Di-muon mass distribution for the $\mu\mu\mu$ signal region for data and expected background. The expected signal distribution for $m_a = 35$ GeV is shown assuming $\sigma(t\bar{t}a)\times \text{Br}(a\rightarrow\mu\mu) = 4$ fb. Rare background processes include $ZZ+$jets, $WWZ$, $WZZ$, $ZZZ$, and $t\bar{t}t\bar{t}$.

Fit of the Double Crystal Ball width as a function of the $a$-boson mass in the $e\mu\mu$ channel.

Expected and observed 95% CL upper limit on signal cross section as a function of $m_a$ for $t\bar{t}a$.

Expected and observed 95% CL upper limit on signal cross section as a function of $m_a$ for $H^{+}\rightarrow aW$, considering a top pair cross section of $\sigma(pp\rightarrow t\bar{t})= 833$ pb for the charged Higgs boson mass, $m_{H^{+}} = 120$ GeV.

Expected and observed 95% CL upper limit on signal cross section as a function of $m_a$ for $H^{+}\rightarrow aW$, considering a top pair cross section of $\sigma(pp\rightarrow t\bar{t})= 833$ pb for the charged Higgs boson mass, $m_{H^{+}} = 140$ GeV.

Expected and observed 95% CL upper limit on signal cross section as a function of $m_a$ for $H^{+}\rightarrow aW$, considering a top pair cross section of $\sigma(pp\rightarrow t\bar{t})= 833$ pb for the charged Higgs boson mass, $m_{H^{+}} = 160$ GeV.

Comparison of the expected background with data in a region dominated by non-prompt background. The region is defined exactly like the $e\mu\mu$ signal region but requiring the two selected muons to have the same electrical charge.

Scan of the observed p-value as a function of $m_a$ for the background-only hypothesis.

Scan of the observed p-value as a function of $m_a$ for the background-only hypothesis for $e\mu\mu$ channel.

Scan of the observed p-value as a function of $m_a$ for the background-only hypothesis for $\mu\mu\mu$ channel.

Acceptance times efficiency for the $t\bar{t}a$, $a\rightarrow \mu\mu$ signal as a function of the $m_a$ hypothesis.

Acceptance times efficiency for the $t \rightarrow bH^+$, $H^+ \rightarrow W^+ a$, $a\rightarrow \mu\mu$ signal as a function of the $m_a$ and $m_{H^+}$ hypotheses, for the $e\mu\mu$ signal region. The upper left region of the plot corresponds to signals for which on-shell decays of $H^+ \rightarrow Wa$ are not possible. The CP conjugate process is also included.

Acceptance times efficiency for the $t \rightarrow bH^+ $, $H^+ \rightarrow W^+ a$, $a\rightarrow \mu\mu$ signal as a function of the $m_a$ and $m_{H^+}$ hypotheses, for the $\mu\mu\mu$ signal region. The upper left region of the plot corresponds to signals for which on-shell decays of $H^+ \rightarrow Wa$ are not possible. The CP conjugate process is also included.

Expected lower limits on $\tan\beta$ for the $t\rightarrow H^{+}b, H^{+}\rightarrow aW, a\rightarrow\mu\mu$ signal in the context of the 2HDM as a function of $m_{H^{+}}$ and $m_a$.

Observed lower limits on $\tan\beta$ for the $t\rightarrow H^{+}b, H^{+}\rightarrow aW, a\rightarrow\mu\mu$ signal in the context of the 2HDM as a function of $m_{H^{+}}$ and $m_a$.

Cutflow for two signal mass points for $t\bar{t}a$, $m_{a} = 20$ GeV and $m_{a} = 60$ GeV, and one signal mass point for $H^+ \rightarrow Wa$ for the electron channel $e\mu\mu$. For the signal yields, a cross section times branching ratio of 1 fb is assumed. The yields are presented before the profile likelihood fit.

Cutflow for the dominant backgrounds estimated from simulation ($t\bar{t}Z$, $WZ$, $t\bar{t}H$) and data, for the electron channel $e\mu\mu$. The yields are presented before the profile likelihood fit.

Cutflow for the signal mass point $t\bar{t}a$, $m_{a} = 20$ GeV, as well as the dominant backgrounds estimated from simulation ($t\bar{t}Z$, $WZ$, $t\bar{t}H$) and data, for the corresponding signal mass hypothesis, for the muon channel $\mu\mu\mu$. For the signal yields, a cross section times branching ratio of 1 fb is assumed. The yields are presented before the profile likelihood fit.

Cutflow for the signal mass point $t\bar{t}a$, $m_{a} = 60$ GeV, as well as the dominant backgrounds estimated from simulation ($t\bar{t}Z$, $WZ$, $t\bar{t}H$) and data, for the corresponding signal mass hypothesis, for the muon channel $\mu\mu\mu$. For the signal yields, a cross section times branching ratio of 1 fb is assumed. The yields are presented before the profile likelihood fit.

Cutflow for $H^+ \rightarrow W a$ with $m_{H^{+}} = 120$ GeV, $m_{a} = 30$ GeV for the muon channel $\mu\mu\mu$. A cross section times branching ratio of 1 fb is assumed. The yields are presented before the profile likelihood fit.

Total yields in the $e\mu\mu$ and $\mu\mu\mu$ signal regions for the expected background and data after the profile likelihood fit for a $m_a = 30$ GeV signal mass hypothesis.

The $L_{T}$ distribution in the MisID-enriched region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L below-Z signal region. The last bin contains the overflow events.

The $M_{T}$ distribution in the 3L on-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L above-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF1 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF2 signal region. The last bin contains the overflow events.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The 95% confidence level exclusion limits for the flavor-democratic scenario on the total production cross section of heavy fermion pairs.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(PS).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(PS).

Product of the fiducial acceptance and the event selection efficiency for the type-III Seesaw signal model at various signal mass hypotheses calculated after all analysis selection requirements.

Product of the fiducial acceptance and the event selection efficiency for the tt$\phi$ signal models at various signal mass hypotheses calculated after all analysis selection requirements.