The extrapolated ($\tau > 30$ ps) average charged-particle muliplicity per unit of rapidity for ETARAP=0 as a function of the centre-of-mass energy.

Charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of pseudorapidity for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of pseudorapidity for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of transverse momentum for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of transverse momentum for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Charged-particle multiplicity distribution in proton-proton collisions at a centre-of mass energy of 13000 GeV for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Charged-particle multiplicity distribution in proton-proton collisions at a centre-of mass energy of 13000 GeV for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Average transverse momentum in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of the number of charged particles in the event for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Average transverse momentum in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of the number of charged particles in the event for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of pseudorapidity for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of pseudorapidity for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of transverse momentum for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of transverse momentum for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) charged-particle multiplicity distributions in proton-proton collisions at a centre-of mass energy of 13000 GeV for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) charged-particle multiplicity distributions in proton-proton collisions at a centre-of mass energy of 13000 GeV for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) average transverse momentum in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of the number of charged particles in the event for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) average transverse momentum in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of the number of charged particles in the event for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

- - - - - - - - Overview of HEPData Record - - - - - - - - <br/><br/> <b>Background Fit results:</b> <ul> <li><a href="89413?version=4&table=Background fit 1">CRs</a> <li><a href="89413?version=4&table=Background fit 2">VRs</a> <li><a href="89413?version=4&table=Background fit 5">inclusive DF-0J SRs</a> <li><a href="89413?version=4&table=Background fit 6">inclusive DF-1J SRs</a> <li><a href="89413?version=4&table=Background fit 3">inclusive SF-0J SRs</a> <li><a href="89413?version=4&table=Background fit 4">inclusive SF-1J SRs</a> </ul> <b>Kinematic distributions in VRs:</b> <ul> <li><a href="89413?version=4&table=VR kinematics 1">$m_{T2}$ in VR-top-low</a> <li><a href="89413?version=4&table=VR kinematics 2">$m_{T2}$ in VR-top-high</a> <li><a href="89413?version=4&table=VR kinematics 3">$E_T^{miss}$ in VR-WW-0J</a> <li><a href="89413?version=4&table=VR kinematics 4">$E_T^{miss}$ in VR-WW-1J</a> <li><a href="89413?version=4&table=VR kinematics 5">$E_T^{miss}$ sig in VR-VZ</a> <li><a href="89413?version=4&table=VR kinematics 6">$E_T^{miss}$ sig in VR-top-WW</a> </ul> <b>Kinematic distributions in SRs:</b> <ul> <li><a href="89413?version=4&table=SR kinematics 1">$m_{T2}$ in SR-SF-0J</a> <li><a href="89413?version=4&table=SR kinematics 2">$m_{T2}$ in SR-SF-1J</a> <li><a href="89413?version=4&table=SR kinematics 3">$m_{T2}$ in SR-DF-0J</a> <li><a href="89413?version=4&table=SR kinematics 4">$m_{T2}$ in SR-DF-1J</a> </ul> <b>Systematic uncertaities:</b> <ul> <li><a href="89413?version=4&table=Systematic uncertainties">dominant systematic uncertainties in the inclusive SRs</a> </ul> <b>Exclusion contours:</b> <ul> <li><a href="89413?version=4&table=Exclusion contour (exp) 1">expected exclusion contour direct chargino-pair production via W decay grid</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 1">observed exclusion contour direct chargino-pair production via W decay grid</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 2">expected exclusion contour direct chargino-pair production via slepton decay grid</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 2">observed exclusion contour direct chargino-pair production via slepton decay grid</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 3">expected exclusion contour direct slepton-pair production grid</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 3">observed exclusion contour direct slepton-pair production grid</a> </ul> <br/><br/><b>AUXILIARY MATERIAL</b><br/> <b>Background Fit in binned SRs:</b> <ul> <li><a href="89413?version=4&table=Background fit 7">binned DF-0J SRs</a> <li><a href="89413?version=4&table=Background fit 8">binned DF-1J SRs</a> <li><a href="89413?version=4&table=Background fit 9">binned SF-0J SRs</a> <li><a href="89413?version=4&table=Background fit 10">binned SF-1J SRs</a> </ul> <b>Exclusion contours:</b> <ul> <li><a href="89413?version=4&table=Exclusion contour (exp) 4">expected exclusion contour left-handed slepton-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 4">observed exclusion contour left-handed slepton-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 5">expected exclusion contour right-handed slepton-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 5">observed exclusion contour right-handed slepton-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 6">expected exclusion contour selectron-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 6">observed exclusion contour selectron-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 7">expected exclusion contour left-handed selectron-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 7">observed exclusion contour left-handed selectron-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 8">expected exclusion contour right-handed selectron-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 8">observed exclusion contour right-handed selectron-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 9">expected exclusion contour smuon-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 9">observed exclusion contour smuon-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 10">expected exclusion contour left-handed smuon-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 10">observed exclusion contour left-handed smuon-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 11">expected exclusion contour right-handed smuon-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 11">observed exclusion contour right-handed smuon-pair production</a> </ul> <b>Cross section upper limits:</b> <ul> <li><a href="89413?version=4&table=xsec upper limits 1">upper limits on signal cross section for direct chargino-pair production via W decay</a> <li><a href="89413?version=4&table=xsec upper limits 2">upper limits on signal cross section for direct chargino-pair production via slepton decay</a> <li><a href="89413?version=4&table=xsec upper limits 3">upper limits on signal cross section for direct slepton-pair production</a> </ul> <b>Acceptances and Efficiencies for direct chargino-pair production via W decay grid </b> <ul> <li> <b>Acceptance</b> <br/> <a href="89413?version=4&table=Acceptance SR-DF-0J-[100,inf) for C1C1WW grid">SR-DF-0J-[100,inf) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[160,inf) for C1C1WW grid">SR-DF-0J-[160,inf) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[100,120) for C1C1WW grid">SR-DF-0J-[100,120) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[120,160) for C1C1WW grid">SR-DF-0J-[120,160) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[100,105) for C1C1WW grid">SR-DF-0J-[100,105) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[105,110) for C1C1WW grid">SR-DF-0J-[105,110) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[110,120) for C1C1WW grid">SR-DF-0J-[110,120) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[120,140) for C1C1WW grid">SR-DF-0J-[120,140) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[140,160) for C1C1WW grid">SR-DF-0J-[140,160) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[160,180) for C1C1WW grid">SR-DF-0J-[160,180) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[180,220) for C1C1WW grid">SR-DF-0J-[180,220) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[220,260) for C1C1WW grid">SR-DF-0J-[220,260) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[260,inf) for C1C1WW grid">SR-DF-0J-[260,inf) </a><br/> <a href="89413?version=4&table=Acceptance SR-DF-1J-[100,inf) for C1C1WW grid">SR-DF-1J-[100,inf) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[160,inf) for C1C1WW grid">SR-DF-1J-[160,inf) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[100,120) for C1C1WW grid">SR-DF-1J-[100,120) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[120,160) for C1C1WW grid">SR-DF-1J-[120,160) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[100,105) for C1C1WW grid">SR-DF-1J-[100,105) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[105,110) for C1C1WW grid">SR-DF-1J-[105,110) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[110,120) for C1C1WW grid">SR-DF-1J-[110,120) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[120,140) for C1C1WW grid">SR-DF-1J-[120,140) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[140,160) for C1C1WW grid">SR-DF-1J-[140,160) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[160,180) for C1C1WW grid">SR-DF-1J-[160,180) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[180,220) for C1C1WW grid">SR-DF-1J-[180,220) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[220,260) for C1C1WW grid">SR-DF-1J-[220,260) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[260,inf) for C1C1WW grid">SR-DF-1J-[260,inf) </a><br/> <a href="89413?version=4&table=Acceptance SR-SF-0J-[100,inf) for C1C1WW grid">SR-SF-0J-[100,inf) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[160,inf) for C1C1WW grid">SR-SF-0J-[160,inf) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[100,120) for C1C1WW grid">SR-SF-0J-[100,120) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[120,160) for C1C1WW grid">SR-SF-0J-[120,160) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[100,105) for C1C1WW grid">SR-SF-0J-[100,105) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[105,110) for C1C1WW grid">SR-SF-0J-[105,110) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[110,120) for C1C1WW grid">SR-SF-0J-[110,120) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[120,140) for C1C1WW grid">SR-SF-0J-[120,140) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[140,160) for C1C1WW grid">SR-SF-0J-[140,160) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[160,180) for C1C1WW grid">SR-SF-0J-[160,180) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[180,220) for C1C1WW grid">SR-SF-0J-[180,220) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[220,260) for C1C1WW grid">SR-SF-0J-[220,260) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[260,inf) for C1C1WW grid">SR-SF-0J-[260,inf) </a><br/> <a href="89413?version=4&table=Acceptance SR-SF-1J-[100,inf) for C1C1WW grid">SR-SF-1J-[100,inf) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[160,inf) for C1C1WW grid">SR-SF-1J-[160,inf) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[100,120) for C1C1WW grid">SR-SF-1J-[100,120) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[120,160) for C1C1WW grid">SR-SF-1J-[120,160) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[100,105) for C1C1WW grid">SR-SF-1J-[100,105) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[105,110) for C1C1WW grid">SR-SF-1J-[105,110) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[110,120) for C1C1WW grid">SR-SF-1J-[110,120) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[120,140) for C1C1WW grid">SR-SF-1J-[120,140) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[140,160) for C1C1WW grid">SR-SF-1J-[140,160) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[160,180) for C1C1WW grid">SR-SF-1J-[160,180) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[180,220) for C1C1WW grid">SR-SF-1J-[180,220) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[220,260) for C1C1WW grid">SR-SF-1J-[220,260) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[260,inf) for C1C1WW grid">SR-SF-1J-[260,inf) </a><br/> <li> <b>Efficiency</b> <br/> <a href="89413?version=4&table=Efficiency SR-DF-0J-[100,inf) for C1C1WW grid">SR-DF-0J-[100,inf) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[160,inf) for C1C1WW grid">SR-DF-0J-[160,inf) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[100,120) for C1C1WW grid">SR-DF-0J-[100,120) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[120,160) for C1C1WW grid">SR-DF-0J-[120,160) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[100,105) for C1C1WW grid">SR-DF-0J-[100,105) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[105,110) for C1C1WW grid">SR-DF-0J-[105,110) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[110,120) for C1C1WW grid">SR-DF-0J-[110,120) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[120,140) for C1C1WW grid">SR-DF-0J-[120,140) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[140,160) for C1C1WW grid">SR-DF-0J-[140,160) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[160,180) for C1C1WW grid">SR-DF-0J-[160,180) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[180,220) for C1C1WW grid">SR-DF-0J-[180,220) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[220,260) for C1C1WW grid">SR-DF-0J-[220,260) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[260,inf) for C1C1WW grid">SR-DF-0J-[260,inf) </a><br/> <a href="89413?version=4&table=Efficiency SR-DF-1J-[100,inf) for C1C1WW grid">SR-DF-1J-[100,inf) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[160,inf) for C1C1WW grid">SR-DF-1J-[160,inf) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[100,120) for C1C1WW grid">SR-DF-1J-[100,120) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[120,160) for C1C1WW grid">SR-DF-1J-[120,160) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[100,105) for C1C1WW grid">SR-DF-1J-[100,105) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[105,110) for C1C1WW grid">SR-DF-1J-[105,110) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[110,120) for C1C1WW grid">SR-DF-1J-[110,120) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[120,140) for C1C1WW grid">SR-DF-1J-[120,140) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[140,160) for C1C1WW grid">SR-DF-1J-[140,160) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[160,180) for C1C1WW grid">SR-DF-1J-[160,180) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[180,220) for C1C1WW grid">SR-DF-1J-[180,220) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[220,260) for C1C1WW grid">SR-DF-1J-[220,260) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[260,inf) for C1C1WW grid">SR-DF-1J-[260,inf) </a><br/> <a href="89413?version=4&table=Efficiency SR-SF-0J-[100,inf) for C1C1WW grid">SR-SF-0J-[100,inf) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[160,inf) for C1C1WW grid">SR-SF-0J-[160,inf) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[100,120) for C1C1WW grid">SR-SF-0J-[100,120) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[120,160) for C1C1WW grid">SR-SF-0J-[120,160) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[100,105) for C1C1WW grid">SR-SF-0J-[100,105) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[105,110) for C1C1WW grid">SR-SF-0J-[105,110) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[110,120) for C1C1WW grid">SR-SF-0J-[110,120) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[120,140) for C1C1WW grid">SR-SF-0J-[120,140) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[140,160) for C1C1WW grid">SR-SF-0J-[140,160) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[160,180) for C1C1WW grid">SR-SF-0J-[160,180) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[180,220) for C1C1WW grid">SR-SF-0J-[180,220) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[220,260) for C1C1WW grid">SR-SF-0J-[220,260) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[260,inf) for C1C1WW grid">SR-SF-0J-[260,inf) </a><br/> <a href="89413?version=4&table=Efficiency SR-SF-1J-[100,inf) for C1C1WW grid">SR-SF-1J-[100,inf) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[160,inf) for C1C1WW grid">SR-SF-1J-[160,inf) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[100,120) for C1C1WW grid">SR-SF-1J-[100,120) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[120,160) for C1C1WW grid">SR-SF-1J-[120,160) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[100,105) for C1C1WW grid">SR-SF-1J-[100,105) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[105,110) for C1C1WW grid">SR-SF-1J-[105,110) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[110,120) for C1C1WW grid">SR-SF-1J-[110,120) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[120,140) for C1C1WW grid">SR-SF-1J-[120,140) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[140,160) for C1C1WW grid">SR-SF-1J-[140,160) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[160,180) for C1C1WW grid">SR-SF-1J-[160,180) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[180,220) for C1C1WW grid">SR-SF-1J-[180,220) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[220,260) for C1C1WW grid">SR-SF-1J-[220,260) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[260,inf) for C1C1WW grid">SR-SF-1J-[260,inf) </a><br/> </ul> <b>Cutflow:</b> <ul> <li><a href="89413?version=4&table=Cutflow 1">Cutflow for direct chargino-pair production via W decay $m(\tilde{\chi}^{\pm}_1,\tilde{\chi}^{0}_1)=(300,50) GeV$</a> <li><a href="89413?version=4&table=Cutflow 2">Cutflow for direct chargino-pair production via slepton decay $m(\tilde{\chi}^{\pm}_1,\tilde{l},\tilde{\chi}^{0}_1)=(600,300,1) GeV$</a> <li><a href="89413?version=4&table=Cutflow 3">Cutflow for direct slepton-pair production $m(\tilde{l},\tilde{\chi}^{0}_1)=(400,200) GeV$</a> </ul> <b>SimpleAnalysis framework implementation</b> of the search SRs is available under "Resources" (purple button on the left)

Observed events and predicted background yields from the fit for the CRs. For backgrounds whose normalisation is extracted from the fit, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit for the CRs. For backgrounds whose normalisation is extracted from the fit, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit for the CRs. For backgrounds whose normalisation is extracted from the fit, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit for the CRs. For backgrounds whose normalisation is extracted from the fit, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields in the VRs. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields in the VRs. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields in the VRs. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields in the VRs. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for slepton-pair production.

Upper limits on signal cross-section (fb) for slepton-pair production.

Upper limits on signal cross-section (fb) for slepton-pair production.

Upper limits on signal cross-section (fb) for slepton-pair production.

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via $W^{\pm}W^{\mp}$. The masses of the two charginos are 300 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 50 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via $W^{\pm}W^{\mp}$. The masses of the two charginos are 300 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 50 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via $W^{\pm}W^{\mp}$. The masses of the two charginos are 300 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 50 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via slepton-neutrino/sneutrino-lepton pair. The masses of the two charginos are 600 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 1 GeV. The slepton/sneutrino masses are 300 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via slepton-neutrino/sneutrino-lepton pair. The masses of the two charginos are 600 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 1 GeV. The slepton/sneutrino masses are 300 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via slepton-neutrino/sneutrino-lepton pair. The masses of the two charginos are 600 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 1 GeV. The slepton/sneutrino masses are 300 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde\ell\tilde\ell$ are produced. Only $\tilde{e}$ and $\tilde{\mu}$ are considered in this model. The masses of the two sleptons are 400 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 200 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde\ell\tilde\ell$ are produced. Only $\tilde{e}$ and $\tilde{\mu}$ are considered in this model. The masses of the two sleptons are 400 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 200 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde\ell\tilde\ell$ are produced. Only $\tilde{e}$ and $\tilde{\mu}$ are considered in this model. The masses of the two sleptons are 400 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 200 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Detailed list of the contribution of each source of uncertainty to the total uncertainty on the measured values of $\sigma(tq)$, $\sigma(\bar{t}q)$, $R_t$, and $\sigma(tq+\bar{t}q)$. The evaluation of the systematic uncertainties has a statistical uncertainty of $0.3\,\%$. Uncertainties contributing less than $1.0\,\%$ are marked with "$<1$" in the paper. To provide numerical values for this table in HEPdata, these uncertainties are approximated with $\pm 0.5\,\%$. This approximation is applied to all measurements for the following uncertainties$:$ JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by-jets, JES pileup, $b$-JES, jet vertex fraction, mistag efficiency and $W+\;$jets shape variation. For the measurement of $\sigma(tq)$ the approximation is applied in addition to the following uncertainties$:$ JES flavor response, $c$-tagging efficiency, $t\bar{t}$ generator + parton shower and $t\bar{t}$ ISR/FSR. For the measurement of $\sigma(\bar{t}q)$ the approximation is applied in addition to these uncertainties$:$ JES flavor response, $b/\bar{b}$ acceptance, and $t\bar{t}$ ISR/FSR. For the measurement of $R_t$ the approximation is applied in addition to these uncertainties$:$ JES detector, $b$-tagging efficiency, $c$-tagging efficiency, $b/\bar{b}$ acceptance and $tq$ scale variations. For the measurement of $\sigma(tq+\bar{t}q)$ the approximation is applied in addition to these uncertainties$:$ JES flavor response, $c$-tagging efficiency, $b/\bar{b}$ acceptance, $t\bar{t}$ generator + parton shower and $t\bar{t}$ ISR/FSR.

Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(T)).

The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.

Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(TBAR)).

Parametrization factors for the $m_{t}$ dependence [see Eq. (4) in the paper] of $\sigma(tq)$, $\sigma(\bar tq)$, and $\sigma(t q+\bar t q)$.

The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.

The value of $|V_{tb}|^{2}$ is extracted by dividing the measured value of $\sigma(t q+\bar t q)$ by the prediction of the approximate NNLO calculation. The experimental and theoretical uncertainties are added in quadrature.

Event yields for the 2-jet-$\ell^{+}$ and 2-jet-$\ell^{-}$ HPR channels. The expectation for the signal and background yields correspond to the result of the binned maximum-likelihood fit described in Sec. $\mathrm{VI~D}$ in the paper. The uncertainty of the expectations is the normalization uncertainty of each process after the fit, as described in Sec. $\mathrm{VII~F}$ in the paper.

Migration matrix relating the parton level $p_{\mathrm{T}}(t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-quark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $p_{\mathrm{T}}(\bar t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-antiquark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $|y(t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-quark $|y|$ distribution.

Migration matrix relating the parton level $|y(\bar t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-antiquark $|y|$ distribution.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Comparison between the measured differential cross sections and the predictions from the NLO calculation using the MSTW2008 PDF set. For each variable and prediction a $\chi^{2}$ value is calculated with HERAfitter using the covariance matrix of each measured spectrum. The theory uncertainties of the predictions are treated as uncorrelated. The number of degrees of freedom (NDF) is equal to the number of bins in the measured spectrum.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, mistag efficiency, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The JES $\eta$ intercalibration uncertainty has a sign switch from the first to the second bin. For the $tq$ generator $+$ parton shower uncertainty a sign switch is denoted with $\mp$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $c-$tagging efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content $:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet energy resolution, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$ tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the differential cross section as a function of $|y(\bar t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(\bar t)|$.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (fb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anticorrelation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracket background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Detailed breakdown of systematic uncertainties for the measurement in the central rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the central rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the central rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the forward rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the forward rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the forward rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the combined measurement of muon, electron central and electron central-forward channels. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement of muon, electron central and electron central-forward channels. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement of muon, electron central and electron central-forward channels. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS (differential in y, Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS (differential in y, Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS (differential in y, Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS and y (differential in Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS and y (differential in Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS and y (differential in Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Powheg based prediction for AFB in the central-central fiducial phase space, as reported in Fig 16 of the paper. Powheg prediction is corrected to NNLO QCD and NLO EWK, as described in the paper. PDF uncertainties are computed using CT10 PDF set scaled to 68%.

Powheg based prediction for AFB in the central-fiducial fiducial phase space, as reported in Fig 17 of the paper. Powheg prediction is corrected to NNLO QCD and NLO EWK, as described in the paper. PDF uncertainties are computed using CT10 PDF set scaled to 68%.

Observed top-quark mass distribution and expected background in Region A after the fit (Post-Fit) under the background-only hypothesis for the resolved analysis.

Observed top-quark mass distribution and expected background in Region B after the fit (Post-Fit) under the background-only hypothesis for the resolved analysis.

Observed top-quark mass distribution and expected background in Region C after the fit (Post-Fit) under the background-only hypothesis for the resolved analysis.

Observed top-quark mass distribution and expected background in Region D after the fit (Post-Fit) under the background-only hypothesis for the resolved analysis.

Observed top-quark mass distribution and expected background in Region SR1 Medium 1b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Observed top-quark mass distribution and expected background in Region SR1 Medium 2b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Observed top-quark mass distribution and expected background in Region SR1 Tight 1b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Observed top-quark mass distribution and expected background in Region SR1 Tight 2b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Observed top-quark mass distribution and expected background in Region SR2 Medium 1b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Observed top-quark mass distribution and expected background in Region SR2 Medium 2b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Observed top-quark mass distribution and expected background in Region SR2 Tight 1b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Observed top-quark mass distribution and expected background in Region SR2 Tight 2b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Expected and observed upper limits on the cross-section times branching fraction of topcolor-assisted-technicolor Z$^{\prime}_{TC2}$ decaying into top-quark pair as a function of the Z$^{\prime}_{TC2}$ mass.

Expected and observed upper limits on the cross-section times branching fraction of A1 axial-vector mediator decaying into top-quark pair as a function of the mediator mass.

Expected and observed upper limits on the cross-section times branching fraction of V1 vector mediator decaying into top-quark pair as a function of the mediator mass.

Expected and observed upper limits on the cross-section times branching fraction of Kaluza-Klein graviton decaying into top-quark pair as a function of the graviton mass.

Expected and observed upper limits on the cross-section times branching fraction of Kaluza-Klein gluon decaying into top-quark pair as a function of the gluon mass.

Expected and observed upper limits on cross-section times branching fraction of Kaluza-Klein gluon decaying into top-quark pair as a function of the width of Kaluza-Klein gluon for masses of 0.5 TeV.

Expected and observed upper limits on cross-section times branching fraction of Kaluza-Klein gluon decaying into top-quark pair as a function of the width of Kaluza-Klein gluon for masses of 1 TeV.

Expected and observed upper limits on cross-section times branching fraction of Kaluza-Klein gluon decaying into top-quark pair as a function of the width of Kaluza-Klein gluon for masses of 1.5 TeV.

Expected upper limits on cross-section times branching fraction of Kaluza-Klein gluon decaying into top-quark pair as a function of the width of Kaluza-Klein gluon for masses of 2 TeV.

Expected upper limits on cross-section times branching fraction of Kaluza-Klein gluon decaying into top-quark pair as a function of the width of Kaluza-Klein gluon for masses of 5 TeV.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the inclusive jet multiplicity.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the inclusive jet multiplicity.

Differential cross section for the production of W bosons as a function of H_T for events with N_jets &ge; 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of H_T for events with N_jets &ge; 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the H_T for events with N_jets &ge; 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the H_T for events with N_jets &ge; 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the H_T for events with N_jets &ge; 1.

Differential cross section for the production of W bosons as a function of the W p_T for events with N_jets &ge; 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the W p_T for events with N_jets &ge; 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the W p_T for events with N_jets &ge; 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the W p_T for events with N_jets &ge; 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the W p_T for events with N_jets &ge; 1.

Differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets &ge; 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets &ge; 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the leading jet p_T for events with N_jets &ge; 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the leading jet p_T for events with N_jets &ge; 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the leading jet p_T for events with N_jets &ge; 1.

Differential cross section for the production of W bosons as a function of the leading jet rapidity for events with N_jets &ge; 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the leading jet rapidity for events with N_jets &ge; 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the leading jet rapidity for events with N_jets &ge; 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the leading jet rapidity for events with N_jets &ge; 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the leading jet rapidity for events with N_jets &ge; 1.

Differential cross section for the production of W bosons as a function of second leading jet p_T for events with N_jets &ge; 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of second leading jet p_T for events with N_jets &ge; 2.

Differential cross section for the production of W bosons as a function of second leading jet rapidity for events with N_jets &ge; 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of second leading jet rapidity for events with N_jets &ge; 2.

Differential cross section for the production of W bosons as a function of &Delta; R_jet1,jet2 for events with N_jets &ge; 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of &Delta; R_jet1,jet2 for events with N_jets &ge; 2.

Differential cross section for the production of W bosons as a function of dijet invariant mass for events with N_jets &ge; 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of dijet invariant mass for events with N_jets &ge; 2.

Cross section for the production of W bosons as a function of exclusive jet multiplicity.

Statistical correlation between bins in data for the cross section for the production of W bosons as a function of exclusive jet multiplicity.

Differential cross section for the production of W bosons as a function of the H_T for events with N_jets &ge; 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the H_T for events with N_jets &ge; 2.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the H_T for events with N_jets &ge; 2.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the H_T for events with N_jets &ge; 2.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the H_T for events with N_jets &ge; 2.

Differential cross section for the production of W bosons as a function of the W p_T for events with N_jets &ge; 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the W p_T for events with N_jets &ge; 2.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the W p_T for events with N_jets &ge; 2.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the W p_T for events with N_jets &ge; 2.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the W p_T for events with N_jets &ge; 2.

Differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets &ge; 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets &ge; 2.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the leading jet p_T for events with N_jets &ge; 2.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the leading jet p_T for events with N_jets &ge; 2.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the leading jet p_T for events with N_jets &ge; 2.

Differential cross section for the production of W bosons as a function of the electron &eta; for events with N_jets &ge; 0.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the electron &eta; for events with N_jets &ge; 0.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the electron &eta; for events with N_jets &ge; 0.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the electron &eta; for events with N_jets &ge; 0.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the electron &eta; for events with N_jets &ge; 0.

Differential cross section for the production of W bosons as a function of the electron &eta; for events with N_jets &ge; 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the electron &eta; for events with N_jets &ge; 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the electron &eta; for events with N_jets &ge; 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the electron &eta; for events with N_jets &ge; 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the electron &eta; for events with N_jets &ge; 1.

List of experimentally considered systematic uncertainties for the W+jets cross section measurement

Non-perturbative corrections for the cross section for the production of W bosons for different inclusive jet multiplicities.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the inclusive jet multiplicity.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of H_T for events with N_jets &ge; 1.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the H_T for events with N_jets &ge; 1.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the W p_T for events with N_jets &ge; 1.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the W p_T for events with N_jets &ge; 1.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets &ge; 1.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet p_T for events with N_jets &ge; 1.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the leading jet rapidity for events with N_jets &ge; 1.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet rapidity for events with N_jets &ge; 1.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of second leading jet p_T for events with N_jets &ge; 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of second leading jet rapidity for events with N_jets &ge; 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of &Delta; R_jet1,jet2 for events with N_jets &ge; 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of dijet invariant mass for events with N_jets &ge; 2.

Non-perturbative corrections for the cross section for the production of W bosons as a function of exclusive jet multiplicity.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the H_T for events with N_jets &ge; 2.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the H_T for events with N_jets &ge; 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the W p_T for events with N_jets &ge; 2.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the W p_T for events with N_jets &ge; 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets &ge; 2.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet p_T for events with N_jets &ge; 2.

NNLO/NLO k-factors determined with NNLO Njetti for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the H_T for events with N_jets &ge; 1. These numbers were obtained with code described in Phys. Rev. Lett. 115 (2015) 062002 [arXiv:1504.02131].

NNLO/NLO k-factors determined with NNLO Njetti for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the W p_T for events with N_jets &ge; 1. These numbers were obtained with code described in Phys. Rev. Lett. 115 (2015) 062002 [arXiv:1504.02131].

NNLO/NLO k-factors determined with NNLO Njetti for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet p_T for events with N_jets &ge; 1. These numbers were obtained with code described in Phys. Rev. Lett. 115 (2015) 062002 [arXiv:1504.02131].

NNLO/NLO k-factors determined with NNLO Njetti for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet rapidity for events with N_jets &ge; 1. These numbers were obtained with code described in Phys. Rev. Lett. 115 (2015) 062002 [arXiv:1504.02131].