Selection efficiency x Acceptance for a spin-0 resonance.

Reconstructed m_tt spectrum for the boosted selections.

Reconstructed m_tt spectrum for the resolved selections.

Reconstructed m_tt spectrum for the all the selections.

Limits on the production cross-section x branching ratio to tt final states as a function of the mass of Z'TC2.

Limits on the production cross-section x branching ratio to tt final states as a function of the mass of bulk RS KK graviton.

Limits on the production cross-section x branching ratio to tt final states as a function of the mass of bulk RS KK gluon.

Limits on the production cross-section x branching ratio to tt final states as a function of the mass of a scalar.

Limits on the production cross-section x branching ratio to tt final states as a function of the width of a 1TeV bulk RS KK gluon.

Limits on the production cross-section x branching ratio to tt final states as a function of the width of a 2TeV bulk RS KK gluon.

Limits on the production cross-section x branching ratio to tt final states as a function of the width of a 3TeV bulk RS KK gluon.

Migration from the true mtt values to the reconstructed mtt values for the resolved selection.

Migration from the true mtt values to the reconstructed mtt values for the boosted selection.

Ratio of the Z'NU to Z'SSM acceptance times efficiency (ACC*EFF) in the lep-had channel as a function of sin^2phi and the Z' mass.

Z' SSM acceptance (ACC) and product of acceptance and efficiency (ACC*EFF) for the had-had and lep-had selections as a function of the Z' mass.

Number of expected Z'SSM signal (NS), background (NB) and observed (N) events passing the total transverse mass ($m_{\rm T}^{\rm tot}$) threshold in the had-had and lep-had channels.

Median expected and observed 95% CL upper limits on the cross-section times branching fraction to tau+tau- for Z'SSM production for the exclusive had-had and lep-had channels, and for both channels combined.

Observed 95% CL upper limits on the cross-section times branching fraction to tau+tau- for Z'L and Z'R production for the combination of the had-had and lep-had channels.

Observed 95% CL lower limit on the Z'NU mass as a function of sin^2(phi).

Observed limits on the pair production cross section as a function of mass for vector-like B quarks. These limits assume branching ratios given by the model where the B quark exists as a singlet.

Observed limits on the pair production cross section as a function of mass for vector-like T quarks. These limits assume branching ratios given by the model where the T quark exists as a singlet.

Expected and observed cross section limits as a function of mass on T_5/3 pair production.

Expected and observed cross section limits as a function of mass on T_5/3 pair production plus single production for $\lambda = 0.5$.

Expected and observed cross section limits as a function of mass on T_5/3 pair production plus single production for $\lambda = 1.0$.

Expected and observed limits for the sgluon pair-production cross section times branching ratio to four top quarks as a function of the sgluon mass.

Expected and observed limits on the four- top-quark production rate for the 2UED/RPP model in the symmetric case. The theory line corresponds to the production of four-top-quark events by tier (1, 1) with a branching ratio of A^(1,1) to tttt of 100%.

Detailed list of the contribution of each source of uncertainty to the total uncertainty on the measured values of $\sigma(tq)$, $\sigma(\bar{t}q)$, $R_t$, and $\sigma(tq+\bar{t}q)$. The evaluation of the systematic uncertainties has a statistical uncertainty of $0.3\,\%$. Uncertainties contributing less than $1.0\,\%$ are marked with "$<1$" in the paper. To provide numerical values for this table in HEPdata, these uncertainties are approximated with $\pm 0.5\,\%$. This approximation is applied to all measurements for the following uncertainties$:$ JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by-jets, JES pileup, $b$-JES, jet vertex fraction, mistag efficiency and $W+\;$jets shape variation. For the measurement of $\sigma(tq)$ the approximation is applied in addition to the following uncertainties$:$ JES flavor response, $c$-tagging efficiency, $t\bar{t}$ generator + parton shower and $t\bar{t}$ ISR/FSR. For the measurement of $\sigma(\bar{t}q)$ the approximation is applied in addition to these uncertainties$:$ JES flavor response, $b/\bar{b}$ acceptance, and $t\bar{t}$ ISR/FSR. For the measurement of $R_t$ the approximation is applied in addition to these uncertainties$:$ JES detector, $b$-tagging efficiency, $c$-tagging efficiency, $b/\bar{b}$ acceptance and $tq$ scale variations. For the measurement of $\sigma(tq+\bar{t}q)$ the approximation is applied in addition to these uncertainties$:$ JES flavor response, $c$-tagging efficiency, $b/\bar{b}$ acceptance, $t\bar{t}$ generator + parton shower and $t\bar{t}$ ISR/FSR.

Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(T)).

The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.

Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(TBAR)).

Parametrization factors for the $m_{t}$ dependence [see Eq. (4) in the paper] of $\sigma(tq)$, $\sigma(\bar tq)$, and $\sigma(t q+\bar t q)$.

The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.

The value of $|V_{tb}|^{2}$ is extracted by dividing the measured value of $\sigma(t q+\bar t q)$ by the prediction of the approximate NNLO calculation. The experimental and theoretical uncertainties are added in quadrature.

Event yields for the 2-jet-$\ell^{+}$ and 2-jet-$\ell^{-}$ HPR channels. The expectation for the signal and background yields correspond to the result of the binned maximum-likelihood fit described in Sec. $\mathrm{VI~D}$ in the paper. The uncertainty of the expectations is the normalization uncertainty of each process after the fit, as described in Sec. $\mathrm{VII~F}$ in the paper.

Migration matrix relating the parton level $p_{\mathrm{T}}(t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-quark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $p_{\mathrm{T}}(\bar t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-antiquark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $|y(t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-quark $|y|$ distribution.

Migration matrix relating the parton level $|y(\bar t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-antiquark $|y|$ distribution.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Comparison between the measured differential cross sections and the predictions from the NLO calculation using the MSTW2008 PDF set. For each variable and prediction a $\chi^{2}$ value is calculated with HERAfitter using the covariance matrix of each measured spectrum. The theory uncertainties of the predictions are treated as uncorrelated. The number of degrees of freedom (NDF) is equal to the number of bins in the measured spectrum.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, mistag efficiency, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The JES $\eta$ intercalibration uncertainty has a sign switch from the first to the second bin. For the $tq$ generator $+$ parton shower uncertainty a sign switch is denoted with $\mp$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $c-$tagging efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content $:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet energy resolution, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$ tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the differential cross section as a function of $|y(\bar t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(\bar t)|$.

The differential cross section measurement as a function of the transverse momentum of the second leading jet.

The differential cross section measurement as a function of the transverse momentum of the third leading jet.

The differential cross section measurement as a function of the transverse momentum of the fourth leading jet.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for jet multiplicities of one or more.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for jet multiplicities of two or more.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for jet multiplicities of three or more.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for jet multiplicities of four or more.

The differential cross section measurement as a function of the absolute value of the pseudorapidity of the first leading jet.

The differential cross section measurement as a function of the absolute value of the pseudorapidity of the first second jet.

The differential cross section measurement as a function of the absolute value of the pseudorapidity of the third leading jet.

The differential cross section measurement as a function of the absolute value of the pseudorapidity of the fourth leading jet.

The differential cross section measurement as a function of the absolute value of the azimuthal separation between the first leading jet and the muon.

The differential cross section measurement as a function of the absolute value of the azimuthal separation between the second leading jet and the muon.

The differential cross section measurement as a function of the absolute value of the azimuthal separation between the third leading jet and the muon.

The differential cross section measurement as a function of the absolute value of the azimuthal separation between the fourth leading jet and the muon.

Additional systematic error given above.

Integration of fits to the differential data.

Post-fit background and signal yields in the full signal region. The total systematic uncertainty differs from the sum in quadrature of the different uncertainties due to correlations. Q mis-id refers to the charge misassignment background. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair. HF $e$ (HF $\mu$) refers to events with one non-prompt electron (muon) from heavy-flavour hadron decay, LF refers to events with a lepton originating from light-meson decay, and 'Other $t\bar{t}X$' includes events coming from $t\bar{t}WZ$, $t\bar{t}Z$+jets, $t\bar{t}WH$, $t\bar{t}HH$.

Ranking of the nuisance parameters included in the fit according to their impact on the signal strength $\mu$. Only the 20 most highly ranked nuisance parameters are shown in the thumbnail figure. The empty blue rectangles correspond to the pre-fit impact on $\mu$ and the filled blue ones to the post-fit impact on $\mu$, both referring to the upper $x$-axis scale. The impact of each nuisance parameter, $\Delta\mu$, is computed by comparing the nominal best-fit value of $\mu$ with the result of the fit when fixing the nuisance parameter to its best-fit value, $\hat{\theta}$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta\theta$ ($\pm \Delta\hat{\theta}$). The black points show the pulls of the parameter relative to their nominal values, $\theta_0$. The nominal value for all parameters is $\theta_0 = 0$. The pulls of the most impactful parameters and their relative post-fit errors, $\Delta\hat{\theta}/\Delta\theta$, are referenced to the lower $x$-axis scale. In the table, POI means Parameter of Interest.

Comparison between data and prediction before the fit ('Pre-Fit') for the 'HF e' control region. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction before the fit ('Pre-Fit') for the 'HF mu' control region. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction before the fit ('Pre-Fit') for the $m_{ee}^{PV}$ variable in the 'Conv.' control region. The first and last bins contain underflow and overflow events, respectively. Q mis-id refers to the charge misassignment background. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction before the fit ('Pre-Fit') for the $\Sigma p_{T}^{l}$ variable in the 'ttW' control region. The first and last bins contain underflow and overflow events, respectively. Q mis-id refers to the charge misassignment background. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction after the fit ('Post-Fit') for the 'HF e' control region. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction after the fit ('Post-Fit') for the 'HF mu' control region. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction after the fit ('Post-Fit') for the $m_{ee}^{PV}$ variable in the 'Conv.' control region. The first and last bins contain underflow and overflow events, respectively. Q mis-id refers to the charge misassignment background. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction after the fit ('Post-Fit') for the $\Sigma p_{T}^{l}$ variable in the in 'ttW' control region. The first and last bins contain underflow and overflow events, respectively. Q mis-id refers to the charge misassignment background. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction before the fit ('Pre-Fit') for the BDT score in the signal region. The first and last bins contain underflow and overflow events, respectively. Q mis-id refers to the charge misassignment background. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction after the fit ('Post-Fit') for the BDT score in the signal region. The first and last bins contain underflow and overflow events, respectively. Q mis-id refers to the charge misassignment background. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.