Muon reconstruction efficiency as function of its tranverse impact parameter, $d_0$.

Electron selection efficiency as function of its tranverse momentum, $p_T$.

Muon selection efficiency as function of its tranverse momentum, $p_T$.

Correlation matrix for the differential branching fraction extraction between different $q^2$ bins in the simultaneous fit.

The product of acceptance and efficiency ($A\epsilon$) of the $\mathcal{B}(\mathrm{B}^+\to\mathrm{K}^+\mu^+\mu^-)$ channel, as a function of the muon pair $q^2$, as measured in simulated signal events, after all the corrections applied. In the figure, regions corresponding to resonances are displayed with red markers.

Same as Table 5, but for the bins containing the J$\psi$ and $\psi$(2S) resonances.

Integrated branching fraction $\mathcal{B}(\mathrm{B}^\pm \to \mathrm{K}^\pm\mu^+\mu^-)$ in the low-$q^2$ region.

Ratio of branching fractions $\mathcal{B}(\text{B}^\pm \to \text{K}^\pm\mu^+\mu^-)$ to $\mathcal{B}(\text{B}^\pm \to \text{K}^\pm\text{e}^+\text{e}^-)$, determined from the measured double ratio $R$(K) of these decays to the respective branching fractions of the decay chains $\text{B}^\pm\to\text{J/}\psi\text{K}^\pm$ with $\text{J/}\psi\to\mu^+\mu^-$ and $\text{e}^+\text{e}^-$.

Negative log likelihood function from the fit profiled as a function of the inverse ratio $R(\mathrm{K})^{-1}$.

Observed 95% CL exclusion limit for direct slepton production.

Expected 95% CL exclusion limit for chargino-neutralino production with slepton-mediated decays.

Observed 95% CL exclusion limit for chargino-neutralino production with slepton-mediated decays.

Expected 95% CL exclusion limit for chargino-neutralino production with W/Z-mediated decays.

Observed 95% CL exclusion limit for chargino-neutralino production with W/Z-mediated decays.

The mT2 distributions for data and the estimated SM backgrounds in the exclusive SF signal regions of the 2l+0jets channel in the regions 150 < mll < 200 GeV (corresponding to SR2-SF-e,f,g,h). Two signal points are added for comparison.

Signal acceptance for C1C1 production in SR2-SFloose for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$ .

Signal efficiency for C1C1 production in SR2-SFloose for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal acceptance for C1C1 production in SR2-SFtight for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal efficiency for C1C1 production in SR2-SFtight for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal acceptance for C1C1 production in SR2-DF100 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal efficiency for C1C1 production in SR2-DF100 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal acceptance for C1C1 production in SR2-DF150 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal efficiency for C1C1 production in SR2-DF150 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal acceptance for C1C1 production in SR2-DF200 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal efficiency for C1C1 production in SR2-DF200 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal acceptance for C1C1 production in SR2-DF300 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal efficiency for C1C1 production in SR2-DF300 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal acceptance for direct Slepton production in SR2-SF-Loose for the process P P -> $\tilde{\ell}^\pm \tilde{\ell}^\mp$ -> $\ell^\pm \ell^\mp \widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for direct Slepton production in SR2-SF-Loose for the process P P -> $\tilde{\ell}^\pm \tilde{\ell}^\mp$ -> $\ell^\pm \ell^\mp \widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for direct Slepton production in SR2-SF-Tight for the process P P -> $\tilde{\ell}^\pm \tilde{\ell}^\mp$ -> $\ell^\pm \ell^\mp \widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for direct Slepton production in SR2-SF-Tight for the process P P -> $\tilde{\ell}^\pm \tilde{\ell}^\mp$ -> $\ell^\pm \ell^\mp \widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for C1N2 production in SR2-low for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->2j) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for C1N2 production in SR2-low for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->2j) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for C1N2 production in SR2-int for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->2j) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for C1N2 production in SR2-int for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->2j) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for C1N2 production in SR2-high for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->2j) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for C1N2 production in SR2-high for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->2j) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for Slep production in SR3-slepa for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal efficiency for Slep production in SR3-slepa for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal acceptance for Slep production in SR3-slepb for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal efficiency for Slep production in SR3-slepb for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal acceptance for Slep production in SR3-slepc for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal efficiency for Slep production in SR3-slepc for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal acceptance for Slep production in SR3-slepd for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal efficiency for Slep production in SR3-slepd for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal acceptance for Slep production in SR3-slepe for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal efficiency for Slep production in SR3-slepe for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal acceptance for WZ production in SR3-WZ-0Ja for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for WZ production in SR3-WZ-0Ja for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for WZ production in SR3-WZ-0Jb for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for WZ production in SR3-WZ-0Jb for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for WZ production in SR3-WZ-0Jc for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for WZ production in SR3-WZ-0Jc for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for WZ production in SR3-WZ-1Ja for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for WZ production in SR3-WZ-1Ja for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for WZ production in SR3-WZ-1Jb for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for WZ production in SR3-WZ-1Jb for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for WZ production in SR3-WZ-1Jc for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for WZ production in SR3-WZ-1Jc for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal regions contributing to the observed exclusion limit for chargino-neutralino production with W/Z-mediated decays.

Expected 95% CL exclusion limit for chargino-neutralino production with W/Z-mediated decays in the 2l+jets channel.

Observed 95% CL exclusion limit for chargino-neutralino production with W/Z-mediated decays in the 2l+jets channel.

Expected 95% CL exclusion limit for chargino-neutralino production with W/Z-mediated decays in the 3l channel.

Observed 95% CL exclusion limit for chargino-neutralino production with W/Z-mediated decays in the 2l+jets channel.

Expected 95% CL exclusion limit for left-handed slepton production.

Observed 95% CL exclusion limit for left-handed slepton production.

Expected 95% CL exclusion limit for right-handed slepton production.

Observed 95% CL exclusion limit for right-handed slepton production.

95% upper limit on production cross-section for chargino-pair production.

95% upper limit on production cross-section for direct slepton production.

95% upper limit on production cross-section for chargino-neutralino production with slepton-mediated decays.

95% upper limit on production cross-section for chargino-neutralino production with W/Z-mediated decays

The expected 95% CL exclusion limits for CHARGINO1+ CHARGINO1- production with SLEPTONL-mediated decays as a function of the CHARGINO1+- and NEUTRALINO1 masses.

The observed 95% CL exclusion limits for CHARGINO1+ CHARGINO1- production with SLEPTONL-mediated decays as a function of the CHARGINO1+- and NEUTRALINO1 masses.

The expected and observed 95% CL exclusion limits on the cross-section for VBF CHARGINO1+-CHARGINO1+- production, as a function of the CHARGINO1-NEUTRALINO1 mass difference, for a CHARGINO1+- of 110 GeV.

The 95% CL exclusion limits (expected and observed) on the cross-section for NEUTRALINO2 NEUTRALINO3 production with SLEPTONR-mediated decays, where the LSP is massless and the intermediate slepton mass is set to 5%, 25%, 50%, 75%, and 95% of the NEUTRALINO2 mass (x).

The expected 95% CL exclusion limits for NEUTRALINO2 NEUTRALINO3 production with SLEPTONR-mediated decays as a function of the NEUTRALINO2 and NEUTRALINO1 masses.

The observed 95% CL exclusion limits for NEUTRALINO2 NEUTRALINO3 production with SLEPTONR-mediated decays as a function of the NEUTRALINO2 and NEUTRALINO1 masses.

The 95% CL exclusion limits (expected and observed) on the cross-section for CHARGINO1+- NEUTRALINO2 production with SLEPTONL-mediated decays, where the LSP is massless and the intermediate slepton mass is set to 5%, 25%, 50%, 75%, and 95% of the CHARGINO1+- mass (x).

The expected 95% CL exclusion limits for CHARGINO1+-NEUTRALINO2 production with SLEPTONL-mediated decays (x=0.50) as a function of the NEUTRALINO2 and NEUTRALINO1 masses.

The observed 95% CL exclusion limits for CHARGINO1+-NEUTRALINO2 production with SLEPTONL-mediated decays (x=0.50) as a function of the NEUTRALINO2 and NEUTRALINO1 masses.

The expected 95% CL exclusion limits for CHARGINO1+-NEUTRALINO2 production with SLEPTONL-mediated decays (x=0.95) as a function of the NEUTRALINO2 and NEUTRALINO1 masses.

The observed 95% CL exclusion limits for CHARGINO1+-NEUTRALINO2 production with SLEPTONL-mediated decays (x=0.95) as a function of the NEUTRALINO2 and NEUTRALINO1 masses.

The expected 95% CL exclusion limits for CHARGINO1+-NEUTRALINO2 production with STAU-mediated decays as a function of the NEUTRALINO2 and NEUTRALINO1 masses.

The observed 95% CL exclusion limits for CHARGINO1+-NEUTRALINO2 production with STAU-mediated decays as a function of the NEUTRALINO2 and NEUTRALINO1 masses.

Definition of the fiducial phase space.

The seven input variables to the NN ordered by their discriminating power. The jet that is not $b$-tagged is referred to as $\textit{untagged}~$jet.

The seven input variables to the NN ordered by their discriminating power. The jet that is not $b$-tagged is referred to as $\textit{untagged}~$jet.

Event yields for the different processes estimated with the fit to the $O_\mathrm{NN}$ distribution compared to the numbers of observed events. Only the statistical uncertainties are quoted. The $Z,VV+\mathrm{jets}$ contributions and the multijet background are fixed in the fit; therefore no uncertainty is quoted for these processes.

Event yields for the different processes estimated with the fit to the $O_\mathrm{NN}$ distribution compared to the numbers of observed events. Only the statistical uncertainties are quoted. The $Z,VV+\mathrm{jets}$ contributions and the multijet background are fixed in the fit; therefore no uncertainty is quoted for these processes.

Detailed list of the contribution from each source of uncertainty to the total uncertainty in the measured values of $\sigma_{\mathrm{fid}}(tq)$ and $\sigma_{\mathrm{fid}}(\bar tq)$. The estimation of the systematic uncertainties has a statistical uncertainty of $0.3\%$. Uncertainties contributing less than $0.5\%$ are marked with ‘<0.5’.

Detailed list of the contribution from each source of uncertainty to the total uncertainty in the measured values of $\sigma_{\mathrm{fid}}(tq)$ and $\sigma_{\mathrm{fid}}(\bar tq)$. The estimation of the systematic uncertainties has a statistical uncertainty of $0.3\%$. Uncertainties contributing less than $0.5\%$ are marked with ‘<0.5’.

Significant contributions to the total relative uncertainty in the measured value of $R_{t}$. The estimation of the systematic uncertainties has a statistical uncertainty of $0.3~\%$. Uncertainties contributing less than $0.5~\%$ are not shown.

Significant contributions to the total relative uncertainty in the measured value of $R_{t}$. The estimation of the systematic uncertainties has a statistical uncertainty of $0.3~\%$. Uncertainties contributing less than $0.5~\%$ are not shown.

Slopes $a$ of the mass dependence of the measured cross$-$sections.

Slopes $a$ of the mass dependence of the measured cross$-$sections.

Predicted (post-fit) and observed event yields for the signal region (SR), after the requirement on the neural network discriminant, $O_{\mathrm{NN}}~>~0.8$. The multijet background prediction is obtained from the fit to the $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution described in Section 6, while all the other predictions and uncertainties are derived from the total cross$-$section measurement. In some cases there is no uncertainty quoted. In these cases the uncertainty is < 0.5.

Predicted (post-fit) and observed event yields for the signal region (SR), after the requirement on the neural network discriminant, $O_{\mathrm{NN}}~>~0.8$. The multijet background prediction is obtained from the fit to the $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution described in Section 6, while all the other predictions and uncertainties are derived from the total cross$-$section measurement. In some cases there is no uncertainty quoted. In these cases the uncertainty is < 0.5.

Predicted (post-fit) and observed event yields for the signal region (SR), after the requirement on the second neural network discriminant, $O_{\mathrm{NN2}}~>~0.8$. The multijet background prediction is obtained from the fit to the $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution described in Section 6, while all the other predictions and uncertainties are derived from the total cross$-$section measurement. In some cases there is no uncertainty quoted. In these cases the uncertainty is < 0.5.

Predicted (post-fit) and observed event yields for the signal region (SR), after the requirement on the second neural network discriminant, $O_{\mathrm{NN2}}~>~0.8$. The multijet background prediction is obtained from the fit to the $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution described in Section 6, while all the other predictions and uncertainties are derived from the total cross$-$section measurement. In some cases there is no uncertainty quoted. In these cases the uncertainty is < 0.5.

Migration matrix for $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at the particle level. The pseudo top quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at the particle level. The pseudo top quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $p_{\mathrm{T}}(t)$ at the parton level. The parton-level quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $p_{\mathrm{T}}(t)$ at the parton level. The parton-level quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $|y(\hat{t\hspace{-0.2mm}})|$ at the particle level. The pseudo top quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $|y(\hat{t\hspace{-0.2mm}})|$ at the particle level. The pseudo top quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $|y(t)|$ at the parton level. The parton-level quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $|y(t)|$ at the parton level. The parton-level quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Uncertainties in the normalisations of the different backgrounds for all processes, as derived from the total cross-section measurement.

Uncertainties in the normalisations of the different backgrounds for all processes, as derived from the total cross-section measurement.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(t)$ at parton level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(t)$ at parton level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(t)$ at parton level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(t)$ at parton level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(t)|$ at parton level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(t)|$ at parton level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(t)|$ at parton level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(t)|$ at parton level.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ for $tq$ events(at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ for $ \bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ for $ \bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(t)$ for $tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(t)$ for $ \bar tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(t)$ for $tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(t)$ for $ \bar tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(t)|$ for $tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(t)|$ for $\bar tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(t)|$ for $tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(t)|$ for $\bar tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Fiducial acceptance $A_{\mathrm{fid}}$ for different $t$-channel single top-quark MC samples. $^{\mathrm{(a)}}$ Calculation taken from AcerMC $+$ $\mathrm{P{\scriptsize YTHIA}6}$. $^{\mathrm{(b)}}$ Calculation taken from $\mathrm{P{\scriptsize OWHEG}}$-$\mathrm{B{\scriptsize OX}}$ $+$ $\mathrm{P{\scriptsize YTHIA}6}$.

Fiducial acceptance $A_{\mathrm{fid}}$ for different $t$-channel single top-antiquark MC samples. $^{\mathrm{(a)}}$ Calculation taken from AcerMC $+$ $\mathrm{P{\scriptsize YTHIA}6}$. $^{\mathrm{(b)}}$ Calculation taken from $\mathrm{P{\scriptsize OWHEG}}$-$\mathrm{B{\scriptsize OX}}$ $+$ $\mathrm{P{\scriptsize YTHIA}6}$.

Uncertainties for the absolute differential $tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level per bin ([0,35,50,75,100,150,200,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level per bin ([0,35,50,75,100,150,200,300] GeV) in percent of $\left( \dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level per bin ([0,35,50,75,100,150,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})}$.

Uncertainties for the normalised differential $\bar tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level per bin ([0,35,50,75,100,150,300] GeV) in percent of $\left( \dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})}$.

Uncertainties for the absolute differential $tq$ cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level per bin ([0,0.15,0.3,0.45,0.7,1.0,1.3,2.2]) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(\hat{t\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $tq$ cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level per bin ([0,0.15,0.3,0.45,0.7,1.0,1.3,2.2]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(\hat{t\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq$ cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level per bin ([0,0.15,0.3,0.45,0.7,1.0,1.3,2.2]) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(\hat{t\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $\bar tq$ cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level per bin ([0,0.15,0.3,0.45,0.7,1.0,1.3,2.2]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(\hat{t\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level per bin ([30,45,60,75,100,150,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level per bin ([30,45,60,75,100,150,300] GeV) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level per bin ([30,45,60,75,100,150,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $\bar tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level per bin ([30,45,60,75,100,150,300] GeV) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $tq$ cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level per bin ([0.0, 1.2, 1.7, 2.2, 2.7, 3.3, 4.5]) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(\hat{j\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $tq$ cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level per bin ([0.0, 1.2, 1.7, 2.2, 2.7, 3.3, 4.5]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(\hat{j\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq$ cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level per bin ([0.0, 1.2, 1.7, 2.2, 2.7, 3.3, 4.5]) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(\hat{j\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $\bar tq$ cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level per bin ([0.0, 1.2, 1.7, 2.2, 2.7, 3.3, 4.5]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(\hat{j\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $tq$ cross-section as a function of $p_{\mathrm{T}}(t)$ at parton level per bin ([0,50,100,150,200,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(t)}$.

Uncertainties for the normalised differential $tq$ cross-section as a function of $p_{\mathrm{T}}(t)$ at parton level per bin ([0,50,100,150,200,300] GeV) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(t)}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq $ cross-section as a function of $p_{\mathrm{T}}(t)$ at parton level per bin ([0,50,100,150,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(t)}$.

Uncertainties for the normalised differential $\bar tq $ cross-section as a function of $p_{\mathrm{T}}(t)$ at parton level per bin ([0,50,100,150,300] GeV) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(t)}$.

Uncertainties for the absolute differential $ tq $ cross-section as a function of $|y(t)|$ at parton level per bin ([0,0.3,0.7,1.3,2.2]) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(t)|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $ tq $ cross-section as a function of $|y(t)|$ at parton level per bin ([0,0.3,0.7,1.3,2.2]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(t)|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $ \bar tq $ cross-section as a function of $|y(t)|$ at parton level per bin ([0,0.3,0.7,1.3,2.2]) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(t)|}$.

Uncertainties for the normalised differential $ \bar tq $ cross-section as a function of $|y(t)|$ at parton level per bin ([0,0.3,0.7,1.3,2.2]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(t)|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Efficiency as a function of the radial vertex position for displaced vertices in the signal MC sample MH, with squark mass 700 GeV and neutralino mass 494 GeV, in events that pass the trigger and primary vertex cuts and also requiring the reconstructed vertex to have at least 4 tracks, an invariant mass > 10 GeV and radial distance from the primary vertex > 4mm, and the event to contain a reconstructed muon with pT > 45 GeV.

Efficiency as a function of the radial vertex position for displaced vertices in the signal MC sample ML, with squark mass 700 GeV and neutralino mass 108 GeV, in events that pass the trigger and primary vertex cuts.

Efficiency as a function of the radial vertex position for displaced vertices in the signal MC sample ML, with squark mass 700 GeV and neutralino mass 108 GeV, in events that pass the trigger and primary vertex cuts and also requiring the reconstructed displaced vertex to have at least 4 tracks, an invariant mass > 10 GeV and radial distance from the primary vertex > 4mm.

Efficiency as a function of the radial vertex position for displaced vertices in the signal MC sample ML, with squark mass 700 GeV and neutralino mass 108 GeV, in events that pass the trigger and primary vertex cuts and also requiring the reconstructed vertex to have at least 4 tracks, an invariant mass > 10 GeV and radial distance from the primary vertex > 4mm, and the event to contain a reconstructed muon with pT > 45 GeV.

The invariant mass of reconstructed displaced vertices in the data after the trigger and muon requirements, and the background MC estimate scaled to the integrated luminosity of the data.

The distribution of numbner of tracks in reconstructed displaced vertices in the data after the trigger and muon requirements, and the background MC estimate scaled to the integrated luminosity of the data.

The distribution of radial position of reconstructed displaced vertices in the data after the trigger and muon requirements, and the background MC estimate scaled to the integrated luminosity of the data.

Reconstructed distribution of the mass difference, DELTA(M), of the D*+- and its decay product (D0 PI+-) in different Z and PT bins.

Reconstructed distribution of the mass difference, DELTA(M), of the D*+- and its decay product (D0 PI+-) over the full Z and PT ranges.

Comparison of the reconstructed jet PT distribution with the reweighted Monte Carlo prediction.

Comparison of the reconstructed Z distribution with the reweighted Monte Carlo prediction.

The R ratios as a function of Z for D*+- jet production compared with various Monte Carlo predictions for the jet PT range 25-30 GeV.

The R ratios as a function of Z for D*+- jet production compared with various Monte Carlo predictions for the jet PT range 30-40 GeV.

The R ratios as a function of Z for D*+- jet production compared with various Monte Carlo predictions for the jet PT range 40-50 GeV.

The R ratios as a function of Z for D*+- jet production compared with various Monte Carlo predictions for the jet PT range 50-60 GeV.

The R ratios as a function of Z for D*+- jet production compared with various Monte Carlo predictions for the jet PT range 60-70 GeV.

The R ratios as a function of Z for D*+- jet production compared with various Monte Carlo predicitions for the jet PT range 25-70 GeV.

Comparisons of the D+- jet prodution rate over the PT and Z range with the POWHEG+PYTHIA predictions, showing also the c- and b- fractions.

Comparisons of the D+- jet prodution rate over the PT and Z range with the POWHEG+HERWIG predictions, showing also the c- and b- fractions.

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (fb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

The corrected per-event transverse momentum distribution of Z bosons in the centrality region 10-20%.

The corrected per-event transverse momentum distribution of Z bosons in the centrality region 20-40%.

The corrected per-event transverse momentum distribution of Z bosons in the centrality region 40-80%.

Combined results for the centrality (Npart) dependence of Z boson yields divided by Ncoll for the PT range > 0 GeV/c. The systematic error includes the uncertainty in Ncoll.

Combined results for the centrality (Npart) dependence of Z boson yields divided by Ncoll for the PT range 0 to 10 GeV/c. The systematic error includes the uncertainty in Ncoll.

Combined results for the centrality (Npart) dependence of Z boson yields divided by Ncoll for the PT range 10 to 30 GeV/c. The systematic error includes the uncertainty in Ncoll.

Combined results for the centrality (Npart) dependence of Z boson yields divided by Ncoll for the PT range > 30 GeV/c. The systematic error includes the uncertainty in Ncoll.