95% CL observed and expected upper limits on M_* for spin-independent (D5) WIMP models. The impact of the +-1sigma theoretical uncertainty on the observed limits and the expected +-1sigma range of limits in the absence of a signal are also given.

95% CL observed and expected upper limits on M_* for spin-dependent (D8) WIMP models. The impact of the +-1sigma theoretical uncertainty on the observed limits and the expected +-1sigma range of limits in the absence of a signal are also given.

95% CL observed and expected upper limits on M_* for spin-dependent (D9) WIMP models. The impact of the +-1sigma theoretical uncertainty on the observed limits and the expected +-1sigma range of limits in the absence of a signal are also given.

95% CL observed and expected limits on the nucleon-WIMP scattering cross-section for spin-independent (D1) WIMP models. The impact of the +-1sigma theoretical uncertainty on the observed limits and the expected +-1sigma range of limits in the absence of a signal are also given.

95% CL observed and expected limits on the nucleon-WIMP scattering cross-section for spin-independent (D5) WIMP models. The impact of the +-1sigma theoretical uncertainty on the observed limits and the expected +-1sigma range of limits in the absence of a signal are also given.

95% CL observed and expected limits on the nucleon-WIMP scattering cross-section for spin-dependent (D8) WIMP models. The impact of the +-1sigma theoretical uncertainty on the observed limits and the expected +-1sigma range of limits in the absence of a signal are also given.

95% CL observed and expected limits on the nucleon-WIMP scattering cross-section for spin-dependent (D9) WIMP models. The impact of the +-1sigma theoretical uncertainty on the observed limits and the expected +-1sigma range of limits in the absence of a signal are also given.

Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of PT(TOPBAR).

Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(T)).

The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.

Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(TBAR)).

Parametrization factors for the $m_{t}$ dependence [see Eq. (4) in the paper] of $\sigma(tq)$, $\sigma(\bar tq)$, and $\sigma(t q+\bar t q)$.

The value of $|V_{tb}|^{2}$ is extracted by dividing the measured value of $\sigma(t q+\bar t q)$ by the prediction of the approximate NNLO calculation. The experimental and theoretical uncertainties are added in quadrature.

The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.

Event yields for the 2-jet-$\ell^{+}$ and 2-jet-$\ell^{-}$ HPR channels. The expectation for the signal and background yields correspond to the result of the binned maximum-likelihood fit described in Sec. $\mathrm{VI~D}$ in the paper. The uncertainty of the expectations is the normalization uncertainty of each process after the fit, as described in Sec. $\mathrm{VII~F}$ in the paper.

Migration matrix relating the parton level $p_{\mathrm{T}}(t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-quark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $p_{\mathrm{T}}(\bar t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-antiquark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $|y(t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-quark $|y|$ distribution.

Migration matrix relating the parton level $|y(\bar t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-antiquark $|y|$ distribution.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Comparison between the measured differential cross sections and the predictions from the NLO calculation using the MSTW2008 PDF set. For each variable and prediction a $\chi^{2}$ value is calculated with HERAfitter using the covariance matrix of each measured spectrum. The theory uncertainties of the predictions are treated as uncorrelated. The number of degrees of freedom (NDF) is equal to the number of bins in the measured spectrum.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, mistag efficiency, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The JES $\eta$ intercalibration uncertainty has a sign switch from the first to the second bin. For the $tq$ generator $+$ parton shower uncertainty a sign switch is denoted with $\mp$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $c-$tagging efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content $:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet energy resolution, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$ tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the differential cross section as a function of $|y(\bar t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(\bar t)|$.

Differential cross-section for non-prompt chi_c2 production, measured in bins of J/psi pT, assuming unpolarised chi_c production. The measurements are not corrected for the branching fractions of the decays chi_c --> J/psi + gamma and J/psi --> mu+ mu-. The uncertainty envelope associated with the unknown chi_c spin alignment is also shown.

Differential cross-section for prompt chi_c1 production, measured in bins of chi_c1 pT, assuming unpolarised chi_c production. The measurements are not corrected for the branching fractions of the decays chi_c --> J/psi + gamma and J/psi --> mu+ mu-. The uncertainty envelope associated with the unknown chi_c spin alignment is also shown.

Differential cross-section for prompt chi_c2 production, measured in bins of chi_c2 pT, assuming unpolarised chi_c production. The measurements are not corrected for the branching fractions of the decays chi_c --> J/psi + gamma and J/psi --> mu+ mu-. The uncertainty envelope associated with the unknown chi_c spin alignment is also shown.

Differential cross-section for non-prompt chi_c1 production, measured in bins of chi_c1 pT, assuming unpolarised chi_c production. The measurements are not corrected for the branching fractions of the decays chi_c --> J/psi + gamma and J/psi --> mu+ mu-. The uncertainty envelope associated with the unknown chi_c spin alignment is also shown.

Differential cross-section for non-prompt chi_c2 production, measured in bins of chi_c2 pT, assuming unpolarised chi_c production. The measurements are not corrected for the branching fractions of the decays chi_c --> J/psi + gamma and J/psi --> mu+ mu-. The uncertainty envelope associated with the unknown chi_c spin alignment is also shown.

Fraction of prompt J/psi produced in feed-down from radiative chi_c decays as a function of J/psi pT, assuming unpolarised chi_c production. The uncertainty envelope associated with the unknown chi_c spin alignment is also shown. The spin-alignment envelope assumes that prompt J/psi are produced unpolarised and represents the maximum uncertainty due to the unknown chi_c spin alignment.

Production rate of prompt chi_c2 relative to prompt chi_c1, measured in bins of J/psi pT, assuming unpolarised chi_c production. The ratio is not corrected for the branching fractions of chi_c1 and chi_c2 into J/psi gamma. The uncertainty envelope associated with the unknown chi_c spin alignment is also shown.

Production rate of non-prompt chi_c2 relative to non-prompt chi_c1, measured in bins of J/psi pT, assuming unpolarised chi_c production. The ratio is not corrected for the branching fractions of chi_c1 and chi_c2 into J/psi gamma. The uncertainty envelope associated with the unknown chi_c spin alignment is also shown.

Fraction of chi_c1 produced in b-hadron decays as a function of chi_c1 pT, assuming unpolarised chi_c production. The uncertainty envelope associated with the unknown chi_c spin alignment is also shown.

Fraction of chi_c2 produced in b-hadron decays as a function of chi_c2 pT, assuming unpolarised chi_c production. The uncertainty envelope associated with the unknown chi_c spin alignment is also shown.

The results of fits of the two-particle double-ratio correlation function $R_{2} (Q)$ for $\sqrt{s} = 0.9\ TeV$ events with the unlike-charge reference sample for various multiplicity intervals $n_{ch}$ for the exponential parametrization $\Omega^{(E)}$. The uncertainties for parameters $\lambda$ and $R$ are square root from the quadratic sum of statistical and systematic errors. Where only one error is shown for parameters $C_{0}$ and $\epsilon$, this represents the statistical uncertainty only.

The results of fits of the two-particle double-ratio correlation function $R_{2} (Q)$ for $\sqrt{s} = 7\ TeV$ events with the unlike-charge reference sample for various multiplicity intervals $n_{ch}$ for the exponential parametrization $\Omega^{(E)}$. The uncertainties for parameters $\lambda$ and $R$ are square root from the quadratic sum of statistical and systematic errors. The statistical uncertainties at $7\ TeV$ were corrected on the $\sqrt{\chi^{2}/ndf}$ and they more smaller than systematic uncertainties. Where only one error is shown for parameters $C_{0}$ and $\epsilon$, this represents the statistical uncertainty only.

The results of fits of the two-particle double-ratio correlation function $R_{2} (Q)$ for $\sqrt{s} = 7\ TeV\ HM$ events with the unlike-charge reference sample for various multiplicity intervals $n_{ch}$ for the exponential parametrization $\Omega^{(E)}$. The uncertainties for parameters $\lambda$ and $R$ are square root from the quadratic sum of statistical and systematic errors. Where only one error is shown for parameters $C_{0}$ and $\epsilon$, this represents the statistical uncertainty only.

The results of fits of the two-particle double-ratio correlation function $R_{2} (Q)$ for $\sqrt{s} = 0.9\ TeV$ ($n_{ch} \ge 2$) events with the unlike-charge reference sample for various $k_{T}$ intervals for the exponential parametrization $\Omega^{(E)}$. The uncertainties for parameters $\lambda$ and $R$ are square root from the quadratic sum of statistical and systematic errors. The statistical uncertainties were corrected on the $\sqrt{\chi^{2}/ndf}$ when $\chi^{2}/ndf > 1$. Where only one error is shown for parameters $C_{0}$ and $\epsilon$, this represents the statistical uncertainty only.

The results of fits of the two-particle double-ratio correlation function $R_{2} (Q)$ for $\sqrt{s} = 7\ TeV\ HM$ ($n_{ch} \ge 150$) events with the unlike-charge reference sample for various $k_{T}$ intervals for the exponential parametrization $\Omega^{(E)}$. The uncertainties for parameters $\lambda$ and $R$ are square root from the quadratic sum of statistical and systematic errors. The statistical uncertainties were corrected on the $\sqrt{\chi^{2}/ndf}$ when $\chi^{2}/ndf > 1$.Where only one error is shown for parameters $C_{0}$ and $\epsilon$, this represents the statistical uncertainty only.

The results of fits of the two-particle double-ratio correlation function $R_{2} (Q)$ for $\sqrt{s} = 7\ TeV$ events with the unlike-charge reference sample for various $k_{T}$ intervals of different multiplicity regions $n_{ch}$ for the exponential parametrization $\Omega^{(E)}$. The statistical uncertainties were corrected on the $\sqrt{\chi^{2}/ndf}$ when $\chi^{2}/ndf > 1$. The statistical uncertainties smaller than systematic uncertainties. The uncertainties for parameters $\lambda$ and $R$ are square root from the quadratic sum of statistical and systematic errors. Where only one error is shown for parameters $C_{0}$ and $\epsilon$, this represents the statistical uncertainty only.

The $Q$ distribution measured at $0.9\ TeV$ for unlike-sign pairs for $p_{T} > 100\ MeV$ and $|\eta|<2.5$, renormalized to the total number of charged-particle pairs. The error bars represents the statistical uncertainties.

The $Q$ distribution measured at $0.9\ TeV$ for like-sign pairs for $p_{T} > 100\ MeV$ and $|\eta|<2.5$, renormalized to the total number of charged-particle pairs. The error bars represents the statistical uncertainties.

The $Q$ distribution measured at $7\ TeV$ for unlike-sign pairs for $p_{T} > 100\ MeV$ and $|\eta|<2.5$, renormalized to the total number of charged-particle pairs. The error bars represents the statistical uncertainties.

The $Q$ distribution measured at $7\ TeV$ for like-sign pairs for $p_{T} > 100\ MeV$ and $|\eta|<2.5$, renormalized to the total number of charged-particle pairs. The error bars represents the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $0.9\ TeV$ using unlike-charge particle reference sample for different $n_{ch}$ intervals $p_{T} > 100\ MeV$ and $|\eta|<2.5$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $0.9\ TeV$ using unlike-charge particle reference sample for different $k_{T}$ intervals with multiplicity $n_{ch} \ge 2$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $7\ TeV$ using unlike-charge particle reference sample for different multiplicity intervals $n_{ch}$ with $p_{T} > 100\ MeV$ and $|\eta| < 2.5$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $7\ TeV$ using unlike-charge particle reference sample for different $k_{T}$ intervals with multiplicity $n_{ch} \ge 2$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured with $7\ TeV\ HM$ data using unlike-charge particle reference sample for different $k_{T}$ intervals with multiplicity $n_{ch} \ge 150$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $7\ TeV$ using unlike-charge particle reference sample for different $k_{T}$ intervals within multiplicity interval $n_{ch} = 2-9$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $7\ TeV$ using unlike-charge particle reference sample for different $k_{T}$ intervals within multiplicity interval $n_{ch} = 10-24$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $7\ TeV$ using unlike-charge particle reference sample for different $k_{T}$ intervals within multiplicity interval $n_{ch} = 25-80$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $7\ TeV$ using unlike-charge particle reference sample for different $k_{T}$ intervals within multiplicity interval $n_{ch} = 81-125$. The error bars represents only the statistical uncertainties.

Reconstructed distribution of the mass difference, DELTA(M), of the D*+- and its decay product (D0 PI+-) in different Z and PT bins.

Reconstructed distribution of the mass difference, DELTA(M), of the D*+- and its decay product (D0 PI+-) over the full Z and PT ranges.

Comparison of the reconstructed jet PT distribution with the reweighted Monte Carlo prediction.

Comparison of the reconstructed Z distribution with the reweighted Monte Carlo prediction.

The R ratios as a function of Z for D*+- jet production compared with various Monte Carlo predictions for the jet PT range 25-30 GeV.

The R ratios as a function of Z for D*+- jet production compared with various Monte Carlo predictions for the jet PT range 30-40 GeV.

The R ratios as a function of Z for D*+- jet production compared with various Monte Carlo predictions for the jet PT range 40-50 GeV.

The R ratios as a function of Z for D*+- jet production compared with various Monte Carlo predictions for the jet PT range 50-60 GeV.

The R ratios as a function of Z for D*+- jet production compared with various Monte Carlo predictions for the jet PT range 60-70 GeV.

The R ratios as a function of Z for D*+- jet production compared with various Monte Carlo predicitions for the jet PT range 25-70 GeV.

Comparisons of the D+- jet prodution rate over the PT and Z range with the POWHEG+PYTHIA predictions, showing also the c- and b- fractions.

Comparisons of the D+- jet prodution rate over the PT and Z range with the POWHEG+HERWIG predictions, showing also the c- and b- fractions.

The measured differential cross sections $\rm{d}\sigma/\rm{d}|\eta|$ of $D^{*\pm}$ and $D^\pm$ production with $20<p_T<100\,$GeV. The first and second errors are the statistical and systematic uncertainties, respectively. The systematic uncertainty fractions corresponding to the tracking ($\delta_2$) uncertainties (Table 2 of the paper) are strongly correlated. The fully correlated uncertainties linked with the luminosity measurement ($3.5\%$) and branching fractions ($1.5\%$ and $2.1\%$ for $D^{*\pm}$ and $D^\pm$, respectively) are not shown.