Fully corrected two subjet $\theta_{sj}$ for $20 < p_{\rm{T, jet}} < 25$ GeV/c, R$=$0.4 anti-kT and R$=$0.1 subjets

Fully corrected two subjet $\theta_{sj}$ for $25 < p_{\rm{T, jet}} < 30$ GeV/c, R$=$0.4 anti-kT and R$=$0.1 subjets

Fully corrected two subjet $\theta_{sj}$ for $30 < p_{\rm{T, jet}} < 40$ GeV/c, R$=$0.4 anti-kT and R$=$0.1 subjets

$z_{sj}$ for HardCore Trigger jets in AuAu Data anti-kT R$=$0.4

$z_{sj}$ for HardCore Trigger jets in pp$+$AuAu Data anti-kT R$=$0.4

$z_{sj}$ for Matched Trigger jets in AuAu Data anti-kT R$=$0.4

$z_{sj}$ for Matched Trigger jets in pp$+$AuAu Data anti-kT R$=$0.4

$z_{sj}$ for HardCore Recoil jets in AuAu Data anti-kT R$=$0.4

$z_{sj}$ for HardCore Recoil jets in pp$+$AuAu Data anti-kT R$=$0.4

$z_{sj}$ for Matched Recoil jets in AuAu Data anti-kT R$=$0.4

$z_{sj}$ for Matched Recoil jets in pp$+$AuAu Data anti-kT R$=$0.4

$\theta_{sj}$ for HardCore Trigger jets in AuAu Data anti-kT R$=$0.4

$\theta_{sj}$ for HardCore Trigger jets in pp$+$AuAu Data anti-kT R$=$0.4

$\theta_{sj}$ for Matched Trigger jets in AuAu Data anti-kT R$=$0.4

$\theta_{sj}$ for Matched Trigger jets in pp$+$AuAu Data anti-kT R$=$0.4

$\theta_{sj}$ for HardCore Recoil jets in AuAu Data anti-kT R$=$0.4

$\theta_{sj}$ for HardCore Recoil jets in pp$+$AuAu Data anti-kT R$=$0.4

$\theta_{sj}$ for Matched Recoil jets in AuAu Data anti-kT R$=$0.4

$\theta_{sj}$ for Matched Recoil jets in pp$+$AuAu Data anti-kT R$=$0.4

$A_{J}$ for HardCore R=0.4 anti-kT jets with $\theta_{sj} > 0.1$ in Au$+$Au collisions

$A_{J}$ for HardCore R=0.4 anti-kT jets with $\theta_{sj} > 0.1$ in pp$+$AuAu reference

$A_{J}$ for HardCore R=0.4 anti-kT jets with $0.1 < \theta_{sj} < 0.2$ in Au$+$Au collisions

$A_{J}$ for HardCore R=0.4 anti-kT jets with $0.1 < \theta_{sj} < 0.2$ in pp$+$AuAu reference

$A_{J}$ for HardCore R=0.4 anti-kT jets with $0.2 < \theta_{sj} < 0.3$ in Au$+$Au collisions

$A_{J}$ for HardCore R=0.4 anti-kT jets with $0.2 < \theta_{sj} < 0.3$ in pp$+$AuAu reference

$A_{J}$ for Matched R=0.4 anti-kT jets with $\theta_{sj} > 0.1$ in Au$+$Au collisions

$A_{J}$ for Matched R=0.4 anti-kT jets with $\theta_{sj} > 0.1$ in pp$+$AuAu reference

$A_{J}$ for Matched R=0.4 anti-kT jets with $0.1 < \theta_{sj} < 0.2$ in Au$+$Au collisions

$A_{J}$ for Matched R=0.4 anti-kT jets with $0.1 < \theta_{sj} < 0.2$ in pp$+$AuAu reference

$A_{J}$ for Matched R=0.4 anti-kT jets with $0.2 < \theta_{sj} < 0.3$ in Au$+$Au collisions

$A_{J}$ for Matched R=0.4 anti-kT jets with $0.2 < \theta_{sj} < 0.3$ in pp$+$AuAu reference

tracking efficiency in pp collisions as a function of track momentum

tracking efficiency in AuAu collisions as a function of track momentum

absolutely normalized dijet yields scaled by 1/<TAA> in 20-40% central PbPb collisions

absolutely normalized dijet yields scaled by 1/<TAA> in 40-60% central PbPb collisions

absolutely normalized dijet yields scaled by 1/<TAA> in 60-80% central PbPb collisions

self normalized dijets from pp collisions

self normalized dijet distributions in 0-10% central PbPb collisions

self normalized dijet distributions in 10-20% central PbPb collisions

self normalized dijet distributions in 20-40% central PbPb collisions

self normalized dijet distributions in 40-60% central PbPb collisions

self normalized dijet distributions in 60-80% central PbPb collisions

leading jet RAA^pair in 0-10% central PbPb collisions

subleading jet RAA^pair in 0-10% central PbPb collisions

leading jet RAA^pair in 10-20% central PbPb collisions

subleading jet RAA^pair in 10-20% central PbPb collisions

leading jet RAA^pair in 20-40% central PbPb collisions

subleading jet RAA^pair in 20-40% central PbPb collisions

leading jet RAA^pair in 40-60% central PbPb collisions

subleading jet RAA^pair in 40-60% central PbPb collisions

leading jet RAA^pair in 60-80% central PbPb collisions

subleading jet RAA^pair in 60-80% central PbPb collisions

ratio of subleading jet RAA^pair to leading jet RAA^pair in PbPb collisions

\Delta v_1 between proton and anti-proton vs rapidity in Au+Au 200 GeV 50-80% centrality.

\Delta v_1 between proton and anti-proton vs rapidity in Zr+Zr and Ru+Ru (combined) 200 GeV 50-80% centrality.

\Delta v_1 between proton and anti-proton vs rapidity in Au+Au 27 GeV 50-80% centrality.

\Delta dv1/dy as a function of centrality in Au+Au 200 GeV.

\Delta dv1/dy as a function of centrality in Ru+Ru and Zr+Zr 200 GeV

\Delta dv1/dy as a function of centrality in Au+Au 27 GeV.

Parametrization of the $A_{X}$ factor, defined as the fraction of diphoton resonances satisfying the fiducial acceptance at the particle level, as function of $m_{X}$ obtained from the narrow width simulated signal samples produced in gluon fusion.

The correction factor, $C_{X}$, defined as the ratio between the number of reconstructed signal events passing the analysis cuts and the number of signal events at the particle level generated within the fiducial volume, and acceptance correction factor, $A_{X}$, defined as the fraction of diphoton resonances satisfying the fiducial acceptance at the particle level. Both are computed for NWA spin-0 models as a function of $m_{X}$.

Effect of event selections on a scalar MC signal sample generated for $m_{X}$ = 15 GeV and on the data. For the MC sample, the efficiencies are shown after applying event weights and a truth level filter that requires two photons with $p^{\gamma\gamma}_{T}>40$ GeV; for the data, the absolute yields are shown. The initial yields for data include a trigger preselection that is the OR of a list of single photon and diphoton triggers. The "2 $loose$ photons" step includes the kinematic acceptance cuts.

Parameterization of the Double Sided Crystal Ball function parameters describing the scalar mass resolution model as a function of $m_{X}$ [GeV].

Comparison between data and background prediction before the fit (Pre-Fit) for the mass of the FCNC top-quark candidate in SR1. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The four FCNC LH signals are also shown separately, normalized to five times the cross-section corresponding to the most stringent observed branching ratio limits. The first (last) bin in all distributions includes the underflow (overflow). The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction before the fit (Pre-Fit) for the mass of the SM top-quark candidate in SR2. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The four FCNC LH signals are also shown separately, normalized to five times the cross-section corresponding to the most stringent observed branching ratio limits. The first (last) bin in all distributions includes the underflow (overflow). The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction before the fit (Pre-Fit) for the transverse momentum of the Z boson candidate in SR2. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The four FCNC LH signals are also shown separately, normalized to five times the cross-section corresponding to the most stringent observed branching ratio limits. The first (last) bin in all distributions includes the underflow (overflow). The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZu LH coupling extraction. The distribution is for the $D_{1}$ discriminant in the mass sideband CR1. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZu LH signals are also separately shown, normalized to 500 times the best fit of the signal yield. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZu LH coupling extraction. The distribution is for the $D_{2}^{u}$ discriminant in the mass sideband CR2. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZu LH signals are also separately shown, normalized to 500 times the best fit of the signal yield. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZu LH coupling extraction. The distribution is for the $D_{1}$ discriminant in SR1. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZu LH signals are also separately shown, normalized to 50 times the best fit of the signal yield. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZu LH coupling extraction. The distribution is for the $D_{2}^{u}$ discriminant in SR2. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZu LH signals are also separately shown, normalized to 50 times the best fit of the signal yield. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZc LH coupling extraction. The distribution is for the $D_{1}$ discriminant in the mass sideband CR1. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZc LH signals are also separately shown, normalized to 500 times the best fit of the signal yield. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZc LH coupling extraction. The distribution is for the $D_{2}^{c}$ discriminant in the mass sideband CR2. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZc LH signals are also separately shown, normalized to 500 times the best fit of the signal yield. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZc LH coupling extraction. The distribution is for the $D_{1}$ discriminant in SR1. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZc LH signals are also separately shown, normalized to 50 times the best fit of the signal yield. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZc LH coupling extraction. The distribution is for the $D_{2}^{c}$ discriminant in SR2. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZc LH signals are also separately shown, normalized to 50 times the best fit of the signal yield. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZu LH coupling extraction. The distribution is for the leading lepton $p_{T}$ in the $t\bar{t}$ CR. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZu LH signals are also shown separately, normalized to $10^{3}$ times the best fit of the signal yield. The last bin includes the overflow. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZu LH coupling extraction. The distribution is for the third lepton $p_{T}$ in the $t\bar{t}$ CR. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZu LH signals are also shown separately, normalized to $10^{3}$ times the best fit of the signal yield. The last bin includes the overflow. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZu LH coupling extraction. The distribution is for the leading lepton $p_{T}$ in the $t\bar{t}Z$ CR. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZu LH signals are also shown separately, normalized to $10^{3}$ times the best fit of the signal yield. The last bin includes the overflow. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZu LH coupling extraction. The distribution is for the $D_{1}$ discriminant in the $t\bar{t}Z$ CR. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZu LH signals are also shown separately, normalized to $10^{3}$ times the best fit of the signal yield. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} + p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} + p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \Delta R (l,l)$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \Delta R (l,l)$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ N_{jets}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ N_{jets}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet1}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet1}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet2}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet2}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet2}/p_{T}^{Jet1}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet2}/p_{T}^{Jet1}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ m_{jj}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ m_{jj}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ m_{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ m_{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ H_{T}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ H_{T}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{\gamma} / \sqrt{H_{T}}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{\gamma} / \sqrt{H_{T}}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \Delta \phi (Jet,\gamma)$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \Delta \phi (Jet,\gamma)$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \phi_{CS}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \phi_{CS}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \cos \theta_{CS}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \cos \theta_{CS}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{\gamma} / \sqrt{H_{T}}$ (Fig. 8 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{\gamma} / \sqrt{H_{T}}$ (Fig. 8 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ H_{T}$ (Fig. 8 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ H_{T}$ (Fig. 8 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \Delta \phi (Jet,\gamma)$ (Fig. 8 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \Delta \phi (Jet,\gamma)$ (Fig. 8 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \Delta R (l,l)$ (Fig. 5 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \Delta R (l,l)$ (Fig. 5 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma}$ (Fig. 5 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma}$ (Fig. 5 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } p_{T}^{ll} + p_{T}^{\gamma} < 200 GeV$ (Fig. 11 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } p_{T}^{ll} + p_{T}^{\gamma} < 200 GeV$ (Fig. 11 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } 200 GeV < p_{T}^{ll} + p_{T}^{\gamma} < 300 GeV$ (Fig. 11 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } 200 GeV < p_{T}^{ll} + p_{T}^{\gamma} < 300 GeV$ (Fig. 11 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } p_{T}^{ll} + p_{T}^{\gamma} > 300 GeV$ (Fig. 11 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } p_{T}^{ll} + p_{T}^{\gamma} > 300 GeV$ (Fig. 11 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ m_{jj}$ (Fig. 7 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ m_{jj}$ (Fig. 7 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ m_{ll\gamma j}$ (Fig. 7 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ m_{ll\gamma j}$ (Fig. 7 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ N_{jets}$ (Fig. 6 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ N_{jets}$ (Fig. 6 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet1}$ (Fig. 6 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet1}$ (Fig. 6 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet2}$ (Fig. 6 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet2}$ (Fig. 6 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet2}/p_{T}^{Jet1}$ (Fig. 6 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet2}/p_{T}^{Jet1}$ (Fig. 6 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll}$ (Fig. 5 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll}$ (Fig. 5 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j}$ (Fig. 8 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j}$ (Fig. 8 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } p_{T}^{ll\gamma} < 50 GeV$ (Fig. 12 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } p_{T}^{ll\gamma} < 50 GeV$ (Fig. 12 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } 50 GeV < p_{T}^{ll\gamma} < 75 GeV$ (Fig. 12 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } 50 GeV < p_{T}^{ll\gamma} < 75 GeV$ (Fig. 12 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } p_{T}^{ll\gamma} > 75 GeV$ (Fig. 12 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } p_{T}^{ll\gamma} > 75 GeV$ (Fig. 12 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } 125 GeV < m_{ll\gamma} < 200 GeV$ (Fig. 10 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } 125 GeV < m_{ll\gamma} < 200 GeV$ (Fig. 10 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } 200 GeV < m_{ll\gamma} < 300 GeV$ (Fig. 10 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } 200 GeV < m_{ll\gamma} < 300 GeV$ (Fig. 10 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } m_{ll\gamma} > 300 GeV$ (Fig. 10 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } m_{ll\gamma} > 300 GeV$ (Fig. 10 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} + p_{T}^{\gamma}$ (Fig. 5 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} + p_{T}^{\gamma}$ (Fig. 5 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \cos \theta_{CS}$ (Fig. 9 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \cos \theta_{CS}$ (Fig. 9 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \phi_{CS}$ (Fig. 9 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \phi_{CS}$ (Fig. 9 (a))

The observed and expected 95% CL upper limits on the minimal coupling vector LQ pair production cross-sections assuming B = 1 as a function of m$_\text{LQ}$.

The observed and expected 95% CL upper limits on the Yang-Mills coupling vector LQ pair production cross-sections assuming B = 1 as a function of m$_\text{LQ}$.

The observed and expected 95% CL upper limits on the branching ratio into charged leptons as a function of m$_\text{LQ}$ for the scalar LQ.

The observed and expected 95% CL upper limits on the branching ratio into charged leptons as a function of m$_\text{LQ}$ for the vector LQ minimal coupling scenario.

The observed and expected 95% CL upper limits on the branching ratio into charged leptons as a function of m$_\text{LQ}$ for the vector LQ Yang-Mills coupling scenario.

Signal region detector-level distribution for the observable $p_{\mathrm{T}}^{\mathrm{lead}\, \ell}$.

Signal region detector-level distribution for the observable $m_{e\mu}$.

Signal region detector-level distribution for the observable $p_{\mathrm{T}}^{e\mu}$.

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|y_{e\mu}|$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|y_{e\mu}|$

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|\Delta \phi(e \mu)|$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|\Delta \phi(e \mu)|$

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $ \cos\theta^{\ast}$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $ \cos\theta^{\ast}$

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{\mathrm{lead}\, \ell}$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{\mathrm{lead}\, \ell}$

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $m_{e\mu}$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $m_{e\mu}$

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{e\mu}$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{e\mu}$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|y_{e\mu}|$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|y_{e\mu}|$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|\Delta \phi(e \mu)|$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|\Delta \phi(e \mu)|$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $ \cos\theta^{\ast}$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $ \cos\theta^{\ast}$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{\mathrm{lead}\, \ell}$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{\mathrm{lead}\, \ell}$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $m_{e\mu}$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $m_{e\mu}$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{e\mu}$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{e\mu}$

Probability of finding at least one TAR jet, where the p_T-leading TAR jet passes the m_Wcand and D₂^&beta;=1 requirements, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=2100 GeV, with the preselections applied.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=500 GeV, with the preselections applied that do not pass the requirements of the merged category.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=1000 GeV, with the preselections applied that do not pass the requirements of the merged category.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=1700 GeV, with the preselections applied that do not pass the requirements of the merged category.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=2100 GeV, with the preselections applied that do not pass the requirements of the merged category.

Observed exclusion contour at 95&#37; C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_&chi;=1, m_&chi;=200 GeV, and sin&theta;=0.01.

Expected exclusion contour at 95&#37; C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_&chi;=1, m_&chi;=200 GeV, and sin&theta;=0.01.

Expected+1&sigma; exclusion contour at 95&#37; C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_&chi;=1, m_&chi;=200 GeV, and sin&theta;=0.01.

Expected-1&sigma; exclusion contour at 95&#37; C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_&chi;=1, m_&chi;=200 GeV, and sin&theta;=0.01.

Expected+2&sigma; exclusion contour at 95&#37; C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_&chi;=1, m_&chi;=200 GeV, and sin&theta;=0.01.

Expected-2&sigma; exclusion contour at 95&#37; C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_&chi;=1, m_&chi;=200 GeV, and sin&theta;=0.01.

Observed upper limits at 95&#37; C.L. on &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) for m_Z'=0.5 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) process for m_Z'=0.5 TeV, shown in dashed blue.

Observed upper limits at 95&#37; C.L. on &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) for m_Z'=1 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) process for m_Z'=1 TeV, shown in dashed blue.

Observed upper limits at 95&#37; C.L. on &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) for m_Z'=1.7 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) process for m_Z'=1.7 TeV, shown in dashed blue.

Observed upper limits at 95&#37; C.L. on &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) for m_Z'=2.1 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) process for m_Z'=2.1 TeV, shown in dashed blue.

Data overlaid on SM background yields stacked in each SR and CR category after the fit to data ('Post-fit'). The yields in the SR are broken down into their contributions to the individual bins. The maximum-likelihood estimators are set to the conditional values of the CR-only fit, and propagated to SR and CRs.

Dominant sources of uncertainty for three dark Higgs scenarios after the fit to data. The uncertainties are quantified in terms of their contribution to the fitted signal uncertainty that is expressed relative to the theory prediction. Three representative dark Higgs signal scenarios with g_q=0.25, g_&chi;=1.0, sin&theta;=0.01 and m_&chi;=200 GeV are considered, which are indicated using the (m_Z', m_s) format in units of GeV in the table columns.

Cumulative efficiencies in the merged category for three representative dark Higgs signal scenarios with g_q=0.25, g_&chi;=1.0, sin&theta;=0.01, m_Z' = 1 TeV, and m_&chi;=200 GeV considering s&rarr;W(&ell;&nu;)W(qq) decays only.

Cumulative efficiencies in the resolved category for three representative dark Higgs signal scenarios with g_q=0.25, g_&chi;=1.0, sin&theta;=0.01, m_Z' = 1 TeV, and m_&chi;=200 GeV considering s&rarr;W(&ell;&nu;)W(qq) decays only.

Theoretical cross section for &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) for each of the dark Higgs signal points at m_Z′ ={300, 350, 400, 500, 750} GeV, with g_q = 0.25, g<sub>&chi; = 1.0, sin&theta; = 0.01, m_Z′ = 1 TeV , and m_&chi; = 200 GeV. Also shown are experimentally excluded cross sections of &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) (Obs.) together with the expectations (Exp.) varied up and down by one standard deviation (&plusmn;1&sigma;).

Theoretical cross section for &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) for each of the dark Higgs signal points at m_Z′ ={1000, 1700} GeV, with g_q = 0.25, g<sub>&chi; = 1.0, sin&theta; = 0.01, m_Z′ = 1 TeV , and m_&chi; = 200 GeV. Also shown are experimentally excluded cross sections of &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) (Obs.) together with the expectations (Exp.) varied up and down by one standard deviation (&plusmn;1&sigma;).

Theoretical cross section for &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) for each of the dark Higgs signal points at m_Z′ ={2100, 2500, 2900, 3300} GeV, with g_q = 0.25, g<sub>&chi; = 1.0, sin&theta; = 0.01, m_Z′ = 1 TeV , and m_&chi; = 200 GeV. Also shown are experimentally excluded cross sections of &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) (Obs.) together with the expectations (Exp.) varied up and down by one standard deviation (&plusmn;1&sigma;).

Figure 4a

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Figure 7

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Dependence of $\overline{p}$-$\overline{d}$ correlation on pseudorapidity acceptance of $\overline{p}$ and $\overline{d}$ selection in Pb-Pb collisions at $\sqrt{s_\mathrm{NN}}$ = 5.02 TeV. Results are for 20.0--30.0$\%$ collision centrality.

Dependence of $\overline{p}$-$\overline{d}$ correlation on pseudorapidity acceptance of $\overline{p}$ and $\overline{d}$ selection in Pb-Pb collisions at $\sqrt{s_\mathrm{NN}}$ = 5.02 TeV. Results are for 50.0--60.0$\%$ collision centrality.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the signal region, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $W$+jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Expected distributions of the MEM discriminant $P(S|X)$ in the SR, for the s-channel single-top signal, and for the $t\bar{t}$ and $W$+jets backgrounds, for MEM discriminant values larger than $2.0\times10^{-4}$. Each distribution is normalised to unity. The binning is the same as the optimised binning used in the signal extraction fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $W$+jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 3-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 4-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty bands indicate the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR before the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore not included. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$, after subtraction of all backgrounds. The fitted distribution for the simulation of the signal is shown together with the post-fit uncertainty in the backgrounds. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Pre-fit and post-fit event yields in the SR, for MEM discriminant values larger than $2.0\times10^{-4}$. The central value of the event yield for each process is calculated by summing the values of the discriminant bin contents, using the nominal expected yield for the pre-fit value, and the best-fit estimate for the post-fit value. The error includes statistical and systematic uncertainties summed in quadrature. All sources of systematic uncertainties are included, taking into account correlations and anti-correlations in the post-fit case. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore only included in the post-fit uncertainties.

Observed impact of the different sources of uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. The 'Systematic uncertainties' category combines all sources of systematic uncertainties. The statistical uncertainty is obtained by repeating the fit after having fixed all nuisance parameters, including the $t\bar{t}$ and $W$+jets normalisation factors. 'Total' gives the total uncertainty on the measurement.

Observed impact of the different sources of $t\bar{t}$ modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and 'ME/PS matching' to the matching of the ME to the parton shower.

Observed impact of the different sources of s-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of t-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of $tW$ modelling uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and '$t\bar{t}$ overlap' to the algorithm removing the overlap between $tW$ and $t\bar{t}$ production at NLO, as described in Section 7 in the paper.

Observed impact of the different sources of PDF uncertainties on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the ${E}_{T}^{miss}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the $m_{T}^{W}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Nuisance parameters ranked according to their post-fit impacts on the best-fit value of the ratio $\mu$ of the measured cross-section to the predicted cross-section. In the figure, only the 20 nuisance parameters with the largest post-fit impacts are shown. The empty (solid) blue rectangles illustrate the pre-fit (post-fit) impact on $\mu$, corresponding to the upper axis. The pre-fit (post-fit) impact of each nuisance parameter, $\Delta\mu$, is calculated as the difference in the fitted value of $\mu$ between the nominal fit and the fit when fixing the corresponding nuisance parameter to $\hat{\theta}\pm\Delta\theta$ ($\hat{\theta}\pm\Delta\hat{\theta}$), where $\hat{\theta}$ is the best-fit value of the nuisance parameter and $\Delta\theta$ ($\Delta\hat{\theta}$) is its pre-fit (post-fit) uncertainty. Several systematic uncertainties are split into different nuisance parameters, which are indicated by NP. JES (JER) indicates jet energy scale (resolution), and $\gamma$ indicates a nuisance parameter associated to the MC statistics in one of the 18 bins numbered from 0 to 17. The black points show the best-fit values of the nuisance parameters, with the error bars representing the post-fit uncertainties. Each nuisance parameter is shown wrt. its nominal value, $\theta_0$, and in units of its pre-fit uncertainty, except the free-floating normalisation factors of the $t\bar{t}$ and $W$+jets backgrounds, and the parameters associated to the MC statistics in each bin, for which the post-fit values and uncertainties are shown.

Correlation matrix of the nuisance parameters and of the ratio $\mu$ of the measured cross-section to the predicted cross-section. The correlations are given after the fit to data. In the figure, only the parameters which have a correlation of at least 0.2 with any other parameter are shown.

Distribution of the MEM discriminant $P(S|X)$ in the SR for MEM discriminant values larger than $2.0\times10^{-4}$, for the collision data used for the measurement, and for 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Measured values of the signal cross-section and of the $t\bar{t}$ and $W$+jets normalisation factors, obtained by statistical-only fits to the collision data used for the measurement, and to 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The central values and their statistical uncertainties are obtained by repeating the fit after having fixed all nuisance parameters, except the $t\bar{t}$ and $W$+jets normalisation factors, which are let free-floating (unlike for the statistical uncertainty on the cross-section quoted in the paper). The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Expected, with the corresponding $\pm 1\sigma$ intervals, and observed 95% CL branching fraction upper limits for the Higgs and $Z$ boson decays into a quarkonium state and a photon. Standard Model production of the Higgs boson is assumed. The corresponding upper limits on the production cross section times branching fraction $\sigma\times\mathcal{B}$ are also shown.

$v(Q)$, for central events, as a function of the azimuthal coverage of the detector for data. (Angles in degrees.)

The effect on $v(Q)$ of varying the acceptance in $\varphi_r$. The solid curve shows the expectation from global charge conservation. The 10% most central events are used for data and RQMD. (Angles in degrees.)

The $M_{e_T}$ distributions for four different centrality classes. The curves are the random baseline mixed event distributions. The source of differences in the data and mixed event distributions are addressed in the text.

The residual distribution between the data and mixed event $M_{e_T}$ spectra as a function of $M_{e_T}$ in units of standard deviation. The total ${\chi}^2$ and the number of degrees of freedom for the $0-5\%$, $0-10\%$, $10-20\%$, $20-30\%$ centrality classes are 310.0/32, 896.4/36, 678.7/47, and 553.9/53, respectively. A large fraction of the residual contributions are due to the effects of cluster merging.

Ratio of the electron data to the calculated background as a function of $p_T$ in minimum bias collisions (upper panel) and relative contributions to the background from various sources (lower panel). The curves for $\omega$ and $\phi$ show the sum of the Dalitz and the di-electron decay modes.

The background-subtracted electron spectra for central (0-10%) collisions compared with the expected contributions from open charm decays. Also shown, for central collisions only, are the expected contribution from bottom decays (dashed) and the conversion electron spectrum from a direct phonon prediction (dotted).

The background-subtracted electron spectra for minimum bias (0-92%) collisions compared with the expected contributions from open charm decays. Also shown, for central collisions only, are the expected contribution from bottom decays (dashed) and the conversion electron spectrum from a direct phonon prediction (dotted).

Single electron cross sections $\frac{d\sigma_e}{dy}|_{y=0}$ of this measurement and ISR experiments [9,11,31] are displayed (bottom of figure, right-hand scale) with charm decay contributions calculated with PYTHIA. Open and filled symbols for 1.0 < $p_T$ < 1.4 GeV/$c$ and $p_T$ > 1.4 GeV/$c$, respectively. The derived charm cross section of this measurement is compared with charm cross sections from SPS/FNAL experiments (top of figure, left-hand scale). The thick curve and the shaded band represent the charm cross section in the PYTHIA model and in a NLO pQCD calculation [30], respectively.

Single electron cross sections $\frac{d\sigma_e}{dy}|_{y=0}$ of this measurement and ISR experiments [9,11,31] are displayed (bottom of figure, right-hand scale) with charm decay contributions calculated with PYTHIA. Open and filled symbols for 1.0 < $p_T$ < 1.4 GeV/$c$ and $p_T$ > 1.4 GeV/$c$, respectively. The derived charm cross section of this measurement is compared with charm cross sections from SPS/FNAL experiments (top of figure, left-hand scale). The thick curve and the shaded band represent the charm cross section in the PYTHIA model and in a NLO pQCD calculation [30], respectively.

$v_2$ vs Fixed $p_T$ for several centrality selections. [F] and [A] follow the notation Fig. 2. Systematic errors are estimated to be $\sim 5$%.

$v_2$ vs Assorted $p_T$ for several centrality selections. [F] and [A] follow the notation Fig. 2. Systematic errors are estimated to be $\sim 5$%.

$v_2$ vs Assorted $p_T$ for several centrality selections. [F] and [A] follow the notation Fig. 2. Systematic errors are estimated to be $\sim 5$%.

The centrality dependence of $A_2$ for two different $p_T$ selections. [F] and [A] follow the notation in Fig. 2. Systematic errors are estimated to be $\sim 10$%, dominated by the normalization of the correction function and the model determination of$ \varepsilon$.

The centrality dependence of $A_2$ for two different $p_T$ selections. [F] and [A] follow the notation in Fig. 2. Systematic errors are estimated to be $\sim 10$%, dominated by the normalization of the correction function and the model determination of$ \varepsilon$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ and photon isolation cone radius $R=0.4$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ and photon isolation cone radius $R=0.4$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ and photon isolation cone radius $R=0.4$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ and photon isolation cone radius $R=0.2$.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ and isolation cone radius $0.2$ at NNLO QCD.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ at NNLO QCD.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $|\eta^{\gamma}|<0.6$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $0.6<|\eta^{\gamma}|<0.8$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $0.8<|\eta^{\gamma}|<1.37$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $1.56<|\eta^{\gamma}|<1.81$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $1.81<|\eta^{\gamma}|<2.01$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $2.01<|\eta^{\gamma}|<2.37$.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $|\eta^{\gamma}|<0.6$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $0.6<|\eta^{\gamma}|<0.8$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $0.8<|\eta^{\gamma}|<1.37$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $1.56<|\eta^{\gamma}|<1.81$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $1.81<|\eta^{\gamma}|<2.01$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $2.01<|\eta^{\gamma}|<2.37$ at NNLO QCD.

Distribution of the NN output in the $\geq$1fj$\,$SR in data and the expected contribution of the signal and background processes after the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions considering the correlations of the uncertainties as obtained by the fit.

Distribution of the NN output in the $t\bar{t}\gamma\,$CR in data and the expected contribution of the signal and background processes after the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions considering the correlations of the uncertainties as obtained by the fit.

Total event yield in the $W\gamma\,$CR in data and the expected contribution of the signal and background processes after the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions considering the correlations of the uncertainties as obtained by the fit.

Distribution of the scalar sum of the jet transverse momenta in the 0fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions. The first and last bins include the underflow and overflow, respectively.

Distribution of the $\eta$ of the $b$-tagged jet in the 0fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions.

Distribution of the reconstructed top-quark mass in the 0fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions. The first and last bins include the underflow and overflow, respectively.

Distribution of the $p_{\mathrm{T}}$ of the top-quark+photon system in the 0fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of the photon $p_{\mathrm{T}}$ in the 0fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of the photon $\eta$ in the 0fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions.

Distribution of the scalar sum of the jet transverse momenta in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of the invariant mass of the $b$-tagged jet and the highest-$p_{\mathrm{T}}$ forward jet in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of $p_{\mathrm{T}}$ of the highest-$p_{\mathrm{T}}$ forward jet in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of the difference in $\eta$ between the highest-$p_{\mathrm{T}}$ forward jet and the photon in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of the energy of the system formed by the highest-$p_{\mathrm{T}}$ forward jet and the photon in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions. The first and last bins include the underflow and overflow, respectively.

Distribution of the $\eta$ of the $b$-tagged jet in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions.

Distribution of the reconstructed top-quark mass in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions. The first and last bins include the underflow and overflow, respectively.

Distribution of the $p_{\mathrm{T}}$ of the top-quark and photon system in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of the photon $p_{\mathrm{T}}$ in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of the photon $\eta$ in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions.

Ordered list of the 30 systematic uncertainties with the largest impact on the measured signal normalisation in the fit to data in the parton-level measurement considered as nuisance parameters (NPs) in the profile-likelihood fit. The column "NP value, error" corresponds to the nominal best-fit values and the corresponding uncertainties. The impact of each NP, $\Delta\sigma$/$\sigma_{\mathrm{pred}}$, is computed by comparing the nominal best-fit value of the POI ($\sigma$/$\sigma_{\mathrm{pred}}$) with the result of the fits when fixing the considered NP to its best-fit value shifted by its pre-fit and post-fit uncertainties. The corresponding impacts are listed in the "POI impact prefit high/low" and "POI impact high/low" columns, respectively. The "MC stat." NPs represent the MC statistical uncertainty and they enter the likelihood with a Poisson term, while all the other NPs enter the likelihood via a Gaussian term.

Ordered list of the 30 systematic uncertainties with the largest impact on the measured signal normalisation in the fit to data in the particle-level measurement considered as nuisance parameters (NPs) in the profile-likelihood fit. The column "NP value, error" corresponds to the nominal best-fit values and the corresponding uncertainties. The impact of each NP, $\Delta\sigma$/$\sigma_{\mathrm{pred}}$, is computed by comparing the nominal best-fit value of the POI ($\sigma$/$\sigma_{\mathrm{pred}}$) with the result of the fits when fixing the considered NP to its best-fit value shifted by its pre-fit and post-fit uncertainties. The corresponding impacts are listed in the "POI impact prefit high/low" and "POI impact high/low" columns, respectively. The "MC stat." NPs represent the MC statistical uncertainty and they enter the likelihood with a Poisson term, while all the other NPs enter the likelihood via a Gaussian term.

This table lists the kinematic requirements on parton-level objects used to define of the fiducial phase space for the parton-level measurement. Frixione isolation ($\href{https://arxiv.org/abs/hep-ph/9801442}{\text{hep-ph/9801442}}$) with a chosen radius of $\Delta R = 0.2$ is applied to photons ($\gamma$). The measured fiducial parton-level cross section is $\sigma_{tq\gamma}\times\mathcal{B}(t\rightarrow l\nu b) = 688\pm 23(\text{stat.})^{+75}_{-71}(\text{syst.})\,$fb.

This table lists the kinematic requirements on particle-level objects used to define of the fiducial phase space for the particle-level measurement. The particle level objects are photons ($\gamma$) not from a hadron decay, neutrinos not from a hadron decay ($\nu$), prompt electrons and muons ($\ell$) "dressed" by adding close-by ($\Delta R < 0.1$) photons, and anti-$k_t$ $R = 0.4$ jets built from stable particles ($\tau > 30\,$ps) and tau leptons excluding neutrinos and prompt dressed muons. Jets are $b$-tagged ($b$-jet) using ghost-matched $b$-hadrons with $p_{\text{T}} > 5\,$GeV. Apart from the kinematic requirements, isolation and overlap removal criteria are applied. Jets within $\Delta R = 0.4$ of a photon are removed if the $p_{\text{T}}$ of charged particles within $\Delta R = 0.3$ of the photon is smaller than $10\,\%$ of its $p_{\text{T}}$. Jets within $\Delta R = 0.4$ of a lepton are removed. Events are removed where a photon is close ($\Delta R < 0.4$) to a lepton or a surviving jet. The measured fiducial particle-level cross section is $\sigma_{tq\gamma}\times\mathcal{B}(t\rightarrow l\nu b)+\sigma_{t(\rightarrow l\nu b\gamma)q} = 303\pm 9(\text{stat.})^{+33}_{-32}(\text{syst.})\,$fb.

The performance of jet energy resolution (JER) for jets with |y| < 2.1 evaluated as a function of pT_truth in different centrality bins. Simulated hard scatter events were overlaid onto events from a dedicated sample of minimum-bias Xe+Xe data. The fit parameters are listed in a sperate table (Extras 1)

The relative magnitude of systematic uncertainties for per-pair normalized xJ distributions in 0-10% Xe+Xe centrality

The relative magnitude of systematic uncertainties for absolutely normalized xJ distributions in 0-10% Xe+Xe centrality

The relative magnitude of systematic uncertainties for rho distributions for leading jets in 0-10% Xe+Xe centrality

Per-pair normalized xJ distribution evaluated in four centrality intervals and given pT1 interval.

Per-pair normalized xJ distribution evaluated in four centrality intervals and given pT1 interval.

Per-pair normalized xJ distribution evaluated in four centrality intervals and given pT1 interval.

Absolutely normalized xJ distribution evaluated in four centrality intervals and given pT1 interval.

Absolutely normalized xJ distribution evaluated in four centrality intervals and given pT1 interval.

Absolutely normalized xJ distribution evaluated in four centrality intervals and given pT1 interval.

Per-pair normalized xJ distribution in Xe+Xe collisions.

Per-pair normalized xJ distribution in Pb+Pb collisions.

Per-pair normalized xJ distribution in Xe+Xe collisions.

Per-pair normalized xJ distribution in Pb+Pb collisions.

Per-pair normalized xJ distribution in Xe+Xe collisions.

Per-pair normalized xJ distribution in Pb+Pb collisions.

Absolutely normalized xJ distribution in Xe+Xe collisions.

Absolutely normalized xJ distribution in Xe+Xe collisions.

Absolutely normalized xJ distribution in Xe+Xe collisions.

Absolutely normalized xJ distribution in Xe+Xe collisions.

Absolutely normalized xJ distribution in Xe+Xe collisions.

Absolutely normalized xJ distribution in Xe+Xe collisions.

The ratios of Xe+Xe and Pb+Pb pair nuclear-modification factors, rho, evaluated as a function of leading jet pT in the same centrality intervals.

The ratios of Xe+Xe and Pb+Pb pair nuclear-modification factors, rho, evaluated as a function of leading jet pT in the same centrality intervals.

The ratios of Xe+Xe and Pb+Pb pair nuclear-modification factors, rho, evaluated as a function of leading jet pT in the same centrality intervals.

The ratios of Xe+Xe and Pb+Pb pair nuclear-modification factors, rho, evaluated as a function of subleading jet pT in the same centrality intervals.

The ratios of Xe+Xe and Pb+Pb pair nuclear-modification factors, rho, evaluated as a function of subleading jet pT in the same centrality intervals.

The ratios of Xe+Xe and Pb+Pb pair nuclear-modification factors, rho, evaluated as a function of subleading jet pT in the same centrality intervals.

The ratios of Xe+Xe and Pb+Pb pair nuclear-modification factors, rho, evaluated as a function of leading jet pT in the same SUM ETFCal intervals (selecting equivalent event activity)

The ratios of Xe+Xe and Pb+Pb pair nuclear-modification factors, rho, evaluated as a function of leading jet pT in the same SUM ETFCal intervals (selecting equivalent event activity)

The ratios of Xe+Xe and Pb+Pb pair nuclear-modification factors, rho, evaluated as a function of leading jet pT in the same SUM ETFCal intervals (selecting equivalent event activity)

The ratios of Xe+Xe and Pb+Pb pair nuclear-modification factors, rho, evaluated as a function of subleading jet pT in the same SUM ETFCal intervals (selecting equivalent event activity)

The ratios of Xe+Xe and Pb+Pb pair nuclear-modification factors, rho, evaluated as a function of subleading jet pT in the same SUM ETFCal intervals (selecting equivalent event activity)

The ratios of Xe+Xe and Pb+Pb pair nuclear-modification factors, rho, evaluated as a function of subleading jet pT in the same SUM ETFCal intervals (selecting equivalent event activity)

Parameter a,b, and c from JER fits in Figure 1b.

Per-pair normalized xJ distribution in Xe+Xe collisions for selected Pb+Pb centrality and pT1 bin.

Per-pair normalized xJ distribution in Xe+Xe collisions for selected Pb+Pb centrality and pT1 bin.

Per-pair normalized xJ distribution in Xe+Xe collisions for selected Pb+Pb centrality and pT1 bin.

Per-pair normalized xJ distribution in Xe+Xe collisions for selected Pb+Pb centrality and pT1 bin.

Per-pair normalized xJ distribution in Xe+Xe collisions for selected Pb+Pb centrality and pT1 bin.

Per-pair normalized xJ distribution in Xe+Xe collisions for selected Pb+Pb centrality and pT1 bin.

Per-pair normalized xJ distribution in Xe+Xe collisions for selected Pb+Pb centrality and pT1 bin.

Per-pair normalized xJ distribution in Xe+Xe collisions for selected Pb+Pb centrality and pT1 bin.

Per-pair normalized xJ distribution in Xe+Xe collisions for selected Pb+Pb centrality and pT1 bin.

Normalisation factors for the major background processes and ttW ($\Delta \eta < 0$) from the fit using only statistical uncertainties (fixing Nuisance Parameters (NP) to their fitted values) to data in all analysis regions.

Normalisation factors for the major background processes and ttW ($\Delta \eta < 0$) from the fit using using both statistical and systematic uncertainties to data in all analysis regions.

Correlation matrix between the Normalisation Factors in the fit using only statistical uncertainties (fixing Nuisance Parameters (NP) to their fitted values) to data in all analysis regions.

The most relevant systematic uncertainties ranked by their impact on the leptonic charge asymmetry ($A_c^{\ell}$) parameter at reconstructed level. The impact of the uncertainties is shown before and after the combined profile-likelihood fit to data in the signal and control regions. Pulls introduced by the fitting procedure are also shown. The entries shown in bold are the uncertainties of the freely floating background normalisations. ME stands for "matrix element", PS for "parton shower" and JER for "jet energy resolution". The gamma-uncertainties refer to the MC statistical uncertainties in a specific region and bin.

The most relevant systematic uncertainties ranked by their impact on the ttW Normalisation Factor ($\Delta \eta < 0$) parameter at reconstructed level. The impact of the uncertainties is shown before and after the combined profile-likelihood fit to data in the signal and control regions. Pulls introduced by the fitting procedure are also shown. ME stands for "matrix element", PS for "parton shower" and JER for "jet energy resolution". The gamma-uncertainties refer to the MC statistical uncertainties in a specific region and bin.

The predicted and observed numbers of events in the control and signal regions. The predictions are shown before the fit to data. The indicated uncertainties consider statistical as well as all experimental and theoretical systematic uncertainties. Background categories with event yields with a value of 1.0e-6 have a negligible contribution to the region and are manually set to that value.

The predicted and observed numbers of events in the control and signal regions. The predictions are shown after the fit to data. The indicated uncertainties consider statistical as well as all experimental and theoretical systematic uncertainties. Background categories with event yields with a value of 1.0e-6 have a negligible contribution to the region and are manually set to that value.