We measure the Drell-Yan differential cross section d2σdMdy||y|<1 over the mass range 11
Dielectron differential cross section.
Dimuon differential cross section.
Drell-Yan differential cross section for combined dielectron and dimuon data. Error includes both statistics and systematics.
We have measured the B0B¯0 mixing probability, χd, using a sample of 965 000 BB¯ pairs from Υ(4S) decays. Counting dilepton events, we find χd=0.157±0.016±0.018−0.021+0.028. Using tagged B0 events, we find χd=0.149±0.023±0.019±0.010. The first (second) error is statistical (systematic). The third error reflects a ±15% uncertainty in the assumption, made in both cases, that charged and neutral B pairs contribute equally to dilepton events. We also obtain a limit on the CP impurity in the Bd0 system, ‖Re(εB0)‖<0.045 at 90% C.L.
No description provided.
Mixing parameter from counting dilepton events. CONST(N=MIXING PARAM) = 1/(1 - LAMBDA(C,N)) * (N(2LEPTON+) + N(2LEPTON-))/(N(LEPTON+,LEPTON-) + N(2LEPTON+) + N(2LEPTON-)). LAMBDA(C,N) is the fraction of dilepton events coming from B+B- decays, LAMBDA(C,N) = f(B+)*Br(B+)**2/(f(B+)*Br(B+)**2 + f(B0)*Br(B0)**2), where f(B+),f(B0) are the productiron fractions of the charged and neutral B's at the UPSI(4S), and Br(B+), Br(B0) are the semileptonic brancing fractions.
Mixing parameter from tagged B0 events.