Detailed list of the contribution of each source of uncertainty to the total uncertainty on the measured values of $\sigma(tq)$, $\sigma(\bar{t}q)$, $R_t$, and $\sigma(tq+\bar{t}q)$. The evaluation of the systematic uncertainties has a statistical uncertainty of $0.3\,\%$. Uncertainties contributing less than $1.0\,\%$ are marked with "$<1$" in the paper. To provide numerical values for this table in HEPdata, these uncertainties are approximated with $\pm 0.5\,\%$. This approximation is applied to all measurements for the following uncertainties$:$ JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by-jets, JES pileup, $b$-JES, jet vertex fraction, mistag efficiency and $W+\;$jets shape variation. For the measurement of $\sigma(tq)$ the approximation is applied in addition to the following uncertainties$:$ JES flavor response, $c$-tagging efficiency, $t\bar{t}$ generator + parton shower and $t\bar{t}$ ISR/FSR. For the measurement of $\sigma(\bar{t}q)$ the approximation is applied in addition to these uncertainties$:$ JES flavor response, $b/\bar{b}$ acceptance, and $t\bar{t}$ ISR/FSR. For the measurement of $R_t$ the approximation is applied in addition to these uncertainties$:$ JES detector, $b$-tagging efficiency, $c$-tagging efficiency, $b/\bar{b}$ acceptance and $tq$ scale variations. For the measurement of $\sigma(tq+\bar{t}q)$ the approximation is applied in addition to these uncertainties$:$ JES flavor response, $c$-tagging efficiency, $b/\bar{b}$ acceptance, $t\bar{t}$ generator + parton shower and $t\bar{t}$ ISR/FSR.

Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(T)).

The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.

Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(TBAR)).

Parametrization factors for the $m_{t}$ dependence [see Eq. (4) in the paper] of $\sigma(tq)$, $\sigma(\bar tq)$, and $\sigma(t q+\bar t q)$.

The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.

The value of $|V_{tb}|^{2}$ is extracted by dividing the measured value of $\sigma(t q+\bar t q)$ by the prediction of the approximate NNLO calculation. The experimental and theoretical uncertainties are added in quadrature.

Event yields for the 2-jet-$\ell^{+}$ and 2-jet-$\ell^{-}$ HPR channels. The expectation for the signal and background yields correspond to the result of the binned maximum-likelihood fit described in Sec. $\mathrm{VI~D}$ in the paper. The uncertainty of the expectations is the normalization uncertainty of each process after the fit, as described in Sec. $\mathrm{VII~F}$ in the paper.

Migration matrix relating the parton level $p_{\mathrm{T}}(t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-quark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $p_{\mathrm{T}}(\bar t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-antiquark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $|y(t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-quark $|y|$ distribution.

Migration matrix relating the parton level $|y(\bar t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-antiquark $|y|$ distribution.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Comparison between the measured differential cross sections and the predictions from the NLO calculation using the MSTW2008 PDF set. For each variable and prediction a $\chi^{2}$ value is calculated with HERAfitter using the covariance matrix of each measured spectrum. The theory uncertainties of the predictions are treated as uncorrelated. The number of degrees of freedom (NDF) is equal to the number of bins in the measured spectrum.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, mistag efficiency, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The JES $\eta$ intercalibration uncertainty has a sign switch from the first to the second bin. For the $tq$ generator $+$ parton shower uncertainty a sign switch is denoted with $\mp$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $c-$tagging efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content $:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet energy resolution, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$ tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the differential cross section as a function of $|y(\bar t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(\bar t)|$.

Differential cross-section $\mathrm{d} \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d}p_T$ [pb/(GeV/$c$)] for $2.0 < y < 4.5$.

Differential cross-section $\mathrm{d} \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d}y$ [pb] for $p_T < 30$ GeV.

Ratio of double-differential cross-sections $( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(2S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y ) / ( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(1S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y )$.

Ratio of double-differential cross-sections $( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(3S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y ) / ( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(1S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y )$.

Ratio of double-differential cross-sections $( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(3S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y ) / ( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(2S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y )$.

The ratio of differential cross-sections $( \mathrm{d} \sigma ( pp \to ( \Upsilon(iS) \to \mu^+ \mu^- ) X ) / \mathrm{d}p_T ) / ( \mathrm{d} \sigma ( pp \to ( \Upsilon(jS) \to \mu^+ \mu^- ) X ) / \mathrm{d}p_T )$ for $2.0 < y < 4.5$.

The ratio of differential cross-sections $( \mathrm{d} \sigma ( pp \to ( \Upsilon(iS) \to \mu^+ \mu^- ) X ) / \mathrm{d}y ) / ( \mathrm{d} \sigma ( pp \to ( \Upsilon(jS) \to \mu^+ \mu^- ) X ) / \mathrm{d}y )$ for $p_T < 30$ GeV/$c$.

Double-differential cross-section $\mathrm{d}^2 \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d}y$ [pb/(GeV/$c$)].

Double-differential cross-section $\mathrm{d}^2 \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d}y$ [pb/(GeV/$c$)].

Double-differential cross-section $\mathrm{d}^2 \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d}y$ [pb/(GeV/$c$)].

Differential cross-section $\mathrm{d} \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d}p_T$ [pb/(GeV/$c$)] for $2.0 < y < 4.5$.

Differential cross-section $\mathrm{d} \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d}y$ [pb] for $p_T < 30$ GeV.

Ratio of double-differential cross-sections $( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(2S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y ) / ( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(1S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y )$.

Ratio of double-differential cross-sections $( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(3S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y ) / ( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(1S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y )$.

Ratio of double-differential cross-sections $( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(3S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y ) / ( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(2S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y )$.

The ratio of differential cross-sections $( \mathrm{d} \sigma ( pp \to ( \Upsilon(iS) \to \mu^+ \mu^- ) X ) / \mathrm{d}p_T ) / ( \mathrm{d} \sigma ( pp \to ( \Upsilon(jS) \to \mu^+ \mu^- ) X ) / \mathrm{d}p_T )$ for $2.0 < y < 4.5$.

The ratio of differential cross-sections $( \mathrm{d} \sigma ( pp \to ( \Upsilon(iS) \to \mu^+ \mu^- ) X ) / \mathrm{d}y ) / ( \mathrm{d} \sigma ( pp \to ( \Upsilon(jS) \to \mu^+ \mu^- ) X ) / \mathrm{d}y )$ for $p_T < 30$ GeV/$c$.

The ratio of differential cross-section $\mathrm{d} \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d}p_T$ [pb/(GeV/$c$)] for $\sqrt{s}=8$ and $\sqrt{s}=7$ TeV in $2.0 < y < 4.5$.

The ratio of differential cross-section $\mathrm{d} \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d}y$ for $\sqrt{s}=8$ and $\sqrt{s}=7$ TeV and $p_T < 30$ GeV/$c$.

Inclusive cross-section for $Z$ boson production in bins of PHI*. The uncertainties are statistical, systematic, beam and luminosity.

Inclusive cross-section for $Z$ boson production in bins of muon pseudorapidity. The uncertainties are statistical, systematic, beam and luminosity.

$W^{\pm}$ to $Z$ boson cross-section ratio in bins of muon pseudorapidity. The uncertainties are statistical, systematic, beam and luminosity.

Ratio of $W^+$ to $W^-$ cross-section in bins of muon pseudorapidity. The uncertainties are statistical, systematic and beam.

Lepton charge asymmetry in bins of muon pseudorapidity. The uncertainties are statistical, systematic and beam.

Ratios of $W^{\pm}$ to $Z$ boson cross-section ratios at differnent centre-of-mass energy (8 TeV to 7 TeV) in bins of muon pseudorapidity. The uncertainties are statistical and systematic.

Inclusive cross-section for $Z$ boson production in bins of muon pseudorapidity at centre-of-mass energy of 7 TeV. The uncertainties are statistical, systematic, beam and luminosity.

$W^{\pm}$ to $Z$ boson cross-section ratio in bins of muon pseudorapidity at centre-of-mass energy of 7 TeV. The uncertainties are statistical, systematic, beam and luminosity.

Correlation coefficients of differential cross-section measurements as a function of lepton $\eta$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded. This table lists bin-to-bin correlations for $W^{+}$.

Correlation coefficients of differential cross-section measurements as a function of lepton $\eta$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded. This table lists bin-to-bin correlations for $W^{-}$.

Correlation coefficients of differential cross-section measurements as a function of lepton $\eta$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded. This table lists differential cross-section correlations between $W^{-}$ and $W^{+}$ bins.

Correlation coefficients of differential cross-section measurements as a function of $y_{Z}$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of transverse momentum. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of $\phi^{*}$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients between differential cross-section measurements as a function $y_{Z}$ and $W^{+}$ boson muon $\eta$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients between differential cross-section measurements as a function $y_{Z}$ and $W^{-}$ boson muon $\eta$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of $\eta^{\mu^{+}}$ of the Z boson. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of $\eta^{\mu^{-}}$ of the Z boson. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of $\eta^{\mu^{+}}$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of $\eta^{\mu^{-}}$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

The cross section differential in the fraction of the proton four-momentum carried by the Pomeron, LOG10(C=XI), for events with at least two jets of pt > 20 GeV found by the anti-kt jet algorithm with R=0.4.

The cross section differential in the fraction of the proton four-momentum carried by the Pomeron, LOG10(C=XI), for events with at least two jets of pt > 20 GeV found by the anti-kt jet algorithm with R=0.6 and after requiring that the pseudorapidity gap > 2.

The cross section differential in the fraction of the proton four-momentum carried by the Pomeron, LOG10(C=XI), for events with at least two jets of pt > 20 GeV found by the anti-kt jet algorithm with R=0.4 and after requiring that the pseudorapidity gap > 2.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $p_T$.

The inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $|y|$.

The inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $y_{\text{boost}}(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $y_{\text{boost}}(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta y(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta y(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta\phi(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta\phi(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta R(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta R(Z,b)$.

The cross-section $\sigma(Zb)$ as a function of $Z$ boson $p_T$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zb)$ as a function of $Z$ boson $p_T$.

The cross-section $\sigma(Zb)$ as a function of $Z$ boson $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zb)$ as a function of $Z$ boson $|y|$.

Integrated $Z+\ge 2$ $b$-jets cross-section.

Breakdown of systematic uncertainties (in %) for the integrated $Z+\ge 2$ $b$-jets cross-section.

The cross-section $\sigma(Zbb)$ as a function of $\Delta R(b,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $\Delta R(b,b)$.

The cross-section $\sigma(Zbb)$ as a function of $\Delta m(b,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $\Delta m(b,b)$.

The cross-section $\sigma(Zbb)$ as a function of $Z$ boson $p_T$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $Z$ boson $p_T$.

The cross-section $\sigma(Zbb)$ as a function of $Z$ boson $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $Z$ boson $|y|$.

Distributions of 0.5*|YZ-YJet| normalized to unity. The data are shown after correcting for efficiency and resolution, and displayed with statistical and systematic uncertainties combined in quadrature.

Distributions of |YPho| normalized to unity. The data are shown after correcting for efficiency and resolution, and displayed with statistical and systematic uncertainties combined in quadrature.

Distributions of |YJet| normalized to unity. The data are shown after correcting for efficiency and resolution, and displayed with statistical and systematic uncertainties combined in quadrature.

Distributions of 0.5*|YPho+YJet| normalized to unity. The data are shown after correcting for efficiency and resolution, and displayed with statistical and systematic uncertainties combined in quadrature.

Distributions of 0.5*|YPho-YJet| normalized to unity. The data are shown after correcting for efficiency and resolution, and displayed with statistical and systematic uncertainties combined in quadrature.