Distribution of the NN output in the $\geq$1fj$\,$SR in data and the expected contribution of the signal and background processes after the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions considering the correlations of the uncertainties as obtained by the fit.

Distribution of the NN output in the $t\bar{t}\gamma\,$CR in data and the expected contribution of the signal and background processes after the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions considering the correlations of the uncertainties as obtained by the fit.

Total event yield in the $W\gamma\,$CR in data and the expected contribution of the signal and background processes after the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions considering the correlations of the uncertainties as obtained by the fit.

Distribution of the scalar sum of the jet transverse momenta in the 0fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions. The first and last bins include the underflow and overflow, respectively.

Distribution of the $\eta$ of the $b$-tagged jet in the 0fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions.

Distribution of the reconstructed top-quark mass in the 0fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions. The first and last bins include the underflow and overflow, respectively.

Distribution of the $p_{\mathrm{T}}$ of the top-quark+photon system in the 0fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of the photon $p_{\mathrm{T}}$ in the 0fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of the photon $\eta$ in the 0fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions.

Distribution of the scalar sum of the jet transverse momenta in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of the invariant mass of the $b$-tagged jet and the highest-$p_{\mathrm{T}}$ forward jet in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of $p_{\mathrm{T}}$ of the highest-$p_{\mathrm{T}}$ forward jet in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of the difference in $\eta$ between the highest-$p_{\mathrm{T}}$ forward jet and the photon in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of the energy of the system formed by the highest-$p_{\mathrm{T}}$ forward jet and the photon in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions. The first and last bins include the underflow and overflow, respectively.

Distribution of the $\eta$ of the $b$-tagged jet in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions.

Distribution of the reconstructed top-quark mass in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions. The first and last bins include the underflow and overflow, respectively.

Distribution of the $p_{\mathrm{T}}$ of the top-quark and photon system in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of the photon $p_{\mathrm{T}}$ in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of the photon $\eta$ in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions.

Ordered list of the 30 systematic uncertainties with the largest impact on the measured signal normalisation in the fit to data in the parton-level measurement considered as nuisance parameters (NPs) in the profile-likelihood fit. The column "NP value, error" corresponds to the nominal best-fit values and the corresponding uncertainties. The impact of each NP, $\Delta\sigma$/$\sigma_{\mathrm{pred}}$, is computed by comparing the nominal best-fit value of the POI ($\sigma$/$\sigma_{\mathrm{pred}}$) with the result of the fits when fixing the considered NP to its best-fit value shifted by its pre-fit and post-fit uncertainties. The corresponding impacts are listed in the "POI impact prefit high/low" and "POI impact high/low" columns, respectively. The "MC stat." NPs represent the MC statistical uncertainty and they enter the likelihood with a Poisson term, while all the other NPs enter the likelihood via a Gaussian term.

Ordered list of the 30 systematic uncertainties with the largest impact on the measured signal normalisation in the fit to data in the particle-level measurement considered as nuisance parameters (NPs) in the profile-likelihood fit. The column "NP value, error" corresponds to the nominal best-fit values and the corresponding uncertainties. The impact of each NP, $\Delta\sigma$/$\sigma_{\mathrm{pred}}$, is computed by comparing the nominal best-fit value of the POI ($\sigma$/$\sigma_{\mathrm{pred}}$) with the result of the fits when fixing the considered NP to its best-fit value shifted by its pre-fit and post-fit uncertainties. The corresponding impacts are listed in the "POI impact prefit high/low" and "POI impact high/low" columns, respectively. The "MC stat." NPs represent the MC statistical uncertainty and they enter the likelihood with a Poisson term, while all the other NPs enter the likelihood via a Gaussian term.

This table lists the kinematic requirements on parton-level objects used to define of the fiducial phase space for the parton-level measurement. Frixione isolation ($\href{https://arxiv.org/abs/hep-ph/9801442}{\text{hep-ph/9801442}}$) with a chosen radius of $\Delta R = 0.2$ is applied to photons ($\gamma$). The measured fiducial parton-level cross section is $\sigma_{tq\gamma}\times\mathcal{B}(t\rightarrow l\nu b) = 688\pm 23(\text{stat.})^{+75}_{-71}(\text{syst.})\,$fb.

This table lists the kinematic requirements on particle-level objects used to define of the fiducial phase space for the particle-level measurement. The particle level objects are photons ($\gamma$) not from a hadron decay, neutrinos not from a hadron decay ($\nu$), prompt electrons and muons ($\ell$) "dressed" by adding close-by ($\Delta R < 0.1$) photons, and anti-$k_t$ $R = 0.4$ jets built from stable particles ($\tau > 30\,$ps) and tau leptons excluding neutrinos and prompt dressed muons. Jets are $b$-tagged ($b$-jet) using ghost-matched $b$-hadrons with $p_{\text{T}} > 5\,$GeV. Apart from the kinematic requirements, isolation and overlap removal criteria are applied. Jets within $\Delta R = 0.4$ of a photon are removed if the $p_{\text{T}}$ of charged particles within $\Delta R = 0.3$ of the photon is smaller than $10\,\%$ of its $p_{\text{T}}$. Jets within $\Delta R = 0.4$ of a lepton are removed. Events are removed where a photon is close ($\Delta R < 0.4$) to a lepton or a surviving jet. The measured fiducial particle-level cross section is $\sigma_{tq\gamma}\times\mathcal{B}(t\rightarrow l\nu b)+\sigma_{t(\rightarrow l\nu b\gamma)q} = 303\pm 9(\text{stat.})^{+33}_{-32}(\text{syst.})\,$fb.

The frequentist $3\sigma$ confidence region in $\sin^2(2\theta)$ $\Delta m^2$ for a 2-neutrino muon-to-electron oscillation fit.

The test-statistic $-2\ln\mathcal{L}$ as a function of $\Delta m^2$ and $\sin^2(2\theta)$ for a 2-neutrino muon-to-electron oscillation fit.

Observed NuE data and background prediction for arXiv:2006.16883

Observed NuMu data and prediction for arXiv:2006.16883

NuMu to NuE oscillation simulation for arXiv:2006.16883. Used used for the combined fit and the neutrino-mode analysis. ntuple has 17,204 predicted muon-to-electron neutrino and antineutrino full transmutation events simulated for the neutrino-mode beam, and contains information on reconstructed neutrino energy ($E_\text{vis}$), true neutrino energy, neutrino baseline, and event weight for each event.

Observed NuEBar data and background prediction for arXiv:2006.16883

Observed NuMuBar data and prediction for arXiv:2006.16883

NuMuBar to NuEBar oscillation simulation for arXiv:2006.16883. Used only for the combined fit. ntuple has 117,949 predicted muon-to-electron neutrino and antineutrino full transmutation events simulated for the antineutrino-mode beam, and contains information on reconstructed neutrino energy ($E_\text{vis}$), true neutrino energy, neutrino baseline, and event weight for each event. This simulation is only used for the combined fit.

NuMuBar to NuEBar oscillation simulation for arXiv:1207.4809. Used only for the antineutrino-mode analysis. ntuple has 86,403 predicted muon-to-electron neutrino and antineutrino full transmutation events simulated for the antineutrino-mode beam, and contains information on reconstructed neutrino energy ($E_\text{vis}$), true neutrino energy, neutrino baseline, and event weight for each event. This simulation is only used for the antineutrino-mode analysis.

The combined fractional covariance matrix for arXiv:2006:16883 includes bins for six classes of events in the following order: 1) neutrino-mode muon-to-electron full transmutation events, 2) neutrino-mode electron neutrino background events, 3) neutrino-mode muon neutrino CCQE events, 4) antineutrino-mode muon-to-electron full transmutation events, 5) antineutrino-mode electron antineutrino background events, 6) antineutrino-mode muon antineutrino CCQE events. Of these categories, the fractional covariance matrix includes the data statistical and systematic errors for four categories: (anti)neutrino-mode electron (anti)neutrino background events, and (anti)neutrino-mode muon (anti)neutrino CCQE events. The (anti)neutrino-mode muon-to-electron full transmutation event portions of the fractional covariance matrix only include systematic errors. The six event classes map to four observable event classifications: 1) NuE-like which includes classes 1 and 2, 2) NuMu-like which includes class 3, 3) NuEBar-like which includes classes 4 and 5, and 4) NuMuBar-like which includes class 6.

The neutrino-mode fractional covariance matrix for arXiv:2006:16883 includes bins for three classes of events in the following order: 1) neutrino-mode muon-to-electron full transmutation events, 2) neutrino-mode electron neutrino background events, 3) neutrino-mode muon neutrino CCQE events. Of these categories, the fractional covariance matrix includes the data statistical and systematic errors for two categories: neutrino-mode electron neutrino background events, and neutrino-mode muon neutrino CCQE events. The neutrino-mode muon-to-electron full transmutation event portion of the fractional covariance matrix only includes systematic errors. The three event classes map to two observable event classifications: 1) NuE-like which includes classes 1 and 2, 2) NuMu-like which includes class 3.

The antineutrino fractional covariance matrix for arXiv:1207.4809 includes bins for three classes of events in the following order: 1) antineutrino-mode muon-to-electron full transmutation events, 2) antineutrino-mode electron antineutrino background events, 3) antineutrino-mode muon antineutrino CCQE events. Of these categories, the fractional covariance matrix includes the data statistical and systematic errors for two categories: antineutrino-mode electron antineutrino background events, and antineutrino-mode muon antineutrino CCQE events. The antineutrino-mode muon-to-electron full transmutation event portions of the fractional covariance matrix only include systematic errors. The three event classes map to two observable event classifications: 1) NuEBar-like which includes classes 1 and 2, and 2) NuMuBar-like which includes class 3.