Systematic covariance matrix for the differential cross-section distribution.

Distribution of $E_{\text{T}}^{\text{miss}}$ in SROS-on-b-$e\mu\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. The hatched band includes all statistical and systematic uncertainties.

Distribution of $m_{\text{T}}^{\text{min}}$ in SROS-on-b-$e\mu\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. The hatched band includes all statistical and systematic uncertainties.

Distribution of $E_{\text{T}}^{\text{miss}}$ in SRSS-$2\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. The hatched band includes all statistical and systematic uncertainties.

Observed ($N_{\text{obs}}$) and expected ($N_{\text{exp}}$) yields after the background-only fit for the flavor-merged inclusive SRs. The third and fourth columns list the 95\% CL upper limits on the visible cross-section ($\sigma_{\text{vis}}^{95}$) and on the number of signal events ($S_\text{obs}^{95}$). The fifth column ($S_\text{exp}^{95}$) shows the 95\% CL upper limit on the number of signal events, given the expected number of background events and its $\pm 1\sigma$ variations. The last two columns indicate the CL$_{\text{b}}$ value, i.e. the confidence level observed for the background-only hypothesis, and the discovery $p$-value ($p(s = 0)$) with its associated statistical significance $Z$. If the observed yield is below the expected yield, the $p$-value is capped at 0.5.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Distribution of $E_{\text{T}}^{\text{miss}}$ in SROS-off-b-$e\mu\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. Ratio values outside the graph range are indicated by brown arrows. The hatched band includes all statistical and systematic uncertainties.

Distribution of $m_{\text{T}}^{\text{min}}$ in SROS-off-b-$e\mu\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. Ratio values outside the graph range are indicated by brown arrows. The hatched band includes all statistical and systematic uncertainties.

Distribution of $E_{\text{T}}^{\text{miss}}$ in SRSS-$eee$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. Ratio values outside the graph range are indicated by brown arrows. The hatched band includes all statistical and systematic uncertainties.

Distribution of $E_{\text{T}}^{\text{miss}}$ in SRSS-$ee\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. Ratio values outside the graph range are indicated by brown arrows. The hatched band includes all statistical and systematic uncertainties.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

The expected upper limits on the cross-section for each signal point. The gray numbers represent the values. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid. An asymptotic approximation is employed in the CL$_{\text{s}}$ calculation instead of the full calculation using pseudo-experiments.

The observed upper limits on the cross-section for each signal point. The gray numbers represent the values. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid. An asymptotic approximation is employed in the CL$_{\text{s}}$ calculation instead of the full calculation using pseudo-experiments.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Summary of the number of events passing each selection for the $m(\tilde{\ell}_{\text{L}}^{\pm},\tilde{\chi}^0_3,\tilde{\chi}^0_1)=(300, 200, 100)$, $(550, 300, 100)$, $(450, 180, 100)$ GeV signal points, including all production processes. After the initial selections, the table is split into row blocks per inclusive region, and then further for each SR channel. Flavor-binned SRs are shown for SROS-on-b for reference. The generator level selections require to have two or more leptons.

Summary of the number of events passing each selection for the $m(\tilde{\ell}_{\text{L}}^{\pm},\tilde{\chi}^0_3,\tilde{\chi}^0_1)=(300, 200, 100)$, $(550, 300, 100)$, $(450, 180, 100)$ GeV signal points, including all production processes. After the initial selections, the table is split into row blocks per inclusive region, and then further for each SR channel. Flavor-binned SRs are shown for SROS-off-b for reference. The generator level selections require to have two or more leptons.

Summary of the number of events passing each selection for the $m(\tilde{\ell}_{\text{L}}^{\pm},\tilde{\chi}^0_3,\tilde{\chi}^0_1)=(300, 200, 100)$, $(550, 300, 100)$, $(450, 180, 100)$ GeV signal points, including all production processes. After the initial selections, the table is split into row blocks per inclusive region, and then further for each SR channel. Flavor-binned SRs are shown. The generator level selections require to have two or more leptons.

The Charged-hadron yields as a function of pT in different y selections in p+Pb collisions.

The K^{0}_{S} yields as a function of pT in different y selections in Pb+Pb photo-nuclear collisions.

The #Lambda yields as a function of pT in different y selections in Pb+Pb photo-nuclear collisions.

The #Xi^{-} yields as a function of pT in different y selections in Pb+Pb photo-nuclear collisions.

The K^{0}_{S} yields as a function of pT in different y selections in p+Pb collisions.

The #Lambda yields as a function of pT in different y selections in p+Pb collisions.

The #Xi^{-} yields as a function of pT in different y selections in p+Pb collisions.

The Charged-hadron and identified-hadron yields as a function of y in Pb+Pb photo-nuclear collisions.

The Charged-hadron and identified-hadron yields as a function of y in Pb+Pb photo-nuclear collisions.

The Charged-hadron and identified-hadron yields as a function of y in p+Pb collisions.

The Charged-hadron and identified-hadron yields as a function of y in p+Pb collisions.

The meanpT of charged hadrons and identified hadrons as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The meanpT of charged hadrons and identified hadrons as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The meanpT of charged hadrons and identified hadrons as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The meanpT of charged hadrons and identified hadrons as a function of Nchrec in p+Pb collisions.

The meanpT of charged hadrons and identified hadrons as a function of Nchrec in p+Pb collisions.

The baryon to meson ratio as a function of pT in Pb+Pb photo-nuclear collisions.

The baryon to meson ratio as a function of pT in Pb+Pb photo-nuclear collisions.

The baryon to meson ratio as a function of pT in p+Pb collisions.

The baryon to meson ratio as a function of pT in p+Pb collisions.

The ratios of identified-strange-hadron yield to charged-hadron yields as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The ratios of identified-strange-hadron yield to charged-hadron yields as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The ratios of identified-strange-hadron yield to charged-hadron yields as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The ratios of identified-strange-hadron yield to charged-hadron yields as a function of Nchrec in p+Pb collisions.

The ratios of identified-strange-hadron yield to charged-hadron yields as a function of Nchrec in p+Pb collisions.

The observed EFT limits at 95% CL, shown for the linear+quadratic electron, muon, and combined fits.

The expected EFT limits at 95% CL, shown for the linear-only electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.

The expected EFT limits at 95% CL, shown for the linear+quadratic electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.

The observed EFT limits at 95% CL, shown for the linear-only electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.

The observed EFT limits at 95% CL, shown for the linear+quadratic electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.

Born-level single-differential cross section $\frac{d\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross section $\frac{d\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross section $\frac{d\sigma (W\to e\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross-section $\frac{d\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross-section $\frac{d\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross-section $\frac{d\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^+$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^-$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^+$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^-$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Ratio of the $e^\pm$- and $\mu^\pm$-channel single-differential cross sections including the absolute data statistical, $e$-$\mu$-uncorrelated (including signal and background statistical) and $e$-$\mu$-correlated systematic uncertainties and the total uncertainty.

Ratio of the $e^\pm$- and $\mu^\pm$-channel double-differential cross sections including the absolute data statistical, $e$-$\mu$-uncorrelated (including signal and background statistical) and $e$-$\mu$-correlated systematic uncertainties and the total uncertainty.

Asymmetry of the $\ell^+$- and $\ell^-$-channel single-differential cross-sections including the absolute total statistical and $\ell^+$-$\ell^-$-correlated systematic uncertainties and the total uncertainty.

Asymmetry of the $\ell^+$- and $\ell^-$-channel double-differential cross sections including the absolute total statistical and $\ell^+$-$\ell^-$-correlated systematic uncertainties and the total uncertainty.

Pre-fit MC statistical uncertainties per bin. These values are used to quantify the MC statistical uncertainty contributions to the total uncertainty in $m_t$ based on elements from the covariance matrix obtained in the profile likelihood fit. Each MC statistical contribution is estimated by dividing the relevant covariance matrix entry (see Table 2) by the corresponding pre-fit MC statistical uncertainty for that bin.

The contribution of each source of systematic uncertainty to the total uncertainty in $m_t$ is provided. Each source's contribution is taken directly from the relevant element of the covariance matrix for the profile likelihood fit to $\overline{m_J}$, $m_{jj}$, and $m_{tj}$ using data. The sign of the effect of each uncertainty is included.

The fitted $m_t$ is provided for each replica generated using bootstrapping. Each replica is a 3D histogram of $m_{J}$, $m_{jj}$, and $m_{tj}$, where $m_{J}$ has 50 bins between 145.0 GeV and 205.0 GeV. This method uses the BootstrapGenerator class in ROOT to initialise a pseudo-random number generator for each event, which is seeded by the value of the eventNumber and runNumber variables for a given event in the input dataset. The pseudo-random numbers are drawn from a Poisson distribution with rate parameter equal to 1. These are used to fluctuate the amount by which each replica histogram is filled. There are 1000 replicas, numbered from 0 to 999.

The contour for the excluded mass--lifetime region for stau pair production obtained with the di-track search. All masses and lifetimes shown that are below the curve and above 200 GeV are excluded by the observed data (while the expected exclusion is between the upper curve down to 210 GeV for lifetimes above 3000 ns). The sensitivity extends indefinitely to longer lifetimes.

The contour for the excluded mass--lifetime region for stau pair production obtained with the di-track search. All masses and lifetimes shown that are below the curve and above 200 GeV are excluded by the observed data (while the expected exclusion is between the upper curve down to 210 GeV for lifetimes above 3000 ns). The sensitivity extends indefinitely to longer lifetimes.

The contour for the excluded mass--lifetime region for stau pair production obtained with the di-track search. All masses and lifetimes shown that are below the curve and above 200 GeV are excluded by the observed data (while the expected exclusion is between the upper curve down to 210 GeV for lifetimes above 3000 ns). The sensitivity extends indefinitely to longer lifetimes.

The distribution of data and predicted background in the di-track Exclusion-SR. The observed data events are indicated as magenta circles if they are inside the mass-compatibility angle (shown as grey lines) and as orange diamonds if they are outside, while the blue area is the mass distribution of the expected background. The last bins include overflow events

The distribution of data and predicted background in the di-track Exclusion-SR. The observed data events are indicated as magenta circles if they are inside the mass-compatibility angle (shown as grey lines) and as orange diamonds if they are outside, while the blue area is the mass distribution of the expected background. The last bins include overflow events

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

Observed and expected 95 % CL exclusion limits on $\tan\beta$ as a function of $m_{H^{\pm}}$, shown in the context of the mh125 scenario, for $m_{H^{\pm}}>150$ GeV and $(1 \leq \tan\beta \leq 60)$. The surrounding shaded bands correspond to the 1$\sigma$ and 2$\sigma$ confidence intervals around the expected limit.

Observed and expected 95 % CL exclusions on $\tan\beta$ as a function of $m_{H^{\pm}}$ derived from exclusion limits on $\mathrm{\cal{B}}(t\to bH^+)\times \mathrm{\cal{B}}(H^+ \to \tau \nu)$, for Type I 2HDM low mass scenario. The surrounding shaded bands correspond to the 1$\sigma$ and 2$\sigma$ confidence intervals around the expected limit.

Observed and expected 95 % CL exclusions on $\tan\beta$ as a function of $m_{H^{\pm}}$ derived from exclusion limits on $\mathrm{\cal{B}}(t\to bH^+)\times \mathrm{\cal{B}}(H^+ \to \tau \nu)$, for Lepton Specific 2HDM low mass scenario. The surrounding shaded bands correspond to the 1$\sigma$ and 2$\sigma$ confidence intervals around the expected limit.

The distribution of the $p_\mathrm{T}{}_{\mu\mathrm{-had}}^\mathrm{col}$ in the VR. `$Z(\rightarrow\tau\tau)+\text{jets}$' represents the contributions from the signal process. `Diboson' indicates the contributions from $WW$, $WZ$, and $ZZ$ processes. `Top' represents the predicted contributions from the $t\bar{t}$, single-top-quark, and $tW$ processes. `Other' includes the contributions from the $Z(\rightarrow\ell\ell)$+jets, $W$+jets, and Higgs boson processes. The uncertainties shown include both statistical and systematic sources.

The distributions of $m_{\mu\mathrm{-had}}^\mathrm{col}$ corresponding to the SR selection criteria defined in the text. `$Z(\rightarrow\tau\tau)+\text{jets}$' represents the contributions from the signal process. `Diboson' indicates the contributions from $WW$, $WZ$, and $ZZ$ processes. `Top' represents the predicted contributions from the $t\bar{t}$, single-top-quark, and $tW$ processes. `Other' includes the contributions from the $Z(\rightarrow\ell\ell)$+jets, $W$+jets, and Higgs boson processes. The uncertainties shown include both statistical and systematic sources.

The distributions of $m_{\mu\mathrm{-had}}^\mathrm{col}$ corresponding to the SR_\text{std} selection criteria defined in the text. `$Z(\rightarrow\tau\tau)+\text{jets}$' represents the contributions from the signal process. `Diboson' indicates the contributions from $WW$, $WZ$, and $ZZ$ processes. `Top' represents the predicted contributions from the $t\bar{t}$, single-top-quark, and $tW$ processes. `Other' includes the contributions from the $Z(\rightarrow\ell\ell)$+jets, $W$+jets, and Higgs boson processes. The uncertainties shown include both statistical and systematic sources.

The distributions of $m_{\mu\mathrm{-had}}^\mathrm{col}$ corresponding to the SR_\text{tight} selection criteria defined in the text. `$Z(\rightarrow\tau\tau)+\text{jets}$' represents the contributions from the signal process. `Diboson' indicates the contributions from $WW$, $WZ$, and $ZZ$ processes. `Top' represents the predicted contributions from the $t\bar{t}$, single-top-quark, and $tW$ processes. `Other' includes the contributions from the $Z(\rightarrow\ell\ell)$+jets, $W$+jets, and Higgs boson processes. The uncertainties shown include both statistical and systematic sources.

The distributions of $m_{\mu\mathrm{-had}}^\mathrm{col}$ corresponding to the SR_\text{tight}^\text{std} selection criteria defined in the text. `$Z(\rightarrow\tau\tau)+\text{jets}$' represents the contributions from the signal process. `Diboson' indicates the contributions from $WW$, $WZ$, and $ZZ$ processes. `Top' represents the predicted contributions from the $t\bar{t}$, single-top-quark, and $tW$ processes. `Other' includes the contributions from the $Z(\rightarrow\ell\ell)$+jets, $W$+jets, and Higgs boson processes. The uncertainties shown include both statistical and systematic sources.

The distribution of $\Delta\phi^\mathrm{signed}_{\mu-MET}$ with all other event selection criteria applied in the SR; the straight lines indicate the positions of the selection requirements. `$Z(\rightarrow\tau\tau)+\text{jets}$' represents the contributions from the signal process. `Diboson' indicates the contributions from $WW$, $WZ$, and $ZZ$ processes. `Top' represents the predicted contributions from the $t\bar{t}$, single-top, and $tW$ processes. `Other' includes the contributions from the $Z(\rightarrow\ell\ell)$+jets, $W$+jets, and Higgs boson processes. The uncertainties shown include both statistical and systematic errors.

The distribution of $\Delta\phi^\mathrm{signed}_{\mu-MET}$ with all other event selection criteria applied in the VR; the straight lines indicate the positions of the selection requirements. `$Z(\rightarrow\tau\tau)+\text{jets}$' represents the contributions from the signal process. `Diboson' indicates the contributions from $WW$, $WZ$, and $ZZ$ processes. `Top' represents the predicted contributions from the $t\bar{t}$, single-top, and $tW$ processes. `Other' includes the contributions from the $Z(\rightarrow\ell\ell)$+jets, $W$+jets, and Higgs boson processes. The uncertainties shown include both statistical and systematic errors.

The distribution of the $m_{\mu\mathrm{-had}}^\mathrm{col}$ in the SR. `$Z(\rightarrow\tau\tau)+\text{jets}$' represents the contributions from the signal process. `Diboson' indicates the contributions from $WW$, $WZ$, and $ZZ$ processes. `Top' represents the predicted contributions from the $t\bar{t}$, single-top, and $tW$ processes. `Other' includes the contributions from the $Z(\rightarrow\ell\ell)$+jets, $W$+jets, and Higgs boson processes. The uncertainties shown include both statistical and systematic errors.

The distribution of the $m_{\mu\mathrm{-had}}^\mathrm{col}$ in the VR. `$Z(\rightarrow\tau\tau)+\text{jets}$' represents the contributions from the signal process. `Diboson' indicates the contributions from $WW$, $WZ$, and $ZZ$ processes. `Top' represents the predicted contributions from the $t\bar{t}$, single-top, and $tW$ processes. `Other' includes the contributions from the $Z(\rightarrow\ell\ell)$+jets, $W$+jets, and Higgs boson processes. The uncertainties shown include both statistical and systematic errors.

The distribution of the $p_\mathrm{T}$ of the $\tau_\mathrm{had}^{\mu\mkern-10mu\backslash}$ in the SR. `$Z(\rightarrow\tau\tau)+\text{jets}$' represents the contributions from the signal process. `Diboson' indicates the contributions from $WW$, $WZ$, and $ZZ$ processes. `Top' represents the predicted contributions from the $t\bar{t}$, single-top, and $tW$ processes. `Other' includes the contributions from the $Z(\rightarrow\ell\ell)$+jets, $W$+jets, and Higgs boson processes. The uncertainties shown include both statistical and systematic errors.

The distribution of the $p_\mathrm{T}$ of the $\tau_\mathrm{had}^{\mu\mkern-10mu\backslash}$ in the VR. `$Z(\rightarrow\tau\tau)+\text{jets}$' represents the contributions from the signal process. `Diboson' indicates the contributions from $WW$, $WZ$, and $ZZ$ processes. `Top' represents the predicted contributions from the $t\bar{t}$, single-top, and $tW$ processes. `Other' includes the contributions from the $Z(\rightarrow\ell\ell)$+jets, $W$+jets, and Higgs boson processes. The uncertainties shown include both statistical and systematic errors.

The distribution of the $p_\mathrm{T}$ of the muon removed from the $\tau_\mathrm{had}^{\mu\mkern-10mu\backslash}$ in the SR `$Z(\rightarrow\tau\tau)+\text{jets}$' represents the contributions from the signal process. `Diboson' indicates the contributions from $WW$, $WZ$, and $ZZ$ processes. `Top' represents the predicted contributions from the $t\bar{t}$, single-top, and $tW$ processes. `Other' includes the contributions from the $Z(\rightarrow\ell\ell)$+jets, $W$+jets, and Higgs boson processes. The uncertainties shown include both statistical and systematic errors.

The distribution of the $p_\mathrm{T}$ of the muon removed from the $\tau_\mathrm{had}^{\mu\mkern-10mu\backslash}$ in the VR `$Z(\rightarrow\tau\tau)+\text{jets}$' represents the contributions from the signal process. `Diboson' indicates the contributions from $WW$, $WZ$, and $ZZ$ processes. `Top' represents the predicted contributions from the $t\bar{t}$, single-top, and $tW$ processes. `Other' includes the contributions from the $Z(\rightarrow\ell\ell)$+jets, $W$+jets, and Higgs boson processes. The uncertainties shown include both statistical and systematic errors.

The distribution of the $p_\mathrm{T}$ of the leading jet in the SR. `$Z(\rightarrow\tau\tau)+\text{jets}$' represents the contributions from the signal process. `Diboson' indicates the contributions from $WW$, $WZ$, and $ZZ$ processes. `Top' represents the predicted contributions from the $t\bar{t}$, single-top, and $tW$ processes. `Other' includes the contributions from the $Z(\rightarrow\ell\ell)$+jets, $W$+jets, and Higgs boson processes. The uncertainties shown include both statistical and systematic errors.

The distribution of the $p_\mathrm{T}$ of the leading jet in the VR. `$Z(\rightarrow\tau\tau)+\text{jets}$' represents the contributions from the signal process. `Diboson' indicates the contributions from $WW$, $WZ$, and $ZZ$ processes. `Top' represents the predicted contributions from the $t\bar{t}$, single-top, and $tW$ processes. `Other' includes the contributions from the $Z(\rightarrow\ell\ell)$+jets, $W$+jets, and Higgs boson processes. The uncertainties shown include both statistical and systematic errors.

The distribution of the $\Delta{R}_{\tau\tau}^\mathrm{reco}$ between the muon and the $\tau_\mathrm{had}^{\mu\mkern-10mu\backslash}$ in the SR `$Z(\rightarrow\tau\tau)+\text{jets}$' represents the contributions from the signal process. `Diboson' indicates the contributions from $WW$, $WZ$, and $ZZ$ processes. `Top' represents the predicted contributions from the $t\bar{t}$, single-top, and $tW$ processes. `Other' includes the contributions from the $Z(\rightarrow\ell\ell)$+jets, $W$+jets, and Higgs boson processes. The uncertainties shown include both statistical and systematic errors.

The distribution of the $\Delta{R}_{\tau\tau}^\mathrm{reco}$ between the muon and the $\tau_\mathrm{had}^{\mu\mkern-10mu\backslash}$ in the VR `$Z(\rightarrow\tau\tau)+\text{jets}$' represents the contributions from the signal process. `Diboson' indicates the contributions from $WW$, $WZ$, and $ZZ$ processes. `Top' represents the predicted contributions from the $t\bar{t}$, single-top, and $tW$ processes. `Other' includes the contributions from the $Z(\rightarrow\ell\ell)$+jets, $W$+jets, and Higgs boson processes. The uncertainties shown include both statistical and systematic errors.

The distribution of the reconstructed $E_\mathrm{T}^\mathrm{miss}$ in the SR `$Z(\rightarrow\tau\tau)+\text{jets}$' represents the contributions from the signal process. `Diboson' indicates the contributions from $WW$, $WZ$, and $ZZ$ processes. `Top' represents the predicted contributions from the $t\bar{t}$, single-top, and $tW$ processes. `Other' includes the contributions from the $Z(\rightarrow\ell\ell)$+jets, $W$+jets, and Higgs boson processes. The uncertainties shown include both statistical and systematic errors.

The distribution of the reconstructed $E_\mathrm{T}^\mathrm{miss}$ in the VR `$Z(\rightarrow\tau\tau)+\text{jets}$' represents the contributions from the signal process. `Diboson' indicates the contributions from $WW$, $WZ$, and $ZZ$ processes. `Top' represents the predicted contributions from the $t\bar{t}$, single-top, and $tW$ processes. `Other' includes the contributions from the $Z(\rightarrow\ell\ell)$+jets, $W$+jets, and Higgs boson processes. The uncertainties shown include both statistical and systematic errors.

The observed and expected ($\pm2\sigma$) upper limits at 95% CL on the branching ratio for $H\rightarrow aa\rightarrow \gamma\gamma\tau\tau$ as a function of the resonance mass hypothesis $m_{a}$.

The polynomial parameterisation of the total signal selection efficiency as a function of $m_{a}$, defined as the fraction of the reconstructed and selected events out of the total number of events in the signal simulated samples.

Values of the test statistic $t_{\kappa_{g,\mathrm{off-shell}}}$ as a function of $\kappa_{g,\mathrm{off-shell}}$ while profiling $\kappa_{V,\mathrm{off-shell}}$ obtained with an Asimov dataset and with data. The values with all nuisance parameters fixed at their best-fit values (stat-only) are added for comparison. The 68% and 95% confidence intervals obtained from the Neyman construction are also added.

Values of the test statistic $t_{\kappa_{V,\mathrm{off-shell}}}$ as a function of $\kappa_{V,\mathrm{off-shell}}$ while profiling $\kappa_{g,\mathrm{off-shell}}$ obtained with an Asimov dataset and with data. The values with all nuisance parameters fixed at their best-fit values (stat-only) are added for comparison. The 68% and 95% confidence intervals obtained from the Neyman construction are also added.

Values of the test statistic $t_{\kappa_{H}}$ as a function of $\kappa_{H}=\Gamma_H/\Gamma_H^{\mathrm{SM}}$ obtained with an Asimov dataset and with data. The values with all nuisance parameters fixed at their best-fit values (stat-only) are added for comparison. The 68% and 95% confidence intervals obtained from the Neyman construction are also added.

Values of the test statistic $t_{R_{gg}}$ as a function of $R_{gg}=\kappa_{g,\mathrm{on-shell}}^2/\kappa_{g,\mathrm{off-shell}}^2$ while profiling $R_{VV}=\kappa_{V,\mathrm{on-shell}}^2/\kappa_{V,\mathrm{off-shell}}^2$ and fixing $\kappa_H=1$ obtained with an Asimov dataset and with data. The values with all nuisance parameters fixed at their best-fit values (stat-only) are added for comparison. The 68% and 95% confidence intervals obtained from the Neyman construction are also added.

Values of the test statistic $t_{R_{VV}}$ as a function of $R_{VV}=\kappa_{V,\mathrm{on-shell}}^2/\kappa_{V,\mathrm{off-shell}}^2$ while profiling $R_{gg}=\kappa_{g,\mathrm{on-shell}}^2/\kappa_{g,\mathrm{off-shell}}^2$ and fixing $\kappa_H=1$ obtained with an Asimov dataset and with data. The values with all nuisance parameters fixed at their best-fit values (stat-only) are added for comparison. The 68% and 95% confidence intervals obtained from the Neyman construction are also added.

Values of the test statistic $t_{\mu_{\mathrm{off-shell}}}$ assuming a single parameter of interest $\mu_{\mathrm{off-shell}}$ obtained with an Asimov dataset and with data when combining the $H^*\rightarrow ZZ\rightarrow 4\ell$ and $H^*\rightarrow ZZ\rightarrow 2\ell 2\nu$ decay channels. The values from the histogram-based analysis (Phys. Lett. B 846 (2023) 138223) are added for comparison. The 68% and 95% confidence intervals obtained from the Neyman construction are also added.

Values of the test statistic $t_{\kappa_{H}}$ as a function of $\kappa_{H}=\Gamma_H/\Gamma_H^{\mathrm{SM}}$ obtained with an Asimov dataset and with data in the $H^*\rightarrow ZZ\rightarrow 4\ell$ decay channel. The values from the histogram-based analysis (Phys. Lett. B 846 (2023) 138223) are added for comparison. The 68% and 95% confidence intervals obtained from the Neyman construction are also added.

Values of the test statistic $t_{\kappa_{H}}$ as a function of $\kappa_{H}=\Gamma_H/\Gamma_H^{\mathrm{SM}}$ obtained with an Asimov dataset and with data when combining the $H^*\rightarrow ZZ\rightarrow 4\ell$ and $H^*\rightarrow ZZ\rightarrow 2\ell 2\nu$ decay channels. The values from the histogram-based analysis (Phys. Lett. B 846 (2023) 138223) are added for comparison. The 68% and 95% confidence intervals obtained from the Neyman construction are also added.

Values of the test statistic $t_{R_{gg}}$ as a function of $R_{gg}$ while profiling $R_{VV}$ and fixing $\kappa_H=1$ obtained with an Asimov dataset and with data. The values from the histogram-based analysis (Phys. Lett. B 846 (2023) 138223) are added for comparison. The 68% and 95% confidence intervals obtained from the Neyman construction are also added.

Values of the test statistic $t_{R_{VV}}$ as a function of $R_{VV}$ while profiling $R_{gg}$ and fixing $\kappa_H=1$ obtained with an Asimov dataset and with data. The values from the histogram-based analysis (Phys. Lett. B 846 (2023) 138223) are added for comparison. The 68% and 95% confidence intervals obtained from the Neyman construction are also added.

Invariant mass of the lepton pair plus jet system, for data, background (pre- and post-reweighting) and three $H\rightarrow Za$ signal hypotheses (for $a\rightarrow q\bar{q}/gg$ inclusively). Events are required to pass the complete event selection but not the classification NN requirement. The background normalization is set equal to that of the data for events passing the preselection and being in the $m_{\ell\ell j}$ 100-180 GeV region. The signal normalization assumes the SM Higgs boson inclusive production cross-section, $\mathcal{B}(H\to Za)=100\%$, and it is scaled up by a factor of 100. The error bars (hatched regions) represent the data (MC) sample's statistical uncertainty in the histograms and the ratio plots. Vertical arrows indicate data points that fall outside the displayed $y$-axis range.

Regression NN output variable, for data, reweighted background, and three $H\rightarrow Za$ signal hypotheses ($a\rightarrow q\bar{q}/gg$ inclusively). Events are required to pass the complete event selection, including a $120<m_{\ell\ell j}<140$ GeV requirement, but not the classification NN output variable requirement. The background normalization is set equal to that of the data for events passing the preselection and being in the $m_{\ell\ell j}$ 100-180 GeV region. The signal normalization assumes the SM Higgs boson inclusive production cross-section, $\mathcal{B}(H\to Za)=100\%$, and it is scaled up by a factor of 100. The error bars (hatched regions) represent the data (MC) sample's statistical uncertainty in the histograms and the ratio plots. Vertical arrows indicate data points that fall outside the displayed $y$-axis range.

Classification NN output variable, for data, reweighted background, and three $H\rightarrow Za$ signal hypotheses ($a\rightarrow q\bar{q}/gg$ inclusively). Events are required to pass the complete event selection, including a $120<m_{\ell\ell j}<140$ GeV requirement, but not the classification NN output variable requirement. The background normalization is set equal to that of the data for events passing the preselection and being in the $m_{\ell\ell j}$ 100-180 GeV region. The signal normalization assumes the SM Higgs boson inclusive production cross-section, $\mathcal{B}(H\to Za)=100\%$, and it is scaled up by a factor of 100. The error bars (hatched regions) represent the data (MC) sample's statistical uncertainty in the histograms and the ratio plots. Vertical arrows indicate data points that fall outside the displayed $y$-axis range.

Invariant mass of the lepton pair plus jet system for data, reweighted background, and various signal hypotheses. Events are required to pass the complete event selection (preselection and classification NN requirement). The pre-fit background distribution is shown along with three $H\rightarrow Za$ signal hypotheses coming from the pure MC sample ($a\rightarrow q\bar{q}/gg$ inclusively). The background normalization is set equal to that of the data for events passing the preselection and being in the region 100-180 GeV. The error bars represent the data sample's statistical uncertainty and the grey bands represent the full background model uncertainty before the fit (assuming all the uncertainties are uncorrelated). The lower panel shows the ratio of the data to the pre-fit background prediction.

Invariant mass of the lepton pair plus jet system for data, reweighted background, and 2.0 GeV signal hypotheses. Events are required to pass the complete event selection (preselection and classification NN requirement). The background shape and normalization come from the fit to the data. The signal includes only $gg$ decays, its shape comes from the fit, and it is normalized to $\mathcal{B}(H\rightarrow Za)=100\%$. The error bars represent the data sample's statistical uncertainty and the grey bands represent the full background model uncertainty after the fit. The lower panel shows the per-bin signal significance, $(N_\text{data}-N_\text{MC})\,\text{\Large{/}}\sqrt{\sigma_\text{data}^2+\sigma_\text{MC}^2}$. The post-fit background uncertainty is calculated from a fit under the background-only hypothesis. Vertical arrows indicate data points that fall outside the displayed $y$-axis range.

Observed 95$\%$ CL upper limits on $\mathcal{B}(H \to Za)=100\%$ for $\mathcal{B}(a \to gg)=100\%$, and the expectation under the background-only hypothesis together with its $\pm1\sigma$ and $\pm2\sigma$ intervals. The weaker limits from the previous version of the analysis (PRL 125(2020) 221802) are also shown. Linear interpolation is used to set limits between the mass points for which MC signal samples were generated.

Observed 95$\%$ confidence level upper limits on $\mathcal{B}(H \to Za)=100\%$ for $\mathcal{B}(a\rightarrow q\bar{q})=100\%$, and the expectation under the background-only hypothesis together with its $\pm1\sigma$ and $\pm2\sigma$ intervals. The weaker limits from the previous version of the analysis (PRL 125(2020) 221802) are also shown. Linear interpolation is used to set limits between the mass points for which MC signal samples were generated.

Breakdown of relative systematic uncertainties in the measured ${t\bar{t}}$ cross-section. The quoted uncertainties are obtained by repeating the fit with a group of nuisance parameters fixed to their fitted values and subtracting in quadrature the resulting total uncertainty from the uncertainty of the complete fit. However, the total uncertainty is not the quadratic sum of the grouped impacts, as this approach neglects the correlation among the different groups.

The figure shows the measurement of the top quark pair production cross-section, $\sigma_{t\bar{t}}$, in lead-lead (Pb+Pb) collisions at a center-of-mass energy of $\sqrt{s_{\mathrm{NN}}} = 5.02$ TeV, based on 1.9 nb$^{-1}$ of data.

Product of acceptance and efficiency for pp->tbH(->Wh) as function of the charged Higgs boson mass for the resolved qqbb signal region.

Product of acceptance and efficiency for pp->tbH(->Wh) as function of the charged Higgs boson mass for the resolved lvbb signal region.

Product of acceptance and efficiency for pp->tbH(->Wh) as function of the charged Higgs boson mass for the merged lvbb signal region

Product of acceptance and efficiency for pp->tbH(->Wh) as function of the charged Higgs boson mass for the merged qqbb signal region

Distributions of the mWh observable in the low-purity signal regions of the resolved qqbb 5jex3bex event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the low-purity signal regions of the resolved qqbb 5jex4bin event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the low-purity signal regions of the resolved qqbb 6jin3bex event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the low-purity signal regions of the resolved qqbb 6jin4bin event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the high-purity signal regions of the resolved qqbb 5jex3bex event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the high-purity signal regions of the resolved qqbb 5jex4bin event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the high-purity signal regions of the resolved qqbb 6jin3bex event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the high-purity signal regions of the resolved qqbb 6jin4bin event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the signal regions of the resolved lvbb 5jex3bex event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the signal regions of the resolved lvbb 5jex4bin event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the signal regions of the resolved lvbb 6jin3bex event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the signal regions of the resolved lvbb 6jin4bin event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

The mWh distributions in the Low-NN-score SRs of the merged qqbb 0b event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The background prediction is shown after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contributions assuming $m_{H^{\pm}}$ = 900 GeV and $m_{H^{\pm}}$ = 2000 GeV, normalised the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) values of 0.036 pb and 2.7 fb respectively, are shown as dashed histograms.

The mWh distributions in the Low-NN-score SRs of the merged qqbb 1b event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The background prediction is shown after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contributions assuming $m_{H^{\pm}}$ = 900 GeV and $m_{H^{\pm}}$ = 2000 GeV, normalised the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) values of 0.036 pb and 2.7 fb respectively, are shown as dashed histograms.

The mWh distributions in the High-NN-score SRs of the merged qqbb 0b event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The background prediction is shown after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contributions assuming $m_{H^{\pm}}$ = 900 GeV and $m_{H^{\pm}}$ = 2000 GeV, normalised the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) values of 0.036 pb and 2.7 fb respectively, are shown as dashed histograms.

The mWh distributions in the High-NN-score SRs of the merged qqbb 1b event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The background prediction is shown after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contributions assuming $m_{H^{\pm}}$ = 900 GeV and $m_{H^{\pm}}$ = 2000 GeV, normalised the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) values of 0.036 pb and 2.7 fb respectively, are shown as dashed histograms.

The mWh distributions in the Low-NN-score SRs of the merged lvbb 0b event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The background prediction is shown after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contributions assuming $m_{H^{\pm}}$ = 900 GeV and $m_{H^{\pm}}$ = 2000 GeV, normalised the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) values of 0.036 pb and 2.7 fb respectively, are shown as dashed histograms.

The mWh distributions in the Low-NN-score SRs of the merged lvbb 1b event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The background prediction is shown after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contributions assuming $m_{H^{\pm}}$ = 900 GeV and $m_{H^{\pm}}$ = 2000 GeV, normalised the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) values of 0.036 pb and 2.7 fb respectively, are shown as dashed histograms.

The mWh distributions in the Medium-NN-score SRs of the merged lvbb 0b event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The background prediction is shown after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contributions assuming $m_{H^{\pm}}$ = 900 GeV and $m_{H^{\pm}}$ = 2000 GeV, normalised the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) values of 0.036 pb and 2.7 fb respectively, are shown as dashed histograms.

The mWh distributions in the Medium-NN-score SRs of the merged lvbb 1b event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The background prediction is shown after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contributions assuming $m_{H^{\pm}}$ = 900 GeV and $m_{H^{\pm}}$ = 2000 GeV, normalised the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) values of 0.036 pb and 2.7 fb respectively, are shown as dashed histograms.

The mWh distributions in the High-NN-score SRs of the merged lvbb 0b event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The background prediction is shown after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contributions assuming $m_{H^{\pm}}$ = 900 GeV and $m_{H^{\pm}}$ = 2000 GeV, normalised the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) values of 0.036 pb and 2.7 fb respectively, are shown as dashed histograms.

The mWh distributions in the High-NN-score SRs of the merged lvbb 1b event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The background prediction is shown after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contributions assuming $m_{H^{\pm}}$ = 900 GeV and $m_{H^{\pm}}$ = 2000 GeV, normalised the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) values of 0.036 pb and 2.7 fb respectively, are shown as dashed histograms.

Cutflow table for a few selected signal samples after applying the selection requirements of the resolved analysis. At the initial cut stage, all events from the tbH ± → W ± h(→ b b) production process (including those from the fully hadronic decay channel) are considered.

Cutflow table for a few selected signal samples after applying the selection requirements of the merged analysis. At the initial cut stage, all events from the tbH ± → W ± h(→ bb) production process (including those from the fully hadronic decay channel) are considered.

Jet pairing efficiencies over the parameter space for the wide-width heavy resonance signals. The pairing efficiency is evaluated in the 6$b$ region when a correct pairing is possible — that is, the six leading jets are geometrically matched to truth-level b-quarks.

Distributions of scores for nonresDNN in 6b data and the background prediction after background-only fits to the observed data. The Low- and High-Score regions are included. Benchmark signal models (normalized to the background) are overlaid: SM HHH signal and non-resonant TRSM signal with $(m_X, m_S)=(400,200)$ GeV.

Distributions of scores for resDNN in 6b data and the background prediction after background-only fits to the observed data. The Low- and High-Score regions are included. A benchmark signal model (normalized to the background) is overlaid: resonant TRSM signal with $(m_X, m_S)=(500,350)$ GeV.

Distributions of scores for heavyresDNN in 6b data and the background prediction after background-only fits to the observed data. The Low- and High-Score regions are included. Benchmark signal models (normalized to the background) are overlaid: heavy-resonant signals with (mX, mS)=(900,325) GeV with a 1% or 20% width.

Expected 95% CL $HHH$ cross section upper limits for the phase space within the perturbative unitarity bounds of the TRSM signals. While the points were generated under Benchmark point 3 of the TRSM, they can also be interpreted in the DM-CPV model.

Observed 95% CL $HHH$ cross section upper limits for the phase space within the perturbative unitarity bounds of the TRSM signals. While the points were generated under Benchmark point 3 of the TRSM, they can also be interpreted in the DM-CPV model.

Expected 95% CL $HHH$ cross section upper limits for the narrow-width (1%) heavy resonance signals.

Expected 95% CL $HHH$ cross section upper limits for the wide-width (20%) heavy resonance signals.

Observed 95% CL $HHH$ cross section upper limits for the narrow-width (1%) heavy resonance signals.

Observed 95% CL $HHH$ cross section upper limits for the wide-width (20%) heavy resonance signals.

Expected 95% CL constraints on $\kappa_3$ and $\kappa_4$, the ratios of the Higgs tri-linear and quartic self-couplings to their predicted SM values.

Expected 68% CL constraints on $\kappa_3$ and $\kappa_4$, the ratios of the Higgs tri-linear and quartic self-couplings to their predicted SM values.

Observed 95% CL constraints on $\kappa_3$ and $\kappa_4$, the ratios of the Higgs tri-linear and quartic self-couplings to their predicted SM values.

Observed 68% CL constraints on $\kappa_3$ and $\kappa_4$, the ratios of the Higgs tri-linear and quartic self-couplings to their predicted SM values.

Unitarity limits, calculated in Eur. Phys. J. C 84 (2024) 366, are overlaid in the region bounded by the gray dashed line.

Overall acceptance x efficiency for events entering the 6$b$ region over the parameter space for the TRSM signals. Generator weights, and weights associated to pileup modeling corrections are applied. Jet trigger scale factors, NNJVT scale factors and scale factors associated to the $b$-tagging calibration are applied.

Overall acceptance x efficiency for events entering the 6$b$ region over the parameter space for the narrow-width heavy resonance signals. Generator weights, and weights associated to pileup modeling corrections are applied. Jet trigger scale factors, NNJVT scale factors and scale factors associated to the $b$-tagging calibration are applied.

Overall acceptance x efficiency for events entering the 6$b$ region over the parameter space for the wide-width heavy resonance signals. Generator weights, and weights associated to pileup modeling corrections are applied. Jet trigger scale factors, NNJVT scale factors and scale factors associated to the $b$-tagging calibration are applied.

Expected one-dimensional likelihood scan over the Higgs self-coupling modifier $\kappa_3$. Both of the modifiers are profiled in the profile-likelihood fit, and the likelihood scan keeps $\kappa_4$ fixed at one.

Observed one-dimensional likelihood scan over the Higgs self-coupling modifier $\kappa_3$. Both of the modifiers are profiled in the profile-likelihood fit, and the likelihood scan keeps $\kappa_4$ fixed at one.

Expected one-dimensional likelihood scan over the Higgs self-coupling modifier $\kappa_4$. Both of the modifiers are profiled in the profile-likelihood fit, and the likelihood scan keeps $\kappa_3$ fixed at one.

Observed one-dimensional likelihood scan over the Higgs self-coupling modifier $\kappa_4$. Both of the modifiers are profiled in the profile-likelihood fit, and the likelihood scan keeps $\kappa_3$ fixed at one.

Summary of the impact on the analysis of different sources of systematic uncertainty. The impact is estimated as the absolute value of the difference between the expected upper limit with all sources of uncertainty included and the upper limit with a subset of systematic uncertainties excluded. In the left-hand column, more heavily indented rows are a sub-category of the less indented row above.

Cutflow for selected signal points. Generator weights, and weights associated to pileup modeling corrections are applied from the second row onwards. These weight the SM events assuming the SM cross section, whilst the TRSM and Generic resonance events are weighted to 50 fb. Jet trigger scale factors are applied from the third row onwards. NNJVT scale factors are applied from the fourth row onwards. Scale factors associated to the b-tagging calibration are applied in the last three rows.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos.

Observed exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos.

Expected exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos.

Observed exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM1.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM1.

Expected exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM1.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM1.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM1.

Observed exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM1.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM2.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM2.

Expected exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM2.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM2.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM2.

Observed exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM2.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM3.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM3.

Expected exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM3.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM3.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM3.

Observed exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM3.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp1.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp1.

Expected exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp1.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp1.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp1.

Observed exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp1.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp2.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp2.

Expected exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp2.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp2.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp2.

Observed exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp2.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp3.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp3.

Expected exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp3.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp3.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp3.

Observed exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp3.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp-1c.

Expected exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp-1c.

Expected exclusion limit at 95% CL for pair production of top squarks decaying to top or charm quarks and 1 GeV neutralinos for different branching fraction assumptions.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to top or charm quarks and 1 GeV neutralinos for different branching fraction assumptions.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to top or charm quarks and 1 GeV neutralinos for different branching fraction assumptions.

Observed exclusion limit at 95% CL for pair production of top squarks decaying to top or charm quarks and 1 GeV neutralinos for different branching fraction assumptions.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to top or charm quarks and 1 GeV neutralinos for different branching fraction assumptions.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to top or charm quarks and 1 GeV neutralinos for different branching fraction assumptions.

Expected exclusion limit at 95% CL for pair production of top squarks decaying to top or charm quarks and 200 GeV neutralinos for different branching fraction assumptions.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to top or charm quarks and 200 GeV neutralinos for different branching fraction assumptions.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to top or charm quarks and 200 GeV neutralinos for different branching fraction assumptions.

Observed exclusion limit at 95% CL for pair production of top squarks decaying to top or charm quarks and 200 GeV neutralinos for different branching fraction assumptions.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to top or charm quarks and 200 GeV neutralinos for different branching fraction assumptions.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to top or charm quarks and 200 GeV neutralinos for different branching fraction assumptions.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of up-type scalar LQs coupled to first generation leptons and second generation quarks.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of up-type scalar LQs coupled to first generation leptons and second generation quarks.

Expected exclusion limit at 95% CL for pair production of up-type scalar LQs coupled to first generation leptons and second generation quarks.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of up-type scalar LQs coupled to first generation leptons and second generation quarks.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of up-type scalar LQs coupled to first generation leptons and second generation quarks.

Observed exclusion limit at 95% CL for pair production of up-type scalar LQs coupled to first generation leptons and second generation quarks.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of up-type scalar LQs coupled to second generation leptons and quarks.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of up-type scalar LQs coupled to second generation leptons and quarks.

Expected exclusion limit at 95% CL for pair production of up-type scalar LQs coupled to second generation leptons and quarks.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of up-type scalar LQs coupled to second generation leptons and quarks.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of up-type scalar LQs coupled to second generation leptons and quarks.

Observed exclusion limit at 95% CL for pair production of up-type scalar LQs coupled to second generation leptons and quarks.

Observed upper limit on the cross-section at 95% CL for pair production of top squarks decaying into charm quarks and neutralinos for the fit with the best expected CL$_\mathrm{S}$.

Observed upper limit on the cross-section for pair production of up-type scalar LQs coupled to first generation leptons and second generation quarks.

Observed upper limit on the cross-section for pair production of up-type scalar LQs coupled to second generation leptons and quarks.

Expected upper limit on the cross-section $(-1\sigma)$ for $U(1)$ vector LQ models in the minimal coupling scenario with $\beta_{23}=1$, corresponding to a branching fraction $\mathcal{B}(\mathrm{vLQ}^\mathrm{u,min}_{23}\rightarrow c\nu) = 0.5$.

Expected upper limit on the cross-section $(+1\sigma)$ for $U(1)$ vector LQ models in the minimal coupling scenario with $\beta_{23}=1$, corresponding to a branching fraction $\mathcal{B}(\mathrm{vLQ}^\mathrm{u,min}_{23}\rightarrow c\nu) = 0.5$.

Expected upper limit on the cross-section for $U(1)$ vector LQ models in the minimal coupling scenario with $\beta_{23}=1$, corresponding to a branching fraction $\mathcal{B}(\mathrm{vLQ}^\mathrm{u,min}_{23}\rightarrow c\nu) = 0.5$.

Observed upper limit on the cross-section for $U(1)$ vector LQ models in the minimal coupling scenario with $\beta_{23}=1$, corresponding to a branching fraction $\mathcal{B}(\mathrm{vLQ}^\mathrm{u,min}_{23}\rightarrow c\nu) = 0.5$.

Expected upper limit on the cross-section $(-1\sigma)$ for $U(1)$ vector LQ models in the Yang-Mills coupling scenario with $\beta_{23}=1$, corresponding to a branching fraction $\mathcal{B}(\mathrm{vLQ}^\mathrm{u,YM}_{23}\rightarrow c\nu) = 0.5$.

Expected upper limit on the cross-section $(+1\sigma)$ for $U(1)$ vector LQ models in the Yang-Mills coupling scenario with $\beta_{23}=1$, corresponding to a branching fraction $\mathcal{B}(\mathrm{vLQ}^\mathrm{u,YM}_{23}\rightarrow c\nu) = 0.5$.

Expected upper limit on the cross-section for $U(1)$ vector LQ models in the Yang-Mills coupling scenario with $\beta_{23}=1$, corresponding to a branching fraction $\mathcal{B}(\mathrm{vLQ}^\mathrm{u,YM}_{23}\rightarrow c\nu) = 0.5$.

Observed upper limit on the cross-section for $U(1)$ vector LQ models in the Yang-Mills coupling scenario with $\beta_{23}=1$, corresponding to a branching fraction $\mathcal{B}(\mathrm{vLQ}^\mathrm{u,YM}_{23}\rightarrow c\nu) = 0.5$.

Distribution of $R_{\mathrm{ISR}}$ in SR-Comp-1c showing the data and the expected backgrounds, after simultaneously fitting all the control regions. The pre-fit yields for a representative $m(\tilde{t}_1,\tilde{\chi}_1^0)=(450,430)$ GeV signal is included. Processes with top quarks and multiple vector bosons are included in "Other". The right-most bin does not include the overflow entry but the $x$-axis range is chosen to include all observed data.

Distribution of $E_\mathrm{T}^\mathrm{miss}\mathrm{ Sig.}$ in SR-HM1 showing the data and the expected backgrounds, after simultaneously fitting all the control regions. The pre-fit yields for a representative $m(\tilde{t}_1,\tilde{\chi}_1^0)=(1000,1)$ GeV signal is included. Processes with top quarks and multiple vector bosons are included in "Other". The right-most bin does not include the overflow entry but the $x$-axis range is chosen to include all observed data.

Distribution of $m_{\mathrm{T}}^{\mathrm{min}}(c)$ in SR-HM2 showing the data and the expected backgrounds, after simultaneously fitting all the control regions. The pre-fit yields for a representative $m(\tilde{t}_1,\tilde{\chi}_1^0)=(750,450)$ GeV signal is included. Processes with top quarks and multiple vector bosons are included in "Other". The right-most bin does not include the overflow entry but the $x$-axis range is chosen to include all observed data.

Distribution of $R_{\mathrm{ISR}}$ in SR-Comp1 showing the data and the expected backgrounds, after simultaneously fitting all the control regions. The pre-fit yields for a representative $m(\tilde{t}_1,\tilde{\chi}_1^0)=(600,550)$ GeV signal is included. Processes with top quarks and multiple vector bosons are included in "Other". The right-most bin does not include the overflow entry but the $x$-axis range is chosen to include all observed data.

Distribution of $R_{\mathrm{ISR}}$ in SR-Comp2 showing the data and the expected backgrounds, after simultaneously fitting all the control regions. The pre-fit yields for a representative $m(\tilde{t}_1,\tilde{\chi}_1^0)=(550,470)$ GeV signal is included. Processes with top quarks and multiple vector bosons are included in "Other". The right-most bin does not include the overflow entry but the $x$-axis range is chosen to include all observed data.

Distribution of $R_{\mathrm{ISR}}$ in SR-Comp3 showing the data and the expected backgrounds, after simultaneously fitting all the control regions. The pre-fit yields for a representative $m(\tilde{t}_1,\tilde{\chi}_1^0)=(550,375)$ GeV signal is included. Processes with top quarks and multiple vector bosons are included in "Other". The right-most bin does not include the overflow entry but the $x$-axis range is chosen to include all observed data.

Acceptance across the SUSY signal grid for SR-Comp-1c.

Acceptance across the SUSY signal grid for SR-HM1.

Acceptance across the SUSY signal grid for SR-HM2.

Acceptance across the SUSY signal grid for SR-HM3.

Acceptance across the SUSY signal grid for SR-HM-Disc.

Acceptance across the SUSY signal grid for SR-Comp1.

Acceptance across the SUSY signal grid for SR-Comp2.

Acceptance across the SUSY signal grid for SR-Comp3.

Acceptance across the $\mathrm{LQ}^\mathrm{u}_{21}$ signal grid for SR-HM1.

Acceptance across the $\mathrm{LQ}^\mathrm{u}_{21}$ signal grid for SR-HM2.

Acceptance across the $\mathrm{LQ}^\mathrm{u}_{21}$ signal grid for SR-HM3.

Acceptance across the $\mathrm{LQ}^\mathrm{u}_{21}$ signal grid for SR-HM-Disc.

Acceptance across the $\mathrm{LQ}^\mathrm{u}_{22}$ signal grid for SR-HM1.

Acceptance across the $\mathrm{LQ}^\mathrm{u}_{22}$ signal grid for SR-HM2.

Acceptance across the $\mathrm{LQ}^\mathrm{u}_{22}$ signal grid for SR-HM3.

Acceptance across the $\mathrm{LQ}^\mathrm{u}_{22}$ signal grid for SR-HM-Disc.

Acceptance for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM1.

Acceptance for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM2.

Acceptance for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM3.

Acceptance for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM-Disc.

Acceptance for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM1.

Acceptance for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM2.

Acceptance for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM3.

Acceptance for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM-Disc.

Efficiency for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM1. Due to the limited statistical power of the signal samples, efficiencies can fluctuate and can drop to zero.

Efficiency for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM2. Due to the limited statistical power of the signal samples, efficiencies can fluctuate and can drop to zero.

Efficiency for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM3. Due to the limited statistical power of the signal samples, efficiencies can fluctuate and can drop to zero.

Efficiency for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM-Disc. Due to the limited statistical power of the signal samples, efficiencies can fluctuate and can drop to zero.

Efficiency for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM1. Due to the limited statistical power of the signal samples, efficiencies can fluctuate and can drop to zero.

Efficiency for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM2. Due to the limited statistical power of the signal samples, efficiencies can fluctuate and can drop to zero.

Efficiency for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM3. Due to the limited statistical power of the signal samples, efficiencies can fluctuate and can drop to zero.

Efficiency for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM-Disc. Due to the limited statistical power of the signal samples, efficiencies can fluctuate and can drop to zero.

Acceptance times efficiency across the SUSY signal grid for SR-Comp-1c.

Acceptance times efficiency across the SUSY signal grid for SR-HM1.

Acceptance times efficiency across the SUSY signal grid for SR-HM2.

Acceptance times efficiency across the SUSY signal grid for SR-HM3.

Acceptance times efficiency across the SUSY signal grid for SR-HM-Disc.

Acceptance times efficiency across the SUSY signal grid for SR-Comp1.

Acceptance times efficiency across the SUSY signal grid for SR-Comp2.

Acceptance times efficiency across the SUSY signal grid for SR-Comp3.

Acceptance times efficiency across the $\mathrm{LQ}^\mathrm{u}_{21}$ signal grid for SR-HM1.

Acceptance times efficiency across the $\mathrm{LQ}^\mathrm{u}_{21}$ signal grid for SR-HM2.

Acceptance times efficiency across the $\mathrm{LQ}^\mathrm{u}_{21}$ signal grid for SR-HM3.

Acceptance times efficiency across the $\mathrm{LQ}^\mathrm{u}_{21}$ signal grid for SR-HM-Disc.

Acceptance times efficiency across the $\mathrm{LQ}^\mathrm{u}_{22}$ signal grid for SR-HM1.

Acceptance times efficiency across the $\mathrm{LQ}^\mathrm{u}_{22}$ signal grid for SR-HM2.

Acceptance times efficiency across the $\mathrm{LQ}^\mathrm{u}_{22}$ signal grid for SR-HM3.

Acceptance times efficiency across the $\mathrm{LQ}^\mathrm{u}_{22}$ signal grid for SR-HM-Disc.

Acceptance times efficiency for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM1.

Acceptance times efficiency for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM2.

Acceptance times efficiency for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM3.

Acceptance times efficiency for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM-Disc.

Acceptance times efficiency for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM1.

Acceptance times efficiency for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM2.

Acceptance times efficiency for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM3.

Acceptance times efficiency for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM-Disc.

Cutflow table for SR-Comp-1c using the $m(\tilde{t}_{1},\tilde{\chi}_{1}^{0}) = (450,430)$ GeV signal point as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-Comp1 using the $m(\tilde{t}_{1},\tilde{\chi}_{1}^{0}) = (600,550)$ GeV signal point as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-Comp2 using the $m(\tilde{t}_{1},\tilde{\chi}_{1}^{0}) = (550,470)$ GeV signal point as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-Comp3 using the $m(\tilde{t}_{1},\tilde{\chi}_{1}^{0}) = (550,375)$ GeV signal point as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-HM1 using the $m(\tilde{t}_{1},\tilde{\chi}_{1}^{0}) = (1000,1)$ GeV signal point as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>40$ GeV, however, the $E_\mathrm{T}^\mathrm{miss}$ is calculated with jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-HM2 using the $m(\tilde{t}_{1},\tilde{\chi}_{1}^{0}) = (750,450)$ GeV signal point as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>40$ GeV, however, the $E_\mathrm{T}^\mathrm{miss}$ is calculated with jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-HM3 using the $m(\tilde{t}_{1},\tilde{\chi}_{1}^{0}) = (750,450)$ GeV signal point as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>40$ GeV, however, the $E_\mathrm{T}^\mathrm{miss}$ is calculated with jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-HM-Disc using the $m(\tilde{t}_{1},\tilde{\chi}_{1}^{0}) = (750,450)$ GeV signal point as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>40$ GeV, however, the $E_\mathrm{T}^\mathrm{miss}$ is calculated with jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-HM1 using the $m(\mathrm{LQ}_{21}^\mathrm{u}) = 600$ GeV signal point, with a 50% branching fraction to $c\nu$, as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>40$ GeV, however, the $E_\mathrm{T}^\mathrm{miss}$ is calculated with jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-HM2 using the $m(\mathrm{LQ}_{21}^\mathrm{u}) = 600$ GeV signal point, with a 50% branching fraction to $c\nu$, as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>40$ GeV, however, the $E_\mathrm{T}^\mathrm{miss}$ is calculated with jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-HM3 using the $m(\mathrm{LQ}_{21}^\mathrm{u}) = 600$ GeV signal point, with a 50% branching fraction to $c\nu$, as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>40$ GeV, however, the $E_\mathrm{T}^\mathrm{miss}$ is calculated with jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-HM-Disc using the $m(\mathrm{LQ}_{21}^\mathrm{u}) = 600$ GeV signal point, with a 50% branching fraction to $c\nu$, as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>40$ GeV, however, the $E_\mathrm{T}^\mathrm{miss}$ is calculated with jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Total invariant mass distribution $m_{4\ell}$ in Signal Region 2.

Selected events in the ($m_{4\ell}$, $\left\langle m_{\ell\ell}\right\rangle$) plane, SR1

Selected events in the ($m_{4\ell}$, $\left\langle m_{\ell\ell}\right\rangle$) plane, SR2

Expected background events in the $(m_{4\ell}, \langle m_{\ell\ell}\rangle)$ plane, SR1

Expected signal shape for $(m_{S}, m_{Z_d}) = (110~\text{GeV},30~\text{GeV}$) in the $(m_{4\ell}, \langle m_{\ell\ell}\rangle)$ plane, SR1. The signal distributions are normalized to unit volume.

Expected background events in the $(m_{4\ell}, \langle m_{\ell\ell}\rangle)$ plane, SR2. Events that satisfy $|m_{ab,cd} - m_Z| < 8~\text{GeV}$ are removed by the Z-veto requirement, however not all events lying behind the mask in the plot, corresponding to $\langle m_{\ell\ell}\rangle$ values between 83 and 99 GeV, are deleted.

Expected signal shape for $(m_{S}, m_{Z_{d}}) = (750~\text{GeV},150~\text{GeV}$) in the $(m_{4\ell}, \langle m_{\ell\ell}\rangle)$ plane, SR2. The signal distributions are normalized to unit volume. Events that satisfy $|m_{ab,cd} - m_Z| < 8~\text{GeV}$ are removed by the Z-veto requirement, however not all events lying behind the mask in the plot, corresponding to $\langle m_{\ell\ell}\rangle$ values between 83 and 99 GeV, are deleted.

Expected 95% CL limit on $\sigma \mathcal{B}(S\rightarrow Z_{d}Z_{d} \rightarrow 4\ell)$, SR1

Observed 95% CL limit on $\sigma \mathcal{B}(S\rightarrow Z_{d}Z_{d} \rightarrow 4\ell)$, SR1

Observed / Expected 95% CL limit ratio in SR1

Expected 95% CL limit on $\mathcal{B}(S\rightarrow Z_{d}Z_{d} \rightarrow 4\ell)$ with Z-veto, SR2

Observed 95% CL limit on $\sigma \mathcal{B}(S\rightarrow Z_{d}Z_{d} \rightarrow 4\ell)$ with Z-veto, SR2

Observed / Expected 95% CL limit ratio with Z-veto, SR2

Local $p_0$-values in the ($m_{S}, m_{Z_{d}}$) plane, SR1

Local $p_0$-values in the ($m_{S}, m_{Z_{d}}$) plane, SR2 with Z-veto applied

Observed data in Signal Region 1 in the $(m_{4\ell}, \langle m_{\ell\ell}\rangle)$ plane.

Observed data in Signal Region 2 in the $(m_{4\ell}, \langle m_{\ell\ell}\rangle)$ plane. Events that satisfy $|m_{ab,cd} - m_Z| < 8~\text{GeV}$ are removed by the Z-veto requirement, however not all events lying behind the mask in the plot, corresponding to <m_ll> values between 83 and 99 GeV, are deleted.

Distributions of the average dilepton mass $\left\langle m_{\ell\ell}\right\rangle = \frac{1}{2}\left(m_{ab} + m_{cd}\right)$ for Signal Region 1 in the $4e$ final state.

Distributions of the average dilepton mass $\left\langle m_{\ell\ell}\right\rangle = \frac{1}{2}\left(m_{ab} + m_{cd}\right)$ for Signal Region 1 in the $2e2\mu$ final state.

Distributions of the average dilepton mass $\left\langle m_{\ell\ell}\right\rangle = \frac{1}{2}\left(m_{ab} + m_{cd}\right)$ for Signal Region 1 in the $4\mu$ final state.

Distributions of the average dilepton mass $\left\langle m_{\ell\ell}\right\rangle = \frac{1}{2}\left(m_{ab} + m_{cd}\right)$ for Signal Region 2 in the $4e$ final state.

Distributions of the average dilepton mass $\left\langle m_{\ell\ell}\right\rangle = \frac{1}{2}\left(m_{ab} + m_{cd}\right)$ for Signal Region 2 in the $2e2\mu$ final state.

Distributions of the average dilepton mass $\left\langle m_{\ell\ell}\right\rangle = \frac{1}{2}\left(m_{ab} + m_{cd}\right)$ for Signal Region 2 in the $4\mu$ final state.

Distributions of the total invariant mass $m_{4\ell}$ for Signal Region 1 in the $4e$ final state. The SR1 requirement $m_{4\ell} < 115~\text{GeV}$ is not applied here.

Distributions of the total invariant mass $m_{4\ell}$ for Signal Region 1 in the $2e2\mu$ final state. The SR1 requirement $m_{4\ell} < 115~\text{GeV}$ is not applied here.

Distributions of the total invariant mass $m_{4\ell}$ for Signal Region 1 in the $4\mu$ final state. The SR1 requirement $m_{4\ell} < 115~\text{GeV}$ is not applied here.

Distributions of the total invariant mass $m_{4\ell}$ for Signal Region 2 in the $4e$ final state.

Distributions of the total invariant mass $m_{4\ell}$ for Signal Region 2 in the $2e2\mu$ final state.

Distributions of the total invariant mass $m_{4\ell}$ for Signal Region 2 in the $4\mu$ final state.

Post-fit $m_\mathrm{MMC}$ distribution in the high-mass SR for the $m_A = 90\,\mathrm{GeV}$ signal mass hypothesis. $m_\mathrm{MMC}$ is the mass reconstructed by the Missing Mass Calculator. Processes contributing to the background Others are $Z/\gamma^* \rightarrow ee/\mu\mu$ and SM Higgs. The subscript on the $A\to\tau\tau$ process indicates the mass of the $A$ boson. otal includes all backgrounds and the signal process. The high-mass Signal Region is defined as: - 1 electron and 1 muon with opposite charge - $p_\mathrm{T}$ requirements of the leptons are a combination of the following: - $p_\mathrm{T}^e > 18\,\mathrm{GeV}$ and $p_\mathrm{T}^\mu > 15\,\mathrm{GeV}$ or - $p_\mathrm{T}^e > 10\,\mathrm{GeV}$ and $p_\mathrm{T}^\mu > 25\,\mathrm{GeV}$ or - $p_\mathrm{T}^e > 27\,\mathrm{GeV}$ and $p_\mathrm{T}^\mu > 10\,\mathrm{GeV}$ - $\vert \eta_e \vert < 2.47$, excluding $1.37 < \vert \eta_e \vert < 1.52$ - $\vert \eta_\mu \vert < 2.7$ - no jets with $b$-quarks - $\Delta R_{\ell\ell} < 1.0$ - $E_\mathrm{T}^\mathrm{miss} > 30\,\mathrm{GeV}$ - $m_\mathrm{T}^\mathrm{tot} = \sqrt{\left(p_\mathrm{T}^e+p_\mathrm{T}^\mu+E_\mathrm{T}^\mathrm{miss}\right)^2-\left(\vec{p}_\mathrm{T}^{\,e}+\vec{p}_\mathrm{T}^{\,\mu}+\vec{E}_\mathrm{T}^{\,\mathrm{miss}}\right)^2} < 65\,\mathrm{GeV}$ - $35\,\mathrm{GeV} < m_\mathrm{MMC} < 130\,\mathrm{GeV}$

Expected and observed $95\%$ CL limits on the production cross-section for $gg\rightarrow A$ times the branching ratio for $A$ decaying into two $\tau$-leptons for $A$ boson masses ranging from $20$ to $90\,\mathrm{GeV}$.

Expected and observed $95\%$ CL limits on the production cross-section for $gg\rightarrow A$ times the branching ratio for $A$ decaying into two $\tau$-leptons for $A$ boson masses ranging from $20$ to $90\,\mathrm{GeV}$.

Expected and observed $95\%$ CL limits on the absolute value of the up-type quark coupling parameter $|\zeta_\mathrm{u}|$ for masses of the $A$ boson ranging from $20$ to $90\,\mathrm{GeV}$.

Expected and observed $95\%$ CL limits on the absolute value of the up-type quark coupling parameter $|\zeta_\mathrm{u}|$ for masses of the $A$ boson ranging from $20$ to $90\,\mathrm{GeV}$.

Observed $p_0$ values for the fits on the production cross-section for $gg\rightarrow A$ times the branching ratio for $A$ decaying into two $\tau$-leptons for $A$ boson masses from $20$ to $90\,\mathrm{GeV}$. For the fit on the up-type quark coupling parameter the $p_0$ values agree up to a precision of $O(10^{-5})$.

Observed $p_0$ values for the fits on the production cross-section for $gg\rightarrow A$ times the branching ratio for $A$ decaying into two $\tau$-leptons for $A$ boson masses from $20$ to $90\,\mathrm{GeV}$. For the fit on the up-type quark coupling parameter the $p_0$ values agree up to a precision of $O(10^{-5})$.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the compressed SUSY simplified model with a bino-like LSP and wino-like NLSPs being considered. These are shown with $\pm1\sigma_\text{exp}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm1\sigma^{\text{SUSY}}_{\text{theory}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the ATLAS searches using the soft lepton signature is illustrated by the blue region while the limit imposed by the LEP experiments is shown in grey.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the compressed SUSY simplified model with a bino-like LSP and wino-like NLSPs being considered. These are shown with $\pm1\sigma_ ext{exp}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm1\sigma^{ ext{SUSY}}_{ ext{theory}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the ATLAS searches using the soft lepton signature is illustrated by the blue region while the limit imposed by the LEP experiments is shown in grey.

The expected upper limits on the cross-sections at 95% CL for the simplified SUSY model featuring the production of mass-degenerate pairs of wino-like $\widetilde{\chi}_{2}^{0}$ and $\widetilde{\chi}_{1}^{\pm}$ particles in association with at least two jets. The production modes considered are $\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{1}^{\pm}$, $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\mp}$, $\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{2}^{0}$, and $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\pm}$.

The observed upper limits on the cross-sections at 95% CL for the simplified SUSY model featuring the production of mass-degenerate pairs of wino-like $\widetilde{\chi}_{2}^{0}$ and $\widetilde{\chi}_{1}^{\pm}$ particles in association with at least two jets. The production modes considered are $\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{1}^{\pm}$, $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\mp}$, $\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{2}^{0}$, and $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\pm}$.

Truth-level signal acceptances in $\text{SR}_\text{2j}$ with BDT score $\in [0.88, 1.0]$. All of the considered production modes ($\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{1}^{\pm}$, $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\mp}$, $\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{2}^{0}$, and $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\pm}$) are included. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation. The generator-level selections are the same as the ones at reconstruction level.

Truth-level signal acceptances in $\text{SR}_{\geq\text{3j}}$ with BDT score $\in [0.88, 1.0]$. All of the considered production modes ($\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{1}^{\pm}$, $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\mp}$, $\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{2}^{0}$, and $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\pm}$) are included. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation. The generator-level selections are the same as the ones at reconstruction level.

Signal efficiencies in $\text{SR}_\text{2j}$ with BDT score $\in [0.88, 1.0]$. All of the considered production modes ($\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{1}^{\pm}$, $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\mp}$, $\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{2}^{0}$, and $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\pm}$) are included. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. The generator-level selections are the same as the ones at reconstruction level.

Signal efficiencies in $\text{SR}_{\geq\text{3j}}$ with BDT score $\in [0.88, 1.0]$. All of the considered production modes ($\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{1}^{\pm}$, $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\mp}$, $\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{2}^{0}$, and $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\pm}$) are included. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. The generator-level selections are the same as the ones at reconstruction level.

Event selection cutflows for signal samples with $m(\tilde\chi^0_2) =100~\text{GeV}$ and $\Delta m(\tilde\chi^0_2 / \tilde\chi^\pm_1,\tilde\chi^0_1) = 0.2~\text{GeV}, 1.0~\text{GeV},$ and $5.0~\text{GeV}$. The first number in the column for each mass point corresponds to the signal event yield after applying the associated cut while the second number in parentheses represents the efficiency with respect to the previous cut. All of the production modes are included. The total cross-section used to obtain the initial number of events ($\sigma$) includes the cuts applied at parton level as described in the main text.

Distributions of the $\mathrm{NN^{SvsB}}$ output for data and the expected background after the likelihood fit in the $SR_{cQu --}$ signal region. The post-fit background expectations are shown as filled histograms, the combined pre-fit background expectations are shown as dashed lines. The signal distribution using the Wilson coefficient values $c_{tu}^{(1)}=0.04$, $c_{Qu}^{(1)}=0.1$, $c_{Qu}^{(8)}=0.1$ is shown with a dotted line, normalized to the same number of events as the background.

Summary of the observed and predicted number of events in the five 2$\ell$ control regions. The background prediction is shown after the combined likelihood fit to data under the signal-plus-background hypothesis across all control regions and signal regions. The uncertainties in the total yields are smaller than the sum in quadrature of the uncertainties in the individual contributions due to anti-correlations resulting from the likelihood fit. Int Conv refers to events with photon conversions in the inner detector, while Mat Conv refers to events with photon conversions in the detector material. QMisID refers to events with charge-misidentified lepton.

Summary of the observed and predicted number of events in the four 3$\ell$ control regions. The background prediction is shown after the combined likelihood fit to data under the signal-plus-background hypothesis across all control regions and signal regions. The uncertainties in the total yields are smaller than the sum in quadrature of the uncertainties in the individual contributions due to anti-correlations resulting from the likelihood fit. Int Conv refers to events with photon conversions in the inner detector, while Mat Conv refers to events with photon conversions in the detector material. QMisID refers to events with charge-misidentified lepton.

Comparison of the observed limits on the three WCs to the limit obtained by the ATLAS Run~1 analysis of events with $b$-tagged jets and a same-sign lepton pair [JHEP10(2015)150]. The cross-section limits from that analysis are converted to the limits on the WCs by using the fitted EFT parametrization. The bounds on the WCs are shown at the 68$\%$ CL (solid) and/or 95$\%$ CL (dashed) levels. For the ATLAS Run~1 analysis only the bounds at 95$\%$ CL are available. The vertical bar represents the SM prediction. The new-physics scale is set to $\Lambda = 1 \, \text{TeV}$.

Observed lower limits at 95$\%$ confidence level on the scale of new physics $\Lambda$ for Wilson coefficient values of 0.01, 1 and $4\pi^2$. The limits are compared with the limits obtained by the ATLAS Run~1 analysis of events with $b$-tagged jets and a same-sign lepton pair.

Observed and expected limits at 95$\%$ confidence level on the cross-section of $\sigma(pp \rightarrow tt)$.

2D likelihood scans of the Wilson coefficients $c_{tu}^{(1)}$ versus $c_{Qu}^{(1)}$. The new-physics scale is set to $\Lambda = 1 \, \text{TeV}$. In the table the $2\Delta$NLL values are shown which correspond to the minimized negative log likelihood for a given Wilson coefficient pair.

2D likelihood scans of the Wilson coefficients $c_{tu}^{(1)}$ versus $c_{Qu}^{(8)}$. The new-physics scale is set to $\Lambda = 1 \, \text{TeV}$. In the table the $2\Delta$NLL values are shown which correspond to the minimized negative log likelihood for a given Wilson coefficient pair.

2D likelihood scans of the Wilson coefficients $c_{Qu}^{(1)}$ versus $c_{Qu}^{(8)}$. The new-physics scale is set to $\Lambda = 1 \, \text{TeV}$. In the table the $2\Delta$NLL values are shown which correspond to the minimized negative log likelihood for a given Wilson coefficient pair.

1D-likelihood scan for $c_{tu}^{(1)}$. The observed and expected limits at 68\% and 95\% confidence level (CL) can be read off by finding the intersection of the likelihood scan curve with the 1$\sigma$ and 2$\sigma$ lines. The new-physics scale is set to $\Lambda = 1 \, \text{TeV}$. In the table the $2\Delta$NLL values are shown which correspond to the minimized negative log likelihood for a given Wilson coefficient value.

1D-likelihood scan for $c_{Qu}^{(1)}$. The observed and expected limits at 68\% and 95\% confidence level (CL) can be read off by finding the intersection of the likelihood scan curve with the 1$\sigma$ and 2$\sigma$ lines. The new-physics scale is set to $\Lambda = 1 \, \text{TeV}$. In the table the $2\Delta$NLL values are shown which correspond to the minimized negative log likelihood for a given Wilson coefficient value.

1D-likelihood scan for $c_{Qu}^{(8)}$. The observed and expected limits at 68\% and 95\% confidence level (CL) can be read off by finding the intersection of the likelihood scan curve with the 1$\sigma$ and 2$\sigma$ lines. The new-physics scale is set to $\Lambda = 1 \, \text{TeV}$. In the table the $2\Delta$NLL values are shown which correspond to the minimized negative log likelihood for a given Wilson coefficient value.

Post-fit agreement between data and MC prediction for the $SR_{\mathrm{loose}}^{2\ell3j}$ signal region, which uses the invariant mass of the c-tagged jet and the geometrically closest b-tagged jet, $m_{\mathit{cb}}^{\mathrm{min}\Delta R}$, as an observable. The hatched uncertainty bands include all uncertainties and their correlations. The last bins contain overflow events. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes.

Post-fit agreement between data and MC prediction for the $SR_{\mathrm{loose}}^{1\ell6ji}$ signal region, which uses the jet multiplicity, $N_{\mathrm{jets}}$, as an observable. The hatched uncertainty bands include all uncertainties and their correlations. The last bins contain overflow events. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes.

Post-fit agreement between data and MC prediction for the $SR_{\mathrm{tight}}^{1\ell6ji}$ signal region, which uses the jet multiplicity, $N_{\mathrm{jets}}$, as an observable. The hatched uncertainty bands include all uncertainties and their correlations. The last bins contain overflow events. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes.

Post-fit agreement between data and MC prediction for the $SR_{\mathrm{loose}}^{2\ell4ji}$ signal region, which uses the jet multiplicity, $N_{\mathrm{jets}}$, as an observable. The hatched uncertainty bands include all uncertainties and their correlations. The last bins contain overflow events. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes.

Post-fit agreement between data and MC prediction for the $SR_{\mathrm{tight}}^{2\ell4ji}$ signal region, which uses the jet multiplicity, $N_{\mathrm{jets}}$, as an observable. The hatched uncertainty bands include all uncertainties and their correlations. The last bins contain overflow events. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes.

Jet multiplicity and tagging criteria for the SRs and CRs in the single-lepton and dilepton channels. All single-lepton regions are defined in the 5-jet-exclusive and 6-jet-inclusive jet selections, all dilepton regions in the 3-jet-exclusive and 4-jet-inclusive jet selections. By construction, $\mathrm{SR}^{2\ell}_{\mathrm{tight}}$ only exists for the 4-jet-inclusive selection. Identical requirements on inclusive and exclusive working points, e.g., one c@22% and one c@11% in the $\mathrm{CR}_1^{1\ell}$, indicate a veto of additional tags at the inclusive working point.

Breakdown of the fiducial $t\bar{t}+{\geq}2c$ and $t\bar{t}+1c$ cross-section uncertainties. Systematic uncertainties are grouped into signal and background modeling, instrumental, and MC statistics categories. The table lists the fractional uncertainty in the measured cross-sections in percent and is estimated from the covariance matrix of the profile likelihood fit, following EPJC 84 (2024) 593. Individual groups of uncertainties can be added in quadrature to obtain the total uncertainty. JES and JER denote the jet energy scale and resolution uncertainties, respectively. The fractional uncertainties in the fitted $t\bar{t}+{\geq}1c$ and $t\bar{t}+\text{light}$ normalization factors are included in the data statistics category. For presentation purposes, all uncertainties are symmetrized.

Measured fiducial cross-section values in comparison with various NLO+PS predictions. The uncertainties in the predictions include independent and simultaneous variations of the $\mu_R$ and $\mu_F$ scales and uncertainties in the choice of the PDF set, but no uncertainties in the parton shower or hadronization. The uncertainties in the measured values include all statistical and systematic uncertainties. For presentation purposes, the quoted measurement and prediction uncertainties are symmetrized.

Measured and predicted values for the $t\bar{t}+{\geq}1b$, $t\bar{t}+{\geq}2c$, and $t\bar{t}+1c$ cross-sections and for the cross-section ratios of these processes to total $t\bar{t}+\text{jets}$ production. The quoted uncertainties in the measurements include statistical and systematic uncertainties. The predictions are taken from the nominal setup using inclusive $t\bar{t}$ Powheg+Pythia8 predictions for the $t\bar{t}+{\geq}2c$, $t\bar{t}+1c$, and $t\bar{t}+\text{light}$ processes, and $t\bar{t}+b\bar{b}$ Powheg+Pythia8 predictions for the $t\bar{t}+{\geq}1b$ process. The first use the 5FS, the latter the 4FS, where the $b$-quarks are treated as massive particles and are included in the matrix element calculation. The uncertainties in the predictions include independent and simultaneous variations of the $\mu_R$ and $\mu_F$ scales and uncertainties in the choice of the PDF set.

Nuisance parameters with a large impact on the fiducial measurement: ranking of the ten most impactful nuisance parameters for the $t\bar{t}+{\geq}2c$ cross-section measurement. The colored boxes indicate the impact of the nuisance parameters, $\Delta\mu$ (top axis), on the corresponding parameter of interest, $\mu$. They are calculated from the covariance matrix using the post-fit up (down) uncertainties of the parameter of interest and the nuisance parameter, $\sigma_{\mathrm{POI}}^{\mathrm{up}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{up}}$ ($\sigma_{\mathrm{POI}}^{\mathrm{down}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{down}}$), and their linear correlation coefficient, $\rho$, following EPJC 84 (2024) 593. The data points and error bars indicate the post-fit values and uncertainties of the nuisance parameters relative to their pre-fit values, $\theta_0$, in units of their pre-fit uncertainties, $\Delta \theta$ (bottom axis). A hollow circle indicates that the nuisance parameter has a Poisson constraint.

Nuisance parameters with a large impact on the fiducial measurement: ranking of the ten most impactful nuisance parameters for the $t\bar{t}+1c$ cross-section measurement. The colored boxes indicate the impact of the nuisance parameters, $\Delta\mu$ (top axis), on the corresponding parameter of interest, $\mu$. They are calculated from the covariance matrix using the post-fit up (down) uncertainties of the parameter of interest and the nuisance parameter, $\sigma_{\mathrm{POI}}^{\mathrm{up}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{up}}$ ($\sigma_{\mathrm{POI}}^{\mathrm{down}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{down}}$), and their linear correlation coefficient, $\rho$, following EPJC 84 (2024) 593. The data points and error bars indicate the post-fit values and uncertainties of the nuisance parameters relative to their pre-fit values, $\theta_0$, in units of their pre-fit uncertainties, $\Delta \theta$ (bottom axis). A hollow circle indicates that the nuisance parameter has a Poisson constraint.

Nuisance parameters with a large impact on the fiducial measurement: ranking of the ten most impactful nuisance parameters for the $t\bar{t}+{\geq}2c$ ratio to total $t\bar{t}+\text{jets}$ production. The colored boxes indicate the impact of the nuisance parameters, $\Delta\mu$ (top axis), on the corresponding parameter of interest, $\mu$. They are calculated from the covariance matrix using the post-fit up (down) uncertainties of the parameter of interest and the nuisance parameter, $\sigma_{\mathrm{POI}}^{\mathrm{up}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{up}}$ ($\sigma_{\mathrm{POI}}^{\mathrm{down}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{down}}$), and their linear correlation coefficient, $\rho$, following EPJC 84 (2024) 593. The data points and error bars indicate the post-fit values and uncertainties of the nuisance parameters relative to their pre-fit values, $\theta_0$, in units of their pre-fit uncertainties, $\Delta \theta$ (bottom axis). A hollow circle indicates that the nuisance parameter has a Poisson constraint.

Nuisance parameters with a large impact on the fiducial measurement: ranking of the ten most impactful nuisance parameters for the $t\bar{t}+1c$ ratio to total $t\bar{t}+\text{jets}$ production. The colored boxes indicate the impact of the nuisance parameters, $\Delta\mu$ (top axis), on the corresponding parameter of interest, $\mu$. They are calculated from the covariance matrix using the post-fit up (down) uncertainties of the parameter of interest and the nuisance parameter, $\sigma_{\mathrm{POI}}^{\mathrm{up}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{up}}$ ($\sigma_{\mathrm{POI}}^{\mathrm{down}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{down}}$), and their linear correlation coefficient, $\rho$, following EPJC 84 (2024) 593. The data points and error bars indicate the post-fit values and uncertainties of the nuisance parameters relative to their pre-fit values, $\theta_0$, in units of their pre-fit uncertainties, $\Delta \theta$ (bottom axis). A hollow circle indicates that the nuisance parameter has a Poisson constraint.

Efficiencies and rejection rates for the $b$- and $c$-jet tagging working points of the $b/c$-tagger, as well as the selection cuts on the discriminants, $\mathcal{D}_b'$ and $\mathcal{D}_c'$ that define the tagging bins. The primes indicate that a standard logistic function is applied to the discriminants. The b@70% and c@22% working points are inclusive of their respective tighter working points. The values were estimated from single-lepton and dilepton $t\bar{t}$ events simulated with Powheg + Pythia 8.

Efficiencies and rejection rates for the $b$- and $c$-jet tagging working points of the $b/c$-tagger, as well as the selection cuts on the discriminants, $\mathcal{D}_b'$ and $\mathcal{D}_c'$ that define the tagging bins. The primes indicate that a standard logistic function is applied to the discriminants. The b@70% and c@22% working points are inclusive of their respective tighter working points. The values were estimated from single-lepton and dilepton $t\bar{t}$ events simulated with Powheg + Pythia 8.

Pre-fit event yields in the twelve single-lepton and dilepton control regions (CRs) of the analysis. The quoted uncertainties include both statistical and systematic components, but all normalization factors are fixed to their pre-fit values with no uncertainties. All uncertainties are assumed to be uncorrelated. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes. The "Fakes" category includes events from misidentified leptons and non-prompt leptons, estimated through the data-driven matrix method in the single-lepton channel and through MC predictions in the dilepton channel.

Pre-fit event yields in the seven signal regions (SRs) of the analysis. The quoted uncertainties include both statistical and systematic components, but all normalization factors are fixed to their pre-fit values with no uncertainties. All uncertainties are assumed to be uncorrelated. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes. The "Fakes" category includes events from misidentified leptons and non-prompt leptons, estimated through the data-driven matrix method in the single-lepton channel and through MC predictions in the dilepton channel.

Post-fit event yields in the twelve single-lepton and dilepton control regions (CRs) of the analysis. The quoted uncertainties include both statistical and systematic components, and post-fit correlations between uncertainties are taken into account. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes. The "Fakes" category includes events from misidentified leptons and non-prompt leptons, estimated through the data-driven matrix method in the single-lepton channel and through MC predictions in the dilepton channel.

Post-fit event yields in the seven signal regions (SRs) of the analysis. The quoted uncertainties include both statistical and systematic components, and post-fit correlations between uncertainties are taken into account. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes. The "Fakes" category includes events from misidentified leptons and non-prompt leptons, estimated through the data-driven matrix method in the single-lepton channel and through MC predictions in the dilepton channel.

Post-fit distribution of the GNN score evaluated with $m_{H/A}$ = 400 GeV in the validation region in the 2LOS region with $\geq 8$ jets. These regions do not enter the fit. The post-fit background prediction is obtained using the post-fit nuisance parameters from the background-only fit in the control and signal regions.

Observed and expected 95% CL upper limits on the cross-section times branching ratio,$ \sigma(pp \rightarrow t\bar{t}H/A ) \times B(H/A \rightarrow t\bar{t})$, as a function of $m_{H/A}$, obtained using the 1L/2LOS final states.

Observed and expected 95% CL lower limits on tanβ as a function of the $m_{H/A}$ mass obtained using the 1L/2LOS final states, assuming a Type-II 2HDM in the alignment limit. Values of tanβ below the observed limit are excluded. The scenario where both the scalar $H$ and pseudo-scalar $A$ contribute with $m_H = m_A$ is shown.

Observed and expected 95% CL lower limits on tanβ as a function of the $m_{H/A}$ mass obtained using the 1L/2LOS final states, assuming a Type-II 2HDM in the alignment limit. Values of tanβ below the observed limit are excluded. The scenario with the contribution from scalar $H$ only is shown.

Observed and expected 95% CL lower limits on tanβ as a function of the $m_{H/A}$ mass obtained using the 1L/2LOS final states, assuming a Type-II 2HDM in the alignment limit. Values of tanβ below the observed limit are excluded. The scenario with the contribution from pseudo-scalar $A$ only is shown.

Expected and observed 95% CL upper limits on the cross-section times branching ratio,$ \sigma(pp \rightarrow t\bar{t}H/A ) \times B(H/A \rightarrow t\bar{t})$, as a function of $m_{H/A}$, obtained from the combination of the 1L/2LOS and 2LSS/ML final states.

Expected and observed 95% CL lower limits on tanβ as a function of the $m_{H/A}$ mass obtained using the 1L/2LOS and 2LSS/ML final states, assuming a Type-II 2HDM in the alignment limit. Values of tanβ below the observed limit are excluded. The scenario where both the scalar $H$ and pseudo-scalar $A$ contribute with $m_H = m_A$ is shown.

Expected and observed 95% CL lower limits on tanβ as a function of the $m_{H/A}$ mass obtained using the 1L/2LOS and 2LSS/ML final states, assuming a Type-II 2HDM in the alignment limit. Values of tanβ below the observed limit are excluded. The scenario with the contribution from scalar $H$ only is shown.

Expected and observed 95% CL lower limits on tanβ as a function of the $m_{H/A}$ mass obtained using the 1L/2LOS and 2LSS/ML final states, assuming a Type-II 2HDM in the alignment limit. Values of tanβ below the observed limit are excluded. The scenario with the contribution from pseudo-scalar $A$ only is shown.

Expected and Observed 95% CL upper limits on the $ \sigma(pp \rightarrow t\bar{t})\times B(S_8\rightarrow t\bar{t})$ production cross-section as a function of $m_{S_8}$, obtained from the combination of the 1L/2LOS and 2LSS/ML final states. The expected limits from the individual 1L/2LOS and 2LSS/ML analyses are also shown.

Post-fit distribution of the GNN scores evaluated with $m_{H/A}$ = 700 GeV in the 1L region with $\geq 10$ jets and four $b$-tagged jets. The fit is performed under the background-only hypothesis.

Post-fit distribution of the GNN scores evaluated with $m_{H/A}$ = 700 GeV in the 2LOS region with $\geq 8$ jets and $\geq 4$ $b$-tagged jets. The fit is performed under the background-only hypothesis.

Post-fit distribution of the GNN scores evaluated with $m_{H/A}=$1000 GeV,in the 1L region with $\geq 10$ jets four $b$-tagged jets. The fit is performed under the background-only hypothesis.

Post-fit distribution of the GNN scores evaluated with $m_{H/A}=$1000 GeV in the 2LOS region with $\geq 8$ jets and $\geq 4$ $b$-tagged jets. The fit is performed under the background-only hypothesis.

Post-fit distribution of the most important global features used in the GNN training, Sum of the pcb scores of the six jets with the highest scores ($\sum_{i\in[1,6]}\mathrm{pcb}_i$), in the region where the training is performed, i.e., the region with $\geq 9$ jets and $\geq3$ $b$-tagged jets in the 1L channel. The fit is performed under the background-only hypothesis using the GNN scores evaluated with $m_{H/A} = 400$ GeV.

Post-fit distribution of the most important global features used in the GNN training, Sum of the pcb scores of the six jets with the highest scores ($\sum_{i\in[1,6]}\mathrm{pcb}_i$), in the region where the training is performed i.e.the region with $\geq 7$ jets and $\geq3$ $b$-tagged jets in the 2LOS channel. The fit is performed under the background-only hypothesis using the GNN scores evaluated with $m_{H/A} = 400$ GeV.

Post-fit distribution of the most important global features used in the GNN training, $p_{\mathrm{T}}$ sum of all reconstructed leptons and jets ($\mathrm{H}_{\mathrm{T}}^{\mathrm{all}}$), in the region where the training is performed, i.e., the region with $\geq 9$ jets and $\geq3$ $b$-tagged jets in the 1L channel. The fit is performed under the background-only hypothesis using the GNN scores evaluated with $m_{H/A} = 400$ GeV.

Post-fit distribution of the most important global features used in the GNN training, $p_{\mathrm{T}}$ sum of all reconstructed leptons and jets ($\mathrm{H}_{\mathrm{T}}^{\mathrm{all}}$), in the region where the training is performed, i.e. the region with $\geq 7$ jets and $\geq3$ $b$-tagged jets in the 2LOS channel. The fit is performed under the background-only hypothesis using the GNN scores evaluated with $m_{H/A} = 400$ GeV.

Post-fit distribution of the most important global features used in the GNN training, Number of jets, in the region where the training is performed, i.e., the region with $\geq 9$ jets and $\geq3$ $b$-tagged jets in the 1L channel. The fit is performed under the background-only hypothesis using the GNN scores evaluated with $m_{H/A} = 400$ GeV.

Post-fit distribution of the most important global features used in the GNN training, Number of jets, in the region where the training is performed, i.e., the region with $\geq 7$ jets and $\geq3$ $b$-tagged jets in the 2LOS channel. The fit is performed under the background-only hypothesis using the GNN scores evaluated with $m_{H/A} = 400$ GeV.

Observed and expected 95% CL upper limits on the total cross-section σ($pp$ → $T$ → $Ht/Zt$) as a function of $T$-quark mass in the SU(2) doublet representation assuming $\kappa$=0.5. The expected limits for the individual analyses are shown. The $HtZt$ analysis is only included in the limit calculation for $m_{\mathrm{T}}$ < 2.1 TeV.

Observed 95% CL exclusion limits on the total cross-section σ($pp$ → $T$ → $Ht/Zt$) as a function of the universal coupling constant and the $T$-quark mass in the SU(2) singlet representation. Limits are only presented in the regime $\Gamma/m_{\mathrm{T}}$ < 50%, where the theory calculations are known to be valid.

Expected 95% CL exclusion limits on the total cross-section σ($pp$ → $T$ → $Ht/Zt$) as a function of the universal coupling constant and the $T$-quark mass in the SU(2) singlet representation. Limits are only presented in the regime $\Gamma/m_{\mathrm{T}}$ < 50%, where the theory calculations are known to be valid.

Observed 95% CL exclusion limits on the total cross-section σ($pp$ → $T$ → $Ht/Zt$) as a function of the universal coupling constant and the $T$-quark mass in the SU(2) doublet representation. Limits are only presented in the regime $\Gamma/m_{\mathrm{T}}$ < 50%, where the theory calculations are known to be valid.

Expected 95% CL exclusion limits on the total cross-section σ($pp$ → $T$ → $Ht/Zt$) as a function of the universal coupling constant and the $T$-quark mass in the SU(2) doublet representation. Limits are only presented in the regime $\Gamma/m_{\mathrm{T}}$ < 50%, where the theory calculations are known to be valid.

Obs.Comb 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) singlet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.Comb 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) singlet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.$+1\sigma$ for the 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) singlet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.$-1\sigma$ for the 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) singlet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.$+2\sigma$ for the 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) singlet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.$-2\sigma$ for the 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) singlet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.OSML 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) singlet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.HTZT 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) singlet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.Monotop 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) singlet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Obs.Comb 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) doublet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.Comb 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) doublet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.$+1\sigma$ for the 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) doublet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.$-1\sigma$ for the 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) doublet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.$+2\sigma$ for the 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) doublet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.$-2\sigma$ for the 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) doublet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.OSML 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) doublet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.HTZT 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) doublet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Observed upper limits at 95% CL on the $T$ quark mass as a function of the relative resonance width ($\Gamma_{\mathrm{T}}/m_{\mathrm{T}}$) and the relative coupling parameter $\xi_W$.

Expected upper limits at 95% CL on the $T$ quark mass as a function of the relative resonance width ($\Gamma_{\mathrm{T}}/m_{\mathrm{T}}$) and the relative coupling parameter $\xi_W$.

Observed and expected 95% CL upper limits on the total cross-section σ($pp$ → $T$ → $Ht/Zt$) as a function of $T$-quark mass in the SU(2) singlet representation assuming $\kappa$=0.7. The expected limits for the individual analyses are shown.

Observed and expected 95% CL upper limits on the total cross-section σ($pp$ → $T$ → $Ht/Zt$) as a function of $T$-quark mass in the SU(2) doublet representation assuming $\kappa$=0.7. The expected limits for the individual analyses are shown.

Observed and expected 95% CL upper limits on the total cross-section σ($pp$ → $T$ → $Ht/Zt$) as a function of $T$-quark mass in the SU(2) singlet representation assuming $\kappa$=0.3. The observed limits for the individual analyses are shown. The $HtZt$ analysis is only included in the limit calculation for $m_{\mathrm{T}}$ < 2.1 TeV.

Observed and expected 95% CL upper limits on the total cross-section σ($pp$ → $T$ → $Ht/Zt$) as a function of $T$-quark mass in the SU(2) singlet representation assuming $\kappa$=0.5. The observed limits for the individual analyses are shown. The $HtZt$ analysis is only included in the limit calculation for $m_{\mathrm{T}}$ < 2.1 TeV.

Observed and expected 95% CL upper limits on the total cross-section σ($pp$ → $T$ → $Ht/Zt$) as a function of $T$-quark mass in the SU(2) singlet representation assuming $\kappa$=0.7. The observed limits for the individual analyses are shown.

Observed and expected 95% CL upper limits on the total cross-section σ($pp$ → $T$ → $Ht/Zt$) as a function of $T$-quark mass in the SU(2) doublet representation assuming $\kappa$=0.3. The observed limits for the individual analyses are shown. The $HtZt$ analysis is only included in the limit calculation for $m_{\mathrm{T}}$ < 2.1 TeV.

Observed and expected 95% CL upper limits on the total cross-section σ($pp$ → $T$ → $Ht/Zt$) as a function of $T$-quark mass in the SU(2) doublet representation assuming $\kappa$=0.5. The observed limits for the individual analyses are shown. The $HtZt$ analysis is only included in the limit calculation for $m_{\mathrm{T}}$ < 2.1 TeV.

Observed and expected 95% CL upper limits on the total cross-section σ($pp$ → $T$ → $Ht/Zt$) as a function of $T$-quark mass in the SU(2) doublet representation assuming $\kappa$=0.7. The observed limits for the individual analyses are shown.

Obs.Comb 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) singlet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.Comb 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) singlet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.$+1\sigma$ for the 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) singlet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.$-1\sigma$ for the 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) singlet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.$+2\sigma$ for the 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) singlet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.$-2\sigma$ for the 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) singlet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Obs.OSML 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) singlet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Obs.HTZT 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) singlet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Obs.Monotop 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) singlet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Obs.Comb 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) doublet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.Comb 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) doublet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.$+1\sigma$ for the 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) doublet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.$-1\sigma$ for the 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) doublet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.$+2\sigma$ for the 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) doublet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Exp.$-2\sigma$ for the 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) doublet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Obs.OSML 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) doublet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.

Obs.HTZT 95% CL exclusion limits on the universal coupling constant $\kappa$ as a function of the $T$ quark mass in the SU(2) doublet representations for the combination. Limits are only presented in the regime $\Gamma_{\mathrm{T}}/m_{\mathrm{T}} < 50\%$, where the theory calculations are known to be valid.