The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 7 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 8 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 9 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 10 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 11 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 12 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 13 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 14 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for at least 15 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $2\ell^{\mathrm{sc}}$ category for 4 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $2\ell^{\mathrm{sc}}$ category for 5 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $2\ell^{\mathrm{sc}}$ category for 6 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $2\ell^{\mathrm{sc}}$ category for 7 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $2\ell^{\mathrm{sc}}$ category for 8 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $2\ell^{\mathrm{sc}}$ category for 9 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $2\ell^{\mathrm{sc}}$ category for at least 10 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 4 jets, considering $\tilde{\chi}^{\pm}_1 \tilde{\chi}^0_1$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 5 jets, considering $\tilde{\chi}^{\pm}_1 \tilde{\chi}^0_1$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 6 jets, considering $\tilde{\chi}^{\pm}_1 \tilde{\chi}^0_1$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 7 jets, considering $\tilde{\chi}^{\pm}_1 \tilde{\chi}^0_1$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 8 jets, considering $\tilde{\chi}^{\pm}_1 \tilde{\chi}^0_1$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $2\ell^{\mathrm{sc}}$ category, considering $\tilde{\chi}^{\pm}_1 \tilde{\chi}^0_1$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 4 jets, considering $\tilde{\chi}^0_1 \tilde{\chi}^0_2$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 5 jets, considering $\tilde{\chi}^0_1 \tilde{\chi}^0_2$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 6 jets, considering $\tilde{\chi}^0_1 \tilde{\chi}^0_2$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 7 jets, considering $\tilde{\chi}^0_1 \tilde{\chi}^0_2$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 8 jets, considering $\tilde{\chi}^0_1 \tilde{\chi}^0_2$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $2\ell^{\mathrm{sc}}$ category, considering $\tilde{\chi}^0_1 \tilde{\chi}^0_2$ production.

Cut flow for the gluino $\tilde{g}\rightarrow q\bar{q}\tilde{\chi}^0_1\rightarrow q\bar{q}q\bar{q} \ell\nu$ model with $m_{\tilde{g}} = 2$ TeV and $m_{\tilde{\chi}^0_1} = 1$ TeV. The column labelled $\mathrm{N}_{\mathrm{raw}}$ shows the number of generated events, while $\mathrm{N}_{\mathrm{events}}$ shows the expected number of events with a luminosity of 139fb$^{−1}$. The last column shows the cut flow efficiency with respect to all weighted events. The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies $p_{\mathrm{T}} > 25$ GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed. Selections that have not been evaluated in the analysis or are not applicable are denoted with a dash (--).

Cut flow for the gluino $\tilde{g}\rightarrow \bar{t}\tilde{t} \rightarrow \bar{t}\bar{b}\bar{s}$ model with with $m_{\tilde{g}} = 1.6$ TeV and $m_{\tilde{t}} = 1$ TeV. The column labelled $\mathrm{N}_{\mathrm{raw}}$ shows the number of generated events, while $\mathrm{N}_{\mathrm{events}}$ shows the expected number of events with a luminosity of 139fb$^{−1}$. The last column shows the cut flow efficiency with respect to all weighted events. The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies $p_{\mathrm{T}} > 25$ GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed. Selections that have not been evaluated in the analysis or are not applicable are denoted with a dash (--).

Cut flow for the gluino $\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1 \rightarrow t\bar{t} tbs$ model with $m_{\tilde{g}} = 2.2$ TeV and $m_{\tilde{\chi}^0_1} = 1.05$ TeV. The column labelled $\mathrm{N}_{\mathrm{raw}}$ shows the number of generated events, while $\mathrm{N}_{\mathrm{events}}$ shows the expected number of events with a luminosity of 139fb$^{−1}$. The last column shows the cut flow efficiency with respect to all weighted events. The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies $p_{\mathrm{T}} > 25$ GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed. Selections that have not been evaluated in the analysis or are not applicable are denoted with a dash (--).

Cut flow for the stop model with $m_{\tilde{t}} = 1.175$ TeV and $m_{\tilde{\chi}^0_1} = 0.7$ TeV. The column labelled $\mathrm{N}_{\mathrm{raw}}$ shows the number of generated events, while $\mathrm{N}_{\mathrm{events}}$ shows the expected number of events with a luminosity of 139fb$^{−1}$. The last column shows the cut flow efficiency with respect to all weighted events. The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies $p_{\mathrm{T}} > 25$ GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed. Selections that have not been evaluated in the analysis or are not applicable are denoted with a dash (--).

Cut flow for the electroweakino production model, considering only the production of $\tilde{\chi}^{\pm}_1 \tilde{\chi}^0_1$, with $m(\tilde{\chi}^{\pm}_1,\tilde{\chi}^0_1)= 250$ GeV. The column labelled $\mathrm{N}_{\mathrm{raw}}$ shows the number of generated events, while $\mathrm{N}_{\mathrm{events}}$ shows the expected number of events with a luminosity of 139fb$^{−1}$. The last column shows the cut flow efficiency with respect to all weighted events. The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies $p_{\mathrm{T}} > 25$ GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed. In the $2\ell^{\mathrm{sc}}$ category no events are expected, as only one lepton is expected to be produced in the decay.Selections that have not been evaluated in the analysis or are not applicable are denoted with a dash (--).

Cut flow for the electroweakino production model, considering only the production of $\tilde{\chi}^0_1 \tilde{\chi}^0_2$, with $m(\tilde{\chi}^0_1,\tilde{\chi}^0_2)= 250$ GeV. The column labelled $\mathrm{N}_{\mathrm{raw}}$ shows the number of generated events, while $\mathrm{N}_{\mathrm{events}}$ shows the expected number of events with a luminosity of 139fb$^{−1}$. The last column shows the cut flow efficiency with respect to all weighted events. The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies $p_{\mathrm{T}} > 25$ GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed. Selections that have not been evaluated in the analysis or are not applicable are denoted with a dash (--).

Post-fit BDT distributions after the VBF event selection for the $\tau_{\mathrm{had}}\tau_{\mathrm{had}}$ analysis channel. The VBF signal is shown for $\mu = 0.73$ and $\tilde d = -0.01$. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given.

Post-fit $m_{\tau\tau}^{\mathrm{MMC}}$ distributions in the low BDT score CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ SF analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leptons depends on the trigger.

Post-fit $m_{\tau\tau}^{\mathrm{MMC}}$ distributions in the low BDT score CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ DF analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given.

Post-fit $m_{\tau\tau}^{\mathrm{MMC}}$ distributions in the low BDT score CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{had}}$ analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leading lepton depends on the trigger.

Post-fit $m_{\tau\tau}^{\mathrm{MMC}}$ distributions in the low BDT score CR for the $\tau_{\mathrm{had}}\tau_{\mathrm{had}}$ analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given.

Post-fit Optimal Observable distributions in the low BDT score CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ SF analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leptons depends on the trigger.

Post-fit Optimal Observable distributions in the low BDT score CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ DF analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given.

Post-fit Optimal Observable distributions in the low BDT score CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{had}}$ analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leading lepton depends on the trigger.

Post-fit Optimal Observable distributions in the low BDT score CR for the $\tau_{\mathrm{had}}\tau_{\mathrm{had}}$ analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given.

Post-fit distributions of the event yields as a function of the Optimal Observable in the SR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ SF analysis channel. The values of $\tilde d$, the signal strength $\mu$, the normalization of background processes, and nuisance parameters for the event yield prediction are set to those which minimize the NLL. The size of the combined statistical, experimental and theoretical uncertainties is given.

Post-fit distributions of the event yields as a function of the Optimal Observable in the SR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ DF analysis channel. The values of $\tilde d$, the signal strength $\mu$, the normalization of background processes, and nuisance parameters for the event yield prediction are set to those which minimize the NLL. The size of the combined statistical, experimental and theoretical uncertainties is given.

Post-fit distributions of the event yields as a function of the Optimal Observable in the SR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{had}}$ analysis channel. The values of $\tilde d$, the signal strength $\mu$, the normalization of background processes, and nuisance parameters for the event yield prediction are set to those which minimize the NLL. The size of the combined statistical, experimental and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leading lepton depends on the trigger.

Post-fit distributions of the event yields as a function of the Optimal Observable in the SR for the $\tau_{\mathrm{had}}\tau_{\mathrm{had}}$ analysis channel. The values of $\tilde d$, the signal strength $\mu$, the normalization of background processes, and nuisance parameters for the event yield prediction are set to those which minimize the NLL. The size of the combined statistical, experimental and theoretical uncertainties is given.

The observed $\Delta\mathrm{NLL}$ curves for each analysis channel as a function of $\tilde d$, compared to the combined result. For the individual analysis channel $\Delta\mathrm{NLL}$ curves, only event yield information in the other SRs is used, ensuring that the Optimal Observable distributions in the other SRs do not influence the preferred value of $\tilde d$. The signal strength is constrained to be positive in these individual channel $\Delta\mathrm{NLL}$ curves. The exact value of the $p_{\mathrm{T}}$ cut on the leading lepton depends on the trigger.

Post-fit BDT distributions in the $Z\to \ell\ell$ CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ SF analysis channel. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leptons depends on the trigger.

Post-fit Optimal Observable distributions in the $Z\to \ell\ell$ CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ SF analysis channel. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leptons depends on the trigger.