The measured differential cross-sections and the predictions from the GM-VFNS calculation for the $D_s^\pm$ meson in bins of $p_T$ for $|\eta| < 2.5$. The statistical, systematic (excluding branching ratio) and branching ratio uncertainties are shown separately for data, while the total theory uncertainties are shown for GM-VFNS.

Inclusive $D^\pm$ meson production cross-sections in different fiducial volumes defined by $|\eta|<2.5$ and different $p_T$ regions. For the ATLAS measurements, the statistical, systematic (excluding branching ratio) and branching ratio uncertainties are shown separately; for the theoretical predictions, the total theoretical uncertainties are shown.

Inclusive $D_s^\pm$ meson production cross-sections in different fiducial volumes defined by $|\eta|<2.5$ and different $p_T$ regions. For the ATLAS measurements, the statistical, systematic (excluding branching ratio) and branching ratio uncertainties are shown separately; for the theoretical predictions, the total theoretical uncertainties are shown.

Figure 8(left) of the article. Differential fiducial cross-section of the Z boson $p_T$ in events with $Z \left( \rightarrow \ell\ell \right) + 1 b$-jet. The thin inner band corresponds to the statistical uncertainty of the data, and the outer band to statistical and systematic uncertainties of the data, added in quadrature.

Figure 8(right) of the article. Differential fiducial cross-section of the leading $b$-jet $p_T$ in events with $Z \left( \rightarrow \ell\ell \right) + 1 b$-jet. The thin inner band corresponds to the statistical uncertainty of the data, and the outer band to statistical and systematic uncertainties of the data, added in quadrature.

Figure 9 of the article. Differential fiducial cross-section of the $\Delta R$ between the $Z$ boson and the leading $b$-jet in events with $Z \left( \rightarrow \ell\ell \right) + 1 b$-jet. The thin inner band corresponds to the statistical uncertainty of the data, and the outer band to statistical and systematic uncertainties of the data, added in quadrature.

Figure 10(left) of the article. Differential fiducial cross-section of the $\Delta \phi$ between the leading and sub-leading $b$-jets in events with $Z \left( \rightarrow \ell\ell \right) + 2 b$-jets. The thin inner band corresponds to the statistical uncertainty of the data, and the outer band to statistical and systematic uncertainties of the data, added in quadrature.

Figure 10(right) of the article. Differential fiducial cross-section of the invariant mass of the leading and sub-leading $b$-jets in events with $Z \left( \rightarrow \ell\ell \right) + 2 b$-jets. The thin inner band corresponds to the statistical uncertainty of the data, and the outer band to statistical and systematic uncertainties of the data, added in quadrature.

Figure 11(left) of the article. Differential fiducial cross-section of the Z boson $p_T$ in events with $Z \left( \rightarrow \ell\ell \right) + 1 c$-jet. The thin inner band corresponds to the statistical uncertainty of the data, and the outer band to statistical and systematic uncertainties of the data, added in quadrature.

Figure 11(right) of the article. Differential fiducial cross-section of the leading $c$-jet $p_T$ in events with $Z \left( \rightarrow \ell\ell ight) + 1 c$-jet. The thin inner band corresponds to the statistical uncertainty of the data, and the outer band to statistical and systematic uncertainties of the data, added in quadrature.

Figure 12 of the article. Differential fiducial cross-section of the leading $c$-jet $x_F$ in events with $Z \left( \rightarrow \ell\ell \right) + 1 c$-jet. The thin inner band corresponds to the statistical uncertainty of the data, and the outer band to statistical and systematic uncertainties of the data, added in quadrature.

Correction factors from parton level done with flavour dressing algorithms as seen in Ref. [2] of the paper to hadron level with R 0.3 cone labelling (see Tables 18 & 24) for the differential cross-section of the Z boson $p_T$ in events with $Z (\rightarrow ll) \ge 1 $ b-jets. Systematic errors include Sherpa 2.2.11 and MGaMC+Py8 FxFx uncertainties for what concerns the passage from hadron level flavour dressing to hadron level cone labelling, plus statistical uncertainty of Pythia8 simulations used for parton to hadron corrections. See Table 4.

Correction factors from parton level done with flavour dressing algorithms as seen in Ref. [2] of the paper to hadron level with R 0.3 cone labelling (see Tables 19 & 25) for the differential cross-section of the Z boson $p_T$ in events with $Z (\rightarrow ll) \ge 1 $ c-jets. Systematic errors include Sherpa 2.2.11 and MGaMC+Py8 FxFx uncertainties for what concerns the passage from hadron level flavour dressing to hadron level cone labelling, plus statistical uncertainty of Pythia8 simulations used for parton to hadron corrections. See Table 9.

Correction factors from parton level done with flavour dressing algorithms as seen in Ref. [2] of the paper to hadron level with R 0.3 cone labelling (see Tables 20 & 26) for the differential cross-section of the leading $b$-jet $p_T$ in events with $Z (\rightarrow ll) \ge 1 $ b-jets. Systematic errors include Sherpa 2.2.11 and MGaMC+Py8 FxFx uncertainties for what concerns the passage from hadron level flavour dressing to hadron level cone labelling, plus statistical uncertainty of Pythia8 simulations used for parton to hadron corrections. See Table 5.

Correction factors from parton level done with flavour dressing algorithms as seen in Ref. [2] of the paper to hadron level with R 0.3 cone labelling (see Tables 21 & 27) for the differential cross-section of the leading $c$-jet $p_T$ in events with $Z (\rightarrow ll) \ge 1 $ c-jets. Systematic errors include Sherpa 2.2.11 and MGaMC+Py8 FxFx uncertainties for what concerns the passage from hadron level flavour dressing to hadron level cone labelling, plus statistical uncertainty of Pythia8 simulations used for parton to hadron corrections. See Table 10.

Correction factors from parton level done with flavour dressing algorithms as seen in Ref. [2] of the paper to hadron level with R 0.3 cone labelling (see Tables 22 & 28) for the differential cross-section of the leading $c$-jet $x_F$ in events with $Z (\rightarrow ll) \ge 1 $ c-jets. Systematic errors include Sherpa 2.2.11 and MGaMC+Py8 FxFx uncertainties for what concerns the passage from hadron level flavour dressing to hadron level cone labelling, plus statistical uncertainty of Pythia8 simulations used for parton to hadron corrections. See Table 11.

Correction factors from parton level done with flavour dressing algorithms as seen in Ref. [2] of the paper of the paper to hadron level with R 0.3 cone labelling (see Tables 23 & 29) for the differential cross-section of $\Delta R$ between the $Z$ boson and the leading $b$-jet in events with $Z (\rightarrow ll) \ge 1 $ b-jets. Systematic errors include Sherpa 2.2.11 and MGaMC+Py8 FxFx uncertainties for what concerns the passage from hadron level flavour dressing to hadron level cone labelling, plus statistical uncertainty of Pythia8 simulations used for parton to hadron corrections. See Table 6.

Correction factors from hadron level done with flavour dressing algorithms as seen in Ref. [2] of the paper to hadron level R 0.3 cone labelling for the differential cross-section of the Z boson $p_T$ in events with $Z (\rightarrow ll) \ge 1 $ b-jets. Systematic errors include Sherpa 2.2.11 and MGaMC+Py8 FxFx uncertainties. See Table 12.

Correction factors from hadron level done with flavour dressing algorithms as seen in Ref. [2] of the paper to hadron level with R 0.3 cone labelling for the differential cross-section of the Z boson $p_T$ in events with $Z (\rightarrow ll) \ge 1 $ c-jets. Systematic errors include Sherpa 2.2.11 and MGaMC+Py8 FxFx uncertainties. See Table 13.

Correction factors from hadron level done with flavour dressing algorithms as seen in Ref. [2] of the paper to hadron level with R 0.3 cone labelling for the differential cross-section of the leading $b$-jet $p_T$ in events with $Z (\rightarrow ll) \ge 1 $ b-jets. Systematic errors include Sherpa 2.2.11 and MGaMC+Py8 FxFx uncertainties. See Table 14.

Correction factors from hadron level done with flavour dressing algorithms as seen in Ref. [2] of the paper to hadron level with R 0.3 cone labelling for the differential cross-section of the leading $c$-jet $p_T$ in events with $Z (\rightarrow ll) \ge 1 $ c-jets. Systematic errors include Sherpa 2.2.11 and MGaMC+Py8 FxFx uncertainties. See Table 15.

Correction factors from hadron level done with flavour dressing algorithms as seen in Ref. [2] of the paper to hadron level with R 0.3 cone labelling for the differential cross-section of the leading $c$-jet $x_F$ in events with $Z (\rightarrow ll) \ge 1 $ c-jets. Systematic errors include Sherpa 2.2.11 and MGaMC+Py8 FxFx uncertainties. See Table 16.

Correction factors from hadron level done with flavour dressing algorithms as seen in Ref. [2] of the paper of the paper to hadron level with R 0.3 cone labelling for the differential cross-section of $\Delta R$ between the $Z$ boson and the leading $b$-jet in events with $Z (\rightarrow ll) \ge 1 $ b-jets. Systematic errors include Sherpa 2.2.11 and MGaMC+Py8 FxFx uncertainties. See Table 17.

Correction factors from parton level to hadron level for the differential cross-section of the Z boson $p_T$ in events with $Z (\rightarrow ll) \ge 1 $ b-jets. Systematic errors statistical uncertainty of Pythia8 simulations. See Table 12.

Correction factors from parton level to hadron level for the differential cross-section of the Z boson $p_T$ in events with $Z (\rightarrow ll) \ge 1 $ c-jets. Systematic errors include statistical uncertainty of Pythia8 simulations. See Table 13.

Correction factors from parton level to hadron level for the differential cross-section of the leading $b$-jet $p_T$ in events with $Z (\rightarrow ll) \ge 1 $ b-jets. Systematic errors include statistical uncertainty of Pythia8 simulations. See Table 14.

Correction factors from parton level to hadron level for the differential cross-section of the leading $c$-jet $p_T$ in events with $Z (\rightarrow ll) \ge 1 $ c-jets. Systematic errors include statistical uncertainty of Pythia8 simulations. See Table 15.

Correction factors from parton level to hadron level for the differential cross-section of the leading $c$-jet $x_F$ in events with $Z (\rightarrow ll) \ge 1 $ c-jets. Systematic errors include statistical uncertainty of Pythia8 simulations. See Table 16.

Correction factors from parton level to hadron level for the differential cross-section of $\Delta R$ between the $Z$ boson and the leading $b$-jet in events with $Z (\rightarrow ll) \ge 1 $ b-jets. Systematic errors include statistical uncertainty of Pythia8 simulations. See Table 17.

I_{AA} of Au+Au 0%-15% collisions at sqrt{s_{NN}} = 200 GeV for R = 0.5 of pi^{0}+jet with E_{T,trig}= 11-15 GeV.

Yield Ratio R=0.2/R=0.5 of Au+Au 0%-15% collisions at sqrt{s_{NN}} = 200 GeV of gamma_{dir}+jet with E_{T,trig}= 15-20 GeV.

Yield Ratio R=0.2/R=0.5 of Au+Au 0%-15% collisions at sqrt{s_{NN}} = 200 GeV of pi^{0}+jet with E_{T,trig}= 11-15 GeV.

Yield Ratio R=0.2/R=0.5 of p+p collisions at sqrt{s_{NN}} = 200 GeV of gamma_{dir}+jet with E_{T,trig}= 15-20 GeV.

Yield Ratio R=0.2/R=0.5 of p+p collisions at sqrt{s_{NN}} = 200 GeV of pi^{0}+jet with E_{T,trig}= 11-15 GeV.

Post-fit distribution of the GNN score evaluated with $m_{H/A}$ = 400 GeV in the validation region in the 2LOS region with $\geq 8$ jets. These regions do not enter the fit. The post-fit background prediction is obtained using the post-fit nuisance parameters from the background-only fit in the control and signal regions.

Observed and expected 95% CL upper limits on the cross-section times branching ratio,$ \sigma(pp \rightarrow t\bar{t}H/A ) \times B(H/A \rightarrow t\bar{t})$, as a function of $m_{H/A}$, obtained using the 1L/2LOS final states.

Observed and expected 95% CL lower limits on tanβ as a function of the $m_{H/A}$ mass obtained using the 1L/2LOS final states, assuming a Type-II 2HDM in the alignment limit. Values of tanβ below the observed limit are excluded. The scenario where both the scalar $H$ and pseudo-scalar $A$ contribute with $m_H = m_A$ is shown.

Observed and expected 95% CL lower limits on tanβ as a function of the $m_{H/A}$ mass obtained using the 1L/2LOS final states, assuming a Type-II 2HDM in the alignment limit. Values of tanβ below the observed limit are excluded. The scenario with the contribution from scalar $H$ only is shown.

Observed and expected 95% CL lower limits on tanβ as a function of the $m_{H/A}$ mass obtained using the 1L/2LOS final states, assuming a Type-II 2HDM in the alignment limit. Values of tanβ below the observed limit are excluded. The scenario with the contribution from pseudo-scalar $A$ only is shown.

Expected and observed 95% CL upper limits on the cross-section times branching ratio,$ \sigma(pp \rightarrow t\bar{t}H/A ) \times B(H/A \rightarrow t\bar{t})$, as a function of $m_{H/A}$, obtained from the combination of the 1L/2LOS and 2LSS/ML final states.

Expected and observed 95% CL lower limits on tanβ as a function of the $m_{H/A}$ mass obtained using the 1L/2LOS and 2LSS/ML final states, assuming a Type-II 2HDM in the alignment limit. Values of tanβ below the observed limit are excluded. The scenario where both the scalar $H$ and pseudo-scalar $A$ contribute with $m_H = m_A$ is shown.

Expected and observed 95% CL lower limits on tanβ as a function of the $m_{H/A}$ mass obtained using the 1L/2LOS and 2LSS/ML final states, assuming a Type-II 2HDM in the alignment limit. Values of tanβ below the observed limit are excluded. The scenario with the contribution from scalar $H$ only is shown.

Expected and observed 95% CL lower limits on tanβ as a function of the $m_{H/A}$ mass obtained using the 1L/2LOS and 2LSS/ML final states, assuming a Type-II 2HDM in the alignment limit. Values of tanβ below the observed limit are excluded. The scenario with the contribution from pseudo-scalar $A$ only is shown.

Expected and Observed 95% CL upper limits on the $ \sigma(pp \rightarrow t\bar{t})\times B(S_8\rightarrow t\bar{t})$ production cross-section as a function of $m_{S_8}$, obtained from the combination of the 1L/2LOS and 2LSS/ML final states. The expected limits from the individual 1L/2LOS and 2LSS/ML analyses are also shown.

Post-fit distribution of the GNN scores evaluated with $m_{H/A}$ = 700 GeV in the 1L region with $\geq 10$ jets and four $b$-tagged jets. The fit is performed under the background-only hypothesis.

Post-fit distribution of the GNN scores evaluated with $m_{H/A}$ = 700 GeV in the 2LOS region with $\geq 8$ jets and $\geq 4$ $b$-tagged jets. The fit is performed under the background-only hypothesis.

Post-fit distribution of the GNN scores evaluated with $m_{H/A}=$1000 GeV,in the 1L region with $\geq 10$ jets four $b$-tagged jets. The fit is performed under the background-only hypothesis.

Post-fit distribution of the GNN scores evaluated with $m_{H/A}=$1000 GeV in the 2LOS region with $\geq 8$ jets and $\geq 4$ $b$-tagged jets. The fit is performed under the background-only hypothesis.

Post-fit distribution of the most important global features used in the GNN training, Sum of the pcb scores of the six jets with the highest scores ($\sum_{i\in[1,6]}\mathrm{pcb}_i$), in the region where the training is performed, i.e., the region with $\geq 9$ jets and $\geq3$ $b$-tagged jets in the 1L channel. The fit is performed under the background-only hypothesis using the GNN scores evaluated with $m_{H/A} = 400$ GeV.

Post-fit distribution of the most important global features used in the GNN training, Sum of the pcb scores of the six jets with the highest scores ($\sum_{i\in[1,6]}\mathrm{pcb}_i$), in the region where the training is performed i.e.the region with $\geq 7$ jets and $\geq3$ $b$-tagged jets in the 2LOS channel. The fit is performed under the background-only hypothesis using the GNN scores evaluated with $m_{H/A} = 400$ GeV.

Post-fit distribution of the most important global features used in the GNN training, $p_{\mathrm{T}}$ sum of all reconstructed leptons and jets ($\mathrm{H}_{\mathrm{T}}^{\mathrm{all}}$), in the region where the training is performed, i.e., the region with $\geq 9$ jets and $\geq3$ $b$-tagged jets in the 1L channel. The fit is performed under the background-only hypothesis using the GNN scores evaluated with $m_{H/A} = 400$ GeV.

Post-fit distribution of the most important global features used in the GNN training, $p_{\mathrm{T}}$ sum of all reconstructed leptons and jets ($\mathrm{H}_{\mathrm{T}}^{\mathrm{all}}$), in the region where the training is performed, i.e. the region with $\geq 7$ jets and $\geq3$ $b$-tagged jets in the 2LOS channel. The fit is performed under the background-only hypothesis using the GNN scores evaluated with $m_{H/A} = 400$ GeV.

Post-fit distribution of the most important global features used in the GNN training, Number of jets, in the region where the training is performed, i.e., the region with $\geq 9$ jets and $\geq3$ $b$-tagged jets in the 1L channel. The fit is performed under the background-only hypothesis using the GNN scores evaluated with $m_{H/A} = 400$ GeV.

Post-fit distribution of the most important global features used in the GNN training, Number of jets, in the region where the training is performed, i.e., the region with $\geq 7$ jets and $\geq3$ $b$-tagged jets in the 2LOS channel. The fit is performed under the background-only hypothesis using the GNN scores evaluated with $m_{H/A} = 400$ GeV.

The observed EFT limits at 95% CL, shown for the linear+quadratic electron, muon, and combined fits.

The expected EFT limits at 95% CL, shown for the linear-only electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.

The expected EFT limits at 95% CL, shown for the linear+quadratic electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.

The observed EFT limits at 95% CL, shown for the linear-only electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.

The observed EFT limits at 95% CL, shown for the linear+quadratic electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.

Born-level single-differential cross section $\frac{d\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross section $\frac{d\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross section $\frac{d\sigma (W\to e\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross-section $\frac{d\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross-section $\frac{d\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross-section $\frac{d\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^+$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^-$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^+$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^-$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Ratio of the $e^\pm$- and $\mu^\pm$-channel single-differential cross sections including the absolute data statistical, $e$-$\mu$-uncorrelated (including signal and background statistical) and $e$-$\mu$-correlated systematic uncertainties and the total uncertainty.

Ratio of the $e^\pm$- and $\mu^\pm$-channel double-differential cross sections including the absolute data statistical, $e$-$\mu$-uncorrelated (including signal and background statistical) and $e$-$\mu$-correlated systematic uncertainties and the total uncertainty.

Asymmetry of the $\ell^+$- and $\ell^-$-channel single-differential cross-sections including the absolute total statistical and $\ell^+$-$\ell^-$-correlated systematic uncertainties and the total uncertainty.

Asymmetry of the $\ell^+$- and $\ell^-$-channel double-differential cross sections including the absolute total statistical and $\ell^+$-$\ell^-$-correlated systematic uncertainties and the total uncertainty.

The contour for the excluded mass--lifetime region for stau pair production obtained with the di-track search. All masses and lifetimes shown that are below the curve and above 200 GeV are excluded by the observed data (while the expected exclusion is between the upper curve down to 210 GeV for lifetimes above 3000 ns). The sensitivity extends indefinitely to longer lifetimes.

The contour for the excluded mass--lifetime region for stau pair production obtained with the di-track search. All masses and lifetimes shown that are below the curve and above 200 GeV are excluded by the observed data (while the expected exclusion is between the upper curve down to 210 GeV for lifetimes above 3000 ns). The sensitivity extends indefinitely to longer lifetimes.

The contour for the excluded mass--lifetime region for stau pair production obtained with the di-track search. All masses and lifetimes shown that are below the curve and above 200 GeV are excluded by the observed data (while the expected exclusion is between the upper curve down to 210 GeV for lifetimes above 3000 ns). The sensitivity extends indefinitely to longer lifetimes.

The distribution of data and predicted background in the di-track Exclusion-SR. The observed data events are indicated as magenta circles if they are inside the mass-compatibility angle (shown as grey lines) and as orange diamonds if they are outside, while the blue area is the mass distribution of the expected background. The last bins include overflow events

The distribution of data and predicted background in the di-track Exclusion-SR. The observed data events are indicated as magenta circles if they are inside the mass-compatibility angle (shown as grey lines) and as orange diamonds if they are outside, while the blue area is the mass distribution of the expected background. The last bins include overflow events

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

$A_{LL}$ as a function of parton-level invariant mass for dijets with the East barrel-endcap.

$A_{LL}$ as a function of parton-level invariant mass for dijets with the West barrel-endcap.

$A_{LL}$ as a function of parton-level invariant mass for dijets with the endcap-endcap.

The observed and expected ($\pm2\sigma$) upper limits at 95% CL on the branching ratio for $H\rightarrow aa\rightarrow \gamma\gamma\tau\tau$ as a function of the resonance mass hypothesis $m_{a}$.

The polynomial parameterisation of the total signal selection efficiency as a function of $m_{a}$, defined as the fraction of the reconstructed and selected events out of the total number of events in the signal simulated samples.

Observed (points with error bars) and expected background (solid histograms) distributions for $E_{T}^{miss}$ in the signal region (a) SRL, (b) SRM and (c) SRH after the background-only fit applied to the CRs. The predicted signal distributions for the two models with a gluino mass of 2000 GeV and neutralino mass of 250 GeV (SRL), 1050 GeV (SRM) or 1950 GeV (SRH) are also shown for comparison. The uncertainties in the SM background are only statistical.

Observed and expected exclusion limit in the gluino-neutralino mass plane at 95% CL combined using the signal region with the best expected sensitivity at each point, for the full Run-2 dataset corresponding to an integrated luminosity of $139~\mathrm{fb}^{-1}$, for $\gamma/Z$ (a) and $\gamma/h$ (b) signal models. The black solid line corresponds to the expected limits at 95% CL, with the light (yellow) bands indicating the 1$\sigma$ exclusions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves, the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties. For each point in the higgsino-bino parameter space, the labels indicate the best-expected signal region, where L, M and H mean SRL, SRM and SRH, respectively.

Observed and expected exclusion limit in the gluino-neutralino mass plane at 95% CL combined using the signal region with the best expected sensitivity at each point, for the full Run-2 dataset corresponding to an integrated luminosity of $139~\mathrm{fb}^{-1}$, for $\gamma/Z$ (a) and $\gamma/h$ (b) signal models. The black solid line corresponds to the expected limits at 95% CL, with the light (yellow) bands indicating the 1$\sigma$ exclusions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves, the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties. For each point in the higgsino-bino parameter space, the labels indicate the best-expected signal region, where L, M and H mean SRL, SRM and SRH, respectively.

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Cutflow for the SRL selection, for two relevant signal points for both $\gamma/Z$ and $\gamma/h$ models, where the gluinos have mass of 2000 GeV and the neutralinos have a mass of 250 GeV (10000 generated events). The numbers are normalized to a luminosity of 139 $fb^{-1}$.

Cutflow for the SRM selection, for two relevant signal points for both $\gamma/Z$ and $\gamma/h$ models, where the gluinos have mass of 2000 GeV and the neutralinos have a mass of 1050 GeV (10000 generated events). The numbers are normalized to a luminosity of 139 $fb^{-1}$.

Cutflow for the SRH selection, for two relevant signal points for both $\gamma/Z$ and $\gamma/h$ models, where the gluinos have mass of 2000 GeV and the neutralinos have a mass of 1950 GeV (10000 generated events). The numbers are normalized to a luminosity of 139 $fb^{-1}$.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.