Observed number of events and pre-fit background predictions in the $7\leq N_{jet}\leq8$ search bins.

Observed number of events and pre-fit background predictions in the $N_{jet}=9$ search bins.

Observed number of events and pre-fit background predictions in the aggregate search regions.

The expected 95% CL upper limits on the production cross sections for the T1tttt simplified models as a function of the gluino and LSP masses.

The expected 95% CL upper limits on the production cross sections plus uncertainty for the T1tttt simplified models as a function of the gluino and LSP masses.

The expected 95% CL upper limits on the production cross sections minus uncertainty for the T1tttt simplified models as a function of the gluino and LSP masses.

The observed 95% CL upper limits on the production cross sections for the T1tttt simplified models as a function of the gluino and LSP masses.

The observed 95% CL upper limits on the production cross sections plus uncertainty for the T1tttt simplified models as a function of the gluino and LSP masses.

The observed 95% CL upper limits on the production cross sections minus uncertainty for the T1tttt simplified models as a function of the gluino and LSP masses.

The expected 95% CL upper limits on the production cross sections for the T1tttt simplified models as a function of the gluino and LSP masses.

The observed 95% CL upper limits on the production cross sections for the T1tttt simplified models as a function of the gluino and LSP masses.

The expected 95% CL upper limits on the production cross sections for the T1bbbb simplified models as a function of the gluino and LSP masses.

The expected 95% CL upper limits on the production cross sections plus uncertainty for the T1bbbb simplified models as a function of the gluino and LSP masses.

The expected 95% CL upper limits on the production cross sections minus uncertainty for the T1bbbb simplified models as a function of the gluino and LSP masses.

The observed 95% CL upper limits on the production cross sections for the T1bbbb simplified models as a function of the gluino and LSP masses.

The observed 95% CL upper limits on the production cross sections plus uncertainty for the T1bbbb simplified models as a function of the gluino and LSP masses.

The observed 95% CL upper limits on the production cross sections minus uncertainty for the T1bbbb simplified models as a function of the gluino and LSP masses.

The expected 95% CL upper limits on the production cross sections for the T1bbbb simplified models as a function of the gluino and LSP masses.

The observed 95% CL upper limits on the production cross sections for the T1bbbb simplified models as a function of the gluino and LSP masses.

The expected 95% CL upper limits on the production cross sections for the T1qqqq simplified models as a function of the gluino and LSP masses.

The expected 95% CL upper limits on the production cross sections plus uncertainty for the T1qqqq simplified models as a function of the gluino and LSP masses.

The expected 95% CL upper limits on the production cross sections minus uncertainty for the T1qqqq simplified models as a function of the gluino and LSP masses.

The observed 95% CL upper limits on the production cross sections for the T1qqqq simplified models as a function of the gluino and LSP masses.

The observed 95% CL upper limits on the production cross sections plus uncertainty for the T1qqqq simplified models as a function of the gluino and LSP masses.

The observed 95% CL upper limits on the production cross sections minus uncertainty for the T1qqqq simplified models as a function of the gluino and LSP masses.

The expected 95% CL upper limits on the production cross sections for the T1qqqq simplified models as a function of the gluino and LSP masses.

The observed 95% CL upper limits on the production cross sections for the T1qqqq simplified models as a function of the gluino and LSP masses.

The expected 95% CL upper limits on the production cross sections for the T5qqqqVV simplified models as a function of the gluino and LSP masses.

The expected 95% CL upper limits on the production cross sections plus uncertainty for the T5qqqqVV simplified models as a function of the gluino and LSP masses.

The expected 95% CL upper limits on the production cross sections minus uncertainty for the T5qqqqVV simplified models as a function of the gluino and LSP masses.

The observed 95% CL upper limits on the production cross sections for the T5qqqqVV simplified models as a function of the gluino and LSP masses.

The observed 95% CL upper limits on the production cross sections plus uncertainty for the T5qqqqVV simplified models as a function of the gluino and LSP masses.

The observed 95% CL upper limits on the production cross sections minus uncertainty for the T5qqqqVV simplified models as a function of the gluino and LSP masses.

The expected 95% CL upper limits on the production cross sections for the T5qqqqVV simplified models as a function of the gluino and LSP masses.

The observed 95% CL upper limits on the production cross sections for the T5qqqqVV simplified models as a function of the gluino and LSP masses.

The expected 95% CL upper limits on the production cross sections for the T1tbtb simplified models as a function of the gluino and LSP masses.

The expected 95% CL upper limits on the production cross sections plus uncertainty for the T1tbtb simplified models as a function of the gluino and LSP masses.

The expected 95% CL upper limits on the production cross sections minus uncertainty for the T1tbtb simplified models as a function of the gluino and LSP masses.

The observed 95% CL upper limits on the production cross sections for the T1tbtb simplified models as a function of the gluino and LSP masses.

The observed 95% CL upper limits on the production cross sections plus uncertainty for the T1tbtb simplified models as a function of the gluino and LSP masses.

The observed 95% CL upper limits on the production cross sections minus uncertainty for the T1tbtb simplified models as a function of the gluino and LSP masses.

The expected 95% CL upper limits on the production cross sections for the T1tbtb simplified models as a function of the gluino and LSP masses.

The observed 95% CL upper limits on the production cross sections for the T1tbtb simplified models as a function of the gluino and LSP masses.

The observed 95% CL upper limits on the production cross sections for the T2tt simplified models as a function of the squark and LSP masses.

The observed 95% CL upper limits on the production cross sections plus uncertainty for the T2tt simplified models as a function of the squark and LSP masses.

The observed 95% CL upper limits on the production cross sections minus uncertainty for the T2tt simplified models as a function of the squark and LSP masses.

The expected 95% CL upper limits on the production cross sections for the T2tt simplified models as a function of the squark and LSP masses.

The expected 95% CL upper limits on the production cross sections plus uncertainty for the T2tt simplified models as a function of the squark and LSP masses.

The expected 95% CL upper limits on the production cross sections minus uncertainty for the T2tt simplified models as a function of the squark and LSP masses.

The expected 95% CL upper limits on the production cross sections for the T2tt simplified models as a function of the squark and LSP masses.

The observed 95% CL upper limits on the production cross sections for the T2tt simplified models as a function of the squark and LSP masses.

The expected 95% CL upper limits on the production cross sections for the T2bb simplified models as a function of the squark and LSP masses.

The expected 95% CL upper limits on the production cross sections plus uncertainty for the T2bb simplified models as a function of the squark and LSP masses.

The expected 95% CL upper limits on the production cross sections minus uncertainty for the T2bb simplified models as a function of the squark and LSP masses.

The observed 95% CL upper limits on the production cross sections for the T2bb simplified models as a function of the squark and LSP masses.

The observed 95% CL upper limits on the production cross sections plus uncertainty for the T2bb simplified models as a function of the squark and LSP masses.

The observed 95% CL upper limits on the production cross sections minus uncertainty for the T2bb simplified models as a function of the squark and LSP masses.

The expected 95% CL upper limits on the production cross sections for the T2bb simplified models as a function of the squark and LSP masses.

The observed 95% CL upper limits on the production cross sections for the T2bb simplified models as a function of the squark and LSP masses.

The observed 95% CL upper limits on the production cross sections for the T2qq simplified models as a function of the squark and LSP masses.

The observed 95% CL upper limits on the production cross sections plus uncertainty for the T2qq simplified models as a function of the squark and LSP masses.

The observed 95% CL upper limits on the production cross sections minus uncertainty for the T2qq simplified models as a function of the squark and LSP masses.

The expected 95% CL upper limits on the production cross sections for the T2qq simplified models as a function of the squark and LSP masses.

The expected 95% CL upper limits on the production cross sections plus uncertainty for the T2qq simplified models as a function of the squark and LSP masses.

The expected 95% CL upper limits on the production cross sections minus uncertainty for the T2qq simplified models as a function of the squark and LSP masses.

The expected 95% CL upper limits on the production cross sections for the T2qq simplified models as a function of the squark and LSP masses.

The observed 95% CL upper limits on the production cross sections for the T2qq simplified models as a function of the squark and LSP masses.

Higgs fiducial cross section in bins of pT of leading jet The first uncertainty is statistical, the second is the systematic uncertainty. The numbers in this HEP data entry are not divided by the bin width, and therefore the units are in fb. The 0-jet bin is also included here, which is not shown in the Figure.

Correlation matrix for DSIG/DPT(H).

Correlation matrix for DSIG/DN(JETS).

Correlation matrix for DSIG/PT(JET).

The differential cross section measurement as a function of the transverse momentum of the second leading jet.

The differential cross section measurement as a function of the transverse momentum of the third leading jet.

The differential cross section measurement as a function of the transverse momentum of the fourth leading jet.

The differential cross section measurement as a function of the absolute value of the rapidity of the first leading jet.

The differential cross section measurement as a function of the absolute value of the rapidity of the second leading jet.

The differential cross section measurement as a function of the absolute value of the rapidity of the third leading jet.

The differential cross section measurement as a function of the absolute value of the rapidity of the fourth leading jet.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for events with one or more jets.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for events with two or more jets.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for events with three or more jets.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for events with four or more jets.

The differential cross section measurement as a function of the azimuthal angle separation between the first leading jet and the muon.

The differential cross section measurement as a function of the azimuthal angle separation between the second leading jet and the muon.

The differential cross section measurement as a function of the azimuthal angle separation between the third leading jet and the muon.

The differential cross section measurement as a function of the azimuthal angle separation between the fourth leading jet and the muon.

The differential cross section measurement as a function of DeltaR separation between the muon and the closest jet for events with one or more jets.

The measured total Z cross section times the BR to 4l. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity and theortical sources, the second is theoretical uncertianty on the extrapolation from the selected region to the total phase space, the third is the luminosity uncertianty

The measured fiducial Z cross section times the BR to 4l. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity, the second is the luminosity uncertianty

The measured Z BR to 4l. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity and theortical sources, the second is theoretical uncertianty on the extrapolation from the selected region to the total phase space, the third is the luminosity uncertianty

Normalized ZZ fiducial cross section in bins of the reconstructed ZZ invariant massm4l. The first systematic uncertainty is detector systematics.

Normalized ZZ fiducial cross section in bins of the reconstructed ZZ pT. The first systematic uncertainty is detector systematics.

Normalized ZZ fiducial cross section in bins Z pT for all Z bosons. The first systematic uncertainty is detector systematics.

Normalized ZZ fiducial cross section in bins of the leading lepton pT. The first systematic uncertainty is detector systematics.

Normalized ZZ fiducial cross section in bins of the Delta phi between the two Z bosons. The first systematic uncertainty is detector systematics.

Normalized ZZ fiducial cross section in bins of the Delta R between the two Z bosons. The first systematic uncertainty is detector systematics.

Normalized 4l fiducial cross section in bins of the reconstructed four lepton invariant massm4l. The first systematic uncertainty is detector systematics.

aTGC limits on anomolous neutral gauge boson complings in ZZ events

Observed exclusion contour at 95% CL for the T6gg model.

Expected exclusion contour at 95% CL for the T6gg model.

Exclusion limits on the SUSY cross section at 95% CL for the T6Wg model.

Observed exclusion contour at 95% CL for the T6Wg model.

Expected exclusion contour at 95% CL for the T6Wg model.

Exclusion limits on the SUSY cross section at 95% CL for the T5gg model.

Observed exclusion contour at 95% CL for the T5gg model.

Expected exclusion contour at 95% CL for the T5gg model.

Exclusion limits on the SUSY cross section at 95% CL for the T5Wg model.

Observed exclusion contour at 95% CL for the T5Wg model.

Expected exclusion contour at 95% CL for the T5Wg model.

The observed upper limit on the cross section times branching fraction at 95% CL for direct top squark pair production with decay $\widetilde{t}\widetilde{t} \rightarrow t \widetilde{\chi_1^0} t \widetilde{\chi_1^0}$.

The observed exclusion limits at 95% CL assuming 100% branching fraction for direct top squark pair production with decay $\widetilde{t}\widetilde{t} \rightarrow b \chi_1^{+} \bar{b} \chi+1^{-}$, $\chi_1^{\pm}\rightarrow W^{\pm} \widetilde{\chi_1^{0}}$

The observed upper limit on the cross section times branching fraction at 95% CL for direct top squark pair production with decay $\widetilde{t}\widetilde{t} \rightarrow b \chi_1^{+} \bar{b} \chi+1^{-}$, $\chi_1^{\pm}\rightarrow W^{\pm} \widetilde{\chi_1^{0}}$

The observed exclusion limits at 95% CL for direct top squark pair production with decay $\widetilde{t}\widetilde{t} \rightarrow b \chi_1^{+} \bar{t} \widetilde{\chi_1^0}$, $\chi_1^{\pm}\rightarrow W^{\pm} \widetilde{\chi_1^{0}}$ assuming a 50% branching fraction for each $\widetilde{t}$ decay.

The observed upper limit on the cross section at 95% CL for direct top squark pair production with decay $\widetilde{t}\widetilde{t} \rightarrow b \chi_1^{+} \bar{t} \widetilde{\chi_1^0}$, $\chi_1^{\pm}\rightarrow W^{\pm} \widetilde{\chi_1^{0}}$ assuming a 50% branching fraction for each $\widetilde{t}$ decay.

Correlation matrix for the background predictions for the signal regions for the standard selection. The labelling of the regions follows the convention of Fig.~4 in the paper.

Correlation matrix for the background predictions for the signal regions for the compressed selection. The labelling of the regions follows the convention of Fig.~4 in the paper.

Figure 2. -1 sigma excluded gluino and neutralino masses at 95% CL for the T1tttt.

Figure 2. Expected exclusion for the T1tttt model.

Figure 2. +1 sigma expected exclusion for the T1tttt model.

Figure 2. -1 sigma expected exclusion for the T1tttt model.

Figure 2. Excluded gluino and neutralino masses at 95% CL for the T5tttt.

Figure 2. Expected exclusion for the T5tttt model.

Table 1. Observed event yields and mean background yields from the predictive fit in the 18 bins of the signal region R4.

Table 2. Observed event yields and mean background yields from the predictive fit in four aggregate search bins.

Figure 9a (upper left). The 95% CL upper limit on the production cross section of the T1tttt simplified models as a function of the gluino and LSP masses.

Figure 9a (upper left). Observed exclusion region at 95% CL assuming 100% branching fraction.

Figure 9a (upper left). Expected exclusion region at 95% CL assuming 100% branching fraction.

Figure 9b (upper right). The 95% CL upper limit on the production cross section of the T1ttbb simplified models as a function of the gluino and LSP masses.

Figure 9b (upper right). Observed exclusion region at 95% CL.

Figure 9b (upper right). Expected exclusion region at 95%.

Figure 9c (bottom left). The 95% CL upper limit on the production cross section of the T5tttt simplified models as a function of the gluino and LSP masses. imits are not given for the T5tttt model for mχ~01< 50 GeV for the reason stated in the text.

Figure 9c (bottom left). Observed exclusion region at 95% CL assuming 100% branching fraction.

Figure 9c (bottom left). Expected exclusion region at 95% CL assuming 100% branching fraction.

Figure 9d (bottom right). The 95% CL upper limit on the production cross section of the T5ttcc simplified models as a function of the gluino and LSP masses.

Figure 9d (bottom right). Observed exclusion region at 95% CL.

Figure 9d (bottom right). Expected exclusion region at 95% CL.

The observed number of events and the total background prediction for search regions with Nt = 1 and Nb = 1.

The observed number of events and the total background prediction for search regions with Nt = 1 and Nb ≥ 2.

The observed number of events and the total background prediction for search regions with Nt ≥ 2.

Selected T2tt signal yields for the aggregate search bins.

Selected gluino mediated signal yields for the aggregate search bins.

Distribution of $m_{jj}$ in data and simulation for events in the signal regions of the low-mass search. The points show the data while the filled histograms show the background contributions. The gray band shows the statistical and systematic uncertainties in the background, while the dashed vertical region ("Higgs") shows the expected SM Higgs boson mass range, which is excluded from this analysis. A 600 GeV bulk graviton signal prediction is represented by the black dashed histogram; for visibility, the signal cross-section is increased by a factor of 50. The background normalization is derived from the final fit to the $m_{VZ}$ observable in data.

The m$_{j}$ distributions of the events in data, compared to the expected background shape, for the high-mass analysis in the electron channel, for the high-purity category. The expected background shape is extracted from a fit to the data sidebands (Z+jets) or derived from simulation ("top quark" and "VV"). The dashed region around the background sum represents the uncertainty in the Z+jets distribution, while the dashed vertical region ("Higgs") shows the expected SM Higgs boson mass range, excluded from the analysis.

The m$_{j}$ distributions of the events in data, compared to the expected background shape, for the high-mass analysis in the electron channel, for the low-purity category. The expected background shape is extracted from a fit to the data sidebands (Z+jets) or derived from simulation ("top quark" and "VV"). The dashed region around the background sum represents the uncertainty in the Z+jets distribution, while the dashed vertical region ("Higgs") shows the expected SM Higgs boson mass range, excluded from the analysis.

The m$_{j}$ distributions of the events in data, compared to the expected background shape, for the high-mass analysis in the muon channel, for the high-purity category. The expected background shape is extracted from a fit to the data sidebands (Z+jets) or derived from simulation ("top quark" and "VV"). The dashed region around the background sum represents the uncertainty in the Z+jets distribution, while the dashed vertical region ("Higgs") shows the expected SM Higgs boson mass range, excluded from the analysis.

The m$_{j}$ distributions of the events in data, compared to the expected background shape, for the high-mass analysis in the muon channel, for the low-purity category. The expected background shape is extracted from a fit to the data sidebands (Z+jets) or derived from simulation ("top quark" and "VV"). The dashed region around the background sum represents the uncertainty in the Z+jets distribution, while the dashed vertical region ("Higgs") shows the expected SM Higgs boson mass range, excluded from the analysis.

Expected and observed distributions of the resonance candidate mass $m_{\text{VZ}}$ in the high-mass analysis, in the electron channel, high-purity category. The shaded area represents the post-fit uncertainty in the background. The expected contribution from W' signal candidates with mass $m_{\text{X}} = 2000$ GeV, normalized to a cross section of 100 fb$^{-1}$, is also shown.

Expected and observed distributions of the resonance candidate mass $m_{\text{VZ}}$ in the high-mass analysis, in the electron channel, low-purity category. The shaded area represents the post-fit uncertainty in the background. The expected contribution from W' signal candidates with mass $m_{\text{X}} = 2000$ GeV, normalized to a cross section of 100 fb$^{-1}$, is also shown.

Expected and observed distributions of the resonance candidate mass $m_{\text{VZ}}$ in the high-mass analysis, in the muon channel, high-purity category. The shaded area represents the post-fit uncertainty in the background. The expected contribution from W' signal candidates with mass $m_{\text{X}} = 2000$ GeV, normalized to a cross section of 100 fb$^{-1}$, is also shown.

Expected and observed distributions of the resonance candidate mass $m_{\text{VZ}}$ in the high-mass analysis, in the muon channel, low-purity category. The shaded area represents the post-fit uncertainty in the background. The expected contribution from W' signal candidates with mass $m_{\text{X}} = 2000$ GeV, normalized to a cross section of 100 fb$^{-1}$, is also shown.

Sideband $m_{ZV}$ distribution for the low-mass search in the merged V, untagged category, after fitting the sideband data alone. The points show the data while the filled histograms show the background contributions. Electron and muon categories are combined. The gray band indicates the statistical and post-fit systematic uncertainties in the normalization and shape of the background. Larger bin widths are used at higher values of $m_{ZV}$; the bin widths are indicated by the horizontal error bars.

Sideband $m_{ZV}$ distribution for the low-mass search in the merged V, tagged category, after fitting the sideband data alone. The points show the data while the filled histograms show the background contributions. Electron and muon categories are combined. The gray band indicates the statistical and post-fit systematic uncertainties in the normalization and shape of the background. Larger bin widths are used at higher values of $m_{ZV}$; the bin widths are indicated by the horizontal error bars.

Sideband $m_{ZV}$ distribution for the low-mass search in the resolved V, untagged category, after fitting the sideband data alone. The points show the data while the filled histograms show the background contributions. Electron and muon categories are combined. The gray band indicates the statistical and post-fit systematic uncertainties in the normalization and shape of the background. Larger bin widths are used at higher values of $m_{ZV}$; the bin widths are indicated by the horizontal error bars.

Sideband $m_{ZV}$ distribution for the low-mass search in the resolved V, tagged category, after fitting the sideband data alone. The points show the data while the filled histograms show the background contributions. Electron and muon categories are combined. The gray band indicates the statistical and post-fit systematic uncertainties in the normalization and shape of the background. Larger bin widths are used at higher values of $m_{ZV}$; the bin widths are indicated by the horizontal error bars.

The signal region $m_{VZ}$ distribution for the low-mass search, in the the merged V, untagged category, after fitting the signal and sideband regions. Electron and muon categories are combined. A 600 GeV bulk graviton signal prediction is represented by the black dashed histogram. The gray band indicates the statistical and post-fit systematic uncertainties in the normalization and shape of the background. Larger bin widths are used at higher values of $m_{VZ}$; the bin widths are indicated by the horizontal error bars.

The signal region $m_{VZ}$ distribution for the low-mass search, in the the merged V, tagged category, after fitting the signal and sideband regions. Electron and muon categories are combined. A 600 GeV bulk graviton signal prediction is represented by the black dashed histogram. The gray band indicates the statistical and post-fit systematic uncertainties in the normalization and shape of the background. Larger bin widths are used at higher values of $m_{VZ}$; the bin widths are indicated by the horizontal error bars.

The signal region $m_{VZ}$ distribution for the low-mass search, in the the resolved V, untagged category, after fitting the signal and sideband regions. Electron and muon categories are combined. A 600 GeV bulk graviton signal prediction is represented by the black dashed histogram. The gray band indicates the statistical and post-fit systematic uncertainties in the normalization and shape of the background. Larger bin widths are used at higher values of $m_{VZ}$; the bin widths are indicated by the horizontal error bars.

The signal region $m_{VZ}$ distribution for the low-mass search, in the the resolved V, tagged category, after fitting the signal and sideband regions. Electron and muon categories are combined. A 600 GeV bulk graviton signal prediction is represented by the black dashed histogram. The gray band indicates the statistical and post-fit systematic uncertainties in the normalization and shape of the background. Larger bin widths are used at higher values of $m_{VZ}$; the bin widths are indicated by the horizontal error bars.

Observed and expected 95% CL upper limit on $\sigma_{W'} Br(W' \to ZW)$ as a function of the resonance mass, taking into account all statistical and systematic uncertainties. The electron and muon channels and the various categories used in the analysis are combined together. The green (inner) and yellow (outer) bands represent the 68% and 95% coverage of the expected limit in the background-only hypothesis.

Observed and expected 95% CL upper limit on $\sigma_{G} Br(G \to ZZ)$ as a function of the resonance mass, taking into account all statistical and systematic uncertainties. The electron and muon channels and the various categories used in the analysis are combined together. The green (inner) and yellow (outer) bands represent the 68% and 95% coverage of the expected limit in the background-only hypothesis.

Observed local p-values for W' narrow resonances as a function of the resonance mass.

Observed local p-values for G narrow resonances as a function of the resonance mass.

Normalized differential ttbar cross sections with statistical and systematic uncertainties at the particle level as a function of y(top).

Normalized differential ttbar cross sections with statistical and systematic uncertainties at the particle level as a function of pt(ttbar).

Normalized differential ttbar cross sections with statistical and systematic uncertainties at the particle level as a function of y(ttbar).

Normalized differential ttbar cross sections with statistical and systematic uncertainties at the particle level as a function of m(ttbar).

Normalized differential ttbar cross sections with statistical and systematic uncertainties at the particle level as a function of dphi(ttbar).

Normalized differential ttbar cross sections with statistical and systematic uncertainties at the parton level as a function of pt(top).

Normalized differential ttbar cross sections with statistical and systematic uncertainties at the parton level as a function of y(top).

Normalized differential ttbar cross sections with statistical and systematic uncertainties at the parton level as a function of pt(ttbar).

Normalized differential ttbar cross sections with statistical and systematic uncertainties at the parton level as a function of y(ttbar).

Normalized differential ttbar cross sections with statistical and systematic uncertainties at the parton level as a function of m(ttbar).

Normalized differential ttbar cross sections with statistical and systematic uncertainties at the parton level as a function of dphi(ttbar).

Statistical covariance matrix for the normalized differential tt cross section in dilepton channel at particle level as a function of the transverse momentum pt(let).

Statistical covariance matrix for the normalized differential tt cross section in dilepton channel at particle level as a function of the transverse momentum pt(jet).

Statistical covariance matrix for the normalized differential tt cross section in dilepton channel at particle level as a function of the transverse momentum pt(top) of the top quark or antiquark.

Normalized differential ttbar cross sections with statistical and systematic uncertainties at the particle level as a function of y(top) of the top quark or antiquark.

Statistical covariance matrix for the normalized differential tt cross section in dilepton channel at particle level as a function of the transverse momentum pt(ttbar) of the top quark and antiquark.

Normalized differential ttbar cross sections with statistical and systematic uncertainties at the particle level as a function of y(ttbar) of the top quark and antiquark.

Normalized differential ttbar cross sections with statistical and systematic uncertainties at the particle level as a function of m(ttbar) of the top quark and antiquark.

Normalized differential ttbar cross sections with statistical and systematic uncertainties at the particle level as a function of dphi(ttbar) of the top quark and antiquark.

Statistical covariance matrix for the normalized differential tt cross section in dilepton channel at parton level as a function of the transverse momentum pt(top) of the top quark or antiquark.

Statistical covariance matrix for the normalized differential tt cross section in dilepton channel at parton level as a function of the transverse momentum y(top) of the top quark or antiquark.

Normalized differential ttbar cross sections with statistical and systematic uncertainties at the parton level as a function of pt(ttbar) of the top quark and antiquark.

Normalized differential ttbar cross sections with statistical and systematic uncertainties at the parton level as a function of y(ttbar) of the top quark and antiquark.

Normalized differential ttbar cross sections with statistical and systematic uncertainties at the parton level as a function of m(ttbar) of the top quark and antiquark.

Normalized differential ttbar cross sections with statistical and systematic uncertainties at the parton level as a function of dphi(ttbar) of the top quark and antiquark.

The test statistic q as a function of $\mu_{\mathrm{ttH}}$ for all decay modes at 7+8 TeV and at 13 TeV, separately, and for all decay modes at all CM energies. The expected SM result for the overall combination is also shown.

Expected and observed upper limits at the 95% CL on the pp --> X --> ZZ cross section as a function of $m_X$ with $\Gamma_X$=10 GeV in VBF production mode.

Expected and observed upper limits at the 95% CL on the pp --> X --> ZZ cross section as a function of $m_X$ with $\Gamma_X$=100 GeV with VBF fraction profiled.

Expected and observed upper limits at the 95% CL on the pp --> X --> ZZ cross section as a function of $m_X$ with $\Gamma_X$=100 GeV in VBF production mode.

Observed upper limits at the 95% CL on the pp --> X --> ZZ cross section as a function of $m_X$ and $\Gamma_X$ values when VBF fraction is profiled.

Observed upper limits at the 95% CL on the pp --> X --> ZZ cross section as a function of $m_X$ and $\Gamma_X$ values in VBF production mode.

Expected and observed 95 percent CL upper limits on BR(H to etau) for each individual category and combined from collinear mass fit analysis

Summary of the observed and expected upper limits at the 95percent CL and the best fit branching fractions in percent for the H->mutau and H->etau processes, for the main analysis (BDT fit) and the cross check (Mcol fit) method.

95 percent CL observed upper limit on the Yukawa couplings for the main analysis (BDT fit) and the cross check (Mcol fit) method

Observed and expected likelihood scans of $f_{\Lambda1}^{Z\gamma}\cos\phi_{\Lambda1}^{Z\gamma}$. See Section 4 of the paper for more details.

Normalized inclusive 2-jet cross section differential in $\Delta\phi_{1,2}$ for $500 < p_{T}^{max} < 600$ GeV

Normalized inclusive 2-jet cross section differential in $\Delta\phi_{1,2}$ for $600 < p_{T}^{max} < 700$ GeV

Normalized inclusive 2-jet cross section differential in $\Delta\phi_{1,2}$ for $700 < p_{T}^{max} < 800$ GeV

Normalized inclusive 2-jet cross section differential in $\Delta\phi_{1,2}$ for $800 < p_{T}^{max} < 1000$ GeV

Normalized inclusive 2-jet cross section differential in $\Delta\phi_{1,2}$ for $1000 < p_{T}^{max} < 1200$ GeV

Normalized inclusive 2-jet cross section differential in $\Delta\phi_{1,2}$ for $p_{T}^{max} > 1200$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{1,2}$ for $200 < p_{T}^{max} < 300$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{1,2}$ for $300 < p_{T}^{max} < 400$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{1,2}$ for $400 < p_{T}^{max} < 500$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{1,2}$ for $500 < p_{T}^{max} < 600$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{1,2}$ for $600 < p_{T}^{max} < 700$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{1,2}$ for $700 < p_{T}^{max} < 800$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{1,2}$ for $800 < p_{T}^{max} < 1000$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{1,2}$ for $p_{T}^{max} > 1000$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{1,2}$ for $200 < p_{T}^{max} < 300$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{1,2}$ for $300 < p_{T}^{max} < 400$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{1,2}$ for $400 < p_{T}^{max} < 500$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{1,2}$ for $500 < p_{T}^{max} < 600$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{1,2}$ for $600 < p_{T}^{max} < 700$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{1,2}$ for $700 < p_{T}^{max} < 800$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{1,2}$ for $800 < p_{T}^{max} < 1000$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{1,2}$ for $p_{T}^{max} > 1000$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $200 < p_{T}^{max} < 300$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $300 < p_{T}^{max} < 400$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $400 < p_{T}^{max} < 500$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $500 < p_{T}^{max} < 600$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $600 < p_{T}^{max} < 700$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $700 < p_{T}^{max} < 800$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $800 < p_{T}^{max} < 1000$ GeV

Normalized inclusive 3-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $p_{T}^{max} > 1000$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $200 < p_{T}^{max} < 300$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $300 < p_{T}^{max} < 400$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $400 < p_{T}^{max} < 500$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $500 < p_{T}^{max} < 600$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $600 < p_{T}^{max} < 700$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $700 < p_{T}^{max} < 800$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $800 < p_{T}^{max} < 1000$ GeV

Normalized inclusive 4-jet cross section differential in $\Delta\phi_{2j}^{min}$ for $p_{T}^{max} > 1000$ GeV

Distributions of $\min[M(\ell,\mathrm{j})]$ in the W+jets control region, for 0 W-tagged jet category. Example signal distributions are also shown. The background distributions correspond to background-only fit to data while signal distributions are before the fit to data. Electron and muon event samples are combined. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{j})]$ in the W+jets control region, for 1 or more W-tagged jet category. Example signal distributions are also shown. The background distributions correspond to background-only fit to data while signal distributions are before the fit to data. Electron and muon event samples are combined. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 0 W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 0 W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 1 or more W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 1 or more W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 0 W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 0 W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 1 or more W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 1 or more W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Expected and observed limits at 95% CL for an LH $X_{5/3}$ after combining all categories for the same-sign dilepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an RH $X_{5/3}$ after combining all categories for the same-sign dilepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an LH $X_{5/3}$ after combining all categories for the single-lepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an RH $X_{5/3}$ after combining all categories for the single-lepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an LH $X_{5/3}$ after combining the same-sign dilepton and single-lepton final states. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an RH $X_{5/3}$ after combining the same-sign dilepton and single-lepton final states. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Double-differential cross section times the dimuon branching fraction of the Y(2S) meson for different ranges of pT in bins of |y| and for the full |y| < 1.2 range, for the unpolarized decay hypothesis. The global uncertainty in the integrated luminosity of 2.3% is not included in the systematic uncertainties.

Double-differential cross section times the dimuon branching fraction of the Y(3S) meson for different ranges of pT in bins of |y| and for the full |y| < 1.2 range, for the unpolarized decay hypothesis. The global uncertainty in the integrated luminosity of 2.3% is not included in the systematic uncertainties.

Multiplicative scaling factors to obtain the J/psi differential cross sections for different polarization scenarios (Lambda_{Theta} = +1, +0.10, -1) from the unpolarized cross section measurements given in Table 1.

Multiplicative scaling factors to obtain the psi(2S) differential cross sections for different polarization scenarios (Lambda_{Theta} = +1, +0.03, -1) from the unpolarized cross section measurements given in Table 2.

Multiplicative scaling factors to obtain the Y(1S) differential cross sections for different polarization scenarios (Lambda_{Theta} = +1, k, -1) from the unpolarized cross section measurements given in Table 3. The parameter k corresponds to a linear interpolation of the CMS measured value as a function of pT for pT < 50 GeV. For pT > 50 GeV, where no measurements exist, k is taken as the average of all the measured values for pT < 50 GeV.

Multiplicative scaling factors to obtain the Y(2S) differential cross sections for different polarization scenarios (Lambda_{Theta} = +1, k, -1) from the unpolarized cross section measurements given in Table 3. The parameter k corresponds to a linear interpolation of the CMS measured value as a function of pT for pT < 50 GeV. For pT > 50 GeV, where no measurements exist, k is taken as the average of all the measured values for pT < 50 GeV.

Multiplicative scaling factors to obtain the Y(3S) differential cross sections for different polarization scenarios (Lambda_{Theta} = +1, k, -1) from the unpolarized cross section measurements given in Table 3. The parameter k corresponds to a linear interpolation of the CMS measured value as a function of pT for pT < 50 GeV. For pT > 50 GeV, where no measurements exist, k is taken as the average of all the measured values for pT < 50 GeV.

Ratio of differential cross section times branching fractions of the prompt psi(2S) to J/psi mesons assuming unpolarized productions as a function of pT for |y| < 1.2.

Ratios of differential cross section times branching fractions of the prompt Y(2S) to Y(1S) and Y(3S) to Y(1S) mesons assuming unpolarized productions as a function of pT for |y| < 1.2.

The measured ratio of production cross sections of top quarks to that of top antiquarks in $t$-channel. The first uncertainty is the statistical, the second is due to profiled systematic sources, and the third is due to the sources describing signal modelling (externalized).

Estimated value of $|\rm{f}_{\rm{LV}}V_{tb}|$ obtained from the ratio of measured inclusive cross section of single top production in the $t$-channel to the theoretical prediction.

Estimated relative impact of uncertainties in percent of the measured cross sections or cross section ratio.

Comparison of the measured R$_{t-\rm{ch}}$ with the NLO predictions from different PDF sets.