Ratios of B+ differential production cross sections at 13 TeV and at 7 TeV as a function of |yB| for 10 < ptB < 100 GeV or 17 < ptB < 100 GeV. The calculations from FONLL and PYTHIA are provided as well.

B+ differential production cross sections DSIG/DPT for |yB|< 1.45 or |yB|< 2.1, at 13 TeV. The calculations from FONLL and PYTHIA are provided.

B+ differential production cross sections DSIG/DETARAP for 10 < ptB < 100 GeV or 17 < ptB < 100 GeV, at 13 TeV. The calculations from FONLL and PYTHIA are provided.

B+ production cross section for the phase-space region of 10 <= pTB < 17 GeV and |yB| < 1.45, and 17 <= pTB < 100 GeV and |yB| < 2.1. The calculations from FONLL and PYTHIA are provided.

The measured absolute cross sections in bins of |y(Z)|, using dressed level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of Z pt, using dressed level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of |y(Z)|, using born level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using dressed level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of Z pt, using born level leptons. The cross sections are normalized by the bin width. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level.

The measured absolute cross sections in bins of Z pt different |y(Z)| bins, using dressed level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using born level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of Z pt different |y(Z)| bins, using born level leptons. The cross sections are normalized by the bin width. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level.

The measured normalized cross sections (left) in bins of Z pt in |y(Z)| bins, using dressed level leptons.

The measured normalized cross sections (left) in bins of Z pt in |y(Z)| bins, using born level leptons. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level.

The measured normalized cross sections in bins of Z pt, using born level leptons. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level.

The measured normalized cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using born level leptons.

The measured normalized cross sections in bins of |y(Z)|, using born level leptons.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

The measured normalized cross sections in bins of Z pt, using dressed level leptons.

The measured normalized cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using dressed level leptons.

The measured normalized cross sections in bins of |y(Z)|, using dressed level leptons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of Z pt on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of Z pt on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of |y(Z)| on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of |y(Z)| on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of Z pt on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of Z pt on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of |y(Z)| on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of |y(Z)| on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(PS).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(PS).

The $M_{T}$ distribution in the WZ-enriched region. The last bin contains the overflow events.

The $L_{T}$ distribution in the ttZ-enriched region. The last bin contains the overflow events.

The $S_{T}$ distribution in the ZZ-enriched region. The last bin contains the overflow events.

The $L_{T}$ distribution in the MisID-enriched region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L below-Z signal region. The last bin contains the overflow events.

The $M_{T}$ distribution in the 3L on-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L above-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF1 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF2 signal region. The last bin contains the overflow events.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

Product of the fiducial acceptance and the event selection efficiency for the type-III Seesaw signal model at various signal mass hypotheses calculated after all analysis selection requirements.

Product of the fiducial acceptance and the event selection efficiency for the tt$\phi$ signal models at various signal mass hypotheses calculated after all analysis selection requirements.

$\mathrm{m_{\mathrm{WV}}}$ distribution in the $\mathrm{WV}$ channel. The predicted yields are shown with their best-fit normalizations from the background-only fit.

Expected and observed exclusion limits at the 95\% CL for $s_{\mathrm{H}}$ in the Georgi-Machacek model.

Expected and observed exclusion limits at the 95\% CL as a function of $m(\mathrm{H}^{\pm})$ for $\sigma_\mathrm{VBF}(\mathrm{H}^{\pm}) \, \mathcal{B}(\mathrm{H}^{\pm} \rightarrow \mathrm{W}^{\pm}\mathrm{Z})$ in the $\mathrm{WV}$ final state.

Expected and observed exclusion limits at the 95\% CL as a function of $m(\mathrm{H}^{\pm})$ for $\sigma_\mathrm{VBF}(\mathrm{H}^{\pm}) \, \mathcal{B}(\mathrm{H}^{\pm} \rightarrow \mathrm{W}^{\pm}\mathrm{Z})$ in the $\mathrm{ZV}$ final state.

Expected and observed exclusion limits at the 95\% CL as a function of $m(\mathrm{H}^{\pm\pm})$ for $\sigma_\mathrm{VBF}(\mathrm{H}^{\pm\pm}) \, \mathcal{B}(\mathrm{H}^{\pm\pm} \rightarrow \mathrm{W}^{\pm}\mathrm{W}^{\pm})$ in the $\mathrm{WV}$ final state.

Covariance matrix for all the $\mathrm{m_{\mathrm{WV}}}$ bins used in the $\mathrm{WV}$ channel. The mass distributions are binned as follows: $\mathrm{m_{\mathrm{WV}}}$ = [600, 700, 800, 900, 1000, 1200, 1500, 2000, $\infty$] GeV. The covariance matrix from the background-only fit is shown.

Covariance matrix for all the $\mathrm{m_{\mathrm{ZV}}}$ bins used in the $\mathrm{ZV}$ channel. The mass distributions are binned as follows: $\mathrm{m_{\mathrm{ZV}}}$ = [600, 700, 800, 900, 1000, 1200, 1500, 2000, $\infty$] GeV. The covariance matrix from the background-only fit is shown.

The observed and expected 95% CL upper limits on the universal quark coupling $g_{q}$ as a function of resonance mass for a vector mediator of interactions between quarks and dark matter.

The observed and expected 95% CL upper limits on the universal quark coupling $g_{q}^{'}$ as a function of resonance mass for a vector mediator of interactions between quarks.

The 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for Randall–Sundrum gravitons. Limits are compared to the predicted cross section.

The 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for dijet resonances decaying to gluon-gluon. Limits are compared to predicted cross section for color-octet scalars.

The 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for dijet resonances decaying to quark-gluon. Limits are compared to predicted cross sections for string resonances and excited quarks.

The 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for dijet resonances decaying to quark-quark. Limits are compared to predicted cross sections for axigluons, colorons, scalar diquarks, new gauge bosons W' and Z' with SM-like couplings and dark matter mediators.

Observed differential dijet spectrum. The cross-section is calculated by dividing the event yield by the bin width and luminosity.

$\mathrm{M_{\mathrm{T}}}$ distribution for the $\mathrm{e}\mu$ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the WZ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the ZZ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the signal region, events with $|\eta_{\gamma}|<1$.

$\mathrm{M_{\mathrm{T}}}$ distribution for the signal region, events with $|\eta_{\gamma}|>1$.

Muon reconstruction, identification, and isolation efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Photon efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Expected yields for different processes after several selection stages. The preselection requires two leptons and at least one photon with $\mathrm{p_\mathrm{T}}$ larger than 25, 20, and 25 GeV, respectively; in addition the dilepton $\mathrm{p_\mathrm{T}}$ must be larger than 60 GeV, and the $\mathrm{p_\mathrm{T}}^{\mathrm{miss}}$ larger than 70 GeV. The signal prediction corresponds to $0.1 \sigma_{\mathrm{\mathrm{ZH}}}$ at $m_{H}$ = 125 GeV.

Expected and observed upper limits at 95\% confidence level on the product of $\sigma_{\mathrm{\mathrm{ZH}}}$ and $\mathcal{B}$($\mathrm{H}$ -> $\mathrm{invisible}+\gamma$) as a function of $m_{\mathrm{\mathrm{H}}}$.

Background-only post-fit $p_{T}^{miss}$ distributions for the SRs of the SL selection. The total theory signal (t/t+DM and tt+DM summed together) is presented by the red solid lines for a scalar mediator mass of 100 GeV. The last bin contains overflow events.

Background-only post-fit $p_{T}^{miss}$ distributions for the SRs of the AH selection. The total theory signal (t/t+DM and tt+DM summed together) is presented by the red solid lines for a scalar mediator mass of 100 GeV. The last bin contains overflow events.

Background-only post-fit $p_{T}^{miss}$ distributions for the SRs of the SL selection. The total theory signal (t/t+DM and tt+DM summed together) is presented by the red solid lines for a scalar mediator mass of 100 GeV. The last bin contains overflow events.

Background-only post-fit $p_{T}^{miss}$ distributions for the SRs of the SL selection. The total theory signal (t/t+DM and tt+DM summed together) is presented by the red solid lines for a scalar mediator mass of 100 GeV. The last bin contains overflow events.

Background-only post-fit $p_{T}^{miss}$ distributions for the SRs of the SL selection. The total theory signal (t/t+DM and tt+DM summed together) is presented by the red solid lines for a scalar mediator mass of 100 GeV. The last bin contains overflow events.

Background-only post-fit $p_{T}^{miss}$ distributions for the SRs of the AH selection. The total theory signal (t/t+DM and tt+DM summed together) is presented by the red solid lines for a scalar mediator mass of 100 GeV. The last bin contains overflow events.

Background-only post-fit $p_{T}^{miss}$ distributions for the CRs of the AH selection. The total theory signal (t/t+DM and tt+DM summed together) is negligible and therefore is not shown. The last bin contains overflow events.

Background-only post-fit $p_{T}^{miss}$ distributions for the CRs of the AH selection. The total theory signal (t/t+DM and tt+DM summed together) is negligible and therefore is not shown. The last bin contains overflow events.

Background-only post-fit $p_{T}^{miss}$ distributions for the CRs of the AH selection. The total theory signal (t/t+DM and tt+DM summed together) is negligible and therefore is not shown. The last bin contains overflow events.

Background-only post-fit $p_{T}^{miss}$ distributions for the CRs of the AH selection. The total theory signal (t/t+DM and tt+DM summed together) is negligible and therefore is not shown. The last bin contains overflow events.

Background-only post-fit $p_{T}^{miss}$ distributions for the CRs of the AH selection. The total theory signal (t/t+DM and tt+DM summed together) is negligible and therefore is not shown. The last bin contains overflow events.

Background-only post-fit $p_{T}^{miss}$ distributions for the CRs of the AH selection. The total theory signal (t/t+DM and tt+DM summed together) is negligible and therefore is not shown. The last bin contains overflow events.

Background-only post-fit $p_{T}^{miss}$ distributions for the CRs of the SL selection. The total theory signal (t/t+DM and tt+DM summed together) is negligible and therefore is not shown. The last bin contains overflow events.

Background-only post-fit $p_{T}^{miss}$ distributions for the CRs of the SL selection. The total theory signal (t/t+DM and tt+DM summed together) is negligible and therefore is not shown. The last bin contains overflow events.

Background-only post-fit $p_{T}^{miss}$ distributions for the CRs of the SL selection. The total theory signal (t/t+DM and tt+DM summed together) is negligible and therefore is not shown. The last bin contains overflow events.

Background-only post-fit $p_{T}^{miss}$ distributions for the CRs of the SL selection. The total theory signal (t/t+DM and tt+DM summed together) is negligible and therefore is not shown. The last bin contains overflow events.

Background-only post-fit $p_{T}^{miss}$ distributions for the CRs of the SL selection. The total theory signal (t/t+DM and tt+DM summed together) is negligible and therefore is not shown. The last bin contains overflow events.

Cross sections of the t+DM and tt+DM processes, for different mediator and dark matter masses. The pseudoscalar hypothesis is considered. The t+DM processes are split by production mode (t-, s-, and tW-channels). The sum of the three is also provided.

Cross sections of the t+DM and tt+DM processes, for different mediator and dark matter masses. The scalar hypothesis is considered. The t+DM processes are split by production mode (t-, s-, and tW-channels). The sum of the three is also provided.

The expected and observed 95% CL limits on the DM production cross sections, relative to the theory predictions, shown for the pseudoscalar models.

The expected and observed 95% CL limits on the DM production cross sections, relative to the theory predictions, shown for the scalar models.

Summary of the measured values of $ d\sigma / d{m}$ (pb/GeV) in the dielectron channel with the statistical ($\delta_{\text{stat}}$), experimental ($\delta_{\text{exp}}$) and theoretical ($\delta_{\text{theo}}$) uncertainties, respectively. Here, $\delta_{\text{tot}}$ is the quadratic sum of the three components.

Summary of the measured values of fiducial $ d\sigma / d{m}$ (pb/GeV) (with no FSR correction applied) in the dimuon channel with the statistical ($\delta_{\text{stat}}$) and experimental ($\delta_{\text{exp}}$) uncertainties shown separately. Here, $\delta_{\text{tot}}$ is the quadratic sum of the two components.

of the measured values of fiducial $ d\sigma / d{m}$ (pb/GeV) (with no FSR correction applied) in the dielectron channel with the statistical ($\delta_{\text{stat}}$) and experimental ($\delta_{\text{exp}}$) uncertainties shown separately. Here, $\delta_{\text{tot}}$ is the quadratic sum of the two components.

Summary of the combined values of $ d\sigma / d{m}$ (pb/GeV) using the results from both the dimuon and dielectron channels. Here, $\delta_{\text{tot}}$ is the quadratic sum of the statistical, experimental and theoretical uncertainties.

Covariance matrix of the Drell-Yan differential cross section as a function of the dimuon invariant mass, measured in the full phase space, with FSR correction is applied. Luminosity uncertainty is not included in the covariance.

Covariance matrix of the Drell-Yan differential cross section as a function of the dielectron invariant mass, measured in the full phase space, with FSR correction is applied. Luminosity uncertainty is not included in the covariance.

Covariance matrix of the differential DY cross section measured for the combination of the two channels in the full phase space.

Combined 95% CL observed upper limit on the signal cross section as a function of $m_{\tilde{\chi}_{2}^{0}}=m_{\tilde{\chi}_{1}^{\pm}}$ for a $\Delta m=50$ GeV mass gap between the chargino and the lightest neutralino in the $W Z$ model.

Covariance matrix from the combined fit of the $m_{ extrm{jj}}$ and $m_{ extrm{T}}$ distributions in the $0\ell extrm{jj}$ and $1\ell extrm{jj}$ search regions.

The observed $m_{T}$ and $m_{jj}$ distributions in the ejj (upper left), $\mu$~jj (upper right), $\tau_{h}$~jj (lower left), and $0\ell$~jj (lower right) signal regions compared with the post-fit SM background yields from the fit described in the text. The pre-fit background yields and shapes are determined using data-driven methods for the major backgrounds, and based on simulation for the smaller backgrounds. Expected signal distributions are overlaid. The last bin in the $m_{T}$ distributions of the $1\ell$~jj channels include all events with $m_{T} > 210$~GeV. The last bin of the $m_{jj}$ distributions of the $0\ell$~jj channel include all events with $m_{jj} > 3800$~GeV.

The observed $m_{T}$ and $m_{jj}$ distributions in the ejj (upper left), $\mu$~jj (upper right), $\tau_{h}$~jj (lower left), and $0\ell$~jj (lower right) signal regions compared with the post-fit SM background yields from the fit described in the text. The pre-fit background yields and shapes are determined using data-driven methods for the major backgrounds, and based on simulation for the smaller backgrounds. Expected signal distributions are overlaid. The last bin in the $m_{T}$ distributions of the $1\ell$~jj channels include all events with $m_{T} > 210$~GeV. The last bin of the $m_{jj}$ distributions of the $0\ell$~jj channel include all events with $m_{jj} > 3800$~GeV.

The observed $m_{T}$ and $m_{jj}$ distributions in the ejj (upper left), $\mu$~jj (upper right), $\tau_{h}$~jj (lower left), and $0\ell$~jj (lower right) signal regions compared with the post-fit SM background yields from the fit described in the text. The pre-fit background yields and shapes are determined using data-driven methods for the major backgrounds, and based on simulation for the smaller backgrounds. Expected signal distributions are overlaid. The last bin in the $m_{T}$ distributions of the $1\ell$~jj channels include all events with $m_{T} > 210$~GeV. The last bin of the $m_{jj}$ distributions of the $0\ell$~jj channel include all events with $m_{jj} > 3800$~GeV.

The observed $m_{T}$ and $m_{jj}$ distributions in the ejj (upper left), $\mu$~jj (upper right), $\tau_{h}$~jj (lower left), and $0\ell$~jj (lower right) signal regions compared with the post-fit SM background yields from the fit described in the text. The pre-fit background yields and shapes are determined using data-driven methods for the major backgrounds, and based on simulation for the smaller backgrounds. Expected signal distributions are overlaid. The last bin in the $m_{T}$ distributions of the $1\ell$~jj channels include all events with $m_{T} > 210$~GeV. The last bin of the $m_{jj}$ distributions of the $0\ell$~jj channel include all events with $m_{jj} > 3800$~GeV.

Combined 95% CL UL on the cross section as a function of $m(\tilde{\chi}_{2}^{0})=m(\tilde{\chi}_{1}^{\pm})$. The results correspond to $\Delta m=1$ GeV (left) and $\Delta m=50$ GeV (right) mass gaps between the chargino and the lightest neutralino in the light slepton model. The top row shows the expected limits, and the bottom row shows the observed limits.

Combined 95% CL UL on the cross section as a function of $m(\tilde{\chi}_{2}^{0})=m(\tilde{\chi}_{1}^{\pm})$. The results correspond to $\Delta m=1$ GeV (left) and $\Delta m=50$ GeV (right) mass gaps between the chargino and the lightest neutralino in the light slepton model. The top row shows the expected limits, and the bottom row shows the observed limits.

Combined 95% CL UL on the cross section as a function of $m(\tilde{\chi}_{2}^{0})=m(\tilde{\chi}_{1}^{\pm})$. The results correspond to $\Delta m=1$ GeV (left) and $\Delta m=50$ GeV (right) mass gaps between the chargino and the lightest neutralino in the light slepton model. The top row shows the expected limits, and the bottom row shows the observed limits.

Combined 95% CL UL on the cross section as a function of $m(\tilde{\chi}_{2}^{0})=m(\tilde{\chi}_{1}^{\pm})$. The results correspond to $\Delta m=1$ GeV (left) and $\Delta m=50$ GeV (right) mass gaps between the chargino and the lightest neutralino in the light slepton model. The top row shows the expected limits, and the bottom row shows the observed limits.

(Left) Expected and observed 95% confidence level upper limit (UL) on the signal cross section as a function of $m(\tilde{\chi}_{1}^{\pm})$ and $\Delta m$, assuming the light slepton model with slepton mass defined as the average of the \tilde{\chi}_{2}^{0} and \tilde{\chi}_{1}^{\pm} masses, $x_{\widetilde{\ell}}=0.5$. The lower left edge of each bin represents the \{$m(\tilde{\chi}_{1}^{\pm})$,$\Delta m$\} combination used to calculate the UL on the signal cross section. For example, the lowest and leftmost bin corresponds to the UL on the signal cross section for the scenario with $m(\tilde{\chi}_{1}^{\pm}) = 100$ GeV and $\Delta m = 1$ GeV. (Right) Combined 95% CL UL on the cross section as a function of $m_{\tilde{\chi}_{2}^{0}}=m_{\tilde{\chi}_{1}^{\pm}}$, for $\Delta m=1$ GeV and $\Delta m=30$ GeV mass gaps between the chargino and the neutralino, assuming the light slepton model.

(Left) Expected and observed 95% confidence level upper limit (UL) on the signal cross section as a function of $m(\tilde{\chi}_{1}^{\pm})$ and $\Delta m$, assuming the light slepton model with slepton mass defined as the average of the \tilde{\chi}_{2}^{0} and \tilde{\chi}_{1}^{\pm} masses, $x_{\widetilde{\ell}}=0.5$. The lower left edge of each bin represents the \{$m(\tilde{\chi}_{1}^{\pm})$,$\Delta m$\} combination used to calculate the UL on the signal cross section. For example, the lowest and leftmost bin corresponds to the UL on the signal cross section for the scenario with $m(\tilde{\chi}_{1}^{\pm}) = 100$ GeV and $\Delta m = 1$ GeV. (Right) Combined 95% CL UL on the cross section as a function of $m_{\tilde{\chi}_{2}^{0}}=m_{\tilde{\chi}_{1}^{\pm}}$, for $\Delta m=1$ GeV and $\Delta m=30$ GeV mass gaps between the chargino and the neutralino, assuming the light slepton model.

(Left) Expected and observed 95% confidence level upper limit (UL) on the signal cross section as a function of $m(\tilde{\chi}_{1}^{\pm})$ and $\Delta m$, assuming the light slepton model with slepton mass defined as the average of the \tilde{\chi}_{2}^{0} and \tilde{\chi}_{1}^{\pm} masses, $x_{\widetilde{\ell}}=0.5$. The lower left edge of each bin represents the \{$m(\tilde{\chi}_{1}^{\pm})$,$\Delta m$\} combination used to calculate the UL on the signal cross section. For example, the lowest and leftmost bin corresponds to the UL on the signal cross section for the scenario with $m(\tilde{\chi}_{1}^{\pm}) = 100$ GeV and $\Delta m = 1$ GeV. (Right) Combined 95% CL UL on the cross section as a function of $m_{\tilde{\chi}_{2}^{0}}=m_{\tilde{\chi}_{1}^{\pm}}$, for $\Delta m=1$ GeV and $\Delta m=30$ GeV mass gaps between the chargino and the neutralino, assuming the light slepton model.

(Left) Expected and observed 95% confidence level upper limit (UL) on the signal cross section as a function of $m(\tilde{\chi}_{1}^{\pm})$ and $\Delta m$, assuming the \tilde{\chi}_{1}^{\pm} and \tilde{\chi}_{2}^{0} decays proceed via $W^{*}$ and $Z^{*}$. The lower left edge of each bin represents the \{$m(\tilde{\chi}_{1}^{\pm})$,$\Delta m$\} combination used to calculate the UL on the signal cross section. For example, the lowest and leftmost bin corresponds to the UL on the signal cross section for the scenario with $m(\tilde{\chi}_{1}^{\pm}) = 100$ GeV and $\Delta m = 1$ GeV. (Right) The 95% CL UL on the cross section as a function of $m_{\tilde{\chi}_{2}^{0}}=m_{\tilde{\chi}_{1}^{\pm}}$, for $\Delta m=1$ GeV and $\Delta m=30$ GeV mass gaps between the chargino and the neutralino, after combining 0 lepton and 1 lepton channels, assuming the \tilde{\chi}_{1}^{\pm} and \tilde{\chi}_{2}^{0} decays proceed via $W^{*}$ and $Z^{*}$.

(Left) Expected and observed 95% confidence level upper limit (UL) on the signal cross section as a function of $m(\tilde{\chi}_{1}^{\pm})$ and $\Delta m$, assuming the \tilde{\chi}_{1}^{\pm} and \tilde{\chi}_{2}^{0} decays proceed via $W^{*}$ and $Z^{*}$. The lower left edge of each bin represents the \{$m(\tilde{\chi}_{1}^{\pm})$,$\Delta m$\} combination used to calculate the UL on the signal cross section. For example, the lowest and leftmost bin corresponds to the UL on the signal cross section for the scenario with $m(\tilde{\chi}_{1}^{\pm}) = 100$ GeV and $\Delta m = 1$ GeV. (Right) The 95% CL UL on the cross section as a function of $m_{\tilde{\chi}_{2}^{0}}=m_{\tilde{\chi}_{1}^{\pm}}$, for $\Delta m=1$ GeV and $\Delta m=30$ GeV mass gaps between the chargino and the neutralino, after combining 0 lepton and 1 lepton channels, assuming the \tilde{\chi}_{1}^{\pm} and \tilde{\chi}_{2}^{0} decays proceed via $W^{*}$ and $Z^{*}$.

Example description

Selection efficiency on signal for each channel.

Model-independent constraints on the coupling strength modifier as a function of the heavy scalar boson mass, for a relative width of 2.5%.

Model-independent constraints on the coupling strength modifier as a function of the heavy scalar boson mass, for a relative width of 5.0%.

Model-independent constraints on the coupling strength modifier as a function of the heavy scalar boson mass, for a relative width of 10.0%.

Model-independent constraints on the coupling strength modifier as a function of the heavy scalar boson mass, for a relative width of 25.0%.

Model-independent constraints on the coupling strength modifier as a function of the heavy pseudoscalar boson mass, for a relative width of 0.5%.

Model-independent constraints on the coupling strength modifier as a function of the heavy pseudoscalar boson mass, for a relative width of 1.0%.

Model-independent constraints on the coupling strength modifier as a function of the heavy pseudoscalar boson mass, for a relative width of 2.5%.

Model-independent constraints on the coupling strength modifier as a function of the heavy pseudoscalar boson mass, for a relative width of 5.0%.

Model-independent constraints on the coupling strength modifier as a function of the heavy pseudoscalar boson mass, for a relative width of 10.0%.

Model-independent constraints on the coupling strength modifier as a function of the heavy pseudoscalar boson mass, for a relative width of 25.0%.

NMSSM 95% CL upper limit on cross section times branching ratio

NMSSM 95% CL upper limit on cross section times branching ratio

NMSSM 95% CL upper limit on cross section times branching ratio

NMSSM 95% CL upper limit on cross section times branching ratio

90% CL upper limit on MSSMD kinetic mixing parameter epsilon

90% CL upper limit on MSSMD kinetic mixing parameter epsilon

90% CL upper limit on MSSMD kinetic mixing parameter epsilon

90% CL upper limit on MSSMD kinetic mixing parameter epsilon

Combined dilepton 95% CL exclusion limits on the cross section for the left-left constructive CI model. The red curve in the left plot shows the theoretical cross section as a function of the CI Scale Lambda.

Combined dilepton 95% CL exclusion limits on the CI scale (Lambda) for the six different CI models considered. Thelimits are obtained for m > 400(2200) GeV in the case of constructive (destructive) interference.

Electron pair invariant mass spectra for the combined barrel-barrel and barrel-endcap event categories. Example model predictions are given for CI. The lower panel shows the relative difference between the data and predicted background. The gray band gives the fractional uncertainty (statistical and systematic) in the prediction.

Muon pair invariant mass spectra for the combined barrel-barrel and barrel-endcap event categories. Example model predictions are given for the ADD model. The lower panel shows the relative difference between the data and predicted background. The gray band gives the fractional uncertainty (statistical and systematic) in the prediction.

Dilepton exclusion limits at 95% CL on the CI scale (Lambda) for the six CI models considered for the electron channel. The limits are obtained for m > 400(2200) GeV in the case of constructive (destructive) interference.

Dilepton exclusion limits at 95% CL on the CI scale (Lambda) for the six CI models considered for the muon channel. The limits are obtained for m > 400(2200) GeV in the case of constructive (destructive) interference.

Combined dilepton 95% CL exclusion limits on the UV cutoff with m> 1.8 TeV in the GRW, Hewett, and HLZ conventions for the ADD model. Signal model cross sections are calculated up to leading order and a correction factor of 1.3 is applied.

Exclusion limits at 95% CL on the UV cutoff for the electron channel with m> 1.8 TeV in the GRW, Hewett, and HLZ conventions for the ADD model. Signal model cross sections are calculated up to leading order and a correction factor of 1.3 is applied.

Exclusion limits at 95% CL on the UV cutoff for the muon channel with m> 1.8 TeV in the GRW, Hewett, and HLZ conventions for the ADD model. Signal model cross sections are calculated up to leading order and a correction factor of 1.3 is applied.

Gluino - neutralino mass points lying on the expected exclusion contour of T5qqqqHG model.

Gluino - neutralino mass points lying on the expected $-1\sigma_{exp}$ exclusion contour of T5qqqqHG model.

Expected $95\%$ CL upper limit on the production cross section of gluinos in T5bbbbZG model.

Gluino - neutralino mass points lying on the observed $+1\sigma_{theory}$ exclusion contour of T5qqqqHG model.

Gluino - neutralino mass points lying on the expected exclusion contour of T5qqqqHG model.

Gluino - neutralino mass points lying on the expected $-1\sigma_{exp}$ exclusion contour of T5qqqqHG model.

Expected $95\%$ CL upper limit on the production cross section of gluinos in T5ttttZG model.

Gluino - neutralino mass points lying on the observed $+1\sigma_{theory}$ exclusion contour of T5qqqqHG model.

Gluino - neutralino mass points lying on the expected exclusion contour of T5qqqqHG model.

Gluino - neutralino mass points lying on the expected $-1\sigma_{exp}$ exclusion contour of T5qqqqHG model.

Expected $95\%$ CL upper limit on the production cross section of gluinos in T6ttZG model.

Stop - neutralino mass points lying on the observed $+1\sigma_{theory}$ exclusion contour of T5qqqqHG model.

Stop - neutralino mass points lying on the expected exclusion contour of T5qqqqHG model.

Observed $95\%$ CL upper limit on the production cross section of gluinos in T5qqqqHG model.

Gluino - neutralino mass points lying on the observed exclusion contour of T5qqqqHG model.

Gluino - neutralino mass points lying on the observed $-1\sigma_{theory}$ exclusion contour of T5qqqqHG model.

Gluino - neutralino mass points lying on the expected $+1\sigma_{exp}$ exclusion contour of T5qqqqHG model.

Observed $95\%$ CL upper limit on the production cross section of gluinos in T5bbbbZG model.

Gluino - neutralino mass points lying on the observed exclusion contour of T5qqqqHG model.

Gluino - neutralino mass points lying on the observed $-1\sigma_{theory}$ exclusion contour of T5qqqqHG model.

Gluino - neutralino mass points lying on the expected $+1\sigma_{exp}$ exclusion contour of T5qqqqHG model.

Observed $95\%$ CL upper limit on the production cross section of gluinos in T5ttttZG model.

Gluino - neutralino mass points lying on the observed exclusion contour of T5qqqqHG model.

Gluino - neutralino mass points lying on the observed $-1\sigma_{theory}$ exclusion contour of T5qqqqHG model.

Gluino - neutralino mass points lying on the expected $+1\sigma_{exp}$ exclusion contour of T5qqqqHG model.

Observed $95\%$ CL upper limit on the production cross section of gluinos in T6ttZG model.

Stop - neutralino mass points lying on the observed exclusion contour of T5qqqqHG model.

Stop - neutralino mass points lying on the observed $-1\sigma_{theory}$ exclusion contour of T5qqqqHG model.

Stop - neutralino mass points lying on the expected $+1\sigma_{exp}$ exclusion contour of T5qqqqHG model.

Stop - neutralino mass points lying on the expected $-1\sigma_{exp}$ exclusion contour of T5qqqqHG model.

Covariance among different search bins.

Correlation among different search bins.

Cutflow table for a few signal models. Yields are normalized to integrated luminosity.

Normalized inclusive 2-jet cross section differential in $\Delta\phi_{1,2}$ for $500 < p_{T}^{max} < 600$ GeV

Normalized inclusive 2-jet cross section differential in $\Delta\phi_{1,2}$ for $600 < p_{T}^{max} < 700$ GeV

Normalized inclusive 2-jet cross section differential in $\Delta\phi_{1,2}$ for $700 < p_{T}^{max} < 800$ GeV

Normalized inclusive 2-jet cross section differential in $\Delta\phi_{1,2}$ for $800 < p_{T}^{max} < 1000$ GeV

Normalized inclusive 2-jet cross section differential in $\Delta\phi_{1,2}$ for $1000 < p_{T}^{max} < 1200$ GeV

Normalized inclusive 2-jet cross section differential in $\Delta\phi_{1,2}$ for $p_{T}^{max} > 1200$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{1,2}$ for $200 < p_{T}^{max} < 300$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{1,2}$ for $300 < p_{T}^{max} < 400$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{1,2}$ for $400 < p_{T}^{max} < 500$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{1,2}$ for $500 < p_{T}^{max} < 600$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{1,2}$ for $600 < p_{T}^{max} < 700$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{1,2}$ for $700 < p_{T}^{max} < 800$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{1,2}$ for $800 < p_{T}^{max} < 1000$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{1,2}$ for $p_{T}^{max} > 1000$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{1,2}$ for $200 < p_{T}^{max} < 300$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{1,2}$ for $300 < p_{T}^{max} < 400$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{1,2}$ for $400 < p_{T}^{max} < 500$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{1,2}$ for $500 < p_{T}^{max} < 600$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{1,2}$ for $600 < p_{T}^{max} < 700$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{1,2}$ for $700 < p_{T}^{max} < 800$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{1,2}$ for $800 < p_{T}^{max} < 1000$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{1,2}$ for $p_{T}^{max} > 1000$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $200 < p_{T}^{max} < 300$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $300 < p_{T}^{max} < 400$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $400 < p_{T}^{max} < 500$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $500 < p_{T}^{max} < 600$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $600 < p_{T}^{max} < 700$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $700 < p_{T}^{max} < 800$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $800 < p_{T}^{max} < 1000$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $p_{T}^{max} > 1000$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $200 < p_{T}^{max} < 300$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $300 < p_{T}^{max} < 400$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $400 < p_{T}^{max} < 500$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $500 < p_{T}^{max} < 600$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $600 < p_{T}^{max} < 700$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $700 < p_{T}^{max} < 800$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $800 < p_{T}^{max} < 1000$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $p_{T}^{max} > 1000$ GeV

The $S_{\rm T}$ distribution for group D before fitting.

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = 100%.

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = B(T → tH) = 50%.

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = B(T → bW) = 50%

The $S_{\rm T}$ distribution for 1b event category for data and the expected background before fitting.

The $S_{\rm T}$ distribution for 2b event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted t event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted H event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted Z event category for data and the expected background.

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = 100%.

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = Br(B → bH) = 50%.

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = Br(B → tW) = 50%

The number of observed events and the predicted number of SM background events in the $T\bar T$ search using muon channel in the four event groups.

The number of observed events and the predicted number of SM background events in the $B\bar B$ search using electron channel in the five event categories.

The number of observed events and the predicted number of SM background events in the $B\bar B$ search using muon channel in the five event categories.

The number of observed events and the predicted number of SM background events in the $B\bar B$ search using muon channel in the five event categories.

Observed and expected likelihood scans of $f_{a3}\cos\phi_{a3}$. See Section 4 of the paper for more details.

Distributions of $\min[M(\ell,\mathrm{j})]$ in the W+jets control region, for 0 W-tagged jet category. Example signal distributions are also shown. The background distributions correspond to background-only fit to data while signal distributions are before the fit to data. Electron and muon event samples are combined. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{j})]$ in the W+jets control region, for 1 or more W-tagged jet category. Example signal distributions are also shown. The background distributions correspond to background-only fit to data while signal distributions are before the fit to data. Electron and muon event samples are combined. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 0 W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 0 W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 1 or more W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 1 or more W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 0 W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 0 W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 1 or more W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 1 or more W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Expected and observed limits at 95% CL for an LH $X_{5/3}$ after combining all categories for the same-sign dilepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an RH $X_{5/3}$ after combining all categories for the same-sign dilepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an LH $X_{5/3}$ after combining all categories for the single-lepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an RH $X_{5/3}$ after combining all categories for the single-lepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an LH $X_{5/3}$ after combining the same-sign dilepton and single-lepton final states. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an RH $X_{5/3}$ after combining the same-sign dilepton and single-lepton final states. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected upper limits at 95% CL on the product of the signal cross section and branching fraction for the tau sneutrino signal, as a function of the mass of the RPV resonance.

Observed and expected upper limits at 95% CL on the median product of the signal cross section and the branching fraction for the QBH decay to $e\mu$ as a function of threshold mass.

Observed and expected upper limits at 95% CL on the product of the signal cross section and the branching fraction(B), assuming B=10% for the decay Z' to $e\mu$, as a function of m(Z').

Observed upper limits at 95% CL on the product of the signal cross section and branching fraction for the tau-sneutrino signal, as a function of the mass of the RPV resonance.