The 95% CL observed limits, expected limits and ± 1 σ and 2 σ bands for the Φ mass 125 GeV, compared to the results from the 2016-data analysis and subsequent combinations, where available. The 125 GeV mediator is assumed to be the SM Higgs boson.

The 95% CL observed limits, expected limits and ± 1 σ and 2 σ bands for the Φ mass 125 GeV, compared to the results from the 2016-data analysis and subsequent combinations, where available. The 125 GeV mediator is assumed to be the SM Higgs boson.

The 95% CL observed limits, expected limits and ± 1 σ and 2 σ bands for the Φ mass of 200 GeV, compared to the results from the 2016-data analysis and subsequent combinations, where available.

The 95% CL observed limits, expected limits and ± 1 σ and 2 σ bands for the Φ mass of 400 GeV, compared to the results from the 2016-data analysis and subsequent combinations, where available.

The 95% CL observed limits, expected limits and ± 1 σ and 2 σ bands for the Φ mass 600 GeV, compared to the results from the 2016-data analysis and subsequent combinations, where available.

The 95% CL observed limits, expected limits and ± 1 σ and 2 σ bands for the Φ mass of 600 GeV, compared to the results from the 2016-data analysis and subsequent combinations, where available.

The 95% CL observed limits, expected limits and ± 1 σ and 2 σ bands for the Φ masses of of 1000 GeV, compared to the results from the 2016-data analysis and subsequent combinations, where available.

The 95% CL observed limits, expected limits and ± 1 σ and 2 σ bands for the Φ masses of of 1000 GeV, compared to the results from the 2016-data analysis and subsequent combinations, where available.

The 95% CL observed limits, expected limits and ± 1 σ and 2 σ bands for the Φ masses of of 1000 GeV, compared to the results from the 2016-data analysis and subsequent combinations, where available.

The 95% CL observed limits, expected limits and ± 1 σ and 2 σ bands for the Φ masses of of 1000 GeV, compared to the results from the 2016-data analysis and subsequent combinations, where available.

The efficiency for simulated ttH events to pass each analysis cut.

The fractional contribution of each production mode to a given analysis region around the Higgs boson peak, defined as 105 < mJ < 140 GeV. The fraction is given with respect to the total signal yield in the analysis region in question.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{H} = 125$ GeV, $m_s = 55$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{\Phi} = 200$ GeV, $m_s = 25$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{\Phi} = 200$ GeV, $m_s = 50$ GeV.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 7 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 8 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 9 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 10 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 11 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 12 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 13 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 14 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for at least 15 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $2\ell^{\mathrm{sc}}$ category for 4 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $2\ell^{\mathrm{sc}}$ category for 5 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $2\ell^{\mathrm{sc}}$ category for 6 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $2\ell^{\mathrm{sc}}$ category for 7 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $2\ell^{\mathrm{sc}}$ category for 8 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $2\ell^{\mathrm{sc}}$ category for 9 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $2\ell^{\mathrm{sc}}$ category for at least 10 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 4 jets, considering $\tilde{\chi}^{\pm}_1 \tilde{\chi}^0_1$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 5 jets, considering $\tilde{\chi}^{\pm}_1 \tilde{\chi}^0_1$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 6 jets, considering $\tilde{\chi}^{\pm}_1 \tilde{\chi}^0_1$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 7 jets, considering $\tilde{\chi}^{\pm}_1 \tilde{\chi}^0_1$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 8 jets, considering $\tilde{\chi}^{\pm}_1 \tilde{\chi}^0_1$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $2\ell^{\mathrm{sc}}$ category, considering $\tilde{\chi}^{\pm}_1 \tilde{\chi}^0_1$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 4 jets, considering $\tilde{\chi}^0_1 \tilde{\chi}^0_2$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 5 jets, considering $\tilde{\chi}^0_1 \tilde{\chi}^0_2$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 6 jets, considering $\tilde{\chi}^0_1 \tilde{\chi}^0_2$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 7 jets, considering $\tilde{\chi}^0_1 \tilde{\chi}^0_2$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 8 jets, considering $\tilde{\chi}^0_1 \tilde{\chi}^0_2$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $2\ell^{\mathrm{sc}}$ category, considering $\tilde{\chi}^0_1 \tilde{\chi}^0_2$ production.

Cut flow for the gluino $\tilde{g}\rightarrow q\bar{q}\tilde{\chi}^0_1\rightarrow q\bar{q}q\bar{q} \ell\nu$ model with $m_{\tilde{g}} = 2$ TeV and $m_{\tilde{\chi}^0_1} = 1$ TeV. The column labelled $\mathrm{N}_{\mathrm{raw}}$ shows the number of generated events, while $\mathrm{N}_{\mathrm{events}}$ shows the expected number of events with a luminosity of 139fb$^{−1}$. The last column shows the cut flow efficiency with respect to all weighted events. The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies $p_{\mathrm{T}} > 25$ GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed. Selections that have not been evaluated in the analysis or are not applicable are denoted with a dash (--).

Cut flow for the gluino $\tilde{g}\rightarrow \bar{t}\tilde{t} \rightarrow \bar{t}\bar{b}\bar{s}$ model with with $m_{\tilde{g}} = 1.6$ TeV and $m_{\tilde{t}} = 1$ TeV. The column labelled $\mathrm{N}_{\mathrm{raw}}$ shows the number of generated events, while $\mathrm{N}_{\mathrm{events}}$ shows the expected number of events with a luminosity of 139fb$^{−1}$. The last column shows the cut flow efficiency with respect to all weighted events. The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies $p_{\mathrm{T}} > 25$ GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed. Selections that have not been evaluated in the analysis or are not applicable are denoted with a dash (--).

Cut flow for the gluino $\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1 \rightarrow t\bar{t} tbs$ model with $m_{\tilde{g}} = 2.2$ TeV and $m_{\tilde{\chi}^0_1} = 1.05$ TeV. The column labelled $\mathrm{N}_{\mathrm{raw}}$ shows the number of generated events, while $\mathrm{N}_{\mathrm{events}}$ shows the expected number of events with a luminosity of 139fb$^{−1}$. The last column shows the cut flow efficiency with respect to all weighted events. The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies $p_{\mathrm{T}} > 25$ GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed. Selections that have not been evaluated in the analysis or are not applicable are denoted with a dash (--).

Cut flow for the stop model with $m_{\tilde{t}} = 1.175$ TeV and $m_{\tilde{\chi}^0_1} = 0.7$ TeV. The column labelled $\mathrm{N}_{\mathrm{raw}}$ shows the number of generated events, while $\mathrm{N}_{\mathrm{events}}$ shows the expected number of events with a luminosity of 139fb$^{−1}$. The last column shows the cut flow efficiency with respect to all weighted events. The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies $p_{\mathrm{T}} > 25$ GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed. Selections that have not been evaluated in the analysis or are not applicable are denoted with a dash (--).

Cut flow for the electroweakino production model, considering only the production of $\tilde{\chi}^{\pm}_1 \tilde{\chi}^0_1$, with $m(\tilde{\chi}^{\pm}_1,\tilde{\chi}^0_1)= 250$ GeV. The column labelled $\mathrm{N}_{\mathrm{raw}}$ shows the number of generated events, while $\mathrm{N}_{\mathrm{events}}$ shows the expected number of events with a luminosity of 139fb$^{−1}$. The last column shows the cut flow efficiency with respect to all weighted events. The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies $p_{\mathrm{T}} > 25$ GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed. In the $2\ell^{\mathrm{sc}}$ category no events are expected, as only one lepton is expected to be produced in the decay.Selections that have not been evaluated in the analysis or are not applicable are denoted with a dash (--).

Cut flow for the electroweakino production model, considering only the production of $\tilde{\chi}^0_1 \tilde{\chi}^0_2$, with $m(\tilde{\chi}^0_1,\tilde{\chi}^0_2)= 250$ GeV. The column labelled $\mathrm{N}_{\mathrm{raw}}$ shows the number of generated events, while $\mathrm{N}_{\mathrm{events}}$ shows the expected number of events with a luminosity of 139fb$^{−1}$. The last column shows the cut flow efficiency with respect to all weighted events. The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies $p_{\mathrm{T}} > 25$ GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed. Selections that have not been evaluated in the analysis or are not applicable are denoted with a dash (--).

$E_{\text{T}}^{\text{miss}}$ distribution in SR0X for the tt0L-low analysis. The contributions from all SM backgrounds are shown after the profile likelihood simultaneous fit to all tt0L-low CRs, with the hatched bands representing the total uncertainty. The category '$t\bar{t}$ (other)' represents $t\bar{t}$ events without extra jets or events with extra light-flavour jets. 'Other' includes contributions from $t\bar{t}W$, $tZ$ and $tWZ$ processes. The expected distributions for selected signal models are shown as dashed lines. The overflow events are included in the last bin. The bottom panels show the ratio of the observed data to the total SM background prediction, with the hatched area representing the total uncertainty in the background prediction and the red arrows marking data outside the vertical-axis range.

$E_{\text{T}}^{\text{miss}}$ distribution in SRWX for the tt0L-low analysis. The contributions from all SM backgrounds are shown after the profile likelihood simultaneous fit to all tt0L-low CRs, with the hatched bands representing the total uncertainty. The category '$t\bar{t}$ (other)' represents $t\bar{t}$ events without extra jets or events with extra light-flavour jets. 'Other' includes contributions from $t\bar{t}W$, $tZ$ and $tWZ$ processes. The expected distributions for selected signal models are shown as dashed lines. The overflow events are included in the last bin. The bottom panels show the ratio of the observed data to the total SM background prediction, with the hatched area representing the total uncertainty in the background prediction and the red arrows marking data outside the vertical-axis range.

$E_{\text{T}}^{\text{miss}}$ distribution in SRTX for the tt0L-low analysis. The contributions from all SM backgrounds are shown after the profile likelihood simultaneous fit to all tt0L-low CRs, with the hatched bands representing the total uncertainty. The category '$t\bar{t}$ (other)' represents $t\bar{t}$ events without extra jets or events with extra light-flavour jets. 'Other' includes contributions from $t\bar{t}W$, $tZ$ and $tWZ$ processes. The expected distributions for selected signal models are shown as dashed lines. The overflow events are included in the last bin. The bottom panels show the ratio of the observed data to the total SM background prediction, with the hatched area representing the total uncertainty in the background prediction and the red arrows marking data outside the vertical-axis range.

Representative fit distribution in the different flavour leptons signal region for the tt2L analysis: each bin of such distribution, starting from the red arrow, corresponds to a single SR included in the fit. 'FNP' includes the contribution from fake/non-prompt lepton background arising from jets (mainly $\pi/K$, heavy-flavour hadron decays and photon conversion) misidentified as leptons, estimated in a purely data-driven way. 'Other' includes contributions from $t\bar{t}W$, $tZ$ and $tWZ$ processes. The total uncertainty in the SM expectation is represented with hatched bands and the expected distributions for selected signal models are shown as dashed lines.