A measurement of the top-quark mass ($m_t$) in the $t\bar{t}\rightarrow~\textrm{lepton}+\textrm{jets}$ channel is presented, with an experimental technique which exploits semileptonic decays of $b$-hadrons produced in the top-quark decay chain. The distribution of the invariant mass $m_{\ell\mu}$ of the lepton, $\ell$ (with $\ell=e,\mu$), from the $W$-boson decay and the muon, $\mu$, originating from the $b$-hadron decay is reconstructed, and a binned-template profile likelihood fit is performed to extract $m_t$. The measurement is based on data corresponding to an integrated luminosity of 36.1 fb$^{-1}$ of $\sqrt{s} = 13~\textrm{TeV}$$pp$ collisions provided by the Large Hadron Collider and recorded by the ATLAS detector. The measured value of the top-quark mass is $m_{t} = 174.41\pm0.39~(\textrm{stat.})\pm0.66~(\textrm{syst.})\pm0.25~(\textrm{recoil})~\textrm{GeV}$, where the third uncertainty arises from changing the PYTHIA8 parton shower gluon-recoil scheme, used in top-quark decays, to a recently developed setup.
Top mass measurement result.
List of all the individual sources of systematic uncertainty considered in the analysis. The individual sources, each corresponding to an independent nuisance parameter in the fit, are grouped into categories, as indicated in the first column. The second column shows the impact of each of the individual sources on the measurement, obtained as the shift on the top mass induced by a positive shift of the each of the nuisance parameters by its post-fit uncertainty. Sources for which no impact is indicated are neglected in the fit procedure as their impact on the total prediction is negligible in any of the bins. The last column shows the statistical uncertainty in each of the reported numbers as estimated with the bootstrap method.
Ranking, from top to bottom, of the main systematic uncertainties (excluding recoil) showing the pulls and the impact of the systematic uncertainties on the top mass, from the combined opposite sign (OS) and same sign (SS) binned-template profile likelihood fit to data. The OS or SS refers to the charge signs of the primary lepton and the soft muon. The gamma parameters are NPs used to describe the effect of the limited statistics of the sample.
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