Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the High-pT jet SR for observed data events

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the High-pT jet SR for expected signal events in the strong gluino pair pair production model with m(gluino)=1.8 TeV, m(chi0)=0.2 TeV, tau(chi0)=0.1 ns

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the Trackless jet SR for observed data events

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the Trackless jet SR for expected signal events in the electroweak pair production model

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Exclusion limits at 95% CL on the production cross section in the electroweak pair production model.

Exclusion limits at 95% CL on the production cross section in the strong gluino pair production models and m(gluino)=2.4 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Exclusion limits at 95% CL on the production cross section in the strong gluino pair production models and m($ ilde{\chi}^0_1$)=1.25 TeV

Acceptance cutflow for the High-pT SR for representative points in the strong gluino pair production model. See additional resources for more information.

Acceptance cutflow for the Trackless SR for representative points in the electroweak pair production model. See additional resources for more information.

Acceptance cutflow for the Trackless SR for representative points in the electroweak pair production model with heavy-flavor quarks final state. See additional resources for more information.

Acceptance cutflow for the High-pT SR for representative points in the electroweak pair production model with heavy-flavor quarks final state. See additional resources for more information.

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R < 1150 mm

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R [1150, 3870] mm

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R > 3870 mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R < 1150 mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R [1150, 3870] mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R > 3870 mm

Reinterpretation Material: Vertex-level Efficiency for R < 22 mm

Reinterpretation Material: Vertex-level Efficiency for R [22, 25] mm

Reinterpretation Material: Vertex-level Efficiency for R [25, 29] mm

Reinterpretation Material: Vertex-level Efficiency for R [29, 38] mm

Reinterpretation Material: Vertex-level Efficiency for R [38, 46] mm

Reinterpretation Material: Vertex-level Efficiency for R [46, 73] mm

Reinterpretation Material: Vertex-level Efficiency for R [73, 84] mm

Reinterpretation Material: Vertex-level Efficiency for R [84, 111] mm

Reinterpretation Material: Vertex-level Efficiency for R [111, 120] mm

Reinterpretation Material: Vertex-level Efficiency for R [120, 145] mm

Reinterpretation Material: Vertex-level Efficiency for R [145, 180] mm

Reinterpretation Material: Vertex-level Efficiency for R [180, 300] mm

Cutflow (acceptance x efficiency) for the High-pT SR for representative points in the strong gluino pair production model. See additional resources for more information.

Cutflow (acceptance x efficiency) for the Trackless SR for representative points in the electroweak pair production model. See additional resources for more information.

Cutflow (acceptance x efficiency) for the Trackless SR for representative points in the electroweak pair production model with heavy-flavor quarks. See additional resources for more information.

Cutflow (acceptance x efficiency) for the High-pT SR for representative points in the electroweak pair production model with heavy-flavor quarks. See additional resources for more information.

The minimum $\chi^2$ and the parameters $T_{fo}$ and $\beta^{max}_T$ for each of the five centrality selections. The best fit parameters are determined by averaging all parameter pairs within the 1$\sigma$ contour. The errors correspond to the standard deviation of the parameter pairs within the 1$\sigma$ $\chi^2$ contour.

Fit parameters for each particle species using Equations $\frac{dN}{dy}$ = $C \cdot$ ($N_{part}$)$^{\alpha_{part}}$ and $\frac{dN}{dy}$ = $C^{\prime} \cdot$ ($N_{coll}$)$^{\alpha_{coll}}$.

Values of the parameters $n_{pp}$ and $x$ from fitting Equation $R \equiv \frac{dN/dy}{N_{part}}$ = (1-$x$) $\cdot n_{pp} \frac{1}{2}$ + $x \cdot n_{pp} \frac{N_{coll}}{N_{part}}$ = $n_{pp}$ [$\frac{1}{2}$ + $x$($\frac{N_{coll}}{N_{part}}$ - $\frac{1}{2})$]to the observed $dN$/$dy$ per $N_{part}$.

Invariant yields for $\pi^{\pm}$ measured in minimum-bias events at midrapidity and normalized to one rapidity unit.

Invariant yields for $K^{\pm}$ measured in minimum-bias events at midrapidity and normalized to one rapidity unit.

Invariant yields for (anti)$p$ measured in minimum-bias events at midrapidity and normalized to one rapidity unit.

Pion invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

Pion invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

Kaon invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

Kaon invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

(Anti)proton invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

(Anti)proton invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

(Anti)proton invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

(Anti)proton invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

(Anti)proton invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

(Anti)proton invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

(Anti)proton invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

Minimum-bias invariant yields for $\pi^{\pm}$ in equal $p_T$ bins.

Minimum-bias invariant yields for $K^{\pm}$ in equal $p_T$ bins.

Minimum-bias invariant yields for (anti)$p$ in equal $p_T$ bins.

Pion invariant yields in each event centrality normalized to one rapidity unit at midrapidity.

Pion invariant yields in each event centrality normalized to one rapidity unit at midrapidity.

Kaon invariant yields in each event centrality normalized to one rapidity unit at midrapidity.

(Anti)proton invariant yields in each event centrality normalized to one rapidity unit at midrapidity.

(Anti)proton invariant yields in each event centrality normalized to one rapidity unit at midrapidity.

The integrated mean $p_T$ for pions, kaons, and (anti)protons produced in the five different classes of event centrality.

The expansion parameters $T_{fo}$ and $\beta^{max}_T$ as a function of the number of participants.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64822.9 $\pm$ 254.6, NPowHeg truth =634276.

Unfolded dR distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64273.2 $\pm$ 253.5, NPowHeg truth =338671.

Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 65362.4 $\pm$ 255.7 , NPowHeg truth =634214.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63486.8 $\pm$ 252.0, NPowHeg truth =333348.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64432.6 $\pm$ 253.8, NPowHeg truth =624059.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57095.9 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =76327.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57130 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =763273.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58310.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58320.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Unfolded dR distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57705.4 $\pm$ 254 , NPowHeg truth =301655, N Sherpa truth =763259.

Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58869.2 $\pm$ 256, NPowHeg truth =564660, NS herpa truth =813995.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57358.6 $\pm$ 254 , NPowHeg truth =298662, N Sherpa truth =756609.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58226.4 $\pm$ 254, NPowHeg truth =558949, N Sherpa truth =806988.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63717.4 $\pm$ 252.4, NPowHeg truth =338714.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63855.8 $\pm$ 252.7 , NPowHeg truth =338708.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64809.8 $\pm$ 254.6, NPowHeg truth =634285.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64822.9 $\pm$ 254.6, NPowHeg truth =634276.

Unfolded dR distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64273.2 $\pm$ 253.5, NPowHeg truth =338671.

Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 65362.4 $\pm$ 255.7 , NPowHeg truth =634214.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63486.8 $\pm$ 252.0, NPowHeg truth =333348.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64432.6 $\pm$ 253.8, NPowHeg truth =624059.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57095.9 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =76327.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57130 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =763273.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58310.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58320.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Unfolded dR distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57705.4 $\pm$ 254 , NPowHeg truth =301655, N Sherpa truth =763259.

Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58869.2 $\pm$ 256, NPowHeg truth =564660, NS herpa truth =813995.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57358.6 $\pm$ 254 , NPowHeg truth =298662, N Sherpa truth =756609.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58226.4 $\pm$ 254, NPowHeg truth =558949, N Sherpa truth =806988.

Truth $P_{T}^{Z}$ distribution after reweghting to data.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63717.4 $\pm$ 252.4, NPowHeg truth =338714.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63855.8 $\pm$ 252.7 , NPowHeg truth =338708.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64809.8 $\pm$ 254.6, NPowHeg truth =634285.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64822.9 $\pm$ 254.6, NPowHeg truth =634276.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64273.2 $\pm$ 253.5, NPowHeg truth =338671.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 65362.4 $\pm$ 255.7 , NPowHeg truth =634214.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63486.8 $\pm$ 252.0, NPowHeg truth =333348.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64432.6 $\pm$ 253.8, NPowHeg truth =624059.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57095.9 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =76327.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57130 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =763273.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58310.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58320.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57705.4 $\pm$ 254 , NPowHeg truth =301655, N Sherpa truth =763259.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58869.2 $\pm$ 256, NPowHeg truth =564660, NS herpa truth =813995.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57358.6 $\pm$ 254 , NPowHeg truth =298662, N Sherpa truth =756609.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58226.4 $\pm$ 254, NPowHeg truth =558949, N Sherpa truth =806988.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63717.4 $\pm$ 252.4, NPowHeg truth =338714.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63855.8 $\pm$ 252.7 , NPowHeg truth =338708.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64809.8 $\pm$ 254.6, NPowHeg truth =634285.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64822.9 $\pm$ 254.6, NPowHeg truth =634276.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64273.2 $\pm$ 253.5, NPowHeg truth =338671.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 65362.4 $\pm$ 255.7 , NPowHeg truth =634214.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63486.8 $\pm$ 252.0, NPowHeg truth =333348.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64432.6 $\pm$ 253.8, NPowHeg truth =624059.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57095.9 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =76327.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57130 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =763273.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58310.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58320.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57705.4 $\pm$ 254 , NPowHeg truth =301655, N Sherpa truth =763259.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58869.2 $\pm$ 256, NPowHeg truth =564660, NS herpa truth =813995.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57358.6 $\pm$ 254 , NPowHeg truth =298662, N Sherpa truth =756609.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58226.4 $\pm$ 254, NPowHeg truth =558949, N Sherpa truth =806988.

Unfolded $M(l^{+}\gamma\gamma)$ distribution for $Z \to ll\gamma\gamma$ process with dressed leptons.

Unfolded $M(l^{+}\gamma\gamma)$ distribution for $Z \to ll\gamma\gamma$ process with bare leptons.

Unfolded dR distribution for $Z \to ll\gamma\gamma$ process with dressed leptons for leading photon.

Unfolded dR distribution for $Z \to ll\gamma\gamma$ process with bare leptons for leading photon.

Unfolded dR distribution for $Z \to ll\gamma\gamma$ process with dressed leptons for second photon.

Unfolded dR distribution for $Z \to ll\gamma\gamma$ process with bare leptons for second photon.

Unfolded dRgg distribution for $Z \to ll\gamma\gamma$ process with dressed leptons.

Unfolded dRgg distribution for $Z \to ll\gamma\gamma$ process with bare leptons.

Unfolded $P_{T}^{\gamma 1}$ distribution for $Z \to ll\gamma\gamma$ process with dressed leptons for leading photon.

Unfolded $P_{T}^{\gamma 1}$ distribution for $Z \to ll\gamma\gamma$ process with bare leptons for leading photon.

Unfolded $P_{T}^{\gamma 2}$ distribution for $Z \to ll\gamma\gamma$ process with dressed leptons for second photon.

Unfolded $P_{T}^{\gamma 2}$ distribution for $Z \to ll\gamma\gamma$ process with bare leptons for second photon.

Measured $p_T$ cross sections in full-lepton phase space for 1.2 < |y| < 1.6.

Measured $p_T$ cross sections in full-lepton phase space for 1.6 < |y| < 2.0.

Measured $p_T$ cross sections in full-lepton phase space for 2.0 < |y| < 2.4.

Measured $p_T$ cross sections in full-lepton phase space for 2.4 < |y| < 2.8.

Measured $p_T$ cross sections in full-lepton phase space for 2.8 < |y| < 3.2.

Measured cross sections in full-lepton phase space as a function of |y|.

Normalised measured $p_T$ cross sections in full-lepton phase space for |y| < 1.6.

absolutely normalized dijet yields scaled by 1/<TAA> in 20-40% central PbPb collisions

absolutely normalized dijet yields scaled by 1/<TAA> in 40-60% central PbPb collisions

absolutely normalized dijet yields scaled by 1/<TAA> in 60-80% central PbPb collisions

self normalized dijets from pp collisions

self normalized dijet distributions in 0-10% central PbPb collisions

self normalized dijet distributions in 10-20% central PbPb collisions

self normalized dijet distributions in 20-40% central PbPb collisions

self normalized dijet distributions in 40-60% central PbPb collisions

self normalized dijet distributions in 60-80% central PbPb collisions

leading jet RAA^pair in 0-10% central PbPb collisions

subleading jet RAA^pair in 0-10% central PbPb collisions

leading jet RAA^pair in 10-20% central PbPb collisions

subleading jet RAA^pair in 10-20% central PbPb collisions

leading jet RAA^pair in 20-40% central PbPb collisions

subleading jet RAA^pair in 20-40% central PbPb collisions

leading jet RAA^pair in 40-60% central PbPb collisions

subleading jet RAA^pair in 40-60% central PbPb collisions

leading jet RAA^pair in 60-80% central PbPb collisions

subleading jet RAA^pair in 60-80% central PbPb collisions

ratio of subleading jet RAA^pair to leading jet RAA^pair in PbPb collisions

Total efficiencies for the selection of signal events after categorization and application of the tighter photon $E_{\mathrm{T}}^{\gamma}$ selection used to optimize the signal significance spin-1 $q\bar{q'}\to X^{\pm} \to W^{\pm}\gamma$. In addition to the total efficiency, contributions to the signal selection from each of the separate event categories are shown. The efficiencies calculated from MC samples with $W/Z$ hadronic decays are shown as the points on each curve. The line presents interpolated results.

Total efficiencies for the selection of signal events after categorization and application of the tighter photon $E_{\mathrm{T}}^{\gamma}$ selection used to optimize the signal significance spin-2 $q\bar{q}\to X^0 \to Z\gamma$. In addition to the total efficiency, contributions to the signal selection from each of the separate event categories are shown. The efficiencies calculated from MC samples with $W/Z$ hadronic decays are shown as the points on each curve. The line presents interpolated results.

Total efficiencies for the selection of signal events after categorization and application of the tighter photon $E_{\mathrm{T}}^{\gamma}$ selection used to optimize the signal significance spin-2 $gg\to X^0 \to Z\gamma$. In addition to the total efficiency, contributions to the signal selection from each of the separate event categories are shown. The efficiencies calculated from MC samples with $W/Z$ hadronic decays are shown as the points on each curve. The line presents interpolated results.

The $m_{J\gamma}$ distributions of data events selected for the spin-1 $q\bar{q'}\to X^{\pm} \to W^{\pm}\gamma$ search in the D2 category. The background-only fit function shape is shown as the solid curve overlaid with a shaded band corresponding to statistical uncertainties in background parameters. Various signal shapes with cross-sections corresponding to expected limits obtained in this analysis are shown as dashed lines.

The $m_{J\gamma}$ distributions of data events selected for the spin-1 $q\bar{q'}\to X^{\pm} \to W^{\pm}\gamma$ search in the WMASS category. The background-only fit function shape is shown as the solid curve overlaid with a shaded band corresponding to statistical uncertainties in background parameters. Various signal shapes with cross-sections corresponding to expected limits obtained in this analysis are shown as dashed lines.

The $m_{J\gamma}$ distributions of data events selected for the spin-0 $gg \to X^{0} \to Z\gamma$ search in the BTAG category. The background-only fit function shape is shown as the solid curve overlaid with a shaded band corresponding to statistical uncertainties in background parameters. Various signal shapes with cross-sections corresponding to expected limits obtained in this analysis are shown as dashed lines.

The $m_{J\gamma}$ distributions of data events selected for the spin-0 $gg \to X^{0} \to Z\gamma$ search in the D2 category. The background-only fit function shape is shown as the solid curve overlaid with a shaded band corresponding to statistical uncertainties in background parameters. Various signal shapes with cross-sections corresponding to expected limits obtained in this analysis are shown as dashed lines.

The $m_{J\gamma}$ distributions of data events selected for the spin-0 $gg \to X^{0} \to Z\gamma$ search in the ZMASS category. The background-only fit function shape is shown as the solid curve overlaid with a shaded band corresponding to statistical uncertainties in background parameters. Various signal shapes with cross-sections corresponding to expected limits obtained in this analysis are shown as dashed lines.

The $m_{J\gamma}$ distributions of data events selected for the spin-2 $gg \to X^{0} \to Z\gamma$ search in the BTAG category. The background-only fit function shape is shown as the solid curve overlaid with a shaded band corresponding to statistical uncertainties in background parameters. Various signal shapes with cross-sections corresponding to expected limits obtained in this analysis are shown as dashed lines.

The $m_{J\gamma}$ distributions of data events selected for the spin-2 $gg \to X^{0} \to Z\gamma$ search in the D2 category. The background-only fit function shape is shown as the solid curve overlaid with a shaded band corresponding to statistical uncertainties in background parameters. Various signal shapes with cross-sections corresponding to expected limits obtained in this analysis are shown as dashed lines.

The $m_{J\gamma}$ distributions of data events selected for the spin-2 $gg \to X^{0} \to Z\gamma$ search in the ZMASS category. The background-only fit function shape is shown as the solid curve overlaid with a shaded band corresponding to statistical uncertainties in background parameters. Various signal shapes with cross-sections corresponding to expected limits obtained in this analysis are shown as dashed lines.

The $m_{J\gamma}$ distributions of data events selected for the spin-2 $q\bar{q} \to X^{0} \to Z\gamma$ search in the BTAG category. The background-only fit function shape is shown as the solid curve overlaid with a shaded band corresponding to statistical uncertainties in background parameters. Various signal shapes with cross-sections corresponding to expected limits obtained in this analysis are shown as dashed lines.

The $m_{J\gamma}$ distributions of data events selected for the spin-2 $q\bar{q} \to X^{0} \to Z\gamma$ search in the D2 category. The background-only fit function shape is shown as the solid curve overlaid with a shaded band corresponding to statistical uncertainties in background parameters. Various signal shapes with cross-sections corresponding to expected limits obtained in this analysis are shown as dashed lines.

The $m_{J\gamma}$ distributions of data events selected for the spin-2 $q\bar{q} \to X^{0} \to Z\gamma$ search in the ZMASS category. The background-only fit function shape is shown as the solid curve overlaid with a shaded band corresponding to statistical uncertainties in background parameters. Various signal shapes with cross-sections corresponding to expected limits obtained in this analysis are shown as dashed lines.

The 95% CL upper limits on $\sigma(pp\to X)\times B(X\to W/Z\gamma)$ as a function of $m_{X}$ for spin-0 $gg \to X^{0} \to Z\gamma$. The observed limits are shown as a solid black line and the expected ones are shown as a dashed line with the 1$\sigma$ (2$\sigma$) uncertainty band presented as the green (yellow) band.

The 95% CL upper limits on $\sigma(pp\to X)\times B(X\to W/Z\gamma)$ as a function of $m_{X}$ for spin-2 $gg \to X^{0} \to Z\gamma$. The observed limits are shown as a solid black line and the expected ones are shown as a dashed line with the 1$\sigma$ (2$\sigma$) uncertainty band presented as the green (yellow) band.

The 95% CL upper limits on $\sigma(pp\to X)\times B(X\to W/Z\gamma)$ as a function of $m_{X}$ for spin-2 $q\bar{q} \to X^{0} \to Z\gamma$. The observed limits are shown as a solid black line and the expected ones are shown as a dashed line with the 1$\sigma$ (2$\sigma$) uncertainty band presented as the green (yellow) band.

The 95% CL upper limits on $\sigma(pp\to X)\times B(X\to W/Z\gamma)$ as a function of $m_{X}$ for spin-1 $q\bar{q'}\to X^{\pm} \to W^{\pm}\gamma$. The observed limits are shown as a solid black line and the expected ones are shown as a dashed line with the 1$\sigma$ (2$\sigma$) uncertainty band presented as the green (yellow) band.

The jet mass distribution of large-$R$ jets originating from the hadronic decay of $W$ and $Z$ bosons produced from the decay of BSM bosons with mass $m_X = 2000$ GeV. The decays simulated are for the production models $q\bar{q'}\to X^{\pm} \to W^{\pm}\gamma$ with a spin-1 resonance $X^{\pm}$ and $gg\to X^0 \to Z\gamma$ with a spin-0 resonance $X^{0}$.

The photon $E_{T}$ selection criteria as a function of resonance mass for D2 categories. Selections for four different signal channels are shown together.

The photon $E_{T}$ selection criteria as a function of resonance mass for ZMASS or WMASS categories. Selections for four different signal channels are shown together.

Events in bins of the $E_{miss}^T$ in the SR.

Parametrization of the $A_{X}$ factor, defined as the fraction of diphoton resonances satisfying the fiducial acceptance at the particle level, as function of $m_{X}$ obtained from the narrow width simulated signal samples produced in gluon fusion.

The correction factor, $C_{X}$, defined as the ratio between the number of reconstructed signal events passing the analysis cuts and the number of signal events at the particle level generated within the fiducial volume, and acceptance correction factor, $A_{X}$, defined as the fraction of diphoton resonances satisfying the fiducial acceptance at the particle level. Both are computed for NWA spin-0 models as a function of $m_{X}$.

Effect of event selections on a scalar MC signal sample generated for $m_{X}$ = 15 GeV and on the data. For the MC sample, the efficiencies are shown after applying event weights and a truth level filter that requires two photons with $p^{\gamma\gamma}_{T}>40$ GeV; for the data, the absolute yields are shown. The initial yields for data include a trigger preselection that is the OR of a list of single photon and diphoton triggers. The "2 $loose$ photons" step includes the kinematic acceptance cuts.

Parameterization of the Double Sided Crystal Ball function parameters describing the scalar mass resolution model as a function of $m_{X}$ [GeV].

The reconstruction efficiency for caloDPJs produced by the decay of &gamma;_d into e⁺e^- or qq&#772;. The reconstruction efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as a function of their transverse momentum in events where the &gamma;_d L_xy is between 2&nbsp;m and 4&nbsp;m.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_2&mu;^ggF, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_c+&mu;^ggF, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_2c^ggF, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and WH selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_c^WH, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and WH selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_c+&mu;^WH, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and WH selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_2c^WH, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_2&mu;^ggF, assuming a HAHM signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_c+&mu;^ggF, assuming a HAHM signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_2c^ggF, assuming a HAHM signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d is larger than unity.

The CalRatio 2015--2016 trigger efficiency for the decay of &gamma;_d in e⁺e^- or qq&#772;. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse decay length L_xy.

The CalRatio 2015--2016 trigger efficiency for the decay of &gamma;_d in e⁺e^- or qq&#772;. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse momentum, in events where the &gamma;_d L_xy is between 2&nbsp;m and 4&nbsp;m.

The CalRatio 2017--2018 trigger efficiency for the decay of &gamma;_d in e⁺e^- or qq&#772;. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse decay length L_xy.

The CalRatio 2017--2018 trigger efficiency for the decay of &gamma;_d in e⁺e^- or qq&#772;. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse momentum, in events where the &gamma;_d L_xy is between 2&nbsp;m and 4&nbsp;m.

The narrow-scan 2015--2016 trigger efficiency for the decay of &gamma;_d in &mu;⁺&mu;^-. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse decay length L_xy.

The narrow-scan 2015--2016 trigger efficiency for the decay of &gamma;_d in &mu;⁺&mu;^-. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse momentum, in events where the &gamma;_d L_xy is below 6&nbsp;m.

The narrow-scan 2017--2018 trigger efficiency for the decay of &gamma;_d in &mu;⁺&mu;^-. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse decay length L_xy.

The narrow-scan 2017--2018 trigger efficiency for the decay of &gamma;_d in &mu;⁺&mu;^-. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse momentum, in events where the &gamma;_d L_xy is below 6&nbsp;m.

Efficiency of the cosmic-ray tagger as function of the &gamma;_d transverse decay length. The efficiency is calculated accepting the &mu;DPJs for which the cosmic-ray tagger score is &gt; 0.2 for each associated MS-only track.

Efficiency of the cosmic-ray tagger as function of the &gamma;_d transverse momentum. The efficiency is calculated accepting the &mu;DPJs for which the cosmic-ray tagger score is &gt; 0.2 for each associated MS-only track.

Efficiency of the QCD tagger as function of the &gamma;_d transverse decay length. The efficiency is calculated accepting the caloDPJs for which the QCD tagger score is &gt; 0.5.

Efficiency of the QCD tagger as function of the &gamma;_d transverse momentum. The efficiency is calculated accepting the caloDPJs for which the QCD tagger score is &gt; 0.5.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_2&mu;^ggF.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_c+&mu;^ggF.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_2c^ggF.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_c^WH.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_2c^WH.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_c+&mu;^WH.

The extrapolated acceptance times efficiencies for SR_2&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_c+&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_2c;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_2&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the HAHM H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the ggF channel.

The extrapolated acceptance times efficiencies for SR_c+&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the HAHM H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the ggF channel.

The extrapolated acceptance times efficiencies for SR_2c;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the HAHM H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the ggF channel.

The extrapolated acceptance times efficiencies for SR_2&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_c+&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_2c;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_2&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a SM Higgs boson. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_c+&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a SM Higgs boson. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_2c;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a SM Higgs boson. The coloured bands represent the MC statistical uncertainties.

Observed limits at the 95% CL on the branching ratio (B), obtained from the SR_2&mu;^ggF, for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X, for different &gamma;_d masses and a 125 GeV Higgs boson. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the branching ratio (B), obtained from the SR_c+&mu;^ggF, for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X, for different &gamma;_d masses and a 125 GeV Higgs boson. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the branching ratio (B), obtained from the SR_2c^ggF, for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X, for different &gamma;_d masses and a 125 GeV Higgs boson. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section, obtained from the SR_2&mu;^ggF, for the process pp &rarr; H&rarr;&nbsp;2&gamma;_d+X, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section, obtained from the SR_c+&mu;^ggF, for the process pp &rarr; H&rarr;&nbsp;2&gamma;_d+X, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section, obtained from the SR_2c^ggF, for the process pp &rarr; H&rarr;&nbsp;2&gamma;_d+X and ggF selection, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X and ggF selection, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown for the 2&mu; search channel, assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X and ggF selection, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown for the c+&mu; search channel, assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X and ggF selection, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown for the 2c search channel, assuming an FRVZ signal model.