Differential cross-section and uncertainty from each source, as a function of leading $p_{T}^j$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of leading $p_{T}^j$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of leading $p_{T}^j$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of leading $p_{T}^j$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{ee}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{\mu\mu}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{e\mu}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{ee}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{\mu\mu}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{e\mu}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the $ee jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Expected and observed 95% CL lower limits on first- and second-generation leptoquark masses for different values of $\beta$.

Event yields in the dimuon channel control regions with total uncertainties. The observed number of events is given in the first row. The background event numbers as obtained from the fit are shown together with the total uncertainties. The second row shows the total background expectation, the further rows show the breakdown into different background components.

Event yields in the dielectron channel control regions with total uncertainties. The observed number of events is given in the first row. The background event numbers as obtained from the fit are shown together with the total uncertainties. The second row shows the total background expectation, the further rows show the breakdown into different background components.

Distribution of $m_{LQ}^{min}$ in the training region for the BDT for the $ee jj$ and $\mu\mu jj$ channels. Data are shown together with predicted total background expectation.

Distribution of $m_{LQ}^{T}$ in the training region for the BDT for the $e\nu jj$ and $\mu\nu jj$ channels. Data are shown together with predicted total background expectation.

Dijet mass distribution for the b-tagged category. Data, estimated background and uncertainties are shown. Events are collected using the combined trigger and contain a $E_T^{\gamma} > 95$ GeV photon and two $p_T^{jet} > 65$ GeV jets.

Upper limits on Gaussian-shape contributions to the dijet mass distributions from the flavour-inclusive category and masses below 450 GeV, for which the single-photon trigger was used.

Upper limits on Gaussian-shape contributions to the dijet mass distributions from the flavour-inclusive category and masses above 450 GeV, for which the combined trigger was used.

Upper limits on Gaussian-shape contributions to the dijet mass distributions from the b-tagged category and masses below 450 GeV, for which the single-photon trigger was used.

Upper limits on Gaussian-shape contributions to the dijet mass distributions from the b-tagged category and masses above 450 GeV, for which the combined trigger was used.

Kinematic acceptance values predicted for the $Z'$ model as a function of mass $m_{Z'}$ for the flavour-inclusive category using the single-photon trigger.

Kinematic acceptance values predicted for the $Z'$ model as a function of mass $m_{Z'}$ for the flavour-inclusive category using the combined trigger.

Kinematic acceptance values predicted for the $Z'$ model as a function of mass $m_{Z'}$ for the b-tagged category using the single-photon trigger.

Kinematic acceptance values predicted for the $Z'$ model as a function of mass $m_{Z'}$ for the b-tagged category using the combined trigger.

Reconstruction efficiency for $Z'$ model, flavour inclusive category, single-photon trigger.

Reconstruction efficiency for $Z'$ model, flavour inclusive category, combined trigger.

Reconstruction efficiency for $Z'$ model, b-tagged category, single-photon trigger.

Reconstruction efficiency for $Z'$ model, b-tagged category, combined trigger.

Ratio of unfolded width of azimuthal angular correlation distributions (P PB/ P P). Different colors correspond to different combinations of p_{T,1} and p_{T,2}

Ratio of unfolded Dijet conditional yields (P PB/ P P). Different colors correspond to different combinations of p_{T,1} and p_{T,2}

Unfolded width of azimuthal angular correlation distributions (Delta p_{T} > 3). Full markers represent p+Pb, open markers p+p

Unfolded Dijet conditional yields (Delta p_{T} > 3). Full markers represent p+Pb, open markers p+p

Ratio of unfolded width of azimuthal angular correlation distributions (P PB/ P P) (Delta p_{T} > 3). Different colors correspond to different combinations of p_{T,1} and p_{T,2}

Ratio of unfolded Dijet conditional yields (P PB/ P P) (Delta p_{T} > 3). Different colors correspond to different combinations of p_{T,1} and p_{T,2}

Unfolded azimuthal angular correlation distributions. Black markers represent p+Pb, red markers p+p

Unfolded azimuthal angular correlation distributions (Delta p_{T} > 3). Black markers represent p+Pb, red markers p+p

Predicted ratio of cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<1.37$.

Measured ratio of cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$.

Predicted ratio of cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$.

Measured ratio of cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.37$.

Predicted ratio of cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.37$.

Measured double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$.

Predicted double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$.

Measured double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<1.37$.

Predicted double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<1.37$.

Measured double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$.

Predicted double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$.

Measured double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.37$.

Predicted double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.37$.

The 95% CL upper limits of the cross section times branching fraction of $\Phi \to \mu^+\mu^-$ for b-associated production

The observed/expected 95% CL upper limits of the cross section times branching fraction of $\Phi \to \mu^+\mu^-$ as a function of $\Phi$ mass and the cross section fraction of the b-associated production.

Signal acceptance for different masses in bTag and bVeto signal regions.

Elliptic-flow coefficients $v_2$ based on the six-particle correlations technique, as functions of transverse momentum and in bins of centrality. The results correspond to the range $|\eta| < 2.4$.

Elliptic-flow coefficients $v_2$ based on the eight-particle correlations technique, as functions of transverse momentum and in bins of centrality. The results correspond to the range $|\eta| < 2.4$.

Triangular-flow coefficients $v_3$ based on the two-particle correlations technique, as functions of transverse momentum and in bins of centrality. The results correspond to the range $|\eta| < 2.4$.

Triangular-flow coefficients $v_3$ based on the scalar-product technique, as functions of transverse momentum and in bins of centrality. The results correspond to the range $|\eta| < 0.8$.

Triangular-flow coefficients $v_3$ based on the four-particle correlations technique, as functions of transverse momentum and in bins of centrality. The results correspond to the range $|\eta| < 2.4$.

The $v_4$ coefficients based on the two-particle correlations technique, as functions of transverse momentum and in bins of centrality. The results correspond to the range $|\eta| < 2.4$.

The $v_4$ coefficients based on the scalar-product technique, as functions of transverse momentum and in bins of centrality. The results correspond to the range $|\eta| < 0.8$.

Centrality dependence of the spectrum-weighted $v_2$ flow harmonics with $0.3 < p_{\mathrm{T}} < 3.0~\mathrm{GeV}/c$. The $v_2$ results are shown for two-, four-, six-, and eight-particle correlations.

Centrality dependence of the spectrum-weighted $v_3$ flow harmonics with $0.3 < p_{\mathrm{T}} < 3.0~\mathrm{GeV}/c$. The results are shown for two- and four-particle correlations.

Centrality dependence of the spectrum-weighted $v_4$ flow harmonics with $0.3 < p_{\mathrm{T}} < 3.0~\mathrm{GeV}/c$. The results are shown for two-particle correlations.

Centrality dependence of $v_2\{4\}/v_2\{2\}$ ratios.

Centrality dependence of $v_2\{6\}/v_2\{4\}$ ratios.

Centrality dependence of $v_3\{4\}/v_3\{2\}$ ratios.

The $v_2$ results measured with two-particle correlations from PbPb collisions at $5.02~$TeV, shown as a function of $p_{\mathrm{T}}$ in eleven centrality bins.

The $v_3$ results measured with two-particle correlations from PbPb collisions at $5.02~$TeV, shown as a function of $p_{\mathrm{T}}$ in eleven centrality bins.

The $v_4$ results measured with two-particle correlations from PbPb collisions at $5.02~$TeV, shown as a function of $p_{\mathrm{T}}$ in eleven centrality bins.

Ratios of the $v_2$ harmonic coefficients from two-particle correlations in XeXe and PbPb collisions as functions of $p_{\mathrm{T}}$ in 11 centrality bins.

Ratios of the $v_3$ harmonic coefficients from two-particle correlations in XeXe and PbPb collisions as functions of $p_{\mathrm{T}}$ in 11 centrality bins.

Ratios of the $v_4$ harmonic coefficients from two-particle correlations in XeXe and PbPb collisions as functions of $p_{\mathrm{T}}$ in 11 centrality bins.

Centrality dependence of the spectrum-weighted $v_2$, $v_3$, and $v_4$ harmonic coefficients from two-particle correlations method for $0.3 < p_{\mathrm{T}} < 3.0 \mathrm{GeV}/c$ for PbPb collisions at $5.02$~TeV.

Ratios of the $v_2$, $v_3$, and $v_4$ harmonic coefficients from two-particle correlations in XeXe and PbPb collisions as functions or $0.3 < p_{\mathrm{T}} < 3.0~\mathrm{GeV}/c$ as a function of centrality.

List of relative uncertainties in the measured cross sections of the $t\bar{t}Z$ and $t\bar{t}W$ processes from the fit, grouped in categories. All uncertainties are symmetrized. The sum in quadrature may not be equal to the total due to correlations between uncertainties introduced by the fit.

The expected and observed 68% and 95% confidence intervals, which include the value 0, for $\mathcal{C}_{i}/\Lambda^{2}$ for the EFT coefficients $\mathcal{C}_{\phi Q}^{(3)}$, $\mathcal{C}_{\phi t}$, $\mathcal{C}_{tB}$ and $\mathcal{C}_{tW}$. The intervals for $\mathcal{C}_{\phi Q}^{(3)}$ are derived setting $\mathcal{C}_{\phi Q}^{(1)}$ to zero; the measurement is sensitive to the difference $\mathcal{C}_{\phi Q}^{(3)}-\mathcal{C}_{\phi Q}^{(1)}$. All results are given in units of 1/TeV$^{2}$. Limits from fits for the EFT coefficients with only the linear term are also shown.

Differential cross section in bins of pT(Z). Values are expressed as a fraction of the total cross section. The inclusive final state is shown.

Differential cross section in bins of pT(Z). Values are expressed as a fraction of the total cross section. The emm and mmm final states are shown.

Differential cross section in bins of mass of the WZ system. Values are expressed as a fraction of the total cross section.

Measured WZ production cross sections computed separately in each of the flavour categories.

Measured fiducial cross sections and their corresponding uncertainties for each of the individual flavour categories, as well as for the combination of the four. The combined value is the result of a symultaneous fit to the four categories, therefore both the central value and its total uncertaintydiffer from the sum of the central values and the quadratic sum of the uncertainties respectively, because of correlations among sources of uncertainty in the categorized values.

Differential cross section in bins of pT(leading jet). Values are expressed as a fraction of the total cross section. The inclusive final state is shown.

Expected and observed yields for each of the relevant processes and flavour categories. Combined statistical and systematic uncertainties are shown for each case except for the observed data yields for which only statistical uncertainties are presented. All expected yields correspond to quantities estimated after the maximum likelihood fit. Uncertainties are computed taking into account the full correlation matrix between sources of uncertainty, processes, and flavour categories.

Differential cross section in bins of pT(leading jet). Values are expressed as a fraction of the total cross section. The eee, eem, emm, and mmm final states are shown.

Summary of the total postfit impact of each uncertainty source on the uncertainty in the signal strength measurement, for the four flavour categories and their combination. Theoretical uncertainties are only included in the signal acceptance during the extrapolation to the total phase space, so they are not included in the likelihood fit. The values are percentages and correspond to half the difference between the up and down variation of each systematic uncertainty component.

Efficiencies estimated as transfer factors from the fiducial region to the signal region using generator-level information, for an integrated luminosity L of 35.9 inverse femtobarn. Statistical, scale, and PDF uncertainties are later propagated to the final cross section measurement.

Measured WZ production cross section computed in the inclusive final state and split by W boson charge, and asymmetry ratio.

Summary of the measured values of $ d\sigma / d{m}$ (pb/GeV) in the dielectron channel with the statistical ($\delta_{\text{stat}}$), experimental ($\delta_{\text{exp}}$) and theoretical ($\delta_{\text{theo}}$) uncertainties, respectively. Here, $\delta_{\text{tot}}$ is the quadratic sum of the three components.

Summary of the measured values of fiducial $ d\sigma / d{m}$ (pb/GeV) (with no FSR correction applied) in the dimuon channel with the statistical ($\delta_{\text{stat}}$) and experimental ($\delta_{\text{exp}}$) uncertainties shown separately. Here, $\delta_{\text{tot}}$ is the quadratic sum of the two components.

of the measured values of fiducial $ d\sigma / d{m}$ (pb/GeV) (with no FSR correction applied) in the dielectron channel with the statistical ($\delta_{\text{stat}}$) and experimental ($\delta_{\text{exp}}$) uncertainties shown separately. Here, $\delta_{\text{tot}}$ is the quadratic sum of the two components.

Summary of the combined values of $ d\sigma / d{m}$ (pb/GeV) using the results from both the dimuon and dielectron channels. Here, $\delta_{\text{tot}}$ is the quadratic sum of the statistical, experimental and theoretical uncertainties.

Covariance matrix of the Drell-Yan differential cross section as a function of the dimuon invariant mass, measured in the full phase space, with FSR correction is applied. Luminosity uncertainty is not included in the covariance.

Covariance matrix of the Drell-Yan differential cross section as a function of the dielectron invariant mass, measured in the full phase space, with FSR correction is applied. Luminosity uncertainty is not included in the covariance.

Covariance matrix of the differential DY cross section measured for the combination of the two channels in the full phase space.

Summary of the relative uncertainties in the measured fiducial cross section $\sigma^{\mathrm{fid}}_{W^\pm Z j j-EW}$ . The uncertainties are reported as percentages.

Numbers of observed and expected events in the $W^{\pm}Zjj$ signal region and in the three control regions, after the fit. The expected number of $WZjj-EW$ events from $SHERPA$ and the estimated number of background events from the other processes are shown. The sum of the background containing misidentified leptons is labelled "Misid. leptons". The total correlated post-fit uncertainties are quoted.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity. The last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded fiducial cross-section.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity. The last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded fiducial cross-section.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity.

Correlation matrix for the unfolded fiducial cross-section.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity. The last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded fiducial cross-section.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity. The last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded fiducial cross-section.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity.

Correlation matrix for the unfolded fiducial cross-section.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity. The last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded fiducial cross-section.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity. the last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded fiducial cross-section.