$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 10j50 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

Observed 95% CL limit for the pMSSM grid.

Observed 95% CL limit for the pMSSM grid when the signal cross section is increased by one standard deviation.

Observed 95% CL limit for the pMSSM grid when the signal cross section is decreased by one standard deviation.

Expected 95% CL limit for the pMSSM grid.

+1 sigma excursion of the expected 95% CL limit for the pMSSM grid.

-1 sigma excursion of the expected 95% CL limit for the pMSSM grid.

Observed 95% CL limit for the 2Step grid.

Observed 95% CL limit for the 2Step grid when the signal cross section is increased by one standard deviation.

Observed 95% CL limit for the 2Step grid when the signal cross section is decreased by one standard deviation.

Expected 95% CL limit for the 2Step grid.

+1 sigma excursion of the expected 95% CL limit for the 2Step grid.

-1 sigma excursion of the expected 95% CL limit for the 2Step grid.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j50 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j50 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j50 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 9j50 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 9j50 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 9j50 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 10j50 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 10j50 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 10j50 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 7j80 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 7j80 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 7j80 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

Degree of multijet closure for signal and vaidation regions with at no b-jet requirement. The solid lines are the pre-fit predicted numbers of events and the points are the observed numbers. The blue hatched band shows only the statistical (MC and data) uncertainty on the background estimate. The bins labelled in bold are signal regions, while the others are validation regions. The template closure uncertainty for each SR bin is given by the maximal deviation of data from prediction in any non-SR bin to its left on this plot (although those for 80 GeV regions are independent of deviations in 50 GeV regions).

Degree of multijet closure for signal and vaidation regions with at least 1 b-jet. The solid lines are the pre-fit predicted numbers of events and the points are the observed numbers. The blue hatched band shows only the statistical (MC and data) uncertainty on the background estimate. The bins labelled in bold are signal regions, while the others are validation regions. The template closure uncertainty for each SR bin is given by the maximal deviation of data from prediction in any non-SR bin to its left on this plot (although those for 80 GeV regions are independent of deviations in 50 GeV regions).

Degree of multijet closure for signal and vaidation regions with at least 2 b-jets. The solid lines are the pre-fit predicted numbers of events and the points are the observed numbers. The blue hatched band shows only the statistical (MC and data) uncertainty on the background estimate. The bins labelled in bold are signal regions, while the others are validation regions. The template closure uncertainty for each SR bin is given by the maximal deviation of data from prediction in any non-SR bin to its left on this plot (although those for 80 GeV regions are independent of deviations in 50 GeV regions).

Summary of all 15 signal regions (post-fit).

Signal region yielding the best-expected CLs value, the best expected CLs value, and the corresponding observed CLs value for the 2Step grid.

Signal region yielding the best-expected CLs value, the best expected CLs value, and the corresponding observed CLs value for the pMSSM grid.

95% CLs observed upper limit on model cross-section for 2-step signal points for the best-expected signal region.

Performance of the 8j50-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Nuclear modicifation factor vs. N_coll $J\psi$ with|y|<1 and pT < 3 GeV/c in d Au collisions.

The invariant cross section versus transverse momentum for J/$\psi$ with $|y|\lt 1$ in $p+p$ collisions.

The invariant yield versus transverse momentum for $J/\Psi$ with |y| < 1 in 0 - 100 percent central d+Au collisions.

Measured fiducial cross section in all $\ell^+\ell^-\ell'^+\ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity uncertainty, the second is the luminosity uncertainty.

Cross section extrapolated to total phase space and all Z boson decays. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity uncertainty, the second is the luminosity uncertainty.

The measured differential cross sections $\rm{d}\sigma/\rm{d}|\eta|$ of $D^{*\pm}$ and $D^\pm$ production with $20<p_T<100\,$GeV. The first and second errors are the statistical and systematic uncertainties, respectively. The systematic uncertainty fractions corresponding to the tracking ($\delta_2$) uncertainties (Table 2 of the paper) are strongly correlated. The fully correlated uncertainties linked with the luminosity measurement ($3.5\%$) and branching fractions ($1.5\%$ and $2.1\%$ for $D^{*\pm}$ and $D^\pm$, respectively) are not shown.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

Fiducial cross sections at dressed level in the electron- and muon-pair channels. The statistical and systematic uncertainties are given as a percentage of the cross section. Leptons are required to have $p_T>20$ GeV and $|\eta|<2.4$. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $m_{\ell\ell}$ bins, pertains to these measurements.

No description provided.