The measured fiducial cross section vs $m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $\Delta\phi(ll,\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}/m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The $L_{T}$ distribution in the MisID-enriched region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L below-Z signal region. The last bin contains the overflow events.

The $M_{T}$ distribution in the 3L on-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L above-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF1 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF2 signal region. The last bin contains the overflow events.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The 95% confidence level exclusion limits for the flavor-democratic scenario on the total production cross section of heavy fermion pairs.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(PS).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(PS).

Product of the fiducial acceptance and the event selection efficiency for the type-III Seesaw signal model at various signal mass hypotheses calculated after all analysis selection requirements.

Product of the fiducial acceptance and the event selection efficiency for the tt$\phi$ signal models at various signal mass hypotheses calculated after all analysis selection requirements.

The 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for dijet resonances decaying to quark-quark. Limits are compared to predicted cross sections for axigluons, colorons, scalar diquarks, new gauge bosons W' and Z' with SM-like couplings and dark matter mediators.

The 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for dijet resonances decaying to quark-gluon. Limits are compared to predicted cross sections for string resonances and excited quarks.

The 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for dijet resonances decaying to gluon-gluon. Limits are compared to predicted cross section for color-octet scalars.

The 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for Randall–Sundrum gravitons. Limits are compared to the predicted cross section.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for spin-2 resonances produced and decaying in the quark-quark channel, shown for various values of intrinsic width as a function of resonance mass.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for spin-2 resonances produced and decaying in the gluon-gluon channel, shown for various values of intrinsic width as a function of resonance mass.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for spin-1 resonances produced and decaying in the quark-quark channel, shown for various values of intrinsic width as a function of resonance mass.

The rho distributions for the mixed-flavour category events corresponding to a signal hypothesis with mH = 261 GeV and mA = 150 GeV.

The rho distributions for the same-flavour category events corresponding to a signal hypothesis with mH = 442 GeV and mA = 193 GeV. The signal is normalised to its theoretical cross section.

The rho distributions for the mixed-flavour category events corresponding to a signal hypothesis with mH = 442 GeV and mA = 193 GeV.

Expected and observed 95% CL upper limits on the product of the production cross section and branching fraction for H(A) -> ZA(H) -> bbbar as a function of mA and mH. The limits are computed using the asymptotic CLs method, combining the ee and μμ channels.

Expected and observed 95% CL upper limits on the signal strength for the Type-II 2HDM benchmark (tan(beta)=1.5, cos(beta-alpha)=0.01) as a function of mA and mH . The limits are computed using the asymptotic CLs method, combining the ee and μμ channels.

Expected and observed 95% CL upper limits on the signal strength for the Type-II 2HDM benchmark (mH = 379 GeV and m A = 172 GeV) as a function of tan(beta) and cos(beta-alpha). The limits are computed using the asymptotic CLs method, combining the ee and μμ channels.

P-value for H(A) -> ZA(H) -> bbbar production as a function of mA and mH. The limits are computed using the asymptotic CLs method, combining the ee and μμ channels.

The covariance matrix containing the experimental uncertainties of Figure 2a is shown.

The covariance matrix containing the model uncertainties of Figure 2a is shown.

The covariance matrix containing the statistical uncertainties of Figure 2b is shown.

The covariance matrix containing the experimental uncertainties of Figure 2b is shown.

The covariance matrix containing the model uncertainties of Figure 2b is shown.

Differential production cross-sections of $\eta_c$ for production in $b$-hadron inclusive decays. The uncertainties are statistical, systematic, and due to the $\eta_c\to p \bar{p}$ and $J/\psi\to p \bar{p}$ branching fractions and $J/\psi$ production cross-section.

K$^{*0}$ transverse momentum spectrum - V0M multiplicity class IV+V, average of particle and antiparticle

K$^{*0}$ transverse momentum spectrum - V0M multiplicity class VI, average of particle and antiparticle

K$^{*0}$ transverse momentum spectrum - V0M multiplicity class VII, average of particle and antiparticle

K$^{*0}$ transverse momentum spectrum - V0M multiplicity class VIII, average of particle and antiparticle

K$^{*0}$ transverse momentum spectrum - V0M multiplicity class IX, average of particle and antiparticle

K$^{*0}$ transverse momentum spectrum - V0M multiplicity class X, average of particle and antiparticle

K$^{*0}$ transverse momentum spectrum ratio to INEL>0 - V0M multiplicity class I

K$^{*0}$ transverse momentum spectrum ratio to INEL>0 - V0M multiplicity class II

K$^{*0}$ transverse momentum spectrum ratio to INEL>0 - V0M multiplicity class III

K$^{*0}$ transverse momentum spectrum ratio to INEL>0 - V0M multiplicity class IV+V

K$^{*0}$ transverse momentum spectrum ratio to INEL>0 - V0M multiplicity class VI

K$^{*0}$ transverse momentum spectrum ratio to INEL>0 - V0M multiplicity class VII

K$^{*0}$ transverse momentum spectrum ratio to INEL>0 - V0M multiplicity class VIII

K$^{*0}$ transverse momentum spectrum ratio to INEL>0 - V0M multiplicity class IX

K$^{*0}$ transverse momentum spectrum ratio to INEL>0 - V0M multiplicity class X

$\phi$ transverse momentum spectrum - V0M multiplicity class I

$\phi$ transverse momentum spectrum - V0M multiplicity class II

$\phi$ transverse momentum spectrum - V0M multiplicity class III

$\phi$ transverse momentum spectrum - V0M multiplicity class IV

$\phi$ transverse momentum spectrum - V0M multiplicity class V

$\phi$ transverse momentum spectrum - V0M multiplicity class VI

$\phi$ transverse momentum spectrum - V0M multiplicity class VII

$\phi$ transverse momentum spectrum - V0M multiplicity class VIII

$\phi$ transverse momentum spectrum - V0M multiplicity class IX

$\phi$ transverse momentum spectrum - V0M multiplicity class X

$\phi$ transverse momentum spectrum ratio to INEL>0 - V0M multiplicity class I

$\phi$ transverse momentum spectrum ratio to INEL>0 - V0M multiplicity class II

$\phi$ transverse momentum spectrum ratio to INEL>0 - V0M multiplicity class III

$\phi$ transverse momentum spectrum ratio to INEL>0 - V0M multiplicity class IV

$\phi$ transverse momentum spectrum ratio to INEL>0 - V0M multiplicity class V

$\phi$ transverse momentum spectrum ratio to INEL>0 - V0M multiplicity class VI

$\phi$ transverse momentum spectrum ratio to INEL>0 - V0M multiplicity class VII

$\phi$ transverse momentum spectrum ratio to INEL>0 - V0M multiplicity class VIII

$\phi$ transverse momentum spectrum ratio to INEL>0 - V0M multiplicity class IX

$\phi$ transverse momentum spectrum ratio to INEL>0 - V0M multiplicity class X

K$^{*0}$ average transverse momentum vs multiplicity - V0M multiplicity classes

$\phi$ average transverse momentum vs multiplicity - V0M multiplicity classes

K$^{*0}$ transverse momentum integrated yield vs multiplicity - V0M multiplicity classes, average of particle and antiparticle

$\phi$ transverse momentum integrated yield vs multiplicity - V0M multiplicity classes

K$^{*0}$/K$_{\mathrm{S}}^{0}$ transverse momentum integrated yield ratio vs multiplicity - V0M multiplicity classes, average of particle and antiparticle

$\phi$/K$_{\mathrm{S}}^{0}$ transverse momentum integrated yield ratio vs multiplicity - V0M multiplicity classes

$(\Xi^{-} + \bar{\Xi}^{+})$/$\phi$ transverse momentum integrated yield ratio vs multiplicity - V0M multiplicity classes

$\phi$/$(\pi^{+} + \pi^{-})$ transverse momentum integrated yield ratio vs multiplicity - V0M multiplicity classes

K$^{*0}$/K$_{\mathrm{S}}^{0}$ yield ratio vs transverse momentum - V0M multiplicity class II, average of particle and antiparticle

K$^{*0}$/K$_{\mathrm{S}}^{0}$ yield ratio vs transverse momentum - V0M multiplicity class X, average of particle and antiparticle

$\phi$/K$_{\mathrm{S}}^{0}$ yield ratio vs transverse momentum - V0M multiplicity class II

$\phi$/K$_{\mathrm{S}}^{0}$ yield ratio vs transverse momentum - V0M multiplicity class X

K$^{*0}$/K$_{\mathrm{S}}^{0}$ double yield ratio vs transverse momentum - V0M multiplicity class II / V0M multiplicity class X, average of particle and antiparticle

$\phi$/K$_{\mathrm{S}}^{0}$ double yield ratio vs transverse momentum - V0M multiplicity class II / V0M multiplicity class X

Significance of K$^{*0}$/K$_{\mathrm{S}}^{0}$ double yield ratio vs transverse momentum - V0M multiplicity class II / V0M multiplicity class X

Significance of $\phi$/K$_{\mathrm{S}}^{0}$ double yield ratio vs transverse momentum - V0M multiplicity class II / V0M multiplicity class X

($\rm{K}^{*0}$+$\bar{\rm{K}}^{*0}$)/(K$^{+}$+K$^{-}$) transverse momentum integrated yield ratio vs multiplicity - V0M multiplicity classes

($\rm{K}^{*0}$+$\bar{\rm{K}}^{*0}$)/($\pi^{+}$+$\pi^{-}$) transverse momentum integrated yield ratio vs multiplicity - V0M multiplicity classes

2$\phi$/(K$^{+}$+K$^{-}$) transverse momentum integrated yield ratio vs multiplicity - V0M multiplicity classes

$\phi$/($\rm{P}$ + $\bar{\rm{P}}$) transverse momentum integrated yield ratio vs multiplicity - V0M multiplicity classes

$\phi$/$(\Lambda~+~\bar{\Lambda})$ transverse momentum integrated yield ratio vs multiplicity - V0M multiplicity classes

$(\Omega^{-}~+~\bar{\Omega}^{+})$/$\phi$ transverse momentum integrated yield ratio vs multiplicity - V0M multiplicity classes

Fig. A1: Number density $N_{ch}$ (left) and $\\Sigma p_{T}$ (right) distributions as a function of pleadingT and the comparisons to MC predictions in Toward (top), Transverse (middle), and Away (bottom) regions for $p_{T}^{track} >$ 0.5 GeV/$c$. The shaded areas in the upper panels represent the systematic uncertainties and vertical error bars indicate statistical uncertainties. In the lower panels, the shaded areas are the sum in quadrature of statistical and systematic uncertainties from the upper panels. No uncertainties are given for the MC calculations.

Fig. A2: Number density $N_{ch}$ (left) and $\\Sigma p_{T}$ (right) distributions as a function of pleadingT and the comparisons to MC predictions in Toward (top), Transverse (middle), and Away (bottom) regions for $p_{T}^{track} >$ 1.0 GeV/$c$. The shaded areas in the upper panels represent the systematic uncertainties and vertical error bars indicate statistical uncertainties. In the lower panels, the shaded areas are the sum in quadrature of statistical and systematic uncertainties from the upper panels. No uncertainties are given for the MC calculations.