Parton-level normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level normalized $t\bar t$ differential cross-sections for the $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level normalized $t\bar t$ differential cross-sections for the $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The cross-sections in the last bins include events (if any) beyond of the bin edges. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The cross-sections in the last bins include events (if any) beyond of the bin edges. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The cross-sections in the last bins include events (if any) beyond of the bin edges. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are unit-less.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are unit-less.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are pb$^2$.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are pb$^2$.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Results for the DeltaR distribution. Statistical and systematic uncertainties are quoted.

Results for the pT distribution. Statistical and systematic uncertainties are quoted.

Results for the y_B distribution. Statistical and systematic uncertainties are quoted.

$R_{pPb}$ as a function of $p_{T}$ integrated over rapidity range $-1.8<y*<1.3$ for the 0--90% centrality interval for the three geometric models: (a) Glauber, (b) Glauber-Gribov with $\omega_{\sigma}=0.11$ and (c) Glauber-Gribov with $\omega_{\sigma}=0.2$.

$R_{pPb}$ values as a function of $p_{T}$ in the 0--90% centrality interval averaged over $|y*|<0.5$.The $\langle T_{Pb} \rangle$ value for the ATLAS centrality correction is calculated with the Glauber model. The total systematic uncertainties, which include the uncertainty in $\langle T_{Pb} \rangle$, are indicated by lines of the same colour. Strict quantitative agreement is not expected as each measurement uses different rapidity intervals for the centrality determination and apply different event selection criteria to reject diffractive collisions.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $-1.8<y*<1.3$ for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $-1.8<y*<1.3$ for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $-1.8<y*<1.3$ for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{CP}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $|\eta|<2.3$ for seven centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{CP}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $|\eta|<2.3$ for seven centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{CP}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $|\eta|<2.3$ for seven centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

The measured fiducial cross sections are corrected to the dressed level. The ratio of $C_{WZ}^{\textrm{dressed}}/C_{WZ}^{\textrm{Born}}$ factors presented in this table can be used to correct fiducial integrated cross sections from dressed to Born level.

Cross section extrapolated to total phase space and all W and Z boson decays. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the theory uncertainty and the third is the luminosity uncertainty.

The total cross section is measured at dressed level and can also be corrected to Born level use this acceptance correction factor.

Ratio of fiducial cross sections measured for $W^{+} Z$ and $W^{-} Z$ production. The first systematic uncertainty is the combined systematic uncertainty excluding the luminosity uncertainty, the second is the luminosity uncertainty.

Observed and expected upper limits at $95\%$ CL in fb on the fiducial cross section $\sigma^{\mathrm{fid.}}_{W^{\pm} Zjj \textrm{-EW} \rightarrow \ell^{'} \nu \ell \ell}$, multiplied by the $W$ and $Z$ branching ratios in a single leptonic channel with muons or electrons in the VBS fiducial phase space. Values obtained with or without subtraction of the $tZj$ contribution are presented. The $1$ $\sigma$ and $2$ $\sigma$ uncertainty intervals around the expected limits are also indicated.

Observed and expected upper limits at $95\%$ CL in fb on the fiducial cross section $\sigma^{\mathrm{fid.}}_{W^{\pm} Zjj \textrm{-EW} \rightarrow \ell^{'} \nu \ell \ell}$, multiplied by the $W$ and $Z$ branching ratios in a single leptonic channel with muons or electrons in the aQGC fiducial phase space. Values obtained with or without subtraction of the $tZj$ contribution are presented. The $1$ $\sigma$ and $2$ $\sigma$ uncertainty intervals around the expected limits are also indicated.

Expected and observed one-dimensional 95% Confidence Level intervals on the anomalous couplings parameters. Anomalous couplings are introduced as form factors using a cut-off scale $\Lambda_{\mathrm{co}}$.

Expected and observed one-dimensional intervals at 95% Confidence Level on the Effective Field Theory (EFT) parameters.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$.

The electron channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The muon channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

Born-level differential fiducial cross section prediction DSIG/DM at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSYRAP at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSDETA at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 116 GeV < M(EE) < 150 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 150 GeV < M(EE) < 200 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 200 GeV < M(EE) < 300 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 300 GeV < M(EE) < 500 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 500 GeV < M(EE) < 1500 GeV.

The electron channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

Measured cross-section as a function of angular separation between the muon and the closest jet for $500~\text{GeV} < p_T^{\text{leading jet}} < 600~\text{GeV}$. Multiplicative correction factors for using prompt muons and prompt dressing photons in the particle-level selection, derived from ALPGEN 2.14 interfaced with PYTHIA 6.426, are also shown.

Measured cross-section as a function of angular separation between the muon and the closest jet for $p_T^{\text{leading jet}} > 650~\text{GeV}$. Multiplicative correction factors for using prompt muons and prompt dressing photons in the particle-level selection, derived from ALPGEN 2.14 interfaced with PYTHIA 6.426, are also shown.

Expected 95% CL exclusion contour for the Gbb signal.

Observed 95% CL exclusion contour for the Gbb signal.

Expected 95% CL exclusion contour for the Gtt combination.

Observed 95% CL exclusion contour for the Gtt combination.

Acceptances for the Gbb model in SR-Gbb-A. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gbb model in SR-Gbb-B. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gbb model in SR-Gbb-C. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-0L-A. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-0L-B. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-0L-C. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-1L-A. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-1L-B. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptance times efficiency for the Gbb model in SR-Gbb-A.

Acceptance times efficiency for the Gbb model in SR-Gbb-B.

Acceptance times efficiency for the Gbb model in SR-Gbb-C.

Acceptance times efficiency for the Gtt model in SR-Gtt-0L-A.

Acceptance times efficiency for the Gtt model in SR-Gtt-0L-B.

Acceptance times efficiency for the Gtt model in SR-Gtt-0L-C.

Acceptance times efficiency for the Gtt model in SR-Gtt-1L-A.

Acceptance times efficiency for the Gtt model in SR-Gtt-1L-B.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gbb model in SR-Gbb-A.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gbb model in SR-Gbb-B.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gbb model in SR-Gbb-C.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-0L-A.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-0L-B.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-0L-C.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-1L-A.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-1L-B.

Signal region yielding the best expected sensitivity for each point of the parameter space in the Gbb model.

Signal region yielding the best expected sensitivity for each point of the parameter space in the Gtt model for the 0-lepton channel.

Signal region yielding the best expected sensitivity for each point of the parameter space in the Gtt model for the 1-lepton channel.

Combination of two 0-lepton and 1-lepton signal regions yielding the best expected sensitivity for each point of the parameter space in the Gtt model.

Observed and expected background and signal effective mass distributions for SR2jl. For signal, a squark direct decay model with $m(\tilde q)=800$ GeV and $m(\tilde\chi^0_1)=400$ GeV is shown.

Observed and expected background and signal effective mass distributions for SR2jm. For signal, a gluino direct decay model with $m(\tilde g)=750$ GeV and $m(\tilde\chi^0_1)=660$ GeV is shown.

Observed and expected background and signal effective mass distributions for SR2jt. For signal, a squark direct decay model with $m(\tilde q)=1200$ GeV and $m(\tilde\chi^0_1)=0$ GeV is shown.

Observed and expected background and signal effective mass distributions for SR4jt. For signal, a gluino direct decay model with $m(\tilde g)=1400$ GeV and $m(\tilde\chi^0_1)=0$ GeV is shown.

Observed and expected background and signal effective mass distributions for SR5j. For signal, a gluino one-step decay model with $m(\tilde g)=1265$ GeV, $m(\tilde\chi^\pm_1)=945$ GeV and $m(\tilde\chi^0_1)=625$ GeV is shown.

Observed and expected background and signal effective mass distributions for SR6jm. For signal, a gluino one-step decay model with $m(\tilde g)=1265$ GeV, $m(\tilde\chi^\pm_1)=945$ GeV and $m(\tilde\chi^0_1)=625$ GeV is shown.

Observed and expected background and signal effective mass distributions for SR6jt. For signal, a gluino one-step decay model with $m(\tilde g)=1385$ GeV, $m(\tilde\chi^\pm_1)=705$ GeV and $m(\tilde\chi^0_1)=25$ GeV is shown.

Expected limit at 95% CL for squark direct decay model grid.

Expected limits at 95% CL +1 sigma excursion due to experimental and background-only theoretical uncertainties for squark direct decay model grid.

Expected limits at 95% CL -1 sigma excursion due to experimental and background-only theoretical uncertainties for squark direct decay model grid.

Observed limits at 95% CL for squark direct decay model grid.

Observed limits at 95% CL +1 sigma excursion due to the signal cross-section uncertainty for squark direct decay model grid.

Observed limits at 95% CL -1 sigma excursion due to the signal cross-section uncertainty for squark direct decay model grid.

Expected limit at 95% CL for gluino direct decay model grid.

Expected limits at 95% CL +1 sigma excursion due to experimental and background-only theoretical uncertainties for gluino direct decay model grid.

Expected limits at 95% CL -1 sigma excursion due to experimental and background-only theoretical uncertainties for gluino direct decay model grid.

Observed limits at 95% CL for gluino direct decay model grid.

Observed limits at 95% CL +1 sigma excursion due to the signal cross-section uncertainty for gluino direct decay model grid.

Observed limits at 95% CL -1 sigma excursion due to the signal cross-section uncertainty for gluino direct decay model grid.

Expected limit at 95% CL for gluino one-step decay model grid.

Expected limits at 95% CL +1 sigma excursion due to experimental and background-only theoretical uncertainties for gluino one-step decay model grid.

Expected limits at 95% CL -1 sigma excursion due to experimental and background-only theoretical uncertainties for gluino one-step decay model grid.

Observed limits at 95% CL for gluino one-step decay model grid.

Observed limits at 95% CL +1 sigma excursion due to the signal cross-section uncertainty for gluino one-step decay model grid.

Observed limits at 95% CL -1 sigma excursion due to the signal cross-section uncertainty for gluino one-step decay model grid.

Observed and expected background effective mass distributions in control region CRgamma for SR2jl.

Observed and expected background effective mass distributions in validation region VRZ for SR2jl.

Observed and expected background effective mass distributions in control region CRW for SR2jl.

Observed and expected background effective mass distributions in control region CRT for SR2jl.

Observed and expected background effective mass distributions in control region CRgamma for SR2jm.

Observed and expected background effective mass distributions in validation region VRZ for SR2jm.

Observed and expected background effective mass distributions in control region CRW for SR2jm.

Observed and expected background effective mass distributions in control region CRT for SR2jm.

Observed and expected background effective mass distributions in control region CRgamma for SR2jt.

Observed and expected background effective mass distributions in validation region VRZ for SR2jt.

Observed and expected background effective mass distributions in control region CRW for SR2jt.

Observed and expected background effective mass distributions in control region CRT for SR2jt.

Observed and expected background effective mass distributions in control region CRgamma for SR4jt.

Observed and expected background effective mass distributions in validation region VRZ for SR4jt.

Observed and expected background effective mass distributions in control region CRW for SR4jt.

Observed and expected background effective mass distributions in control region CRT for SR4jt.

Observed and expected background effective mass distributions in control region CRgamma for SR5j.

Observed and expected background effective mass distributions in validation region VRZ for SR5j.

Observed and expected background effective mass distributions in control region CRW for SR5j.

Observed and expected background effective mass distributions in control region CRT for SR5j.

Observed and expected background effective mass distributions in control region CRgamma for SR6jm.

Observed and expected background effective mass distributions in validation region VRZ for SR6jm.

Observed and expected background effective mass distributions in control region CRW for SR6jm.

Observed and expected background effective mass distributions in control region CRT for SR6jm.

Observed and expected background effective mass distributions in control region CRgamma for SR6jt.

Observed and expected background effective mass distributions in validation region VRZ for SR6jt.

Observed and expected background effective mass distributions in control region CRW for SR6jt.

Observed and expected background effective mass distributions in control region CRT for SR6jt.

Observed and expected event yields in VRZ as a function of signal region.

Observed and expected event yields in VRW as a function of signal region.

Observed and expected event yields in VRWv as a function of signal region.

Observed and expected event yields in VRT as a function of signal region.

Observed and expected event yields in VRTv as a function of signal region.

Observed and expected event yields in VRQa as a function of signal region.

Observed and expected event yields in VRQb as a function of signal region.

Signal acceptance for SR2jl in squark direct decay model grid.

Signal acceptance times efficiency for SR2jl in squark direct decay model grid.

Signal acceptance for SR2jm in squark direct decay model grid.

Signal acceptance times efficiency for SR2jm in squark direct decay model grid.

Signal acceptance for SR2jt in squark direct decay model grid.

Signal acceptance times efficiency for SR2jt in squark direct decay model grid.

Signal acceptance for SR4jt in squark direct decay model grid.

Signal acceptance times efficiency for SR4jt in squark direct decay model grid.

Signal acceptance for SR5j in squark direct decay model grid.

Signal acceptance times efficiency for SR5j in squark direct decay model grid.

Signal acceptance for SR6jm in squark direct decay model grid.

Signal acceptance times efficiency for SR6jm in squark direct decay model grid.

Signal acceptance for SR6jt in squark direct decay model grid.

Signal acceptance times efficiency for SR6jt in squark direct decay model grid.

Signal acceptance for SR2jl in gluino direct decay model grid.

Signal acceptance times efficiency for SR2jl in gluino direct decay model grid.

Signal acceptance for SR2jm in gluino direct decay model grid.

Signal acceptance times efficiency for SR2jm in gluino direct decay model grid.

Signal acceptance for SR2jt in gluino direct decay model grid.

Signal acceptance times efficiency for SR2jt in gluino direct decay model grid.

Signal acceptance for SR4jt in gluino direct decay model grid.

Signal acceptance times efficiency for SR4jt in gluino direct decay model grid.

Signal acceptance for SR5j in gluino direct decay model grid.

Signal acceptance times efficiency for SR5j in gluino direct decay model grid.

Signal acceptance for SR6jm in gluino direct decay model grid.

Signal acceptance times efficiency for SR6jm in gluino direct decay model grid.

Signal acceptance for SR6jt in gluino direct decay model grid.

Signal acceptance times efficiency for SR6jt in gluino direct decay model grid.

Signal acceptance for SR2jl in gluino one-step decay model grid.

Signal acceptance times efficiency for SR2jl in gluino one-step decay model grid.

Signal acceptance for SR2jm in gluino one-step decay model grid.

Signal acceptance times efficiency for SR2jm in gluino one-step decay model grid.

Signal acceptance for SR2j5 in gluino one-step decay model grid.

Signal acceptance times efficiency for SR2jt in gluino one-step decay model grid.

Signal acceptance for SR4jt in gluino one-step decay model grid.

Signal acceptance times efficiency for SR4jt in gluino one-step decay model grid.

Signal acceptance for SR5j in gluino one-step decay model grid.

Signal acceptance times efficiency for SR5j in gluino one-step decay model grid.

Signal acceptance for SR6jm in gluino one-step decay model grid.

Signal acceptance times efficiency for SR6jm in gluino one-step decay model grid.

Signal acceptance for SR6jt in gluino one-step decay model grid.

Signal acceptance times efficiency for SR6jt in gluino one-step decay model grid.

Comparison of data with estimated backgrounds in the $\tilde{E}_\text{T}^\text{miss}$ distribution with the TZCR1 event selection except for the requirement on $\tilde{E}_\text{T}^\text{miss}$. The variables $\tilde{E}_\text{T}^\text{miss}$ and $\tilde{m}_\text{T}$ are constructed in the same way as $E_\text{T}^\text{miss}$ and $m_\text{T}$ but treating the leading photon transverse momentum as invisible. The predicted backgrounds are scaled with normalization factors. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin includes overflow.

Comparison of data with estimated backgrounds in the $\tilde{m}_\text{T}$ distribution with the TZCR1 event selection except for the requirement on $\tilde{m}_\text{T}$. The variables $\tilde{E}_\text{T}^\text{miss}$ and $\tilde{m}_\text{T}$ are constructed in the same way as $E_\text{T}^\text{miss}$ and $m_\text{T}$ but treating the leading photon transverse momentum as invisible. The predicted backgrounds are scaled with normalization factors. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin includes overflow.

Comparison of the observed data ($n_\text{obs}$) with the predicted background ($n_\text{exp}$) in the validation and signal regions. The background predictions are obtained using the background-only fit configuration. The bottom panel shows the significance of the difference between data and predicted background, where the significance is based on the total uncertainty ($\sigma_\text{tot}$).

Jet multiplicity distributions for events where exactly two signal leptons are selected. No correction factors are included in the background normalizations. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin includes overflow.

Jet multiplicity distributions for events where exactly one lepton plus one $\tau$ candidate are selected. No correction factors are included in the background normalizations. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin includes overflow.

The $E_\text{T}^\text{miss}$ distribution in SR1. In the plot, the full event selection in the corresponding signal region is applied, except for the requirement on $E_\text{T}^\text{miss}$. The predicted backgrounds are scaled with normalization factors. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin contains the overflow. Benchmark signal models are overlaid for comparison. The benchmark models are specified by the gluino and stop masses, given in TeV in the table.

The $m_\text{T}$ distribution in SR1. In the plot, the full event selection in the corresponding signal region is applied, except for the requirement on $m_\text{T}$. The predicted backgrounds are scaled with normalization factors. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin contains the overflow. Benchmark signal models are overlaid for comparison. The benchmark models are specified by the gluino and stop masses, given in TeV in the table.

Expected (black dashed) 95% excluded regions in the plane of $m_{\tilde{g}}$ versus $m_{\tilde{t}_1}$ for gluino-mediated stop production.

Observed (red solid) 95% excluded regions in the plane of $m_{\tilde{g}}$ versus $m_{\tilde{t}_1}$ for gluino-mediated stop production.

Expected (black dashed) 95% excluded regions in the plane of $m_{\tilde{t}_1}$ versus $m_{\tilde{\chi}_1^0}$ for direct stop production.

Observed (red solid) 95% excluded regions in the plane of $m_{\tilde{t}_1}$ versus $m_{\tilde{\chi}_1^0}$ for direct stop production.

The expected upper limits on $T$ quark pair production times the squared branching ratio for $T \rightarrow tZ$ as a function of the $T$ quark mass.

The observed upper limits on $T$ quark pair production times the squared branching ratio for $T \rightarrow tZ$ as a function of the $T$ quark mass.

The expected limits on $T$ quarks as a function of the branching ratios $B\left(T \rightarrow bW\right)$ and $B\left(T \rightarrow tH\right)$ for a $T$ quark with a mass of 800 GeV. The $T$ is assumed to decay in three possible ways: $T \to tZ$, $T \to tH$, and $T \to bW$.

The observed limits on $T$ quarks as a function of the branching ratios $B\left(T \rightarrow bW\right)$ and $B\left(T \rightarrow tH\right)$ for a $T$ quark with a mass of 800 GeV. The $T$ is assumed to decay in three possible ways: $T \to tZ$, $T \to tH$, and $T \to bW$.

The $m_\text{T}$ distribution in the WVR2-tail validation region which has the same preselection and jet $p_\text{T}$ requirements as SR2.

The $am_\text{T2}$ distribution in the WVR2-tail validation region which has the same preselection and jet $p_\text{T}$ requirements as SR2.

Large-radius jet mass ($R=1.2$), decomposed into the number of small-radius jet constituents. The lower panel shows the ratio of the total data to the total prediction (summed over all jet multiplicities). Events are required to have one lepton, four jets with $p_\text{T}>80,50,40,40$ GeV, at least one $b$-tagged jet, $E_\text{T}^\text{miss}>200$ GeV, and $m_\text{T}>30$ GeV.

Distribution of $m_\text{T2}^\tau$ in data for a selection enriched in $t\bar{t}$ events with one hadronically decaying $\tau$. Events that have no hadronic $\tau$ candidate (that passes the Loose identification criteria, as well as other requirements) are not shown in the plot.

Upper limits on the model cross-section in units of pb for the gluino-mediated stop models.

Upper limits on the model cross-section in units of pb for the models with direct stop pair production.

Illustration of the best expected signal region per signal grid point for the gluino-mediated stop models. This mapping is used for the final combined exclusion limits.

Illustration of the best expected signal region per signal grid point for models with direct stop pair production. This mapping is used for the final combined exclusion limits.

Expected $CL_s$ values for the gluino-mediated stop models.

Observed $CL_s$ values for the gluino-mediated stop models.

Expected $CL_s$ values for the direct stop pair production models.

Observed $CL_s$ values for the direct stop pair production models.

Expected limit using SR1 for models with direct stop pair production and an unpolarized stop (and bino LSP).

Expected limit using SR1 for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Expected limit using SR1 for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Observed limit using SR1 for models with direct stop pair production and an unpolarized stop (and bino LSP).

Observed limit using SR1 for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Observed limit using SR1 for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Expected limit using SR2 for models with direct stop pair production and an unpolarized stop (and bino LSP).

Expected limit using SR2 for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Expected limit using SR2 for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Observed limit using SR2 for models with direct stop pair production and an unpolarized stop (and bino LSP).

Observed limit using SR2 for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Observed limit using SR2 for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Expected limit using SR1+SR2 (best expected) for models with direct stop pair production and an unpolarized stop (and bino LSP).

Expected limit using SR1+SR2 (best expected) for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Expected limit using SR1+SR2 (best expected) for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Observed limit using SR1+SR2 (best expected) for models with direct stop pair production and an unpolarized stop (and bino LSP).

Observed limit using SR1+SR2 (best expected) for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Observed limit using SR1+SR2 (best expected) for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Acceptance for SR1 in the gluino-mediated stop models. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Acceptance for SR1 in the direct stop pair production. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Acceptance for SR2 in the gluino-mediated stop models. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Acceptance for SR2 in the direct stop pair production. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Acceptance for SR3 in the gluino-mediated stop models. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Acceptance for SR3 in the direct stop pair production. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Efficiency for SR1 in the gluino-mediated stop models. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Efficiency for SR1 in the direct stop pair production. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Efficiency for SR2 in the gluino-mediated stop models. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Efficiency for SR2 in the direct stop pair production. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Efficiency for SR3 in the gluino-mediated stop models. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Efficiency for SR3 in the direct stop pair production. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).