The JEC, JER, and total systematic uncertainties in unfolded cross sections as functions of transverse momentum, for 1.5<|y|<2. The total systematic uncertainty includes also the luminosity, jet identification and trigger efficiency uncertainties.

The unfolded measured particle-level inclusive jet cross section as functions of jet pT (markers), for |y|<0.5, compared to the NLO perturbative QCD prediction (histogram), using the CT14NLO PDF set, with muR = muF = HT, and corrected for the NP effects. The experimental and theoretical systematic uncertainties are shown.

The unfolded measured particle-level inclusive jet cross section as functions of jet pT (markers), for 0.5<|y|<1, compared to the NLO perturbative QCD prediction (histogram), using the CT14NLO PDF set, with muR = muF = HT, and corrected for the NP effects. The experimental and theoretical systematic uncertainties are shown.

The unfolded measured particle-level inclusive jet cross section as functions of jet pT (markers), for 1<|y|<1.5, compared to the NLO perturbative QCD prediction (histogram), using the CT14NLO PDF set, with muR = muF = HT, and corrected for the NP effects. The experimental and theoretical systematic uncertainties are shown.

The unfolded measured particle-level inclusive jet cross section as functions of jet pT (markers), for 1.5<|y|<2, compared to the NLO perturbative QCD prediction (histogram), using the CT14NLO PDF set, with muR = muF = HT, and corrected for the NP effects. The experimental and theoretical systematic uncertainties are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = pT, for |y|<0.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = pT, for 0.5<|y|<1. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = pT, for 1<|y|<1.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = pT, for 1.5<|y|<2. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = HT, for |y|<0.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = HT, for 0.5<|y|<1. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = HT, for 1<|y|<1.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = HT, for 1.5<|y|<2. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the CT14NNLO PDF set, with mu = HT, for |y|<0.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the CT14NNLO PDF set, with mu = HT, for 0.5<|y|<1. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the CT14NNLO PDF set, with mu = HT, for 1<|y|<1.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the CT14NNLO PDF set, with mu = HT, for 1.5<|y|<2. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the NNPDF31NNLO PDF set, with mu = HT, for |y|<0.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the NNPDF31NNLO PDF set, with mu = HT, for 0.5<|y|<1. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the NNPDF31NNLO PDF set, with mu = HT, for 1<|y|<1.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the NNPDF31NNLO PDF set, with mu = HT, for 1.5<|y|<2. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

The effect of aS(MZ) variation, for |y|<0.5. The NNLO theoretical cross section predictions using the NNPDF31NNLO PDF with m = HT, calculated for different choices of aS (0.108, 0.110, 0.112, 0.114, 0.116, 0.117, 0.118, 0.119, 0.120, 0.122, and 0.124), are divided by the benchmark NNLO prediction for aS = 0.118 and the same choice of PDF set, muR, and muF. Also shown is the experimental unfolded measurement divided by the same benchmark prediction. The width of the unity line corresponds to the statistical uncertainty from the MC integration for the determination of the NNLO prediction. The error bars on the unfolded data correspond to the total experimental statistical and systematic uncertainty added in quadrature.

The effect of aS(MZ) variation, for 0.5<|y|<1. The NNLO theoretical cross section predictions using the NNPDF31NNLO PDF with m = HT, calculated for different choices of aS (0.108, 0.110, 0.112, 0.114, 0.116, 0.117, 0.118, 0.119, 0.120, 0.122, and 0.124), are divided by the benchmark NNLO prediction for aS = 0.118 and the same choice of PDF set, muR, and muF. Also shown is the experimental unfolded measurement divided by the same benchmark prediction. The width of the unity line corresponds to the statistical uncertainty from the MC integration for the determination of the NNLO prediction. The error bars on the unfolded data correspond to the total experimental statistical and systematic uncertainty added in quadrature.

The effect of aS(MZ) variation, for 1<|y|<1.5. The NNLO theoretical cross section predictions using the NNPDF31NNLO PDF with m = HT, calculated for different choices of aS (0.108, 0.110, 0.112, 0.114, 0.116, 0.117, 0.118, 0.119, 0.120, 0.122, and 0.124), are divided by the benchmark NNLO prediction for aS = 0.118 and the same choice of PDF set, muR, and muF. Also shown is the experimental unfolded measurement divided by the same benchmark prediction. The width of the unity line corresponds to the statistical uncertainty from the MC integration for the determination of the NNLO prediction. The error bars on the unfolded data correspond to the total experimental statistical and systematic uncertainty added in quadrature.

The effect of aS(MZ) variation, for 1.5<|y|<2. The NNLO theoretical cross section predictions using the NNPDF31NNLO PDF with m = HT, calculated for different choices of aS (0.108, 0.110, 0.112, 0.114, 0.116, 0.117, 0.118, 0.119, 0.120, 0.122, and 0.124), are divided by the benchmark NNLO prediction for aS = 0.118 and the same choice of PDF set, muR, and muF. Also shown is the experimental unfolded measurement divided by the same benchmark prediction. The width of the unity line corresponds to the statistical uncertainty from the MC integration for the determination of the NNLO prediction. The error bars on the unfolded data correspond to the total experimental statistical and systematic uncertainty added in quadrature.

Unfolded correlation matrix for |y|<0.5.

Unfolded correlation matrix for 0.5<|y|<1.

Unfolded correlation matrix for 1<|y|<1.5.

Unfolded correlation matrix for 1.5<|y|<2.

Self-normalised yield of electrons from heavy-flavour hadron decays as a function of normalised charged-particle pseudorapidity density at midrapidity computed in pp collisions at $\sqrt{s}$ = 13 TeV in different $p_{\rm T}$ intervals

Self-normalised yield of electrons from heavy-flavour hadron decays as a function of normalised charged-particle pseudorapidity density at midrapidity computed in p--pPb collisions at $\sqrt{s_{\rm NN}}$ = 8.16 TeV in different $p_{\rm T}$ intervals

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with 400 < $p_{T1}$ < 800 GeV and for an azimuthal separation between the two leading jets of $0 < \Delta\Phi_{1,2} < 150^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with 400 < $p_{T1}$ < 800 GeV and for an azimuthal separation between the two leading jets of $150 < \Delta\Phi_{1,2} < 170^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with 400 < $p_{T1}$ < 800 GeV and for an azimuthal separation between the two leading jets of $170 < \Delta\Phi_{1,2} < 180^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with $p_{T1}$ > 800 and for an azimuthal separation between the two leading jets of $0 < \Delta\Phi_{1,2} < 150^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with $p_{T1}$ > 800 and for an azimuthal separation between the two leading jets of $150 < \Delta\Phi_{1,2} < 170^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with $p_{T1}$ > 800 and for an azimuthal separation between the two leading jets of $170 < \Delta\Phi_{1,2} < 180^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Measured transverse momentum of the leading $p_{T}$ jet ($p_{T1}$). The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Measured transverse momentum of the subleading $p_{T}$ jet ($p_{T2}$). The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Measured transverse momentum of the third leading $p_{T}$ jet ($p_{T3}$). The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Measured transverse momentum of the fourth leading $p_{T}$ jet ($p_{T4}$). The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity distribution in TUnfold binning ($N_{jets},\Delta\phi_{1,2},p_{T1}$) as indicated in the XML file provided as additional resource. The uncertainties follow the notation of Table 1.

Correlation matrix at particle level for the measured jet multiplicity in TUnfold binning ($N_{jets},\Delta\phi_{1,2},p_{T1}$) as indicated in the XML file provided as additional resource.

Jet $p_{T}$ distributions in TUnfold binning ($p_{T1},p_{T2},p_{T3},p_{T4}$) as indicated in the XML file provided as additional resource. The uncertainties follow the notation of Table 1.

Correlation matrix at particle level for the measured jet $p_{T}$ distributions in TUnfold binning ($p_{T1},p_{T2},p_{T3},p_{T4}$) as indicated in the XML file provided as additional resource.

Negative log-likelihood difference in $\text{c}_{\varphi\text{Q}}^{3}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\varphi\text{t}}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\varphi\text{tb}}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\text{tW}}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\text{bW}}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\text{tZ}}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\text{t}\varphi}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\varphi\text{Q}}^{-}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\varphi\text{Q}}^{3}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\varphi\text{t}}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\varphi\text{tb}}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\text{tW}}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\text{bW}}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\text{tZ}}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\varphi\text{t}}, \text{c}_{\varphi\text{Q}}^{-}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\varphi\text{Q}}^{3}, \text{c}_{\varphi\text{Q}}^{-}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\text{tW}}, \text{c}_{\text{tZ}}$ where the other Wilson coefficients are fixed to 0.

Ratio of measured PSI(2S) over J/PSI(1S) cross section in charged-particle multiplicity intervals and integrated in multiplicity.

Ratio of measured PSI(2S) over J/PSI(1S) cross section in charged-particle multiplicity intervals and integrated in multiplicity.

Ratio of measured PSI(2S) over J/PSI(1S) cross section in charged-particle multiplicity intervals and integrated in multiplicity.

Measured inclusive fiducial $tt\gamma$ production cross section in the dilepton final state for the different dilepton-flavour channels and combined.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ .

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ . The values provided in the table are not divided by the bin width.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton measurement.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton and lepton+jets measurements combined.

One-dimensional 68 and 95% CL intervals obtained for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$, using the photon $p_{T}$ distribution from the dilepton analysis, or the combination of photon pT distributions from the dilepton and lepton+jets analyses.

Comparison of observed $95\%$ CL intervals for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$. Results are shown from a CMS ttZ measurement [JHEP 03 (2020) 056], from a CMS ttZ & tZq interpretation [arXiv:2107.13896], from a CMS ttG (lepton+jets) measurement [arXiv:2107.01508], from this measurement, and from a global fit by J. Ellis et al. [JHEP 04 (2021) 279].

Distribution of $m_{T}(W)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $M_{3}$ in the $N_{jet}\geq 3$ signal region.

Distribution of $M_{3}$ in the $N_{jet}\geq 3$ signal region.

Distribution of $m(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $m(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(j,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(j,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for electrons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for electrons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for muons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for muons.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the e channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the e channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the $\mu$ channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the $\mu$ channel.

Extracted scale factors for the contribution from misidentified electrons for the three data-taking periods, and the Z$\gamma$, W$\gamma$ simulations.

Extracted scale factors for the contribution from misidentified electrons for the three data-taking periods, and the Z$\gamma$, W$\gamma$ simulations.

Predicted and observed yields in the control regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the control regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the signal regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the signal regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

The measured inclusive ttgamma cross section in the fiducial phase space compared to the prediction from simulation using Madgraph_aMC@NLO at a center-of-mass energy of 13 TeV.

The measured inclusive ttgamma cross section in the fiducial phase space compared to the prediction from simulation using Madgraph_aMC@NLO at a center-of-mass energy of 13 TeV.

Summary of the measured cross section ratios with respect to the NLO cross section prediction for signal regions binned in the electron channel, muon channel and the combined single lepton measurement.

Summary of the measured cross section ratios with respect to the NLO cross section prediction for signal regions binned in the electron channel, muon channel and the combined single lepton measurement.

The unfolded differential cross sections for $p_{T}(\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $p_{T}(\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $|\eta(\gamma)|$ and the comparison to simulations.

The unfolded differential cross sections for $|\eta(\gamma)|$ and the comparison to simulations.

The unfolded differential cross sections for $\Delta R(l,\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $\Delta R(l,\gamma)$ and the comparison to simulations.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

Summary of the one-dimensional intervals at 68 and 95% CL.

Summary of the one-dimensional intervals at 68 and 95% CL.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the muon channel.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the two-dimensional scan for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the two-dimensional scan for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$.