Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the observed limit on the corresponding SUSY particle masses obtained by comparing the excluded cross section with theoretical cross sections.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the observed limit on the corresponding SUSY particle masses obtained by comparing the excluded cross section with $+1\sigma$ theoretical cross sections.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the observed limit on the corresponding SUSY particle masses obtained by comparing the excluded cross section with $-1\sigma$ theoretical cross sections.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the expected limit on the corresponding SUSY particle masses obtained by comparing the excluded cross section with theoretical cross sections.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the expected limit on the corresponding SUSY particle masses corresponding to a $+1\sigma$ variation of the experimental uncertainty.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the expected limit on the corresponding SUSY particle masses corresponding to a $-1\sigma$ variation of the experimental uncertainty.

Observed excluded region (95\% CL), shown in blue, in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane for a model combining T5tttt, gluino pair production, followed by gluino decay to an on-shell top squark, together with a model for direct top squark pair production. The top squarks decay via the two-body process $\tilde{t}\rightarrow t\tilde{\chi}^0_1$. The neutralino and top squark masses are related by the constraint $m_{\tilde{t}} = m_{\tilde{\chi}^0_1} + 175$ GeV.

Expected excluded region (95\% CL), shown in blue, in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane for a model combining T5tttt, gluino pair production, followed by gluino decay to an on-shell top squark, together with a model for direct top squark pair production. The top squarks decay via the two-body process $\tilde{t}\rightarrow t\tilde{\chi}^0_1$. The neutralino and top squark masses are related by the constraint $m_{\tilde{t}} = m_{\tilde{\chi}^0_1} + 175$ GeV.

Figure 8. Gluino pair production cross section.

Table 1. Post-fit yields for the background-only fit, observed data, and expected yields for mgluino = 1600 GeV in each search bin.

Distribution in the reconstructed B quark mass after applying all selections to events with no forward jets and in the low mass analysis, compared to the background distributions estimated before fitting.

Distribution in the reconstructed B quark mass after applying all selections to events with no forward jets and in the low mass analysis, compared to the background distributions estimated after fitting.

Distribution in the reconstructed B quark mass after applying all selections to events with at least one forward jet and in the low mass analysis, compared to the background distributions estimated after fitting.

Distribution in the reconstructed B quark mass after applying all selections to events with no forward jets and in the high mass analysis, compared to the background distributions estimated after fitting.

Distribution in the reconstructed B quark mass after applying all selections to events with at least one forward jet and in the high mass analysis, compared to the background distributions estimated after fitting.

The median observed and expected 95% CL upper limits on the product of the B quark production cross section and branching fraction as a function of the signal mass, for the narrow width scenario. The results are shown for the combination of 0 and >0 forward-jet categories.

The median observed and expected 95% CL upper limits on the product of the B quark production cross section and branching fraction as a function of the signal mass, for the resonance width/mass equal to 10% scenario. The results are shown for the combination of 0 and >0 forward-jet categories.

The median observed and expected 95% CL upper limits on the product of the B quark production cross section and branching fraction as a function of the signal mass, for the resonance width/mass equal to 20% scenario. The results are shown for the combination of 0 and >0 forward-jet categories.

The median observed and expected 95% CL upper limits on the product of the B quark production cross section and branching fraction as a function of the signal mass, for the resonance width/mass equal to 30% scenario. The results are shown for the combination of 0 and >0 forward-jet categories.

Observed and expected fitted number of events in the signal ranges of 800 < mB < 1500, and expected signal at mB = 1000 GeV. The multijet background is obtained from data, while the yields for the other sources of background are obtained from MC simulation. The combined statistical and systematic uncertainties correspond to the quadrature of the statistical and systematic uncertainties.

Observed and expected fitted number of events in the signal ranges 1500 < mB < 1800 , and expected signal at mB = 1800 GeV. The multijet background is obtained from data, while the yields for the other sources of background are obtained from MC simulation. The combined statistical and systematic uncertainties correspond to the quadrature of the statistical and systematic uncertainties.

Observed exclusion contour at 95% CL for the T6gg model.

Expected exclusion contour at 95% CL for the T6gg model.

Exclusion limits on the SUSY cross section at 95% CL for the T6Wg model.

Observed exclusion contour at 95% CL for the T6Wg model.

Expected exclusion contour at 95% CL for the T6Wg model.

Exclusion limits on the SUSY cross section at 95% CL for the T5gg model.

Observed exclusion contour at 95% CL for the T5gg model.

Expected exclusion contour at 95% CL for the T5gg model.

Exclusion limits on the SUSY cross section at 95% CL for the T5Wg model.

Observed exclusion contour at 95% CL for the T5Wg model.

Expected exclusion contour at 95% CL for the T5Wg model.

Figure 2. -1 sigma excluded gluino and neutralino masses at 95% CL for the T1tttt.

Figure 2. Expected exclusion for the T1tttt model.

Figure 2. +1 sigma expected exclusion for the T1tttt model.

Figure 2. -1 sigma expected exclusion for the T1tttt model.

Figure 2. Excluded gluino and neutralino masses at 95% CL for the T5tttt.

Figure 2. Expected exclusion for the T5tttt model.

Table 1. Observed event yields and mean background yields from the predictive fit in the 18 bins of the signal region R4.

Table 2. Observed event yields and mean background yields from the predictive fit in four aggregate search bins.

Figure 9a (upper left). The 95% CL upper limit on the production cross section of the T1tttt simplified models as a function of the gluino and LSP masses.

Figure 9a (upper left). Observed exclusion region at 95% CL assuming 100% branching fraction.

Figure 9a (upper left). Expected exclusion region at 95% CL assuming 100% branching fraction.

Figure 9b (upper right). The 95% CL upper limit on the production cross section of the T1ttbb simplified models as a function of the gluino and LSP masses.

Figure 9b (upper right). Observed exclusion region at 95% CL.

Figure 9b (upper right). Expected exclusion region at 95%.

Figure 9c (bottom left). The 95% CL upper limit on the production cross section of the T5tttt simplified models as a function of the gluino and LSP masses. imits are not given for the T5tttt model for mχ~01< 50 GeV for the reason stated in the text.

Figure 9c (bottom left). Observed exclusion region at 95% CL assuming 100% branching fraction.

Figure 9c (bottom left). Expected exclusion region at 95% CL assuming 100% branching fraction.

Figure 9d (bottom right). The 95% CL upper limit on the production cross section of the T5ttcc simplified models as a function of the gluino and LSP masses.

Figure 9d (bottom right). Observed exclusion region at 95% CL.

Figure 9d (bottom right). Expected exclusion region at 95% CL.

The observed number of events and the total background prediction for search regions with Nt = 1 and Nb = 1.

The observed number of events and the total background prediction for search regions with Nt = 1 and Nb ≥ 2.

The observed number of events and the total background prediction for search regions with Nt ≥ 2.

Selected T2tt signal yields for the aggregate search bins.

Selected gluino mediated signal yields for the aggregate search bins.

Distribution of $m_{jj}$ in data and simulation for events in the signal regions of the low-mass search. The points show the data while the filled histograms show the background contributions. The gray band shows the statistical and systematic uncertainties in the background, while the dashed vertical region ("Higgs") shows the expected SM Higgs boson mass range, which is excluded from this analysis. A 600 GeV bulk graviton signal prediction is represented by the black dashed histogram; for visibility, the signal cross-section is increased by a factor of 50. The background normalization is derived from the final fit to the $m_{VZ}$ observable in data.

The m$_{j}$ distributions of the events in data, compared to the expected background shape, for the high-mass analysis in the electron channel, for the high-purity category. The expected background shape is extracted from a fit to the data sidebands (Z+jets) or derived from simulation ("top quark" and "VV"). The dashed region around the background sum represents the uncertainty in the Z+jets distribution, while the dashed vertical region ("Higgs") shows the expected SM Higgs boson mass range, excluded from the analysis.

The m$_{j}$ distributions of the events in data, compared to the expected background shape, for the high-mass analysis in the electron channel, for the low-purity category. The expected background shape is extracted from a fit to the data sidebands (Z+jets) or derived from simulation ("top quark" and "VV"). The dashed region around the background sum represents the uncertainty in the Z+jets distribution, while the dashed vertical region ("Higgs") shows the expected SM Higgs boson mass range, excluded from the analysis.

The m$_{j}$ distributions of the events in data, compared to the expected background shape, for the high-mass analysis in the muon channel, for the high-purity category. The expected background shape is extracted from a fit to the data sidebands (Z+jets) or derived from simulation ("top quark" and "VV"). The dashed region around the background sum represents the uncertainty in the Z+jets distribution, while the dashed vertical region ("Higgs") shows the expected SM Higgs boson mass range, excluded from the analysis.

The m$_{j}$ distributions of the events in data, compared to the expected background shape, for the high-mass analysis in the muon channel, for the low-purity category. The expected background shape is extracted from a fit to the data sidebands (Z+jets) or derived from simulation ("top quark" and "VV"). The dashed region around the background sum represents the uncertainty in the Z+jets distribution, while the dashed vertical region ("Higgs") shows the expected SM Higgs boson mass range, excluded from the analysis.

Expected and observed distributions of the resonance candidate mass $m_{\text{VZ}}$ in the high-mass analysis, in the electron channel, high-purity category. The shaded area represents the post-fit uncertainty in the background. The expected contribution from W' signal candidates with mass $m_{\text{X}} = 2000$ GeV, normalized to a cross section of 100 fb$^{-1}$, is also shown.

Expected and observed distributions of the resonance candidate mass $m_{\text{VZ}}$ in the high-mass analysis, in the electron channel, low-purity category. The shaded area represents the post-fit uncertainty in the background. The expected contribution from W' signal candidates with mass $m_{\text{X}} = 2000$ GeV, normalized to a cross section of 100 fb$^{-1}$, is also shown.

Expected and observed distributions of the resonance candidate mass $m_{\text{VZ}}$ in the high-mass analysis, in the muon channel, high-purity category. The shaded area represents the post-fit uncertainty in the background. The expected contribution from W' signal candidates with mass $m_{\text{X}} = 2000$ GeV, normalized to a cross section of 100 fb$^{-1}$, is also shown.

Expected and observed distributions of the resonance candidate mass $m_{\text{VZ}}$ in the high-mass analysis, in the muon channel, low-purity category. The shaded area represents the post-fit uncertainty in the background. The expected contribution from W' signal candidates with mass $m_{\text{X}} = 2000$ GeV, normalized to a cross section of 100 fb$^{-1}$, is also shown.

Sideband $m_{ZV}$ distribution for the low-mass search in the merged V, untagged category, after fitting the sideband data alone. The points show the data while the filled histograms show the background contributions. Electron and muon categories are combined. The gray band indicates the statistical and post-fit systematic uncertainties in the normalization and shape of the background. Larger bin widths are used at higher values of $m_{ZV}$; the bin widths are indicated by the horizontal error bars.

Sideband $m_{ZV}$ distribution for the low-mass search in the merged V, tagged category, after fitting the sideband data alone. The points show the data while the filled histograms show the background contributions. Electron and muon categories are combined. The gray band indicates the statistical and post-fit systematic uncertainties in the normalization and shape of the background. Larger bin widths are used at higher values of $m_{ZV}$; the bin widths are indicated by the horizontal error bars.

Sideband $m_{ZV}$ distribution for the low-mass search in the resolved V, untagged category, after fitting the sideband data alone. The points show the data while the filled histograms show the background contributions. Electron and muon categories are combined. The gray band indicates the statistical and post-fit systematic uncertainties in the normalization and shape of the background. Larger bin widths are used at higher values of $m_{ZV}$; the bin widths are indicated by the horizontal error bars.

Sideband $m_{ZV}$ distribution for the low-mass search in the resolved V, tagged category, after fitting the sideband data alone. The points show the data while the filled histograms show the background contributions. Electron and muon categories are combined. The gray band indicates the statistical and post-fit systematic uncertainties in the normalization and shape of the background. Larger bin widths are used at higher values of $m_{ZV}$; the bin widths are indicated by the horizontal error bars.

The signal region $m_{VZ}$ distribution for the low-mass search, in the the merged V, untagged category, after fitting the signal and sideband regions. Electron and muon categories are combined. A 600 GeV bulk graviton signal prediction is represented by the black dashed histogram. The gray band indicates the statistical and post-fit systematic uncertainties in the normalization and shape of the background. Larger bin widths are used at higher values of $m_{VZ}$; the bin widths are indicated by the horizontal error bars.

The signal region $m_{VZ}$ distribution for the low-mass search, in the the merged V, tagged category, after fitting the signal and sideband regions. Electron and muon categories are combined. A 600 GeV bulk graviton signal prediction is represented by the black dashed histogram. The gray band indicates the statistical and post-fit systematic uncertainties in the normalization and shape of the background. Larger bin widths are used at higher values of $m_{VZ}$; the bin widths are indicated by the horizontal error bars.

The signal region $m_{VZ}$ distribution for the low-mass search, in the the resolved V, untagged category, after fitting the signal and sideband regions. Electron and muon categories are combined. A 600 GeV bulk graviton signal prediction is represented by the black dashed histogram. The gray band indicates the statistical and post-fit systematic uncertainties in the normalization and shape of the background. Larger bin widths are used at higher values of $m_{VZ}$; the bin widths are indicated by the horizontal error bars.

The signal region $m_{VZ}$ distribution for the low-mass search, in the the resolved V, tagged category, after fitting the signal and sideband regions. Electron and muon categories are combined. A 600 GeV bulk graviton signal prediction is represented by the black dashed histogram. The gray band indicates the statistical and post-fit systematic uncertainties in the normalization and shape of the background. Larger bin widths are used at higher values of $m_{VZ}$; the bin widths are indicated by the horizontal error bars.

Observed and expected 95% CL upper limit on $\sigma_{W'} Br(W' \to ZW)$ as a function of the resonance mass, taking into account all statistical and systematic uncertainties. The electron and muon channels and the various categories used in the analysis are combined together. The green (inner) and yellow (outer) bands represent the 68% and 95% coverage of the expected limit in the background-only hypothesis.

Observed and expected 95% CL upper limit on $\sigma_{G} Br(G \to ZZ)$ as a function of the resonance mass, taking into account all statistical and systematic uncertainties. The electron and muon channels and the various categories used in the analysis are combined together. The green (inner) and yellow (outer) bands represent the 68% and 95% coverage of the expected limit in the background-only hypothesis.

Observed local p-values for W' narrow resonances as a function of the resonance mass.

Observed local p-values for G narrow resonances as a function of the resonance mass.

Distributions of $\min[M(\ell,\mathrm{j})]$ in the W+jets control region, for 0 W-tagged jet category. Example signal distributions are also shown. The background distributions correspond to background-only fit to data while signal distributions are before the fit to data. Electron and muon event samples are combined. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{j})]$ in the W+jets control region, for 1 or more W-tagged jet category. Example signal distributions are also shown. The background distributions correspond to background-only fit to data while signal distributions are before the fit to data. Electron and muon event samples are combined. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 0 W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 0 W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 1 or more W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 1 or more W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 0 W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 0 W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 1 or more W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 1 or more W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Expected and observed limits at 95% CL for an LH $X_{5/3}$ after combining all categories for the same-sign dilepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an RH $X_{5/3}$ after combining all categories for the same-sign dilepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an LH $X_{5/3}$ after combining all categories for the single-lepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an RH $X_{5/3}$ after combining all categories for the single-lepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an LH $X_{5/3}$ after combining the same-sign dilepton and single-lepton final states. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an RH $X_{5/3}$ after combining the same-sign dilepton and single-lepton final states. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

W+jets BDT distributions in the muon and electron single-lepton channel. The SR is defined as events with W+jets BDT >= 0.5.

W+jets BDT distributions in the muon and electron single-lepton channel. The SR is defined as events with W+jets BDT >= 0.5.

Dijet rapidity difference $(|\Delta y|)$ for events passing the fully hadronic event selection for all $m_{t\overline{t}}$ and for events with an $m_{t\overline{t}}$ > 2 TeV.

Dijet rapidity difference $(|\Delta y|)$ for events passing the fully hadronic event selection for all $m_{t\overline{t}}$ and for events with an $m_{t\overline{t}}$ > 2 TeV.

Distributions of $p_{T}$ and $m_{SD}$ for the W+jets background in the muon and electron channels using the W+jets mistag CR.

Distributions of $p_{T}$ and $m_{SD}$ for the W+jets background in the muon and electron channels using the W+jets mistag CR.

Distributions of $p_{T}$ and $m_{SD}$ for the W+jets background in the muon and electron channels using the W+jets mistag CR.

Distributions of $p_{T}$ and $m_{SD}$ for the W+jets background in the muon and electron channels using the W+jets mistag CR.

Distributions of $S_{T}$ in the background-enriched CR for $\mu\mu$, $ee$, and $e\mu$ subchannels.

Distributions of $S_{T}$ in the background-enriched CR for $\mu\mu$, $ee$, and $e\mu$ subchannels.

Distributions of $S_{T}$ in the background-enriched CR for $\mu\mu$, $ee$, and $e\mu$ subchannels.

Distributions of ST for the $\mu\mu$, $ee$, and $e\mu$ SRs in the boosted and nonboosted regions.

Distributions of ST for the $\mu\mu$, $ee$, and $e\mu$ SRs in the boosted and nonboosted regions.

Distributions of ST for the $\mu\mu$, $ee$, and $e\mu$ SRs in the boosted and nonboosted regions.

Distributions of ST for the $\mu\mu$, $ee$, and $e\mu$ SRs in the boosted and nonboosted regions.

Distributions of ST for the $\mu\mu$, $ee$, and $e\mu$ SRs in the boosted and nonboosted regions.

Distributions of ST for the $\mu\mu$, $ee$, and $e\mu$ SRs in the boosted and nonboosted regions.

Distributions of $m_{t\overline{t}}$ for the single-lepton channel CR1 and CR2 forthe muon and electron categories.

Distributions of $m_{t\overline{t}}$ for the single-lepton channel CR1 and CR2 forthe muon and electron categories.

Distributions of $m_{t\overline{t}}$ for the single-lepton channel SRs for the muon and electron categories with and without t tagging

Distributions of $m_{t\overline{t}}$ for the single-lepton channel SRs for the muon and electron categories with and without t tagging

Distributions of $m_{t\overline{t}}$ for the single-lepton channel CR1 and CR2 forthe muon and electron categories.

Distributions of $m_{t\overline{t}}$ for the single-lepton channel CR1 and CR2 forthe muon and electron categories.

Distributions of $m_{t\overline{t}}$ for the single-lepton channel SRs for the muon and electron categories with and without t tagging

Distributions of $m_{t\overline{t}}$ for the single-lepton channel SRs for the muon and electron categories with and without t tagging

Distributions of $m_{t\overline{t}}$ for the fully hadronic channel SR categories, used to extract the final results.

Distributions of $m_{t\overline{t}}$ for the fully hadronic channel SR categories, used to extract the final results.

Distributions of $m_{t\overline{t}}$ for the fully hadronic channel SR categories, used to extract the final results.

Distributions of $m_{t\overline{t}}$ for the fully hadronic channel SR categories, used to extract the final results.

Distributions of $m_{t\overline{t}}$ for the fully hadronic channel SR categories, used to extract the final results.

Distributions of $m_{t\overline{t}}$ for the fully hadronic channel SR categories, used to extract the final results.

The $S_{\rm T}$ distribution for group B before fitting.

The $S_{\rm T}$ distribution for group C before fitting.

The $S_{\rm T}$ distribution for group C before fitting.

The $S_{\rm T}$ distribution for group D before fitting.

The $S_{\rm T}$ distribution for group D before fitting.

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = 100%.

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = 100%.

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = B(T → tH) = 50%.

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = B(T → tH) = 50%.

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = B(T → bW) = 50%

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = B(T → bW) = 50%

The number of observed events and the predicted number of SM background events in the $T\bar T$ search using electron channel in the four event groups.

The number of observed events and the predicted number of SM background events in the $T\bar T$ search using electron channel in the four event groups.

The number of observed events and the predicted number of SM background events in the $T\bar T$ search using muon channel in the four event groups.

The number of observed events and the predicted number of SM background events in the $T\bar T$ search using muon channel in the four event groups.

The $S_{\rm T}$ distribution for 1b event category for data and the expected background before fitting.

The $S_{\rm T}$ distribution for 1b event category for data and the expected background before fitting.

The $S_{\rm T}$ distribution for 2b event category for data and the expected background.

The $S_{\rm T}$ distribution for 2b event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted t event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted t event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted H event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted H event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted Z event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted Z event category for data and the expected background.

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = 100%.

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = 100%.

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = Br(B → bH) = 50%.

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = Br(B → bH) = 50%.

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = Br(B → tW) = 50%

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = Br(B → tW) = 50%

The number of observed events and the predicted number of SM background events in the $B\bar B$ search using electron channel in the five event categories.

The number of observed events and the predicted number of SM background events in the $B\bar B$ search using electron channel in the five event categories.

The number of observed events and the predicted number of SM background events in the $B\bar B$ search using muon channel in the five event categories.

The number of observed events and the predicted number of SM background events in the $B\bar B$ search using muon channel in the five event categories.

Expected yields for different processes after several selection stages. The preselection requires two leptons and at least one photon with $\mathrm{p_\mathrm{T}}$ larger than 25, 20, and 25 GeV, respectively; in addition the dilepton $\mathrm{p_\mathrm{T}}$ must be larger than 60 GeV, and the $\mathrm{p_\mathrm{T}}^{\mathrm{miss}}$ larger than 70 GeV. The signal prediction corresponds to $0.1 \sigma_{\mathrm{\mathrm{ZH}}}$ at $m_{H}$ = 125 GeV.

Expected and observed upper limits at 95\% confidence level on the product of $\sigma_{\mathrm{\mathrm{ZH}}}$ and $\mathcal{B}$($\mathrm{H}$ -> $\mathrm{invisible}+\gamma$) as a function of $m_{\mathrm{\mathrm{H}}}$.

Expected and observed upper limits at 95\% confidence level on the product of $\sigma_{\mathrm{\mathrm{ZH}}}$ and $\mathcal{B}$($\mathrm{H}$ -> $\mathrm{invisible}+\gamma$) as a function of $m_{\mathrm{\mathrm{H}}}$.

$\mathrm{M_{\mathrm{T}}}$ distribution for the $\mathrm{e}\mu$ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the $\mathrm{e}\mu$ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the WZ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the WZ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the ZZ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the ZZ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the signal region, events with $|\eta_{\gamma}|<1$.

$\mathrm{M_{\mathrm{T}}}$ distribution for the signal region, events with $|\eta_{\gamma}|<1$.

$\mathrm{M_{\mathrm{T}}}$ distribution for the signal region, events with $|\eta_{\gamma}|>1$.

$\mathrm{M_{\mathrm{T}}}$ distribution for the signal region, events with $|\eta_{\gamma}|>1$.

Muon reconstruction, identification, and isolation efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Muon reconstruction, identification, and isolation efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Electron reconstruction, identification, and isolation efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Electron reconstruction, identification, and isolation efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Photon efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Photon efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Covariance matrix for all bins used in the analysis. There are 45 bins in total, 15 for every data-taking year. For every year, the first bin corresponds to events in the $\mathrm{e}\mu$ control region, the following five bins correspond to events with $|\eta^\gamma|< 1$ in the signal region, the next five bins correspond to events with $|\eta^\gamma|> 1$ in the signal region, the next two bins correspond to events in the WZ control region, and finally the last two bins correspond to events in the ZZ control region.

Covariance matrix for all bins used in the analysis. There are 45 bins in total, 15 for every data-taking year. For every year, the first bin corresponds to events in the $\mathrm{e}\mu$ control region, the following five bins correspond to events with $|\eta^\gamma|< 1$ in the signal region, the next five bins correspond to events with $|\eta^\gamma|> 1$ in the signal region, the next two bins correspond to events in the WZ control region, and finally the last two bins correspond to events in the ZZ control region.

The $L_{T}$ distribution in the MisID-enriched region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L below-Z signal region. The last bin contains the overflow events.

The $M_{T}$ distribution in the 3L on-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L above-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF1 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF2 signal region. The last bin contains the overflow events.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The 95% confidence level exclusion limits for the flavor-democratic scenario on the total production cross section of heavy fermion pairs.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(PS).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(PS).

Product of the fiducial acceptance and the event selection efficiency for the type-III Seesaw signal model at various signal mass hypotheses calculated after all analysis selection requirements.

Product of the fiducial acceptance and the event selection efficiency for the tt$\phi$ signal models at various signal mass hypotheses calculated after all analysis selection requirements.

Measured misidentification probability distribution as a function of track multiplicity for the EMJ-1 criteria group defined in Table 2. The red up-pointing triangles are for b jets while the blue down-pointing triangles are for light-flavor jets. The horizontal lines on the data points indicate the variable bin width.

The $H_\mathrm{T}$ distribution for the observed data events (black points) and the predicted background estimation (blue) for selection set 8 (SM QCD-enhanced), requiring at least two jets tagged by loose emerging jet criteria.

The number of associated tracks distribution for the observed data events (black points) and the predicted background estimation (blue) for selection set 8 (SM QCD-enhanced), requiring at least two jets tagged by loose emerging jet criteria.

The $H_\mathrm{T}$ distribution for the observed data events (black points) and the predicted background estimation (blue) for selection set 9 (SM QCD-enhanced), requiring at least one jet tagged by loose emerging jet criteria and large $p_\mathrm{T}^\mathrm{miss}$.

The number of associated tracks distribution for the observed data events (black points) and the predicted background estimation (blue) for selection set 9 (SM QCD-enhanced), requiring at least one jet tagged by loose emerging jet criteria and large $p_\mathrm{T}^\mathrm{miss}$.

Upper limits at 95% CL on the signal cross section for models with dark pion mass $(m_{\pi_\mathrm{DK}})$ of 5 GeV in the proper decay length $(c\tau_{\pi_\mathrm{DK}})$ versus dark mediator mass $(m_{\mathrm{X_{DK}}})$ plane.

Dark mediator mass exclusion limits at 95% CL derived from theoretical cross sections for models with dark pion mass $(m_{\pi_\mathrm{DK}})$ of 5 GeV in the proper decay length $(c\tau_{\pi_\mathrm{DK}})$ versus dark mediator mass $(m_{\mathrm{X_{DK}}})$ plane.

The timing distribution of the background sources predicted to contribute to the signal region, compared to those for a representative signal model. The time is defined by the jet in the event with the largest $t_{\mathrm{jet}}$ passing the relevant selection. The distributions for the major backgrounds are taken from control regions and normalized to the predictions. The observed data is shown by the black points. No events are observed in data for $t_{\mathrm{jet}} > 3\,$ns (indicated with a vertical black line).

The product of the acceptance and efficiency in the $c\tau_{0}$ vs. $m_{\tilde{g}}$ plane for the GMSB model, after all requirements.

The product of the acceptance and efficiency in the $c\tau_{0}$ vs. $m_{\tilde{g}}$ plane for the GMSB model, after all requirements.

The observed upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed.

The observed upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The observed upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed.

The observed upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The observed and expected upper limits at $95\%$ CL on the gluino pair production cross section for a gluino GMSB model with $m_{\tilde{g}}=2400$ GeV. The one (two) standard deviation variation in the expected limit is shown in the inner green (outer yellow) band. The blue solid line shows the observed limit obtained by the CMS displaced jet search

The observed and expected upper limits at $95\%$ CL on the gluino pair production cross section for a gluino GMSB model with $m_{\tilde{g}}=2400$ GeV. The one (two) standard deviation variation in the expected limit is shown in the inner green (outer yellow) band. The blue solid line shows the observed limit obtained by the CMS displaced jet search

The distribution (normalized to unity) of number of ECAL cells hit in the jet for jets in a background enriched data sample (satisfying $|\eta| < 1.48$, $PV_{\rm track}^{\rm fraction} > 1/12$, $\mathrm{HEF} > 0.2$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$ and $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$) and for signal jets satisfying signal region requirements (except those on $E_{\mathrm{ECAL}}$ and $N^{\mathrm{cell}}_{\mathrm{ECAL}}$).

The distribution (normalized to unity) of number of ECAL cells hit in the jet for jets in a background enriched data sample (satisfying $|\eta| < 1.48$, $p_\mathrm{T}tf > 0.08$, $\mathrm{HEF} > 0.2$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$ and $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$) and for signal jets satisfying signal region requirements (except those on $E_{\mathrm{ECAL}}$ and $N^{\mathrm{cell}}_{\mathrm{ECAL}}$).

The distribution (normalized to unity) of $\mathrm{HEF}$ for a data sample enriched in beam halo and noise jets (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30 \,\mathrm{GeV}$, $PV_{\rm track}^{\rm fraction} < 1/12$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$) and for signal jets passing signal region selections (except on $\mathrm{HEF}$).

The distribution (normalized to unity) of $\mathrm{HEF}$ for a data sample enriched in beam halo and noise jets (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30 \,\mathrm{GeV}$, $p_\mathrm{T}tf < 0.08$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$) and for signal jets passing signal region selections (except on $\mathrm{HEF}$).

The distribution (normalized to unity) of $E_{\mathrm{HCAL}}$ for a data sample enriched in beam halo and noise jets (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30 \,\mathrm{GeV}$, $PV_{\rm track}^{\rm fraction} < 1/12$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$) and for signal jets passing signal region selections (except on $E_{\mathrm{HCAL}}$).

The distribution (normalized to unity) of $E_{\mathrm{HCAL}}$ for a data sample enriched in beam halo and noise jets (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30 \,\mathrm{GeV}$, $p_\mathrm{T}tf < 0.08$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$) and for signal jets passing signal region selections (except on $E_{\mathrm{HCAL}}$).

The distribution (normalized to unity) of $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}}$ for data sample enriched in jets from noise (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $PV_{\rm track}^{\rm fraction} > 1/12$, $\mathrm{HEF} > 0.2$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20 \,\mathrm{GeV}$ and $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$) and for signal jets passing signal region selections (except on $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}}$ and $t^{\mathrm{RMS}}_\mathrm{jet}$)

The distribution (normalized to unity) of $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}}$ for data sample enriched in jets from noise (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $p_\mathrm{T}tf > 0.08$, $\mathrm{HEF} > 0.2$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20 \,\mathrm{GeV}$ and $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$) and for signal jets passing signal region selections (except on $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}}$ and $t^{\mathrm{RMS}}_\mathrm{jet}$)

The distribution (normalized to unity) of $t^{\mathrm{RMS}}_\mathrm{jet}$ for data sample enriched in jets from noise (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $PV_{\rm track}^{\rm fraction} > 1/12$, $\mathrm{HEF} > 0.2$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20 \,\mathrm{GeV}$ and $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$) and for signal jets passing signal region selections (except on $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}}$ and $t^{\mathrm{RMS}}_\mathrm{jet}$)

The distribution (normalized to unity) of $t^{\mathrm{RMS}}_\mathrm{jet}$ for data sample enriched in jets from noise (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $p_\mathrm{T}tf > 0.08$, $\mathrm{HEF} > 0.2$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20 \,\mathrm{GeV}$ and $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$) and for signal jets passing signal region selections (except on $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}}$ and $t^{\mathrm{RMS}}_\mathrm{jet}$)

The distribution (normalized to unity) of $PV_{\rm track}^{\rm fraction}$ for a data sample enriched in main bunch backgrounds (satisfying $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$, $|t_{\mathrm{jet}}| < 3\,\mathrm{ns}$ and $E_{\mathrm{ECAL}} >20\,\mathrm{GeV}$) and for signal jets passing signal selections (except on $PV_{\rm track}^{\rm fraction}$).

The distribution (normalized to unity) of $p_\mathrm{T}tf$ for a data sample enriched in main bunch backgrounds (satisfying $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$, $|t_{\mathrm{jet}}| < 3\,\mathrm{ns}$ and $E_{\mathrm{ECAL}} >20\,\mathrm{GeV}$) and for signal jets passing signal selections (except on $p_\mathrm{T}tf$).

The distribution (normalized to unity) of $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}}$ for a data sample enriched in beam halo (satisfying $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $PV_{\rm track}^{\rm fraction} < 1/12$, $\mathrm{HEF} < 0.2$, $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$ and $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$) and for signal jets passing signal selections (except on $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}}$)

The distribution (normalized to unity) of $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}}$ for a data sample enriched in beam halo (satisfying $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $p_\mathrm{T}tf < 0.08$, $\mathrm{HEF} < 0.2$, $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$ and $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$) and for signal jets passing signal selections (except on $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}}$)

The distribution (normalized to unity) of $\mathrm{max}(\Delta \phi_{\mathrm{DT}})$ for a data sample enriched in cosmic muons (satisfying $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $PV_{\rm track}^{\rm fraction} < 1/12$, $\mathrm{HEF} > 0.2$, $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$, $t_{\mathrm{jet}} > 3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and failing the HCAL noise rejection quality filters) and for signal jets passing signal selections (except on $\mathrm{max}(\Delta \phi_{\mathrm{DT}})$).

The distribution (normalized to unity) of $\mathrm{max}(\Delta \phi_{\mathrm{DT}})$ for a data sample enriched in cosmic muons (satisfying $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $p_\mathrm{T}tf < 0.08$, $\mathrm{HEF} > 0.2$, $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$, $t_{\mathrm{jet}} > 3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and failing the HCAL noise rejection quality filters) and for signal jets passing signal selections (except on $\mathrm{max}(\Delta \phi_{\mathrm{DT}})$).

The distribution (normalized to unity) of $\mathrm{max}(\Delta \phi_{\mathrm{RPC}})$ for a data sample enriched in cosmic muons (satisfying $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $PV_{\rm track}^{\rm fraction} < 1/12$, $\mathrm{HEF} > 0.2$, $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$, $t_{\mathrm{jet}} > 3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and failing the HCAL noise rejection quality filters) and for signal jets passing signal selections (except on $\mathrm{max}(\Delta \phi_{\mathrm{RPC}})$).

The distribution (normalized to unity) of $\mathrm{max}(\Delta \phi_{\mathrm{RPC}})$ for a data sample enriched in cosmic muons (satisfying $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $p_\mathrm{T}tf < 0.08$, $\mathrm{HEF} > 0.2$, $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$, $t_{\mathrm{jet}} > 3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and failing the HCAL noise rejection quality filters) and for signal jets passing signal selections (except on $\mathrm{max}(\Delta \phi_{\mathrm{RPC}})$).

Distribution of $t_{\mathrm{jet}}$ for jets with the full Run 2 dataset with no cleaning selection applied (a) and after all jet cleaning selections are applied (b) in events satisfying the trigger requirements and satisfying $p_T^\mathrm{miss} > 300$. The jets are required to pass an inverted selection of $PV_{\rm track}^{\rm fraction} > 1/12$ to enrich the sample in those originating from main and satellite bunch backgrounds. The cleaning selections are shown to reduce the backgrounds by many orders of magnitude.

Distribution of $t_{\mathrm{jet}}$ for jets with the full Run 2 dataset with no cleaning selection applied (a) and after all jet cleaning selections are applied (b) in events satisfying the trigger requirements and satisfying $p_T^\mathrm{miss} > 300$. The jets are required to pass an inverted selection of $PV_{\rm track}^{\rm fraction} > 0.08$ to enrich the sample in those originating from main and satellite bunch backgrounds. The cleaning selections are shown to reduce the backgrounds by many orders of magnitude.

Distribution of $t_{\mathrm{jet}}$ for jets with the full Run 2 dataset in events satisfying the trigger requirements and satisfying $p_T^\mathrm{miss} < 300$. The jets are required to pass an inverted selection of $PV_{\rm track}^{\rm fraction} > 1/12$ to enrich the sample in those originating from main and satellite bunch backgrounds (all other jet cleaning selections are applied). Clear contributions from jets from satellite bunch collisions can be seen peaked around -5, 5 and 10 ns.

Distribution of $t_{\mathrm{jet}}$ for jets with the full Run 2 dataset in events satisfying the trigger requirements and satisfying $p_T^\mathrm{miss} < 300$. The jets are required to pass an inverted selection of $PV_{\rm track}^{\rm fraction} > 0.08$ to enrich the sample in those originating from main and satellite bunch backgrounds (all other jet cleaning selections are applied). Clear contributions from jets from satellite bunch collisions can be seen peaked around -5, 5 and 10 ns.

Contribution to the delayed time of jets from the $\beta$ of the gluino is plotted against the delay contribution from the difference (assuming straight line paths) between the path taken by the gluino and the particle forming the jet from the path length for a particle travelling directly to the same position on the ECAL barrel for gluino $c\tau_{0} = 10$ m and mass of 1000 Gev (top) and 3000 GeV (bottom). The dominant contribution is shown to be the gluino $\beta$.

Contribution to the delayed time of jets from the $\beta$ of the gluino is plotted against the delay contribution from the difference (assuming straight line paths) between the path taken by the gluino and the particle forming the jet from the path length for a particle travelling directly to the same position on the ECAL barrel for gluino $c\tau_{0} = 10$ m and mass of 1000 Gev (top) and 3000 GeV (bottom). The dominant contribution is shown to be the gluino $\beta$.

Selection efficiencies for the GMSB model with $m_{\tilde{g}}=1000$ and various proper decay lengths

Selection efficiencies for the GMSB model with $m_{\tilde{g}}=1000$ and various proper decay lengths

Selection efficiencies for the GMSB model with $m_{\tilde{g}}=2400$ and various proper decay lengths

Selection efficiencies for the GMSB model with $m_{\tilde{g}}=2400$ and various proper decay lengths

Selection efficiencies for the GMSB model with $m_{\tilde{g}}=3000$ and various proper decay lengths

Selection efficiencies for the GMSB model with $m_{\tilde{g}}=3000$ and various proper decay lengths

The observed upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The observed upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected plus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected plus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected minus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected minus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected plus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected plus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected minus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected minus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The product of signal acceptance and efficiency in the 2l categories for the signal produced via vector boson fusion.

$m_{X}^{T}$ distribution in data in the 0l 2b non-VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}^{T}$ observed in the SR.

$m_{X}^{T}$ distribution in data in the 0l $\leq$1b non-VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}^{T}$ observed in the SR.

$m_{X}$ distribution in data in the 2e 2b non-VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}$ observed in the SR.

$m_{X}$ distribution in data in the 2e $\leq$1b non-VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}$ observed in the SR.

$m_{X}$ distribution in data in the 2$\mu$ 2b non-VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}$ observed in the SR.

$m_{X}$ distribution in data in the 2$\mu$ $\leq$1b non-VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}$ observed in the SR.

$m_{X}^{T}$ distribution in data in the 0l 2b VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}^{T}$ observed in the SR.

$m_{X}^{T}$ distribution in data in the 0l $\leq$1b VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}^{T}$ observed in the SR.

$m_{X}$ distribution in data in the 2e 2b VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}$ observed in the SR.

$m_{X}$ distribution in data in the 2e $\leq$1b VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}$ observed in the SR.

$m_{X}$ distribution in data in the 2$\mu$ 2b VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}$ observed in the SR.

$m_{X}$ distribution in data in the 2$\mu$ $\leq$1b VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}$ observed in the SR.

Observed and expected 95% CL upper limit on $\sigma \mathcal{B}$(Z'-> ZH) with all categories combined for the non-VBF signal, including all statistical and systematic uncertainties. The inner green band and the outer yellow band indicate the regions containing 68 and 95%, respectively, of the distribution of expected limits under the background-only hypothesis. The CMS search for a heavy resonance using 2016 data and the same final state [JHEP 11 (2018) 172] is shown as a comparison.

Observed and expected 95% CL upper limit on $\sigma \mathcal{B}$(Z'-> ZH) with all categories combined for the VBF signal, including all statistical and systematic uncertainties. The inner green band and the outer yellow band indicate the regions containing 68 and 95%, respectively, of the distribution of expected limits under the background-only hypothesis.

Observed exclusion limit in the space of the HVT model parameters [$g_{V}c_{H}$, $g^{2}c_{F}/g_{V}$] for mass hypotheses of 2 TeV for the non-VBF signal.

Observed exclusion limit in the space of the HVT model parameters [$g_{V}c_{H}$, $g^{2}c_{F}/g_{V}$] for mass hypotheses of 3 TeV for the non-VBF signal.

Observed exclusion limit in the space of the HVT model parameters [$g_{V}c_{H}$, $g^{2}c_{F}/g_{V}$] for mass hypotheses of 4 TeV for the non-VBF signal.

Summary of typical systematic uncertainties for the signal.

Numbers of observed events for all signal regions, including predicted background contributions and expected signal yields.

Limits on anomalous quartic couplings at 95% CL.

Expected and observed 95% CL upper limits on the cross section times the branching ratio sigma(P P --> W+- a)B(a --> W+- W-+) as a function of ALP mass

Expected and observed 95% CL upper limits on the photophobic ALP model parameter 1/f_a as a function of ALP mass.

Observed signal strength, and observed signal cross section.

The normalized particle-level $\mathrm{t}\overline{\mathrm{t}}$ differential cross section in the fiducial region as a function of the XCone-jet mass.

The normalized particle-level $\mathrm{t}\overline{\mathrm{t}}$ differential cross section in the fiducial region as a function of the XCone-jet mass.

The covariance matrix containing the statistical uncertainties of Figure 2a is shown.

The covariance matrix containing the statistical uncertainties of Figure 2a is shown.

The covariance matrix containing the experimental uncertainties of Figure 2a is shown.

The covariance matrix containing the experimental uncertainties of Figure 2a is shown.

The covariance matrix containing the model uncertainties of Figure 2a is shown.

The covariance matrix containing the model uncertainties of Figure 2a is shown.

The covariance matrix containing the statistical uncertainties of Figure 2b is shown.

The covariance matrix containing the statistical uncertainties of Figure 2b is shown.

The covariance matrix containing the experimental uncertainties of Figure 2b is shown.

The covariance matrix containing the experimental uncertainties of Figure 2b is shown.

The covariance matrix containing the model uncertainties of Figure 2b is shown.

The covariance matrix containing the model uncertainties of Figure 2b is shown.

The distribution of Top jet $ au_{3}/ au_{2}$ for the simulation of backgrounds and a 2400 GeV (left-handed) b* signal. The area of the total background contribution and area of the signal component are separately normalized to unity. All analysis selections are applied with the exception of the variable being plotted.

The distribution of W jet $ au_{2}/ au_{1}$ for the simulation of backgrounds and a 2400 GeV (left-handed) b* signal. The area of the total background contribution and area of the signal component are separately normalized to unity. All analysis selections are applied with the exception of the variable being plotted.

The distribution of m_{W} for the simulation of backgrounds and a 2400 GeV (left-handed) b* signal. The area of the total background contribution and area of the signal component are separately normalized to unity. All analysis selections are applied with the exception of the variable being plotted.

The distribution of Top jet DeepCSV score for the simulation of backgrounds and a 2400 GeV (left-handed) b* signal. The area of the total background contribution and area of the signal component are separately normalized to unity. All analysis selections are applied with the exception of the variable being plotted.

The distribution of m_{t} for the simulation of backgrounds and a 2400 GeV (left-handed) b* signal. The area of the total background contribution and area of the signal component are separately normalized to unity. All analysis selections are applied with the exception of the variable being plotted.

Distributions of $m_{tW}$ in the signal region for an interval of $m_{t}$ (65-105 GeV).

Distributions of $m_{tW}$ in the signal region for an interval of $m_{t}$ (105-225 GeV).

Distributions of $m_{tW}$ in the signal region for an interval of $m_{t}$ (225-285 GeV).

Distributions of $m_{tW}$ in themultijet control region of the signal region for an interval of $m_{t}$ (65-105 GeV).

Distributions of $m_{tW}$ in themultijet control region of the signal region for an interval of $m_{t}$ (105-225 GeV).

Distributions of $m_{tW}$ in themultijet control region of the signal region for an interval of $m_{t}$ (225-285 GeV).

Distributions of $m_{t}$ in the ttbar measurement region for an interval of $m_{tar{t}}$ (1200-1300 GeV).

Distributions of $m_{t}$ in the ttbar measurement region for an interval of $m_{tar{t}}$ (1300-1800 GeV).

Distributions of $m_{t}$ in the ttbar measurement region for an interval of $m_{tar{t}}$ (1800-3000 GeV).

Distributions of $m_{t}$ in themultijet control region of the ttbar measurement region for an interval of $m_{tar{t}}$ (1200-1300 GeV).

Distributions of $m_{t}$ in themultijet control region of the ttbar measurement region for an interval of $m_{tar{t}}$ (1300-1800 GeV).

Distributions of $m_{t}$ in themultijet control region of the ttbar measurement region for an interval of $m_{tar{t}}$ (1800-3000 GeV).

The number of background events obtained from the 1- and 2-leg predictions derived from data, together with the direct observation in data, in bins in ChF, where either the leading or subleading jet has a ChF within the bin edges, and both have a ChF below the upper bin threshold. The bottom panel shows the ratios of the observation in data to the 1-leg and the 2-leg background predictions.

The expected and observed 95% CL upper limits on the production cross section for SIMPs with masses between 1 and 1000 GeV, with the assumption that the SIMP interaction in the detector can be approximated as neutron-like. The theoretical prediction of a simplified model incorporating this approximation and including a scalar mediator with couplings g_chi = -1 and g_q = 1 is also shown (red line). For masses above 100 GeV, where the modelling of the SIMP-nucleon interaction becomes more speculative, the obtained cross section upper limits are increasingly uncertain (shaded area).

Electron $p_{T}$ distribution using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

$p_{T}^{miss}$ distribution in the electron channel using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

Muon $p_T$ distribution using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

$p_T^{miss}$ distribution in the muon channel using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

$M_T$ distribution for the E+INVISIBLE system using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

$M_T$ distribution for the MU+INVISIBLE system using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

Theoretical prediction for the production and decay cross-section of SSM WPRIME bosons (W --> LEPTON + NU) as a function of the WPRIME mass, for the range 200-6400 GeV and inclusive in phase-space (no cuts). The uncertainty shown covers PDF and ALPHAS uncertainties. These theoretical predictions are obtained with PYTHIA (LO) and corrected to NNLO in QCD using FEWZ program.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the product of WPRIME cross-section production and BF(WPRIME --> LEPTON + NU) for an SSM WPRIME boson, as a function of the boson mass, for the electron decay channel. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits. The theoretical predictions for the SSM at NNLO precision in QCD are shown with narrow gray bands corresponding to the PDF and ALPHAS uncertainties.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the product of WPRIME cross-section production and BF(WPRIME --> LEPTON + NU) for an SSM WPRIME boson, as a function of the boson mass, for the muon decay channel. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits. The theoretical predictions for the SSM at NNLO precision in QCD are shown with narrow gray bands corresponding to the PDF and ALPHAS uncertainties.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the product of WPRIME cross-section production and BF(WPRIME --> LEPTON + NU) for an SSM WPRIME boson, as a function of the boson mass, for the combined electron and muon decay channels. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits. The theoretical predictions for the SSM at NNLO precision in QCD are shown with narrow gray bands corresponding to the PDF and ALPHAS uncertainties.

The 95% CL observed (solid line) and expected (dashed line) model independent cross section upper limits as function of the $MT_{min}$ threshold, for the electron decay channel. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits.

The 95% CL observed (solid line) and expected (dashed line) model independent cross section upper limits as function of the $MT_{min}$ threshold, for the muon decay channel. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits.

The 95% CL observed (solid line) and expected (dashed line) model independent cross section upper limits as function of the $MT_{min}$ threshold, for the combined electron and muon decay channels. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the coupling strength ratio, gWprime/gW as a function of the mass of the WPRIME boson, for the electron channel. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The area above the limit curve is excluded. The dotted line represents the case of SSM coupling, gWprime, being equal to gW, the SM coupling.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the coupling strength ratio, gWprime/gW, as a function of the mass of the WPRIME boson, for the muon channel. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The area above the limit curve is excluded. The dotted line represents the case of SSM coupling, gWprime , being equal to gW, the SM coupling.

Exclusion limits in the 2D plane (1/R, $\mu$) for the split-UED interpretation for the n = 2 case, for the electron channel for the 2016-2018 data sets. R is the radius of the additional spatial dimension and $\mu$ the bulk mass for the fermion field in five dimensions. The expected limit is depicted as a black dashed line. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The experimentally excluded region is the entire area to the left of the solid black line.

Exclusion limits in the 2D plane (1/R, $\mu$) for the split-UED interpretation for the n = 2 case, for the muon channel for the 2016-2018 data sets. R is the radius of the additional spatial dimension and $\mu$ the bulk mass for the fermion field in five dimensions. The expected limit is depicted as a black dashed line. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The experimentally excluded region is the entire area to the left of the solid black line.

Exclusion limits in the 2D plane (1/R, $\mu$) for the split-UED interpretation for the n = 2 case, for the combined electron and muon channels for the 2016-2018 data sets. R is the radius of the additional spatial dimension and $\mu$ the bulk mass for the fermion field in five dimensions. The expected limit is depicted as a black dashed line. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The experimentally excluded region is the entire area to the left of the solid black line.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the ${\lambda}_{231}$ coupling in the RPV SUSY model with a STAU mediator, as a function of the mass of STAU, for the electron channel and for the production coupling, ${\lambda}^{'}_{3ij}$=0.5 . The couplings ${\lambda}^{'}_{3ij}$, ${\lambda}_{231}$, and ${\lambda}_{132}$ are defined in Fig. 1. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The area above the limit curve is excluded. Limits for other values of ${\lambda}^{'}_{3ij}$ are obtained multiplying the ones shown by the ratio ${\lambda}^{'}_{3ij}$/0.5

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the ${\lambda}_{132}$ coupling in the RPV SUSY model with a stau mediator, as a function of the mass of the stau, for the muon channel and for the production coupling, ${\lambda}^{'}_{3ij}$ = 0.5 . The couplings ${\lambda}^{'}_{3ij}$, ${\lambda}_{231}$, and ${\lambda}_{132}$ are defined in Fig. 1. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The area above the limit curve is excluded. Limits for other values of ${\lambda}^{'}_{3ij}$ are obtained multiplying these ones by the ratio ${\lambda}^{'}_{3ij}$/0.5

Region in the oblique (W,Y) parameter phase space allowed by the current analysis at 95% CL. The combination of the electron and muon channel distributions from the 2017 and 2018 data sets at sqrt(s) = 13 TeV is used, having 101 fb-1 of luminosity.

Negative Log-Likelihood for the determination of the oblique W parameter, for the combination of the electron and muon channel and for 2017 and 2018 data sets (L=101 fb-1) at sqrt(s) = 13 TeV.

Total background estimate and observed data in all bins used in the limit calculation for the SSM WPRIME limits. The total event sample is split into the three years of data taking and the two lepton flavors.The distributions being shown are $M_T$ ones. The associated integrated luminosities for each year are of 35.9, 41.5, and 59.4 fb$̣^{-1}. The mass bins are numbered in ascending order.

The distributions of the transfer factor ($\alpha$) versus $m_T$ in the HP VBF category is shown. The last bin corresponds to the value obtained by integrating events above the penultimate bin.

The distributions of the transfer factor ($\alpha$) versus $m_T$ in the HP ggF/DY category is shown. The last bin corresponds to the value obtained by integrating events above the penultimate bin.

The distributions of the transfer factor ($\alpha$) versus $m_T$ in the LP VBF category is shown. The last bin corresponds to the value obtained by integrating events above the penultimate bin.

The distributions of the transfer factor ($\alpha$) versus $m_T$ in the LP ggF/DY category is shown. The last bin corresponds to the value obtained by integrating events above the penultimate bin.

Distributions of mT for high-purity ggF/DY CR events after performing background-only fits. The last bin corresponds to the yields integrated above the penultimate bin. Both the ggF and VBF-produced 1 TeV graviton signals (normalized to 10 fb) are shown in the plot. Nonresonant background corresponds to the Z+jets and W+jets events. Resonant background corresponds to the ttbar, single top, and di/tri-boson events.

Distributions of mT for high-purity VBF CR events after performing background-only fits. The last bin corresponds to the yields integrated above the penultimate bin. Both the ggF and VBF-produced 1 TeV graviton signals (normalized to 10 fb) are shown in the plot. Nonresonant background corresponds to the Z+jets and W+jets events. Resonant background corresponds to the ttbar, single top, and di/tri-boson events.

Distributions of mT for low-purity ggF/DY CR events after performing background-only fits. The last bin corresponds to the yields integrated above the penultimate bin. Both the ggF and VBF-produced 1 TeV graviton signals (normalized to 10 fb) are shown in the plot. Nonresonant background corresponds to the Z+jets and W+jets events. Resonant background corresponds to the ttbar, single top, and di/tri-boson events.

Distributions of mT for low-purity VBF CR events after performing background-only fits. The last bin corresponds to the yields integrated above the penultimate bin. Both the ggF and VBF-produced 1 TeV graviton signals (normalized to 10 fb) are shown in the plot. Nonresonant background corresponds to the Z+jets and W+jets events. Resonant background corresponds to the ttbar, single top, and di/tri-boson events.

Distributions of mT for high-purity ggF/DY SR events after performing background-only fits. The last bin corresponds to the yields integrated above the penultimate bin. Both the ggF and VBF-produced 1 TeV graviton signals (normalized to 10 fb) are shown in the plot. Nonresonant background corresponds to the Z+jets and W+jets events. Resonant background corresponds to the ttbar, single top, and di/tri-boson events.

Distributions of mT for high-purity VBF SR events after performing background-only fits. The last bin corresponds to the yields integrated above the penultimate bin. Both the ggF and VBF-produced 1 TeV graviton signals (normalized to 10 fb) are shown in the plot. Nonresonant background corresponds to the Z+jets and W+jets events. Resonant background corresponds to the ttbar, single top, and di/tri-boson events.

Distributions of mT for low-purity ggF/DY SR events after performing background-only fits. The last bin corresponds to the yields integrated above the penultimate bin. Both the ggF and VBF-produced 1 TeV graviton signals (normalized to 10 fb) are shown in the plot. Nonresonant background corresponds to the Z+jets and W+jets events. Resonant background corresponds to the ttbar, single top, and di/tri-boson events.

Distributions of mT for low-purity VBF SR events after performing background-only fits. The last bin corresponds to the yields integrated above the penultimate bin. Both the ggF and VBF-produced 1 TeV graviton signals (normalized to 10 fb) are shown in the plot. Nonresonant background corresponds to the Z+jets and W+jets events. Resonant background corresponds to the ttbar, single top, and di/tri-boson events.

Expected and observed 95% CL upper limits on the product of the radion (R) production (gluon-gluon fusion) cross section and the R -> ZZ branching fraction versus the radion mass.

Expected and observed 95% CL upper limits on the product of the radion (R) production (vector boson fusion) cross section and the R -> ZZ branching fraction versus the radion mass.

Expected and observed 95% CL upper limits on the product of the W' (W') production (Drell-Yan) cross section and the W' -> WZ branching fraction versus the W' mass.

Expected and observed 95% CL upper limits on the product of the W' (W') production (vector boson fusion) cross section and the W' -> WZ branching fraction versus the W' mass.

Expected and observed 95% CL upper limits on the product of the graviton (G) production (gluon-gluon fusion) cross section and the G -> ZZ branching fraction versus the graviton mass.

Expected and observed 95% CL upper limits on the product of the graviton (G) production (vector boson fusion) cross section and the G -> ZZ branching fraction versus the graviton mass.

The ratio between the observed data and the simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $p_T^{miss}$ after scaling the simulation to match the total yield in data.

Comparison between data and simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_t$ after scaling the simulation to match the total yield in data. The hatched region indicates the total shape uncertainty in the simulation.

The ratio between the observed data and the simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_t$ after scaling the simulation to match the total yield in data.

Comparison between data and simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_W$ after scaling the simulation to match the total yield in data. The hatched region indicates the total shape uncertainty in the simulation.

The ratio between the observed data and the simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_W$ after scaling the simulation to match the total yield in data.

Comparison between data and simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_{\text{res}}$ after scaling the simulation to match the total yield in data. The hatched region indicates the total shape uncertainty in the simulation.

The ratio between the observed data and the simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_{\text{res}}$ after scaling the simulation to match the total yield in data.

Observed event yields in data (black points) and predicted SM background (filled histograms) for the low $\Delta$m search bins 0--52. The signal models are denoted in the legend with the masses in GeV of the SUSY particles in parentheses: $(m_{\tilde{t}}, m_{\tilde{\chi}^0_1})$ or $(m_{\tilde{g}}, m_{\tilde{\chi}^0_1})$ for the T2 or T1 signal models, respectively. The hatched bands correspond to the total uncertainty in the background prediction. The (unstacked) distributions for two example signal models are also shown.

The ratio of the data to the total background prediction for the low $\Delta$m search bins 0--52. The hatched bands correspond to the total uncertainty in the background prediction.

Observed event yields in data (black points) and predicted SM background (filled histograms) for the high $\Delta$m search bins 53--104. The signal models are denoted in the legend with the masses in GeV of the SUSY particles in parentheses: $(m_{\tilde{t}}, m_{\tilde{\chi}^0_1})$ or $(m_{\tilde{g}}, m_{\tilde{\chi}^0_1})$ for the T2 or T1 signal models, respectively. The hatched bands correspond to the total uncertainty in the background prediction. The (unstacked) distributions for two example signal models are also shown.

The ratio of the data to the total background prediction for the high $\Delta$m search bins 53--104. The hatched bands correspond to the total uncertainty in the background prediction.

Observed event yields in data (black points) and predicted SM background (filled histograms) for the high $\Delta$m search bins 105--152 with ${N_b = 2}$. The signal models are denoted in the legend with the masses in GeV of the SUSY particles in parentheses: $(m_{\tilde{t}}, m_{\tilde{\chi}^0_1})$ or $(m_{\tilde{g}}, m_{\tilde{\chi}^0_1})$ for the T2 or T1 signal models, respectively. The hatched bands correspond to the total uncertainty in the background prediction. The (unstacked) distributions for two example signal models are also shown.

The ratio of the data to the total background prediction for the high $\Delta$m search bins 105--152 with ${N_b = 2}$. The hatched bands correspond to the total uncertainty in the background prediction.

Observed event yields in data (black points) and predicted SM background (filled histograms) for the high $\Delta$m search bins 153--182 with ${N_b \geq 3}$. The signal models are denoted in the legend with the masses in GeV of the SUSY particles in parentheses: $(m_{\tilde{t}}, m_{\tilde{\chi}^0_1})$ or $(m_{\tilde{g}}, m_{\tilde{\chi}^0_1})$ for the T2 or T1 signal models, respectively. The hatched bands correspond to the total uncertainty in the background prediction. The (unstacked) distributions for two example signal models are also shown.

The ratio of the data to the total background prediction for the high $\Delta$m search bins 153--182 with ${N_b \geq 3}$. The hatched bands correspond to the total uncertainty in the background prediction.

The observed 95% CL upper limit on the production cross section of the T2tt simplified model as a function of the top squark and LSP masses. No interpretation is provided for signal models for which ${|{m_{\tilde{t}} - m_{\tilde{\chi}^0_1} - m_t}| < 25 GeV}$ and ${m_{\tilde{t}} < 275 GeV}$ as described in the text.

The expected 95% CL upper limit on the production cross section of the T2tt simplified model as a function of the top squark and LSP masses. No interpretation is provided for signal models for which ${|{m_{\tilde{t}} - m_{\tilde{\chi}^0_1} - m_t}| < 25 GeV}$ and ${m_{\tilde{t}} < 275 GeV}$ as described in the text.

The observed exclusion contour of the T2tt simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$). No interpretation is provided for signal models for which ${|{m_{\tilde{t}} - m_{\tilde{\chi}^0_1} - m_t}| < 25 GeV}$ and ${m_{\tilde{t}} < 275 GeV}$ as described in the text.

The mean expected exclusion contour of the T2tt simplified model and the region containing 68 and 95\% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis. No interpretation is provided for signal models for which ${|{m_{\tilde{t}} - m_{\tilde{\chi}^0_1} - m_t}| < 25 GeV}$ and ${m_{\tilde{t}} < 275 GeV}$ as described in the text.

The observed 95% CL upper limit on the production cross section of the T2bW simplified model as a function of the top squark and LSP masses.

The expected 95% CL upper limit on the production cross section of the T2bW simplified model as a function of the top squark and LSP masses.

The observed exclusion contour of the T2bW simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T2bW simplified model and the region containing 68 and 95\% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T2tb simplified model as a function of the top squark and LSP masses.

The expected 95% CL upper limit on the production cross section of the T2tb simplified model as a function of the top squark and LSP masses.

The observed exclusion contour of the T2tb simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T2tb simplified model and the region containing 68 and 95\% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T2ttC simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The expected 95% CL upper limit on the production cross section of the T2ttC simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The observed exclusion contour of the T2ttC simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T2ttC simplified model and the region containing 68\% ($\pm 1\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T2bWC simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The expected 95% CL upper limit on the production cross section of the T2bWC simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The observed exclusion contour of the T2bWC simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T2bWC simplified model and the region containing 68\% ($\pm 1\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T2cc simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The expected 95% CL upper limit on the production cross section of the T2cc simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The observed exclusion contour of the T2cc simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T2cc simplified model and the region containing 68\% ($\pm 1\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T1tttt simplified model as a function of the gluino and LSP masses.

The expected 95% CL upper limit on the production cross section of the T1tttt simplified model as a function of the gluino and LSP masses.

The observed exclusion contour of the T1tttt simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T1tttt simplified model and the region containing 68 and 95\% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T1ttbb simplified model as a function of the gluino and LSP masses.

The expected 95% CL upper limit on the production cross section of the T1ttbb simplified model as a function of the gluino and LSP masses.

The observed exclusion contour of the T1ttbb simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T1ttbb simplified model and the region containing 68 and 95\% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T5ttcc simplified model as a function of the gluino and LSP masses. The upper limits do not take into account contributions from direct top squark pair production; however, its effect is small for $m_{\tilde{\chi}^0_1} > 600 GeV$, which corresponds to the phase space beyond the exclusions based on direct top squark pair production. The excluded regions based on direct top squark pair production from this search and earlier searches are indicated by the hatched areas.

The expected 95% CL upper limit on the production cross section of the T5ttcc simplified model as a function of the gluino and LSP masses. The uppser limits do not take into account contributions from direct top squark pair production; however, its effect is small for $m_{\tilde{\chi}^0_1} > 600 GeV$, which corresponds to the phase space beyond the exclusions based on direct top squark pair production. The excluded regions based on direct top squark pair production from this search and earlier searches are indicated by the hatched areas.

The observed exclusion contour of the T5ttcc simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$). The expected and observed upper limits do not take into account contributions from direct top squark pair production; however, its effect is small for $m_{\tilde{\chi}^0_1} > 600 GeV$, which corresponds to the phase space beyond the exclusions based on direct top squark pair production. The excluded regions based on direct top squark pair production from this search and earlier searches are indicated by the hatched areas.

The mean expected exclusion contour of the T5ttcc simplified model and the region containing 68% and 95% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis. The expected and observed upper limits do not take into account contributions from direct top squark pair production; however, its effect is small for $m_{\tilde{\chi}^0_1} > 600 GeV$, which corresponds to the phase space beyond the exclusions based on direct top squark pair production. The excluded regions based on direct top squark pair production from this search and earlier searches are indicated by the hatched areas.

Measured fraction of events after unfolding for $N_J = 0, 1, \geq 2$ jets. The first uncertainty is statistical and the second combines systematic uncertainties from the response matrix and from the background subtraction.

Expected and observed 68% and 95% confidence intervals on the measurement of the Wilson coefficients associated with the three CP-preserving, dimension-6 operators.

Expected and observed 68% and 95% confidence intervals on the measurement of the Wilson coefficients associated with the three CP-preserving, dimension-6 operators.

Measured normalized differential cross sections with respect to the dilepton invariant mass.

Measured normalized differential cross sections with respect to the dilepton invariant mass.

Measured normalized differential cross sections with respect to the leading lepton $p_T$.

Measured normalized differential cross sections with respect to the leading lepton $p_T$.

Measured normalized differential cross sections with respect to the trailing lepton $p_T$.

Measured normalized differential cross sections with respect to the trailing lepton $p_T$.

Measured normalized differential cross sections with respect to the dilepton azimuthal angular separation.

Measured normalized differential cross sections with respect to the dilepton azimuthal angular separation.

Fiducial cross section for the production of $W^+W^−$ +0-jets as the $p_T$ threshold for jets is varied. The fiducial region is defined by two opposite-sign leptons with $p_T > 20$GeV and | η | < 2.5 excluding the products of τ lepton decay, and $m_{\ell\ell} > 20$GeV, $p_T^{\ell\ell} > 30$GeV, and $p_T^{\mathrm{miss}} > 30$GeV. Jets must have $p_T$ above the stated threshold, | η | < 4.5, and be separated from each of the two leptons by ∆R > 0.4. The total uncertainty is reported.

Fiducial cross section for the production of $W^+W^-$ +0-jets as the $p_T$ threshold for jets is varied. The fiducial region is defined by two opposite-sign leptons with $p_T > 20$GeV and |$\eta$| < 2.5 excluding the products of tau lepton decay, and $m_{\ell\ell} > 20$GeV, $p_T^{\ell\ell} > 30$GeV, and $p_T^{\mathrm{miss}} > 30$GeV. Jets must have $p_T$ above the stated threshold, |$\eta$| < 4.5, and be separated from each of the two leptons by dR > 0.4. The total uncertainty is reported.

Experimental uncertainties affecting transfer factors in the analysis that is used to estimate the W background in the signal region (SR). The number of W boson events are denoted as $W_{SR}$ for the SR and in analogy as $W_{\mu\nu}$ ($W_{e\nu}$) for the single-muon (single-electron) control region (CR).

Uncertainties assigned to the simulation based processes in SR and CRs.

Uncertainties assigned to the simulation based processes in SR and CRs.

Cross sections (fb) at large Z $p_{T}$ values in the Z -> $\ell\ell$ and Z -> $\nu\nu$ channels, and their combination. The theoretical predictions from Madgraph at NLO in QCD and corrected to NLO in electroweak using the NNPDF 3.0 are also reported. With the exception of the largest Z $p_{T}$ bin, the statistical uncertainties in the measurements are much smaller than the systematic uncertainties. Both measurements and predictions correspond to $\sigma \mathcal{B}(Z -> \ell\ell)$, where $\sigma$ is the total fiducial cross section, $\mathcal{B}$ is the branching fraction, and $\ell$ is a charged lepton. The $Z -> \nu\nu$ measurement corresponds to $\sigma \mathcal{B}(Z -> \ell\ell)/\mathcal{B}(Z -> \nu\nu)$.

Cross sections (fb) at large Z $p_{T}$ values in the Z -> $\ell\ell$ and Z -> $\nu\nu$ channels, and their combination. The theoretical predictions from Madgraph at NLO in QCD and corrected to NLO in electroweak using the NNPDF 3.0 are also reported. With the exception of the largest Z $p_{T}$ bin, the statistical uncertainties in the measurements are much smaller than the systematic uncertainties. Both measurements and predictions correspond to $\sigma \mathcal{B}(Z -> \ell\ell)$, where $\sigma$ is the total fiducial cross section, $\mathcal{B}$ is the branching fraction, and $\ell$ is a charged lepton. The $Z -> \nu\nu$ measurement corresponds to $\sigma \mathcal{B}(Z -> \ell\ell)/\mathcal{B}(Z -> \nu\nu)$.

Cross sections normalized to the total cross section measurements at high Z $p_{T}$ values in the Z -> $\ell\ell$ and Z -> $\nu\nu$ channels, and in their combination. The uncertainty includes both statistical and systematic uncertainties.

Cross sections normalized to the total cross section measurements at high Z $p_{T}$ values in the Z -> $\ell\ell$ and Z -> $\nu\nu$ channels, and in their combination. The uncertainty includes both statistical and systematic uncertainties.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on charged leptons.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on charged leptons.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on charged leptons.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on charged leptons.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on neutrinos.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on neutrinos.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on neutrinos.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on neutrinos.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on neutrinos and charged leptons.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on neutrinos and charged leptons.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on neutrinos and charged leptons.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on neutrinos and charged leptons.

Cross section measurements in bins of Z $p_{T}$ on neutrinos and charged leptons.

Cross section measurements in bins of Z $p_{T}$ on neutrinos and charged leptons.

Distribution of the MLP W+jets score in the CRs for the $T\overline{T}$ search. The observed data, predicted $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario, and the background are all shown. Statistical and systematic uncertainties in the background prediction before performing the fit to data are also shown.

Distribution of DeepAK8 jet tags in the DeepAK8 CR of the $T\overline{T}$ search. The observed data are shown using black markers, $T\overline{T}$ signals using solid lines, and background using filled histograms. Statistical and systematic uncertainties in the background prediction before performing the fit to data are shown by the hatched region.

Distribution of HT in the W+jets CR of the $T\overline{T}$ search. The observed data are shown using black markers, $T\overline{T}$ signals using solid lines, and background using filled histograms. Statistical and systematic uncertainties in the background prediction before performing the fit to data are shown by the hatched region.

Distribution of HT in the $T\overline{T}$ CR of the $T\overline{T}$ search. The observed data are shown using black markers, $T\overline{T}$ signals using solid lines, and background using filled histograms. Statistical and systematic uncertainties in the background prediction before performing the fit to data are shown by the hatched region.

Numbers of predicted and observed CR events in 2016--2018 data for the $T\overline{T}$ signal hypotheses in the single-lepton channel, after a background-only fit to data. Predicted numbers of signal events before the fit to data are included for comparison, using the singlet branching fraction scenario. Uncertainties include statistical and systematic components, and lepton flavor categories are combined with their uncertainties added in quadrature. Values in the DeepAK8 CR represent the number of large-radius jets rather than number of events.

Numbers of predicted and observed CR events in 2016--2018 data for the $B\overline{B}$ signal hypotheses in the single-lepton channel, after a background-only fit to data. Predicted numbers of signal events before the fit to data are included for comparison, using the singlet branching fraction scenario. Uncertainties include statistical and systematic components, and lepton flavor categories are combined with their uncertainties added in quadrature. Values in the DeepAK8 CR represent the number of large-radius jets rather than number of events.

Numbers of predicted and observed CR events in 2017--2018 data in the same-sign dilepton channel, after a background-only fit to data. Predicted numbers of signal events before the fit to data are included for comparison, using the singlet branching fraction scenario. Uncertainties include statistical and systematic components. Predictions for 2017 and 2018 are combined with their uncertainties added in quadrature.

Distribution of lepton $p_T$ in 2017 in the multilepton channel nonprompt lepton control region for all flavor categories, evaluated with the best-fit nonprompt rates. The uncertainty shown is the quadratic sum of statistical and systematics uncertainties.

Distribution of lepton $p_T$ in 2018 in the multilepton channel nonprompt lepton control region for all flavor categories, evaluated with the best-fit nonprompt rates. The uncertainty shown is the quadratic sum of statistical and systematics uncertainties.

Numbers of predicted and observed CR events in 2017--2018 data in the multilepton channel, after a background-only fit to data. Predicted numbers of signal events before the fit to data are included for comparison, using the singlet branching fraction scenario. Uncertainties include statistical and systematic components. Predictions for 2017 and 2018 are combined with their uncertainties added in quadrature.

Numbers of predicted and observed $T\overline{T}$ SR events in 2016--2018 data in the single-lepton channel, after a background-only fit to data. Predicted numbers of signal events before the fit to data are included for comparison, using the singlet branching fraction scenario. Uncertainties include statistical and systematic components, and lepton flavor categories are combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 1. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 2. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 3. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 4. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 5. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 6. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 7. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 8. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 9. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 10. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 11. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of the VLQ score in single-lepton category 12. Observed data is shown using black markers, $T\overline{T}$ signal with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region. Electron and muon categories have been combined with their uncertainties added in quadrature.

Distribution of $H_T^{\mathrm{lep}}$ in the same-sign dilepton signal region for $ee$ category. Data from 2017 and 2018 is shown using black markers, $T\overline{T}$ signals with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region.

Distribution of $H_T^{\mathrm{lep}}$ in the same-sign dilepton signal region for $e\mu$ category. Data from 2017 and 2018 is shown using black markers, $T\overline{T}$ signals with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region.

Distribution of $H_T^{\mathrm{lep}}$ in the same-sign dilepton signal region for $\mu\mu$ category. Data from 2017 and 2018 is shown using black markers, $T\overline{T}$ signals with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region.

Distribution of $S_T$ in the multilepton signal region for $eee$ category. Data from 2017 and 2018 is shown using black markers, $T\overline{T}$ signals with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region.

Distribution of $S_T$ in the multilepton signal region for $ee\mu$ category. Data from 2017 and 2018 is shown using black markers, $T\overline{T}$ signals with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region.

Distribution of $S_T$ in the multilepton signal region for $e\mu\mu$ category. Data from 2017 and 2018 is shown using black markers, $T\overline{T}$ signals with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region.

Distribution of $S_T$ in the multilepton signal region for $\mu\mu\mu$ category. Data from 2017 and 2018 is shown using black markers, $T\overline{T}$ signals with mass of 1.2 (1.5) TeV in the singlet scenario using solid (dashed) lines, and post-fit background using filled histograms. Statistical and systematic uncertainties in the background prediction after performing the fit to data are shown by the hatched region.

Numbers of predicted and observed $B\overline{B}$ SR events in 2016--2018 data in the single-lepton channel, after a background-only fit to data. Predicted numbers of signal events before the fit to data are included for comparison, using the singlet branching fraction scenario. Uncertainties include statistical and systematic components, and lepton flavor categories are combined with their uncertainties added in quadrature.

Numbers of predicted and observed SR events in 2017--2018 data in the same-sign dilepton channel, after a background-only fit to data. Predicted numbers of signal events before the fit to data are included for comparison, using the singlet branching fraction scenario. Uncertainties include statistical and systematic components. Predictions for 2017 and 2018 are combined with their uncertainties added in quadrature.

Numbers of predicted and observed SR events in 2017--2018 data in the multilepton channel, after a background-only fit to data. Predicted numbers of signal events before the fit to data are included for comparison, using the singlet branching fraction scenario. Uncertainties include statistical and systematic components. Predictions for 2017 and 2018 are combined with their uncertainties added in quadrature.

Expected and observed lower limits on the VLT quark masses.

Expected and observed lower limits on the VLB quark masses.

Expected 95% CL upper limits on $T\overline{T}$ production cross sections for the singlet combination.

Expected 95% CL upper limits on $T\overline{T}$ production cross sections for the doublet combination.

Expected 95% CL upper limits on $B\overline{B}$ production cross sections for the singlet combination.

Expected 95% CL upper limits on $B\overline{B}$ production cross sections for the doublet combination.

The 95% CL expected lower mass limits on pair-produced T quark masses as functions of their branching ratios to W and H bosons.

The 95% CL observed lower mass limits on pair-produced T quark masses as functions of their branching ratios to W and H bosons.

The 95% CL expected lower mass limits on pair-produced B quark masses as functions of their branching ratios to W and H bosons.

The 95% CL observed lower mass limits on pair-produced B quark masses as functions of their branching ratios to W and H bosons.