Measured unfolded differential cross-section as a function of the dilepton transverse momentum $p^{ll}_{\mathrm{T}}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the the four-body transverse momentum $p^{ll\gamma\gamma}_{\mathrm{T}}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the diphoton invariant mass $m_{\gamma\gamma}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the four-body invariant mass $m_{ll\gamma\gamma}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Expected and observed $95\%$ confidence intervals for the coupling parameters $f_{T,j}/\Lambda^{4}$ of transverse dimension-8 operators. All parameter values outside of the stated range are excluded at the chosen confidence level. No unitarity constraints are applied.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,8}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,0}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,1}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,2}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,5}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,6}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,7}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,9}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

The measured fiducial cross section vs $E_{\mathrm{T}}^\gamma$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $|\eta^\gamma|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $|\eta^\gamma|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $\Delta\phi(ll,\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $\Delta\phi(ll,\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}/m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}/m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

Summary of the measured values of $ d\sigma / d{m}$ (pb/GeV) in the dielectron channel with the statistical ($\delta_{\text{stat}}$), experimental ($\delta_{\text{exp}}$) and theoretical ($\delta_{\text{theo}}$) uncertainties, respectively. Here, $\delta_{\text{tot}}$ is the quadratic sum of the three components.

Summary of the measured values of fiducial $ d\sigma / d{m}$ (pb/GeV) (with no FSR correction applied) in the dimuon channel with the statistical ($\delta_{\text{stat}}$) and experimental ($\delta_{\text{exp}}$) uncertainties shown separately. Here, $\delta_{\text{tot}}$ is the quadratic sum of the two components.

of the measured values of fiducial $ d\sigma / d{m}$ (pb/GeV) (with no FSR correction applied) in the dielectron channel with the statistical ($\delta_{\text{stat}}$) and experimental ($\delta_{\text{exp}}$) uncertainties shown separately. Here, $\delta_{\text{tot}}$ is the quadratic sum of the two components.

Summary of the combined values of $ d\sigma / d{m}$ (pb/GeV) using the results from both the dimuon and dielectron channels. Here, $\delta_{\text{tot}}$ is the quadratic sum of the statistical, experimental and theoretical uncertainties.

Covariance matrix of the Drell-Yan differential cross section as a function of the dimuon invariant mass, measured in the full phase space, with FSR correction is applied. Luminosity uncertainty is not included in the covariance.

Covariance matrix of the Drell-Yan differential cross section as a function of the dielectron invariant mass, measured in the full phase space, with FSR correction is applied. Luminosity uncertainty is not included in the covariance.

Covariance matrix of the differential DY cross section measured for the combination of the two channels in the full phase space.

The cross section measurement as a function of the inclusive jet multiplicity, for jet multiplicities of up to 7.

The differential cross section measurement as a function of the transverse momentum of the first leading jet.

The differential cross section measurement as a function of the transverse momentum of the first leading jet.

The differential cross section measurement as a function of the transverse momentum of the second leading jet.

The differential cross section measurement as a function of the transverse momentum of the second leading jet.

The differential cross section measurement as a function of the transverse momentum of the third leading jet.

The differential cross section measurement as a function of the transverse momentum of the third leading jet.

The differential cross section measurement as a function of the transverse momentum of the fourth leading jet.

The differential cross section measurement as a function of the transverse momentum of the fourth leading jet.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for events with one or more jets.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for events with one or more jets.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for events with two or more jets.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for events with two or more jets.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for events with three or more jets.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for events with three or more jets.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for events with four or more jets.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for events with four or more jets.

The differential cross section measurement as a function of the transverse momentum of the dijet system of the two highest pT jets for events with two or more jets.

The differential cross section measurement as a function of the transverse momentum of the dijet system of the two highest pT jets for events with two or more jets.

The differential cross section measurement as a function of the transverse momentum of the dijet system of the two highest pT jets for events with three or more jets.

The differential cross section measurement as a function of the transverse momentum of the dijet system of the two highest pT jets for events with three or more jets.

The differential cross section measurement as a function of the transverse momentum of the dijet system of the two highest pT jets for events with four or more jets.

The differential cross section measurement as a function of the transverse momentum of the dijet system of the two highest pT jets for events with four or more jets.

The differential cross section measurement as a function of the dijet invariant mass of the two highest pT jets for events with two or more jets.

The differential cross section measurement as a function of the dijet invariant mass of the two highest pT jets for events with two or more jets.

The differential cross section measurement as a function of the dijet invariant mass of the two highest pT jets for events with three or more jets.

The differential cross section measurement as a function of the dijet invariant mass of the two highest pT jets for events with three or more jets.

The differential cross section measurement as a function of the dijet invariant mass of the two highest pT jets for events with four or more jets.

The differential cross section measurement as a function of the dijet invariant mass of the two highest pT jets for events with four or more jets.

The differential cross section measurement as a function of the absolute value of the pseudorapidity of the first leading jet.

The differential cross section measurement as a function of the absolute value of the pseudorapidity of the first leading jet.

The differential cross section measurement as a function of the absolute value of the pseudorapidity of the second leading jet.

The differential cross section measurement as a function of the absolute value of the pseudorapidity of the second leading jet.

The differential cross section measurement as a function of the absolute value of the pseudorapidity of the third leading jet.

The differential cross section measurement as a function of the absolute value of the pseudorapidity of the third leading jet.

The differential cross section measurement as a function of the absolute value of the pseudorapidity of the fourth leading jet.

The differential cross section measurement as a function of the absolute value of the pseudorapidity of the fourth leading jet.

The differential cross section measurement as a function of the rapidity difference between the two highest pT jets for events with two or more jets.

The differential cross section measurement as a function of the rapidity difference between the two highest pT jets for events with two or more jets.

The differential cross section measurement as a function of the rapidity difference between the two highest pT jets for events with three or more jets.

The differential cross section measurement as a function of the rapidity difference between the two highest pT jets for events with three or more jets.

The differential cross section measurement as a function of the rapidity difference between the two highest pT jets for events with four or more jets.

The differential cross section measurement as a function of the rapidity difference between the two highest pT jets for events with four or more jets.

The differential cross section measurement as a function of the rapidity difference between the first and the third highest pT jets for events with three or more jets.

The differential cross section measurement as a function of the rapidity difference between the first and the third highest pT jets for events with three or more jets.

The differential cross section measurement as a function of the rapidity difference between the second and the third highest pT jets for events with three or more jets.

The differential cross section measurement as a function of the rapidity difference between the second and the third highest pT jets for events with three or more jets.

The differential cross section measurement as a function of the rapidity difference between the most forward and the most backward jets for events with two or more jets.

The differential cross section measurement as a function of the rapidity difference between the most forward and the most backward jets for events with two or more jets.

The differential cross section measurement as a function of the rapidity difference between the most forward and the most backward jets for events with three or more jets.

The differential cross section measurement as a function of the rapidity difference between the most forward and the most backward jets for events with three or more jets.

The differential cross section measurement as a function of the rapidity difference between the most forward and the most backward jets for events with four or more jets.

The differential cross section measurement as a function of the rapidity difference between the most forward and the most backward jets for events with four or more jets.

The differential cross section measurement as a function of the azimuthal angle separation between the two highest pT jets for events with two or more jets.

The differential cross section measurement as a function of the azimuthal angle separation between the two highest pT jets for events with two or more jets.

The differential cross section measurement as a function of the azimuthal angle separation between the most forward and the most backward jets for events with two or more jets.

The differential cross section measurement as a function of the azimuthal angle separation between the most forward and the most backward jets for events with two or more jets.

The differential cross section measurement as a function of DeltaR separation between the two highest pT jets for events with two or more jets.

The differential cross section measurement as a function of DeltaR separation between the two highest pT jets for events with two or more jets.

The differential cross section measurement as a function of the azimuthal angle separation between the first leading jet and the muon.

The differential cross section measurement as a function of the azimuthal angle separation between the first leading jet and the muon.

The differential cross section measurement as a function of the azimuthal angle separation between the second leading jet and the muon.

The differential cross section measurement as a function of the azimuthal angle separation between the second leading jet and the muon.

The differential cross section measurement as a function of the azimuthal angle separation between the third leading jet and the muon.

The differential cross section measurement as a function of the azimuthal angle separation between the third leading jet and the muon.

The differential cross section measurement as a function of the azimuthal angle separation between the fourth leading jet and the muon.

The differential cross section measurement as a function of the azimuthal angle separation between the fourth leading jet and the muon.

Average number of jets as a function of HT for events with one or more jets.

Average number of jets as a function of HT for events with one or more jets.

Average number of jets as a function of HT for events with two or more jets.

Average number of jets as a function of HT for events with two or more jets.

Average number of jets as a function of the rapidity difference between the two highest pT jets for events with two or more jets.

Average number of jets as a function of the rapidity difference between the two highest pT jets for events with two or more jets.

Average number of jets as a function of the rapidity difference between the most forward and the most backward jets for events with two or more jets.

Average number of jets as a function of the rapidity difference between the most forward and the most backward jets for events with two or more jets.

Parton-level normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level normalized $t\bar t$ differential cross-sections for the $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level normalized $t\bar t$ differential cross-sections for the $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The cross-sections in the last bins include events (if any) beyond of the bin edges. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The cross-sections in the last bins include events (if any) beyond of the bin edges. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The cross-sections in the last bins include events (if any) beyond of the bin edges. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are unit-less.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are unit-less.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are pb$^2$.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are pb$^2$.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

The electron channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The muon channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

Born-level differential fiducial cross section prediction DSIG/DM at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSYRAP at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSDETA at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 116 GeV < M(EE) < 150 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 150 GeV < M(EE) < 200 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 200 GeV < M(EE) < 300 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 300 GeV < M(EE) < 500 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 500 GeV < M(EE) < 1500 GeV.

The electron channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

Measured integrated cross sections for the $Z\gamma\gamma$ process for neutrino final state at $\sqrt{s} = 8$ TeV in the extended fiducial regions defined in the paper, table 5. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The cross sections as a function of $N_{\mathrm{jets}}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

Normalized differential ttbar cross sections as a function of the jet multiplicity for jets with pt > 60GeV, along with their statistical and systematic uncertainties. The results are presented at the particle level in the visible phase space of the ttbar decay products and the additional jets.

Absolute differential ttbar cross sections as a function of the jet multiplicity for jets with pt > 100GeV, along with their statistical and systematic uncertainties. The results are presented at the particle level in the visible phase space of the ttbar decay products and the additional jets.

Normalized differential ttbar cross sections as a function of the jet multiplicity for jets with pt > 100GeV, along with their statistical and systematic uncertainties. The results are presented at the particle level in the visible phase space of the ttbar decay products and the additional jets.

Absolute differential ttbar cross sections as a function of the pt of the leading additional jet in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the visible phase space.

Normalized differential ttbar cross sections as a function of the pt of the leading additional jet in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the visible phase space.

Absolute differential ttbar cross sections as a function of the eta of the leading additional jet in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the visible phase space.

Normalized differential ttbar cross sections as a function of the eta of the leading additional jet in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the visible phase space.

Absolute differential ttbar cross sections as a function of the pt of the subleading additional jet in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the visible phase space.

Normalized differential ttbar cross sections as a function of the pt of the subleading additional jet in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the visible phase space.

Absolute differential ttbar cross sections as a function of |eta| of the subleading additional jet in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the visible phase space.

Normalized differential ttbar cross sections as a function of |eta| of the subleading additional jet in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the visible phase space.

Absolute differential ttbar cross sections as a function of the invariant mass of the two leading additional jets in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the visible phase space.

Normalized differential ttbar cross sections as a function of the invariant mass of the two leading additional jets in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the visible phase space.

Absolute differential ttbar cross sections as a function of the angle DeltaR between the two leading additional jets in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the visible phase space.

Normalized differential ttbar cross sections as a function of the angle DeltaR between the two leading additional jets in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the visible phase space.

Absolute differential ttbar cross sections as a function of the observable HT, along with their statistical and systematic uncertainties. The results are presented at the particle level in the visible phase space.

Normalized differential ttbar cross sections as a function of the observable HT, along with their statistical and systematic uncertainties. The results are presented at the particle level in the visible phase space.

Absolute differential ttbar cross sections as a function of the pt of the leading additional jet j1 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at the particle level in the full phase space of the ttbar system, corrected for acceptance and branching fractions.

Normalized differential ttbar cross sections as a function of pt of the leading additional jet j1 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at the particle level in the full phase space of the ttbar system, corrected for acceptance and branching fractions.

Absolute differential ttbar cross sections as a function of |eta| of the leading additional jet j1 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at the particle level in the full phase space of the ttbar system, corrected for acceptance and branching fractions.

Normalized differential ttbar cross sections as a function of |eta| of the leading additional jet j1 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at the particle level in the full phase space of the ttbar system, corrected for acceptance and branching fractions.

Absolute differential ttbar cross sections as a function of the pt of the subleading additional jet j2 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at the particle level in the full phase space of the ttbar system, corrected for acceptance and branching fractions.

Normalized differential ttbar cross sections as a function of pt of the subleading additional jet j2 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at the particle level in the full phase space of the ttbar system, corrected for acceptance and branching fractions.

Absolute differential ttbar cross sections as a function of |eta| of the subleading additional jet j2 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at the particle level in the full phase space of the ttbar system, corrected for acceptance and branching fractions.

Normalized differential ttbar cross sections as a function of |eta| of the subleading additional jet j2 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at the particle level in the full phase space of the ttbar system, corrected for acceptance and branching fractions.

Absolute differential ttbar cross sections as a function of the invariant mass of the two leading additional jets in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the full phase space of tt system, corrected for acceptance and branching fractions.

Normalized differential ttbar cross sections as a function of the invariant mass of the two leading additional jets in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the full phase space of tt system, corrected for acceptance and branching fractions.

Absolute differential ttbar cross sections as a function of the angle DeltaR between the two leading additional jets in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the full phase space of tt system, corrected for acceptance and branching fractions.

Normalized differential ttbar cross sections as a function of the angle DeltaR between the two leading additional jets in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the full phase space of tt system, corrected for acceptance and branching fractions.

Absolute differential ttbar cross sections as a function of the observable HT, along with their statistical and systematic uncertainties. The results are presented at the particle level in the full phase space of tt system, corrected for acceptance and branching fractions.

Normalized differential ttbar cross sections as a function of the observable HT, along with their statistical and systematic uncertainties. The results are presented at the particle level in the full phase space of tt system, corrected for acceptance and branching fractions.

Absolute differential ttbar cross sections as a function of the pt of the leading additional b-jet b1 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at particle level in the visible phase space.

Normalized differential ttbar cross sections as a function of the pt of the leading additional b-jet b1 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at particle level in the visible phase space.

Absolute differential ttbar cross sections as a function of |eta| of the leading additional b-jet b1 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at particle level in the visible phase space.

Normalized differential ttbar cross sections as a function of |eta| of the leading additional b-jet b1 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at particle level in the visible phase space.

Absolute differential ttbar cross sections as a function of the pt of the subleading additional b-jet b2 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at particle level in the visible phase space.

Normalized differential ttbar cross sections as a function of the pt of the subleading additional b-jet b2 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at particle level in the visible phase space.

Absolute differential ttbar cross sections as a function of |eta| of the leading additional b-jet b2 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at particle level in the visible phase space.

Normalized differential ttbar cross sections as a function of |eta| of the leading additional b-jet b2 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at particle level in the visible phase space.

Absolute differential ttbar cross sections as a function of the invariant mass of the two leading additional b-jets in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the visible phase space.

Normalized differential ttbar cross sections as a function of the invariant mass of the two leading additional b-jets in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the visible phase space.

Absolute differential ttbar cross sections as a function of the angle DeltaR between the two leading additional b-jets in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the visible phase space.

Normalized differential ttbar cross sections as a function of the angle DeltaR between the two leading additional b-jets in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the visible phase space.

Absolute differential ttbar cross sections as a function of the pt of the leading additional b-jet b1 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at particle level in the full phase space of the tt system, corrected for acceptance and branching fractions.

Normalized differential ttbar cross sections as a function of the pt of the leading additional b-jet b1 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at particle level in the full phase space of the tt system, corrected for acceptance and branching fractions.

Absolute differential ttbar cross sections as a function of |eta| of the leading additional b-jet b1 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at particle level in the full phase space of the tt system, corrected for acceptance and branching fractions.

Normalized differential ttbar cross sections as a function of |eta| of the leading additional b-jet b1 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at particle level in the full phase space of the tt system, corrected for acceptance and branching fractions.

Absolute differential ttbar cross sections as a function of the pt of the subleading additional b-jet b2 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at particle level in the full phase space of the tt system, corrected for acceptance and branching fractions.

Normalized differential ttbar cross sections as a function of the pt of the subleading additional b-jet b2 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at particle level in the full phase space of the tt system, corrected for acceptance and branching fractions.

Absolute differential ttbar cross sections as a function of |eta| of the leading additional b-jet b2 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at particle level in the full phase space of the tt system, corrected for acceptance and branching fractions.

Normalized differential ttbar cross sections as a function of |eta| of the leading additional b-jet b2 in the event (not coming from the top quark decay products), along with their statistical, systematic, and total uncertainties. The results are presented at particle level in the full phase space of the tt system, corrected for acceptance and branching fractions.

Absolute differential ttbar cross sections as a function of the invariant mass of the two leading additional b-jets in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the full phase space of the tt system, corrected for acceptance and branching fractions.

Normalized differential ttbar cross sections as a function of the invariant mass of the two leading additional b-jets in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the full phase space of the tt system, corrected for acceptance and branching fractions.

Absolute differential ttbar cross sections as a function of the angle DeltaR between the two leading additional b-jets in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the full phase space of the tt system, corrected for acceptance and branching fractions.

Normalized differential ttbar cross sections as a function of the angle DeltaR between the two leading additional b-jets in the event (not coming from the top quark decay products), along with their statistical and systematic uncertainties. The results are presented at the particle level in the full phase space of the tt system, corrected for acceptance and branching fractions.

Gap fraction $f(p_T^{\rm jet})$ as function of leading additional jet transverse momentum $p_T^{\rm jet}$.

Gap fraction $f(p_T^{\rm jet})$ as function of leading additional jet transverse momentum $p_T^{\rm jet}$ in the region $|\eta|<0.8$.

Gap fraction $f(p_T^{\rm jet})$ as function of leading additional jet transverse momentum $p_T^{\rm jet}$ in the region $0.8<|\eta|<1.5$.

Gap fraction $f(p_T^{\rm jet})$ as function of leading additional jet transverse momentum $p_T^{\rm jet}$ in the region $1.5<|\eta|<2.4$.

Gap fraction $f(p_T^{\rm jet_2})$ as function of subleading additional jet transverse momentum $p_T^{\rm jet_2}$.

Gap fraction $f(p_T^{\rm jet_2})$ as function of subleading additional jet transverse momentum $p_T^{\rm jet_2}$ in the region $|\eta|<0.8$.

Gap fraction $f(p_T^{\rm jet_2})$ as function of subleading additional jet transverse momentum $p_T^{\rm jet_2}$ in the region $0.8<|\eta|<1.5$.

Gap fraction $f(p_T^{\rm jet_2})$ as function of subleading additional jet transverse momentum $p_T^{\rm jet_2}$ in the region $1.5<|\eta|<2.4$.

Gap fraction $f(H_T)$ as function of $H_T$.

Gap fraction $f(H_T)$ as function of $H_T$ in the region $|\eta|<0.8$.

Gap fraction $f(H_T)$ as function of $H_T$ in the region $0.8<|\eta|<1.5$.

Gap fraction $f(H_T)$ as function of $H_T$ in the region $1.5<|\eta|<2.4$.

Statistical covariance matrix for the absolute differential cross-section as a function of the number of jets with pt>30 GeV (see also table B.1).

Statistical covariance matrix for the normalized differential cross-section as a function of the number of jets with pt>30 GeV.

Statistical covariance matrix for the absolute differential cross-section as a function of the number of jets with pt>60 GeV (see also table B.1).

Statistical covariance matrix for the normalized differential cross-section as a function of the number of jets with pt>60 GeV.

Statistical covariance matrix for the absolute differential cross-section as a function of the number of jets with pt>100 GeV (see also table B.1).

Statistical covariance matrix for the normalized differential cross-section as a function of the number of jets with pt>100 GeV.

The total uncertainty covariance matrix for measured differential cross sections in $m_{4\ell}$ bins in fiducial volume. The matrix elements are in unit of $[$fb/TeV$]^2$.

The total uncertainty covariance matrix for measured differential cross sections in $p_\mathrm{T}^{4\ell}$ bins in fiducial volume. The matrix elements are in unit of $[$fb/TeV$]^2$.