Event yields for the different processes estimated with the fit to the $O_\mathrm{NN}$ distribution compared to the numbers of observed events. Only the statistical uncertainties are quoted. The $Z,VV+\mathrm{jets}$ contributions and the multijet background are fixed in the fit; therefore no uncertainty is quoted for these processes.

Detailed list of the contribution from each source of uncertainty to the total uncertainty in the measured values of $\sigma_{\mathrm{fid}}(tq)$ and $\sigma_{\mathrm{fid}}(\bar tq)$. The estimation of the systematic uncertainties has a statistical uncertainty of $0.3\%$. Uncertainties contributing less than $0.5\%$ are marked with ‘<0.5’.

Significant contributions to the total relative uncertainty in the measured value of $R_{t}$. The estimation of the systematic uncertainties has a statistical uncertainty of $0.3~\%$. Uncertainties contributing less than $0.5~\%$ are not shown.

Slopes $a$ of the mass dependence of the measured cross$-$sections.

Predicted (post-fit) and observed event yields for the signal region (SR), after the requirement on the neural network discriminant, $O_{\mathrm{NN}}~>~0.8$. The multijet background prediction is obtained from the fit to the $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution described in Section 6, while all the other predictions and uncertainties are derived from the total cross$-$section measurement. In some cases there is no uncertainty quoted. In these cases the uncertainty is < 0.5.

Predicted (post-fit) and observed event yields for the signal region (SR), after the requirement on the second neural network discriminant, $O_{\mathrm{NN2}}~>~0.8$. The multijet background prediction is obtained from the fit to the $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution described in Section 6, while all the other predictions and uncertainties are derived from the total cross$-$section measurement. In some cases there is no uncertainty quoted. In these cases the uncertainty is < 0.5.

Migration matrix for $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at the particle level. The pseudo top quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $p_{\mathrm{T}}(t)$ at the parton level. The parton-level quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $|y(\hat{t\hspace{-0.2mm}})|$ at the particle level. The pseudo top quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $|y(t)|$ at the parton level. The parton-level quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Uncertainties in the normalisations of the different backgrounds for all processes, as derived from the total cross-section measurement.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(t)$ at parton level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(t)$ at parton level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(t)|$ at parton level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(t)|$ at parton level.

Expected 95% CL exclusion contours in signal region Rpv2L on the gluino and lightest top squark masses in a SUSY scenario where gluinos are produced in pairs and decay into a top quark and an top squark, which in turn decays via non-zero baryon-number-violating RPV couplings $\lambda^{''}_{313}$, $\tilde g\to t\tilde{t}_1$ followed by $\tilde{t}_1\to b d$.

Observed 95% CL exclusion contours in the best combination of signal regions of Rpc2L1b and Rpc2L2b on the lightest bottom squark and lightest neutralino masses in a SUSY scenario where pairs of bottom-antibottom squarks are produced and decay into the lightest neutralino via a chargino, $\tilde b^{}_{1}\to t\tilde{\chi}_1^-$ followed by $\tilde{\chi}_1^\pm\to W^\pm\tilde{\chi}_1^0$.

Expected 95% CL exclusion contours in the best combination of signal regions of Rpc2L1b and Rpc2L2b on the lightest bottom squark and lightest neutralino masses in a SUSY scenario where pairs of bottom-antibottom squarks are produced and decay into the lightest neutralino via a chargino, $\tilde b^{}_{1}\to t\tilde{\chi}_1^-$ followed by $\tilde{\chi}_1^\pm\to W^\pm\tilde{\chi}_1^0$.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region Rpc2L0b, in a SUSY scenario where gluinos are produced in pairs and decay into the lightest neutralino via a two-steps cascade, $\tilde g\to q\bar{q}^{'}\tilde{\chi}_1^\pm$ followed by $\tilde{\chi}_1^\pm\to W^\pm\tilde{\chi}_2^0$ and $\tilde{\chi}_2^0\to Z\tilde{\chi}_1^0$. The masses of the superpartners involved in the process are set to $m(\tilde g)$ = 1600 GeV, $m(\tilde \chi_1^\pm)$ = 1200 GeV, $m(\tilde \chi_2^0)$ = 1000 GeV and $m(\tilde \chi_1^0)$ = 800 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region Rpc2L1b, in a SUSY scenario where pairs of bottom-antibottom squarks are produced and decay into the lightest neutralino via a chargino, $\tilde b^{}_{1}\to t\tilde{\chi}_1^-$ followed by $\tilde{\chi}_1^\pm\to W^\pm\tilde{\chi}_1^0$. The masses of the superpartners involved in the process are set to $m(\tilde{b}^{}_1)$ = 850 GeV, $m(\tilde \chi_1^\pm)$ = 500 GeV and $m(\tilde \chi_1^0)$ = 400 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region Rpc2L2b, in a SUSY scenario where pairs of bottom-antibottom squarks are produced and decay into the lightest neutralino via a chargino, $\tilde b^{}_{1}\to t\tilde{\chi}_1^-$ followed by $\tilde{\chi}_1^\pm\to W^\pm\tilde{\chi}_1^0$. The masses of the superpartners involved in the process are set to $m(\tilde{b}^{}_1)$ = 850 GeV, $m(\tilde \chi_1^\pm)$ = 500 GeV and $m(\tilde \chi_1^0)$ = 400 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region Rpc3LSS1b, in a SUSY scenario where pairs of top-antitop squarks are produced and decay into the lightest neutralino via a two-steps cascade, $\tilde t^{}_{1}\to t\tilde{\chi}_2^0$ followed by $\tilde{\chi}_2^0\to \tilde{\chi}_1^\pm W^\mp$ and $\tilde{\chi}_1^\pm\to f\bar{f^{'}}\tilde{\chi}_1^0$. The lightest chargino and the lightest neutralino are assumed to be nearly mass-degenerate. The masses of the superpartners involved in the process are set to $m(\tilde{t}^{}_1)$ = 800 GeV, $m(\tilde \chi_2^0)$ = 625 GeV, $m(\tilde \chi_1^\pm)\approx m(\tilde \chi_1^0)$ = 525 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region Rpv2L, in a SUSY scenario where gluinos are produced in pairs and decay into a top quark and an top squark which in turn decays via non-zero baryon-number-violating RPV couplings $\lambda^{''}_{313}$, $\tilde g\to t\tilde{t}_1$ followed by $\tilde{t}_1\to b d$. The masses of the superpartners involved in the process are set to $m(\tilde g)$ = 1600 GeV, $m(\tilde{t}^{}_{1})$ = 800 GeV. Only statistical uncertainties are shown.

Signal acceptance for Rpc2L0b signal region with sensitivity to $pp\to \tilde g\tilde g$ production cross-sections in a SUSY scenario where gluinos are produced in pairs and decay into the lightest neutralino via a two-steps cascade, $\tilde g\to q\bar{q}^{'}\tilde{\chi}_1^\pm$ followed by $\tilde{\chi}_1^\pm\to W^\pm\tilde{\chi}_2^0$ and $\tilde{\chi}_2^0\to Z\tilde{\chi}_1^0$.

Signal acceptance for Rpc2L1b signal region with sensitivity to $pp\to \tilde{b}^{}_1\tilde{b}^{*}_1$ production cross-sections in a SUSY scenario where pairs of bottom-antibottom squarks are produced and decay into the lightest neutralino via a chargino, $\tilde b^{}_{1}\to t\tilde{\chi}_1^-$ followed by $\tilde{\chi}_1^\pm\to W^\pm\tilde{\chi}_1^0$.

Signal acceptance for Rpc2L2b signal region with sensitivity to $pp\to \tilde{b}^{}_1\tilde{b}^{*}_1$ production cross-sections in a SUSY scenario where pairs of bottom-antibottom squarks are produced and decay into the lightest neutralino via a chargino, $\tilde b^{}_{1}\to t\tilde{\chi}_1^-$ followed by $\tilde{\chi}_1^\pm\to W^\pm\tilde{\chi}_1^0$.

Signal acceptance for Rpv2L signal region with sensitivity to $pp\to \tilde g\tilde g$ production cross-sections in a SUSY scenario where gluinos are produced in pairs and decay into a top quark and an top squark, which in turn decays via non-zero baryon-number-violating RPV couplings $\lambda^{''}_{313}$, $\tilde g\to t\tilde{t}_1$ followed by $\tilde{t}_1\to b d$.

Signal acceptance for Rpc3LSS1b signal region with sensitivity to $pp\to \tilde{t}^{}_\mathrm{1}\tilde{t}^{*}_\mathrm{1}$ production cross-sections in a SUSY scenario where pairs of top-antitop squarks are produced and decay into the lightest neutralino via a two-steps cascade, $\tilde t^{}_{1}\to t\tilde{\chi}_2^0$ followed by $\tilde{\chi}_2^0\to \tilde{\chi}_1^\pm W^\mp$ and $\tilde{\chi}_1^\pm\to f\bar{f^{'}}\tilde{\chi}_1^0$. The lightest chargino and the lightest neutralino are assumed to be nearly mass-degenerate.

Signal efficiency for Rpc2L0b signal region with sensitivity to $pp\to \tilde g\tilde g$ production cross-sections in a SUSY scenario where gluinos are produced in pairs and decay into the lightest neutralino via a two-steps cascade, $\tilde g\to q\bar{q}^{'}\tilde{\chi}_1^\pm$ followed by $\tilde{\chi}_1^\pm\to W^\pm\tilde{\chi}_2^0$ and $\tilde{\chi}_2^0\to Z\tilde{\chi}_1^0$.

Signal efficiency for Rpc2L1b signal region with sensitivity to $pp\to \tilde{b}^{}_1\tilde{b}^{*}_1$ production cross-sections in a SUSY scenario where pairs of bottom-antibottom squarks are produced and decay into the lightest neutralino via a chargino, $\tilde b^{}_{1}\to t\tilde{\chi}_1^-$ followed by $\tilde{\chi}_1^\pm\to W^\pm\tilde{\chi}_1^0$.

Signal efficiency for Rpc2L2b signal region with sensitivity to $pp\to \tilde{b}^{}_1\tilde{b}^{*}_1$ production cross-sections in a SUSY scenario where pairs of bottom-antibottom squarks are produced and decay into the lightest neutralino via a chargino, $\tilde b^{}_{1}\to t\tilde{\chi}_1^-$ followed by $\tilde{\chi}_1^\pm\to W^\pm\tilde{\chi}_1^0$.

Signal efficiency for Rpv2L signal region with sensitivity to $pp\to \tilde g\tilde g$ production cross-sections in a SUSY scenario where gluinos are produced in pairs and decay into a top quark and an top squark, which in turn decays via non-zero baryon-number-violating RPV couplings $\lambda^{''}_{313}$, $\tilde g\to t\tilde{t}_1$ followed by $\tilde{t}_1\to b d$.

Signal efficiency for Rpc3LSS1b signal region with sensitivity to $pp\to \tilde{t}^{}_\mathrm{1}\tilde{t}^{*}_\mathrm{1}$ production cross-sections in a SUSY scenario where pairs of top-antitop squarks are produced and decay into the lightest neutralino via a two-steps cascade, $\tilde t^{}_{1}\to t\tilde{\chi}_2^0$ followed by $\tilde{\chi}_2^0\to \tilde{\chi}_1^\pm W^\mp$ and $\tilde{\chi}_1^\pm\to f\bar{f^{'}}\tilde{\chi}_1^0$. The lightest chargino and the lightest neutralino are assumed to be nearly mass-degenerate.

Observed 95% CL upper limit on $pp\to \tilde g\tilde g$ production cross-sections in a SUSY scenario where gluinos are produced in pairs and decay into the lightest neutralino via a two-steps cascade, $\tilde g\to q\bar{q}^{'}\tilde{\chi}_1^\pm$ followed by $\tilde{\chi}_1^\pm\to W^\pm\tilde{\chi}_2^0$ and $\tilde{\chi}_2^0\to Z\tilde{\chi}_1^0$.

Observed 95% CL upper limit on $pp\to \tilde g\tilde g$ production cross-sections in a SUSY scenario where gluinos are produced in pairs and decay into a top quark and an top squark, which in turn decays via non-zero baryon-number-violating RPV couplings $\lambda^{''}_{313}$, $\tilde g\to t\tilde{t}_1$ followed by $\tilde{t}_1\to b d$.

Observed 95% CL upper limit on $pp\to \tilde{b}^{}_1\tilde{b}^{*}_1$ production cross-sections in a SUSY scenario where pairs of bottom-antibottom squarks are produced and decay into the lightest neutralino via a chargino, $\tilde b^{}_{1}\to t\tilde{\chi}_1^-$ followed by $\tilde{\chi}_1^\pm\to W^\pm\tilde{\chi}_1^0$.

Observed 95% CL upper limit on $pp\to \tilde{t}^{}_\mathrm{1}\tilde{t}^{*}_\mathrm{1}$ production cross-sections in a SUSY scenario where pairs of top-antitop squarks are produced and decay into the lightest neutralino via a two-steps cascade, $\tilde t^{}_{1}\to t\tilde{\chi}_2^0$ followed by $\tilde{\chi}_2^0\to \tilde{\chi}_1^\pm W^\mp$ and $\tilde{\chi}_1^\pm\to f\bar{f^{'}}\tilde{\chi}_1^0$. The lightest chargino and the lightest neutralino are assumed to be nearly mass-degenerate.

Best observed 95% CL exclusion contours selected from Rpc2L1b and Rpc2L2b on the lightest bottom squark and lightest neutralino masses in a SUSY scenario where pairs of bottom-antibottom squarks are produced and decay into the lightest neutralino via a chargino, $\tilde b^{}_{1}\to t\tilde{\chi}_1^-$ followed by $\tilde{\chi}_1^\pm\to W^\pm\tilde{\chi}_1^0$.

N-1 distributions for $E_{\mathrm{T}}^{\mathrm{miss}}$ of observed data and expected background towards Rpc2L0b from publication's Figure 5 . The last bin is inclusive.

N-1 distributions for $E_{\mathrm{T}}^{\mathrm{miss}} / m_{\mathrm{eff}}$ of observed data and expected background towards Rpc2L1b from publication's Figure 5 . The last bin is inclusive.

N-1 distributions for $E_{\mathrm{T}}^{\mathrm{miss}}$ of observed data and expected background towards Rpc2L2b from publication's Figure 5 . The last bin is inclusive.

N-1 distributions for $m_{\mathrm{eff}}$ of observed data and expected background towards Rpv2L from publication's Figure 5 . The last bin is inclusive.

W+jets BDT distributions in the muon and electron single-lepton channel. The SR is defined as events with W+jets BDT >= 0.5.

W+jets BDT distributions in the muon and electron single-lepton channel. The SR is defined as events with W+jets BDT >= 0.5.

Dijet rapidity difference $(|\Delta y|)$ for events passing the fully hadronic event selection for all $m_{t\overline{t}}$ and for events with an $m_{t\overline{t}}$ > 2 TeV.

Dijet rapidity difference $(|\Delta y|)$ for events passing the fully hadronic event selection for all $m_{t\overline{t}}$ and for events with an $m_{t\overline{t}}$ > 2 TeV.

Distributions of $p_{T}$ and $m_{SD}$ for the W+jets background in the muon and electron channels using the W+jets mistag CR.

Distributions of $p_{T}$ and $m_{SD}$ for the W+jets background in the muon and electron channels using the W+jets mistag CR.

Distributions of $p_{T}$ and $m_{SD}$ for the W+jets background in the muon and electron channels using the W+jets mistag CR.

Distributions of $p_{T}$ and $m_{SD}$ for the W+jets background in the muon and electron channels using the W+jets mistag CR.

Distributions of $S_{T}$ in the background-enriched CR for $\mu\mu$, $ee$, and $e\mu$ subchannels.

Distributions of $S_{T}$ in the background-enriched CR for $\mu\mu$, $ee$, and $e\mu$ subchannels.

Distributions of $S_{T}$ in the background-enriched CR for $\mu\mu$, $ee$, and $e\mu$ subchannels.

Distributions of ST for the $\mu\mu$, $ee$, and $e\mu$ SRs in the boosted and nonboosted regions.

Distributions of ST for the $\mu\mu$, $ee$, and $e\mu$ SRs in the boosted and nonboosted regions.

Distributions of ST for the $\mu\mu$, $ee$, and $e\mu$ SRs in the boosted and nonboosted regions.

Distributions of ST for the $\mu\mu$, $ee$, and $e\mu$ SRs in the boosted and nonboosted regions.

Distributions of ST for the $\mu\mu$, $ee$, and $e\mu$ SRs in the boosted and nonboosted regions.

Distributions of ST for the $\mu\mu$, $ee$, and $e\mu$ SRs in the boosted and nonboosted regions.

Distributions of $m_{t\overline{t}}$ for the single-lepton channel CR1 and CR2 forthe muon and electron categories.

Distributions of $m_{t\overline{t}}$ for the single-lepton channel CR1 and CR2 forthe muon and electron categories.

Distributions of $m_{t\overline{t}}$ for the single-lepton channel SRs for the muon and electron categories with and without t tagging

Distributions of $m_{t\overline{t}}$ for the single-lepton channel SRs for the muon and electron categories with and without t tagging

Distributions of $m_{t\overline{t}}$ for the single-lepton channel CR1 and CR2 forthe muon and electron categories.

Distributions of $m_{t\overline{t}}$ for the single-lepton channel CR1 and CR2 forthe muon and electron categories.

Distributions of $m_{t\overline{t}}$ for the single-lepton channel SRs for the muon and electron categories with and without t tagging

Distributions of $m_{t\overline{t}}$ for the single-lepton channel SRs for the muon and electron categories with and without t tagging

Distributions of $m_{t\overline{t}}$ for the fully hadronic channel SR categories, used to extract the final results.

Distributions of $m_{t\overline{t}}$ for the fully hadronic channel SR categories, used to extract the final results.

Distributions of $m_{t\overline{t}}$ for the fully hadronic channel SR categories, used to extract the final results.

Distributions of $m_{t\overline{t}}$ for the fully hadronic channel SR categories, used to extract the final results.

Distributions of $m_{t\overline{t}}$ for the fully hadronic channel SR categories, used to extract the final results.

Distributions of $m_{t\overline{t}}$ for the fully hadronic channel SR categories, used to extract the final results.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (fb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anticorrelation between different backgrounds.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracket background events is small.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of Z pt on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of Z pt on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of |y(Z)| on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of |y(Z)| on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of Z pt on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of Z pt on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of |y(Z)| on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of |y(Z)| on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

The measured absolute cross sections in bins of |y(Z)|, using dressed level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of Z pt, using dressed level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using dressed level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of Z pt different |y(Z)| bins, using dressed level leptons. The cross sections are normalized by the bin width.

The measured normalized cross sections in bins of Z pt, using dressed level leptons.

The measured normalized cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using dressed level leptons.

The measured normalized cross sections in bins of |y(Z)|, using dressed level leptons.

The measured normalized cross sections (left) in bins of Z pt in |y(Z)| bins, using dressed level leptons.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

The measured absolute cross sections in bins of |y(Z)|, using born level leptons. The cross sections are normalized by the bin width.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt in the dimuon final state.

The measured absolute cross sections in bins of Z pt, using born level leptons. The cross sections are normalized by the bin width. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

The measured absolute cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using born level leptons. The cross sections are normalized by the bin width.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

The measured absolute cross sections in bins of Z pt different |y(Z)| bins, using born level leptons. The cross sections are normalized by the bin width. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

The measured normalized cross sections in bins of Z pt, using born level leptons. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

The measured normalized cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using born level leptons.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

The measured normalized cross sections in bins of |y(Z)|, using born level leptons.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

The measured normalized cross sections (left) in bins of Z pt in |y(Z)| bins, using born level leptons. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

pT-differential invariant yield of charged kaons in pPb collisions with centre-of-mass energy/nucleon=5.02 TeV.

pT-differential invariant yield of k0s in pPb collisions with centre-of-mass energy/nucleon=5.02 TeV.

pT-differential invariant yield of k0s in pPb collisions with centre-of-mass energy/nucleon=5.02 TeV.

pT-differential invariant yield of protons+antiprotons in pPb collisions with centre-of-mass energy/nucleon=5.02 TeV.

pT-differential invariant yield of protons+antiprotons in pPb collisions with centre-of-mass energy/nucleon=5.02 TeV.

pT-differential invariant yield of lambdas+antilambdas in pPb collisions with centre-of-mass energy/nucleon=5.02 TeV.

pT-differential invariant yield of lambdas+antilambdas in pPb collisions with centre-of-mass energy/nucleon=5.02 TeV.

pT-dependent charged kaon to charged pion production ratios in pPb collisions with centre-of-mass energy/nucleon=5.02 TeV.

pT-dependent charged kaon to charged pion production ratios in pPb collisions with centre-of-mass energy/nucleon=5.02 TeV.

pT-dependent proton+antiproton to charged pion production ratios in pPb collisions with centre-of-mass energy/nucleon=5.02 TeV.

pT-dependent proton+antiproton to charged pion production ratios in pPb collisions with centre-of-mass energy/nucleon=5.02 TeV.

pT-dependent lambda+antilambda to k0s production ratios in pPb collisions with centre-of-mass energy/nucleon=5.02 TeV.

pT-dependent lambda+antilambda to k0s production ratios in pPb collisions with centre-of-mass energy/nucleon=5.02 TeV.

Mean transverse momentum of lambdas+antilambdas in pPb collisions with centre-of-mass energy/nucleon=5.02 TeV.

Mean transverse momentum of protons+antiprotons in pPb collisions with centre-of-mass energy/nucleon=5.02 TeV.

Mean transverse momentum of k0s in pPb collisions with centre-of-mass energy/nucleon=5.02 TeV.

Mean transverse momentum of charged kaons in pPb collisions with centre-of-mass energy/nucleon=5.02 TeV.

Mean transverse momentum of charged pions in pPb collisions with centre-of-mass energy/nucleon=5.02 TeV.

Integrated production ratios in pPb collisions with centre-of-mass energy/nucleon=5.02 TeV.

Integrated production yield of pions in pPb collisions at sqrts 5.02 TeV.

Integrated production yield of charged kaons in pPb collisions at sqrts 5.02 TeV.

Integrated production yield of K0S in pPb collisions at sqrts 5.02 TeV.

Integrated production yield of protons+antiprotons in pPb collisions at sqrts 5.02 TeV.

Integrated production yield of lambda+antilambda in pPb collisions at sqrts 5.02 TeV.

Differential cross section dsigma(Z+c)/dpTZ times branching ratio and differential cross sections ratio dsigma(Z+c)/dpTZ / dsigma(Z+b)/dpTZ for three ranges of the transverse momentum of the Z boson and combining the dielectron and dimuon Z0 decay channels

Differential cross section dsigma(Z+c)/dpTjet times branching ratio and differential cross sections ratio dsigma(Z+c)/dpTZ / dsigma(Z+b)/dpTjet for three ranges of the transverse momentum of the jet and combining the dielectron and dimuon Z0 decay channels

Transverse momentum distribution of the selected muon-inside-a-jet for events with an identified muon among the jet constituents in the dielectron channel

Transverse momentum distribution of the selected muon-inside-a-jet for events with an identified muon among the jet constituents in the dimuon channel

The invariant mass distribution of three-prong secondary vertices for events selected in the D± mode, in the dielectron channel

The invariant mass distribution of three-prong secondary vertices for events selected in the D ± mode, in the dimuon channel

The invariant mass distribution of the three-track system composed of a two-prong secondary vertex and a primary particle for events selected in the D∗(2010)± mode, in the dielectron channel

The invariant mass distribution of the three-track system composed of a two-prong secondary vertex and a primary particle for events selected in the D ∗ (2010) ± mode, in the dimuon channel

Transverse momentum distribution of the c-tagged jet normalized to unity, in simulated W+c and Z+c samples and in W+c data events.

Number of reconstructed secondary vertices normalized to unity, in simulated W+c and Z+c samples and in W+c data events.

Distribution of the corrected secondary-vertex mass normalized to unity, in simulated W + c and Z + c samples, and in W + c data events.

Distribution of the JP discriminant for the D± mode normalized to unity, in simulated W + c and Z + c samples, and in W + c data events.

Distribution of the JP discriminant for the D∗(2010) ± mode normalized to unity, in simulated W + c and Z + c samples, and in W + c data events.

Distribution of the corrected secondary-vertex mass normalized to unity from simulated Z + b and eμ-tt data events

Corrected secondary-vertex mass distributions, after background subtraction in the dielectron channel for events selected in the semileptonic mode.

Corrected secondary-vertex mass distributions, after background subtraction in the dimuon channel for events selected in the semileptonic mode.

Background-subtracted distributions of the JP discriminant in the dielectron channel for Z + jets events with a D± → K∓ π± π± candidate.

Background-subtracted distributions of the JP discriminant in the dimuon channel for Z + jets events with a D± → K∓ π± π± candidate.

Background-subtracted distributions of the JP discriminant in the dielectron channel for Z +jets events with a D∗(2010)± → D0 π± → K∓ π± π± candidate.

Background-subtracted distributions of the JP discriminant in the dimuon channel for Z +jets events with a D∗(2010)± → D0 π± → K∓ π± π± candidate.

ontributions to the systematic uncertainty in the measured Z+c cross section and in the (Z+c)/(Z+b) cross section ratio.

Differential Z + c cross section as a function of the transverse momentum of the Z boson

(Z +c)/(Z +b) cross section ratio as a function of the transverse momentum of teh Z boson

Differential Z + c cross section as a function of the transverse momentum of the jet

(Z +c)/(Z +b) cross section ratio as a function of the transverse momentum of the jet.

Transverse mass $m_T$ spectrum at midrapidity of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 158 GeV/c. $m_0$ is the PDG mass of the $\phi$ meson.

Transverse mass $m_T$ spectrum at midrapidity of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 80 GeV/c. $m_0$ is the PDG mass of the $\phi$ meson.

Dependence of the slope parameter $T$ of the transverse momentum spectrum on rapidity $y$, of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 158 GeV/c.

Dependence of the slope parameter $T$ of the transverse momentum spectrum on rapidity $y$, of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 80 GeV/c.

Dependence of the width $\sigma_y$ of the rapidity distributions on $p_T$, of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 158 GeV/c.

Dependence of the width $\sigma_y$ of the rapidity distributions on $p_T$, of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 80 GeV/c.

Rapidity spectrum of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 158 GeV/c.

Rapidity spectrum of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 80 GeV/c.

Rapidity spectrum of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 40 GeV/c.

Energy dependence of ratios of total yields of $\phi$ mesons to mean total yields of pions produced in in minimum bias p+p collisions at CERN SPS energies.

Energy dependence of double ratios of total yields of $\phi$ mesons to mean total yields of pions in central Pb+Pb collisions over minimum bias p+p collisions at CERN SPS energies.

Energy dependence of total yields of $\phi$ mesons produced in minimum bias p+p collisions at CERN SPS energies.

Energy dependence of midrapidity yields of $\phi$ mesons produced in minimum bias p+p collisions at CERN SPS energies.

Widths of rapidity distributions of $\phi$ mesons produced in minimum bias p+p collisions at CERN SPS energies, as a function of beam rapidity.

The $L_{T}$ distribution in the MisID-enriched region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L below-Z signal region. The last bin contains the overflow events.

The $M_{T}$ distribution in the 3L on-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L above-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF1 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF2 signal region. The last bin contains the overflow events.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The 95% confidence level exclusion limits for the flavor-democratic scenario on the total production cross section of heavy fermion pairs.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(PS).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(PS).

Product of the fiducial acceptance and the event selection efficiency for the type-III Seesaw signal model at various signal mass hypotheses calculated after all analysis selection requirements.

Product of the fiducial acceptance and the event selection efficiency for the tt$\phi$ signal models at various signal mass hypotheses calculated after all analysis selection requirements.

$\mathrm{M_{\mathrm{T}}}$ distribution for the $\mathrm{e}\mu$ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the WZ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the ZZ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the signal region, events with $|\eta_{\gamma}|<1$.

$\mathrm{M_{\mathrm{T}}}$ distribution for the signal region, events with $|\eta_{\gamma}|>1$.

Muon reconstruction, identification, and isolation efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Electron reconstruction, identification, and isolation efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Photon efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Covariance matrix for all bins used in the analysis. There are 45 bins in total, 15 for every data-taking year. For every year, the first bin corresponds to events in the $\mathrm{e}\mu$ control region, the following five bins correspond to events with $|\eta^\gamma|< 1$ in the signal region, the next five bins correspond to events with $|\eta^\gamma|> 1$ in the signal region, the next two bins correspond to events in the WZ control region, and finally the last two bins correspond to events in the ZZ control region.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for slepton-pair production.

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via $W^{\pm}W^{\mp}$. The masses of the two charginos are 300 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 50 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via slepton-neutrino/sneutrino-lepton pair. The masses of the two charginos are 600 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 1 GeV. The slepton/sneutrino masses are 300 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde\ell\tilde\ell$ are produced. Only $\tilde{e}$ and $\tilde{\mu}$ are considered in this model. The masses of the two sleptons are 400 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 200 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

The observed upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed.

The observed upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed.

The observed and expected upper limits at $95\%$ CL on the gluino pair production cross section for a gluino GMSB model with $m_{\tilde{g}}=2400$ GeV. The one (two) standard deviation variation in the expected limit is shown in the inner green (outer yellow) band. The blue solid line shows the observed limit obtained by the CMS displaced jet search

The distribution (normalized to unity) of number of ECAL cells hit in the jet for jets in a background enriched data sample (satisfying $|\eta| < 1.48$, $PV_{\rm track}^{\rm fraction} > 1/12$, $\mathrm{HEF} > 0.2$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$ and $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$) and for signal jets satisfying signal region requirements (except those on $E_{\mathrm{ECAL}}$ and $N^{\mathrm{cell}}_{\mathrm{ECAL}}$).

The distribution (normalized to unity) of $\mathrm{HEF}$ for a data sample enriched in beam halo and noise jets (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30 \,\mathrm{GeV}$, $PV_{\rm track}^{\rm fraction} < 1/12$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$) and for signal jets passing signal region selections (except on $\mathrm{HEF}$).

The distribution (normalized to unity) of $E_{\mathrm{HCAL}}$ for a data sample enriched in beam halo and noise jets (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30 \,\mathrm{GeV}$, $PV_{\rm track}^{\rm fraction} < 1/12$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$) and for signal jets passing signal region selections (except on $E_{\mathrm{HCAL}}$).

The distribution (normalized to unity) of $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}}$ for data sample enriched in jets from noise (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $PV_{\rm track}^{\rm fraction} > 1/12$, $\mathrm{HEF} > 0.2$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20 \,\mathrm{GeV}$ and $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$) and for signal jets passing signal region selections (except on $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}}$ and $t^{\mathrm{RMS}}_\mathrm{jet}$)

The distribution (normalized to unity) of $t^{\mathrm{RMS}}_\mathrm{jet}$ for data sample enriched in jets from noise (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $PV_{\rm track}^{\rm fraction} > 1/12$, $\mathrm{HEF} > 0.2$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20 \,\mathrm{GeV}$ and $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$) and for signal jets passing signal region selections (except on $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}}$ and $t^{\mathrm{RMS}}_\mathrm{jet}$)

The distribution (normalized to unity) of $PV_{\rm track}^{\rm fraction}$ for a data sample enriched in main bunch backgrounds (satisfying $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$, $|t_{\mathrm{jet}}| < 3\,\mathrm{ns}$ and $E_{\mathrm{ECAL}} >20\,\mathrm{GeV}$) and for signal jets passing signal selections (except on $PV_{\rm track}^{\rm fraction}$).

The distribution (normalized to unity) of $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}}$ for a data sample enriched in beam halo (satisfying $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $PV_{\rm track}^{\rm fraction} < 1/12$, $\mathrm{HEF} < 0.2$, $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$ and $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$) and for signal jets passing signal selections (except on $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}}$)

The distribution (normalized to unity) of $\mathrm{max}(\Delta \phi_{\mathrm{DT}})$ for a data sample enriched in cosmic muons (satisfying $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $PV_{\rm track}^{\rm fraction} < 1/12$, $\mathrm{HEF} > 0.2$, $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$, $t_{\mathrm{jet}} > 3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and failing the HCAL noise rejection quality filters) and for signal jets passing signal selections (except on $\mathrm{max}(\Delta \phi_{\mathrm{DT}})$).

The distribution (normalized to unity) of $\mathrm{max}(\Delta \phi_{\mathrm{RPC}})$ for a data sample enriched in cosmic muons (satisfying $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $PV_{\rm track}^{\rm fraction} < 1/12$, $\mathrm{HEF} > 0.2$, $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$, $t_{\mathrm{jet}} > 3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and failing the HCAL noise rejection quality filters) and for signal jets passing signal selections (except on $\mathrm{max}(\Delta \phi_{\mathrm{RPC}})$).

Distribution of $t_{\mathrm{jet}}$ for jets with the full Run 2 dataset with no cleaning selection applied (a) and after all jet cleaning selections are applied (b) in events satisfying the trigger requirements and satisfying $p_T^\mathrm{miss} > 300$. The jets are required to pass an inverted selection of $PV_{\rm track}^{\rm fraction} > 1/12$ to enrich the sample in those originating from main and satellite bunch backgrounds. The cleaning selections are shown to reduce the backgrounds by many orders of magnitude.

Distribution of $t_{\mathrm{jet}}$ for jets with the full Run 2 dataset in events satisfying the trigger requirements and satisfying $p_T^\mathrm{miss} < 300$. The jets are required to pass an inverted selection of $PV_{\rm track}^{\rm fraction} > 1/12$ to enrich the sample in those originating from main and satellite bunch backgrounds (all other jet cleaning selections are applied). Clear contributions from jets from satellite bunch collisions can be seen peaked around -5, 5 and 10 ns.

Contribution to the delayed time of jets from the $\beta$ of the gluino is plotted against the delay contribution from the difference (assuming straight line paths) between the path taken by the gluino and the particle forming the jet from the path length for a particle travelling directly to the same position on the ECAL barrel for gluino $c\tau_{0} = 10$ m and mass of 1000 Gev (top) and 3000 GeV (bottom). The dominant contribution is shown to be the gluino $\beta$.

Selection efficiencies for the GMSB model with $m_{\tilde{g}}=1000$ and various proper decay lengths

Selection efficiencies for the GMSB model with $m_{\tilde{g}}=2400$ and various proper decay lengths

Selection efficiencies for the GMSB model with $m_{\tilde{g}}=3000$ and various proper decay lengths

The observed upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected plus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected minus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected plus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected minus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

Expected and observed events in the 16 discovery regions along with the according control regions.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the MS-agnostic R-hadron search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector R-hadron search.

p0-values and model-independent upper limits on cross-section x acceptance x efficiency for the 16 discovery regions.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the MS-agnostic search for metastable gluino R-hadrons.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector direct-stau search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector chargino search.

Upper cross-section limit in gluino R-hadron search.

Upper cross-section limit in sbottom R-hadron search.

Upper cross-section limit in stop R-hadron search.

Upper cross-section limit in stau search.

Upper cross-section limit in chargino search.

Lower mass limit as function of gluino lifetime.

Acceptance x efficiency, acceptance and efficiency for the full range of simulated masses in the MS-agnostic R-hadron search.

Upper cross-section limit in meta-stable gluino R-hadron search.

Flavor composition of 800 GeV stop R-hadrons simulated using the generic model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV anti-stop R-hadrons simulated using the generic model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV stop R-hadrons simulated using the Regge model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV anti-stop R-hadrons simulated using the Regge model as a function of radial distance from the interaction point.

ETmiss trigger efficiency as function of true ETmiss (EtmissTurnOn).

Single-muon trigger efficiency as function of $|\eta|$ and $\beta$ (SingleMuTurnOn).

Candidate reconstruction efficiency for ID+Calo selection (IDCaloEff).

Candidate reconstruction efficiency for loose selection (LooseEff).

Efficiency for a loose candidate to be promoted to a tight candidate (TightPromotionEff).

Resolution and average of reconstructed dE/dx mass for a given simulated mass for ID+calo candidates.

Resolution and average of reconstructed ToF mass for a given simulated mass for ID+calo candidates.

Resolution and average of reconstructed ToF mass for a given simulated mass for FullDet candidates.