Differential cross section (multiplied by the dimuon branching fraction) of prompt $\psi$(2S) mesons in pPb collisions at $\sqrt(s_{\textrm{NN}})=5.02 $ TeV, as a function of $p_{\textrm{T}}$, for three forward $y_{\mathrm{CM}}$ regions. The fully correlated luminosity uncertainty of 3.5% is not included in the point-by-point uncertainty. NOTE- The cross section unit is nb (nano barn); the y-axes of the figures in the publication show pb (pico barn) by mistake.

Differential cross section (multiplied by the dimuon branching fraction) of prompt $\psi$(2S) mesons in pp collisions at $\sqrt(s_{\textrm{NN}})=5.02 $ TeV, as a function of $p_{\textrm{T}}$, for four $y_{\mathrm{CM}}$ regions. The fully correlated luminosity uncertainty of 2.3% is not inlcuded in the point-by-point uncertainty.

Differential cross section (multiplied by the dimuon branching fraction) of prompt $\psi$(2S) mesons in pp collisions at $\sqrt(s)=5.02 $ TeV, as a function of $p_{\textrm{T}}$, for four $y_{\mathrm{CM}}$ regions. The fully correlated luminosity uncertainty of 2.3% is not included in the point-by-point uncertainty. NOTE- The cross section unit is nb (nano barn); the y-axes of the figures in the publication show pb (pico barn) by mistake.

Rapidity dependence of $R_{\mathrm{pPb}}$ for prompt $\psi$(2S) mesons at $\sqrt(s_{\textrm{NN}})=5.02 $ TeV, in three $p_{\mathrm{T}}$ ranges. The fully correlated global uncertainty of 4.2% is not inlcuded in the point-by-point uncertainty.

Rapidity dependence of $R_{\mathrm{pPb}}$ for prompt $\psi$(2S) mesons at $\sqrt(s_{\textrm{NN}})=5.02 $ TeV, in three $p_{\mathrm{T}}$ ranges. The fully correlated global uncertainty of 4.2% is not included in the point-by-point uncertainty.

Transverse momentum dependence of $R_{\mathrm{pPb}}$ for prompt $\psi$(2S) mesons at $\sqrt(s_{\textrm{NN}})=5.02 $ TeV, in seven $y_{\mathrm{CM}}$ ranges. The fully correlated global uncertainty of 4.2% is not inlcuded in the point-by-point uncertainty.

Transverse momentum dependence of $R_{\mathrm{pPb}}$ for prompt $\psi$(2S) mesons at $\sqrt(s_{\textrm{NN}})=5.02 $ TeV, in seven $y_{\mathrm{CM}}$ ranges. The fully correlated global uncertainty of 4.2% is not incuded in the point-by-point uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of inclusive jet multiplicity, $N_{\text{jets}}^{\text{min}}$.

Measured cross section for Z+jets as a function of the transverse momementum of the Z boson, $p_{\text{T}}(\text{Z})$, for events with at least one jet and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the transverse momementum of the Z boson, $p_{\text{T}}(\text{Z})$, for events with at least one jet.

Measured cross section for Z+jets as a function of the transverse momenum of the first jet, $p_{\text{T}}(\text{j}_1)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the transverse momenum of the first jet, $p_{\text{T}}(\text{j}_1)$.

Measured cross section for Z+jets as a function of the transverse momenum of the second jet, $p_{\text{T}}(\text{j}_2)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the transverse momenum of the second jet, $p_{\text{T}}(\text{j}_2)$.

Measured cross section for Z+jets as a function of the transverse momenum of the third jet, $p_{\text{T}}(\text{j}_3)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the transverse momenum of the third jet, $p_{\text{T}}(\text{j}_3)$.

Measured cross section for Z+jets as a function of the absolute rapidity of the first jet, $|y(\text{j}_1)|$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the absolute rapidity of the first jet, $|y(\text{j}_1)|$.

Measured cross section for Z+jets as a function of the absolute rapidity of the second jet, $|y(\text{j}_2)|$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the absolute rapidity of the second jet, $|y(\text{j}_2)|$.

Measured cross section for Z+jets as a function of the absolute rapidity of the third jet, $|y(\text{j}_3)|$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the absolute rapidity of the third jet, $|y(\text{j}_3)|$.

Measured cross section for Z+jets as a function of the $H_{\text{T}}$ observable for event with at least one jet and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the $H_{\text{T}}$ observable for event with at least one jet.

Measured cross section for Z+jets as a function of the $H_{\text{T}}$ observable for event with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the $H_{\text{T}}$ observable for event with at least two jets.

Measured cross section for Z+jets as a function of the $H_{\text{T}}$ observable for event with at least three jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the $H_{\text{T}}$ observable for event with at least three jets.

Measured cross section for Z+jets as a function of the transverse momentum balance between the Z boson and the accompanying jets, $p_{\text{T}}^{\text{bal}}$, for events with at least one jet and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the transverse momentum balance between the Z boson and the accompanying jets, $p_{\text{T}}^{\text{bal}}$, for events with at least one jet.

Measured cross section for Z+jets as a function of the transverse momentum balance between the Z boson and the accompanying jets, $p_{\text{T}}^{\text{bal}}$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the transverse momentum balance between the Z boson and the accompanying jets, $p_{\text{T}}^{\text{bal}}$, for events with at least two jets.

Measured cross section for Z+jets as a function of the transverse momentum balance between the Z boson and the accompanying jets, $p_{\text{T}}^{\text{bal}}$, for events with at least three jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the transverse momentum balance between the Z boson and the accompanying jets, $p_{\text{T}}^{\text{bal}}$, for events with at least three jets.

Measured cross section for Z+jets as a function of the JZB variable with no restriction on $p_{\text{T}}(\text{Z})$ and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the JZB variable with no restriction on $p_{\text{T}}(\text{Z})$.

Measured cross section for Z+jets as a function of the JZB variable for $p_{\text{T}}(\text{Z})\leq50\,$GeV) and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the JZB variable for $p_{\text{T}}(\text{Z})\leq50\,$GeV).

Measured cross section for Z+jets as a function of the JZB variable for $p_{\text{T}}(\text{Z})>50\,$GeV and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the JZB variable for $p_{\text{T}}(\text{Z})>50\,$GeV.

2-dimensional aTGC limits in lepton + jet events in WW and WZ production

2-dimensional aTGC limits in lepton + jet events in WW and WZ production

2-dimensional aTGC limits in LEP paramatrization in lepton + jet events in WW and WZ production

2-dimensional aTGC limits in LEP paramatrization in lepton + jet events in WW and WZ production

2-dimensional aTGC limits in LEP paramatrization in lepton + jet events in WW and WZ production

Invariant mass distribution of the selected $\mathrm{B}^+\mathrm{K}^-$ candidates in data

Invariant mass distribution of the selected $\mathrm{B}^0 \mathrm{K}^{0}_{\mathrm{S}}$ candidates in data

The observed signal yields ($N$), natural widths ($\Gamma$), and mass differences from the fits to the $m_{\mathrm{BK}}$ distributions in data, for the two channels: $\mathrm{B}^+\mathrm{K}^-$ and $\mathrm{B}^0 \mathrm{K}^{0}_{\mathrm{S}}$. The uncertainties are statistical only.

The measured ratios of branching fractions

The measured ratios of cross sections times branching fractions

The measured mass differences $M(\mathrm{B}^{(*)0}_{\mathrm{s1,2}})-M^{\mathrm{PDG}}_{\mathrm{B}}-M^{\mathrm{PDG}}_{\mathrm{K}}$

The measured masses of $\mathrm{B}^{*}_{\mathrm{s2}}(5840)^0$ and $\mathrm{B}_{\mathrm{s1}}(5830)^0$ mesons

The measured mass differences between neutral and charged B mesons

The measured $\mathrm{B}^{*}_{\mathrm{s2}}(5840)^0$ natural width

Distributions of $\min[M(\ell,\mathrm{j})]$ in the W+jets control region, for 0 W-tagged jet category. Example signal distributions are also shown. The background distributions correspond to background-only fit to data while signal distributions are before the fit to data. Electron and muon event samples are combined. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{j})]$ in the W+jets control region, for 1 or more W-tagged jet category. Example signal distributions are also shown. The background distributions correspond to background-only fit to data while signal distributions are before the fit to data. Electron and muon event samples are combined. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 0 W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 0 W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 1 or more W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 1 or more W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 0 W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 0 W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 1 or more W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 1 or more W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Expected and observed limits at 95% CL for an LH $X_{5/3}$ after combining all categories for the same-sign dilepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an RH $X_{5/3}$ after combining all categories for the same-sign dilepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an LH $X_{5/3}$ after combining all categories for the single-lepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an RH $X_{5/3}$ after combining all categories for the single-lepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an LH $X_{5/3}$ after combining the same-sign dilepton and single-lepton final states. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an RH $X_{5/3}$ after combining the same-sign dilepton and single-lepton final states. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Differential cross section in bins of pT(Z). Values are expressed as a fraction of the total cross section. The inclusive final state is shown.

Differential cross section in bins of pT(Z). Values are expressed as a fraction of the total cross section. The emm and mmm final states are shown.

Differential cross section in bins of mass of the WZ system. Values are expressed as a fraction of the total cross section.

Measured WZ production cross sections computed separately in each of the flavour categories.

Measured fiducial cross sections and their corresponding uncertainties for each of the individual flavour categories, as well as for the combination of the four. The combined value is the result of a symultaneous fit to the four categories, therefore both the central value and its total uncertaintydiffer from the sum of the central values and the quadratic sum of the uncertainties respectively, because of correlations among sources of uncertainty in the categorized values.

Differential cross section in bins of pT(leading jet). Values are expressed as a fraction of the total cross section. The inclusive final state is shown.

Expected and observed yields for each of the relevant processes and flavour categories. Combined statistical and systematic uncertainties are shown for each case except for the observed data yields for which only statistical uncertainties are presented. All expected yields correspond to quantities estimated after the maximum likelihood fit. Uncertainties are computed taking into account the full correlation matrix between sources of uncertainty, processes, and flavour categories.

Differential cross section in bins of pT(leading jet). Values are expressed as a fraction of the total cross section. The eee, eem, emm, and mmm final states are shown.

Summary of the total postfit impact of each uncertainty source on the uncertainty in the signal strength measurement, for the four flavour categories and their combination. Theoretical uncertainties are only included in the signal acceptance during the extrapolation to the total phase space, so they are not included in the likelihood fit. The values are percentages and correspond to half the difference between the up and down variation of each systematic uncertainty component.

Efficiencies estimated as transfer factors from the fiducial region to the signal region using generator-level information, for an integrated luminosity L of 35.9 inverse femtobarn. Statistical, scale, and PDF uncertainties are later propagated to the final cross section measurement.

Measured WZ production cross section computed in the inclusive final state and split by W boson charge, and asymmetry ratio.