Observed and expected upper limits at 95% CL on the production cross-section times branching fraction as a function of $m_{A'}$ at dark Higgs boson mass of 50 GeV

Observed and expected upper limits at 95% CL on the production cross-section times branching fraction as a function of $m_{A'}$ at dark Higgs boson mass of 60 GeV

Observed and expected upper limits at 95% CL on the production cross-section times branching fraction as a function of $m_{A'}$ at dark Higgs boson mass of 70 GeV

Observed 90% CL upper limits on $\alpha_{D}\epsilon^{2}$ as a function of $m_{A'}$ at dark Higgs boson mass of 20 GeV

Observed 90% CL upper limits on $\alpha_{D}\epsilon^{2}$ as a function of $m_{A'}$ at dark Higgs boson mass of 30 GeV

Observed 90% CL upper limits on $\alpha_{D}\epsilon^{2}$ as a function of $m_{A'}$ at dark Higgs boson mass of 40 GeV

Observed 90% CL upper limits on $\alpha_{D}\epsilon^{2}$ as a function of $m_{A'}$ at dark Higgs boson mass of 50 GeV

Observed 90% CL upper limits on $\alpha_{D}\epsilon^{2}$ as a function of $m_{A'}$ at dark Higgs boson mass of 60 GeV

Observed 90% CL upper limits on $\alpha_{D}\epsilon^{2}$ as a function of $m_{A'}$ at dark Higgs boson mass of 70 GeV

Observed 90% CL upper limits on $\epsilon^{2}$, assuming of $\alpha_{D}=0.1$, as a function of $m_{A'}$ at dark Higgs boson mass of 20 GeV

Observed 90% CL upper limits on $\epsilon^{2}$, assuming of $\alpha_{D}=0.1$, as a function of $m_{A'}$ at dark Higgs boson mass of 30 GeV

Observed 90% CL upper limits on $\epsilon^{2}$, assuming of $\alpha_{D}=0.1$, as a function of $m_{A'}$ at dark Higgs boson mass of 40 GeV

Observed 90% CL upper limits on $\epsilon^{2}$, assuming of $\alpha_{D}=0.1$, as a function of $m_{A'}$ at dark Higgs boson mass of 50 GeV

Observed 90% CL upper limits on $\epsilon^{2}$, assuming of $\alpha_{D}=0.1$, as a function of $m_{A'}$ at dark Higgs boson mass of 60 GeV

Observed 90% CL upper limits on $\epsilon^{2}$, assuming of $\alpha_{D}=0.1$, as a function of $m_{A'}$ at dark Higgs boson mass of 70 GeV

Observed and expected upper limits at 95% CL on the branching fraction as a function of $m_{A'}$ at dark Higgs boson mass of 20 GeV

Observed and expected upper limits at 95% CL on the branching fraction as a function of $m_{A'}$ at dark Higgs boson mass of 30 GeV

Observed and expected upper limits at 95% CL on the branching fraction as a function of $m_{A'}$ at dark Higgs boson mass of 40 GeV

Observed and expected upper limits at 95% CL on the branching fraction as a function of $m_{A'}$ at dark Higgs boson mass of 50 GeV

Observed and expected upper limits at 95% CL on the branching fraction as a function of $m_{A'}$ at dark Higgs boson mass of 60 GeV

Observed and expected upper limits at 95% CL on the branching fraction as a function of $m_{A'}$ at dark Higgs boson mass of 70 GeV

Observed and expected upper limits at 95% CL on $\alpha_{D}\epsilon^{2}$ as a function of $m_{A'}$ at dark Higgs boson mass of 20 GeV

Observed and expected upper limits at 95% CL on $\alpha_{D}\epsilon^{2}$ as a function of $m_{A'}$ at dark Higgs boson mass of 30 GeV

Observed and expected upper limits at 95% CL on $\alpha_{D}\epsilon^{2}$ as a function of $m_{A'}$ at dark Higgs boson mass of 40 GeV

Observed and expected upper limits at 95% CL on $\alpha_{D}\epsilon^{2}$ as a function of $m_{A'}$ at dark Higgs boson mass of 50 GeV

Observed and expected upper limits at 95% CL on $\alpha_{D}\epsilon^{2}$ as a function of $m_{A'}$ at dark Higgs boson mass of 60 GeV

Observed and expected upper limits at 95% CL on $\alpha_{D}\epsilon^{2}$ as a function of $m_{A'}$ at dark Higgs boson mass of 70 GeV

Measured unfolded differential cross-section as a function of the dilepton transverse momentum $p^{ll}_{\mathrm{T}}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the the four-body transverse momentum $p^{ll\gamma\gamma}_{\mathrm{T}}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the diphoton invariant mass $m_{\gamma\gamma}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the four-body invariant mass $m_{ll\gamma\gamma}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Expected and observed $95\%$ confidence intervals for the coupling parameters $f_{T,j}/\Lambda^{4}$ of transverse dimension-8 operators. All parameter values outside of the stated range are excluded at the chosen confidence level. No unitarity constraints are applied.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,8}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,0}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,1}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,2}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,5}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,6}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,7}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,9}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Measured fiducial differential cross sections for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Measured fiducial differential cross sections for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Differential fiducial cross section of the Z boson $|y|$ in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the leading b-jet $|y|$ in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta \phi$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta y$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta R$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta \phi$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta y$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta R$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the invariant mass of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the Z boson $p_{\text{T}}$ in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $p_{\text{T}}$ of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the ratio between the $p_{\text{T}}$ and the invariant mass of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.