Distributions of $\min[M(\ell,\mathrm{j})]$ in the W+jets control region, for 0 W-tagged jet category. Example signal distributions are also shown. The background distributions correspond to background-only fit to data while signal distributions are before the fit to data. Electron and muon event samples are combined. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{j})]$ in the W+jets control region, for 1 or more W-tagged jet category. Example signal distributions are also shown. The background distributions correspond to background-only fit to data while signal distributions are before the fit to data. Electron and muon event samples are combined. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 0 W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 0 W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 1 or more W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 1 or more W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 0 W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 0 W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 1 or more W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 1 or more W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Expected and observed limits at 95% CL for an LH $X_{5/3}$ after combining all categories for the same-sign dilepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an RH $X_{5/3}$ after combining all categories for the same-sign dilepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an LH $X_{5/3}$ after combining all categories for the single-lepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an RH $X_{5/3}$ after combining all categories for the single-lepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an LH $X_{5/3}$ after combining the same-sign dilepton and single-lepton final states. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an RH $X_{5/3}$ after combining the same-sign dilepton and single-lepton final states. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

The ratio between the observed data and the simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $p_T^{miss}$ after scaling the simulation to match the total yield in data.

Comparison between data and simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_t$ after scaling the simulation to match the total yield in data. The hatched region indicates the total shape uncertainty in the simulation.

The ratio between the observed data and the simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_t$ after scaling the simulation to match the total yield in data.

Comparison between data and simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_W$ after scaling the simulation to match the total yield in data. The hatched region indicates the total shape uncertainty in the simulation.

The ratio between the observed data and the simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_W$ after scaling the simulation to match the total yield in data.

Comparison between data and simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_{\text{res}}$ after scaling the simulation to match the total yield in data. The hatched region indicates the total shape uncertainty in the simulation.

The ratio between the observed data and the simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_{\text{res}}$ after scaling the simulation to match the total yield in data.

Observed event yields in data (black points) and predicted SM background (filled histograms) for the low $\Delta$m search bins 0--52. The signal models are denoted in the legend with the masses in GeV of the SUSY particles in parentheses: $(m_{\tilde{t}}, m_{\tilde{\chi}^0_1})$ or $(m_{\tilde{g}}, m_{\tilde{\chi}^0_1})$ for the T2 or T1 signal models, respectively. The hatched bands correspond to the total uncertainty in the background prediction. The (unstacked) distributions for two example signal models are also shown.

The ratio of the data to the total background prediction for the low $\Delta$m search bins 0--52. The hatched bands correspond to the total uncertainty in the background prediction.

Observed event yields in data (black points) and predicted SM background (filled histograms) for the high $\Delta$m search bins 53--104. The signal models are denoted in the legend with the masses in GeV of the SUSY particles in parentheses: $(m_{\tilde{t}}, m_{\tilde{\chi}^0_1})$ or $(m_{\tilde{g}}, m_{\tilde{\chi}^0_1})$ for the T2 or T1 signal models, respectively. The hatched bands correspond to the total uncertainty in the background prediction. The (unstacked) distributions for two example signal models are also shown.

The ratio of the data to the total background prediction for the high $\Delta$m search bins 53--104. The hatched bands correspond to the total uncertainty in the background prediction.

Observed event yields in data (black points) and predicted SM background (filled histograms) for the high $\Delta$m search bins 105--152 with ${N_b = 2}$. The signal models are denoted in the legend with the masses in GeV of the SUSY particles in parentheses: $(m_{\tilde{t}}, m_{\tilde{\chi}^0_1})$ or $(m_{\tilde{g}}, m_{\tilde{\chi}^0_1})$ for the T2 or T1 signal models, respectively. The hatched bands correspond to the total uncertainty in the background prediction. The (unstacked) distributions for two example signal models are also shown.

The ratio of the data to the total background prediction for the high $\Delta$m search bins 105--152 with ${N_b = 2}$. The hatched bands correspond to the total uncertainty in the background prediction.

Observed event yields in data (black points) and predicted SM background (filled histograms) for the high $\Delta$m search bins 153--182 with ${N_b \geq 3}$. The signal models are denoted in the legend with the masses in GeV of the SUSY particles in parentheses: $(m_{\tilde{t}}, m_{\tilde{\chi}^0_1})$ or $(m_{\tilde{g}}, m_{\tilde{\chi}^0_1})$ for the T2 or T1 signal models, respectively. The hatched bands correspond to the total uncertainty in the background prediction. The (unstacked) distributions for two example signal models are also shown.

The ratio of the data to the total background prediction for the high $\Delta$m search bins 153--182 with ${N_b \geq 3}$. The hatched bands correspond to the total uncertainty in the background prediction.

The observed 95% CL upper limit on the production cross section of the T2tt simplified model as a function of the top squark and LSP masses. No interpretation is provided for signal models for which ${|{m_{\tilde{t}} - m_{\tilde{\chi}^0_1} - m_t}| < 25 GeV}$ and ${m_{\tilde{t}} < 275 GeV}$ as described in the text.

The expected 95% CL upper limit on the production cross section of the T2tt simplified model as a function of the top squark and LSP masses. No interpretation is provided for signal models for which ${|{m_{\tilde{t}} - m_{\tilde{\chi}^0_1} - m_t}| < 25 GeV}$ and ${m_{\tilde{t}} < 275 GeV}$ as described in the text.

The observed exclusion contour of the T2tt simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$). No interpretation is provided for signal models for which ${|{m_{\tilde{t}} - m_{\tilde{\chi}^0_1} - m_t}| < 25 GeV}$ and ${m_{\tilde{t}} < 275 GeV}$ as described in the text.

The mean expected exclusion contour of the T2tt simplified model and the region containing 68 and 95\% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis. No interpretation is provided for signal models for which ${|{m_{\tilde{t}} - m_{\tilde{\chi}^0_1} - m_t}| < 25 GeV}$ and ${m_{\tilde{t}} < 275 GeV}$ as described in the text.

The observed 95% CL upper limit on the production cross section of the T2bW simplified model as a function of the top squark and LSP masses.

The expected 95% CL upper limit on the production cross section of the T2bW simplified model as a function of the top squark and LSP masses.

The observed exclusion contour of the T2bW simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T2bW simplified model and the region containing 68 and 95\% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T2tb simplified model as a function of the top squark and LSP masses.

The expected 95% CL upper limit on the production cross section of the T2tb simplified model as a function of the top squark and LSP masses.

The observed exclusion contour of the T2tb simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T2tb simplified model and the region containing 68 and 95\% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T2ttC simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The expected 95% CL upper limit on the production cross section of the T2ttC simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The observed exclusion contour of the T2ttC simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T2ttC simplified model and the region containing 68\% ($\pm 1\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T2bWC simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The expected 95% CL upper limit on the production cross section of the T2bWC simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The observed exclusion contour of the T2bWC simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T2bWC simplified model and the region containing 68\% ($\pm 1\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T2cc simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The expected 95% CL upper limit on the production cross section of the T2cc simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The observed exclusion contour of the T2cc simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T2cc simplified model and the region containing 68\% ($\pm 1\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T1tttt simplified model as a function of the gluino and LSP masses.

The expected 95% CL upper limit on the production cross section of the T1tttt simplified model as a function of the gluino and LSP masses.

The observed exclusion contour of the T1tttt simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T1tttt simplified model and the region containing 68 and 95\% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T1ttbb simplified model as a function of the gluino and LSP masses.

The expected 95% CL upper limit on the production cross section of the T1ttbb simplified model as a function of the gluino and LSP masses.

The observed exclusion contour of the T1ttbb simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T1ttbb simplified model and the region containing 68 and 95\% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T5ttcc simplified model as a function of the gluino and LSP masses. The upper limits do not take into account contributions from direct top squark pair production; however, its effect is small for $m_{\tilde{\chi}^0_1} > 600 GeV$, which corresponds to the phase space beyond the exclusions based on direct top squark pair production. The excluded regions based on direct top squark pair production from this search and earlier searches are indicated by the hatched areas.

The expected 95% CL upper limit on the production cross section of the T5ttcc simplified model as a function of the gluino and LSP masses. The uppser limits do not take into account contributions from direct top squark pair production; however, its effect is small for $m_{\tilde{\chi}^0_1} > 600 GeV$, which corresponds to the phase space beyond the exclusions based on direct top squark pair production. The excluded regions based on direct top squark pair production from this search and earlier searches are indicated by the hatched areas.

The observed exclusion contour of the T5ttcc simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$). The expected and observed upper limits do not take into account contributions from direct top squark pair production; however, its effect is small for $m_{\tilde{\chi}^0_1} > 600 GeV$, which corresponds to the phase space beyond the exclusions based on direct top squark pair production. The excluded regions based on direct top squark pair production from this search and earlier searches are indicated by the hatched areas.

The mean expected exclusion contour of the T5ttcc simplified model and the region containing 68% and 95% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis. The expected and observed upper limits do not take into account contributions from direct top squark pair production; however, its effect is small for $m_{\tilde{\chi}^0_1} > 600 GeV$, which corresponds to the phase space beyond the exclusions based on direct top squark pair production. The excluded regions based on direct top squark pair production from this search and earlier searches are indicated by the hatched areas.

The $S_{\rm T}$ distribution for group B before fitting.

The $S_{\rm T}$ distribution for group C before fitting.

The $S_{\rm T}$ distribution for group C before fitting.

The $S_{\rm T}$ distribution for group D before fitting.

The $S_{\rm T}$ distribution for group D before fitting.

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = 100%.

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = 100%.

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = B(T → tH) = 50%.

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = B(T → tH) = 50%.

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = B(T → bW) = 50%

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = B(T → bW) = 50%

The number of observed events and the predicted number of SM background events in the $T\bar T$ search using electron channel in the four event groups.

The number of observed events and the predicted number of SM background events in the $T\bar T$ search using electron channel in the four event groups.

The number of observed events and the predicted number of SM background events in the $T\bar T$ search using muon channel in the four event groups.

The number of observed events and the predicted number of SM background events in the $T\bar T$ search using muon channel in the four event groups.

The $S_{\rm T}$ distribution for 1b event category for data and the expected background before fitting.

The $S_{\rm T}$ distribution for 1b event category for data and the expected background before fitting.

The $S_{\rm T}$ distribution for 2b event category for data and the expected background.

The $S_{\rm T}$ distribution for 2b event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted t event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted t event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted H event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted H event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted Z event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted Z event category for data and the expected background.

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = 100%.

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = 100%.

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = Br(B → bH) = 50%.

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = Br(B → bH) = 50%.

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = Br(B → tW) = 50%

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = Br(B → tW) = 50%

The number of observed events and the predicted number of SM background events in the $B\bar B$ search using electron channel in the five event categories.

The number of observed events and the predicted number of SM background events in the $B\bar B$ search using electron channel in the five event categories.

The number of observed events and the predicted number of SM background events in the $B\bar B$ search using muon channel in the five event categories.

The number of observed events and the predicted number of SM background events in the $B\bar B$ search using muon channel in the five event categories.

Invariant mass distribution of the selected $\mathrm{B}^+\mathrm{K}^-$ candidates in data

Invariant mass distribution of the selected $\mathrm{B}^0 \mathrm{K}^{0}_{\mathrm{S}}$ candidates in data

The observed signal yields ($N$), natural widths ($\Gamma$), and mass differences from the fits to the $m_{\mathrm{BK}}$ distributions in data, for the two channels: $\mathrm{B}^+\mathrm{K}^-$ and $\mathrm{B}^0 \mathrm{K}^{0}_{\mathrm{S}}$. The uncertainties are statistical only.

The measured ratios of branching fractions

The measured ratios of cross sections times branching fractions

The measured mass differences $M(\mathrm{B}^{(*)0}_{\mathrm{s1,2}})-M^{\mathrm{PDG}}_{\mathrm{B}}-M^{\mathrm{PDG}}_{\mathrm{K}}$

The measured masses of $\mathrm{B}^{*}_{\mathrm{s2}}(5840)^0$ and $\mathrm{B}_{\mathrm{s1}}(5830)^0$ mesons

The measured mass differences between neutral and charged B mesons

The measured $\mathrm{B}^{*}_{\mathrm{s2}}(5840)^0$ natural width

Correlation matrix for the differential branching fraction extraction between different $q^2$ bins in the simultaneous fit.

The product of acceptance and efficiency ($A\epsilon$) of the $\mathcal{B}(\mathrm{B}^+\to\mathrm{K}^+\mu^+\mu^-)$ channel, as a function of the muon pair $q^2$, as measured in simulated signal events, after all the corrections applied. In the figure, regions corresponding to resonances are displayed with red markers.

Same as Table 5, but for the bins containing the J$\psi$ and $\psi$(2S) resonances.

Integrated branching fraction $\mathcal{B}(\mathrm{B}^\pm \to \mathrm{K}^\pm\mu^+\mu^-)$ in the low-$q^2$ region.

Ratio of branching fractions $\mathcal{B}(\text{B}^\pm \to \text{K}^\pm\mu^+\mu^-)$ to $\mathcal{B}(\text{B}^\pm \to \text{K}^\pm\text{e}^+\text{e}^-)$, determined from the measured double ratio $R$(K) of these decays to the respective branching fractions of the decay chains $\text{B}^\pm\to\text{J/}\psi\text{K}^\pm$ with $\text{J/}\psi\to\mu^+\mu^-$ and $\text{e}^+\text{e}^-$.

Negative log likelihood function from the fit profiled as a function of the inverse ratio $R(\mathrm{K})^{-1}$.

Distributions of the b-tagging efficiency as a function of the mistag rate of charm jets for pp collisions in a PYTHIA simulation.

Distributions of the b-tagging efficiency as a function of the mistag rate of light jets for pPb collisions in a PYTHIA+HIJING simulation.

Distributions of the b-tagging efficiency as a function of the mistag rate of charm jets for pPb collisions in a PYTHIA+HIJING simulation.

Distributions of the Secondary Vertex Mass after applying the SSV tagger selection.

b-jet cross-sections in pPb, scaled by the Glauber nuclear overlap function, as well as a b-jet cross-section from a PYTHIA simulation from -2.5 < eta_CM < -1.5.

b-jet cross-sections in pPb, scaled by the Glauber nuclear overlap function, as well as a b-jet cross-section from a PYTHIA simulation from -1.5 < eta_CM < -0.5 (x 10^2).

b-jet cross-sections in pPb, scaled by the Glauber nuclear overlap function, as well as a b-jet cross-section from a PYTHIA simulation from -0.5 < eta_CM < 0.5 (x10^4).

b-jet cross-sections in pPb, scaled by the Glauber nuclear overlap function, as well as a b-jet cross-section from a PYTHIA simulation from 0.5 < eta_CM < 1.5 (x10^6).

b-jet RpA (PYTHIA) from 0.5 < eta_CM < 1.5.

b-jet RpA (PYTHIA) from -0.5 < eta_CM < 0.5.

b-jet RpA (PYTHIA) from -1.5 < eta_CM < -0.5.

b-jet RpA (PYTHIA) from -2.5 < eta_CM < -1.5.

b-jet Fraction.

b-jet RpA(PYTHIA).

Measured fraction of events after unfolding for $N_J = 0, 1, \geq 2$ jets. The first uncertainty is statistical and the second combines systematic uncertainties from the response matrix and from the background subtraction.

Expected and observed 68% and 95% confidence intervals on the measurement of the Wilson coefficients associated with the three CP-preserving, dimension-6 operators.

Expected and observed 68% and 95% confidence intervals on the measurement of the Wilson coefficients associated with the three CP-preserving, dimension-6 operators.

Measured normalized differential cross sections with respect to the dilepton invariant mass.

Measured normalized differential cross sections with respect to the dilepton invariant mass.

Measured normalized differential cross sections with respect to the leading lepton $p_T$.

Measured normalized differential cross sections with respect to the leading lepton $p_T$.

Measured normalized differential cross sections with respect to the trailing lepton $p_T$.

Measured normalized differential cross sections with respect to the trailing lepton $p_T$.

Measured normalized differential cross sections with respect to the dilepton azimuthal angular separation.

Measured normalized differential cross sections with respect to the dilepton azimuthal angular separation.

Fiducial cross section for the production of $W^+W^−$ +0-jets as the $p_T$ threshold for jets is varied. The fiducial region is defined by two opposite-sign leptons with $p_T > 20$GeV and | η | < 2.5 excluding the products of τ lepton decay, and $m_{\ell\ell} > 20$GeV, $p_T^{\ell\ell} > 30$GeV, and $p_T^{\mathrm{miss}} > 30$GeV. Jets must have $p_T$ above the stated threshold, | η | < 4.5, and be separated from each of the two leptons by ∆R > 0.4. The total uncertainty is reported.

Fiducial cross section for the production of $W^+W^-$ +0-jets as the $p_T$ threshold for jets is varied. The fiducial region is defined by two opposite-sign leptons with $p_T > 20$GeV and |$\eta$| < 2.5 excluding the products of tau lepton decay, and $m_{\ell\ell} > 20$GeV, $p_T^{\ell\ell} > 30$GeV, and $p_T^{\mathrm{miss}} > 30$GeV. Jets must have $p_T$ above the stated threshold, |$\eta$| < 4.5, and be separated from each of the two leptons by dR > 0.4. The total uncertainty is reported.