The measured differential cross-section normalized to the bin width in values of the angle between the leptons in the leading reconstructed lepton pair for the 4 lepton channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the rapidity difference between the reconstructed lepton pairs for the 4 lepton channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the leading reconstructed dilepton pT for the 2 lepton, 2 neutrino channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the angle between the dilepton pair for the 2 lepton, 2 neutrino channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the transverse mass of the reconstructed diboson pair for the 2 lepton, 2 neutrino channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

Measured integrated cross sections for the $Z\gamma\gamma$ process for neutrino final state at $\sqrt{s} = 8$ TeV in the extended fiducial regions defined in the paper, table 5. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The cross sections as a function of $N_{\mathrm{jets}}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

Fiducial cross sections at dressed level in the electron- and muon-pair channels. The statistical and systematic uncertainties are given as a percentage of the cross section. Leptons are required to have $p_T>20$ GeV and $|\eta|<2.4$. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $m_{\ell\ell}$ bins, pertains to these measurements.

The total uncertainty covariance matrix for measured differential cross sections in $m_{4\ell}$ bins in fiducial volume. The matrix elements are in unit of $[$fb/TeV$]^2$.

The total uncertainty covariance matrix for measured differential cross sections in $p_\mathrm{T}^{4\ell}$ bins in fiducial volume. The matrix elements are in unit of $[$fb/TeV$]^2$.

The total inelastic cross section, the first systematic error accounts for all experimental uncertainties and the second error for the extrapolation t-->0.

The measured differential elastic cross section. In addition to the statistical and total systematic uncertainties, the following 24 systematic shifts are given, which are included in the profile fit with their signs: -- Constraints: Beam optics uncertainty obtained by varying the ALFA constraints in the optics fit -- QScan: Variation by +/- 0.1 % of the quadrupole strength -- Q2: Fit of the strength of Q2 using the best value for the strength of Q1 and Q3 -- MadX: Uncertainty related to the beam transport replacing matrix transport by MadX PTC tracking -- Q5Q6: Variation of the strength of Q5 and Q6 by -0.2% as indicated by machine constraints -- Qmisal: Uncertainty due to the mis-alignment of the quadrupoles in the beam line -- Q1Q3: Propagation of the optics fit uncertainty in the strenght of Q1 and Q3 on the differential elastic cross section -- Stat2: Alignment uncertainty from the choice of a reference station -- Dist: Alignment uncertainty related to the distance calibration between the upper and lower detectors -- Leff: Alignment uncertainty related to effective lever arm used in the alignment optimization procedure -- Offv: Alignment uncertainty related to the vertical beam center offset -- Offh: Alignment uncertainty related to the horizontal beam center offset -- Ang: Alignment uncertainty related to the detector rotation in the x-y plane -- BGn: Uncertainty from the background normalization -- BGs: Uncertainty from the background shape -- MCres: Error from modelling of the detector response -- Slope: Residual dependence on the physics model estimated by varying the nuclear slope in the simulation by +/- 1 GeV^-2 -- Emit: Uncertainty from the emittance used to calculate beam divergence in the simulation -- Unf: Unfolding uncertainty from the data-driven closure test -- Trac: Uncertainty from the variation of the track reconstruction selection cuts -- Xing: Uncertainty from residual crossing angle in the horizontal plane -- Eff: Uncertainty from the reconstruction efficiency -- Lumi: Luminosity uncertainty (+/- 2.3%) -- Ebeam: Uncertainty from the nominal beam energy (+/- 0.65%) A small difference in the statistical uncertainties give here compared to the published version is related to insignificant rounding issues.

The statistical covariance matrix for the differential elastic cross section.

Prompt and non-prompt production cross-section times branching ratio as a function of $\psi(2\mathrm{S})$ $p_{\rm T}$ for $\psi(2\mathrm{S})$ rapidity interval of $0\leq |y| < 0.75$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Prompt and non-prompt production cross-section times branching ratio as a function of $\psi(2\mathrm{S})$ $p_{\rm T}$ for $\psi(2\mathrm{S})$ rapidity interval of $0.75\leq |y| < 1.5$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Prompt and non-prompt production cross-section times branching ratio as a function of $\psi(2\mathrm{S})$ $p_{\rm T}$ for $\psi(2\mathrm{S})$ rapidity interval of $1.5\leq |y| < 2$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Prompt and non-prompt production cross-section times branching ratio as a function of $J/\psi$ $p_{\rm T}$ for $J/\psi$ rapidity interval of $0\leq |y| < 0.75$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Prompt and non-prompt production cross-section times branching ratio as a function of $J/\psi$ $p_{\rm T}$ for $J/\psi$ rapidity interval of $0.75\leq |y| < 1.5$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Prompt and non-prompt production cross-section times branching ratio as a function of $J/\psi$ $p_{\rm T}$ for $J/\psi$ rapidity interval of $1.5\leq |y| < 2$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Measured differential cross section with associated uncertainties as a function of absolute rapidity of diphoton system. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of multiplicity of jets with transverse momentum pT(jet) > 30 GeV. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of multiplicity of jets with transverse momentum pT(jet) > 30 GeV. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of multiplicity of jets with transverse momentum pT(jet) > 30 GeV. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of multiplicity of jets with transverse momentum pT(jet) > 30 GeV. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of transverse momentum of the leading jet. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of transverse momentum of the leading jet. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of absolute rapidity of the leading jet. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of absolute rapidity of the leading jet. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of scalar transverse momentum sum of all jets. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of scalar transverse momentum sum of all jets. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of transverse momentum of second leading jet. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of transverse momentum of second leading jet. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of rapidity separation of leading two jets. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of rapidity separation of leading two jets. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of azimuthal angle between diphoton and dijet systems. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of azimuthal angle between diphoton and dijet systems. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of cosine of the decay angle in the Collins-Soper frame. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of cosine of the decay angle in the Collins-Soper frame. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of cosine of the decay angle in the Collins-Soper frame. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of cosine of the decay angle in the Collins-Soper frame. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of azimuthal angle between the two leading jets. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of azimuthal angle between the two leading jets. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of diphoton thrust pT. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of diphoton thrust pT. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of rapidity separation of the two photons. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of rapidity separation of the two photons. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of tau of highest-tau jet (see paper for description). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of tau of highest-tau jet (see paper for description). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of scalar sum of tau for all jets (see paper for description). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of scalar sum of tau for all jets (see paper for description). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of absolute rapidity of second leading jet. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of absolute rapidity of second leading jet. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of transverse momentum of third leading jet. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of transverse momentum of third leading jet. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of dijet invariant mass. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of dijet invariant mass. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of transverse momentum of the combined diphoton and dijet system. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of transverse momentum of the combined diphoton and dijet system. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of cosine of the decay angle in the Collins-Soper frame in bins of diphoton transverse momentum. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of cosine of the decay angle in the Collins-Soper frame in bins of diphoton transverse momentum. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of diphoton transverse momentum in jet multiplicity bins. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of diphoton transverse momentum in jet multiplicity bins. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of leading jet transverse momentum for exclusive one-jet events. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of leading jet transverse momentum for exclusive one-jet events. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Diphoton kinematic acceptances in percent for gluon fusion for each fiducial region/variable bin studied in this paper, defined as the probability to fulfil the diphoton kinematic criteria: pT(2gam) < 0.35 (0.25) for the leading (subleading) photon and |eta(gam)|<2.37. The factors are evaluated using the POWHEG event generator with MPI modelling and hadronisation turned off. Consistent results for the diphoton variables are obtained by HRes 2.2. Uncertainties are taken from PDF variations. QCD scale varaitions have a negligible impact on these factors.

Diphoton kinematic acceptances in percent for gluon fusion for each fiducial region/variable bin studied in this paper, defined as the probability to fulfil the diphoton kinematic criteria: pT(2gam) < 0.35 (0.25) for the leading (subleading) photon and |eta(gam)|<2.37. The factors are evaluated using the POWHEG event generator with MPI modelling and hadronisation turned off. Consistent results for the diphoton variables are obtained by HRes 2.2. Uncertainties are taken from PDF variations. QCD scale varaitions have a negligible impact on these factors.

Isolation efficiencies in percent for gluon fusion H -> 2gam for each fiducial region/variable bin measured in this analysis. The isolation efficiency is defined as the probability for both photons to fulfil the isolation criteria (ETiso < 14 GeV as described in the text) for events that pass the diphoton kinematic criteria. Uncertainties are assigned in the same way as for the non-perturbative correction factors: by varying the fragmentation and underlying event modelling. These factors can be multiplied by the kinematic acceptance factors (see table~ ef{tab:fid_acceptance}) to extrapolate an inclusive gluon fusion Higgs prediction to the fiducial volume used in this analysis.

Isolation efficiencies in percent for gluon fusion H -> 2gam for each fiducial region/variable bin measured in this analysis. The isolation efficiency is defined as the probability for both photons to fulfil the isolation criteria (ETiso < 14 GeV as described in the text) for events that pass the diphoton kinematic criteria. Uncertainties are assigned in the same way as for the non-perturbative correction factors: by varying the fragmentation and underlying event modelling. These factors can be multiplied by the kinematic acceptance factors (see table~ ef{tab:fid_acceptance}) to extrapolate an inclusive gluon fusion Higgs prediction to the fiducial volume used in this analysis.

Non-perturbative correction factors in percent accounting for the impact of hadronisation and the underlying event activity for all measured variables and fiducial regions. Uncertainties are evaluated by deriving these factors using different generators and tunes as described in the text.

Non-perturbative correction factors in percent accounting for the impact of hadronisation and the underlying event activity for all measured variables and fiducial regions. Uncertainties are evaluated by deriving these factors using different generators and tunes as described in the text.

Fiducial cross sections in fb from WH, ZH and ttH combined, in each variable bin and fiducial region.

Fiducial cross sections in fb from WH, ZH and ttH combined, in each variable bin and fiducial region.

Statistical bin-to-bin correlations between the 24 bins used in the analysis described in Phys.Lett. B753 (2016) 69-85 (arXiv:1508.02507). See Figure 3 of this paper for the bins used.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $p_T$.

The inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $|y|$.

The inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $y_{\text{boost}}(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $y_{\text{boost}}(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta y(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta y(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta\phi(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta\phi(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta R(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta R(Z,b)$.

The cross-section $\sigma(Zb)$ as a function of $Z$ boson $p_T$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zb)$ as a function of $Z$ boson $p_T$.

The cross-section $\sigma(Zb)$ as a function of $Z$ boson $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zb)$ as a function of $Z$ boson $|y|$.

Integrated $Z+\ge 2$ $b$-jets cross-section.

Breakdown of systematic uncertainties (in %) for the integrated $Z+\ge 2$ $b$-jets cross-section.

The cross-section $\sigma(Zbb)$ as a function of $\Delta R(b,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $\Delta R(b,b)$.

The cross-section $\sigma(Zbb)$ as a function of $\Delta m(b,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $\Delta m(b,b)$.

The cross-section $\sigma(Zbb)$ as a function of $Z$ boson $p_T$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $Z$ boson $p_T$.

The cross-section $\sigma(Zbb)$ as a function of $Z$ boson $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $Z$ boson $|y|$.

Detailed list of the contribution of each source of uncertainty to the total uncertainty on the measured values of $\sigma(tq)$, $\sigma(\bar{t}q)$, $R_t$, and $\sigma(tq+\bar{t}q)$. The evaluation of the systematic uncertainties has a statistical uncertainty of $0.3\,\%$. Uncertainties contributing less than $1.0\,\%$ are marked with "$<1$" in the paper. To provide numerical values for this table in HEPdata, these uncertainties are approximated with $\pm 0.5\,\%$. This approximation is applied to all measurements for the following uncertainties$:$ JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by-jets, JES pileup, $b$-JES, jet vertex fraction, mistag efficiency and $W+\;$jets shape variation. For the measurement of $\sigma(tq)$ the approximation is applied in addition to the following uncertainties$:$ JES flavor response, $c$-tagging efficiency, $t\bar{t}$ generator + parton shower and $t\bar{t}$ ISR/FSR. For the measurement of $\sigma(\bar{t}q)$ the approximation is applied in addition to these uncertainties$:$ JES flavor response, $b/\bar{b}$ acceptance, and $t\bar{t}$ ISR/FSR. For the measurement of $R_t$ the approximation is applied in addition to these uncertainties$:$ JES detector, $b$-tagging efficiency, $c$-tagging efficiency, $b/\bar{b}$ acceptance and $tq$ scale variations. For the measurement of $\sigma(tq+\bar{t}q)$ the approximation is applied in addition to these uncertainties$:$ JES flavor response, $c$-tagging efficiency, $b/\bar{b}$ acceptance, $t\bar{t}$ generator + parton shower and $t\bar{t}$ ISR/FSR.

Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(T)).

The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.

Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(TBAR)).

Parametrization factors for the $m_{t}$ dependence [see Eq. (4) in the paper] of $\sigma(tq)$, $\sigma(\bar tq)$, and $\sigma(t q+\bar t q)$.

The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.

The value of $|V_{tb}|^{2}$ is extracted by dividing the measured value of $\sigma(t q+\bar t q)$ by the prediction of the approximate NNLO calculation. The experimental and theoretical uncertainties are added in quadrature.

Event yields for the 2-jet-$\ell^{+}$ and 2-jet-$\ell^{-}$ HPR channels. The expectation for the signal and background yields correspond to the result of the binned maximum-likelihood fit described in Sec. $\mathrm{VI~D}$ in the paper. The uncertainty of the expectations is the normalization uncertainty of each process after the fit, as described in Sec. $\mathrm{VII~F}$ in the paper.

Migration matrix relating the parton level $p_{\mathrm{T}}(t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-quark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $p_{\mathrm{T}}(\bar t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-antiquark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $|y(t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-quark $|y|$ distribution.

Migration matrix relating the parton level $|y(\bar t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-antiquark $|y|$ distribution.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Comparison between the measured differential cross sections and the predictions from the NLO calculation using the MSTW2008 PDF set. For each variable and prediction a $\chi^{2}$ value is calculated with HERAfitter using the covariance matrix of each measured spectrum. The theory uncertainties of the predictions are treated as uncorrelated. The number of degrees of freedom (NDF) is equal to the number of bins in the measured spectrum.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, mistag efficiency, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The JES $\eta$ intercalibration uncertainty has a sign switch from the first to the second bin. For the $tq$ generator $+$ parton shower uncertainty a sign switch is denoted with $\mp$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $c-$tagging efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content $:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet energy resolution, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$ tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the differential cross section as a function of $|y(\bar t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(\bar t)|$.