Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $p_T$.

The inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $|y|$.

The inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $y_{\text{boost}}(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $y_{\text{boost}}(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta y(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta y(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta\phi(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta\phi(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta R(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta R(Z,b)$.

The cross-section $\sigma(Zb)$ as a function of $Z$ boson $p_T$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zb)$ as a function of $Z$ boson $p_T$.

The cross-section $\sigma(Zb)$ as a function of $Z$ boson $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zb)$ as a function of $Z$ boson $|y|$.

Integrated $Z+\ge 2$ $b$-jets cross-section.

Breakdown of systematic uncertainties (in %) for the integrated $Z+\ge 2$ $b$-jets cross-section.

The cross-section $\sigma(Zbb)$ as a function of $\Delta R(b,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $\Delta R(b,b)$.

The cross-section $\sigma(Zbb)$ as a function of $\Delta m(b,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $\Delta m(b,b)$.

The cross-section $\sigma(Zbb)$ as a function of $Z$ boson $p_T$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $Z$ boson $p_T$.

The cross-section $\sigma(Zbb)$ as a function of $Z$ boson $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $Z$ boson $|y|$.

Measurement of the $t\overline{t}$ cross-section as a function of the jet multiplicity for jets with $p_{\mathrm{T}}$ larger than 80 GeV. The uncertainties given correspond to the individual contributions of each source of systematic uncertainty as described in the paper.

Measurement of the $t\overline{t}$ cross-section as a function of the transverse momentum of the leading jet in $t\overline{t}$ events. The uncertainties given correspond to the individual contributions of each source of systematic uncertainty as described in the paper.

Measurement of the $t\overline{t}$ cross-section as a function of the transverse momentum of the 2nd leading jet in $t\overline{t}$ events. The uncertainties given correspond to the individual contributions of each source of systematic uncertainty as described in the paper.

Measurement of the $t\overline{t}$ cross-section as a function of the transverse momentum of the 3rd leading jet in $t\overline{t}$ events. The uncertainties given correspond to the individual contributions of each source of systematic uncertainty as described in the paper.

Measurement of the $t\overline{t}$ cross-section as a function of the transverse momentum of the 4th leading jet in $t\overline{t}$ events. The uncertainties given correspond to the individual contributions of each source of systematic uncertainty as described in the paper.

Measurement of the $t\overline{t}$ cross-section as a function of the transverse momentum of the 5th leading jet in $t\overline{t}$ events. The uncertainties given correspond to the individual contributions of each source of systematic uncertainty as described in the paper.

Parametrization factors for the $m_{t}$ dependence [see Eq. (4) in the paper] of $\sigma(tq)$, $\sigma(\bar tq)$, and $\sigma(t q+\bar t q)$.

The value of $|V_{tb}|^{2}$ is extracted by dividing the measured value of $\sigma(t q+\bar t q)$ by the prediction of the approximate NNLO calculation. The experimental and theoretical uncertainties are added in quadrature.

Event yields for the 2-jet-$\ell^{+}$ and 2-jet-$\ell^{-}$ HPR channels. The expectation for the signal and background yields correspond to the result of the binned maximum-likelihood fit described in Sec. $\mathrm{VI~D}$ in the paper. The uncertainty of the expectations is the normalization uncertainty of each process after the fit, as described in Sec. $\mathrm{VII~F}$ in the paper.

Migration matrix relating the parton level $p_{\mathrm{T}}(t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-quark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $p_{\mathrm{T}}(\bar t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-antiquark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $|y(t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-quark $|y|$ distribution.

Migration matrix relating the parton level $|y(\bar t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-antiquark $|y|$ distribution.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Comparison between the measured differential cross sections and the predictions from the NLO calculation using the MSTW2008 PDF set. For each variable and prediction a $\chi^{2}$ value is calculated with HERAfitter using the covariance matrix of each measured spectrum. The theory uncertainties of the predictions are treated as uncorrelated. The number of degrees of freedom (NDF) is equal to the number of bins in the measured spectrum.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, mistag efficiency, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The JES $\eta$ intercalibration uncertainty has a sign switch from the first to the second bin. For the $tq$ generator $+$ parton shower uncertainty a sign switch is denoted with $\mp$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $c-$tagging efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content $:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet energy resolution, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$ tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the differential cross section as a function of $|y(\bar t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(\bar t)|$.

Transverse $\langle N_\text{ch} / \delta\eta\,\delta\phi \rangle$ vs. $p_T^\text{lead}$ in $|\eta| < 2.5$ in incl jet / excl dijet events.

Trans-max $\langle N_\text{ch} / \delta\eta\,\delta\phi \rangle$ vs. $p_T^\text{lead}$ in $|\eta| < 2.5$ in incl jet / excl dijet events.

Trans-min $\langle N_\text{ch} / \delta\eta\,\delta\phi \rangle$ vs. $p_T^\text{lead}$ in $|\eta| < 2.5$ in incl jet / excl dijet events.

Transverse $\langle \sum E_T^\text{ch+neut} / \delta\eta\,\delta\phi \rangle$ vs. $p_T^\text{lead}$ in $|\eta| < 2.5$ in incl jet / excl dijet events.

Transverse $\langle \sum E_T^\text{ch+neut} / \delta\eta\,\delta\phi \rangle$ vs. $p_T^\text{lead}$ in $|\eta| < 4.8$ in incl jet / excl dijet events.

Transverse $\langle \sum p_T^\text{ch} / \sum E_T^\text{ch+neut} \rangle$ vs. $p_T^\text{lead}$ in $|\eta| < 2.5$ in incl jet / excl dijet events.

Transverse $\langle \text{mean}~p_T^\text{ch} \rangle$ vs. $p_T^\text{lead}$ in $|\eta| < 2.5$ in incl jet / excl dijet events.

Transverse $\langle \text{mean}~p_T^\text{ch} \rangle$ vs. $N_\text{ch}$ in $|\eta| < 2.5$ in incl jet events.

Transverse $\langle \text{mean}~p_T^\text{ch} \rangle$ vs. $N_\text{ch}$ in $|\eta| < 2.5$ in excl dijet events.

Transverse $\sum p_T^\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} > 20\;\text{GeV}$ in incl jet / excl dijet events.

Trans-max $\sum p_T^\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} > 20\;\text{GeV}$ in incl jet / excl dijet events.

Trans-min $\sum p_T^\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} > 20\;\text{GeV}$ in incl jet / excl dijet events.

Transverse $\sum p_T^\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} \in [20, 60]\;\text{GeV}$ in incl jet / excl dijet events.

Trans-max $\sum p_T^\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} \in [20, 60]\;\text{GeV}$ in incl jet / excl dijet events.

Trans-min $\sum p_T^\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} \in [20, 60]\;\text{GeV}$ in incl jet / excl dijet events.

Transverse $\sum p_T^\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} \in [60,210]\;\text{GeV}$ in incl jet / excl dijet events.

Trans-max $\sum p_T^\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} \in [60,210]\;\text{GeV}$ in incl jet / excl dijet events.

Trans-min $\sum p_T^\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} \in [60,210]\;\text{GeV}$ in incl jet / excl dijet events.

Transverse $\sum p_T^\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} > 210\;\text{GeV}$ in incl jet / excl dijet events.

Trans-max $\sum p_T^\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} > 210\;\text{GeV}$ in incl jet / excl dijet events.

Trans-min $\sum p_T^\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} > 210\;\text{GeV}$ in incl jet / excl dijet events.

Transverse $N_\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} > 20\;\text{GeV}$ in incl jet / excl dijet events.

Trans-max $N_\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} > 20\;\text{GeV}$ in incl jet / excl dijet events.

Trans-min $N_\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} > 20\;\text{GeV}$ in incl jet / excl dijet events.

Transverse $N_\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} \in [20, 60]\;\text{GeV}$ in incl jet / excl dijet events.

Trans-max $N_\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} \in [20, 60]\;\text{GeV}$ in incl jet / excl dijet events.

Trans-min $N_\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} \in [20, 60]\;\text{GeV}$ in incl jet / excl dijet events.

Transverse $N_\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} \in [60,210]\;\text{GeV}$ in incl jet / excl dijet events.

Trans-max $N_\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} \in [60,210]\;\text{GeV}$ in incl jet / excl dijet events.

Trans-min $N_\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} \in [60,210]\;\text{GeV}$ in incl jet / excl dijet events.

Transverse $N_\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} > 210\;\text{GeV}$ in incl jet / excl dijet events.

Trans-max $N_\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} > 210\;\text{GeV}$ in incl jet / excl dijet events.

Trans-min $N_\text{ch}$ in $|\eta| < 2.5$, $p_T^\text{lead} > 210\;\text{GeV}$ in incl jet / excl dijet events.

Differential cross-section for non-prompt chi_c2 production, measured in bins of J/psi pT, assuming unpolarised chi_c production. The measurements are not corrected for the branching fractions of the decays chi_c --> J/psi + gamma and J/psi --> mu+ mu-. The uncertainty envelope associated with the unknown chi_c spin alignment is also shown.

Differential cross-section for prompt chi_c1 production, measured in bins of chi_c1 pT, assuming unpolarised chi_c production. The measurements are not corrected for the branching fractions of the decays chi_c --> J/psi + gamma and J/psi --> mu+ mu-. The uncertainty envelope associated with the unknown chi_c spin alignment is also shown.

Differential cross-section for prompt chi_c2 production, measured in bins of chi_c2 pT, assuming unpolarised chi_c production. The measurements are not corrected for the branching fractions of the decays chi_c --> J/psi + gamma and J/psi --> mu+ mu-. The uncertainty envelope associated with the unknown chi_c spin alignment is also shown.

Differential cross-section for non-prompt chi_c1 production, measured in bins of chi_c1 pT, assuming unpolarised chi_c production. The measurements are not corrected for the branching fractions of the decays chi_c --> J/psi + gamma and J/psi --> mu+ mu-. The uncertainty envelope associated with the unknown chi_c spin alignment is also shown.

Differential cross-section for non-prompt chi_c2 production, measured in bins of chi_c2 pT, assuming unpolarised chi_c production. The measurements are not corrected for the branching fractions of the decays chi_c --> J/psi + gamma and J/psi --> mu+ mu-. The uncertainty envelope associated with the unknown chi_c spin alignment is also shown.

Fraction of prompt J/psi produced in feed-down from radiative chi_c decays as a function of J/psi pT, assuming unpolarised chi_c production. The uncertainty envelope associated with the unknown chi_c spin alignment is also shown. The spin-alignment envelope assumes that prompt J/psi are produced unpolarised and represents the maximum uncertainty due to the unknown chi_c spin alignment.

Production rate of prompt chi_c2 relative to prompt chi_c1, measured in bins of J/psi pT, assuming unpolarised chi_c production. The ratio is not corrected for the branching fractions of chi_c1 and chi_c2 into J/psi gamma. The uncertainty envelope associated with the unknown chi_c spin alignment is also shown.

Production rate of non-prompt chi_c2 relative to non-prompt chi_c1, measured in bins of J/psi pT, assuming unpolarised chi_c production. The ratio is not corrected for the branching fractions of chi_c1 and chi_c2 into J/psi gamma. The uncertainty envelope associated with the unknown chi_c spin alignment is also shown.

Fraction of chi_c1 produced in b-hadron decays as a function of chi_c1 pT, assuming unpolarised chi_c production. The uncertainty envelope associated with the unknown chi_c spin alignment is also shown.

Fraction of chi_c2 produced in b-hadron decays as a function of chi_c2 pT, assuming unpolarised chi_c production. The uncertainty envelope associated with the unknown chi_c spin alignment is also shown.

The systematic uncertainties for the nominal muon-channel cross-section measurement. Some sources of uncertainty have both correlated and uncorrelated components. Correlated uncertainties arise from the uncertainty in the electroweak background contributions delta(e.w.)_cor, from corrections to the Monte Carlo modelling of the Z/gamma* pT spectra, and from the reconstruction, trigger and isolation efficiency corrections, given by delta(reco)_cor, delta(trig)_cor and delta(iso)_cor respectively. The uncertainty on the multijet and electroweak background cross sections, given by delta(multijet and delta(e.w.), respectively and muon momentum scale uncertainty, delta(pT_scale) are also correlated. Uncorrelated uncertainties are due to corrections for the trigger and isolation efficiencies, given by delta(trig)_unc and delta(iso)_unc respectively. The uncertainty from the muon resolution correction, delta(res), from the size of the signal Monte Carlo sample, delta(MC), and the uncertaintities due to corrections for the reconstruction, delta(reco)_unc, are also uncorrelated. The luminosity uncertainty 1.8% is not included.

The combined Born-level fiducial differential cross section dsigma/dm_ll, statistical delta(stat), total correlated delta(cor), uncorrelated delta(unc), and total delta(total) uncertainties, as well as individual correlated sources delta(cor)_i. The correlated uncertainties are a linear combination of the 13 correlated uncertainties in the nominal muon and electron channels. As the uncertainties on the combined result no longer originate from individual error sources they are numbered 1-13. Also shown is the correction factor used to derive the dressed cross section (D), and the NNLO extrapolation factor (A) used to derive the cross section for the full phase space, along with the uncertainties associated to variations in scale choice delta(A)_scale, and PDF uncertainty delta(A)_pdf_alpha_s. The luminosity uncertainty 1.8% is not included.

The extended muon channel Born-level fiducial differential cross section dsigma/dm_ll, with the statistical delta(stat), systematic delta(syst), and total delta(tot) uncertainties for each invariant mass bin. Also shown is the correction factor used to derive the dressed cross section (D), and the extrapolation factor (A) used to derive the cross section for the full phase space, along with the uncertainties associated to variations in scale delta(A)_scale, and PDF uncertainty delta(A)_pdf_alpha_s. The luminosity uncertainty 3.5% is not included.

The systematic uncertainties for the extended muon channel cross-section measurement in each invariant mass bin. Correlated uncertainties come from the reconstruction, trigger and isolation efficiency corrections, given by delta(reco), delta(trig) and delta(iso) respectively. The uncertainty on the multijet background cross section, delta(multijet) and the uncertainty on the muon momentum scale, delta(pT_scale), are also correlated across bins. Uncorrelated uncertainties are due to the uncertainty from the muon resolution correction, delta(res), and the sample size of the signal Monte Carlo sample, delta(MC). The luminosity uncertainty 3.5% is not included.

Theory predictions for NLO+LLPS and for fixed-order calculations at NLO and NNLO including higher-order electroweak corrections, for the nominal analysis of the differential cross section dsigma/dm_ll as a function of the invariant mass m_ll. The scale uncertainty is defined as the envelope of variations for 0.5< mu_R,mu_F<2.0 for Powheg. For Fewz the scale uncertainty is defined by the variation 0.5<mu_R=mu_F<2.0. The uncertainty labelled as "stat" in the table corresponds to the pdf+alpha_s uncertainty for Fewz or just the pdf uncertainty for Powheg.

Theory predictions for NLO+LLPS and for fixed-order calculations at NLO and NNLO including higher-order electroweak corrections, for the extended analysis of the differential cross section dsigma/dm_ll as a function of the invariant mass m_ll. The scale uncertainty is defined as the envelope of variations for 0.5<mu_R,mu_F<2.0 for Powheg. For Fewz the scale uncertainty is defined by the variation 0.5<mu_R=mu_F<2.0. The uncertainty labelled as "stat" in the table corresponds to the pdf+alpha_s uncertainty for Fewz or just the pdf uncertainty for Powheg.

Higher-order electroweak corrections in nominal analysis, Delta(HOEW), and the correction for the Photon Induced process, Delta(PI), together with its uncertainty derived from the uncertainty of the photon PDF as a function of the dilepton invariant mass m_ll. Also shown is the difference arising from the non-convergence of calculations derived with different electroweak schema, delta(scheme).

Higher-order electroweak corrections in extended analysis, Delta(HOEW), and the correction for the Photon Induced process, Delta(PI), together with its uncertainty derived from the uncertainty of the photon PDF as a function of the dilepton invariant mass m_ll. Also shown is the difference arising from the non-convergence of calculations derived with different electroweak schema, delta(scheme).

Values of chi^2 for the nominal and extended DY cross-section measurements for predictions based from Fewz at NLO and NNLO and Powheg using MSTW2008 PDFs accounting for the experimental correlated systematic uncertainties. The _pdf_scale columns show the chi^2 when the PDF and scale uncertainties on the theoretical predictions are taken into account.

The chi^2 values from NLO and NNLO QCD fits made using the ATLAS nominal and extended Drell--Yan cross-section measurements and the HERA-I dataset accounting for the experimental correlated systematic uncertainties.

The measured individual cross sections in the fiducial region and the combined cross sections for 4-muon and 4-electron final states at a centre-of-collision energy of 8 TeV.

The measured individual cross sections in the fiducial region and the combined cross sections for for 2-muon-2-electron final states at a centre-of-collision energy of 8 TeV.

The measured cross section for four-lepton final states at a centre-of-collision energy of 8 TeV.

The branching fraction for Z0 --> 4 LEPTON, summed over all final states, measured using both the 7 and 8 TeV datasets.