The measured inclusive fiducial cross section measurements. The WW fiducial region is defined by requiring two same-sign leptons with $p_{T}>20$, $|\eta|<2.5$, and $m_{ll}>20$, and two jets with $m_{jj}>500$ and $|\Delta \eta_{jj}|>2.5$. The jets at generator level are clustered from stable particles, excluding neutrinos, using the anti-kt clustering algorithm with R = 0.4, and are required to have $p_{T}>50$ and $|\eta|<4.7$. The jets within $\Delta R<0.4$ of the selected charged leptons are not included. The WZ fiducial region is defined by requiring three leptons with $p_{T}>20$, $|\eta|<2.5$, a pair of opposite charge same-flavor lepton pair with $|m_{ll}-m_{Z}|<15$, and two jets with $m_{jj}>500$ and $|\Delta \eta_{jj}|>2.5$.

Distributions of $m_{jj}$ in the WW signal region.

Distributions of $m_{ll}$ in the WW signal region.

Distributions of $m_{jj}$ in the WZ signal region.

Distributions of BDT score in the WZ signal region.

Absolute WW cross section in $m_{jj}$ bins.

Normalized WW cross section in $m_{jj}$ bins.

Absolute WW cross section in $m_{ll}$ bins.

Normalized WW cross section in $m_{ll}$ bins.

Absolute WW cross section in $p_{T}^{l max}$ bins.

Normalized WW cross section in $p_{T}^{l max}$ bins.

Absolute WZ cross section in $m_{jj}$ bins.

Normalized WZ cross section in $m_{jj}$ bins.

Distributions of $m_{T}^{WW}$ in the WW signal region.

Distributions of $m_{T}^{WZ}$ in the WZ signal region.

Observed and expected lower and upper 95\% confidence level limits in TeV$^{-4}$ on the parameters of the quartic, obtained without using any unitarization procedure.

Observed and expected lower and upper 95\% confidence level limits in TeV$^{-4}$ on the parameters of the quartic by cutting the EFT expansion at the unitarity limit.

Measured normalized differential cross sections with respect to the dilepton invariant mass.

Measured normalized differential cross sections with respect to the leading lepton $p_T$.

Measured normalized differential cross sections with respect to the trailing lepton $p_T$.

Measured normalized differential cross sections with respect to the dilepton azimuthal angular separation.

Fiducial cross section for the production of $W^+W^−$ +0-jets as the $p_T$ threshold for jets is varied. The fiducial region is defined by two opposite-sign leptons with $p_T > 20$GeV and | η | < 2.5 excluding the products of τ lepton decay, and $m_{\ell\ell} > 20$GeV, $p_T^{\ell\ell} > 30$GeV, and $p_T^{\mathrm{miss}} > 30$GeV. Jets must have $p_T$ above the stated threshold, | η | < 4.5, and be separated from each of the two leptons by ∆R > 0.4. The total uncertainty is reported.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for slepton-pair production.

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via $W^{\pm}W^{\mp}$. The masses of the two charginos are 300 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 50 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via slepton-neutrino/sneutrino-lepton pair. The masses of the two charginos are 600 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 1 GeV. The slepton/sneutrino masses are 300 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde\ell\tilde\ell$ are produced. Only $\tilde{e}$ and $\tilde{\mu}$ are considered in this model. The masses of the two sleptons are 400 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 200 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Expected and observed 95% CL upper limits on the production of a heavy, narrow-width, scalar resonance decaying to a pair of Higgs bosons ($X\rightarrow HH$). The final state used in the search consists of a boosted $b\bar{b}$ pair and a boosted hadronically decaying $\tau^{+}\tau^{-}$ pair, and the SM braching ratio of the Higgs boson are assumed. The $\pm 1\sigma$ and $\pm 2\sigma$ variations about the expected limit are indicated by the error bands. Two different requirements are applied on the visible mass of the two boosted Higgs boson candidates for the resonance mass hypotheses of 1.6 TeV and 2.5 TeV, leading to discontinuities in the limits (at 1.6 TeV, the difference between imposing no requirement and $m^{vis}_{HH}>900$ GeV is less than 1% though).

Fig. 2. (Color online.) Event-by-event photon multiplicity distributions (solid circles) for $\mathrm{Au}+\mathrm{Au}$ and $\mathrm{Cu}+\mathrm{Cu}$ at $\sqrt{s_{\mathrm{NN}}}=62.4$ and $200 \mathrm{GeV} .$ The distributions for top $0-5 \%$ central $\mathrm{Au}+$ Au collisions and top $0-10 \%$ central $\mathrm{Cu}+\mathrm{Cu}$ collisions are also shown (open circles). The photon multiplicity distributions for central collisions are observed to be Gaussian (solid line). Only statistical errors are shown. NOTE: For points with invisible error bars, the point size was considered as an absolute upper limit for the uncertainty.

Fig. 2. (Color online.) Event-by-event photon multiplicity distributions (solid circles) for $\mathrm{Au}+\mathrm{Au}$ and $\mathrm{Cu}+\mathrm{Cu}$ at $\sqrt{s_{\mathrm{NN}}}=62.4$ and $200 \mathrm{GeV} .$ The distributions for top $0-5 \%$ central $\mathrm{Au}+$ Au collisions and top $0-10 \%$ central $\mathrm{Cu}+\mathrm{Cu}$ collisions are also shown (open circles). The photon multiplicity distributions for central collisions are observed to be Gaussian (solid line). Only statistical errors are shown. NOTE: For points with invisible error bars, the point size was considered as an absolute upper limit for the uncertainty.

Fig. 2. (Color online.) Event-by-event photon multiplicity distributions (solid circles) for $\mathrm{Au}+\mathrm{Au}$ and $\mathrm{Cu}+\mathrm{Cu}$ at $\sqrt{s_{\mathrm{NN}}}=62.4$ and $200 \mathrm{GeV} .$ The distributions for top $0-5 \%$ central $\mathrm{Au}+$ Au collisions and top $0-10 \%$ central $\mathrm{Cu}+\mathrm{Cu}$ collisions are also shown (open circles). The photon multiplicity distributions for central collisions are observed to be Gaussian (solid line). Only statistical errors are shown. NOTE: For points with invisible error bars, the point size was considered as an absolute upper limit for the uncertainty.

Fig. 3. (Color online.) Photon pseudorapidity distributions for $\mathrm{Au}+\mathrm{Au}$ and $\mathrm{Cu}+\mathrm{Cu}$ at $\sqrt{\mathrm{s}_{\mathrm{NN}}}=62.4$ and $200\mathrm{GeV}$. The results for several centrality classes are shown. The solid curves are results of HIJING simulations for central $(0-5 \%$ for $\mathrm{Au}+\mathrm{Au}$ and $0-10 \%$ for $\mathrm{Cu}+\mathrm{Cu})$ and $30-40 \%$ mid-central collisions. The errors shown are systematic, statistical errors are negligible in comparison. NOTE: For points with invisible error bars, the point size was considered as an absolute upper limit for the uncertainty.

Fig. 3. (Color online.) Photon pseudorapidity distributions for $\mathrm{Au}+\mathrm{Au}$ and $\mathrm{Cu}+\mathrm{Cu}$ at $\sqrt{\mathrm{s}_{\mathrm{NN}}}=62.4$ and $200\mathrm{GeV}$. The results for several centrality classes are shown. The solid curves are results of HIJING simulations for central $(0-5 \%$ for $\mathrm{Au}+\mathrm{Au}$ and $0-10 \%$ for $\mathrm{Cu}+\mathrm{Cu})$ and $30-40 \%$ mid-central collisions. The errors shown are systematic, statistical errors are negligible in comparison. NOTE: For points with invisible error bars, the point size was considered as an absolute upper limit for the uncertainty.

Fig. 3. (Color online.) Photon pseudorapidity distributions for $\mathrm{Au}+\mathrm{Au}$ and $\mathrm{Cu}+\mathrm{Cu}$ at $\sqrt{\mathrm{s}_{\mathrm{NN}}}=62.4$ and $200\mathrm{GeV}$. The results for several centrality classes are shown. The solid curves are results of HIJING simulations for central $(0-5 \%$ for $\mathrm{Au}+\mathrm{Au}$ and $0-10 \%$ for $\mathrm{Cu}+\mathrm{Cu})$ and $30-40 \%$ mid-central collisions. The errors shown are systematic, statistical errors are negligible in comparison. NOTE: For points with invisible error bars, the point size was considered as an absolute upper limit for the uncertainty.

Fig. 3. (Color online.) Photon pseudorapidity distributions for $\mathrm{Au}+\mathrm{Au}$ and $\mathrm{Cu}+\mathrm{Cu}$ at $\sqrt{\mathrm{s}_{\mathrm{NN}}}=62.4$ and $200\mathrm{GeV}$. The results for several classes are shown. The solid curves are results of HIJING simulations for central $(0-5 \%$ for $\mathrm{Au}+\mathrm{Au}$ and $0-10 \%$ for $\mathrm{Cu}+\mathrm{Cu})$ and $30-40 \%$ mid-central collisions. The errors shown are systematic, statistical errors are negligible in comparison. NOTE: For points with invisible error bars, the point size was considered as an absolute upper limit for the uncertainty.

Fig. 4. (Color online.) Top panel: The number of photons divided by $\left\langle N_{\text{part}}\right\rangle / 2$ as a function of average number of participating nucleons for $\mathrm{Au}+\mathrm{Au}$ and $\mathrm{Cu}+\mathrm{Cu}$ at $\sqrt{\mathrm{s} _{\mathrm{NN}}}=62.4$ and $200 \mathrm{GeV}$ for $-3.7<\eta<-2.3 .$ Errors shown are systematic only and include those for $\left\langle N_{\text {part }}\right\rangle .$ Results from HIJING are shown as lines (solid for $\mathrm{Au}+\mathrm{Au}$ and dashed for $\mathrm{Cu}+\mathrm{Cu}$ ). Bottom panel: Same as above, for both photons and charged particles from PHOBOS [10]. NOTE: For points with invisible error bars, the point size was considered as an absolute upper limit for the uncertainty.

Fig. 4. (Color online.) Top panel: The number of photons divided by $\left\langle N_{\text{part}}\right\rangle / 2$ as a function of average number of participating nucleons for $\mathrm{Au}+\mathrm{Au}$ and $\mathrm{Cu}+\mathrm{Cu}$ at $\sqrt{\mathrm{s} _{\mathrm{NN}}}=62.4$ and $200 \mathrm{GeV}$ for $-3.7<\eta<-2.3 .$ Errors shown are systematic only and include those for $\left\langle N_{\text {part }}\right\rangle .$ Results from HIJING are shown as lines (solid for $\mathrm{Au}+\mathrm{Au}$ and dashed for $\mathrm{Cu}+\mathrm{Cu}$ ). Bottom panel: Same as above, for both photons and charged particles from PHOBOS [10]. NOTE: For points with invisible error bars, the point size was considered as an absolute upper limit for the uncertainty.

Fig. 5. (Color online.) Photon pseudorapidity distributions normalized by the average number of participating nucleon pairs for different collision centralities are plotted as a function of pseudorapidity shifted by the beam rapidity (-5.36 for $200 \mathrm{GeV}$ and -4.19 for $62.4 \mathrm{GeV}$ ) for $\mathrm{Au}+\mathrm{Au}$ and $\mathrm{Cu}+\mathrm{Cu}$ collisions at $\sqrt{s_{\mathrm{NN}}}=62.4$ and $200 \mathrm{GeV}$. Errors are systematic only, statistical errors are negligible in comparison. For clarity of presentation, results for only four centralities are shown. The $\mathrm{Cu}+$ Cu data are shifted by 0.1 unit in $\eta-y_{\text {beam }} .$ The solid line is a second order polynomial fit to the data (see text for details).

Fig. 5. (Color online.) Photon pseudorapidity distributions normalized by the average number of participating nucleon pairs for different collision centralities are plotted as a function of pseudorapidity shifted by the beam rapidity (-5.36 for $200 \mathrm{GeV}$ and -4.19 for $62.4 \mathrm{GeV}$ ) for $\mathrm{Au}+\mathrm{Au}$ and $\mathrm{Cu}+\mathrm{Cu}$ collisions at $\sqrt{s_{\mathrm{NN}}}=62.4$ and $200 \mathrm{GeV}$. Errors are systematic only, statistical errors are negligible in comparison. For clarity of presentation, results for only four centralities are shown. The $\mathrm{Cu}+$ Cu data are shifted by 0.1 unit in $\eta-y_{\text {beam }} .$ The solid line is a second order polynomial fit to the data (see text for details).

A comparison of the measured cell $E_T^{miss}$ distribution with that predicted by the two-component model for two pile-up scenarios. The magenta points extend the measured distribution using L1 $E_T^{miss} > 30\,$GeV and L1 $E_T^{miss} > 50\,$GeV data. The red curve is the prediction from the calorimeter-resolution part of the model. The green curve is the high $E_T^{miss}$ tail's probability distribution for the mean number of $pp$ interactions $\mu$ in each figure. The blue curve is the full model prediction computed by combining the $E_T^{miss}$ from these two individual sources shown in red and green, each calculated for $\mu=\langle\mu\rangle$. The black points show the unbiased $E_T^{miss}$ distribution measured in data. Corresponds to a prediction for $\langle\mu\rangle = 25$.

A comparison of the measured cell $E_T^{miss}$ distribution with that predicted by the two-component model for two pile-up scenarios. The magenta points extend the measured distribution using L1 $E_T^{miss} > 30\,$GeV and L1 $E_T^{miss} > 50\,$GeV data. The red curve is the prediction from the calorimeter-resolution part of the model. The green curve is the high $E_T^{miss}$ tail's probability distribution for the mean number of $pp$ interactions $\mu$ in each figure. The blue curve is the full model prediction computed by combining the $E_T^{miss}$ from these two individual sources shown in red and green, each calculated for $\mu=\langle\mu\rangle$. The black points show the unbiased $E_T^{miss}$ distribution measured in data. Corresponds to a prediction for $\langle\mu\rangle = 25$.

A comparison of the measured cell $E_T^{miss}$ distribution with that predicted by the two-component model for two pile-up scenarios. The magenta points extend the measured distribution using L1 $E_T^{miss} > 30\,$GeV and L1 $E_T^{miss} > 50\,$GeV data. The red curve is the prediction from the calorimeter-resolution part of the model. The green curve is the high $E_T^{miss}$ tail's probability distribution for the mean number of $pp$ interactions $\mu$ in each figure. The blue curve is the full model prediction computed by combining the $E_T^{miss}$ from these two individual sources shown in red and green, each calculated for $\mu=\langle\mu\rangle$. The black points show the unbiased $E_T^{miss}$ distribution measured in data. Corresponds to a prediction for $\langle\mu\rangle = 55$.

A comparison of the measured cell $E_T^{miss}$ distribution with that predicted by the two-component model for two pile-up scenarios. The magenta points extend the measured distribution using L1 $E_T^{miss} > 30\,$GeV and L1 $E_T^{miss} > 50\,$GeV data. The red curve is the prediction from the calorimeter-resolution part of the model. The green curve is the high $E_T^{miss}$ tail's probability distribution for the mean number of $pp$ interactions $\mu$ in each figure. The blue curve is the full model prediction computed by combining the $E_T^{miss}$ from these two individual sources shown in red and green, each calculated for $\mu=\langle\mu\rangle$. The black points show the unbiased $E_T^{miss}$ distribution measured in data. Corresponds to a prediction for $\langle\mu\rangle = 55$.

A comparison of the measured cell $E_T^{miss}$ distribution with that predicted by the two-component model for two pile-up scenarios. The magenta points extend the measured distribution using L1 $E_T^{miss} > 30\,$GeV and L1 $E_T^{miss} > 50\,$GeV data. The red curve is the prediction from the calorimeter-resolution part of the model. The green curve is the high $E_T^{miss}$ tail's probability distribution for the mean number of $pp$ interactions $\mu$ in each figure. The blue curve is the full model prediction computed by combining the $E_T^{miss}$ from these two individual sources shown in red and green, each calculated for $\mu=\langle\mu\rangle$. The black points show the unbiased $E_T^{miss}$ distribution measured in data. Corresponds to a prediction for $\langle\mu\rangle = 55$.

A comparison of the measured cell $E_T^{miss}$ distribution with that predicted by the two-component model for two pile-up scenarios. The magenta points extend the measured distribution using L1 $E_T^{miss} > 30\,$GeV and L1 $E_T^{miss} > 50\,$GeV data. The red curve is the prediction from the calorimeter-resolution part of the model. The green curve is the high $E_T^{miss}$ tail's probability distribution for the mean number of $pp$ interactions $\mu$ in each figure. The blue curve is the full model prediction computed by combining the $E_T^{miss}$ from these two individual sources shown in red and green, each calculated for $\mu=\langle\mu\rangle$. The black points show the unbiased $E_T^{miss}$ distribution measured in data. Corresponds to a prediction for $\langle\mu\rangle = 55$.

A comparison of the measured cell $E_T^{miss}$ distribution with that predicted by the two-component model for two pile-up scenarios. The magenta points extend the measured distribution using L1 $E_T^{miss} > 30\,$GeV and L1 $E_T^{miss} > 50\,$GeV data. The red curve is the prediction from the calorimeter-resolution part of the model. The green curve is the high $E_T^{miss}$ tail's probability distribution for the mean number of $pp$ interactions $\mu$ in each figure. The blue curve is the full model prediction computed by combining the $E_T^{miss}$ from these two individual sources shown in red and green, each calculated for $\mu=\langle\mu\rangle$. The black points show the unbiased $E_T^{miss}$ distribution measured in data. Corresponds to a prediction for $\langle\mu\rangle = 55$.

The $E_T^{miss}$ model predicted trigger rate as a function of $\mu$ for the cell $E_T^{miss}$ algorithm with a threshold of $80\,$GeV and $120\,$GeV, assuming no additional pile-up mitigation.

The L1 $E_T^{miss}$ trigger efficiency, shown as a function of $p_T(\mu\mu)$ in $Z\rightarrow\mu\mu$ events.

The efficiencies in the plot are shown for events satisfying a $Z\rightarrow\mu\mu$ selection and with $p_T(\mu\mu)$ larger than $150\,$GeV vs pile-up for each of the four years of data taking.

The L1 $E_T^{miss}$ trigger rate as a function of $\langle\mu\rangle$ for runs in three different periods ($\alpha$, $\beta$, $\gamma$) in the year 2017.

The L1 $E_T^{miss}$ trigger rate as a function of $\langle\mu\rangle$ for runs in three different periods ($\alpha$, $\beta$, $\gamma$) in the year 2017.

The L1 $E_T^{miss}$ trigger rate as a function of $\langle\mu\rangle$ for runs in three different periods ($\alpha$, $\beta$, $\gamma$) in the year 2017.

The L1 $E_T^{miss}$ trigger efficiency is shown as a function of mean pile-up for events satisfying a $Z\rightarrow\mu\mu$ selection and with $p_T(\mu\mu)$ larger than $150\,$GeV in three periods during the year 2017.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $0\leq\langle\mu\rangle < 20$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $0\leq\langle\mu\rangle < 20$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $0\leq\langle\mu\rangle < 20$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $0\leq\langle\mu\rangle < 20$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $0\leq\langle\mu\rangle < 20$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $20\leq\langle\mu\rangle < 30$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $20\leq\langle\mu\rangle < 30$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $20\leq\langle\mu\rangle < 30$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $20\leq\langle\mu\rangle < 30$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $20\leq\langle\mu\rangle < 30$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $30\leq\langle\mu\rangle < 40$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $30\leq\langle\mu\rangle < 40$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $30\leq\langle\mu\rangle < 40$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $30\leq\langle\mu\rangle < 40$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $30\leq\langle\mu\rangle < 40$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $40\leq\langle\mu\rangle$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $40\leq\langle\mu\rangle$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $40\leq\langle\mu\rangle$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $40\leq\langle\mu\rangle$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $40\leq\langle\mu\rangle$.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Turn-on efficiency curves are shown for $Z\rightarrow\mu\mu$ events for three algorithms: the cell algorithm alone, the pufit algorithm alone and the combined cell+pufit algorithm. The thresholds are set such that the algorithms have equal rates, and the data were recorded in the year 2018. Here the trigger efficiency is shown with respect to $p_T(\mu\mu)$.

Turn-on efficiency curves are shown for $Z\rightarrow\mu\mu$ events for three algorithms: the cell algorithm alone, the pufit algorithm alone and the combined cell+pufit algorithm. The thresholds are set such that the algorithms have equal rates, and the data were recorded in the year 2018. Here the trigger efficiency is shown with respect to the offline $E_T^{miss}$ calculation with muons treated as being invisible.

Efficiencies for $Z\rightarrow\mu\mu$ events are shown for the L1 $E_T^{miss}>50\,$GeV trigger and for the complete L1+HLT trigger chain that also requires pufit > 110 GeV. Each is shown as a function of $\langle\mu\rangle$ for a $p_T(\mu\mu)$ threshold of 150 GeV.

Efficiencies for $Z\rightarrow\mu\mu$ events are shown for the L1 $E_T^{miss}>50\,$GeV trigger and for the complete L1+HLT trigger chain that also requires pufit > 110 GeV. Each is shown as a function of $\langle\mu\rangle$ for an offline $E_T^{miss}$ threshold of 150 GeV.

Efficiencies for $Z\rightarrow\mu\mu$ events are shown for the L1 $E_T^{miss}>50\,$GeV trigger and for the complete L1+HLT trigger chain that also requires pufit > 110 GeV. Each is shown as a function of $\langle\mu\rangle$ for an $p_T(\mu\mu)$ threshold of 175 GeV.

Efficiencies for $Z\rightarrow\mu\mu$ events are shown for the L1 $E_T^{miss}>50\,$GeV trigger and for the complete L1+HLT trigger chain that also requires pufit > 110 GeV. Each is shown as a function of $\langle\mu\rangle$ for an offline $E_T^{miss}$ threshold of 175 GeV.

HLT_xe70_mht trigger output rate as a function of $\langle\mu\rangle$ shown for an example run in year 2015.

HLT_xe90_mht trigger output rate as a function of $\langle\mu\rangle$ shown for an example run in year 2016.

HLT_xe110_mht trigger output rate as a function of $\langle\mu\rangle$ shown for an example run in year 2016.

HLT_xe110_pufit trigger output rate as a function of $\langle\mu\rangle$ shown for an example run in year 2017. This trigger included an implicit requirement of cell $E_T^{miss}>50\,$GeV.

HLT_xe110_pufit_xe65 trigger output rate as a function of $\langle\mu\rangle$ shown for an example run in year 2018.

HLT_xe110_pufit_xe70 trigger output rate as a function of $\langle\mu\rangle$ shown for an example run in year 2018.

Full-chain trigger efficiencies for each year as a function of $p_T(\mu\mu)$. The efficiency corresponds to that of the lowest unprescaled trigger that is adjusted throughout each year.

Full-chain trigger efficiencies for 2015, 2016, 2017 and 2018 as a function of $\langle\mu\rangle$ for $p_T(\mu\mu)>150$ GeV. The efficiency corresponds to that of the lowest unprescaled trigger that is adjusted throughout the year.

Efficiencies for the first-level trigger L1XE50 and the combined L1+HLT trigger chain HLT_xe110_pufit_xe65_L1XE50 in data recorded in the year 2018 are shown as a function of $\langle\mu\rangle$ for $W\rightarrow e\nu$ and $Z\rightarrow\mu\mu$ selections with offline $E_T^{miss}>150\,$GeV.

Efficiencies for the first-level trigger L1XE50 and the combined L1+HLT trigger chain HLT_xe110_pufit_xe65_L1XE50 in data recorded in the year 2018 are shown as a function of $\langle\mu\rangle$ for $t\bar t$ with offline $E_T^{miss}>150\,$GeV.

Efficiencies for the first-level trigger L1XE50 and the combined L1+HLT trigger chain HLT_xe110_pufit_xe65_L1XE50 in data recorded in the year 2018 are shown as a function of $\langle\mu\rangle$ for $W\rightarrow e\nu$ and $Z\rightarrow\mu\mu$ selections with offline $E_T^{miss}>175\,$GeV.

Efficiencies for the first-level trigger L1XE50 and the combined L1+HLT trigger chain HLT_xe110_pufit_xe65_L1XE50 in data recorded in the year 2018 are shown as a function of $\langle\mu\rangle$ for $t\bar t$ with offline $E_T^{miss}>175\,$GeV.

Post-fit yields for data and prediction in each of the single-bin signal regions of the analysis.

Observed 95% confidence level limit for the two-step signal grid.

Observed 95% confidence level limit for the two-step signal grid with the signal cross section increased by one sigma.

Observed 95% confidence level limit for the two-step signal grid with the signal cross section decreased by one sigma.

Expected 95% confidence level limit for the two-step signal grid.

Expected 95% confidence level limit for the two-step signal grid plus one sigma from experimental systematics.

Expected 95% confidence level limit for the two-step signal grid minus one sigma from experimental systematics.

Observed 95% confidence level limit for the Gtt signal grid.

Observed 95% confidence level limit for the Gtt signal grid with the signal cross section increased by one sigma.

Observed 95% confidence level limit for the Gtt signal grid with the signal cross section decreased by one sigma.

Expected 95% confidence level limit for the Gtt signal grid.

Expected 95% confidence level limit for the Gtt signal grid plus one sigma from experimental systematics.

Expected 95% confidence level limit for the Gtt signal grid minus one sigma from experimental systematics.

Observed 95% confidence level limit for the RPV signal grid.

Observed 95% confidence level limit for the RPV signal grid with the signal cross section increased by one sigma.

Observed 95% confidence level limit for the RPV signal grid with the signal cross section decreased by one sigma.

Expected 95% confidence level limit for the RPV signal grid.

Expected 95% confidence level limit for the RPV signal grid plus one sigma from experimental systematics.

Expected 95% confidence level limit for the RPV signal grid minus one sigma from experimental systematics.

Observed 95% confidence level limit for the two-step signal grid.

Expected 95% confidence level limit for the two-step signal grid.

Observed 95% confidence level limit for the Gtt signal grid.

Expected 95% confidence level limit for the Gtt signal grid.

Observed 95% confidence level limit for the RPV signal grid.

Expected 95% confidence level limit for the RPV signal grid.

$\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ distribution in the signal region SR-10ij50-0ib-MJ340. Two benchmark signal models are shown along with the background yields. These models, each representing a single mass point, are labelled 'RPV' with $(m_{\tilde{g}}, m_{\tilde{t}}) = (1600, 600) \, \mathrm{GeV}$ and 'two-step' with $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

$\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ distribution in the signal region SR-12ij50-2ib. Two benchmark signal models are shown along with the background yields. These models, each representing a single mass point, are labelled 'RPV' with $(m_{\tilde{g}}, m_{\tilde{t}}) = (1600, 600) \, \mathrm{GeV}$ and 'two-step' with $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

$\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ distribution in the signal region SR-9ij80-0ib. Two benchmark signal models are shown along with the background yields. These models, each representing a single mass point, are labelled 'RPV' with $(m_{\tilde{g}}, m_{\tilde{t}}) = (1600, 600) \, \mathrm{GeV}$ and 'two-step' with $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

Number of signal events expected for $139 \, \mathrm{fb}^{-1} $ after different analysis selections in the signal region SR-8ij50-0ib-MJ500. This 'two-step' model requires that a strongly produced gluino decays into quarks, the W and Z bosons, and the lightest stable neutralino where $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

Number of signal events expected for $139 \, \mathrm{fb}^{-1} $ after different analysis selections in the signal region SR-9ij50-0ib-MJ340. This 'two-step' model requires that a strongly produced gluino decays into quarks, the W and Z bosons, and the lightest stable neutralino where $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

Number of signal events expected for $139 \, \mathrm{fb}^{-1} $ after different analysis selections in the signal region SR-10ij50-0ib-MJ340. This 'two-step' model requires that a strongly produced gluino decays into quarks, the W and Z bosons, and the lightest stable neutralino where $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

Number of signal events expected for $139 \, \mathrm{fb}^{-1} $ after different analysis selections in the signal region SR-10ij50-0ib-MJ500. This 'two-step' model requires that a strongly produced gluino decays into quarks, the W and Z bosons, and the lightest stable neutralino where $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

Number of signal events expected for $139 \, \mathrm{fb}^{-1} $ after different analysis selections in the signal region SR-10ij50-1ib-MJ500. This 'two-step' model requires that a strongly produced gluino decays into quarks, the W and Z bosons, and the lightest stable neutralino where $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

Number of signal events expected for $139 \, \mathrm{fb}^{-1} $ after different analysis selections in the signal region SR-11ij50-0ib. This 'two-step' model requires that a strongly produced gluino decays into quarks, the W and Z bosons, and the lightest stable neutralino where $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

Number of signal events expected for $139 \, \mathrm{fb}^{-1} $ after different analysis selections in the signal region SR-12ij50-2ib. This 'two-step' model requires that a strongly produced gluino decays into quarks, the W and Z bosons, and the lightest stable neutralino where $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

Number of signal events expected for $139 \, \mathrm{fb}^{-1} $ after different analysis selections in the signal region SR-9ij80-0ib. This 'two-step' model requires that a strongly produced gluino decays into quarks, the W and Z bosons, and the lightest stable neutralino where $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

Acceptance for the signal region SR-8ij50-0ib-MJ500 showing the acceptance for the complete two-step signal grid.

Efficiency for the signal region SR-8ij50-0ib-MJ500 showing the efficiency for the complete two-step signal grid.

Acceptance for the signal region SR-9ij50-0ib-MJ340 showing the acceptance for the complete two-step signal grid.

Efficiency for the signal region SR-9ij50-0ib-MJ340 showing the efficiency for the complete two-step signal grid.

Acceptance for the signal region SR-10ij50-0ib-MJ340 showing the acceptance for the complete two-step signal grid.

Efficiency for the signal region SR-10ij50-0ib-MJ340 showing the efficiency for the complete two-step signal grid.

Acceptance for the signal region SR-10ij50-0ib-MJ500 showing the acceptance for the complete two-step signal grid.

Efficiency for the signal region SR-10ij50-0ib-MJ500 showing the efficiency for the complete two-step signal grid.

Acceptance for the signal region SR-10ij50-1ib-MJ500 showing the acceptance for the complete two-step signal grid.

Efficiency for the signal region SR-10ij50-1ib-MJ500 showing the efficiency for the complete two-step signal grid.

Acceptance for the signal region SR-11ij50-0ib showing the acceptance for the complete two-step signal grid.

Efficiency for the signal region SR-11ij50-0ib showing the efficiency for the complete two-step signal grid.

Acceptance for the signal region SR-12ij50-2ib showing the acceptance for the complete two-step signal grid.

Efficiency for the signal region SR-12ij50-2ib showing the efficiency for the complete two-step signal grid.

Acceptance for the signal region SR-9ij80-0ib showing the acceptance for the complete two-step signal grid.

Efficiency for the signal region SR-9ij80-0ib showing the efficiency for the complete two-step signal grid.

The normalisation factors for the dominant backgrounds of the analysis in each of the multi-bin and single-bin regions.

Post-fit yields for data and prediction in each of the single-bin validation regions to test the $N_{\mathrm{jet}}$ extraction.

Post-fit yields for data and prediction in each of the single-bin validation regions to test the $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ extrapolation.

Post-fit yields for data and prediction in each of the multi-bin validation regions to test the $N_{\mathrm{jet}}$ extraction.

Post-fit yields for data and prediction in each of the multi-bin validation regions to test the $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ extrapolation.

The observed Cls from the best expected signal regions for the two-step decay.

The observed Cls from the best expected signal regions for the Gtt decay.

The observed Cls from the best expected signal regions for the RPV decay.

Number of events in each signal region broken down by background type and the number of observed data events.

From left to right; the $95\%$ CL upper limits on the visible cross section (${\langle \epsilon\sigma \rangle}^{95}_{obs}$) and on the number of signal events. Next is the $95\%$ CL upper limit on the number of signal events, given the expected number of background events. The last two columns show the confidence level for the background only hypothesis ($CL_{b}$) and the dicovery $p$-value along with the Gaussian significance (Z).

Visualisation of the highest jet multiplicity event selected in signal regions targeting long cascade decays of pair-produced gluinos. This event was recorded by ATLAS on 23 October 2016, and contains 16 jets, illustrated by cones. Yellow blocks represent the calorimeter energy measured in noise-suppressed clusters. Of the reconstructed jets, 13 (11) have transverse momenta above 50 GeV (80 GeV), with 3 (2) being b-tagged. The leading jet has a transverse momentum of 507 GeV, and the sum of jet transverse momenta $H_T=2.9$ TeV. A value of 343 GeV is observed for the $E_{T}^{miss}$, whose direction is shown by the dashed red line, producing a significance $S(E_{T}^{miss})=6.4$. The sum of the masses of large-radius jets is evaluated as $M_{J}^{\Sigma}=1070$ GeV.

Visualisation of the highest jet multiplicity event selected in a control region used to make predictions of the background from multijet production. This event was recorded by ATLAS on 18 July 2018, and contains 19 jets, illustrated by cones. Yellow blocks represent the calorimeter energy measured in in noise-suppressed clusters. Of the reconstructed jets, 16 (10) have transverse momenta above 50 GeV (80 GeV). No jets were b-tagged. The leading et has a transverse momentum of 371 GeV, and the sum of jet transverse momenta $H_T=2.2$ TeV. A value of 8 GeV is observed for the $E_{T}^{miss}$, whose direction is shown by the dashed red line, producing a significance $S(E_{T}^{miss})=0.2$. The sum of the masses of large-radius jets is evaluated as $M_{J}^{\Sigma}=767$ GeV.

Post-fit $m_{T}$ distribution in the SR 4J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 6J b-veto N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 6J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Pre-fit $m_{eff}$ distribution in the TR6J control region. Uncertainties include statistical and systematic uncertainties (added in quadrature). The value 9999 is used as a placeholder for infinity.

Pre-fit $m_{eff}$ distribution in the WR6J control region. Uncertainties include statistical and systematic uncertainties (added in quadrature). The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the TR6J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the WR6J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 2J b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 2J b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J low-x b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J low-x b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J high-x b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J high-x b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 6J b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 6J b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Observed 95% CL exclusion contours for the gluino one-step x = 1/2 model.

Expected 95% CL exclusion contours for the gluino one-step x = 1/2 model. space.

Observed 95% CL exclusion contours for the gluino one-step variable-x

Expected 95% CL exclusion contours for the gluino one-step variable-x

Observed 95% CL exclusion contours for the squark one-step x = 1/2 model.

Observed 95% CL exclusion contours for the squark one-step x = 1/2 model.

Observed 95% CL exclusion contours for one-flavour schemes in one-step x = 1/2 model.

Observed 95% CL exclusion contours for one-flavour schemes in one-step x = 1/2 model.

Expected 95% CL exclusion contours for the squark one-step variable-x

Expected 95% CL exclusion contours for the squark one-step variable-x

Expected 95% CL exclusion contours for the squark one-flavour schemes in variable-x

Expected 95% CL exclusion contours for the squark one-flavour schemes in variable-x

Upper limits on the signal cross section for simplified model gluino one-step x = 1/2

Upper limits on the signal cross section for simplified model gluino one-step variable-x

Upper limits on the signal cross section for simplified model squark one-step x = 1/2

Upper limits on the signal cross section for simplified model squark one-step variable-x

Upper limits on the signal cross section for simplified model squark one-step x=1/2 in one-flavour schemes

Upper limits on the signal cross section for simplified model squark one-step variable-x in one-flavour schemes

Post-fit $m_{eff}$ distribution in the TR2J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the WR2J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the TR4J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the WR4J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 2J b-tag validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 2J b-veto validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J b-tag validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J b-veto validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 6J b-tag validation region. Uncertainties include statistical and systematic uncertainties.

Post-fit $m_{eff}$ distribution in the 6J b-veto validation region. Uncertainties include statistical and systematic uncertainties.

Event selection cutflow for two representative signal samples for the SR2JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Event selection cutflow for two representative signal samples for the SR2JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Event selection cutflow for two representative signal samples for the SR4JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Event selection cutflow for two representative signal samples for the SR4JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Event selection cutflow for two representative signal samples for the SR6JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Event selection cutflow for two representative signal samples for the SR6JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Signal acceptance in SR2J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery high region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery low region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx discovery region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx discovery region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin4 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin4 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery high region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery low region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J discovery high region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J discovery low region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx discovery region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx discovery region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin4 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin4 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J discovery high region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J discovery low region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery high region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery low region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx discovery region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx discovery region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin4 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin4 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery high region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery low region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J discovery high region for squark production one-step variable-x simplified models

Signal acceptance in SR2J discovery low region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx discovery region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx discovery region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin4 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin4 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J discovery high region for squark production one-step variable-x simplified models

Signal acceptance in SR6J discovery low region for squark production one-step variable-x simplified models

Signal efficiency in SR2J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery high region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery low region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx discovery region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx discovery region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin4 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin4 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery high region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery low region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery high region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery low region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx discovery region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx discovery region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin4 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin4 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery high region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery low region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery high region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery low region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx discovery region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx discovery region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin4 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin4 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery high region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery low region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0