The JEC, JER, and total systematic uncertainties in unfolded cross sections as functions of transverse momentum, for 1.5<|y|<2. The total systematic uncertainty includes also the luminosity, jet identification and trigger efficiency uncertainties.

The unfolded measured particle-level inclusive jet cross section as functions of jet pT (markers), for |y|<0.5, compared to the NLO perturbative QCD prediction (histogram), using the CT14NLO PDF set, with muR = muF = HT, and corrected for the NP effects. The experimental and theoretical systematic uncertainties are shown.

The unfolded measured particle-level inclusive jet cross section as functions of jet pT (markers), for 0.5<|y|<1, compared to the NLO perturbative QCD prediction (histogram), using the CT14NLO PDF set, with muR = muF = HT, and corrected for the NP effects. The experimental and theoretical systematic uncertainties are shown.

The unfolded measured particle-level inclusive jet cross section as functions of jet pT (markers), for 1<|y|<1.5, compared to the NLO perturbative QCD prediction (histogram), using the CT14NLO PDF set, with muR = muF = HT, and corrected for the NP effects. The experimental and theoretical systematic uncertainties are shown.

The unfolded measured particle-level inclusive jet cross section as functions of jet pT (markers), for 1.5<|y|<2, compared to the NLO perturbative QCD prediction (histogram), using the CT14NLO PDF set, with muR = muF = HT, and corrected for the NP effects. The experimental and theoretical systematic uncertainties are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = pT, for |y|<0.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = pT, for 0.5<|y|<1. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = pT, for 1<|y|<1.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = pT, for 1.5<|y|<2. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = HT, for |y|<0.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = HT, for 0.5<|y|<1. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = HT, for 1<|y|<1.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = HT, for 1.5<|y|<2. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the CT14NNLO PDF set, with mu = HT, for |y|<0.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the CT14NNLO PDF set, with mu = HT, for 0.5<|y|<1. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the CT14NNLO PDF set, with mu = HT, for 1<|y|<1.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the CT14NNLO PDF set, with mu = HT, for 1.5<|y|<2. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the NNPDF31NNLO PDF set, with mu = HT, for |y|<0.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the NNPDF31NNLO PDF set, with mu = HT, for 0.5<|y|<1. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the NNPDF31NNLO PDF set, with mu = HT, for 1<|y|<1.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the NNPDF31NNLO PDF set, with mu = HT, for 1.5<|y|<2. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

The effect of aS(MZ) variation, for |y|<0.5. The NNLO theoretical cross section predictions using the NNPDF31NNLO PDF with m = HT, calculated for different choices of aS (0.108, 0.110, 0.112, 0.114, 0.116, 0.117, 0.118, 0.119, 0.120, 0.122, and 0.124), are divided by the benchmark NNLO prediction for aS = 0.118 and the same choice of PDF set, muR, and muF. Also shown is the experimental unfolded measurement divided by the same benchmark prediction. The width of the unity line corresponds to the statistical uncertainty from the MC integration for the determination of the NNLO prediction. The error bars on the unfolded data correspond to the total experimental statistical and systematic uncertainty added in quadrature.

The effect of aS(MZ) variation, for 0.5<|y|<1. The NNLO theoretical cross section predictions using the NNPDF31NNLO PDF with m = HT, calculated for different choices of aS (0.108, 0.110, 0.112, 0.114, 0.116, 0.117, 0.118, 0.119, 0.120, 0.122, and 0.124), are divided by the benchmark NNLO prediction for aS = 0.118 and the same choice of PDF set, muR, and muF. Also shown is the experimental unfolded measurement divided by the same benchmark prediction. The width of the unity line corresponds to the statistical uncertainty from the MC integration for the determination of the NNLO prediction. The error bars on the unfolded data correspond to the total experimental statistical and systematic uncertainty added in quadrature.

The effect of aS(MZ) variation, for 1<|y|<1.5. The NNLO theoretical cross section predictions using the NNPDF31NNLO PDF with m = HT, calculated for different choices of aS (0.108, 0.110, 0.112, 0.114, 0.116, 0.117, 0.118, 0.119, 0.120, 0.122, and 0.124), are divided by the benchmark NNLO prediction for aS = 0.118 and the same choice of PDF set, muR, and muF. Also shown is the experimental unfolded measurement divided by the same benchmark prediction. The width of the unity line corresponds to the statistical uncertainty from the MC integration for the determination of the NNLO prediction. The error bars on the unfolded data correspond to the total experimental statistical and systematic uncertainty added in quadrature.

The effect of aS(MZ) variation, for 1.5<|y|<2. The NNLO theoretical cross section predictions using the NNPDF31NNLO PDF with m = HT, calculated for different choices of aS (0.108, 0.110, 0.112, 0.114, 0.116, 0.117, 0.118, 0.119, 0.120, 0.122, and 0.124), are divided by the benchmark NNLO prediction for aS = 0.118 and the same choice of PDF set, muR, and muF. Also shown is the experimental unfolded measurement divided by the same benchmark prediction. The width of the unity line corresponds to the statistical uncertainty from the MC integration for the determination of the NNLO prediction. The error bars on the unfolded data correspond to the total experimental statistical and systematic uncertainty added in quadrature.

Unfolded correlation matrix for |y|<0.5.

Unfolded correlation matrix for 0.5<|y|<1.

Unfolded correlation matrix for 1<|y|<1.5.

Unfolded correlation matrix for 1.5<|y|<2.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with 400 < $p_{T1}$ < 800 GeV and for an azimuthal separation between the two leading jets of $0 < \Delta\Phi_{1,2} < 150^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with 400 < $p_{T1}$ < 800 GeV and for an azimuthal separation between the two leading jets of $150 < \Delta\Phi_{1,2} < 170^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with 400 < $p_{T1}$ < 800 GeV and for an azimuthal separation between the two leading jets of $170 < \Delta\Phi_{1,2} < 180^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with $p_{T1}$ > 800 and for an azimuthal separation between the two leading jets of $0 < \Delta\Phi_{1,2} < 150^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with $p_{T1}$ > 800 and for an azimuthal separation between the two leading jets of $150 < \Delta\Phi_{1,2} < 170^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with $p_{T1}$ > 800 and for an azimuthal separation between the two leading jets of $170 < \Delta\Phi_{1,2} < 180^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Measured transverse momentum of the leading $p_{T}$ jet ($p_{T1}$). The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Measured transverse momentum of the subleading $p_{T}$ jet ($p_{T2}$). The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Measured transverse momentum of the third leading $p_{T}$ jet ($p_{T3}$). The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Measured transverse momentum of the fourth leading $p_{T}$ jet ($p_{T4}$). The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity distribution in TUnfold binning ($N_{jets},\Delta\phi_{1,2},p_{T1}$) as indicated in the XML file provided as additional resource. The uncertainties follow the notation of Table 1.

Correlation matrix at particle level for the measured jet multiplicity in TUnfold binning ($N_{jets},\Delta\phi_{1,2},p_{T1}$) as indicated in the XML file provided as additional resource.

Jet $p_{T}$ distributions in TUnfold binning ($p_{T1},p_{T2},p_{T3},p_{T4}$) as indicated in the XML file provided as additional resource. The uncertainties follow the notation of Table 1.

Correlation matrix at particle level for the measured jet $p_{T}$ distributions in TUnfold binning ($p_{T1},p_{T2},p_{T3},p_{T4}$) as indicated in the XML file provided as additional resource.

Negative log-likelihood difference in $\text{c}_{\varphi\text{Q}}^{3}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\varphi\text{t}}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\varphi\text{tb}}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\text{tW}}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\text{bW}}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\text{tZ}}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\text{t}\varphi}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\varphi\text{Q}}^{-}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\varphi\text{Q}}^{3}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\varphi\text{t}}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\varphi\text{tb}}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\text{tW}}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\text{bW}}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\text{tZ}}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\varphi\text{t}}, \text{c}_{\varphi\text{Q}}^{-}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\varphi\text{Q}}^{3}, \text{c}_{\varphi\text{Q}}^{-}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\text{tW}}, \text{c}_{\text{tZ}}$ where the other Wilson coefficients are fixed to 0.

Measured inclusive fiducial $tt\gamma$ production cross section in the dilepton final state for the different dilepton-flavour channels and combined.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ .

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ . The values provided in the table are not divided by the bin width.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton measurement.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton and lepton+jets measurements combined.

One-dimensional 68 and 95% CL intervals obtained for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$, using the photon $p_{T}$ distribution from the dilepton analysis, or the combination of photon pT distributions from the dilepton and lepton+jets analyses.

Comparison of observed $95\%$ CL intervals for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$. Results are shown from a CMS ttZ measurement [JHEP 03 (2020) 056], from a CMS ttZ & tZq interpretation [arXiv:2107.13896], from a CMS ttG (lepton+jets) measurement [arXiv:2107.01508], from this measurement, and from a global fit by J. Ellis et al. [JHEP 04 (2021) 279].

Distribution of $m_{T}(W)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $M_{3}$ in the $N_{jet}\geq 3$ signal region.

Distribution of $M_{3}$ in the $N_{jet}\geq 3$ signal region.

Distribution of $m(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $m(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(j,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(j,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for electrons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for electrons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for muons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for muons.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the e channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the e channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the $\mu$ channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the $\mu$ channel.

Extracted scale factors for the contribution from misidentified electrons for the three data-taking periods, and the Z$\gamma$, W$\gamma$ simulations.

Extracted scale factors for the contribution from misidentified electrons for the three data-taking periods, and the Z$\gamma$, W$\gamma$ simulations.

Predicted and observed yields in the control regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the control regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the signal regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the signal regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

The measured inclusive ttgamma cross section in the fiducial phase space compared to the prediction from simulation using Madgraph_aMC@NLO at a center-of-mass energy of 13 TeV.

The measured inclusive ttgamma cross section in the fiducial phase space compared to the prediction from simulation using Madgraph_aMC@NLO at a center-of-mass energy of 13 TeV.

Summary of the measured cross section ratios with respect to the NLO cross section prediction for signal regions binned in the electron channel, muon channel and the combined single lepton measurement.

Summary of the measured cross section ratios with respect to the NLO cross section prediction for signal regions binned in the electron channel, muon channel and the combined single lepton measurement.

The unfolded differential cross sections for $p_{T}(\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $p_{T}(\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $|\eta(\gamma)|$ and the comparison to simulations.

The unfolded differential cross sections for $|\eta(\gamma)|$ and the comparison to simulations.

The unfolded differential cross sections for $\Delta R(l,\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $\Delta R(l,\gamma)$ and the comparison to simulations.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

Summary of the one-dimensional intervals at 68 and 95% CL.

Summary of the one-dimensional intervals at 68 and 95% CL.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the muon channel.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the two-dimensional scan for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the two-dimensional scan for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$.

Differential cross sections as function of transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events.

Differential cross sections as function of transverse momentum imbalance between leading and subleading jet for Z+ ≥ 2 jets events.

Area normalized distribution as function of Delta Phi between Z boson and the leading jet for Z+ ≥ 1 jet events.

Area normalized distribution as function of transverse momentum imbalance between Z boson and the leading jet for Z+ ≥ 1 jet events.

Area normalized distribution as function of Delta Phi between Z boson and dijet for Z+ ≥ 2 jets events.

Area normalized distribution as function of transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events.

Area normalized distribution as function of transverse momentum imbalance between leading and subleading jet for Z+ ≥ 2 jets events

Response matrix for Delta Phi between Z boson and the leading jet for Z+ ≥ 1 jet events.

Response matrix for transverse momentum imbalance between Z boson and the leading jet for Z+ ≥ 1 jet events.

Response matrix for Delta Phi between Z boson and dijet for Z+ ≥ 2 jets events.

Response matrix for transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events.

Response matrix for transverse momentum imbalance between the leading jet and subleading jet for Z+ ≥ 2 jets events.

Correlation matrix for Delta Phi between Z boson and the leading jet for Z+ ≥ 1 jet events (for absolute differential cross section measurements).

Correlation matrix for transverse momentum imbalance between Z boson and the leading jet for Z+ ≥ 1 jet events (for absolute differential cross section measurements).

Correlation matrix for Delta Phi between Z boson and dijet for Z+ ≥ 2 jets events (for absolute differential cross section measurements).

Correlation matrix for transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events (for absolute differential cross section measurements).

Correlation matrix for transverse momentum imbalance between the leading jet and subleading jet for Z+ ≥ 2 jets events (for absolute differential cross section measurements).

Correlation matrix for Delta Phi between Z boson and the leading jet for Z+ ≥ 1 jet events (for normalized differential cross section measurements).

Correlation matrix for transverse momentum imbalance between Z boson and the leading jet for Z+ ≥ 1 jet events (for normalized differential cross section measurements).

Correlation matrix for Delta Phi between Z boson and dijet for Z+ ≥ 2 jets events (for normalized differential cross section measurements).

Correlation matrix for transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events (for normalized differential cross section measurements).

Correlation matrix for transverse momentum imbalance between the leading jet and subleading jet for Z+ ≥ 2 jets events (for normalized differential cross section measurements).

The $L_{T}$ distribution in the MisID-enriched region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L below-Z signal region. The last bin contains the overflow events.

The $M_{T}$ distribution in the 3L on-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L above-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF1 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF2 signal region. The last bin contains the overflow events.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The 95% confidence level exclusion limits for the flavor-democratic scenario on the total production cross section of heavy fermion pairs.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(PS).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(PS).

Product of the fiducial acceptance and the event selection efficiency for the type-III Seesaw signal model at various signal mass hypotheses calculated after all analysis selection requirements.

Product of the fiducial acceptance and the event selection efficiency for the tt$\phi$ signal models at various signal mass hypotheses calculated after all analysis selection requirements.

Exclusion limits at 95% CL for direct gluino pair production, where the gluinos decay to light-flavor quarks and a $\tilde{\chi}_1^\pm$ that decays to $W^\pm\tilde{\chi}_1^0$. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$, assuming unity branching fraction to $q_i\bar{q}_j W\pm\tilde{\chi}_1^0$.

Exclusion limits at 95% CL for direct gluino pair production, where the gluinos decay to bottom quarks ($\tilde{g}\to b\bar{b}\tilde{\chi}_1^0$). Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$, assuming unity branching fraction for the given decay.

Exclusion limits at 95% CL for direct gluino pair production, where the gluinos decay to top quarks ($\tilde{g}\to t\bar{t}\tilde{\chi}_1^0$). Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$, assuming unity branching fraction for the given decay.

Exclusion limits at 95% CL for light-flavor squark pair production, where the squarks decay to $q\tilde{\chi}_1^0$. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$, assuming unity branching fraction for the given decay and 1-fold degeneracy in the light-flavor squarks (corresponding to the inner set of curves in the limit plot). To get the theory cross section for other N-fold degeneracy assumptions (e.g. 8-fold for the outer curves in the limit plot), just multiply by N.

Exclusion limits at 95% CL for bottom squark pair production, where the squarks decay to $b\tilde{\chi}_1^0$. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$, assuming unity branching fraction for the given decay.

Exclusion limits at 95% CL for top squark pair production, where the squarks decay to $t\tilde{\chi}_1^0$. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$, assuming unity branching fraction for the given decay.

Exclusion limits at 95% CL for top squark pair production, where the squarks decay to $b\tilde{\chi}_1^\pm$ and the $\tilde{\chi}_1^0$ decay to $W^\pm\tilde{\chi}_1^0$. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$, assuming unity branching fraction for the given decay.

Exclusion limits at 95% CL for top squark pair production, where the squarks decay either to $b\tilde{\chi}_1^\pm\to bW^\pm\tilde{\chi}_1^0$ or to $t\tilde{\chi}_1^0$. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$, assuming unity branching fraction for the given decay.

Exclusion limits at 95% CL for top squark pair production, where the squarks decay to $c\tilde{\chi}_1^0$. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$, assuming unity branching fraction for the given decay.

Exclusion limits at 95% CL for the mono-$\phi$ model, in which a resonantly-produced colored scalar decays to a massive Dirac fermion and a quark. Signal cross sections are calculated at leading order in $\alpha_S$, assuming unity branching fraction for the given decay.

Cross section limits for $\mathrm{LQ}\to\mathrm{q}\nu$, where $q=u,\,d,\,s,\,\mathrm{or}\,c$. Limits are at the 95% confidence level. Theory cross sections are LO for vector LQ, and NLO for scalar LQ. Branching ratio is assumed to be 100% to $\mathrm{q}\nu$.

Cross section limits for $\mathrm{LQ}\to\mathrm{b}\nu$. Limits are at the 95% confidence level. Theory cross sections are LO for vector LQ, and NLO for scalar LQ. Branching ratio is assumed to be 100% to $\mathrm{b}\nu$.

Cross section limits for $\mathrm{LQ}\to\mathrm{t}\nu$. Limits are at the 95% confidence level. Theory cross sections are LO for vector LQ, and NLO for scalar LQ. Branching ratios are assumed to be $\mathcal{B}(\mathrm{LQ}\to\mathrm{t}\nu)=1-\beta$, and $\mathcal{B}(\mathrm{LQ}\to\mathrm{b}\tau)=\beta$.

Predictions and observations for monojet signal regions

Predictions and observations for signal regions with $250 \leq H_\mathrm{T} < 450$ GeV

Predictions and observations for signal regions with $450 \leq H_\mathrm{T} < 575$ GeV and $N_\mathrm{j}<7$

Predictions and observations for signal regions with $450 \leq H_\mathrm{T} < 575$ GeV and $N_\mathrm{j}\geq7$

Predictions and observations for signal regions with $575 \leq H_\mathrm{T} < 1200$ GeV and $N_\mathrm{j}^\mathrm{hi}<4$

Predictions and observations for signal regions with $575 \leq H_\mathrm{T} < 1200$ GeV and $4\leq N_\mathrm{j}^\mathrm{hi}<7$

Predictions and observations for signal regions with $575 \leq H_\mathrm{T} < 1200$ GeV and $N_\mathrm{j}\geq7$

Predictions and observations for signal regions with $1200 \leq H_\mathrm{T} < 1500$ GeV and $N_\mathrm{j}^\mathrm{hi}<4$

Predictions and observations for signal regions with $1200 \leq H_\mathrm{T} < 1500$ GeV and $4\leq N_\mathrm{j}^\mathrm{hi}<7$

Predictions and observations for signal regions with $1200 \leq H_\mathrm{T} < 1500$ GeV and $N_\mathrm{j}\geq7$

Predictions and observations for signal regions with $H_\mathrm{T} \geq 1500$ GeV and $N_\mathrm{j}<7$

Predictions and observations for signal regions with $H_\mathrm{T} \geq 1500$ GeV and $N_\mathrm{j}\geq7$

Covariance matrix for the 282 signal regions of the inclusive $M_\mathrm{T2}$ search

Correlation matrix for the 282 signal regions of the inclusive $M_\mathrm{T2}$ search

Bin number definitions for the $M_\mathrm{T2}$ covariance and correlation matrices

Exclusion limits at 95% CL for direct gluino pair production, where the gluinos decay to light-flavor quarks and either the lightest neutralino, or the lightest chargino, and the chargino is long-lived with $c\tau_0 = 10$ cm and mass O(100) MeV greater than the neutralino's mass. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$.

Exclusion limits at 95% CL for direct gluino pair production, where the gluinos decay to light-flavor quarks and either the lightest neutralino, or the lightest chargino, and the chargino is long-lived with $c\tau_0 = 50$ cm and mass O(100) MeV greater than the neutralino's mass. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$.

Exclusion limits at 95% CL for direct gluino pair production, where the gluinos decay to light-flavor quarks and either the lightest neutralino, or the lightest chargino, and the chargino is long-lived with $c\tau_0 = 200$ cm and mass O(100) MeV greater than the neutralino's mass. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$.

Exclusion limits at 95% CL for direct light squark pair production, where the squarks decay to light-flavor quarks and either the lightest neutralino, or the lightest chargino, and the chargino is long-lived with $c\tau_0 = 10$ cm and mass O(100) MeV greater than the neutralino's mass. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$, for a single light squark.

Exclusion limits at 95% CL for direct light squark pair production, where the squarks decay to light-flavor quarks and either the lightest neutralino, or the lightest chargino, and the chargino is long-lived with $c\tau_0 = 50$ cm and mass O(100) MeV greater than the neutralino's mass. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$, for a single light squark.

Exclusion limits at 95% CL for direct light squark pair production, where the squarks decay to light-flavor quarks and either the lightest neutralino, or the lightest chargino, and the chargino is long-lived with $c\tau_0 = 200$ cm and mass O(100) MeV greater than the neutralino's mass. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$, for a single light squark.

Exclusion limits at 95% CL for direct stop pair production, where the stops decay to either a top and the lightest neutralino, or a bottom and the lightest chargino, and the chargino is long-lived with $c\tau_0 = 10$ cm and mass O(100) MeV greater than the neutralino's mass. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$.

Exclusion limits at 95% CL for direct stop pair production, where the stops decay to either a top and the lightest neutralino, or a bottom and the lightest chargino, and the chargino is long-lived with $c\tau_0 = 50$ cm and mass O(100) MeV greater than the neutralino's mass. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$.

Exclusion limits at 95% CL for direct stop pair production, where the stops decay to either a top and the lightest neutralino, or a bottom and the lightest chargino, and the chargino is long-lived with $c\tau_0 = 200$ cm and mass O(100) MeV greater than the neutralino's mass. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$.

The maximum chargino mass excluded at 95% CL for direct gluino pair production, where the gluinos decay to light-flavor quarks and either the lightest neutralino, or the lightest chargino, and the chargino mass is O(100) MeV greater than the neutralino's mass. The chargino's lifetime is varied from $c\tau_{0} = 1$ to 2000 cm while the gluino mass is fixed to 1900 GeV. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$. If all kinematically allowed chargino masses are excluded, the curves, including 68 and 95% expected, tend to overlap. At short decay lengths, horizontal exclusion lines are obtained from the inclusive analysis, as this is not affected by track reconstruction inefficiencies, which may arise when the chargino decays before the CMS tracker, and therefore shows better sensitivity to scenarios with very small lifetime compared to the disappearing track search, based on median expected limits.

The maximum chargino mass excluded at 95% CL for direct squark pair production, where the squarks decay to light-flavor quarks and either the lightest neutralino, or the lightest chargino, and the chargino mass is O(100) MeV greater than the neutralino's mass. The chargino's lifetime is varied from $c\tau_{0} = 1$ to 2000 cm while the squark mass is fixed to 900 GeV. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$, for a single light squark. If all kinematically allowed chargino masses are excluded, the curves, including 68 and 95% expected, tend to overlap. At short decay lengths, horizontal exclusion lines are obtained from the inclusive analysis, as this is not affected by track reconstruction inefficiencies, which may arise when the chargino decays before the CMS tracker, and therefore shows better sensitivity to scenarios with very small lifetime compared to the disappearing track search, based on median expected limits.

The maximum chargino mass excluded at 95% CL for direct squark pair production, where the squarks decay to light-flavor quarks and either the lightest neutralino, or the lightest chargino, and the chargino mass is O(100) MeV greater than the neutralino's mass. The chargino's lifetime is varied from $c\tau_{0} = 1$ to 2000 cm while the squark mass is fixed to 1500 GeV. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$, and the eight light squarks' masses are assumed to be degenerate. If all kinematically allowed chargino masses are excluded, the curves, including 68 and 95% expected, tend to overlap. At short decay lengths, horizontal exclusion lines are obtained from the inclusive analysis, as this is not affected by track reconstruction inefficiencies, which may arise when the chargino decays before the CMS tracker, and therefore shows better sensitivity to scenarios with very small lifetime compared to the disappearing track search, based on median expected limits.

Exclusion limits at 95% CL for direct stop pair production, where the stops decay to either a top and the lightest neutralino, or a bottom and the lightest chargino, and the chargino mass is O(100) MeV greater than the neutralino's mass. The chargino's lifetime is varied from $c\tau_{0} = 1$ to 2000 cm while the stop mass is fixed to 1000 GeV. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$. If all kinematically allowed chargino masses are excluded, the curves, including 68 and 95% expected, tend to overlap. At short decay lengths, horizontal exclusion lines are obtained from the inclusive analysis, as this is not affected by track reconstruction inefficiencies, which may arise when the chargino decays before the CMS tracker, and therefore shows better sensitivity to scenarios with very small lifetime compared to the disappearing track search, based on median expected limits.

Exclusion limits at 95% CL for direct gluino pair production, where the gluinos decay to light-flavor quarks and either the lightest neutralino, or the lightest chargino, and the chargino mass is O(100) MeV greater than the neutralino's mass. The chargino's lifetime is varied from $c\tau_{0} = 5$ to 1000 cm while the gluino mass is fixed to 1600 GeV and the neutralino's mass is fixed to 1575 GeV. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$.

Exclusion limits at 95% CL for direct squark pair production, where the squarks decay to light-flavor quarks and either the lightest neutralino, or the lightest chargino, and the chargino mass is O(100) MeV greater than the neutralino's mass. The chargino's lifetime is varied from $c\tau_{0} = 5$ to 1000 cm while the squark mass is fixed to 2000 GeV and the neutralino's mass is fixed to 1000 GeV. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$, and the eight light squarks' masses are assumed to be degenerate.

Exclusion limits at 95% CL for direct stop pair production, where the stops decay to either a top and the lightest neutralino, or a bottom and the lightest chargino, and the chargino mass is O(100) MeV greater than the neutralino's mass. The chargino's lifetime is varied from $c\tau_{0} = 5$ to 1000 cm while the stop mass is fixed to 1100 GeV and the neutralino's mass is fixed to 1000 GeV. Signal cross sections are calculated at approximately NNLO+NNLL order in $\alpha_S$.

Predictions and observations for 2016 disappearing track signal regions

Predictions and observations for 2017-2018 pixel track signal regions

Predictions and observations for 2017-2018 medium (M) and long (L) length track signal regions

Covariance matrix for the 68 signal regions of the disappearing tracks $M_\mathrm{T2}$ search

Correlation matrix for the 68 signal regions of the disappearing tracks $M_\mathrm{T2}$ search

Summary of the measured values of $ d\sigma / d{m}$ (pb/GeV) in the dielectron channel with the statistical ($\delta_{\text{stat}}$), experimental ($\delta_{\text{exp}}$) and theoretical ($\delta_{\text{theo}}$) uncertainties, respectively. Here, $\delta_{\text{tot}}$ is the quadratic sum of the three components.

Summary of the measured values of fiducial $ d\sigma / d{m}$ (pb/GeV) (with no FSR correction applied) in the dimuon channel with the statistical ($\delta_{\text{stat}}$) and experimental ($\delta_{\text{exp}}$) uncertainties shown separately. Here, $\delta_{\text{tot}}$ is the quadratic sum of the two components.

of the measured values of fiducial $ d\sigma / d{m}$ (pb/GeV) (with no FSR correction applied) in the dielectron channel with the statistical ($\delta_{\text{stat}}$) and experimental ($\delta_{\text{exp}}$) uncertainties shown separately. Here, $\delta_{\text{tot}}$ is the quadratic sum of the two components.

Summary of the combined values of $ d\sigma / d{m}$ (pb/GeV) using the results from both the dimuon and dielectron channels. Here, $\delta_{\text{tot}}$ is the quadratic sum of the statistical, experimental and theoretical uncertainties.

Covariance matrix of the Drell-Yan differential cross section as a function of the dimuon invariant mass, measured in the full phase space, with FSR correction is applied. Luminosity uncertainty is not included in the covariance.

Covariance matrix of the Drell-Yan differential cross section as a function of the dielectron invariant mass, measured in the full phase space, with FSR correction is applied. Luminosity uncertainty is not included in the covariance.

Covariance matrix of the differential DY cross section measured for the combination of the two channels in the full phase space.

Lower mass exclusion limits for scalar and vector LQs.

Observed upper limits on the production cross section for pair production of LQs decaying into a top quark and a muon or bottom quark and a neutrino at 95% CL in the $M_{LQ} - B(LQ \rightarrow t\mu)$ plane.

Lower mass exclusion limits for scalar and vector LQs.

Double-differential cross section times the dimuon branching fraction of the Y(2S) meson for different ranges of pT in bins of |y| and for the full |y| < 1.2 range, for the unpolarized decay hypothesis. The global uncertainty in the integrated luminosity of 2.3% is not included in the systematic uncertainties.

Double-differential cross section times the dimuon branching fraction of the Y(3S) meson for different ranges of pT in bins of |y| and for the full |y| < 1.2 range, for the unpolarized decay hypothesis. The global uncertainty in the integrated luminosity of 2.3% is not included in the systematic uncertainties.

Multiplicative scaling factors to obtain the J/psi differential cross sections for different polarization scenarios (Lambda_{Theta} = +1, +0.10, -1) from the unpolarized cross section measurements given in Table 1.

Multiplicative scaling factors to obtain the psi(2S) differential cross sections for different polarization scenarios (Lambda_{Theta} = +1, +0.03, -1) from the unpolarized cross section measurements given in Table 2.

Multiplicative scaling factors to obtain the Y(1S) differential cross sections for different polarization scenarios (Lambda_{Theta} = +1, k, -1) from the unpolarized cross section measurements given in Table 3. The parameter k corresponds to a linear interpolation of the CMS measured value as a function of pT for pT < 50 GeV. For pT > 50 GeV, where no measurements exist, k is taken as the average of all the measured values for pT < 50 GeV.

Multiplicative scaling factors to obtain the Y(2S) differential cross sections for different polarization scenarios (Lambda_{Theta} = +1, k, -1) from the unpolarized cross section measurements given in Table 3. The parameter k corresponds to a linear interpolation of the CMS measured value as a function of pT for pT < 50 GeV. For pT > 50 GeV, where no measurements exist, k is taken as the average of all the measured values for pT < 50 GeV.

Multiplicative scaling factors to obtain the Y(3S) differential cross sections for different polarization scenarios (Lambda_{Theta} = +1, k, -1) from the unpolarized cross section measurements given in Table 3. The parameter k corresponds to a linear interpolation of the CMS measured value as a function of pT for pT < 50 GeV. For pT > 50 GeV, where no measurements exist, k is taken as the average of all the measured values for pT < 50 GeV.

Ratio of differential cross section times branching fractions of the prompt psi(2S) to J/psi mesons assuming unpolarized productions as a function of pT for |y| < 1.2.

Ratios of differential cross section times branching fractions of the prompt Y(2S) to Y(1S) and Y(3S) to Y(1S) mesons assuming unpolarized productions as a function of pT for |y| < 1.2.

The measured total Z cross section times the BR to 4l. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity and theortical sources, the second is theoretical uncertianty on the extrapolation from the selected region to the total phase space, the third is the luminosity uncertianty

The measured fiducial Z cross section times the BR to 4l. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity, the second is the luminosity uncertianty

The measured Z BR to 4l. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity and theortical sources, the second is theoretical uncertianty on the extrapolation from the selected region to the total phase space, the third is the luminosity uncertianty

Normalized ZZ fiducial cross section in bins of the reconstructed ZZ invariant massm4l. The first systematic uncertainty is detector systematics.

Normalized ZZ fiducial cross section in bins of the reconstructed ZZ pT. The first systematic uncertainty is detector systematics.

Normalized ZZ fiducial cross section in bins Z pT for all Z bosons. The first systematic uncertainty is detector systematics.

Normalized ZZ fiducial cross section in bins of the leading lepton pT. The first systematic uncertainty is detector systematics.

Normalized ZZ fiducial cross section in bins of the Delta phi between the two Z bosons. The first systematic uncertainty is detector systematics.

Normalized ZZ fiducial cross section in bins of the Delta R between the two Z bosons. The first systematic uncertainty is detector systematics.

Normalized 4l fiducial cross section in bins of the reconstructed four lepton invariant massm4l. The first systematic uncertainty is detector systematics.

aTGC limits on anomolous neutral gauge boson complings in ZZ events

The differential cross section measurement as a function of the transverse momentum of the second leading jet.

The differential cross section measurement as a function of the transverse momentum of the third leading jet.

The differential cross section measurement as a function of the transverse momentum of the fourth leading jet.

The differential cross section measurement as a function of the absolute value of the rapidity of the first leading jet.

The differential cross section measurement as a function of the absolute value of the rapidity of the second leading jet.

The differential cross section measurement as a function of the absolute value of the rapidity of the third leading jet.

The differential cross section measurement as a function of the absolute value of the rapidity of the fourth leading jet.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for events with one or more jets.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for events with two or more jets.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for events with three or more jets.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for events with four or more jets.

The differential cross section measurement as a function of the azimuthal angle separation between the first leading jet and the muon.

The differential cross section measurement as a function of the azimuthal angle separation between the second leading jet and the muon.

The differential cross section measurement as a function of the azimuthal angle separation between the third leading jet and the muon.

The differential cross section measurement as a function of the azimuthal angle separation between the fourth leading jet and the muon.

The differential cross section measurement as a function of DeltaR separation between the muon and the closest jet for events with one or more jets.

Full covariance matrix of the total energy spectrum.

Full covariance matrix of the electromagnetic energy spectrum.

Full covariance matrix of the hadronic energy spectrum.

A summary of benchmark simplified models, the most sensitive $n_{\mathrm{jet}}$ categories, and representative values for the corresponding experimental acceptance times efficiency ($\mathcal{A}\varepsilon$), the dominant systematic uncertainties, the theoretical production cross section ($\sigma_{\mathrm{theory}}$), and the expected and observed upper limits on the production cross section, expressed in terms of the signal strength parameter ($\mu$).

Summary of the mass limits obtained for the fourteen classes of simplified models. The limits indicate the strongest observed and expected (in parentheses) mass exclusions in $\tilde{g}$, $\tilde{q}$, $\tilde{b}$, $\tilde{t}$, and $\tilde{\chi}_1^0$. The quoted values have uncertainties of $\pm 25$ and $\pm 10$ GeV for models involving the pair production of, respectively, gluinos and squarks.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1qqqq model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1qqqq model. This line is the observed exclusion.

Covariance matrix for the SM background estimates obtained using the simplified binning scheme, determined from a simultaneous fit to data in the control regions only (CR-only fit). The uncertainties in the background estimates are correlated in such a way that the covariance is typically positive. Small positive values, as well as the few negative values, are not shown.

Correlation matrix for the SM background estimates obtained using the simplified binning scheme, determined from a simultaneous fit to data in the control regions only (CR-only fit).

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{q} } }, m_{\tilde{\chi}^0_1 })$ plane for the T2qq model. This line is the expected exclusion.

Observed data counts and "post-fit" background expectations based on the result of a combined fit to the signal region and multiple control regions under the SM-only hypothesis for the "monojet" event category. The rows labelled SM "pre-fit' show the background expectations when excluding the signal region from the fit. The uncertainties include statistical as well as systematic contributions.

Observed data counts and "post-fit" background expectations based on the result of a combined fit to the signal region and multiple control regions under the SM-only hypothesis for the "asymmetric" event categories. The rows labelled SM "pre-fit" show the background expectations when excluding the signal region from the fit. The uncertainties include statistical as well as systematic contributions.

Observed data counts and "post-fit" background expectations based on the result of a combined fit to the signal region and multiple control regions under the SM-only hypothesis for the "symmetric" event categories. The rows labelled SM "pre-fit" show the background expectations when excluding the signal region from the fit. The uncertainties include statistical as well as systematic contributions.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{q} } }, m_{\tilde{\chi}^0_1 })$ plane for the T2qq model. This line is the observed exclusion.

Summary of a simplified binning scheme comprising $H_{\mathrm{T}}^{\mathrm{miss}}$ shapes for eight representative event topologies, defined in terms of requirements on $n_{\mathrm{jet}}$ both symmetric and asymmetric categories) and $n_{\mathrm{b}}$. For each topology, event yields are integrated over the full $H_{\mathrm{T}}$ range, $H_{\mathrm{T}} > 200$ GeV, and are categorised according to eight bins in $H_{\mathrm{T}}^{\mathrm{miss}}$ -- $130 < H_{\mathrm{T}}^{\mathrm{miss}} < 200$ GeV, six bins 100 GeV wide in the region $200 < H_{\mathrm{T}}^{\mathrm{miss}} < 800$ GeV, and an open final bin, $H_{\mathrm{T}}^{\mathrm{miss}} > 800$ GeV. This categorisation scheme leads to 64 bins that are exclusive, contiguous, and provide complete coverage of the signal region. The corresponding SM background estimates for these 64 bins are obtained using the nominal likelihood model. The $H_{\mathrm{T}}^{\mathrm{miss}}$ template for each topology is determined from simulation and the normalisation for each template is given by an aggregate of estimates from several ($n_{\mathrm{jet}}$, $n_{\mathrm{b}}$, $H_{\mathrm{T}}$) bins, defined according to the nominal binning scheme.

Observed data yields and "CR-only fit" SM background expectations using the simplified binning scheme, as a function of topology and $H_{\mathrm{T}}^{\mathrm{miss}}$. The SM backgrounds are determined from a simultaneous fit to data in the control regions. The data yields in the signal region are masked and excluded from the fit. The uncertainties include statistical as well as systematic contributions.

Expected ($\mu_{\mathrm{exp}}$) and observed ($\mu_{\mathrm{obs}}$) upper limits on the production cross section, expressed in terms of the signal strength parameter, obtained using both the nominal and simplified binning schema. Comparable values are obtained from the two schema for these benchmark SUSY models because the signal events typically populate bins at high values of $H_{\mathrm{T}}$ and $H_{\mathrm{T}}^{\mathrm{miss}}$ and so are at or near the limit of the search sensitivity. Larger differences in $\mu$ can be observed for models that populate the core of these distributions.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1bbbb model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1bbbb model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1tttt model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1tttt model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1ttbb model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1qqqq model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1ttbb model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1qqqq model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1qqqq model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5tttt_DM175 model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1qqqq model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{q} } }, m_{\tilde{\chi}^0_1 })$ plane for the T2qq model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{q} } }, m_{\tilde{\chi}^0_1 })$ plane for the T2qq model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5tttt_DM175 model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{q} } }, m_{\tilde{\chi}^0_1 })$ plane for the T2qq model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{q} } }, m_{\tilde{\chi}^0_1 })$ plane for the T2qq model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1bbbb model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5ttcc model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1bbbb model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1bbbb model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1bbbb model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5ttcc model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1tttt model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1tttt model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1tttt model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ b } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bb model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1tttt model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1ttbb model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1ttbb model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ b } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bb model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1ttbb model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1ttbb model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5tttt_DM175 model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tb model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5tttt_DM175 model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5tttt_DM175 model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5tttt_DM175 model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tb model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5ttcc model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5ttcc model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5ttcc model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5ttcc model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ b } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bb model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ b } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bb model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ b } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bb model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ b } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bb model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tb model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2cc model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tb model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tb model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tb model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2cc model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt_degen model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2cc model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2cc model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt_degen model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2cc model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2cc model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt_degen model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2_mixed model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt_degen model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt_degen model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt_degen model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2_mixed model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2_mixed model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2_mixed model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2_mixed model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bW model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2_mixed model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bW model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bW model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bW model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bW model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bW model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Ratios of B+ differential production cross sections at 13 TeV and at 7 TeV as a function of |yB| for 10 < ptB < 100 GeV or 17 < ptB < 100 GeV. The calculations from FONLL and PYTHIA are provided as well.

B+ differential production cross sections DSIG/DPT for |yB|< 1.45 or |yB|< 2.1, at 13 TeV. The calculations from FONLL and PYTHIA are provided.

B+ differential production cross sections DSIG/DETARAP for 10 < ptB < 100 GeV or 17 < ptB < 100 GeV, at 13 TeV. The calculations from FONLL and PYTHIA are provided.

B+ production cross section for the phase-space region of 10 <= pTB < 17 GeV and |yB| < 1.45, and 17 <= pTB < 100 GeV and |yB| < 2.1. The calculations from FONLL and PYTHIA are provided.

The (Z to l+l-l'+l'-) branching ratio. The first systematic uncertainty is detector systematics, the second is theoretical uncertainty, and the third is luminosity uncertainty. The theoretical prediction is from MadGraph5_aMC@NLO.

The total (P P to Z Z) cross section. The first systematic uncertainty is detector systematics, the second is theoretical uncertainty, and the third is luminosity uncertainty. The theoretical predictions are MATRIX generated at NNLO and POWHEG generated at NLO plus the gluon-gluon initial state contribution from MCFM. Both use NNPDF3.0 PDFs and fixed scales mu_F = mu_R = 0.5m[l+l-l'+l'-].

The second-order Fourier coefficients, $V_{3\Delta}(2, |\Delta\eta| > 2)$, as a function of $N_{offline}^{trk}$ for charged particles, after correcting for back-to-back jet correlations, estimated from the 10 $\leq$ $N_{offline}^{trk}$ < 20 range.

The elliptic flow after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of $N_{offline}^{trk}$ for charged particles.

The elliptic flow after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of $N_{offline}^{trk}$ for charged particles.

The elliptic flow after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of $N_{offline}^{trk}$ for charged particles.

The triangular flow after correcting for back-to-back jet correlations, $v_{3}^{sub}(2, |\Delta\eta| > 2)$, as a function of $N_{offline}^{trk}$ for charged particles.

The triangular flow after correcting for back-to-back jet correlations, $v_{3}^{sub}(2, |\Delta\eta| > 2)$, as a function of $N_{offline}^{trk}$ for charged particles.

The triangular flow after correcting for back-to-back jet correlations, $v_{3}^{sub}(2, |\Delta\eta| > 2)$, as a function of $N_{offline}^{trk}$ for charged particles.

The elliptic flow, $v_{2}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for charged particles.

The elliptic flow, $v_{2}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for charged particles.

The elliptic flow, $v_{2}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for charged particles.

The elliptic flow after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for charged particles.

The elliptic flow after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for charged particles.

The elliptic flow after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for charged particles.

The elliptic flow, $v_{2}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for charged particles.

The elliptic flow, $v_{2}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for $K^{0}_{S}$.

The elliptic flow, $v_{2}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for $\Lambda/\bar{\Lambda}$.

The elliptic flow, $v_{2}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for charged particles.

The elliptic flow, $v_{2}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for $K^{0}_{S}$.

The elliptic flow, $v_{2}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for $\Lambda/\bar{\Lambda}$.

The elliptic flow after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for charged particles.

The elliptic flow after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for $K^{0}_{S}$.

The elliptic flow after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for $\Lambda/\bar{\Lambda}$.

The elliptic flow per constituent quark after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)/n_{q}$, as a function of transverse kinetic energy per constituent quark $KE_{T}/n_{q}$ for $K^{0}_{S}$.

The elliptic flow per constituent quark after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of transverse kinetic energy per constituent quark $KE_{T}/n_{q}$ for $\Lambda/\bar{\Lambda}$.

The four-particle cumulant, $c_{2}(4)$, as a function of $N_{offline}^{trk}$ for charged particles.

The four-particle cumulant, $c_{2}(4)$, as a function of $N_{offline}^{trk}$ for charged particles.

The four-particle cumulant, $c_{2}(4)$, as a function of $N_{offline}^{trk}$ for charged particles.

The six-particle cumulant, $c_{2}(6)$, as a function of $N_{offline}^{trk}$ for charged particles.

The elliptic flow after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of $N_{offline}^{trk}$ for charged particles.

The elliptic flow, $v_{2}(4)$, as a function of $N_{offline}^{trk}$ for charged particles.

The elliptic flow, $v_{2}(6)$, as a function of $N_{offline}^{trk}$ for charged particles.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the observed limit on the corresponding SUSY particle masses obtained by comparing the excluded cross section with theoretical cross sections.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the observed limit on the corresponding SUSY particle masses obtained by comparing the excluded cross section with $+1\sigma$ theoretical cross sections.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the observed limit on the corresponding SUSY particle masses obtained by comparing the excluded cross section with $-1\sigma$ theoretical cross sections.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the expected limit on the corresponding SUSY particle masses obtained by comparing the excluded cross section with theoretical cross sections.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the expected limit on the corresponding SUSY particle masses corresponding to a $+1\sigma$ variation of the experimental uncertainty.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the expected limit on the corresponding SUSY particle masses corresponding to a $-1\sigma$ variation of the experimental uncertainty.

Observed excluded region (95\% CL), shown in blue, in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane for a model combining T5tttt, gluino pair production, followed by gluino decay to an on-shell top squark, together with a model for direct top squark pair production. The top squarks decay via the two-body process $\tilde{t}\rightarrow t\tilde{\chi}^0_1$. The neutralino and top squark masses are related by the constraint $m_{\tilde{t}} = m_{\tilde{\chi}^0_1} + 175$ GeV.

Expected excluded region (95\% CL), shown in blue, in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane for a model combining T5tttt, gluino pair production, followed by gluino decay to an on-shell top squark, together with a model for direct top squark pair production. The top squarks decay via the two-body process $\tilde{t}\rightarrow t\tilde{\chi}^0_1$. The neutralino and top squark masses are related by the constraint $m_{\tilde{t}} = m_{\tilde{\chi}^0_1} + 175$ GeV.

Inclusive Jet Cross Section for |rapidity| 1.5 TO 2.0 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.7). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 2.0 TO 2.5 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.7). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 2.5 TO 3.0 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.7). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 3.2 TO 4.7 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.7). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| < 0.5 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.4). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 0.5 TO 1.0 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.4). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 1.0 TO 1.5 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.4). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 1.5 TO 2.0 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.4). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 2.0 TO 2.5 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.4). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 2.5 TO 3.0 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.4). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 3.2 TO 4.7 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.4). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and $N_{offline}^{trk}<$ 35 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and $N_{offline}^{trk}<$ 35 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and $N_{offline}^{trk}<$ 35 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and $N_{offline}^{trk}<$ 35 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and $N_{offline}^{trk}<$ 35 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 80 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 90 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 80 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 90 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 80 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 90 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 80 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 90 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and 80 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and 90 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and 80 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and 90 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and 80 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and 90 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and 80 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and 90 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and $N_{offline}^{trk}>$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and $N_{offline}^{trk}>$ 110 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and $N_{offline}^{trk}>$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and $N_{offline}^{trk}>$ 110 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and $N_{offline}^{trk}>$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and $N_{offline}^{trk}>$ 110 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and $N_{offline}^{trk}>$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and $N_{offline}^{trk}>$ 110 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 and integrated over the region $|\Delta\Phi| < \Delta\Phi_{ZYAM}$ for pp data at $\sqrt{s} =$ 13 $TeV$. The associated yield as a function of $p_{T}$ for events with $N^{offline}_{trk} \geq$ 105. The $p_{T}$ value for each $p_{T}$ bin is the average $p_{T}$ value.

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 for pp data at $\sqrt{s} =$ 7 $TeV$. The associated yield as a function of $p_{T}$ for events with $N^{offline}_{trk} \geq$ 110. The $p_{T}$ value for each $p_{T}$ bin is the average $p_{T}$ value.

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 and integrated over the region $|\Delta\Phi| < \Delta\Phi_{ZYAM}$ for pp data at $\sqrt{s} =$ 13 $TeV$. The associated yield as a function of $N_{trk}^{offline}$ for events with 1.0 $< p_{T} <$ 2.0 GeV/c. The $N_{trk}^{offline}$ value for each $N_{trk}^{offline}$ bin is the average $N_{trk}^{offline}$ value.

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 for pp data at $\sqrt{s} =$ 7 $TeV$. The associated yield as a function of $N_{trk}^{offline}$ for events with 1.0 $< p_{T} <$ 2.0 GeV/c. The $N_{trk}^{offline}$ value for each $N_{trk}^{offline}$ bin is the average $N_{trk}^{offline}$ value.

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 pPb data at $\sqrt{s} =$ 5.02 $TeV$. The associated yield as a function of $N_{trk}^{offline}$ for events with 1.0 $< p_{T} <$ 2.0 GeV/c. The $N_{trk}^{offline}$ value for each $N_{trk}^{offline}$ bin is the average $N_{trk}^{offline}$ value.

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 PbPb data at $\sqrt{s} =$ 2.76 $TeV$. The associated yield as a function of $N_{trk}^{offline}$ for events with 1.0 $< p_{T} <$ 2.0 GeV/c. The $N_{trk}^{offline}$ value for each $N_{trk}^{offline}$ bin is the average $N_{trk}^{offline}$ value.