The best-fit predicted and observed distributions of the combined NN output in the high-$p_\text{T}$-SR for the $\mu\tau_e$ channel. The first and last bin include underflow and overflow events, respectively.

The best-fit predicted and observed distributions of the collinear mass $m_\text{coll}$ in the high-$p_\text{T}$-SR for the $e\tau_\mu$ channel. The first and last bin include underflow and overflow events, respectively.

The best-fit predicted and observed distributions of the collinear mass $m_\text{coll}$ in the high-$p_\text{T}$-SR for the $\mu\tau_e$ channel. The first and last bin include underflow and overflow events, respectively.

Observed and expected upper limits on $\mathcal{B}(Z\rightarrow\ell\tau)$ with leptonically decaying $\tau$ at 95% confidence level.

Observed and expected upper limits on $\mathcal{B}(Z\rightarrow\ell\tau)$ at 95% confidence level, combination of hadronically and leptonically decaying $\tau$ channels.

The best-fit predicted and observed distributions of the collinear mass $m_\text{coll}$ in the CRZ$\tau\tau$ for the $e\tau_\mu$ channel. The first and last bin include underflow and overflow events, respectively.

The best-fit predicted and observed distributions of the collinear mass $m_\text{coll}$ in the CRZ$\tau\tau$ for the $\mu\tau_e$ channel. The first and last bin include underflow and overflow events, respectively.

The best-fit predicted and observed distributions of the combined NN output in the CRZ$\tau\tau$ for the $e\tau_\mu$ channel. The first and last bin include underflow and overflow events, respectively.

The best-fit predicted and observed distributions of the combined NN output in the CRZ$\tau\tau$ for the $\mu\tau_e$ channel. The first and last bin include underflow and overflow events, respectively.

The best-fit predicted and observed distributions of the leading lepton transverse momentum $p_\text{T}(e)$ in the high-$p_\text{T}$-SR for the $e\tau_\mu$ channel. The first and last bin include underflow and overflow events, respectively.

The best-fit predicted and observed distributions of the leading lepton transverse momentum $p_\text{T}(\mu)$ in the high-$p_\text{T}$-SR for the $\mu\tau_e$ channel. The first and last bin include underflow and overflow events, respectively.

The best-fit predicted and observed distributions of the missing transverse momentum $E^\text{miss}_\text{T}$ in the low-$p_\text{T}$-SR for the $e\tau_\mu$ channel. The first and last bin include underflow and overflow events, respectively.

The best-fit predicted and observed distributions of the missing transverse momentum $E^\text{miss}_\text{T}$ in the low-$p_\text{T}$-SR for the $\mu\tau_e$ channel. The first and last bin include underflow and overflow events, respectively.

Dijet signal efficiencies as a function of the signal mass and lifetime for events satisfying all event and vertex requirements, with corrections based on systematic differences in the vertex reconstruction efficiency between data and simulation.

The distribution of $d_{\mathrm{BV}}$ for $\geq$5-track one-vertex events in data and three simulated multijet signal samples each with a mass of 1600 GeV. The production cross section for each signal model is assumed to be the lower limit excluded by CMS-EXO-17-018, corresponding to values of 0.8, 0.25, and 0.15 fb for the samples with $c\tau =$ 0.3, 1.0, and 10 mm, respectively. The last bin includes the overflow events. This bin includes one event in data with a vertex with large $d_{\mathrm{BV}}$ that appears to arise from tracks originating from separate pp interaction vertices, consistent with background.

Distribution of the $x$-$y$ distances between vertices, $d_{\mathrm{VV}}$, for 2017 and 2018 data. The background distribution $d_{\mathrm{VV}}^{\kern 0.15em\mathrm{C}}$ (blue continuous line) is constructed from one-vertex events in data, and is normalized to the number of two-vertex events in data with two 3-track vertices. The two vertical red dashed lines separate the regions used in the fit.

Distribution of the $x$-$y$ distances between vertices, $d_{\mathrm{VV}}$, for 2017 and 2018 data. The background distribution $d_{\mathrm{VV}}^{\kern 0.15em\mathrm{C}}$ (blue continuous line) is constructed from one-vertex events in data, and is normalized to the number of two-vertex events in data which have exactly one 4-track vertex and one 3-track vertex. The two vertical red dashed lines separate the regions used in the fit.

Distribution of the $x$-$y$ distances between vertices, $d_{\mathrm{VV}}$, for 2017 and 2018 data. The background distribution $d_{\mathrm{VV}}^{\kern 0.15em\mathrm{C}}$ (blue continuous line) is constructed from one-vertex events in data, and is normalized to the number of two-vertex events in data with two 4-track vertices. The two vertical red dashed lines separate the regions used in the fit.

Distribution of the $x$-$y$ distances between vertices, $d_{\mathrm{VV}}$, for 2017 and 2018 data. The background distribution $d_{\mathrm{VV}}^{\kern 0.15em\mathrm{C}}$ (blue continuous line) is constructed from one-vertex events in data, and is normalized using $\geq$5-track one-vertex event information. The two vertical red dashed lines separate the regions used in the fit.

Predicted yields for the background-only normalized template, predicted yields for three simulated multijet signals each with a mass of 1600 GeV, and the observed yield in each $d_{\mathrm{VV}}$ bin. The production cross section for each signal model is assumed to be the lower limit excluded by CMS-EXO-17-018, corresponding to values of 0.8, 0.25, and 0.15 fb for samples with $c\tau =$ 0.3, 1.0, and 10 mm, respectively. The uncertainties in the signal yields and the systematic uncertainties in the background prediction reflect the systematic uncertainties given in the text.

Observed 95% CL upper limits on the product of cross section and branching fraction squared for the multijet signals, as a function of mass and $c\tau$. The overlaid mass-lifetime exclusion curves assume pair-production cross sections for the neutralino (red) and gluino (purple) with 100% branching fraction to each model's respective decay mode specified. The solid black (dashed colored) lines represent the observed (median expected) limits at 95% CL. The thin black lines represent the variation of the observed limit within theoretical uncertainties of the signal cross section. The thin dashed colored lines represent the region containing 68% of the expected limit distribution under the background-only hypothesis. The observed limits from the CMS displaced jets search (CMS-EXO-19-021) are also shown in teal for comparison.

Observed 95% CL upper limits on the product of cross section and branching fraction squared for the multijet signals, as a function of mass and $c\tau$. The overlaid mass-lifetime exclusion curves assume pair-production cross sections for the neutralino (red) and gluino (purple) with 100% branching fraction to each model's respective decay mode specified. The solid black (dashed colored) lines represent the observed (median expected) limits at 95% CL. The thin black lines represent the variation of the observed limit within theoretical uncertainties of the signal cross section. The thin dashed colored lines represent the region containing 68% of the expected limit distribution under the background-only hypothesis. The observed limits from the CMS displaced jets search (CMS-EXO-19-021) are also shown in teal for comparison.

Observed 95% CL upper limits on the product of cross section and branching fraction squared for the multijet signals, as a function of mass and $c\tau$. The overlaid mass-lifetime exclusion curves assume pair-production cross sections for the neutralino (red) and gluino (purple) with 100% branching fraction to each model's respective decay mode specified. The solid black (dashed colored) lines represent the observed (median expected) limits at 95% CL. The thin black lines represent the variation of the observed limit within theoretical uncertainties of the signal cross section. The thin dashed colored lines represent the region containing 68% of the expected limit distribution under the background-only hypothesis. The observed limits from the CMS displaced jets search (CMS-EXO-19-021) are also shown in teal for comparison.

Observed 95% CL upper limits on the product of cross section and branching fraction squared for the dijet signals, as a function of mass and $c\tau$. The overlaid mass-lifetime exclusion curves assume pair-production cross sections for the top squark with 100% branching fraction to each model's respective decay mode specified. The solid black (dashed colored) lines represent the observed (median expected) limits at 95% CL. The thin black lines represent the variation of the observed limit within theoretical uncertainties of the signal cross section. The thin dashed colored lines represent the region containing 68% of the expected limit distribution under the background-only hypothesis. The observed limits from the CMS displaced jets search (CMS-EXO-19-021) are also shown in teal for comparison.

Observed 95% CL upper limits on the product of cross section and branching fraction squared for the dijet signals, as a function of mass and $c\tau$. The overlaid mass-lifetime exclusion curves assume pair-production cross sections for the top squark with 100% branching fraction to each model's respective decay mode specified. The solid black (dashed colored) lines represent the observed (median expected) limits at 95% CL. The thin black lines represent the variation of the observed limit within theoretical uncertainties of the signal cross section. The thin dashed colored lines represent the region containing 68% of the expected limit distribution under the background-only hypothesis. The observed limits from the CMS displaced jets search (CMS-EXO-19-021) are also shown in teal for comparison.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of mass for multijet signals, for a fixed $c\tau$ of 300um in the full Run-2 data set. The neutralino and gluino pair production cross sections are shown for the multijet signals.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of mass for dijet signals, for a fixed $c\tau$ of 300um in the full Run-2 data set. The top squark pair-production cross section is shown for the dijet signals.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of mass for multijet signals, for a fixed $c\tau$ of 1 mm in the full Run-2 data set. The neutralino and gluino pair production cross sections are shown for the multijet signals.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of mass for dijet signals, for a fixed $c\tau$ of 1 mm in the full Run-2 data set. The top squark pair-production cross section is shown for the dijet signals.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of mass for multijet signals, for a fixed $c\tau$ of 10 mm in the full Run-2 data set. The neutralino and gluino pair production cross sections are shown for the multijet signals.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of mass for dijet signals, for a fixed $c\tau$ of 10 mm in the full Run-2 data set. The top squark pair-production cross section is shown for the dijet signals.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of $c\tau$ for multijet signals, for a fixed mass of 800 GeV in the full Run-2 data set. The neutralino and gluino pair production cross sections are shown for the multijet signals.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of $c\tau$ for dijet signals, for a fixed mass of 800 GeV in the full Run-2 data set. The top squark pair-production cross section is shown for the dijet signals.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of $c\tau$ for multijet signals, for a fixed mass of 1600 GeV in the full Run-2 data set. The neutralino and gluino pair production cross sections are shown for the multijet signals.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of $c\tau$ for dijet signals, for a fixed mass of 1600 GeV in the full Run-2 data set. The top squark pair-production cross section is shown for the dijet signals.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of $c\tau$ for multijet signals, for a fixed mass of 2400 GeV in the full Run-2 data set. The neutralino and gluino pair production cross sections are shown for the multijet signals. For $m$ = 2400 GeV, the expected neutralino cross section is $\approx 8\times 10^{-5}$ fb and is not shown.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of $c\tau$ for dijet signals, for a fixed mass of 2400 GeV in the full Run-2 data set. The top squark pair-production cross section is shown for the dijet signals.

Data-to-simulation efficiency correction factors, shown for multijet and dijet signal topologies in several ranges of $c\tau$. Note that these correction factors account for the two long-lived particles in the simulated events, and are therefore the total correction factors used to scale event yields rather than the correction factors one would apply to individual vertices.

Distribution of the azimuthal angle between vertices, $\Delta\phi_{\mathrm{VV}}$, for 2017 and 2018 data. The background distribution (blue continuous line) is constructed from 3-track one-vertex events in data, and is normalized to the number of 3-track two-vertex events in data.

Distribution of the azimuthal angle between vertices, $\Delta\phi_{\mathrm{VV}}$, for 2017 and 2018 data. The background distribution (blue continuous line) is constructed from 4-track and 3-track one-vertex events in data, and is normalized to the number of two-vertex events in data which have exactly one 4-track vertex and one 3-track vertex.

Distribution of the azimuthal angle between vertices, $\Delta\phi_{\mathrm{VV}}$, for 2017 and 2018 data. The background distribution (blue continuous line) is constructed from 4-track one-vertex events in data, and is normalized to the number of 4-track two-vertex events in data.

Distribution of the azimuthal angle between vertices, $\Delta\phi_{\mathrm{VV}}$, for 2017 and 2018 data. The background distribution (blue continuous line) is constructed from $\geq$5-track one-vertex events in data, and is normalized using one-vertex event information. No $\geq$5-track two-vertex data events pass the selection.

Distribution of $S$, which is one of the discriminating variables used to define the $2\ell^{sc}$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $E_{T}^{miss}$, which is one of the discriminating variables used to define the $3\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $\Delta R_{\ell^{\pm}\ell^{\pm}}$, which is one of the discriminating variables used to define the $3\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $m_{x\ell}$ ($x$=3), which is one of the discriminating variables used to define the $3\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $p_{T}^{leading jet}$, which is one of the discriminating variables used to define the $3\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $E_{T}^{miss}$, which is one of the discriminating variables used to define the $4\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $\Delta R_{\ell^{\pm}\ell^{\pm}}^{min}$, which is one of the discriminating variables used to define the $4\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $m_{x\ell}$ ($x$=4), which is one of the discriminating variables used to define the $4\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $p_{T}^{\ell_{1}}$, which is one of the discriminating variables used to define the $4\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Contributions from different categories of uncertainties relative to the expected background yields in the defined SRs, as obtained after performing the likelihood ratio test discussed in Section 9 in the paper. The uncertainties are shown for the combination of the individual channels of the $2\ell^{sc}$, $3\ell$ and $4\ell$ SRs. The SRs are indicated along the horizontal axis. In the HEPData entry, the x-axis is simplified for easier visualisation. The first number indicates the sub channel (2:$2\ell^{sc}$, 3:$3\ell$, 4:$4\ell$), while the second number indicates the mass point (2:200, 3:300, 4:400, 5:500).

Data event yields compared with the expected contributions from relevant background sources, for the combination of the individual channels of the $2\ell^{sc}$, $3\ell$ and $4\ell$ SRs. The total uncertainties in the expected event yields are shown as the hatched bands. The SRs are indicated along the horizontal axis. In the HEPData entry, the x-axis is simplified for easier visualisation. The first number indicates the sub channel (2:$2\ell^{sc}$, 3:$3\ell$, 4:$4\ell$), while the second number indicates the mass point (2:200, 3:300, 4:400, 5:500).

The $E_{T}^{miss}$ distribution for the SRs of the $m_{H^{\pm\pm}} = 300~GeV$ signal mass hypothesis, where the selection requirement on $E_{T}^{miss}$ has been removed. In the attached plot, the signals are stacked on top of the backgrounds while individuals contributions of the $2\ell^{sc}$ channel are shown in HEPData. The last bin, isolated by a vertical red dashed line, is inclusive and corresponds to the SR.

The $E_{T}^{miss}$ distribution for the SRs of the $m_{H^{\pm\pm}} = 300~GeV$ signal mass hypothesis, where the selection requirement on $E_{T}^{miss}$ has been removed. In the attached plot, the signals are stacked on top of the backgrounds while individuals contributions of the $3\ell$ channel are shown in HEPData. The last bin, isolated by a vertical red dashed line, is inclusive and corresponds to the SR.

The $E_{T}^{miss}$ distribution for the SRs of the $m_{H^{\pm\pm}} = 300~GeV$ signal mass hypothesis, where the selection requirement on $E_{T}^{miss}$ has been removed. In the attached plot, the signals are stacked on top of the backgrounds while individuals contributions of the $4\ell$ channel are shown in HEPData. The last bin, isolated by a vertical red dashed line, is inclusive and corresponds to the SR.

Observed and expected upper limits of the $H^{\pm\pm}$ pair production cross section times branching fraction at 95% CL obtained from the combination of 2$\ell^{sc}$, 3$\ell$ and 4$\ell$ channels. The region above the observed limit is excluded by the measurement. The bands represent the expected exclusion curves within one and two standard deviations.

The theoretical prediction of Figure 9(a) in the paper.

Observed and expected upper limits of the $H^{\pm\pm}$ and $H^{\pm}$ production cross section times branching fraction at 95% CL obtained from the combination of 2$\ell^{sc}$, 3$\ell$ and 4$\ell$ channels. The region above the observed limit is excluded by the measurement. The bands represent the expected exclusion curves within one and two standard deviations.

The theoretical prediction of Figure 9(b) in the paper.

Data event yields compared with the estimated background in the $m_{H^{\pm\pm}} = 200~GeV$ or $m_{H^{\pm\pm}} = 220~GeV$ SRs. SFOC 0 and SFOC 1,2 refer to the number of same-flavour opposite charge lepton pairs. The total uncertainties in the estimated background yields are shown as the hashed bands. In the HEPData entry, the x-axis is simplified for easier visualisation (1:$e^{\pm}e^{\pm}$, 2:$e^{\pm}\mu^{\pm}$, 3:$\mu^{\pm}\mu^{\pm}$, 4:SFOC 0, 5:SFOC 1,2, 6:$4\ell$).

Data event yields compared with the estimated background in the $m_{H^{\pm\pm}} = 300~GeV$ or $m_{H^{\pm\pm}} = 350~GeV$ SRs. SFOC 0 and SFOC 1,2 refer to the number of same-flavour opposite charge lepton pairs. The total uncertainties in the estimated background yields are shown as the hashed bands. In the HEPData entry, the x-axis is simplified for easier visualisation (1:$e^{\pm}e^{\pm}$, 2:$e^{\pm}\mu^{\pm}$, 3:$\mu^{\pm}\mu^{\pm}$, 4:SFOC 0, 5:SFOC 1,2, 6:$4\ell$).

Data event yields compared with the estimated background in the $m_{H^{\pm\pm}} = 400~GeV$ or $m_{H^{\pm\pm}} = 450~GeV$ SRs. SFOC 0 and SFOC 1,2 refer to the number of same-flavour opposite charge lepton pairs. The total uncertainties in the estimated background yields are shown as the hashed bands. In the HEPData entry, the x-axis is simplified for easier visualisation (1:$e^{\pm}e^{\pm}$, 2:$e^{\pm}\mu^{\pm}$, 3:$\mu^{\pm}\mu^{\pm}$, 4:SFOC 0, 5:SFOC 1,2, 6:$4\ell$).

Data event yields compared with the estimated background in the $m_{H^{\pm\pm}} = 500~GeV$ or $m_{H^{\pm\pm}} = 550~GeV$ or $m_{H^{\pm\pm}} = 600~GeV$ SRs. SFOC 0 and SFOC 1,2 refer to the number of same-flavour opposite charge lepton pairs. The total uncertainties in the estimated background yields are shown as the hashed bands. In the HEPData entry, the x-axis is simplified for easier visualisation (1:$e^{\pm}e^{\pm}$, 2:$e^{\pm}\mu^{\pm}$, 3:$\mu^{\pm}\mu^{\pm}$, 4:SFOC 0, 5:SFOC 1,2, 6:$4\ell$).

Post-fit $m_{T}$ distribution in the SR 4J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 6J b-veto N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 6J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 2J b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 2J b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J low-x b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J low-x b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J high-x b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J high-x b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 6J b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 6J b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Observed 95% CL exclusion contours for the gluino one-step x = 1/2 model.

Expected 95% CL exclusion contours for the gluino one-step x = 1/2 model. space.

Observed 95% CL exclusion contours for the gluino one-step variable-x

Expected 95% CL exclusion contours for the gluino one-step variable-x

Observed 95% CL exclusion contours for the squark one-step x = 1/2 model.

Observed 95% CL exclusion contours for the squark one-step x = 1/2 model.

Observed 95% CL exclusion contours for one-flavour schemes in one-step x = 1/2 model.

Observed 95% CL exclusion contours for one-flavour schemes in one-step x = 1/2 model.

Expected 95% CL exclusion contours for the squark one-step variable-x

Expected 95% CL exclusion contours for the squark one-step variable-x

Expected 95% CL exclusion contours for the squark one-flavour schemes in variable-x

Expected 95% CL exclusion contours for the squark one-flavour schemes in variable-x

Upper limits on the signal cross section for simplified model gluino one-step x = 1/2

Upper limits on the signal cross section for simplified model gluino one-step variable-x

Upper limits on the signal cross section for simplified model squark one-step x = 1/2

Upper limits on the signal cross section for simplified model squark one-step variable-x

Upper limits on the signal cross section for simplified model squark one-step x=1/2 in one-flavour schemes

Upper limits on the signal cross section for simplified model squark one-step variable-x in one-flavour schemes

Post-fit $m_{eff}$ distribution in the 2J b-tag validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 2J b-veto validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J b-tag validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J b-veto validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 6J b-tag validation region. Uncertainties include statistical and systematic uncertainties.

Post-fit $m_{eff}$ distribution in the 6J b-veto validation region. Uncertainties include statistical and systematic uncertainties.

Event selection cutflow for two representative signal samples for the SR2JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Event selection cutflow for two representative signal samples for the SR2JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Event selection cutflow for two representative signal samples for the SR4JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Event selection cutflow for two representative signal samples for the SR4JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Event selection cutflow for two representative signal samples for the SR6JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Event selection cutflow for two representative signal samples for the SR6JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Signal acceptance in SR2J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery high region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery low region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx discovery region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx discovery region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin4 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin4 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery high region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery low region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J discovery high region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J discovery low region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx discovery region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx discovery region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin4 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin4 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J discovery high region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J discovery low region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery high region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery low region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx discovery region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx discovery region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin4 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin4 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery high region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery low region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J discovery high region for squark production one-step variable-x simplified models

Signal acceptance in SR2J discovery low region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx discovery region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx discovery region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin4 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin4 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J discovery high region for squark production one-step variable-x simplified models

Signal acceptance in SR6J discovery low region for squark production one-step variable-x simplified models

Signal efficiency in SR2J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery high region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery low region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx discovery region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx discovery region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin4 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin4 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery high region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery low region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery high region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery low region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx discovery region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx discovery region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin4 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin4 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery high region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery low region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery high region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery low region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx discovery region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx discovery region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin4 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin4 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery high region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery low region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery high region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery low region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx discovery region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx discovery region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin4 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin4 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery high region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery low region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Acceptances on TRUTH level of the DMt samples in the tW1L channel for all bins in the SR. The acceptance is defined as the number of weighted TRUTH events in the SR over the number of expected events without any selections. The maps include all samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

Efficiencies of the DMt samples in the tW2L SR. The efficiency is defined as the number of weighted reconstructed events over the number of weighted TRUTH events in the SR. The maps include all samples in the $m_a - m_H$ plane with $tan\beta = 1$.

Acceptances on TRUTH level of the DMt samples in the tW2L SR. The acceptance is defined as the number of weighted TRUTH events in the SR over the number of expected events without any selections. The maps include all samples in the $m_a - m_H$ plane with $tan\beta = 1$.

Efficiencies of the DMt samples in the tW2L SR. The efficiency is defined as the number of weighted reconstructed events over the number of weighted TRUTH events in the SR. The maps include all samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

Acceptances on TRUTH level of the DMt samples in the tW2L SR. The acceptance is defined as the number of weighted TRUTH events in the SR over the number of expected events without any selections. The maps include all samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

Efficiencies of the DMt samples in the tj1L channel for all bins in the SR. The efficiency is defined as the number of weighted reconstructed events over the number of weighted TRUTH events in the SR. The map includes all used samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

Acceptances on TRUTH level of the DMt samples in the tj1L channel for all bins in the SR. The acceptance is defined as the number of weighted TRUTH events in the SR over the number of expected events without any selections. The map includes all used samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the tW1L analysis considering only DMt signal.

Upper limits on excluded cross sections of the tW1L analysis considering only the DMt signal.

The expected exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming only $tW$+DM contributions, for the tW1L analysis channel.

The observed exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming only $tW$+DM contributions, for the tW1L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the tW1L analysis considering only DMt signal.

Upper limits on excluded cross sections of the tW1L analysis considering only the DMt signal.

The expected exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming only $tW$+DM contributions, for the tW1L analysis channel.

The observed exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming only $tW$+DM contributions, for the tW1L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the tW2L analysis considering only DMt signal.

Upper limits on excluded cross sections of the tW2L analysis considering only the DMt signal.

The expected exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming only $tW$+DM contributions, for the tW2L analysis channel.

The observed exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming only $tW$+DM contributions, for the tW2L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the tW2L analysis considering only DMt signal.

Upper limits on excluded cross sections of the tW2L analysis considering only the DMt signal.

The expected exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming only $tW$+DM contributions, for the tW2L analysis channel.

The observed exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming only $tW$+DM contributions, for the tW2L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the combined tW1L and tW2L analyses considering only the DMt signal.

Upper limits on excluded cross sections of the combined tW1L and tW2L analyses considering only the DMt signal.

The expected exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming only $tW$+DM contributions, for the statistical combination of the tW1L and tW2L analysis channel.

The observed exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming only $tW$+DM contributions, for the statistical combination of the tW1L and tW2L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the combined tW1L and tW2L analyses considering only the DMt signal.

Upper limits on excluded cross sections of the combined tW1L and tW2L analyses considering only the DMt signal.

The expected exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming only $tW$+DM contributions, for the statistical combination of the tW1L and tW2L analysis channel.

The observed exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming only $tW$+DM contributions, for the statistical combination of the tW1L and tW2L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the tW1L analysis considering the DMt$\bar{t}$+DMt signal.

The expected exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the tW1L analysis channel.

The observed exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the tW1L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the tW1L analysis considering the DMt$\bar{t}$+DMt signal.

The expected exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the tW1L analysis channel.

The observed exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the tW1L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the tW2L analysis considering the DMt$\bar{t}$+DMt signal.

The expected exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the tW2L analysis channel.

The observed exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the tW2L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the tW2L analysis considering the DMt$\bar{t}$+DMt signal.

The expected exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the tW2L analysis channel.

The observed exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the tW2L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the combined tW1L and tW2L analyses considering the DMt$\bar{t}$+DMt signal.

The expected exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the statistical combination of the tW1L and tW2L analysis channel.

The observed exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the statistical combination of the tW1L and tW2L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the combined tW1L and tW2L analyses considering the DMt$\bar{t}$+DMt signal.

The expected exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the statistical combination of the tW1L and tW2L analysis channel.

The observed exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the statistical combination of the tW1L and tW2L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the tj1L analysis considering only the DMt signal.

Upper limits on upper limits on excluded cross sections of the tj1L analysis considering only the DMt signal.

The expected and observed cross section exclusion limits as a function of $m_{H^{\pm}}$ in the tj1L analysis channel for signal models with $m_a = 250~GeV$, and $\tan\beta=0.3$. The $\sigma^{}_\mathrm{BSM}$ is the cross section of the $t$-channel DM production process.

The expected and observed cross section exclusion limits as a function of $m_{H^{\pm}}$ in the tj1L analysis channel for signal models with $m_a = 250~GeV$, and $\tan\beta=0.5$. The $\sigma^{}_\mathrm{BSM}$ is the cross section of the $t$-channel DM production process.

Cross sections of the DMt samples in the tW1L channel. The maps include all samples in the $m_a - m_H$ plane with $tan\beta = 1$.

Cross sections of the DMt samples in the tW1L channel. The maps include all samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

Cross sections times branching ratio of the DMt samples in the tW2L channel. The maps include all samples in the $m_a - m_H$ plane with $tan\beta = 1$.

Cross sections times branching ratio of the DMt samples in the tW2L channel. The maps include all samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

Cross sections of the DMt samples in the tj1L channel. The map includes all samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

MC generator filter efficiencies of the DMt samples in the tW1L channel. The maps include all samples in the $m_a - m_H$ plane with $tan\beta = 1$.

MC generator filter efficiencies of the DMt samples in the tW1L channel. The maps include all samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

MC generator filter efficiencies of the DMt samples in the tW2L channel. The maps include all samples in the $m_a - m_H$ plane with $tan\beta = 1$.

MC generator filter efficiencies of the DMt samples in the tW2L channel. The maps include all samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

MC generator filter efficiencies of the DMt samples in the tj1L channel. The map includes all samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

Background-only fit results for the tW1L and tW2L signal regions. The backgrounds which contribute only a small amount (rare processes such as triboson, Higgs boson production processes, $t\bar{t}t\bar{t}$, $t\bar{t}WW$ and non-prompt or misidentified leptons background) are grouped and labelled as ``Others´´. The quoted uncertainties on the fitted SM background include both the statistical and systematic uncertainties.

Background-only fit results for the tj1L signal regions. The backgrounds which contribute only a small amount ($Z$+jets, rare processes such as $tWZ$, triboson, Higgs boson production processes, ,$t\bar{t}t\bar{t}$, $t\bar{t}WW$) are grouped and labelled as ``Others´´. The quoted uncertainties on the fitted SM background include both the statistical and systematic uncertainties.

Cutflow of the weighted events with statistical uncertainties for two DMt samples in all bins of the tW1L channel. The PreSelection includes at least 1 lepton in the event, at least 1 $b$-jet with $p_{\mathrm{T}} > 50~GeV$, $m\mathrm{_{T}^{lep}} > 30~GeV$, $\Delta\phi\mathrm{_{4jets, MET}^{min}} > 0.5$ and $E\mathrm{_{T}^{miss}} > 200~GeV$.

Cutflow of the weighted events with statistical uncertainties for two DMt samples in the tW2L channel. The PreSelection includes at least 2 leptons in the event, at least 1 $b$-jet with $p_{\mathrm{T}} > 40~GeV$, $m_{ll} > 40~GeV$, $m\mathrm{_{T2}} > 40~GeV$, $\Delta\phi\mathrm{_{4jets, MET}^{min}} > 0.5$ and $E\mathrm{_{T}^{miss}} > 200~GeV$.

Cutflow of the weighted events with the statistical uncertainties (except for the first cuts) for two DMt samples in all bins off the tj1L channel. The PreSelection includes at least 1 lepton in the event, at least 1 $b$-jet with $p_{\mathrm{T}} > 50~GeV$, $m\mathrm{_{T}^{lep}} > 30~GeV$, $\Delta\phi\mathrm{_{4jets, MET}^{min}} > 0.5$ and $E\mathrm{_{T}^{miss}} > 200~GeV$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, where all slepton flavors are mass degenerate (co-NLSP).

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the selectron signal model. Selectron ($\tilde{e}_{L, R}$) refers to the scalar superpartners of left- and right-handed electrons.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the left-handed electrons, $\tilde{e}_L$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the right-handed electrons, $\tilde{e}_R$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the smuon signal model. Smuon ($\tilde{\mu}_{L, R}$) refers to the scalar superpartners of left- and right-handed muons.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the left-handed muons, $\tilde{\mu}_L$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the right-handed muons, $\tilde{\mu}_R$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the stau signal model. Staus, $\tilde{\tau}_{1,2}$ are the mixed states of the superpartners of the left- and right-handed $\tau$ leptons, with mixing angle $\sin\theta_{\tilde\tau}=0.95$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for $\tilde{\tau}_L$ production, where $\tilde{\tau}_L$ is pure-state superpartner of the left-handed $\tau$.

The expected and observed yields in the signal regions. Combined statistical and systematic uncertainties are presented. Estimates are truncated at 0 if the size of measured systematic uncertainties would yield a negative result.

Reconstruction efficiency as a function of $|d_{0}|$ and $p_\text{T}$ for signal electrons. Monte Carlo samples with $\tilde{e}$ or $\tilde{\mu}$ with mass 400 GeV and 1 ns lifetime were used. Efficiency is defined as the number of leptons passing all signal requirements and matched to generator-level muons divided by the number of generator level leptons with $p_\text{T} > 65$ GeV, $|d_{0}| >$ 3 mm, and |$\eta$| $<$ 2.47 for electrons. No event-level selections are made. Reconstructed leptons must pass all quality criteria, including the cosmic veto. Electron selection scale factors are included on the reconstructed leptons. The overflow is not shown in these plots.

Reconstruction efficiency as a function of $|d_{0}|$ and $p_\text{T}$ for signal muons. Monte Carlo samples with $\tilde{e}$ or $\tilde{\mu}$ with mass 400 GeV and 1 ns lifetime were used. Efficiency is defined as the number of leptons passing all signal requirements and matched to generator-level muons divided by the number of generator level leptons with $p_\text{T} > 65$ GeV, $|d_{0}| >$ 3 mm, and |$\eta$| $<$ 2.5 for muons. No event-level selections are made. Reconstructed leptons must pass all quality criteria, including the cosmic veto. Muon selection scale factors are included on the reconstructed leptons. The overflow is not shown in these plots.

Acceptance for $\tilde{e}$ of various masses and lifetimes in SR-$ee$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{\mu}$ of various masses and lifetimes in SR-$\mu\mu$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Efficiency for $\tilde{e}$ of various masses and lifetimes in SR-$ee$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{\mu}$ of various masses and lifetimes in SR-$\mu\mu$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Acceptance as a function of the generator-level $p_\text{T}$ of the leading and subleading lepton in SR-$ee$ from $\tilde{e}$ decays. The plot is made from signal Monte Carlo events with $\tilde{\ell}$ with mass of 400 GeV and lifetime of 1 ns. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47 for electrons, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. The overflow is not shown in these plots.

Acceptance as a function of the generator-level $p_\text{T}$ of the leading and subleading lepton in SR-$\mu\mu$ from $\tilde{\mu}$ decays. The plot is made from signal Monte Carlo events with $\tilde{\ell}$ with mass of 400 GeV and lifetime of 1 ns. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 for muons, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. The overflow is not shown in these plots.

Acceptance for $\tilde{\tau}$ of various masses and lifetimes in SR-$ee$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{\tau}$ of various masses and lifetimes in SR-$e\mu$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 (2.47) for muons (electrons), $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{\tau}$ of various masses and lifetimes in SR-$\mu\mu$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Efficiency for $\tilde{\tau}$ of various masses and lifetimes in SR-$ee$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{\tau}$ of various masses and lifetimes in SR-$e\mu$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 (2.47) for muons (electrons), $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{\tau}$ of various masses and lifetimes in SR-$\mu\mu$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Acceptance as a function of the generator-level $p_\text{T}$ of the leading and subleading lepton in SR-$e\mu$ from $\tilde{\tau}$ decays. The plot is made from signal Monte Carlo events with $\tilde{\ell}$ with mass of 400 GeV and lifetime of 1 ns. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 (2.47) for muons (electrons), $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. The overflow is not shown in these plots.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane where all slepton flavors and chiralities are mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane where all slepton flavors and chiralities are mass degenerate.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L, R}$) refer to the scalar superpartners of left- and right-handed electrons, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L, R}$) refer to the scalar superpartners of left- and right-handed electrons, which are assumed to be mass degenerate.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L}$) refer to the scalar superpartners of left-handed electrons.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L}$) refer to the scalar superpartners of left-handed electrons.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{R}$) refer to the scalar superpartners of right-handed electrons. Purple denotes the region excluded by LEP.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{R}$) refer to the scalar superpartners of right-handed electrons. Purple denotes the region excluded by LEP.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L, R}$) refer to the scalar superpartners of left- and right-handed muons, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L, R}$) refer to the scalar superpartners of left- and right-handed muons, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L}$) refer to the scalar superpartners of left-handed muons.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L}$) refer to the scalar superpartners of left-handed muons.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{R}$) refer to the scalar superpartners of right-handed muons. Purple denotes the region excluded by LEP.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{R}$) refer to the scalar superpartners of right-handed muons. Purple denotes the region excluded by LEP.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau})$ plane. Staus, $\tilde{\tau}_{1,2}$ are the mixed states of the superpartners of the left- and right-handed $\tau$ leptons, with mixing angle $\sin(\theta_{\tilde\tau})=0.95$, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau})$ plane. Staus, $\tilde{\tau}_{1,2}$ are the mixed states of the superpartners of the left- and right-handed $\tau$ leptons, with mixing angle $\sin(\theta_{\tilde\tau})=0.95$, which are assumed to be mass degenerate.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau}_L)$ plane, where $\tilde{\tau}_L$ is the pure-state super-partner of the left-handed $\tau$. Purple denotes the region excluded by LEP. This result does not present signficant sensitivity to the pure-state superpartner of the right-handed $\tau$.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau}_L)$ plane, where $\tilde{\tau}_L$ is the pure-state super-partner of the left-handed $\tau$. Purple denotes the region excluded by LEP. This result does not present signficant sensitivity to the pure-state superpartner of the right-handed $\tau$.

The best-fit expected and observed distributions of the combined NN output in the VRSS for the $e\tau$ channel for events with 3-prong $\tau_\text{had-vis}$ candidates. The last bin in each plot includes overflow events.

The best-fit expected and observed distributions of the combined NN output in the SR for the $e\tau$ channel for events with 1-prong $\tau_\text{had-vis}$ candidates. The last bin in each plot includes overflow events.

The best-fit expected and observed distributions of the combined NN output in the SR for the $e\tau$ channel for events with 3-prong $\tau_\text{had-vis}$ candidates. The last bin in each plot includes overflow events.

The best-fit expected and observed distributions of the combined NN output in the SR for the $\mu\tau$ channel for events with 1-prong $\tau_\text{had-vis}$ candidates. The last bin in each plot includes overflow events.

The best-fit expected and observed distributions of the combined NN output in the SR for the $\mu\tau$ channel for events with 3-prong $\tau_\text{had-vis}$ candidates. The last bin in each plot includes overflow events.

Observed and expected upper limits on $\mathcal{B}(Z\rightarrow\ell\tau)$ at 95% confidence level.

Measured normalised differential fiducial cross sections of $\gamma\gamma \rightarrow \gamma\gamma$ production in Pb+Pb collisions at $\sqrt{s_{NN}}$ = 5.02 TeV for diphoton $|cos(\theta*)|$ are shown as points with error bars giving the statistical uncertainty and grey bands indicating the size of the total uncertainty. The results are compared with the prediction from the SuperChic v3.0 MC generator (solid line).

Measured normalised differential fiducial cross sections of $\gamma\gamma \rightarrow \gamma\gamma$ production in Pb+Pb collisions at $\sqrt{s_{NN}}$ = 5.02 TeV for average photon transverse momentum are shown as points with error bars giving the statistical uncertainty and grey bands indicating the size of the total uncertainty. The results are compared with the prediction from the SuperChic v3.0 MC generator (solid line) with bands denoting the theoretical uncertainty.

Measured normalised differential fiducial cross sections of $\gamma\gamma \rightarrow \gamma\gamma$ production in Pb+Pb collisions at $\sqrt{s_{NN}}$ = 5.02 TeV for average photon transverse momentum are shown as points with error bars giving the statistical uncertainty and grey bands indicating the size of the total uncertainty. The results are compared with the prediction from the SuperChic v3.0 MC generator (solid line).

Measured differential fiducial cross sections of $\gamma\gamma \rightarrow \gamma\gamma$ production in Pb+Pb collisions at $\sqrt{s_{NN}}$ = 5.02 TeV for diphoton rapidity are shown as points with error bars giving the statistical uncertainty and grey bands indicating the size of the total uncertainty. The results are compared with the prediction from the SuperChic v3.0 MC generator (solid line) with bands denoting the theoretical uncertainty.

Measured normalised differential fiducial cross sections of $\gamma\gamma \rightarrow \gamma\gamma$ production in Pb+Pb collisions at $\sqrt{s_{NN}}$ = 5.02 TeV for diphoton rapidity are shown as points with error bars giving the statistical uncertainty and grey bands indicating the size of the total uncertainty. The results are compared with the prediction from the SuperChic v3.0 MC generator (solid line).

The 95% CL upper limit on the ALP cross section $\sigma_{\gamma\gamma\rightarrow a \rightarrow\gamma\gamma}$ for the $\gamma\gamma\rightarrow a \rightarrow \gamma\gamma$ process as a function of ALP mass m$_{a}$. The observed upper limit is shown as a solid black line and the expected upper limit is shown by the dashed black line with its $\pm1$ and $\pm2$ standard deviation bands. The discontinuity at $m_{a}=70 GeV$ is caused by the increase of the mass-bin width which brings an increase in signal acceptance.

The 95% CL upper limit on the ALP coupling $1/\Lambda_{a}$ for the $\gamma\gamma\rightarrow a \rightarrow \gamma\gamma$ process as a function of ALP mass m$_{a}$. The observed upper limit is shown as a solid black line and the expected upper limit is shown by the dashed black line with its $\pm1$ and $\pm2$ standard deviation bands. The discontinuity at $m_{a} = 70 GeV$ is caused by the increase of the mass-bin width which brings an increase in signal acceptance.

Fiducial cross section for light-by-light scattering