Showing 10 of 362 results
The $t\bar{t}$ production cross-section is measured in the lepton+jets channel using proton$-$proton collision data at a centre-of-mass energy of $\sqrt{s}=13$ TeV collected with the ATLAS detector at the LHC. The dataset corresponds to an integrated luminosity of 139 fb$^{-1}$. Events with exactly one charged lepton and four or more jets in the final state, with at least one jet containing $b$-hadrons, are used to determine the $t\bar{t}$ production cross-section through a profile-likelihood fit. The inclusive cross-section is measured to be ${\sigma_{\text{inc}} = 830 \pm 0.4~ \text{(stat.)}\pm 36~\text{(syst.)}\pm 14~\text{(lumi.)}~\mathrm{pb}}$ with a relative uncertainty of 4.6 %. The result is consistent with theoretical calculations at next-to-next-to-leading order in perturbative QCD. The fiducial $t\bar{t}$ cross-section within the experimental acceptance is also measured.
The results of fitted inclusive and fiducial ${t\bar{t}}$ cross-sections
The results of fitted inclusive and fiducial ${t\bar{t}}$ cross-sections
Ranking of the systematic uncertainties on the measured cross-section, normalised to the predicted value, in the inclusive fit to data. The impact of each nuisance parameter, $\Delta \sigma_{\text{inc}}/\sigma^{\text{pred.}}_{\text{inc}}$, is computed by comparing the nominal best-fit value of $\sigma_{\text{inc}}/\sigma^{\text{pred}}_{\text{inc}}$ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\theta$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta$ ($\pm \Delta \hat{\theta}$). The figure shows the effect of the ten most significant uncertainties.
Ranking of the systematic uncertainties on the measured cross-section, normalised to the predicted value, in the inclusive fit to data. The impact of each nuisance parameter, $\Delta \sigma_{\text{inc}}/\sigma^{\text{pred.}}_{\text{inc}}$, is computed by comparing the nominal best-fit value of $\sigma_{\text{inc}}/\sigma^{\text{pred}}_{\text{inc}}$ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\theta$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta$ ($\pm \Delta \hat{\theta}$). The figure shows the effect of the ten most significant uncertainties.
Ranking of the systematic uncertainties on the measured cross-section, normalised to the predicted value, in the fiducial fit to data. The impact of each nuisance parameter, $\Delta \sigma_{\text{fid}}/\sigma^{\text{pred.}}_{\text{fid}}$, is computed by comparing the nominal best-fit value of $\sigma_{\text{fid}}/\sigma^{\text{pred}}_{\text{fid}}$ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\theta$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta$ ($\pm \Delta \hat{\theta}$). The figure shows the effect of the ten most significant uncertainties.
Ranking of the systematic uncertainties on the measured cross-section, normalised to the predicted value, in the fiducial fit to data. The impact of each nuisance parameter, $\Delta \sigma_{\text{fid}}/\sigma^{\text{pred.}}_{\text{fid}}$, is computed by comparing the nominal best-fit value of $\sigma_{\text{fid}}/\sigma^{\text{pred}}_{\text{fid}}$ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\theta$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta$ ($\pm \Delta \hat{\theta}$). The figure shows the effect of the ten most significant uncertainties.
Impact of different categories of systematic uncertainties on the fiducial and inclusive measurements. The quoted values are obtained by repeating the fit, fixing a set of nuisance parameters of the sources corresponding to the considered category, and subtracting in quadrature the resulting uncertainty from the total uncertainty of the nominal fit. The total uncertainty is different from the sum in quadrature of the different components due to correlations between nuisance parameters built by the fit.
Impact of different categories of systematic uncertainties on the fiducial and inclusive measurements. The quoted values are obtained by repeating the fit, fixing a set of nuisance parameters of the sources corresponding to the considered category, and subtracting in quadrature the resulting uncertainty from the total uncertainty of the nominal fit. The total uncertainty is different from the sum in quadrature of the different components due to correlations between nuisance parameters built by the fit.
Fiducial region definition
Fiducial region definition
In a special run of the LHC with $\beta^\star = 2.5~$km, proton-proton elastic-scattering events were recorded at $\sqrt{s} = 13~$TeV with an integrated luminosity of $340~\mu \textrm{b}^{-1}$ using the ALFA subdetector of ATLAS in 2016. The elastic cross section was measured differentially in the Mandelstam $t$ variable in the range from $-t = 2.5 \cdot 10^{-4}~$GeV$^{2}$ to $-t = 0.46~$GeV$^{2}$ using 6.9 million elastic-scattering candidates. This paper presents measurements of the total cross section $\sigma_{\textrm{tot}}$, parameters of the nuclear slope, and the $\rho$-parameter defined as the ratio of the real part to the imaginary part of the elastic-scattering amplitude in the limit $t \rightarrow 0$. These parameters are determined from a fit to the differential elastic cross section using the optical theorem and different parameterizations of the $t$-dependence. The results for $\sigma_{\textrm{tot}}$ and $\rho$ are \begin{equation*} \sigma_{\textrm{tot}}(pp\rightarrow X) = \mbox{104.7} \pm 1.1 \; \mbox{mb} , \; \; \; \rho = \mbox{0.098} \pm 0.011 . \end{equation*} The uncertainty in $\sigma_{\textrm{tot}}$ is dominated by the luminosity measurement, and in $\rho$ by imperfect knowledge of the detector alignment and by modelling of the nuclear amplitude.
The measured total cross section. The systematic uncertainty includes experimental and theoretical uncerainties.
The measured total cross section. The systematic uncertainty includes experimental and theoretical uncerainties.
The rho-parameter, i.e. the ratio of the real to imaginary part of the elastic scattering amplitude extrapolated to t=0. The systematic uncertainty includes experimental and theoretical uncerainties.
The rho-parameter, i.e. the ratio of the real to imaginary part of the elastic scattering amplitude extrapolated to t=0. The systematic uncertainty includes experimental and theoretical uncerainties.
The nuclear slope parameter B from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.
The nuclear slope parameter B from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.
The nuclear slope parameter C from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.
The nuclear slope parameter C from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.
The nuclear slope parameter D from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.
The nuclear slope parameter D from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.
The total elastic cross section measured inside the fiducial volume. The systematic uncertainty includes experimental uncertainties.
The total elastic cross section measured inside the fiducial volume. The systematic uncertainty includes experimental uncertainties.
The total elastic cross section obtained from the fitted parameters, extrapolated to full phase space using only the nuclear amplitude.
The total elastic cross section obtained from the fitted parameters, extrapolated to full phase space using only the nuclear amplitude.
The total inelastic cross section.
The total inelastic cross section.
The ratio of elastic to total cross section.
The ratio of elastic to total cross section.
The differential elastic cross section as function of t with statistical and systematic uncertainties. The systematic uncertainties are given as signed relative change for 20 sources of experimental uncertainty associated to nuisance parameters used in the fit for the extraction of physics parameters.
The differential elastic cross section as function of t with statistical and systematic uncertainties. The systematic uncertainties are given as signed relative change for 20 sources of experimental uncertainty associated to nuisance parameters used in the fit for the extraction of physics parameters.
Statistical covariance matrix for the measurement of the differential elastic cross section as function of t.
Statistical covariance matrix for the measurement of the differential elastic cross section as function of t.
Measurements of distributions of charged particles produced in proton-proton collisions with a centre-of-mass energy of 13 TeV are presented. The data were recorded by the ATLAS detector at the LHC and correspond to an integrated luminosity of 151 $\mu$b$^{-1}$. The particles are required to have a transverse momentum greater than 100 MeV and an absolute pseudorapidity less than 2.5. The charged-particle multiplicity, its dependence on transverse momentum and pseudorapidity and the dependence of the mean transverse momentum on multiplicity are measured in events containing at least two charged particles satisfying the above kinematic criteria. The results are corrected for detector effects and compared to the predictions from several Monte Carlo event generators.
The average charged-particle muliplicity per unit of rapidity for ETARAP=0 as a function of the centre-of-mass energy.
The average charged-particle muliplicity per unit of rapidity for ETARAP=0 as a function of the centre-of-mass energy.
The extrapolated ($\tau > 30$ ps) average charged-particle muliplicity per unit of rapidity for ETARAP=0 as a function of the centre-of-mass energy.
The extrapolated ($\tau > 30$ ps) average charged-particle muliplicity per unit of rapidity for ETARAP=0 as a function of the centre-of-mass energy.
Charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of pseudorapidity for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.
Charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of pseudorapidity for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.
Charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of transverse momentum for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.
Charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of transverse momentum for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.
Charged-particle multiplicity distribution in proton-proton collisions at a centre-of mass energy of 13000 GeV for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.
Charged-particle multiplicity distribution in proton-proton collisions at a centre-of mass energy of 13000 GeV for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.
Average transverse momentum in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of the number of charged particles in the event for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.
Average transverse momentum in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of the number of charged particles in the event for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.
Extrapolated ($\tau > 30$ ps) charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of pseudorapidity for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.
Extrapolated ($\tau > 30$ ps) charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of pseudorapidity for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.
Extrapolated ($\tau > 30$ ps) charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of transverse momentum for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.
Extrapolated ($\tau > 30$ ps) charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of transverse momentum for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.
Extrapolated ($\tau > 30$ ps) charged-particle multiplicity distributions in proton-proton collisions at a centre-of mass energy of 13000 GeV for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.
Extrapolated ($\tau > 30$ ps) charged-particle multiplicity distributions in proton-proton collisions at a centre-of mass energy of 13000 GeV for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.
Extrapolated ($\tau > 30$ ps) average transverse momentum in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of the number of charged particles in the event for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.
Extrapolated ($\tau > 30$ ps) average transverse momentum in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of the number of charged particles in the event for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.
This paper presents studies of Bose-Einstein correlations (BEC) in proton-proton collisions at a centre-of-mass energy of 13 TeV, using data from the ATLAS detector at the CERN Large Hadron Collider. Data were collected in a special low-luminosity configuration with a minimum-bias trigger and a high-multiplicity track trigger, accumulating integrated luminosities of 151 $\mu$b$^{-1}$ and 8.4 nb$^{-1}$ respectively. The BEC are measured for pairs of like-sign charged particles, each with $|\eta|$ < 2.5, for two kinematic ranges: the first with particle $p_T$ > 100 MeV and the second with particle $p_T$ > 500 MeV. The BEC parameters, characterizing the source radius and particle correlation strength, are investigated as functions of charged-particle multiplicity (up to 300) and average transverse momentum of the pair (up to 1.5 GeV). The double-differential dependence on charged-particle multiplicity and average transverse momentum of the pair is also studied. The BEC radius is found to be independent of the charged-particle multiplicity for high charged-particle multiplicity (above 100), confirming a previous observation at lower energy. This saturation occurs independent of the transverse momentum of the pair.
Comparison of single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q) and C<sub>2</sub><sup>MC</sup>(Q), with the two-particle double-ratio correlation function, R<sub>2</sub>(Q), for the high-multiplicity track (HMT) events using the opposite hemisphere (OHP) like-charge particles pairs reference sample for k<sub>T</sub> - interval 1000 < k<sub>T</sub> ≤ 1500 MeV.
Comparison of single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q) and C<sub>2</sub><sup>MC</sup>(Q), with the two-particle double-ratio correlation function, R<sub>2</sub>(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k<sub>T</sub> - interval 1000 < k<sub>T</sub> ≤ 1500 MeV.
The Bose-Einstein correlation (BEC) parameter R as a function of n<sub>ch</sub> for MB events using different MC generators in the calculation of R<sub>2</sub>(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.
The Bose-Einstein correlation (BEC) parameter R as a function of n<sub>ch</sub> for HMT events using different MC generators in the calculation of R<sub>2</sub>(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.
The Bose-Einstein correlation (BEC) parameter R as a function of k<sub>T</sub> for MB events using different MC generators in the calculation of R<sub>2</sub>(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.
The Bose-Einstein correlation (BEC) parameter λ as a function of k<sub>T</sub> for MB events using different MC generators in the calculation of R<sub>2</sub>(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.
The two-particle double-ratio correlation function, R<sub>2</sub>(Q), for pp collisions for track p<sub>T</sub> >100 MeV at √s=13 TeV in the multiplicity interval 71 ≤ n<sub>ch</sub> < 80 for the minimum-bias (MB) events. The blue dashed and red solid lines show the results of the exponential and Gaussian fits, respectively. The region excluded from the fits is shown. The statistical uncertainty and the systematic uncertainty for imperfections in the data reconstruction procedure are added in quadrature.
The two-particle double-ratio correlation function, R<sub>2</sub>(Q), for pp collisions for track p<sub>T</sub> >100 MeV at √s=13 TeV in the multiplicity interval 231 ≤ n<sub>ch</sub> < 300 for the high-multiplicity track (HMT) events. The blue dashed and red solid lines show the results of the exponential and Gaussian fits, respectively. The region excluded from the fits is shown. The statistical uncertainty and the systematic uncertainty for imperfections in the data reconstruction procedure are added in quadrature.
The dependence of the correlation strength, λ(m<sub>ch</sub>), on rescaled multiplicity, m<sub>ch</sub>, obtained from the exponential fit of the R<sub>2</sub>(Q) correlation functions for tracks with p<sub>T</sub> > 100 MeV and p<sub>T</sub> > 500 MeV at √s = 13 TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of λ(m<sub>ch</sub>) for p<sub>T</sub> >100 MeV and p<sub>T</sub> >500 MeV, respectively.
The dependence of the correlation strength, λ(m<sub>ch</sub>), on rescaled multiplicity, m<sub>ch</sub>, obtained from the exponential fit of the R<sub>2</sub>(Q) correlation functions for tracks with p<sub>T</sub> > 100 MeV and p<sub>T</sub> > 500 MeV at √s = 13 TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of λ(m<sub>ch</sub>) for p<sub>T</sub> >100 MeV and p<sub>T</sub> >500 MeV, respectively.
The dependence of the correlation strength, λ(m<sub>ch</sub>), on rescaled multiplicity, m<sub>ch</sub>, obtained from the exponential fit of the R<sub>2</sub>(Q) correlation functions for tracks with p<sub>T</sub> > 100 MeV and p<sub>T</sub> > 500 MeV at √s = 13 TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of λ(m<sub>ch</sub>) for p<sub>T</sub> >100 MeV and p<sub>T</sub> >500 MeV, respectively.
The dependence of the correlation strength, λ(m<sub>ch</sub>), on rescaled multiplicity, m<sub>ch</sub>, obtained from the exponential fit of the R<sub>2</sub>(Q) correlation functions for tracks with p<sub>T</sub> > 100 MeV and p<sub>T</sub> > 500 MeV at √s = 13 TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of λ(m<sub>ch</sub>) for p<sub>T</sub> >100 MeV and p<sub>T</sub> >500 MeV, respectively.
The dependence of the source radius, R(m<sub>ch</sub>), on m<sub>ch</sub>. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m<sub>ch</sub>) for ∛m<sub>ch</sub> < 1.2 for p<sub>T</sub> >100 MeV and p<sub>T</sub> >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m<sub>ch</sub> > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m<sub>ch</sub>) for ∛m<sub>ch</sub> > 1.45 with p<sub>T</sub> >100 MeV and for ∛m<sub>ch</sub> > 1.6 with p<sub>T</sub> >500 MeV, respectively.
The dependence of the source radius, R(m<sub>ch</sub>), on m<sub>ch</sub>. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m<sub>ch</sub>) for ∛m<sub>ch</sub> < 1.2 for p<sub>T</sub> >100 MeV and p<sub>T</sub> >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m<sub>ch</sub> > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m<sub>ch</sub>) for ∛m<sub>ch</sub> > 1.45 with p<sub>T</sub> >100 MeV and for ∛m<sub>ch</sub> > 1.6 with p<sub>T</sub> >500 MeV, respectively.
The dependence of the source radius, R(m<sub>ch</sub>), on m<sub>ch</sub>. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m<sub>ch</sub>) for ∛m<sub>ch</sub> < 1.2 for p<sub>T</sub> >100 MeV and p<sub>T</sub> >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m<sub>ch</sub> > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m<sub>ch</sub>) for ∛m<sub>ch</sub> > 1.45 with p<sub>T</sub> >100 MeV and for ∛m<sub>ch</sub> > 1.6 with p<sub>T</sub> >500 MeV, respectively.
The dependence of the source radius, R(m<sub>ch</sub>), on m<sub>ch</sub>. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m<sub>ch</sub>) for ∛m<sub>ch</sub> < 1.2 for p<sub>T</sub> >100 MeV and p<sub>T</sub> >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m<sub>ch</sub> > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m<sub>ch</sub>) for ∛m<sub>ch</sub> > 1.45 with p<sub>T</sub> >100 MeV and for ∛m<sub>ch</sub> > 1.6 with p<sub>T</sub> >500 MeV, respectively.
The dependence of the R(m<sub>ch</sub>) on ∛m<sub>ch</sub>. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m<sub>ch</sub>) for ∛m<sub>ch</sub> < 1.2 for p<sub>T</sub> >100 MeV and p<sub>T</sub> >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m<sub>ch</sub> > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m<sub>ch</sub>) for ∛m<sub>ch</sub> > 1.45 with p<sub>T</sub> >100 MeV and for ∛m<sub>ch</sub> > 1.6 with p<sub>T</sub> >500 MeV, respectively
The dependence of the R(m<sub>ch</sub>) on ∛m<sub>ch</sub>. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m<sub>ch</sub>) for ∛m<sub>ch</sub> < 1.2 for p<sub>T</sub> >100 MeV and p<sub>T</sub> >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m<sub>ch</sub> > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m<sub>ch</sub>) for ∛m<sub>ch</sub> > 1.45 with p<sub>T</sub> >100 MeV and for ∛m<sub>ch</sub> > 1.6 with p<sub>T</sub> >500 MeV, respectively
The dependence of the R(m<sub>ch</sub>) on ∛m<sub>ch</sub>. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m<sub>ch</sub>) for ∛m<sub>ch</sub> < 1.2 for p<sub>T</sub> >100 MeV and p<sub>T</sub> >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m<sub>ch</sub> > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m<sub>ch</sub>) for ∛m<sub>ch</sub> > 1.45 with p<sub>T</sub> >100 MeV and for ∛m<sub>ch</sub> > 1.6 with p<sub>T</sub> >500 MeV, respectively
The dependence of the R(m<sub>ch</sub>) on ∛m<sub>ch</sub>. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m<sub>ch</sub>) for ∛m<sub>ch</sub> < 1.2 for p<sub>T</sub> >100 MeV and p<sub>T</sub> >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m<sub>ch</sub> > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m<sub>ch</sub>) for ∛m<sub>ch</sub> > 1.45 with p<sub>T</sub> >100 MeV and for ∛m<sub>ch</sub> > 1.6 with p<sub>T</sub> >500 MeV, respectively
Comparison of single-ratio two-particle correlation functions, using the unlike-charge particle (UCP) pair reference sample, for minimum-bias (MB) events, showing C<sub>2</sub><sup>data</sup>(Q) (top panel) at 13 TeV (black circles) and 7 TeV (open blue circles), and the ratio of C<sub>2</sub><sup>7 TeV</sup> (Q) to C<sub>2</sub><sup>13 TeV</sup> (Q) (bottom panel). Comparison of C<sub>2</sub><sup>data</sup> (Q) for representative multiplicity region 3.09 < m<sub>ch</sub> ≤ 3.86. The statistical and systematic uncertainties, combined in quadrature, are presented. The systematic uncertainties include track efficiency, Coulomb correction, non-closure and multiplicity-unfolding uncertainties.
Comparison of single-ratio two-particle correlation functions, using the unlike-charge particle (UCP) pair reference sample, for minimum-bias (MB) events, showing C<sub>2</sub><sup>data</sup>(Q) (top panel) at 13 TeV (black circles) and 7 TeV (open blue circles), and the ratio of C<sub>2</sub><sup>7 TeV</sup> (Q) to C<sub>2</sub><sup>13 TeV</sup> (Q) (bottom panel). Comparison of C<sub>2</sub><sup>data</sup> (Q) for representative k<sub>T</sub> region 400 < k<sub>T</sub> ≤500 MeV. The statistical and systematic uncertainties, combined in quadrature, are presented. The systematic uncertainties include track efficiency, Coulomb correction, non-closure and multiplicity-unfolding uncertainties.
The k<sub>T</sub> dependence of the correlation strength, λ(k<sub>T</sub>), obtained from the exponential fit to the R<sub>2</sub>(Q) correlation functions for events with multiplicity n<sub>ch</sub> ≥ 2 and transfer momentum of tracks with p<sub>T</sub> >100 MeV and p<sub>T</sub> >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to λ(k<sub>T</sub>).
The k<sub>T</sub> dependence of the correlation strength, λ(k<sub>T</sub>), obtained from the exponential fit to the R<sub>2</sub>(Q) correlation functions for events with multiplicity n<sub>ch</sub> ≥ 2 and transfer momentum of tracks with p<sub>T</sub> >100 MeV and p<sub>T</sub> >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to λ(k<sub>T</sub>).
The k<sub>T</sub> dependence of the correlation strength, λ(k<sub>T</sub>), obtained from the exponential fit to the R<sub>2</sub>(Q) correlation functions for events with multiplicity n<sub>ch</sub> ≥ 2 and transfer momentum of tracks with p<sub>T</sub> >100 MeV and p<sub>T</sub> >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to λ(k<sub>T</sub>).
The k<sub>T</sub> dependence of the correlation strength, λ(k<sub>T</sub>), obtained from the exponential fit to the R<sub>2</sub>(Q) correlation functions for events with multiplicity n<sub>ch</sub> ≥ 2 and transfer momentum of tracks with p<sub>T</sub> >100 MeV and p<sub>T</sub> >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to λ(k<sub>T</sub>).
The k<sub>T</sub> dependence of the source radius, R(k<sub>T</sub>), obtained from the exponential fit to the R<sub>2</sub>(Q) correlation functions for events with multiplicity n<sub>ch</sub> ≥ 2 and transfer momentum of tracks with p<sub>T</sub> >100 MeV and p<sub>T</sub> >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k<sub>T</sub>).
The k<sub>T</sub> dependence of the source radius, R(k<sub>T</sub>), obtained from the exponential fit to the R<sub>2</sub>(Q) correlation functions for events with multiplicity n<sub>ch</sub> ≥ 2 and transfer momentum of tracks with p<sub>T</sub> >100 MeV and p<sub>T</sub> >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k<sub>T</sub>).
The k<sub>T</sub> dependence of the source radius, R(k<sub>T</sub>), obtained from the exponential fit to the R<sub>2</sub>(Q) correlation functions for events with multiplicity n<sub>ch</sub> ≥ 2 and transfer momentum of tracks with p<sub>T</sub> >100 MeV and p<sub>T</sub> >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k<sub>T</sub>).
The k<sub>T</sub> dependence of the source radius, R(k<sub>T</sub>), obtained from the exponential fit to the R<sub>2</sub>(Q) correlation functions for events with multiplicity n<sub>ch</sub> ≥ 2 and transfer momentum of tracks with p<sub>T</sub> >100 MeV and p<sub>T</sub> >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k<sub>T</sub>).
The two-dimensional dependence on m<sub>ch</sub> and k<sub>T</sub> for p<sub>T</sub> > 100 MeV for the correlation strength, λ, obtained from the exponential fit to the R<sub>2</sub>(Q) correlation functions using the MB sample for m<sub>ch</sub> ≤ 3.08 and the HMT sample for m<sub>ch</sub> > 3.08.
The two-dimensional dependence on m<sub>ch</sub> and k<sub>T</sub> for p<sub>T</sub> > 100 MeV for the source radius, R, obtained from the exponential fit to the R<sub>2</sub>(Q) correlation functions using the MB sample for m<sub>ch</sub> ≤ 3.08 and the HMT sample for m<sub>ch</sub> > 3.08.
The parameter λ for p<sub>T</sub> > 100 MeV as a function of k<sub>T</sub> in selected low m<sub>ch</sub> intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter λ for p<sub>T</sub> > 100 MeV as a function of k<sub>T</sub> in selected low m<sub>ch</sub> intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter λ for p<sub>T</sub> > 100 MeV as a function of k<sub>T</sub> in selected high m<sub>ch</sub> intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter λ for p<sub>T</sub> > 100 MeV as a function of k<sub>T</sub> in selected high m<sub>ch</sub> intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter λ for p<sub>T</sub> > 100 MeV as a function of m<sub>ch</sub> in k<sub>T</sub> intervals between 0.1 and 0.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter λ for p<sub>T</sub> > 100 MeV as a function of m<sub>ch</sub> in k<sub>T</sub> intervals between 0.1 and 0.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter λ for p<sub>T</sub> > 100 MeV as a function of m<sub>ch</sub> in k<sub>T</sub> intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter λ for p<sub>T</sub> > 100 MeV as a function of m<sub>ch</sub> in k<sub>T</sub> intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter R for p<sub>T</sub> > 100 MeV as a function of k<sub>T</sub> in selected low m<sub>ch</sub> intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter R for p<sub>T</sub> > 100 MeV as a function of k<sub>T</sub> in selected low m<sub>ch</sub> intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter R for p<sub>T</sub> > 100 MeV as a function of k<sub>T</sub> in selected high m<sub>ch</sub> intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter R for p<sub>T</sub> > 100 MeV as a function of k<sub>T</sub> in selected high m<sub>ch</sub> intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter R for p<sub>T</sub> > 100 MeV as a function of m<sub>ch</sub> in k<sub>T</sub> intervals between 0.1 and 0.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter R for p<sub>T</sub> > 100 MeV as a function of m<sub>ch</sub> in k<sub>T</sub> intervals between 0.1 and 0.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter R for p<sub>T</sub> > 100 MeV as a function of m<sub>ch</sub> in k<sub>T</sub> intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter R for p<sub>T</sub> > 100 MeV as a function of m<sub>ch</sub> in k<sub>T</sub> intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.
The fit parameter μ describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p<sub>T</sub>>100 MeV and track p<sub>T</sub>>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter μ on m<sub>ch</sub> for tracks with p<sub>T</sub> >100 MeV (p<sub>T</sub> >500 MeV).
The fit parameter μ describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p<sub>T</sub>>100 MeV and track p<sub>T</sub>>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter μ on m<sub>ch</sub> for tracks with p<sub>T</sub> >100 MeV (p<sub>T</sub> >500 MeV).
The fit parameter μ describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p<sub>T</sub>>100 MeV and track p<sub>T</sub>>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter μ on m<sub>ch</sub> for tracks with p<sub>T</sub> >100 MeV (p<sub>T</sub> >500 MeV).
The fit parameter μ describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p<sub>T</sub>>100 MeV and track p<sub>T</sub>>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter μ on m<sub>ch</sub> for tracks with p<sub>T</sub> >100 MeV (p<sub>T</sub> >500 MeV).
The fit parameter ν describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p<sub>T</sub>>100 MeV and track p<sub>T</sub>>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter ν on m<sub>ch</sub> for tracks with p<sub>T</sub> >100 MeV (p<sub>T</sub> >500 MeV).
The fit parameter ν describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p<sub>T</sub>>100 MeV and track p<sub>T</sub>>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter ν on m<sub>ch</sub> for tracks with p<sub>T</sub> >100 MeV (p<sub>T</sub> >500 MeV).
The fit parameter ν describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p<sub>T</sub>>100 MeV and track p<sub>T</sub>>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter ν on m<sub>ch</sub> for tracks with p<sub>T</sub> >100 MeV (p<sub>T</sub> >500 MeV).
The fit parameter ν describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p<sub>T</sub>>100 MeV and track p<sub>T</sub>>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter ν on m<sub>ch</sub> for tracks with p<sub>T</sub> >100 MeV (p<sub>T</sub> >500 MeV).
The parameter ξ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m<sub>ch</sub>, for track p<sub>T</sub>>100 MeV and track p<sub>T</sub>>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter ξ for m<sub>ch</sub> > 3.0 for tracks with p<sub>T</sub> >100 MeV and for m<sub>ch</sub> > 2.8 for tracks with p<sub>T</sub> >500 MeV, respectively.
The parameter ξ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m<sub>ch</sub>, for track p<sub>T</sub>>100 MeV and track p<sub>T</sub>>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter ξ for m<sub>ch</sub> > 3.0 for tracks with p<sub>T</sub> >100 MeV and for m<sub>ch</sub> > 2.8 for tracks with p<sub>T</sub> >500 MeV, respectively.
The parameter ξ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m<sub>ch</sub>, for track p<sub>T</sub>>100 MeV and track p<sub>T</sub>>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter ξ for m<sub>ch</sub> > 3.0 for tracks with p<sub>T</sub> >100 MeV and for m<sub>ch</sub> > 2.8 for tracks with p<sub>T</sub> >500 MeV, respectively.
The parameter ξ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m<sub>ch</sub>, for track p<sub>T</sub>>100 MeV and track p<sub>T</sub>>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter ξ for m<sub>ch</sub> > 3.0 for tracks with p<sub>T</sub> >100 MeV and for m<sub>ch</sub> > 2.8 for tracks with p<sub>T</sub> >500 MeV, respectively.
The parameter κ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m<sub>ch</sub>, for track p<sub>T</sub>>100 MeV and track p<sub>T</sub>>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter κ for tracks with p<sub>T</sub> >100 MeV and for tracks with p<sub>T</sub> >500 MeV, respectively.
The parameter κ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m<sub>ch</sub>, for track p<sub>T</sub>>100 MeV and track p<sub>T</sub>>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter κ for tracks with p<sub>T</sub> >100 MeV and for tracks with p<sub>T</sub> >500 MeV, respectively.
The parameter κ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m<sub>ch</sub>, for track p<sub>T</sub>>100 MeV and track p<sub>T</sub>>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter κ for tracks with p<sub>T</sub> >100 MeV and for tracks with p<sub>T</sub> >500 MeV, respectively.
The parameter κ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m<sub>ch</sub>, for track p<sub>T</sub>>100 MeV and track p<sub>T</sub>>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter κ for tracks with p<sub>T</sub> >100 MeV and for tracks with p<sub>T</sub> >500 MeV, respectively.
The two-dimensional dependence on m<sub>ch</sub> and k<sub>T</sub> for p<sub>T</sub> > 500 MeV for the correlation strength, λ, obtained from the exponential fit to the R<sub>2</sub>(Q) correlation functions using the MB sample for m<sub>ch</sub> ≤ 3.08 and the HMT sample for m<sub>ch</sub> > 3.08.
The two-dimensional dependence on m<sub>ch</sub> and k<sub>T</sub> for p<sub>T</sub> > 500 MeV for the source radius, R, obtained from the exponential fit to the R<sub>2</sub>(Q) correlation functions using the MB sample for m<sub>ch</sub> ≤ 3.08 and the HMT sample for m<sub>ch</sub> > 3.08.
The parameter λ for p<sub>T</sub> > 500 MeV as a function of k<sub>T</sub> in selected low m<sub>ch</sub> intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter λ for p<sub>T</sub> > 500 MeV as a function of k<sub>T</sub> in selected low m<sub>ch</sub> intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter λ for p<sub>T</sub> > 500 MeV as a function of k<sub>T</sub> in selected high m<sub>ch</sub> intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter λ for p<sub>T</sub> > 500 MeV as a function of k<sub>T</sub> in selected high m<sub>ch</sub> intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter λ for p<sub>T</sub> > 500 MeV as a function of m<sub>ch</sub> in k<sub>T</sub> intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter λ for p<sub>T</sub> > 500 MeV as a function of m<sub>ch</sub> in k<sub>T</sub> intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter R for p<sub>T</sub> > 500 MeV as a function of k<sub>T</sub> in selected low m<sub>ch</sub> intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter R for p<sub>T</sub> > 500 MeV as a function of k<sub>T</sub> in selected low m<sub>ch</sub> intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter R for p<sub>T</sub> > 500 MeV as a function of k<sub>T</sub> in selected high m<sub>ch</sub> intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter R for p<sub>T</sub> > 500 MeV as a function of k<sub>T</sub> in selected high m<sub>ch</sub> intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter R for p<sub>T</sub> > 500 MeV as a function of m<sub>ch</sub> in k<sub>T</sub> intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.
The parameter R for p<sub>T</sub> > 500 MeV as a function of m<sub>ch</sub> in k<sub>T</sub> intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.
ATLAS and CMS results for the source radius R as a function of n<sub>ch</sub> in pp interactions at 13 TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region∶ p<sub>T</sub> > 100 MeV and |η|<2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to ∛n<sub>ch</sub> at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.
ATLAS and CMS results for the source radius R as a function of n<sub>ch</sub> in pp interactions at 13 TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region∶ p<sub>T</sub> > 100 MeV and |η|<2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to ∛n<sub>ch</sub> at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.
ATLAS and CMS results for the source radius R as a function of n<sub>ch</sub> in pp interactions at 13 TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region∶ p<sub>T</sub> > 100 MeV and |η|<2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to ∛n<sub>ch</sub> at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.
ATLAS and CMS results for the source radius R as a function of ∛n<sub>ch</sub> in pp interactions at 13 TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region∶ p<sub>T</sub> > 100 MeV and |η|<2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to ∛n<sub>ch</sub> at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.
ATLAS and CMS results for the source radius R as a function of ∛n<sub>ch</sub> in pp interactions at 13 TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region∶ p<sub>T</sub> > 100 MeV and |η|<2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to ∛n<sub>ch</sub> at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.
ATLAS and CMS results for the source radius R as a function of ∛n<sub>ch</sub> in pp interactions at 13 TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region∶ p<sub>T</sub> > 100 MeV and |η|<2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to ∛n<sub>ch</sub> at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.
Systematic uncertainties (in percent) in the correlation strength, λ, and source radius, R, for the exponential fit of the two-particle double-ratio correlation functions, R<sub>2</sub>(Q), for p<sub>T</sub> > 100 MeV at √s= 13 TeV for the MB and HMT events. The choice of MC generator gives rise to asymmetric uncertainties, denoted by uparrow and downarrow. This asymmetry propagates through to the cumulative uncertainty. The columns under ‘Uncertainty range’ show the range of systematic uncertainty from the fits in the various n<sub>ch</sub> intervals.
The results of the fits to the dependencies of the correlation strength, λ, and source radius, R, on the average rescaled charged-particle multiplicity, m<sub>ch</sub>, for |η| < 2.5 and both p<sub>T</sub> > 100 MeV and p<sub>T</sub> > 500 MeV at √s = 13 TeV for the minimum-bias (MB) and the high-multiplicity track (HMT) events. The parameters γ and δ resulting from a joint fit to the MB and HMT data are presented. The total uncertainties are shown.
The results of the fits to the dependencies of the correlation strength, λ, and source radius, R, on the pair average transverse momentum, k<sub>T</sub>, for various functional forms and for minimum-bias (MB) and high-multiplicity track (HMT) events for p<sub>T</sub> > 100 MeV and p<sub>T</sub> > 500 MeV at √s = 13 TeV. The total uncertainties are shown.
The Bose-Einstein correlation (BEC) parameters λ and R as a function of n<sub>ch</sub> and k<sub>T</sub> using different MC generators in the calculation of R<sub>2</sub>(Q). (a) λ versus n<sub>ch</sub> for MB events, (b) λ versus n<sub>ch</sub> for HMT events, (c) λ versus k<sub>T</sub> and (d) R versus k<sub>T</sub> for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.
The Bose-Einstein correlation (BEC) parameters λ and R as a function of n<sub>ch</sub> and k<sub>T</sub> using different MC generators in the calculation of R<sub>2</sub>(Q). (a) λ versus n<sub>ch</sub> for MB events, (b) λ versus n<sub>ch</sub> for HMT events, (c) λ versus k<sub>T</sub> and (d) R versus k<sub>T</sub> for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.
The Bose-Einstein correlation (BEC) parameters λ and R as a function of n<sub>ch</sub> and k<sub>T</sub> using different MC generators in the calculation of R<sub>2</sub>(Q). (a) λ versus n<sub>ch</sub> for MB events, (b) λ versus n<sub>ch</sub> for HMT events, (c) λ versus k<sub>T</sub> and (d) R versus k<sub>T</sub> for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.
The Bose-Einstein correlation (BEC) parameters λ and R as a function of n<sub>ch</sub> and k<sub>T</sub> using different MC generators in the calculation of R<sub>2</sub>(Q). (a) λ versus n<sub>ch</sub> for MB events, (b) λ versus n<sub>ch</sub> for HMT events, (c) λ versus k<sub>T</sub> and (d) R versus k<sub>T</sub> for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 2 < n<sub>ch</sub> ≤ 10, (b) 11 < n<sub>ch</sub> ≤ 20, (c) 21 < n<sub>ch</sub> ≤ 30, (d) 31 < n<sub>ch</sub> ≤ 40, (e) 41 < n<sub>ch</sub> ≤ 50, (f) 51 < n<sub>ch</sub> ≤ 60, (g) 61 < n<sub>ch</sub> ≤ 70, (h) 71 < n<sub>ch</sub> ≤ 80 and (i) 81 < n<sub>ch</sub> ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 2 < n<sub>ch</sub> ≤ 10, (b) 11 < n<sub>ch</sub> ≤ 20, (c) 21 < n<sub>ch</sub> ≤ 30, (d) 31 < n<sub>ch</sub> ≤ 40, (e) 41 < n<sub>ch</sub> ≤ 50, (f) 51 < n<sub>ch</sub> ≤ 60, (g) 61 < n<sub>ch</sub> ≤ 70, (h) 71 < n<sub>ch</sub> ≤ 80 and (i) 81 < n<sub>ch</sub> ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 2 < n<sub>ch</sub> ≤ 10, (b) 11 < n<sub>ch</sub> ≤ 20, (c) 21 < n<sub>ch</sub> ≤ 30, (d) 31 < n<sub>ch</sub> ≤ 40, (e) 41 < n<sub>ch</sub> ≤ 50, (f) 51 < n<sub>ch</sub> ≤ 60, (g) 61 < n<sub>ch</sub> ≤ 70, (h) 71 < n<sub>ch</sub> ≤ 80 and (i) 81 < n<sub>ch</sub> ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 2 < n<sub>ch</sub> ≤ 10, (b) 11 < n<sub>ch</sub> ≤ 20, (c) 21 < n<sub>ch</sub> ≤ 30, (d) 31 < n<sub>ch</sub> ≤ 40, (e) 41 < n<sub>ch</sub> ≤ 50, (f) 51 < n<sub>ch</sub> ≤ 60, (g) 61 < n<sub>ch</sub> ≤ 70, (h) 71 < n<sub>ch</sub> ≤ 80 and (i) 81 < n<sub>ch</sub> ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 2 < n<sub>ch</sub> ≤ 10, (b) 11 < n<sub>ch</sub> ≤ 20, (c) 21 < n<sub>ch</sub> ≤ 30, (d) 31 < n<sub>ch</sub> ≤ 40, (e) 41 < n<sub>ch</sub> ≤ 50, (f) 51 < n<sub>ch</sub> ≤ 60, (g) 61 < n<sub>ch</sub> ≤ 70, (h) 71 < n<sub>ch</sub> ≤ 80 and (i) 81 < n<sub>ch</sub> ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 2 < n<sub>ch</sub> ≤ 10, (b) 11 < n<sub>ch</sub> ≤ 20, (c) 21 < n<sub>ch</sub> ≤ 30, (d) 31 < n<sub>ch</sub> ≤ 40, (e) 41 < n<sub>ch</sub> ≤ 50, (f) 51 < n<sub>ch</sub> ≤ 60, (g) 61 < n<sub>ch</sub> ≤ 70, (h) 71 < n<sub>ch</sub> ≤ 80 and (i) 81 < n<sub>ch</sub> ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 2 < n<sub>ch</sub> ≤ 10, (b) 11 < n<sub>ch</sub> ≤ 20, (c) 21 < n<sub>ch</sub> ≤ 30, (d) 31 < n<sub>ch</sub> ≤ 40, (e) 41 < n<sub>ch</sub> ≤ 50, (f) 51 < n<sub>ch</sub> ≤ 60, (g) 61 < n<sub>ch</sub> ≤ 70, (h) 71 < n<sub>ch</sub> ≤ 80 and (i) 81 < n<sub>ch</sub> ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 2 < n<sub>ch</sub> ≤ 10, (b) 11 < n<sub>ch</sub> ≤ 20, (c) 21 < n<sub>ch</sub> ≤ 30, (d) 31 < n<sub>ch</sub> ≤ 40, (e) 41 < n<sub>ch</sub> ≤ 50, (f) 51 < n<sub>ch</sub> ≤ 60, (g) 61 < n<sub>ch</sub> ≤ 70, (h) 71 < n<sub>ch</sub> ≤ 80 and (i) 81 < n<sub>ch</sub> ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 2 < n<sub>ch</sub> ≤ 10, (b) 11 < n<sub>ch</sub> ≤ 20, (c) 21 < n<sub>ch</sub> ≤ 30, (d) 31 < n<sub>ch</sub> ≤ 40, (e) 41 < n<sub>ch</sub> ≤ 50, (f) 51 < n<sub>ch</sub> ≤ 60, (g) 61 < n<sub>ch</sub> ≤ 70, (h) 71 < n<sub>ch</sub> ≤ 80 and (i) 81 < n<sub>ch</sub> ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 91 < n<sub>ch</sub> ≤ 100, (b) 101 < n<sub>ch</sub> ≤ 125, (c) 126 < n<sub>ch</sub> ≤ 150, (d) 151 < n<sub>ch</sub> ≤ 200, (e) 201 < n<sub>ch</sub> ≤ 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 91 < n<sub>ch</sub> ≤ 100, (b) 101 < n<sub>ch</sub> ≤ 125, (c) 126 < n<sub>ch</sub> ≤ 150, (d) 151 < n<sub>ch</sub> ≤ 200, (e) 201 < n<sub>ch</sub> ≤ 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 91 < n<sub>ch</sub> ≤ 100, (b) 101 < n<sub>ch</sub> ≤ 125, (c) 126 < n<sub>ch</sub> ≤ 150, (d) 151 < n<sub>ch</sub> ≤ 200, (e) 201 < n<sub>ch</sub> ≤ 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 91 < n<sub>ch</sub> ≤ 100, (b) 101 < n<sub>ch</sub> ≤ 125, (c) 126 < n<sub>ch</sub> ≤ 150, (d) 151 < n<sub>ch</sub> ≤ 200, (e) 201 < n<sub>ch</sub> ≤ 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 91 < n<sub>ch</sub> ≤ 100, (b) 101 < n<sub>ch</sub> ≤ 125, (c) 126 < n<sub>ch</sub> ≤ 150, (d) 151 < n<sub>ch</sub> ≤ 200, (e) 201 < n<sub>ch</sub> ≤ 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 101 < n<sub>ch</sub> ≤ 110, (b) 111 < n<sub>ch</sub> ≤ 120, (c) 121 < n<sub>ch</sub> ≤ 130, (d) 131 < n<sub>ch</sub> ≤ 140, (e) 141 < n<sub>ch</sub> ≤ 155, (f) 156 < n<sub>ch</sub> ≤ 175, (g) 176 < n<sub>ch</sub> ≤ 200, (h) 201 < n<sub>ch</sub> ≤ 230 and (i) 231 < n<sub>ch</sub> ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 101 < n<sub>ch</sub> ≤ 110, (b) 111 < n<sub>ch</sub> ≤ 120, (c) 121 < n<sub>ch</sub> ≤ 130, (d) 131 < n<sub>ch</sub> ≤ 140, (e) 141 < n<sub>ch</sub> ≤ 155, (f) 156 < n<sub>ch</sub> ≤ 175, (g) 176 < n<sub>ch</sub> ≤ 200, (h) 201 < n<sub>ch</sub> ≤ 230 and (i) 231 < n<sub>ch</sub> ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 101 < n<sub>ch</sub> ≤ 110, (b) 111 < n<sub>ch</sub> ≤ 120, (c) 121 < n<sub>ch</sub> ≤ 130, (d) 131 < n<sub>ch</sub> ≤ 140, (e) 141 < n<sub>ch</sub> ≤ 155, (f) 156 < n<sub>ch</sub> ≤ 175, (g) 176 < n<sub>ch</sub> ≤ 200, (h) 201 < n<sub>ch</sub> ≤ 230 and (i) 231 < n<sub>ch</sub> ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 101 < n<sub>ch</sub> ≤ 110, (b) 111 < n<sub>ch</sub> ≤ 120, (c) 121 < n<sub>ch</sub> ≤ 130, (d) 131 < n<sub>ch</sub> ≤ 140, (e) 141 < n<sub>ch</sub> ≤ 155, (f) 156 < n<sub>ch</sub> ≤ 175, (g) 176 < n<sub>ch</sub> ≤ 200, (h) 201 < n<sub>ch</sub> ≤ 230 and (i) 231 < n<sub>ch</sub> ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 101 < n<sub>ch</sub> ≤ 110, (b) 111 < n<sub>ch</sub> ≤ 120, (c) 121 < n<sub>ch</sub> ≤ 130, (d) 131 < n<sub>ch</sub> ≤ 140, (e) 141 < n<sub>ch</sub> ≤ 155, (f) 156 < n<sub>ch</sub> ≤ 175, (g) 176 < n<sub>ch</sub> ≤ 200, (h) 201 < n<sub>ch</sub> ≤ 230 and (i) 231 < n<sub>ch</sub> ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 101 < n<sub>ch</sub> ≤ 110, (b) 111 < n<sub>ch</sub> ≤ 120, (c) 121 < n<sub>ch</sub> ≤ 130, (d) 131 < n<sub>ch</sub> ≤ 140, (e) 141 < n<sub>ch</sub> ≤ 155, (f) 156 < n<sub>ch</sub> ≤ 175, (g) 176 < n<sub>ch</sub> ≤ 200, (h) 201 < n<sub>ch</sub> ≤ 230 and (i) 231 < n<sub>ch</sub> ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 101 < n<sub>ch</sub> ≤ 110, (b) 111 < n<sub>ch</sub> ≤ 120, (c) 121 < n<sub>ch</sub> ≤ 130, (d) 131 < n<sub>ch</sub> ≤ 140, (e) 141 < n<sub>ch</sub> ≤ 155, (f) 156 < n<sub>ch</sub> ≤ 175, (g) 176 < n<sub>ch</sub> ≤ 200, (h) 201 < n<sub>ch</sub> ≤ 230 and (i) 231 < n<sub>ch</sub> ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 101 < n<sub>ch</sub> ≤ 110, (b) 111 < n<sub>ch</sub> ≤ 120, (c) 121 < n<sub>ch</sub> ≤ 130, (d) 131 < n<sub>ch</sub> ≤ 140, (e) 141 < n<sub>ch</sub> ≤ 155, (f) 156 < n<sub>ch</sub> ≤ 175, (g) 176 < n<sub>ch</sub> ≤ 200, (h) 201 < n<sub>ch</sub> ≤ 230 and (i) 231 < n<sub>ch</sub> ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 101 < n<sub>ch</sub> ≤ 110, (b) 111 < n<sub>ch</sub> ≤ 120, (c) 121 < n<sub>ch</sub> ≤ 130, (d) 131 < n<sub>ch</sub> ≤ 140, (e) 141 < n<sub>ch</sub> ≤ 155, (f) 156 < n<sub>ch</sub> ≤ 175, (g) 176 < n<sub>ch</sub> ≤ 200, (h) 201 < n<sub>ch</sub> ≤ 230 and (i) 231 < n<sub>ch</sub> ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 2 < n<sub>ch</sub> ≤ 9, (b) 10 < n<sub>ch</sub> ≤ 18, (c) 19 < n<sub>ch</sub> ≤ 27, (d) 28 < n<sub>ch</sub> ≤ 36, (e) 37 < n<sub>ch</sub> ≤ 45, (f) 46 < n<sub>ch</sub> ≤ 54, (g) 55 < n<sub>ch</sub> ≤ 63, (h) 64 < n<sub>ch</sub> ≤ 72, (i) 73 < n<sub>ch</sub> ≤ 81, (j) 82 < n<sub>ch</sub> ≤ 90, (k) 91 < n<sub>ch</sub> ≤ 113, and (l) 114 < n<sub>ch</sub> ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 2 < n<sub>ch</sub> ≤ 9, (b) 10 < n<sub>ch</sub> ≤ 18, (c) 19 < n<sub>ch</sub> ≤ 27, (d) 28 < n<sub>ch</sub> ≤ 36, (e) 37 < n<sub>ch</sub> ≤ 45, (f) 46 < n<sub>ch</sub> ≤ 54, (g) 55 < n<sub>ch</sub> ≤ 63, (h) 64 < n<sub>ch</sub> ≤ 72, (i) 73 < n<sub>ch</sub> ≤ 81, (j) 82 < n<sub>ch</sub> ≤ 90, (k) 91 < n<sub>ch</sub> ≤ 113, and (l) 114 < n<sub>ch</sub> ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 2 < n<sub>ch</sub> ≤ 9, (b) 10 < n<sub>ch</sub> ≤ 18, (c) 19 < n<sub>ch</sub> ≤ 27, (d) 28 < n<sub>ch</sub> ≤ 36, (e) 37 < n<sub>ch</sub> ≤ 45, (f) 46 < n<sub>ch</sub> ≤ 54, (g) 55 < n<sub>ch</sub> ≤ 63, (h) 64 < n<sub>ch</sub> ≤ 72, (i) 73 < n<sub>ch</sub> ≤ 81, (j) 82 < n<sub>ch</sub> ≤ 90, (k) 91 < n<sub>ch</sub> ≤ 113, and (l) 114 < n<sub>ch</sub> ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 2 < n<sub>ch</sub> ≤ 9, (b) 10 < n<sub>ch</sub> ≤ 18, (c) 19 < n<sub>ch</sub> ≤ 27, (d) 28 < n<sub>ch</sub> ≤ 36, (e) 37 < n<sub>ch</sub> ≤ 45, (f) 46 < n<sub>ch</sub> ≤ 54, (g) 55 < n<sub>ch</sub> ≤ 63, (h) 64 < n<sub>ch</sub> ≤ 72, (i) 73 < n<sub>ch</sub> ≤ 81, (j) 82 < n<sub>ch</sub> ≤ 90, (k) 91 < n<sub>ch</sub> ≤ 113, and (l) 114 < n<sub>ch</sub> ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 2 < n<sub>ch</sub> ≤ 9, (b) 10 < n<sub>ch</sub> ≤ 18, (c) 19 < n<sub>ch</sub> ≤ 27, (d) 28 < n<sub>ch</sub> ≤ 36, (e) 37 < n<sub>ch</sub> ≤ 45, (f) 46 < n<sub>ch</sub> ≤ 54, (g) 55 < n<sub>ch</sub> ≤ 63, (h) 64 < n<sub>ch</sub> ≤ 72, (i) 73 < n<sub>ch</sub> ≤ 81, (j) 82 < n<sub>ch</sub> ≤ 90, (k) 91 < n<sub>ch</sub> ≤ 113, and (l) 114 < n<sub>ch</sub> ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 2 < n<sub>ch</sub> ≤ 9, (b) 10 < n<sub>ch</sub> ≤ 18, (c) 19 < n<sub>ch</sub> ≤ 27, (d) 28 < n<sub>ch</sub> ≤ 36, (e) 37 < n<sub>ch</sub> ≤ 45, (f) 46 < n<sub>ch</sub> ≤ 54, (g) 55 < n<sub>ch</sub> ≤ 63, (h) 64 < n<sub>ch</sub> ≤ 72, (i) 73 < n<sub>ch</sub> ≤ 81, (j) 82 < n<sub>ch</sub> ≤ 90, (k) 91 < n<sub>ch</sub> ≤ 113, and (l) 114 < n<sub>ch</sub> ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 2 < n<sub>ch</sub> ≤ 9, (b) 10 < n<sub>ch</sub> ≤ 18, (c) 19 < n<sub>ch</sub> ≤ 27, (d) 28 < n<sub>ch</sub> ≤ 36, (e) 37 < n<sub>ch</sub> ≤ 45, (f) 46 < n<sub>ch</sub> ≤ 54, (g) 55 < n<sub>ch</sub> ≤ 63, (h) 64 < n<sub>ch</sub> ≤ 72, (i) 73 < n<sub>ch</sub> ≤ 81, (j) 82 < n<sub>ch</sub> ≤ 90, (k) 91 < n<sub>ch</sub> ≤ 113, and (l) 114 < n<sub>ch</sub> ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 2 < n<sub>ch</sub> ≤ 9, (b) 10 < n<sub>ch</sub> ≤ 18, (c) 19 < n<sub>ch</sub> ≤ 27, (d) 28 < n<sub>ch</sub> ≤ 36, (e) 37 < n<sub>ch</sub> ≤ 45, (f) 46 < n<sub>ch</sub> ≤ 54, (g) 55 < n<sub>ch</sub> ≤ 63, (h) 64 < n<sub>ch</sub> ≤ 72, (i) 73 < n<sub>ch</sub> ≤ 81, (j) 82 < n<sub>ch</sub> ≤ 90, (k) 91 < n<sub>ch</sub> ≤ 113, and (l) 114 < n<sub>ch</sub> ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 2 < n<sub>ch</sub> ≤ 9, (b) 10 < n<sub>ch</sub> ≤ 18, (c) 19 < n<sub>ch</sub> ≤ 27, (d) 28 < n<sub>ch</sub> ≤ 36, (e) 37 < n<sub>ch</sub> ≤ 45, (f) 46 < n<sub>ch</sub> ≤ 54, (g) 55 < n<sub>ch</sub> ≤ 63, (h) 64 < n<sub>ch</sub> ≤ 72, (i) 73 < n<sub>ch</sub> ≤ 81, (j) 82 < n<sub>ch</sub> ≤ 90, (k) 91 < n<sub>ch</sub> ≤ 113, and (l) 114 < n<sub>ch</sub> ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 2 < n<sub>ch</sub> ≤ 9, (b) 10 < n<sub>ch</sub> ≤ 18, (c) 19 < n<sub>ch</sub> ≤ 27, (d) 28 < n<sub>ch</sub> ≤ 36, (e) 37 < n<sub>ch</sub> ≤ 45, (f) 46 < n<sub>ch</sub> ≤ 54, (g) 55 < n<sub>ch</sub> ≤ 63, (h) 64 < n<sub>ch</sub> ≤ 72, (i) 73 < n<sub>ch</sub> ≤ 81, (j) 82 < n<sub>ch</sub> ≤ 90, (k) 91 < n<sub>ch</sub> ≤ 113, and (l) 114 < n<sub>ch</sub> ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 2 < n<sub>ch</sub> ≤ 9, (b) 10 < n<sub>ch</sub> ≤ 18, (c) 19 < n<sub>ch</sub> ≤ 27, (d) 28 < n<sub>ch</sub> ≤ 36, (e) 37 < n<sub>ch</sub> ≤ 45, (f) 46 < n<sub>ch</sub> ≤ 54, (g) 55 < n<sub>ch</sub> ≤ 63, (h) 64 < n<sub>ch</sub> ≤ 72, (i) 73 < n<sub>ch</sub> ≤ 81, (j) 82 < n<sub>ch</sub> ≤ 90, (k) 91 < n<sub>ch</sub> ≤ 113, and (l) 114 < n<sub>ch</sub> ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n<sub>ch</sub> - intervals∶ (a) 2 < n<sub>ch</sub> ≤ 9, (b) 10 < n<sub>ch</sub> ≤ 18, (c) 19 < n<sub>ch</sub> ≤ 27, (d) 28 < n<sub>ch</sub> ≤ 36, (e) 37 < n<sub>ch</sub> ≤ 45, (f) 46 < n<sub>ch</sub> ≤ 54, (g) 55 < n<sub>ch</sub> ≤ 63, (h) 64 < n<sub>ch</sub> ≤ 72, (i) 73 < n<sub>ch</sub> ≤ 81, (j) 82 < n<sub>ch</sub> ≤ 90, (k) 91 < n<sub>ch</sub> ≤ 113, and (l) 114 < n<sub>ch</sub> ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The single-ratio two-particle correlation functions, C<sub>2</sub><sup>data</sup>(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k<sub>T</sub> - intervals∶ (a) 100 < k<sub>T</sub> ≤ 200 MeV, (b) 200 < k<sub>T</sub> ≤ 300 MeV, (c) 300 < k<sub>T</sub> ≤ 400 MeV, (d) 400 < k<sub>T</sub> ≤ 500 MeV, (e) 500 < k<sub>T</sub> ≤ 600 MeV, (f) 600 < k<sub>T</sub> ≤ 700 MeV, (g) 700 < k<sub>T</sub> ≤ 1000 MeV, and (h) 1000 < k<sub>T</sub> ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.
The correlation strength, λ, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R<sub>2</sub>(Q), in dependence on the multiplicity, m<sub>ch</sub>, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p<sub>T</sub> > 100 MeV at √s = 13 TeV. Statistical uncertainties for √χ<sup>2</sup>/ndf>1 are corrected by the √χ<sup>2</sup>/ndf. The total uncertainties are shown.
The correlation strength, λ, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R<sub>2</sub>(Q), in dependence on the multiplicity, m<sub>ch</sub>, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p<sub>T</sub> > 500 MeV at √s = 13 TeV. Statistical uncertainties for √χ<sup>2</sup>/ndf>1 are corrected by the √χ<sup>2</sup>/ndf. The total uncertainties are shown.
The correlation strength, λ, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R<sub>2</sub>(Q), in dependence on the pair transverse momentum, k<sub>T</sub>, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p<sub>T</sub> > 100 MeV at √s = 13 TeV. Statistical uncertainties for √χ<sup>2</sup>/ndf>1 are corrected by the √χ<sup>2</sup>/ndf. The total uncertainties are shown.
The correlation strength, λ, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R<sub>2</sub>(Q), in dependence on the pair transverse momentum, k<sub>T</sub>, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p<sub>T</sub> > 500 MeV at √s = 13 TeV. Statistical uncertainties for √χ<sup>2</sup>/ndf>1 are corrected by the √χ<sup>2</sup>/ndf. The total uncertainties are shown.
A data sample containing top quark pairs ($\mathrm{t\bar{t}}$) produced in association with a Lorentz-boosted Z or Higgs boson is used to search for signs of new physics using effective field theory. The data correspond to an integrated luminosity of 138 fb$^{-1}$ of proton-proton collisions produced at a center-of-mass energy of 13 TeV at the LHC and collected by the CMS experiment. Selected events contain a single lepton and hadronic jets, including two identified with the decay of bottom quarks, plus an additional large-radius jet with high transverse momentum identified as a Z or Higgs boson decaying to a bottom quark pair. Machine learning techniques are employed to discriminate between $\mathrm{t\bar{t}}$Z or $\mathrm{t\bar{t}}$H events and events from background processes, which are dominated by $\mathrm{t\bar{t}}$ + jets production. No indications of new physics are observed. The signal strengths of boosted $\mathrm{t\bar{t}}$Z and $\mathrm{t\bar{t}}$H production are measured, and upper limits are placed on the $\mathrm{t\bar{t}}$Z and $\mathrm{t\bar{t}}$H differential cross sections as functions of the Z or Higgs boson transverse momentum. The effects of new physics are probed using a framework in which the standard model is considered to be the low-energy effective field theory of a higher energy scale theory. Eight possible dimension-six operators are added to the standard model Lagrangian and their corresponding coefficients are constrained via fits to the data.
Negative log-likelihood difference in $\mu_{\text{ttH}}, \mu_{\text{ttZ}}$ for a Z or Higgs boson with a simulated pT $> 200$GeV
Negative log-likelihood difference in $\text{c}_{\text{t}\varphi}$ where the other Wilson coefficients are fixed to 0.
Negative log-likelihood difference in $\text{c}_{\varphi\text{Q}}^{-}$ where the other Wilson coefficients are fixed to 0.
Negative log-likelihood difference in $\text{c}_{\varphi\text{Q}}^{3}$ where the other Wilson coefficients are fixed to 0.
Negative log-likelihood difference in $\text{c}_{\varphi\text{t}}$ where the other Wilson coefficients are fixed to 0.
Negative log-likelihood difference in $\text{c}_{\varphi\text{tb}}$ where the other Wilson coefficients are fixed to 0.
Negative log-likelihood difference in $\text{c}_{\text{tW}}$ where the other Wilson coefficients are fixed to 0.
Negative log-likelihood difference in $\text{c}_{\text{bW}}$ where the other Wilson coefficients are fixed to 0.
Negative log-likelihood difference in $\text{c}_{\text{tZ}}$ where the other Wilson coefficients are fixed to 0.
Negative log-likelihood difference in $\text{c}_{\text{t}\varphi}$ where the other Wilson coefficients are simultaneously fit.
Negative log-likelihood difference in $\text{c}_{\varphi\text{Q}}^{-}$ where the other Wilson coefficients are simultaneously fit.
Negative log-likelihood difference in $\text{c}_{\varphi\text{Q}}^{3}$ where the other Wilson coefficients are simultaneously fit.
Negative log-likelihood difference in $\text{c}_{\varphi\text{t}}$ where the other Wilson coefficients are simultaneously fit.
Negative log-likelihood difference in $\text{c}_{\varphi\text{tb}}$ where the other Wilson coefficients are simultaneously fit.
Negative log-likelihood difference in $\text{c}_{\text{tW}}$ where the other Wilson coefficients are simultaneously fit.
Negative log-likelihood difference in $\text{c}_{\text{bW}}$ where the other Wilson coefficients are simultaneously fit.
Negative log-likelihood difference in $\text{c}_{\text{tZ}}$ where the other Wilson coefficients are simultaneously fit.
Negative log-likelihood difference in $\text{c}_{\varphi\text{t}}, \text{c}_{\varphi\text{Q}}^{-}$ where the other Wilson coefficients are fixed to 0.
Negative log-likelihood difference in $\text{c}_{\varphi\text{Q}}^{3}, \text{c}_{\varphi\text{Q}}^{-}$ where the other Wilson coefficients are fixed to 0.
Negative log-likelihood difference in $\text{c}_{\text{tW}}, \text{c}_{\text{tZ}}$ where the other Wilson coefficients are fixed to 0.
The associated production of a Higgs boson and a top-quark pair is measured in events characterised by the presence of one or two electrons or muons. The Higgs boson decay into a $b$-quark pair is used. The analysed data, corresponding to an integrated luminosity of 139 fb$^{-1}$, were collected in proton-proton collisions at the Large Hadron Collider between 2015 and 2018 at a centre-of-mass energy of $\sqrt{s}=13$ TeV. The measured signal strength, defined as the ratio of the measured signal yield to that predicted by the Standard Model, is $0.35^{+0.36}_{-0.34}$. This result is compatible with the Standard Model prediction and corresponds to an observed (expected) significance of 1.0 (2.7) standard deviations. The signal strength is also measured differentially in bins of the Higgs boson transverse momentum in the simplified template cross-section framework, including a bin for specially selected boosted Higgs bosons with transverse momentum above 300 GeV.
Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate prior to any fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate prior to any fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Performance of the Higgs boson reconstruction algorithms. For each row of `truth' ${\hat{p}_{{T}}^{H}}$, the matrix shows (in percentages) the fraction of all Higgs boson candidates with reconstructed $p_T^H$ in the various bins of the dilepton (left), single-lepton resolved (middle) and boosted (right) channels.
Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.
Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.
Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.
Comparison of predicted and observed event yields in each of the control and signal regions in the dilepton channel after the fit to the data. The uncertainty band includes all uncertainties and their correlations.
Comparison of predicted and observed event yields in each of the control and signal regions in the single-lepton channels after the fit to the data. The uncertainty band includes all uncertainties and their correlations.
Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $120\le p_T^H<200$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $200\le p_T^H<300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $120\le p_T^H<200$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $200\le p_T^H<300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 450$ GeV (yield only). The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Comparison between data and prediction for the BDT discriminant in the single-lepton boosted SRs after the inclusive fit to the data for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Comparison between data and prediction for the BDT discriminant in the single-lepton boosted SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Comparison between data and prediction for ${\Delta R^{{avg}}_{bb}}$ after the inclusive fit to the data in the single-lepton $CR^{5j}_{{\geq}4b\ lo}$ control region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).
Comparison between data and prediction for ${\Delta R^{{avg}}_{bb}}$ after the inclusive fit to the data in the single-lepton $CR^{5j}_{{\geq}4b\ hi}$ control region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).
Post-fit yields of signal ($S$) and total background ($B$) as a function of $\log (S/B)$, compared with data. Final-discriminant bins in all dilepton and single-lepton analysis regions are combined into bins of $\log (S/B)$, with the signal normalised to the SM prediction used for the computation of $\log (S/B)$. The signal is then shown normalised to the best-fit value and the SM prediction. The lower frame reports the ratio of data to background, and this is compared with the expected ${t\bar {t}H}$-signal-plus-background yield divided by the background-only yield for the best-fit signal strength (solid red line) and the SM prediction (dashed orange line).
Comparison between data and prediction for the reconstruction BDT score for the Higgs boson candidate identified using Higgs boson information, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Comparison between data and prediction for the average $\Delta \eta $ between $b$-tagged jets, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Comparison between data and prediction for the likelihood discriminant, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Comparison between data and prediction for the average $\Delta R$ for all possible combinations of $b$-tagged jet pairs, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Post-fit distribution of the reconstructed Higgs boson candidate mass for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).
Post-fit distribution of the reconstructed Higgs boson candidate mass for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).
Post-fit distribution of the reconstructed Higgs boson candidate mass for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).
Fitted values of the ${t\bar {t}H}$ signal strength parameter in the individual channels and in the inclusive signal-strength measurement.
Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the fit. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.
Pre-fit distribution of the number of jets in the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.
Pre-fit distribution of the number of jets in the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.
Pre-fit distribution of the number of jets in the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.
Post-fit distribution of the number of jets in the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Post-fit distribution of the number of jets in the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Post-fit distribution of the number of jets in the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.
Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.
Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.
Signal-strength measurements in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive signal strength.
The ratios $S/B$ (black solid line, referring to the vertical axis on the left) and $S/\sqrt{B}$ (red dashed line, referring to the vertical axis on the right) for each category in the inclusive analysis in the dilepton channel (left) and in the single-lepton channels (right), where $S$ ($B$) is the number of selected signal (background) events predicted by the simulation and normalised to a luminosity of 139 fb$^{-1}$ .
Comparison between data and prediction for the $\Delta R$ between the Higgs candidate and the ${t\bar {t}}$ candidate system, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.
The observation of forward proton scattering in association with lepton pairs ($e^+e^-+p$ or $\mu^+\mu^-+p$) produced via photon fusion is presented. The scattered proton is detected by the ATLAS Forward Proton spectrometer while the leptons are reconstructed by the central ATLAS detector. Proton-proton collision data recorded in 2017 at a center-of-mass energy of $\sqrt{s} = 13$ TeV are analyzed, corresponding to an integrated luminosity of 14.6 fb$^{-1}$. A total of 57 (123) candidates in the $ee+p$ ($\mu\mu+p$) final state are selected, allowing the background-only hypothesis to be rejected with a significance exceeding five standard deviations in each channel. Proton-tagging techniques are introduced for cross-section measurements in the fiducial detector acceptance, corresponding to $\sigma_{ee+p}$ = 11.0 $\pm$ 2.6 (stat.) $\pm$ 1.2 (syst.) $\pm$ 0.3 (lumi.) fb and $\sigma_{\mu\mu+p}$ = 7.2 $\pm$ 1.6 (stat.) $\pm$ 0.9 (syst.) $\pm$ 0.2 (lumi.) fb in the dielectron and dimuon channel, respectively.
The measured fiducial cross sections. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity, the second is the luminosity
This paper describes precision measurements of the transverse momentum $p_\mathrm{T}^{\ell\ell}$ ($\ell=e,\mu$) and of the angular variable $\phi^{*}_{\eta}$ distributions of Drell-Yan lepton pairs in a mass range of 66-116 GeV. The analysis uses data from 36.1 fb$^{-1}$ of proton-proton collisions at a centre-of-mass energy of $\sqrt{s}=13$ TeV collected by the ATLAS experiment at the LHC in 2015 and 2016. Measurements in electron-pair and muon-pair final states are performed in the same fiducial volumes, corrected for detector effects, and combined. Compared to previous measurements in proton-proton collisions at $\sqrt{s}=$7 and 8 TeV, these new measurements probe perturbative QCD at a higher centre-of-mass energy with a different composition of initial states. They reach a precision of 0.2% for the normalized spectra at low values of $p_\mathrm{T}^{\ell\ell}$. The data are compared with different QCD predictions, where it is found that predictions based on resummation approaches can describe the full spectrum within uncertainties.
Selected signal candidate events in data for both decay channels as well as the expected background contributions including their total uncertainties.
Selected signal candidate events in data for both decay channels as well as the expected background contributions including their total uncertainties.
Selected signal candidate events in data for both decay channels as well as the expected background contributions including their total uncertainties.
Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.
Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.
Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.
Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.
Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.
Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.
The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.
The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.
The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.
The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.
The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.
The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.
Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.
Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.
Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.
Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.
Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.
Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.
Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.
Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.
Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.
Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.
Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.
Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.
Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.
Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.
Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.
Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.
Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.
Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.
Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.
Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.
Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.
Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.
Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.
Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.
The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.
The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.
The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.
The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.
The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.
The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.
The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.
Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.
Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.
Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.
Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.
Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.
Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.
Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.
Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.
Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.
The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.
The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.
The results of a search for gluino and squark pair production with the pairs decaying via the lightest charginos into a final state consisting of two $W$ bosons, the lightest neutralinos ($\tilde\chi^0_1$), and quarks, are presented. The signal is characterised by the presence of a single charged lepton ($e^{\pm}$ or $\mu^{\pm}$) from a $W$ boson decay, jets, and missing transverse momentum. The analysis is performed using 139 fb$^{-1}$ of proton-proton collision data taken at a centre-of-mass energy $\sqrt{s}=13$ TeV delivered by the Large Hadron Collider and recorded by the ATLAS experiment. No statistically significant excess of events above the Standard Model expectation is found. Limits are set on the direct production of squarks and gluinos in simplified models. Masses of gluino (squark) up to 2.2 TeV (1.4 TeV) are excluded at 95% confidence level for a light $\tilde\chi^0_1$.
Post-fit $m_{T}$ distribution in the SR 2J b-veto N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{T}$ distribution in the SR 2J b-veto N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{T}$ distribution in the SR 2J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{T}$ distribution in the SR 2J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{T}$ distribution in the SR 4J b-veto N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{T}$ distribution in the SR 4J b-veto N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{T}$ distribution in the SR 4J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{T}$ distribution in the SR 4J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{T}$ distribution in the SR 6J b-veto N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{T}$ distribution in the SR 6J b-veto N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{T}$ distribution in the SR 6J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{T}$ distribution in the SR 6J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Pre-fit $m_{eff}$ distribution in the TR6J control region. Uncertainties include statistical and systematic uncertainties (added in quadrature). The value 9999 is used as a placeholder for infinity.
Post-fit $m_{eff}$ distribution in the 2J b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.
Pre-fit $m_{eff}$ distribution in the WR6J control region. Uncertainties include statistical and systematic uncertainties (added in quadrature). The value 9999 is used as a placeholder for infinity.
Post-fit $m_{eff}$ distribution in the 2J b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{eff}$ distribution in the TR6J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{eff}$ distribution in the 4J low-x b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{eff}$ distribution in the WR6J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{eff}$ distribution in the 4J low-x b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{eff}$ distribution in the 2J b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{eff}$ distribution in the 4J high-x b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{eff}$ distribution in the 2J b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{eff}$ distribution in the 4J high-x b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{eff}$ distribution in the 4J low-x b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{eff}$ distribution in the 6J b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{eff}$ distribution in the 4J low-x b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{eff}$ distribution in the 6J b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{eff}$ distribution in the 4J high-x b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.
Observed 95% CL exclusion contours for the gluino one-step x = 1/2 model.
Post-fit $m_{eff}$ distribution in the 4J high-x b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.
Expected 95% CL exclusion contours for the gluino one-step x = 1/2 model. space.
Post-fit $m_{eff}$ distribution in the 6J b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.
Observed 95% CL exclusion contours for the gluino one-step variable-x
Post-fit $m_{eff}$ distribution in the 6J b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.
Expected 95% CL exclusion contours for the gluino one-step variable-x
Observed 95% CL exclusion contours for the gluino one-step x = 1/2 model.
Observed 95% CL exclusion contours for the squark one-step x = 1/2 model.
Expected 95% CL exclusion contours for the gluino one-step x = 1/2 model. space.
Observed 95% CL exclusion contours for the squark one-step x = 1/2 model.
Observed 95% CL exclusion contours for the gluino one-step variable-x
Observed 95% CL exclusion contours for one-flavour schemes in one-step x = 1/2 model.
Expected 95% CL exclusion contours for the gluino one-step variable-x
Observed 95% CL exclusion contours for one-flavour schemes in one-step x = 1/2 model.
Observed 95% CL exclusion contours for the squark one-step x = 1/2 model.
Expected 95% CL exclusion contours for the squark one-step variable-x
Observed 95% CL exclusion contours for the squark one-step x = 1/2 model.
Expected 95% CL exclusion contours for the squark one-step variable-x
Observed 95% CL exclusion contours for one-flavour schemes in one-step x = 1/2 model.
Expected 95% CL exclusion contours for the squark one-flavour schemes in variable-x
Observed 95% CL exclusion contours for one-flavour schemes in one-step x = 1/2 model.
Expected 95% CL exclusion contours for the squark one-flavour schemes in variable-x
Expected 95% CL exclusion contours for the squark one-step variable-x
Upper limits on the signal cross section for simplified model gluino one-step x = 1/2
Expected 95% CL exclusion contours for the squark one-step variable-x
Upper limits on the signal cross section for simplified model gluino one-step variable-x
Expected 95% CL exclusion contours for the squark one-flavour schemes in variable-x
Upper limits on the signal cross section for simplified model squark one-step x = 1/2
Expected 95% CL exclusion contours for the squark one-flavour schemes in variable-x
Upper limits on the signal cross section for simplified model squark one-step variable-x
Upper limits on the signal cross section for simplified model gluino one-step x = 1/2
Upper limits on the signal cross section for simplified model squark one-step x=1/2 in one-flavour schemes
Upper limits on the signal cross section for simplified model gluino one-step variable-x
Upper limits on the signal cross section for simplified model squark one-step variable-x in one-flavour schemes
Upper limits on the signal cross section for simplified model squark one-step x = 1/2
Post-fit $m_{eff}$ distribution in the 2J b-tag validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Upper limits on the signal cross section for simplified model squark one-step variable-x
Post-fit $m_{eff}$ distribution in the 2J b-veto validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Upper limits on the signal cross section for simplified model squark one-step x=1/2 in one-flavour schemes
Post-fit $m_{eff}$ distribution in the 4J b-tag validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Upper limits on the signal cross section for simplified model squark one-step variable-x in one-flavour schemes
Post-fit $m_{eff}$ distribution in the 4J b-veto validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{eff}$ distribution in the TR2J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{eff}$ distribution in the 6J b-tag validation region. Uncertainties include statistical and systematic uncertainties.
Post-fit $m_{eff}$ distribution in the WR2J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Post-fit $m_{eff}$ distribution in the 6J b-veto validation region. Uncertainties include statistical and systematic uncertainties.
Post-fit $m_{eff}$ distribution in the TR4J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Event selection cutflow for two representative signal samples for the SR2JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.
Post-fit $m_{eff}$ distribution in the WR4J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Event selection cutflow for two representative signal samples for the SR2JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.
Post-fit $m_{eff}$ distribution in the 2J b-tag validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Event selection cutflow for two representative signal samples for the SR4JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.
Post-fit $m_{eff}$ distribution in the 2J b-veto validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Event selection cutflow for two representative signal samples for the SR4JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.
Post-fit $m_{eff}$ distribution in the 4J b-tag validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Event selection cutflow for two representative signal samples for the SR6JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.
Post-fit $m_{eff}$ distribution in the 4J b-veto validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.
Event selection cutflow for two representative signal samples for the SR6JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.
Post-fit $m_{eff}$ distribution in the 6J b-tag validation region. Uncertainties include statistical and systematic uncertainties.
Signal acceptance in SR2J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models
Post-fit $m_{eff}$ distribution in the 6J b-veto validation region. Uncertainties include statistical and systematic uncertainties.
Signal acceptance in SR2J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models
Event selection cutflow for two representative signal samples for the SR2JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.
Signal acceptance in SR2J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models
Event selection cutflow for two representative signal samples for the SR2JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.
Signal acceptance in SR2J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models
Event selection cutflow for two representative signal samples for the SR4JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.
Signal acceptance in SR2J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models
Event selection cutflow for two representative signal samples for the SR4JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.
Signal acceptance in SR2J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models
Event selection cutflow for two representative signal samples for the SR6JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.
Signal acceptance in SR2J discovery high region for gluino production one-step x = 1/2 simplified models
Event selection cutflow for two representative signal samples for the SR6JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.
Signal acceptance in SR2J discovery low region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx discovery region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR2J discovery high region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR2J discovery low region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx discovery region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx discovery region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx discovery region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Tag bin4 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Veto bin4 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR6J discovery high region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR6J discovery low region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Tag bin1 region for gluino production one-step variable-x simplified models
Signal acceptance in SR6J b-Tag bin4 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Tag bin2 region for gluino production one-step variable-x simplified models
Signal acceptance in SR6J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Tag bin3 region for gluino production one-step variable-x simplified models
Signal acceptance in SR6J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Veto bin1 region for gluino production one-step variable-x simplified models
Signal acceptance in SR6J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Veto bin2 region for gluino production one-step variable-x simplified models
Signal acceptance in SR6J b-Veto bin4 region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Veto bin3 region for gluino production one-step variable-x simplified models
Signal acceptance in SR6J discovery high region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR2J discovery high region for gluino production one-step variable-x simplified models
Signal acceptance in SR6J discovery low region for gluino production one-step x = 1/2 simplified models
Signal acceptance in SR2J discovery low region for gluino production one-step variable-x simplified models
Signal acceptance in SR2J b-Tag bin1 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jhx discovery region for gluino production one-step variable-x simplified models
Signal acceptance in SR2J b-Tag bin2 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Tag bin1 region for gluino production one-step variable-x simplified models
Signal acceptance in SR2J b-Tag bin3 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Tag bin2 region for gluino production one-step variable-x simplified models
Signal acceptance in SR2J b-Veto bin1 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Tag bin3 region for gluino production one-step variable-x simplified models
Signal acceptance in SR2J b-Veto bin2 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Veto bin1 region for gluino production one-step variable-x simplified models
Signal acceptance in SR2J b-Veto bin3 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Veto bin2 region for gluino production one-step variable-x simplified models
Signal acceptance in SR2J discovery high region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Veto bin3 region for gluino production one-step variable-x simplified models
Signal acceptance in SR2J discovery low region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jlx discovery region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jhx discovery region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Tag bin1 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Tag bin1 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Tag bin2 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Tag bin2 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Tag bin3 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Tag bin3 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Veto bin1 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Veto bin1 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Veto bin2 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Veto bin2 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Veto bin3 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Veto bin3 region for gluino production one-step variable-x simplified models
Signal acceptance in SR6J b-Tag bin1 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jlx discovery region for gluino production one-step variable-x simplified models
Signal acceptance in SR6J b-Tag bin2 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Tag bin1 region for gluino production one-step variable-x simplified models
Signal acceptance in SR6J b-Tag bin3 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Tag bin2 region for gluino production one-step variable-x simplified models
Signal acceptance in SR6J b-Tag bin4 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Tag bin3 region for gluino production one-step variable-x simplified models
Signal acceptance in SR6J b-Veto bin1 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Veto bin1 region for gluino production one-step variable-x simplified models
Signal acceptance in SR6J b-Veto bin2 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Veto bin2 region for gluino production one-step variable-x simplified models
Signal acceptance in SR6J b-Veto bin3 region for gluino production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Veto bin3 region for gluino production one-step variable-x simplified models
Signal acceptance in SR6J b-Veto bin4 region for gluino production one-step variable-x simplified models
Signal acceptance in SR6J b-Tag bin1 region for gluino production one-step variable-x simplified models
Signal acceptance in SR6J discovery high region for gluino production one-step variable-x simplified models
Signal acceptance in SR6J b-Tag bin2 region for gluino production one-step variable-x simplified models
Signal acceptance in SR6J discovery low region for gluino production one-step variable-x simplified models
Signal acceptance in SR6J b-Tag bin3 region for gluino production one-step variable-x simplified models
Signal acceptance in SR2J b-Tag bin1 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Tag bin4 region for gluino production one-step variable-x simplified models
Signal acceptance in SR2J b-Tag bin2 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Veto bin1 region for gluino production one-step variable-x simplified models
Signal acceptance in SR2J b-Tag bin3 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Veto bin2 region for gluino production one-step variable-x simplified models
Signal acceptance in SR2J b-Veto bin1 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Veto bin3 region for gluino production one-step variable-x simplified models
Signal acceptance in SR2J b-Veto bin2 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Veto bin4 region for gluino production one-step variable-x simplified models
Signal acceptance in SR2J b-Veto bin3 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR6J discovery high region for gluino production one-step variable-x simplified models
Signal acceptance in SR2J discovery high region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR6J discovery low region for gluino production one-step variable-x simplified models
Signal acceptance in SR2J discovery low region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Tag bin1 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx discovery region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Tag bin2 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Tag bin1 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Tag bin3 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Tag bin2 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Veto bin1 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Tag bin3 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Veto bin2 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Veto bin1 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Veto bin3 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Veto bin2 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR2J discovery high region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Veto bin3 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR2J discovery low region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx discovery region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx discovery region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Tag bin1 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Tag bin1 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Tag bin2 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Tag bin2 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Tag bin3 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Tag bin3 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Veto bin1 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Veto bin1 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Veto bin2 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Veto bin2 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Veto bin3 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jhx b-Veto bin3 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Tag bin1 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx discovery region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Tag bin2 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Tag bin1 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Tag bin3 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Tag bin2 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Tag bin4 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Tag bin3 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Veto bin1 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Veto bin1 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Veto bin2 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Veto bin2 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Veto bin3 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR4Jlx b-Veto bin3 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Veto bin4 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Tag bin1 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR6J discovery high region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Tag bin2 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR6J discovery low region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR6J b-Tag bin3 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Tag bin1 region for squark production one-step variable-x simplified models
Signal acceptance in SR6J b-Tag bin4 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Tag bin2 region for squark production one-step variable-x simplified models
Signal acceptance in SR6J b-Veto bin1 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Tag bin3 region for squark production one-step variable-x simplified models
Signal acceptance in SR6J b-Veto bin2 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Veto bin1 region for squark production one-step variable-x simplified models
Signal acceptance in SR6J b-Veto bin3 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Veto bin2 region for squark production one-step variable-x simplified models
Signal acceptance in SR6J b-Veto bin4 region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR2J b-Veto bin3 region for squark production one-step variable-x simplified models
Signal acceptance in SR6J discovery high region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR2J discovery high region for squark production one-step variable-x simplified models
Signal acceptance in SR6J discovery low region for squark production one-step x = 1/2 simplified models
Signal acceptance in SR2J discovery low region for squark production one-step variable-x simplified models
Signal acceptance in SR2J b-Tag bin1 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jhx discovery region for squark production one-step variable-x simplified models
Signal acceptance in SR2J b-Tag bin2 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Tag bin1 region for squark production one-step variable-x simplified models
Signal acceptance in SR2J b-Tag bin3 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Tag bin2 region for squark production one-step variable-x simplified models
Signal acceptance in SR2J b-Veto bin1 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Tag bin3 region for squark production one-step variable-x simplified models
Signal acceptance in SR2J b-Veto bin2 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Veto bin1 region for squark production one-step variable-x simplified models
Signal acceptance in SR2J b-Veto bin3 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Veto bin2 region for squark production one-step variable-x simplified models
Signal acceptance in SR2J discovery high region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Veto bin3 region for squark production one-step variable-x simplified models
Signal acceptance in SR2J discovery low region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jlx discovery region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jhx discovery region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Tag bin1 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Tag bin1 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Tag bin2 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Tag bin2 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Tag bin3 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Tag bin3 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Veto bin1 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Veto bin1 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Veto bin2 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Veto bin2 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Veto bin3 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jhx b-Veto bin3 region for squark production one-step variable-x simplified models
Signal acceptance in SR6J b-Tag bin1 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jlx discovery region for squark production one-step variable-x simplified models
Signal acceptance in SR6J b-Tag bin2 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Tag bin1 region for squark production one-step variable-x simplified models
Signal acceptance in SR6J b-Tag bin3 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Tag bin2 region for squark production one-step variable-x simplified models
Signal acceptance in SR6J b-Tag bin4 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Tag bin3 region for squark production one-step variable-x simplified models
Signal acceptance in SR6J b-Veto bin1 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Veto bin1 region for squark production one-step variable-x simplified models
Signal acceptance in SR6J b-Veto bin2 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Veto bin2 region for squark production one-step variable-x simplified models
Signal acceptance in SR6J b-Veto bin3 region for squark production one-step variable-x simplified models
Signal acceptance in SR4Jlx b-Veto bin3 region for squark production one-step variable-x simplified models
Signal acceptance in SR6J b-Veto bin4 region for squark production one-step variable-x simplified models
Signal acceptance in SR6J b-Tag bin1 region for squark production one-step variable-x simplified models
Signal acceptance in SR6J discovery high region for squark production one-step variable-x simplified models
Signal acceptance in SR6J b-Tag bin2 region for squark production one-step variable-x simplified models
Signal acceptance in SR6J discovery low region for squark production one-step variable-x simplified models
Signal acceptance in SR6J b-Tag bin3 region for squark production one-step variable-x simplified models
Signal efficiency in SR2J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal acceptance in SR6J b-Tag bin4 region for squark production one-step variable-x simplified models
Signal efficiency in SR2J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal acceptance in SR6J b-Veto bin1 region for squark production one-step variable-x simplified models
Signal efficiency in SR2J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal acceptance in SR6J b-Veto bin2 region for squark production one-step variable-x simplified models
Signal efficiency in SR2J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal acceptance in SR6J b-Veto bin3 region for squark production one-step variable-x simplified models
Signal efficiency in SR2J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal acceptance in SR6J b-Veto bin4 region for squark production one-step variable-x simplified models
Signal efficiency in SR2J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal acceptance in SR6J discovery high region for squark production one-step variable-x simplified models
Signal efficiency in SR2J discovery high region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal acceptance in SR6J discovery low region for squark production one-step variable-x simplified models
Signal efficiency in SR2J discovery low region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx discovery region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J discovery high region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J discovery low region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx discovery region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx discovery region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx discovery region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin4 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin4 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J discovery high region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J discovery low region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin4 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin4 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J discovery high region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J discovery high region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J discovery low region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J discovery low region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx discovery region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J discovery high region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J discovery low region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx discovery region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx discovery region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx discovery region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin4 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin4 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J discovery high region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J discovery low region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin4 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin4 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J discovery high region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J discovery high region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J discovery low region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J discovery low region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx discovery region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J discovery high region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J discovery low region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx discovery region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx discovery region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx discovery region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin4 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin4 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J discovery high region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J discovery low region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Tag bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin4 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Tag bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Tag bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Veto bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Veto bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin4 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Veto bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J discovery high region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J discovery high region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J discovery low region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J discovery low region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Tag bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx discovery region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Tag bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Tag bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Veto bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Veto bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J b-Veto bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J discovery high region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR2J discovery low region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx discovery region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx discovery region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Tag bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jhx b-Veto bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx discovery region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin4 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Tag bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR4Jlx b-Veto bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin4 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J discovery high region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J discovery low region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Tag bin4 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J b-Veto bin4 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J discovery high region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
Signal efficiency in SR6J discovery low region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0
This article presents measurements of the $t$-channel single top-quark ($t$) and top-antiquark ($\bar{t}$) total production cross sections $\sigma(tq)$ and $\sigma(\bar{t}q)$, their ratio $R_{t}=\sigma(tq)/\sigma(\bar{t}q)$, and a measurement of the inclusive production cross section $\sigma(tq + \bar{t}q)$ in proton--proton collisions at $\sqrt{s} = 7$ TeV at the LHC. Differential cross sections for the $tq$ and $\bar{t}q$ processes are measured as a function of the transverse momentum and the absolute value of the rapidity of $t$ and $\bar{t}$, respectively. The analyzed data set was recorded with the ATLAS detector and corresponds to an integrated luminosity of 4.59 fb$^{-1}$. Selected events contain one charged lepton, large missing transverse momentum, and two or three jets. The cross sections are measured by performing a binned maximum-likelihood fit to the output distributions of neural networks. The resulting measurements are $\sigma(tq)= 46\pm 6\; \mathrm{pb}$, $\sigma(\bar{t}q)= 23 \pm 4\; \mathrm{pb}$, $R_{t}=2.04\pm 0.18$, and $\sigma(tq + \bar{t}q)= 68 \pm 8\; \mathrm{pb}$, consistent with the Standard Model expectation. The uncertainty on the measured cross sections is dominated by systematic uncertainties, while the uncertainty on $R_{t}$ is mainly statistical. Using the ratio of $\sigma(tq + \bar{t}q)$ to its theoretical prediction, and assuming that the top-quark-related CKM matrix elements obey the relation $|V_{tb}|\gg |V_{ts}|, |V_{td}|$, we determine $|V_{tb}|=1.02 \pm 0.07$.
Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of PT(TOP).
Predicted and observed events yields for the 2-jet and 3-jet channels considered in this measurement. The multijet background is estimated using data-driven techniques (see Sec. VB); an uncertainty of $50\%$ is applied. All the other expectations are derived using theoretical cross sections and their uncertainties (see Secs. VA and VC in the paper).
Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of PT(TOPBAR).
Detailed list of the contribution of each source of uncertainty to the total uncertainty on the measured values of $\sigma(tq)$, $\sigma(\bar{t}q)$, $R_t$, and $\sigma(tq+\bar{t}q)$. The evaluation of the systematic uncertainties has a statistical uncertainty of $0.3\,\%$. Uncertainties contributing less than $1.0\,\%$ are marked with "$<1$" in the paper. To provide numerical values for this table in HEPdata, these uncertainties are approximated with $\pm 0.5\,\%$. This approximation is applied to all measurements for the following uncertainties$:$ JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by-jets, JES pileup, $b$-JES, jet vertex fraction, mistag efficiency and $W+\;$jets shape variation. For the measurement of $\sigma(tq)$ the approximation is applied in addition to the following uncertainties$:$ JES flavor response, $c$-tagging efficiency, $t\bar{t}$ generator + parton shower and $t\bar{t}$ ISR/FSR. For the measurement of $\sigma(\bar{t}q)$ the approximation is applied in addition to these uncertainties$:$ JES flavor response, $b/\bar{b}$ acceptance, and $t\bar{t}$ ISR/FSR. For the measurement of $R_t$ the approximation is applied in addition to these uncertainties$:$ JES detector, $b$-tagging efficiency, $c$-tagging efficiency, $b/\bar{b}$ acceptance and $tq$ scale variations. For the measurement of $\sigma(tq+\bar{t}q)$ the approximation is applied in addition to these uncertainties$:$ JES flavor response, $c$-tagging efficiency, $b/\bar{b}$ acceptance, $t\bar{t}$ generator + parton shower and $t\bar{t}$ ISR/FSR.
Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(T)).
The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.
Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(TBAR)).
Parametrization factors for the $m_{t}$ dependence [see Eq. (4) in the paper] of $\sigma(tq)$, $\sigma(\bar tq)$, and $\sigma(t q+\bar t q)$.
The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.
The value of $|V_{tb}|^{2}$ is extracted by dividing the measured value of $\sigma(t q+\bar t q)$ by the prediction of the approximate NNLO calculation. The experimental and theoretical uncertainties are added in quadrature.
Event yields for the 2-jet-$\ell^{+}$ and 2-jet-$\ell^{-}$ HPR channels. The expectation for the signal and background yields correspond to the result of the binned maximum-likelihood fit described in Sec. $\mathrm{VI~D}$ in the paper. The uncertainty of the expectations is the normalization uncertainty of each process after the fit, as described in Sec. $\mathrm{VII~F}$ in the paper.
Migration matrix relating the parton level $p_{\mathrm{T}}(t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-quark $p_{\mathrm{T}}$ distribution.
Migration matrix relating the parton level $p_{\mathrm{T}}(\bar t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-antiquark $p_{\mathrm{T}}$ distribution.
Migration matrix relating the parton level $|y(t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-quark $|y|$ distribution.
Migration matrix relating the parton level $|y(\bar t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-antiquark $|y|$ distribution.
Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.
Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.
Differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.
Differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.
Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.
Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.
Normalized differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.
Normalized differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.
Comparison between the measured differential cross sections and the predictions from the NLO calculation using the MSTW2008 PDF set. For each variable and prediction a $\chi^{2}$ value is calculated with HERAfitter using the covariance matrix of each measured spectrum. The theory uncertainties of the predictions are treated as uncorrelated. The number of degrees of freedom (NDF) is equal to the number of bins in the measured spectrum.
Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.
Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, mistag efficiency, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.
Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.
Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.
Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The JES $\eta$ intercalibration uncertainty has a sign switch from the first to the second bin. For the $tq$ generator $+$ parton shower uncertainty a sign switch is denoted with $\mp$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $c-$tagging efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.
Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.
Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.
Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content $:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet energy resolution, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$ tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.
Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(t)$.
Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.
Statistical correlation matrices for the differential cross section as a function of $|y(t)|$.
Statistical correlation matrices for the differential cross section as a function of $|y(\bar t)|$.
Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(t)$.
Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.
Statistical correlation matrices for the normalized differential cross section as a function of $|y(t)|$.
Statistical correlation matrices for the normalized differential cross section as a function of $|y(\bar t)|$.
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