Ratio of fiducial cross sections measured for $W^{\pm} Z$ production at $\sqrt{s}=13$ TeV and $\sqrt{s}=8$ TeV. The first systematic uncertainty is the combined systematic uncertainty excluding the luminosity uncertainty, the second is the luminosity uncertainty.

Ratio of fiducial cross sections measured for $W^{+} Z$ and $W^{-} Z$ production.

Cross section extrapolated to total phase space and all W and Z boson decays. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the theory uncertainty and the third is the luminosity uncertainty.

The measured fiducial cross sections are corrected to the dressed level. The ratio of $C_{WZ}^{\textrm{dressed}}/C_{WZ}^{\textrm{Born}}$ factors presented in this table can be used to correct fiducial integrated cross sections from dressed to Born level.

Measured fiducial cross section as a function of the exclusive jet multiplicity, where jets are particle level jets with anti-kt R=0.4. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

The total cross section is measured at dressed level and can also be corrected to Born level use this acceptance correction factor.

Correlation matrix for the total uncertainties, including all sources of systematic and statistical uncertainties, for the differential cross section as a function of the exclusive jet multiplicity.

All correlated systematic relative uncertainties in percent on measured differential cross section as a function of the exclusive jet multiplicity.

The measured fiducial cross sections are corrected to the dressed level. The ratio of $C_{WZ}^{\textrm{dressed}}/C_{WZ}^{\textrm{Born}}$ factors presented in this table can be used to correct fiducial integrated cross sections from dressed to Born level.

Cross section extrapolated to total phase space and all W and Z boson decays. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the theory uncertainty and the third is the luminosity uncertainty.

The total cross section is measured at dressed level and can also be corrected to Born level use this acceptance correction factor.

Ratio of fiducial cross sections measured for $W^{+} Z$ and $W^{-} Z$ production. The first systematic uncertainty is the combined systematic uncertainty excluding the luminosity uncertainty, the second is the luminosity uncertainty.

Observed and expected upper limits at $95\%$ CL in fb on the fiducial cross section $\sigma^{\mathrm{fid.}}_{W^{\pm} Zjj \textrm{-EW} \rightarrow \ell^{'} \nu \ell \ell}$, multiplied by the $W$ and $Z$ branching ratios in a single leptonic channel with muons or electrons in the VBS fiducial phase space. Values obtained with or without subtraction of the $tZj$ contribution are presented. The $1$ $\sigma$ and $2$ $\sigma$ uncertainty intervals around the expected limits are also indicated.

Observed and expected upper limits at $95\%$ CL in fb on the fiducial cross section $\sigma^{\mathrm{fid.}}_{W^{\pm} Zjj \textrm{-EW} \rightarrow \ell^{'} \nu \ell \ell}$, multiplied by the $W$ and $Z$ branching ratios in a single leptonic channel with muons or electrons in the aQGC fiducial phase space. Values obtained with or without subtraction of the $tZj$ contribution are presented. The $1$ $\sigma$ and $2$ $\sigma$ uncertainty intervals around the expected limits are also indicated.

Expected and observed one-dimensional 95% Confidence Level intervals on the anomalous couplings parameters. Anomalous couplings are introduced as form factors using a cut-off scale $\Lambda_{\mathrm{co}}$.

Expected and observed one-dimensional intervals at 95% Confidence Level on the Effective Field Theory (EFT) parameters.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$.

Ratios of integrated fiducial CC and NC cross sections obtained from the combination of electron and muon channels with statistical (stat) and systematic (syst) uncertainties. The common fiducial regions are defined in Section 2.3.

Total cross sections times leptonic branching ratios obtained from the combination of electron and muon channels with statistical and systematic uncertainties, for $W^+$, $W^-$, their sum and the $Z/\gamma^*$ process measured at $\sqrt{s}=7$ TeV. The $Z/\gamma^*$ cross section is defined for the dilepton mass window $m_{\ell\ell} = 66 - 116$ GeV. The uncertainties denote the statistical (stat), the experimental systematic (syst), the luminosity (lumi), and acceptance extrapolation (acc) contributions.

Ratios of total CC and NC cross sections obtained from the combination of electron and muon channels with statistical and systematic uncertainties. The $Z/\gamma^*$ cross section is defined for the dilepton mass window $m_{\ell\ell} = 66 - 116$ GeV. The uncertainties denote the statistical (stat), the experimental systematic (syst), and acceptance extrapolation (acc) contributions.

The correlation coefficients of the $W^+$, $W^-$ and $Z$ fiducial cross-section measurements.

Measurement of the electron-to-muon cross-section ratios for the $W$ and $Z$ production, $R_W$ and $R_Z$. The uncertainties denote the statistical (stat) and the experimental systematic (syst) contributions.

Differential cross section for the $W^+ \to \ell^+\nu$ processes combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^- \to \ell^-\bar{\nu}$ processes combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^- \to e^-\bar{\nu}$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^+ \to e^+\nu$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to ee$ process in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to ee$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to ee$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to ee$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to ee$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^- \to \mu^-\bar{\nu}$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^+ \to \mu^+\nu$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \mu\mu$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \mu\mu$ process in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \mu\mu$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Values of $E(W[Z])$ and $A(W[Z])$ correction factors for integrated $W\to\ell\nu$ and $Z\to\ell\ell$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(W[Z])$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region. The $A(W[Z])$ factors, defined in Eq. (9), are used to extract a total cross section. Finally, the ratios of $A(W[Z])$ correction factors are given for four combinations of $W^+$, $W^-$ and $Z$ treating all components of the $A(W[Z])$ uncertainties as correlated between processes, which is relevant for the acceptance uncertainties on the total cross-section ratios.

Values of $E(W)$ correction factors for the differential $W\to\ell\nu$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(W)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region. This only affects the bin of highest $\eta_\ell$, all other $E(W)$ factors are exactly 1 without uncertainties.

Values of $E(Z)$ correction factors for the differential $Z/\gamma^*\to e^+e^-$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(Z)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region.

Values of $E(Z)$ correction factors for the differential $Z/\gamma^*\to \mu^+\mu^-$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(Z)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region.

Values of $E(Z)$ correction factors for the differential forward $Z/\gamma^*\to e^+e^-$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(Z)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region.

Correlation coefficients between integrated cross sections extrapolated to the total phase space, $\sigma^\mathrm{tot}_{W \to \ell\nu}$ and $\sigma^\mathrm{tot}_{Z/\gamma^* \to \ell\ell}$ for four combinations of $W^+, W^-, W^{\pm}$ and $Z$. Values are given including and excluding the luminosity uncertainties.

Correlation coefficients between integrated fiducial cross sections in electron and muon channels for $W^{\pm}$ and $Z$. Values are given including and excluding the luminosity uncertainties.

The differential W charge asymmetry $A_{\ell}$ as defined in Eq. (19) from the combined electron and muon channel measurements. All uncertainties are quoted in % with respect to the $A_{\ell}$ values. The statistical (stat), uncorrelated (uncor) and correlated (cor) systematic uncertainties are reported.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the integrated common fiducial cross sections using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the $W^+ \to \ell^+\nu$ process using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the $W^- \to \ell^-\bar{\nu}$ process$ using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial W charge asymmetry $A_{\ell}$ using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$). All predictions are corrected for leading two-loop EW contributions.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential $W^+ \to \ell^+\nu$ process. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses FEWZ 3.1.b2 for the NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors of 2 and 0.5, respectively. The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions are negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential $W^- \to \ell^-\bar{\nu}$ process. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses FEWZ 3.1.b2 for the NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors of 2 and 0.5, respectively. The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions are negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential central $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential central $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential central $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential forward $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential forward $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the integrated common fiducial cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties are negligible on these correction factors.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^+ \to e^+\nu$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^- \to e^-\bar{\nu}$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^+ \to \mu^+\nu$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^- \to \mu^-\bar{\nu}$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial central $Z/\gamma^* \to ee$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial central $Z/\gamma^* \to \mu\mu$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial forward $Z/\gamma^* \to ee$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Measured fiducial cross section in all $\ell^+\ell^-\ell'^+\ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity uncertainty, the second is the luminosity uncertainty.

Cross section extrapolated to total phase space and all Z boson decays. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity uncertainty, the second is the luminosity uncertainty.

Observed and expected $E_T^{miss}$ distribution in soft dimuon signal region. The last bin includes the overflow.

Observed and expected $m_{eff}^{incl}$ distribution in hard single-lepton 3-jet signal region. The last bin includes the overflow.

Observed and expected $m_{eff}^{incl}$ distribution for hard single-lepton 5-jet signal region. The last bin includes the overflow.

Observed and expected $E_{T}^{miss}$ distribution for hard single-lepton 6-jet signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard same-flavour dilepton low-multiplicity signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard same-flavour dilepton 3-jet signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard opposite-flavour dilepton low-multiplicity signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard opposite-flavour dilepton 3-jet opposite-flavour signal region. The last bin includes the overflow.

Observed 95% exclusion contour for the mSUGRA/CMSSM model with $\tan\beta=30$, $A_{0}=-2m_{0}$ and $\mu > 0$.

Expected 95% exclusion contour for the mSUGRA/CMSSM model with $\tan\beta=30$, $A_{0}=-2m_{0}$ and $\mu > 0$.

Observed 95% exclusion contour for the bRPV MSUGRA/CMSSM model.

Expected 95% exclusion contour for the bRPV MSUGRA/CMSSM model.

Observed 95% exclusion contour for the natural gauge mediation with a stau NLSP model (nGM).

Expected 95% exclusion contour for the natural gauge mediation with a stau NLSP model (nGM).

Observed 95% exclusion contour for the non-universal higgs masses with gaugino mediation model (NUHMG).

Expected 95% exclusion contour for the non-universal higgs masses with gaugino mediation model (NUHMG).

Observed 95% exclusion contour for the minimal UED model from the combination of the hard dilepton and soft dilepton analyses.

Expected 95% exclusion contour for the minimal UED model from the combination of the hard dilepton and soft dilepton analyses.

Observed 95% exclusion contour for the minimal UED model from the hard dilepton analysis.

Expected 95% exclusion contour for the minimal UED model from the hard dilepton analysis.

Observed 95% exclusion contour for the minimal UED model from the soft dilepton analysis.

Expected 95% exclusion contour for the minimal UED model from the soft dilepton analysis.

Observed 95% exclusion contour for the simplified model with gluino-mediated top squark production where the top squark is assumed to decay exclusively via $\tilde{t} \rightarrow c \tilde{\chi}^{0}_{1}$.

Expected 95% exclusion contour for the simplified model with gluino-mediated top squark production, where the top squark is assumed to decay exclusively via $\tilde{t} \rightarrow c \tilde{\chi}^{0}_{1}$.

Observed 95% exclusion contour for the simplified model with gluino-mediated top squark production where the gluinos are assumed to decay exclusively through a virtual top squark, $\tilde{g} \rightarrow tt+\tilde{\chi}^{0}_{1}$.

Expected 95% exclusion contour for the simplified model with gluino-mediated top squark production where the gluinos are assumed to decay exclusively through a virtual top squark, $\tilde{g} \rightarrow tt+\tilde{\chi}^{0}_{1}$.

Observed 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the gluino simplified model from the hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the gluino simplified model from the hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the gluino simplified model from the soft single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the gluino simplified model from the soft single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the the first- and second-generation squark simplified model from the hard single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the the first- and second-generation squark simplified model from the hard single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the the first- and second-generation squark simplified model from the soft single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the the first- and second-generation squark simplified model from the soft single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the gluino simplified model from the hard single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the gluino simplified model from the hard single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the gluino simplified model from the soft single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the gluino simplified model from the soft single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the first- and second-generation squark simplified model from the combination of soft single-lepton and hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the first- and second-generation squark simplified model from the hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the first- and second-generation squark simplified model from the hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the first- and second-generation squark simplified model from the soft single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the first- and second-generation squark simplified model from the soft single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons from the combination of the hard dilepton and hard single-lepton analyses.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons from the combination of the hard dilepton and hard single-lepton analyses.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard single-lepton analysis.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard single-lepton analysis.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard dilepton analysis.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard dilepton analysis.

Observed 95% exclusion contour for the two-step first- and second-generation squark simplified model with sleptons from the hard dilepton analysis.

Expected 95% exclusion contour for the two-step first- and second-generation squark simplified model with sleptons from the hard dilepton analysis.

Observed 95% exclusion contour for the two-step gluino simplified model without sleptons from the hard single-lepton analysis.

Expected 95% exclusion contour for the two-step gluino simplified model without sleptons from the hard single-lepton analysis.

Number of generated events in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Production cross-section in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Number of generated events in the the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV. squark decaying to quark neutralino1 with varying x.

Production cross-section in the the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Production cross-section in the minimal UED model in pb.

Number of generated events in the two-step first- and second-generation squark simplified model with sleptons.

Production cross-section in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for soft single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for soft single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for soft single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for soft single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for soft single-lepton 3-jet inclusive signal region in the gluino simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for the soft single-lepton 3-jet inclusive signal region in the gluino simplified model for the case in x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is varied and the LSP mass is set at 60 GeV. The chargino mass is parameterised using x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)).

Observed CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is varied and the LSP mass is set at 60 GeV. The chargino mass is parameterised using x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)).

Acceptance for hard dilepton 3-jet opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton 3jet opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard dilepton 3-jet same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton 3-jet same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard dilepton low-multiplicity opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton low-multiplicity opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard dilepton low-multiplicity same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton low-multiplicity same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Expected CLs from hard dilepton analysis in the two-step first- and second-generation squark simplified model with sleptons.

Observed CLs from the hard dilepton analysis in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for hard single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for hard single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for hard single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for hard single-lepton 6-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for hard single-lepton 6-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for hard single-lepton 3-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for hard single-lepton 3-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Acceptance for hard single-lepton 5-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for hard single-lepton 5-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Acceptance for hard single-lepton 6-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for hard single-lepton 6-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% upper limit on the visible cross-section in the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% upper limit on the visible cross-section in the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% upper limit on the visible cross-section in the first- and second-generation squark simplified model with sleptons from the hard dilepton analysis.

Observed 95% upper limit on the visible cross-section in the minimal UED model (mUED) from the combination of the soft dimuon and hard dilepton analyses.

The measured differential cross-section normalized to the bin width in values of the angle between the leptons in the leading reconstructed lepton pair for the 4 lepton channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the rapidity difference between the reconstructed lepton pairs for the 4 lepton channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the leading reconstructed dilepton pT for the 2 lepton, 2 neutrino channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the angle between the dilepton pair for the 2 lepton, 2 neutrino channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the transverse mass of the reconstructed diboson pair for the 2 lepton, 2 neutrino channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $p_T$.

The inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $|y|$.

The inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $y_{\text{boost}}(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $y_{\text{boost}}(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta y(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta y(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta\phi(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta\phi(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta R(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta R(Z,b)$.

The cross-section $\sigma(Zb)$ as a function of $Z$ boson $p_T$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zb)$ as a function of $Z$ boson $p_T$.

The cross-section $\sigma(Zb)$ as a function of $Z$ boson $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zb)$ as a function of $Z$ boson $|y|$.

Integrated $Z+\ge 2$ $b$-jets cross-section.

Breakdown of systematic uncertainties (in %) for the integrated $Z+\ge 2$ $b$-jets cross-section.

The cross-section $\sigma(Zbb)$ as a function of $\Delta R(b,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $\Delta R(b,b)$.

The cross-section $\sigma(Zbb)$ as a function of $\Delta m(b,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $\Delta m(b,b)$.

The cross-section $\sigma(Zbb)$ as a function of $Z$ boson $p_T$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $Z$ boson $p_T$.

The cross-section $\sigma(Zbb)$ as a function of $Z$ boson $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $Z$ boson $|y|$.

Breakdown of systematic uncertainties in percent for the measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+mu- final state at 13TeV.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the combined Z/gamma* -> l+l- (l = e, mu) final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the combined Z/gamma* -> l+ l- (l = e, mu) final state.

Measured total cross-section for ttbar events using e-mu events with b-tagged jets.

Correlation coefficients amongst the combined (Z/gamma^* -> l+ l-) where (l = e, mu) fiducial cross section and ttbar total cross section at 13, 8, and 7TeV.

Correlation coefficients amongst the combined (Z/gamma^* -> l+ l-) where (l = e, mu) fiducial cross section and ttbar total cross section at 13, 8, and 7TeV, omitting the common normalisation uncertainty due to the luminosity calibration and beam energy.

Z-boson and ttbar production cross-section single ratios at 13, 8, 7TeV. The beam-energy uncertainty, which largely cancels in the ratios, is included in the systematic uncertainty. In the first column, the total (TOT) cross sections are used for both numerator and denominator. In the second column, the total cross section is used for the numerator while the fiducial (FID) cross section is used for the denominator. In the third column, the fiducial cross sections are used for both numerator and denominator. Apart for the MZ requirement, the kinematic fiducial requirements listed below apply only to the fiducial cross sections. The luminosity uncertainty almost entirely cancels in some of the ratio measurements.

Z-boson and ttbar production cross-section double ratios at 13, 8, 7TeV. The beam-energy uncertainty, which largely cancels in the ratios, is included in the systematic uncertainty. In the first column, the total (TOT) cross sections are used for both ttbar and Z processes. In the second column, the total cross section is used for ttbar while the fiducial (FID) cross section is used for Z. In the third column, the fiducial cross sections are used for both ttbar and Z. Apart for the MZ requirement, the kinematic fiducial requirements listed below apply only to the fiducial cross sections.

Detailed breakdown of systematic uncertainties for the measurement in the central rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the central rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the central rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the forward rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the forward rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the forward rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the combined measurement of muon, electron central and electron central-forward channels. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement of muon, electron central and electron central-forward channels. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement of muon, electron central and electron central-forward channels. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS (differential in y, Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS (differential in y, Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS (differential in y, Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS and y (differential in Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS and y (differential in Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS and y (differential in Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Powheg based prediction for AFB in the central-central fiducial phase space, as reported in Fig 16 of the paper. Powheg prediction is corrected to NNLO QCD and NLO EWK, as described in the paper. PDF uncertainties are computed using CT10 PDF set scaled to 68%.

Powheg based prediction for AFB in the central-fiducial fiducial phase space, as reported in Fig 17 of the paper. Powheg prediction is corrected to NNLO QCD and NLO EWK, as described in the paper. PDF uncertainties are computed using CT10 PDF set scaled to 68%.

Differential fiducial cross section of the Z boson $|y|$ in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the leading b-jet $|y|$ in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta \phi$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta y$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta R$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta \phi$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta y$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta R$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the invariant mass of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the Z boson $p_{\text{T}}$ in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $p_{\text{T}}$ of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the ratio between the $p_{\text{T}}$ and the invariant mass of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.