The FSR correction applied as a function of $\phi ^ * _ \eta$ for electrons.

The FSR correction applied as a function of the boson transverse momentum.

The measured differential cross-sections as a function of the boson rapidity for muons. The first uncertainty is due to the size of the dataset, the second is due to experimental systematic uncertainties, and the third is due to the luminosity.

The measured differential cross-sections as a function of the boson rapidity for electrons. The first uncertainty is due to the size of the dataset, the second is due to experimental systematic uncertainties, and the third is due to the luminosity.

The measured differential cross-sections as a function of $\phi ^ * _ \eta$ for muons. The first uncertainty is due to the size of the dataset, the second is due to experimental systematic uncertainties, and the third is due to the luminosity.

The measured differential cross-sections as a function of $\phi ^ * _ \eta$ for electrons. The first uncertainty is due to the size of the dataset, the second is due to experimental systematic uncertainties, and the third is due to the luminosity.

The measured differential cross-sections as a function of pT . The first uncertainty is due to the size of the dataset, the second is due to experimental systematic uncertainties, and the third is due to the luminosity.

The correlation matrix for the differential cross-section measurement as a function of Z boson rapidity, for the dimuon final state, excluding the luminosity uncertainty, which is fully correlated between bins.

The correlation matrix for the differential cross-section measurements as a function of the Z boson rapidity, for the dielectron final state, excluding the luminosity uncertainty, which is fully correlated between bins.

The correlation matrix for the differential cross-section measurement as a function of $\phi ^ * _ \eta$ , for the dimuon final state, excluding the luminosity uncertainty, which is fully correlated between bins.

The correlation matrix for the differential cross-section measurements as a function of $\phi ^ * _ \eta$ , for the dielectron final state, excluding the luminosity uncertainty, which is fully correlated between bins.

The correlation matrix for the differential cross-section measurements as a function of boson pT , for the dimuon final state, excluding the luminosity uncertainty, which is fully correlated between bins.

Measured integrated cross sections for the $Z\gamma\gamma$ process for neutrino final state at $\sqrt{s} = 8$ TeV in the extended fiducial regions defined in the paper, table 5. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The cross sections as a function of $N_{\mathrm{jets}}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

Fiducial cross sections at dressed level in the electron- and muon-pair channels. The statistical and systematic uncertainties are given as a percentage of the cross section. Leptons are required to have $p_T>20$ GeV and $|\eta|<2.4$. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $m_{\ell\ell}$ bins, pertains to these measurements.

Inclusive cross-section for $Z$ boson production in bins of PHI*. The uncertainties are statistical, systematic, beam and luminosity.

Inclusive cross-section for $Z$ boson production in bins of muon pseudorapidity. The uncertainties are statistical, systematic, beam and luminosity.

$W^{\pm}$ to $Z$ boson cross-section ratio in bins of muon pseudorapidity. The uncertainties are statistical, systematic, beam and luminosity.

Ratio of $W^+$ to $W^-$ cross-section in bins of muon pseudorapidity. The uncertainties are statistical, systematic and beam.

Lepton charge asymmetry in bins of muon pseudorapidity. The uncertainties are statistical, systematic and beam.

Ratios of $W^{\pm}$ to $Z$ boson cross-section ratios at differnent centre-of-mass energy (8 TeV to 7 TeV) in bins of muon pseudorapidity. The uncertainties are statistical and systematic.

Inclusive cross-section for $Z$ boson production in bins of muon pseudorapidity at centre-of-mass energy of 7 TeV. The uncertainties are statistical, systematic, beam and luminosity.

$W^{\pm}$ to $Z$ boson cross-section ratio in bins of muon pseudorapidity at centre-of-mass energy of 7 TeV. The uncertainties are statistical, systematic, beam and luminosity.

Correlation coefficients of differential cross-section measurements as a function of lepton $\eta$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded. This table lists bin-to-bin correlations for $W^{+}$.

Correlation coefficients of differential cross-section measurements as a function of lepton $\eta$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded. This table lists bin-to-bin correlations for $W^{-}$.

Correlation coefficients of differential cross-section measurements as a function of lepton $\eta$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded. This table lists differential cross-section correlations between $W^{-}$ and $W^{+}$ bins.

Correlation coefficients of differential cross-section measurements as a function of $y_{Z}$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of transverse momentum. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of $\phi^{*}$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients between differential cross-section measurements as a function $y_{Z}$ and $W^{+}$ boson muon $\eta$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients between differential cross-section measurements as a function $y_{Z}$ and $W^{-}$ boson muon $\eta$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of $\eta^{\mu^{+}}$ of the Z boson. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of $\eta^{\mu^{-}}$ of the Z boson. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of $\eta^{\mu^{+}}$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of $\eta^{\mu^{-}}$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Double differential cross-section for $J/\psi$-from-$b$ mesons as a function of $p_\perp$ in bins of $y$. The first uncertainties are statistical, the second are the correlated systematic uncertainties shared between bins and the last are the uncorrelated systematic uncertainties.

The fraction of $J/\psi$-from-$b$ mesons (in %) in bins of the $J/\psi$ $p_\perp$ and $y$. The uncertainties are statistical only. The systematic uncertainties are negligible.

The fraction of $J/\psi$-from-$b$ mesons (in %) in bins of the $J/\psi$ $p_\perp$ and $y$. The uncertainties are statistical only. The systematic uncertainties are negligible.

Differential cross-sections as a function of $p_\perp$ integrated over $y$ for prompt $J/\psi$ mesons. The first uncertainties are statistical and the second (third) are uncorrelated (correlated) systematic uncertainties amongst bins.

Differential cross-sections as a function of $p_\perp$ integrated over $y$ for prompt $J/\psi$ mesons. The first uncertainties are statistical and the second (third) are uncorrelated (correlated) systematic uncertainties amongst bins.

Differential cross-sections as a function of $p_\perp$ integrated over $y$ for $J/\psi$-from-$b$ mesons. The first uncertainties are statistical and the second (third) are uncorrelated (correlated) systematic uncertainties amongst bins.

Differential cross-sections as a function of $p_\perp$ integrated over $y$ for $J/\psi$-from-$b$ mesons. The first uncertainties are statistical and the second (third) are uncorrelated (correlated) systematic uncertainties amongst bins.

Differential cross-sections as a function of $y$ integrated over $p_\perp$ for prompt $J/\psi$ mesons. The first uncertainties are statistical and the second (third) are the correlated (uncorrelated) systematic uncertainties.

Differential cross-sections as a function of $y$ integrated over $p_\perp$ for prompt $J/\psi$ mesons. The first uncertainties are statistical and the second (third) are the correlated (uncorrelated) systematic uncertainties.

Differential cross-sections as a function of $y$ integrated over $p_\perp$ for $J/\psi$-from-$b$ mesons. The first uncertainties are statistical and the second (third) are the correlated (uncorrelated) systematic uncertainties.

Differential cross-sections as a function of $y$ integrated over $p_\perp$ for $J/\psi$-from-$b$ mesons. The first uncertainties are statistical and the second (third) are the correlated (uncorrelated) systematic uncertainties.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ in bins of $y$ for prompt $J/\psi$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ in bins of $y$ for prompt $J/\psi$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ in bins of $y$ for $J/\psi$-from-$b$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ in bins of $y$ for $J/\psi$-from-$b$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $y$ integrated over $p_\perp$ for prompt $J/\psi$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $y$ integrated over $p_\perp$ for prompt $J/\psi$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $y$ integrated over $p_\perp$ for $J/\psi$-from-$b$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $y$ integrated over $p_\perp$ for $J/\psi$-from-$b$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ integrated over $y$ for prompt $J/\psi$ mesons.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ integrated over $y$ for prompt $J/\psi$ mesons.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ integrated over $y$ for $J/\psi$-from-$b$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ integrated over $y$ for $J/\psi$-from-$b$ mesons. The systematic errors are negligible.

Inclusive cross-section for $W^+$ and $W^-$ boson production in bins of muon pseudorapidity. The uncertainties are statistical, systematic, beam and luminosity.

Ratio of $W^+$ to $W^-$ cross-section in bins of muon pseudorapidity. The uncertainties are statistical, systematic and beam.

Lepton charge asymmetry in bins of muon pseudorapidity. The uncertainties are statistical, systematic and beam.

Correlation coefficients of differential cross-section measurements as a function of $y_{Z}$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of transverse momentum. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of $\phi^{*}$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of lepton $\eta$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients between differential cross-section measurements as a function $y_{Z}$ and $W^{\pm}$ boson muon $\eta$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Fiducial cross sections for pT(gamma) > 15 GeV with statistical, systematic, and luminosity uncertainties, respectively. Combined result of electron and muon channels.

The $p_{\rm T}$ bin width and corrected yield ratios R21 and R31 for $|y| < 0.6$. The statistical and systematic uncertainties in the corrected yield ratios are given as the percentage of the ratio.

The $p_{\rm T}$ bin width and corrected yield ratios R21 and R31 for $0.6 < |y| < 1.2$. The statistical and systematic uncertainties in the corrected yield ratios are given as the percentage of the ratio.

The $p_{\rm T}$ bin width and corrected yield ratios R21 and R31 for $|y| < 1.2$. The statistical and systematic uncertainties in the corrected yield ratios are given as the percentage of the ratio.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon$(1S) state and $|y| <0.6$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(1S) state and $0.6 < |y| < 1.2$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(1S) state and $|y| < 1.2$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(2S) state and $|y| < 0.6$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(2S) state and $0.6 < |y| < 1.2$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(2S) state and $|y| < 1.2$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(3S) state and $|y| < 0.6$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(3S) state and $0.6 < |y| < 1.2$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(3S) state and $|y| < 1.2$.

Prompt and non-prompt production cross-section times branching ratio as a function of $\psi(2\mathrm{S})$ $p_{\rm T}$ for $\psi(2\mathrm{S})$ rapidity interval of $0\leq |y| < 0.75$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Prompt and non-prompt production cross-section times branching ratio as a function of $\psi(2\mathrm{S})$ $p_{\rm T}$ for $\psi(2\mathrm{S})$ rapidity interval of $0.75\leq |y| < 1.5$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Prompt and non-prompt production cross-section times branching ratio as a function of $\psi(2\mathrm{S})$ $p_{\rm T}$ for $\psi(2\mathrm{S})$ rapidity interval of $1.5\leq |y| < 2$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Prompt and non-prompt production cross-section times branching ratio as a function of $J/\psi$ $p_{\rm T}$ for $J/\psi$ rapidity interval of $0\leq |y| < 0.75$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Prompt and non-prompt production cross-section times branching ratio as a function of $J/\psi$ $p_{\rm T}$ for $J/\psi$ rapidity interval of $0.75\leq |y| < 1.5$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Prompt and non-prompt production cross-section times branching ratio as a function of $J/\psi$ $p_{\rm T}$ for $J/\psi$ rapidity interval of $1.5\leq |y| < 2$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

The differential cross section measurement as a function of the transverse momentum of the second leading jet.

The differential cross section measurement as a function of the transverse momentum of the third leading jet.

The differential cross section measurement as a function of the transverse momentum of the fourth leading jet.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for jet multiplicities of one or more.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for jet multiplicities of two or more.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for jet multiplicities of three or more.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for jet multiplicities of four or more.

The differential cross section measurement as a function of the absolute value of the pseudorapidity of the first leading jet.

The differential cross section measurement as a function of the absolute value of the pseudorapidity of the first second jet.

The differential cross section measurement as a function of the absolute value of the pseudorapidity of the third leading jet.

The differential cross section measurement as a function of the absolute value of the pseudorapidity of the fourth leading jet.

The differential cross section measurement as a function of the absolute value of the azimuthal separation between the first leading jet and the muon.

The differential cross section measurement as a function of the absolute value of the azimuthal separation between the second leading jet and the muon.

The differential cross section measurement as a function of the absolute value of the azimuthal separation between the third leading jet and the muon.

The differential cross section measurement as a function of the absolute value of the azimuthal separation between the fourth leading jet and the muon.