Sequential impact of each requirement on the number of events passing the selection for the high-$E_T$ analysis.

Sequential impact of each requirement on the number of events passing the selection for the low-$E_T$ analysis.

Application of the modified ABCD method to the final high-$E_T$ and low-$E_T$ selections.

The extrapolated signal efficiencies as a function of proper decay length of the $s$ for several simulated samples in the low-$E_T$ selections.

The extrapolated signal efficiencies as a function of proper decay length of the $s$ for several simulated samples in the high-$E_T$ selections.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 25 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 600 ~\mathrm{GeV}$ and $m_{s} = 150 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 25 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 600 ~\mathrm{GeV}$ and $m_{s} = 150 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 5 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 8 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 15 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 40 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 55 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 200 ~\mathrm{GeV}$ and $m_{s} = 8 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 200 ~\mathrm{GeV}$ and $m_{s} = 25 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 200 ~\mathrm{GeV}$ and $m_{s} = 50 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 400 ~\mathrm{GeV}$ and $m_{s} = 50 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 400 ~\mathrm{GeV}$ and $m_{s} = 100 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 600 ~\mathrm{GeV}$ and $m_{s} = 50 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 1000 ~\mathrm{GeV}$ and $m_{s} = 50 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 1000 ~\mathrm{GeV}$ and $m_{s} = 150 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 1000 ~\mathrm{GeV}$ and $m_{s} = 400 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 5 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 8 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 15 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 40 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 200 ~\mathrm{GeV}$ and $m_{s} = 8 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 200 ~\mathrm{GeV}$ and $m_{s} = 25 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 200 ~\mathrm{GeV}$ and $m_{s} = 50 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 400 ~\mathrm{GeV}$ and $m_{s} = 50 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 400 ~\mathrm{GeV}$ and $m_{s} = 100 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 600 ~\mathrm{GeV}$ and $m_{s} = 50 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 1000 ~\mathrm{GeV}$ and $m_{s} = 50 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 1000 ~\mathrm{GeV}$ and $m_{s} = 150 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 1000 ~\mathrm{GeV}$ and $m_{s} = 400 ~\mathrm{GeV}$.

Differential cross-section and uncertainty from each source, as a function of leading $p_{T}^j$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of leading $p_{T}^j$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of leading $p_{T}^j$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of leading $p_{T}^j$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{ee}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{\mu\mu}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{e\mu}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{ee}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{\mu\mu}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{e\mu}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the $ee jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Expected and observed 95% CL lower limits on first- and second-generation leptoquark masses for different values of $\beta$.

Event yields in the dimuon channel control regions with total uncertainties. The observed number of events is given in the first row. The background event numbers as obtained from the fit are shown together with the total uncertainties. The second row shows the total background expectation, the further rows show the breakdown into different background components.

Event yields in the dielectron channel control regions with total uncertainties. The observed number of events is given in the first row. The background event numbers as obtained from the fit are shown together with the total uncertainties. The second row shows the total background expectation, the further rows show the breakdown into different background components.

Distribution of $m_{LQ}^{min}$ in the training region for the BDT for the $ee jj$ and $\mu\mu jj$ channels. Data are shown together with predicted total background expectation.

Distribution of $m_{LQ}^{T}$ in the training region for the BDT for the $e\nu jj$ and $\mu\nu jj$ channels. Data are shown together with predicted total background expectation.