Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} + p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} + p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \Delta R (l,l)$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \Delta R (l,l)$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ N_{jets}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ N_{jets}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet1}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet1}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet2}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet2}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet2}/p_{T}^{Jet1}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet2}/p_{T}^{Jet1}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ m_{jj}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ m_{jj}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ m_{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ m_{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ H_{T}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ H_{T}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{\gamma} / \sqrt{H_{T}}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{\gamma} / \sqrt{H_{T}}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \Delta \phi (Jet,\gamma)$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \Delta \phi (Jet,\gamma)$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \phi_{CS}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \phi_{CS}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \cos \theta_{CS}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \cos \theta_{CS}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{\gamma} / \sqrt{H_{T}}$ (Fig. 8 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{\gamma} / \sqrt{H_{T}}$ (Fig. 8 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ H_{T}$ (Fig. 8 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ H_{T}$ (Fig. 8 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \Delta \phi (Jet,\gamma)$ (Fig. 8 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \Delta \phi (Jet,\gamma)$ (Fig. 8 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \Delta R (l,l)$ (Fig. 5 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \Delta R (l,l)$ (Fig. 5 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma}$ (Fig. 5 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma}$ (Fig. 5 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } p_{T}^{ll} + p_{T}^{\gamma} < 200 GeV$ (Fig. 11 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } p_{T}^{ll} + p_{T}^{\gamma} < 200 GeV$ (Fig. 11 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } 200 GeV < p_{T}^{ll} + p_{T}^{\gamma} < 300 GeV$ (Fig. 11 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } 200 GeV < p_{T}^{ll} + p_{T}^{\gamma} < 300 GeV$ (Fig. 11 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } p_{T}^{ll} + p_{T}^{\gamma} > 300 GeV$ (Fig. 11 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } p_{T}^{ll} + p_{T}^{\gamma} > 300 GeV$ (Fig. 11 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ m_{jj}$ (Fig. 7 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ m_{jj}$ (Fig. 7 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ m_{ll\gamma j}$ (Fig. 7 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ m_{ll\gamma j}$ (Fig. 7 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ N_{jets}$ (Fig. 6 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ N_{jets}$ (Fig. 6 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet1}$ (Fig. 6 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet1}$ (Fig. 6 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet2}$ (Fig. 6 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet2}$ (Fig. 6 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet2}/p_{T}^{Jet1}$ (Fig. 6 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet2}/p_{T}^{Jet1}$ (Fig. 6 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll}$ (Fig. 5 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll}$ (Fig. 5 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j}$ (Fig. 8 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j}$ (Fig. 8 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } p_{T}^{ll\gamma} < 50 GeV$ (Fig. 12 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } p_{T}^{ll\gamma} < 50 GeV$ (Fig. 12 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } 50 GeV < p_{T}^{ll\gamma} < 75 GeV$ (Fig. 12 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } 50 GeV < p_{T}^{ll\gamma} < 75 GeV$ (Fig. 12 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } p_{T}^{ll\gamma} > 75 GeV$ (Fig. 12 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } p_{T}^{ll\gamma} > 75 GeV$ (Fig. 12 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } 125 GeV < m_{ll\gamma} < 200 GeV$ (Fig. 10 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } 125 GeV < m_{ll\gamma} < 200 GeV$ (Fig. 10 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } 200 GeV < m_{ll\gamma} < 300 GeV$ (Fig. 10 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } 200 GeV < m_{ll\gamma} < 300 GeV$ (Fig. 10 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } m_{ll\gamma} > 300 GeV$ (Fig. 10 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } m_{ll\gamma} > 300 GeV$ (Fig. 10 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} + p_{T}^{\gamma}$ (Fig. 5 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} + p_{T}^{\gamma}$ (Fig. 5 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \cos \theta_{CS}$ (Fig. 9 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \cos \theta_{CS}$ (Fig. 9 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \phi_{CS}$ (Fig. 9 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \phi_{CS}$ (Fig. 9 (a))

The observed and expected 95% CL upper limits on the minimal coupling vector LQ pair production cross-sections assuming B = 1 as a function of m$_\text{LQ}$.

The observed and expected 95% CL upper limits on the Yang-Mills coupling vector LQ pair production cross-sections assuming B = 1 as a function of m$_\text{LQ}$.

The observed and expected 95% CL upper limits on the branching ratio into charged leptons as a function of m$_\text{LQ}$ for the scalar LQ.

The observed and expected 95% CL upper limits on the branching ratio into charged leptons as a function of m$_\text{LQ}$ for the vector LQ minimal coupling scenario.

The observed and expected 95% CL upper limits on the branching ratio into charged leptons as a function of m$_\text{LQ}$ for the vector LQ Yang-Mills coupling scenario.

Summary of results for cross-section of non-prompt $\psi(2S)$ decaying to a muon pair for 13 TeV data in fb/GeV. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt fraction of $J/\psi$ decaying to a muon pair as a percentage for 13 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt fraction of $\psi(2S)$ decaying to a muon pair as a percentage for 13 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for prompt $\psi(2S)$ over $J/\psi$ ratio as a percentage for 13 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt $\psi(2S)$ over $J/\psi$ ratio as a percentage for 13 TeV data. Uncertainties are statistical and systematic, respectively.

Correction factors for an assumed angular dependence $\propto 1+\lambda_{\theta} \cos^2\theta $ in the helicity frame, for several values of the parameter $\lambda_{\theta}$. The correction factors were found to be the same (within 1% - 2%) for $J\psi$ and $\psi(2S)$ mesons, for prompt and non-prompt production mechanisms, and for the three rapidity intervals considered in this paper.

Data selection efficiency as a function of nuclear recoil energy

Data points used in analysis in log_10(S2)-S1 space

Signal region detector-level distribution for the observable $p_{\mathrm{T}}^{\mathrm{lead}\, \ell}$.

Signal region detector-level distribution for the observable $m_{e\mu}$.

Signal region detector-level distribution for the observable $p_{\mathrm{T}}^{e\mu}$.

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|y_{e\mu}|$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|y_{e\mu}|$

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|\Delta \phi(e \mu)|$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|\Delta \phi(e \mu)|$

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $ \cos\theta^{\ast}$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $ \cos\theta^{\ast}$

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{\mathrm{lead}\, \ell}$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{\mathrm{lead}\, \ell}$

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $m_{e\mu}$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $m_{e\mu}$

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{e\mu}$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{e\mu}$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|y_{e\mu}|$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|y_{e\mu}|$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|\Delta \phi(e \mu)|$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|\Delta \phi(e \mu)|$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $ \cos\theta^{\ast}$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $ \cos\theta^{\ast}$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{\mathrm{lead}\, \ell}$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{\mathrm{lead}\, \ell}$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $m_{e\mu}$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $m_{e\mu}$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{e\mu}$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{e\mu}$

Probability of finding at least one TAR jet, where the p_T-leading TAR jet passes the m_Wcand and D₂^&beta;=1 requirements, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=2100 GeV, with the preselections applied.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=500 GeV, with the preselections applied that do not pass the requirements of the merged category.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=1000 GeV, with the preselections applied that do not pass the requirements of the merged category.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=1700 GeV, with the preselections applied that do not pass the requirements of the merged category.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=2100 GeV, with the preselections applied that do not pass the requirements of the merged category.

Observed exclusion contour at 95&#37; C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_&chi;=1, m_&chi;=200 GeV, and sin&theta;=0.01.

Expected exclusion contour at 95&#37; C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_&chi;=1, m_&chi;=200 GeV, and sin&theta;=0.01.

Expected+1&sigma; exclusion contour at 95&#37; C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_&chi;=1, m_&chi;=200 GeV, and sin&theta;=0.01.

Expected-1&sigma; exclusion contour at 95&#37; C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_&chi;=1, m_&chi;=200 GeV, and sin&theta;=0.01.

Expected+2&sigma; exclusion contour at 95&#37; C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_&chi;=1, m_&chi;=200 GeV, and sin&theta;=0.01.

Expected-2&sigma; exclusion contour at 95&#37; C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_&chi;=1, m_&chi;=200 GeV, and sin&theta;=0.01.

Observed upper limits at 95&#37; C.L. on &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) for m_Z'=0.5 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) process for m_Z'=0.5 TeV, shown in dashed blue.

Observed upper limits at 95&#37; C.L. on &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) for m_Z'=1 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) process for m_Z'=1 TeV, shown in dashed blue.

Observed upper limits at 95&#37; C.L. on &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) for m_Z'=1.7 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) process for m_Z'=1.7 TeV, shown in dashed blue.

Observed upper limits at 95&#37; C.L. on &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) for m_Z'=2.1 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) process for m_Z'=2.1 TeV, shown in dashed blue.

Data overlaid on SM background yields stacked in each SR and CR category after the fit to data ('Post-fit'). The yields in the SR are broken down into their contributions to the individual bins. The maximum-likelihood estimators are set to the conditional values of the CR-only fit, and propagated to SR and CRs.

Dominant sources of uncertainty for three dark Higgs scenarios after the fit to data. The uncertainties are quantified in terms of their contribution to the fitted signal uncertainty that is expressed relative to the theory prediction. Three representative dark Higgs signal scenarios with g_q=0.25, g_&chi;=1.0, sin&theta;=0.01 and m_&chi;=200 GeV are considered, which are indicated using the (m_Z', m_s) format in units of GeV in the table columns.

Cumulative efficiencies in the merged category for three representative dark Higgs signal scenarios with g_q=0.25, g_&chi;=1.0, sin&theta;=0.01, m_Z' = 1 TeV, and m_&chi;=200 GeV considering s&rarr;W(&ell;&nu;)W(qq) decays only.

Cumulative efficiencies in the resolved category for three representative dark Higgs signal scenarios with g_q=0.25, g_&chi;=1.0, sin&theta;=0.01, m_Z' = 1 TeV, and m_&chi;=200 GeV considering s&rarr;W(&ell;&nu;)W(qq) decays only.

Theoretical cross section for &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) for each of the dark Higgs signal points at m_Z′ ={300, 350, 400, 500, 750} GeV, with g_q = 0.25, g<sub>&chi; = 1.0, sin&theta; = 0.01, m_Z′ = 1 TeV , and m_&chi; = 200 GeV. Also shown are experimentally excluded cross sections of &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) (Obs.) together with the expectations (Exp.) varied up and down by one standard deviation (&plusmn;1&sigma;).

Theoretical cross section for &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) for each of the dark Higgs signal points at m_Z′ ={1000, 1700} GeV, with g_q = 0.25, g<sub>&chi; = 1.0, sin&theta; = 0.01, m_Z′ = 1 TeV , and m_&chi; = 200 GeV. Also shown are experimentally excluded cross sections of &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) (Obs.) together with the expectations (Exp.) varied up and down by one standard deviation (&plusmn;1&sigma;).

Theoretical cross section for &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) for each of the dark Higgs signal points at m_Z′ ={2100, 2500, 2900, 3300} GeV, with g_q = 0.25, g<sub>&chi; = 1.0, sin&theta; = 0.01, m_Z′ = 1 TeV , and m_&chi; = 200 GeV. Also shown are experimentally excluded cross sections of &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) (Obs.) together with the expectations (Exp.) varied up and down by one standard deviation (&plusmn;1&sigma;).

Expected 95% CL exclusion contours in the $(m(W_{R}), m(N_{R}))$ plane in the muon channel for boosted.

Observed 95% CL exclusion contours for the assumption of Dirac type in the $(m(W_{R}), m(N_{R}))$ plane in the electron channel for boosted.

Expected 95% CL exclusion contours for the assumption of Dirac type in the $(m(W_{R}), m(N_{R}))$ plane in the electron channel for boosted.

Observed 95% CL exclusion contours for the assumpition of Dirac type in the $(m(W_{R}), m(N_{R}))$ plane in the muon channel for boosted.

Expected 95% CL exclusion contours for the assumption of Dirac type in the $(m(W_{R}), m(N_{R}))$ plane in the muon channel for boosted.

Observed 95% CL exclusion contours for the assumption of Majorana type in the $(m(W_{R}), m(N_{R}))$ plane in the electron channel for resolved.

Expected 95% CL exclusion contours for the assumption of Majorana type in the $(m(W_{R}), m(N_{R}))$ plane in the electron channel for resolved.

Observed 95% CL exclusion contours for the assumption of Majorana type in the $(m(W_{R}), m(N_{R}))$ plane in the muon channel for resolved.

Expected 95% CL exclusion contours for the assumption of Majorana type in the $(m(W_{R}), m(N_{R}))$ plane in the muon channel for resolved.

Observed 95% CL exclusion contours for the assumption of Dirac type in the $(m(W_{R}), m(N_{R}))$ plane in the electron channel for resolved.

Expected 95% CL exclusion contours for the assumption of Dirac type in the $(m(W_{R}), m(N_{R}))$ plane in the electron channel for resolved.

Observed 95% CL exclusion contours for the assumption of Dirac type in the $(m(W_{R}), m(N_{R}))$ plane in the muon channel for resolved.

Expected 95% CL exclusion contours for the assumption of Dirac type in the $(m(W_{R}), m(N_{R}))$ plane in the muon channel for resolved.

The $m_{eJ}$ distribution in the boosted one electron channel.

The $m_{eeJ}$ distribution in the boosted two electron channel.

The $m_{\mu\mu J}$ distribution in the boosted two muon channel.

The $m_{jj}$ distribution in the resolved electron channel.

The $m_{jj}$ distribution in the resolved muon channel.

The $m_{eejj}$ distribution in the resolved electron channel.

The $m_{\mu\mu jj}$ distribution in the resolved muon channel.

The $h_{T}$ distribution in the resolved electron channel.

The $h_{T}$ distribution in the resolved muon channel.

Acceptance $\times$ efficiency for bSR1e.

Acceptance $\times$ efficiency for bSR2e.

Acceptance $\times$ efficiency for bSR2mu.

Acceptance $\times$ efficiency for rSROS2e.

Acceptance $\times$ efficiency for rSROS2mu.

Acceptance $\times$ efficiency for rSRSS2e.

Acceptance $\times$ efficiency for rSRSS2mu.

Expected and observed 95% CL upper limits for $\sigma(pp\to W_{R})\times B(W_{R}\to eeqq)$ as a function of $m(W_{R})$ for the special case of $m(W_{R}) = 2\times m(N_{R})$. The theoretical cross section corresponds to either the Dirac or Majorana neutrino interpretation by ignoring the charge of the leptons.

Expected and observed 95% CL upper limits for $\sigma(pp\to W_{R})\times B(W_{R} \to \mu\mu qq)$ as a function of $m(W_{R})$ for the special case of $m(W_{R}) = 2\times m(N_{R})$. The theoretical cross section corresponds to either the Dirac or Majorana neutrino interpretation by ignoring the charge of the leptons.

Expected and observed 95% CL upper limits for $\sigma(pp\to W_{R})\times B(W_{R} \to eeqq)$ as a function of $m(W_{R})$ for the special case of $m(N_{R})=200$ GeV. The theoretical cross section corresponds to either the Dirac or Majorana neutrino interpretation by ignoring the charge of the leptons.

Expected and observed 95% CL upper limits for $\sigma(pp\to W_{R})\times B(W_{R} \to \mu \mu qq)$ as a function of $m(W_{R})$ for the special case of $m(N_{R})=200$ GeV. The theoretical cross section corresponds to either the Dirac or Majorana neutrino interpretation by ignoring the charge of the leptons.

Expected and observed 95% CL upper limits for $\sigma(pp \to W_{R}) \times B(W_{R} \to eeqq)$ as a function of $m(W_{R})$ for the Majorana neutrino interpretations for the special case of $m(W_{R}) = 2\times m(N_{R})$.

Expected and observed 95% CL upper limits for $\sigma(pp \to W_{R}) \times B(W_{R} \to \mu\mu qq)$ as a function of $m(W_{R})$ for the Majorana neutrino interpretations for the special case of $m(W_{R}) = 2 \times m(N_{R})$.

Expected and observed 95% CL upper limits for $\sigma(pp \to W_{R}) \times B(W_{R} \to eeqq)$ as a function of $m(W_{R})$ for the Dirac neutrino interpretations for the special case of $m(W_{R}) = 2 \times m(N_{R})$.

Expected and observed 95% CL upper limits for $\sigma(pp \to W_{R}) \times B(W_{R} \to \mu \mu qq)$ as a function of $m(W_{R})$ for the Dirac neutrino interpretations for the special case of $m(W_{R}) = 2 \times m(N_{R})$.

HFE (electrons from semileptonic decays of heavy-flavor hadrons) invariant yields in different centrality intervals of Au+Au collisions at $\sqrt{s_{\rm NN}}=200$ GeV. The vertical bars and the boxes represent statistical and systematic uncertainties, respectively. The horizontal bars indicate the bin width.

HFE (electrons from semileptonic decays of heavy-flavor hadrons) $R_{\rm AA}$ (red circles) as a function of $p_{\rm T}$ in different centrality intervals of Au+Au collisions at $\sqrt{s_{\rm NN}}=200$ GeV, compared with STAR (yellow stars) and PHENIX (green squares) published results, and Duke ((modified Langevin transport model, blue line) and PHSD (parton-hadron-string dynamics model, orange line) model calculations. Vertical bars and boxes around data points represent combined statistical and systematic uncertainties from both Au+Au and $p$+$p$ measurements, respectively. Boxes at unity show the global uncertainties, which for this analysis include the 8% global uncertainty on $p$+$p$ reference and the $N_{\rm coll}$ uncertainties. The left box is for PHENIX and the right one for STAR.

HFE (electrons from semileptonic decays of heavy-flavor hadrons) $R_{\rm AA}$ (red circles) as a function of $N_{\rm part}$ in Au+Au collisions at $\sqrt{s_{\rm NN}}=200$ GeV, compared with PHENIX measurements (green squares), and Duke (blue line) and PHSD (orange line) model calculations. Vertical bars and boxes around data points represent statistical and systematic uncertainties from Au+Au measurements, respectively. The gray band represents the $N_{\rm coll}$ uncertainties. The boxes at unity show the global uncertainties including the total uncertainties of the $p$+$p$ reference.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the signal region, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $W$+jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Expected distributions of the MEM discriminant $P(S|X)$ in the SR, for the s-channel single-top signal, and for the $t\bar{t}$ and $W$+jets backgrounds, for MEM discriminant values larger than $2.0\times10^{-4}$. Each distribution is normalised to unity. The binning is the same as the optimised binning used in the signal extraction fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $W$+jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 3-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 4-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty bands indicate the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR before the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore not included. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$, after subtraction of all backgrounds. The fitted distribution for the simulation of the signal is shown together with the post-fit uncertainty in the backgrounds. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Pre-fit and post-fit event yields in the SR, for MEM discriminant values larger than $2.0\times10^{-4}$. The central value of the event yield for each process is calculated by summing the values of the discriminant bin contents, using the nominal expected yield for the pre-fit value, and the best-fit estimate for the post-fit value. The error includes statistical and systematic uncertainties summed in quadrature. All sources of systematic uncertainties are included, taking into account correlations and anti-correlations in the post-fit case. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore only included in the post-fit uncertainties.

Observed impact of the different sources of uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. The 'Systematic uncertainties' category combines all sources of systematic uncertainties. The statistical uncertainty is obtained by repeating the fit after having fixed all nuisance parameters, including the $t\bar{t}$ and $W$+jets normalisation factors. 'Total' gives the total uncertainty on the measurement.

Observed impact of the different sources of $t\bar{t}$ modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and 'ME/PS matching' to the matching of the ME to the parton shower.

Observed impact of the different sources of s-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of t-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of $tW$ modelling uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and '$t\bar{t}$ overlap' to the algorithm removing the overlap between $tW$ and $t\bar{t}$ production at NLO, as described in Section 7 in the paper.

Observed impact of the different sources of PDF uncertainties on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the ${E}_{T}^{miss}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the $m_{T}^{W}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Nuisance parameters ranked according to their post-fit impacts on the best-fit value of the ratio $\mu$ of the measured cross-section to the predicted cross-section. In the figure, only the 20 nuisance parameters with the largest post-fit impacts are shown. The empty (solid) blue rectangles illustrate the pre-fit (post-fit) impact on $\mu$, corresponding to the upper axis. The pre-fit (post-fit) impact of each nuisance parameter, $\Delta\mu$, is calculated as the difference in the fitted value of $\mu$ between the nominal fit and the fit when fixing the corresponding nuisance parameter to $\hat{\theta}\pm\Delta\theta$ ($\hat{\theta}\pm\Delta\hat{\theta}$), where $\hat{\theta}$ is the best-fit value of the nuisance parameter and $\Delta\theta$ ($\Delta\hat{\theta}$) is its pre-fit (post-fit) uncertainty. Several systematic uncertainties are split into different nuisance parameters, which are indicated by NP. JES (JER) indicates jet energy scale (resolution), and $\gamma$ indicates a nuisance parameter associated to the MC statistics in one of the 18 bins numbered from 0 to 17. The black points show the best-fit values of the nuisance parameters, with the error bars representing the post-fit uncertainties. Each nuisance parameter is shown wrt. its nominal value, $\theta_0$, and in units of its pre-fit uncertainty, except the free-floating normalisation factors of the $t\bar{t}$ and $W$+jets backgrounds, and the parameters associated to the MC statistics in each bin, for which the post-fit values and uncertainties are shown.

Correlation matrix of the nuisance parameters and of the ratio $\mu$ of the measured cross-section to the predicted cross-section. The correlations are given after the fit to data. In the figure, only the parameters which have a correlation of at least 0.2 with any other parameter are shown.

Distribution of the MEM discriminant $P(S|X)$ in the SR for MEM discriminant values larger than $2.0\times10^{-4}$, for the collision data used for the measurement, and for 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Measured values of the signal cross-section and of the $t\bar{t}$ and $W$+jets normalisation factors, obtained by statistical-only fits to the collision data used for the measurement, and to 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The central values and their statistical uncertainties are obtained by repeating the fit after having fixed all nuisance parameters, except the $t\bar{t}$ and $W$+jets normalisation factors, which are let free-floating (unlike for the statistical uncertainty on the cross-section quoted in the paper). The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.