$v_3\{\Psi_1\}$ vs. centrality for $\pi^+$, $\pi^-$, and protons using the event plane method in $\sqrt{s_{\textrm{NN}}}=3$ GeV Au+Au collisions at STAR.

$v_3\{\Psi_1\}$ vs. centrality for $K^+$, and $K^-$ using the event plane method in $\sqrt{s_{\textrm{NN}}}=3$ GeV Au+Au collisions at STAR.

$v_3\{\Psi_1\}$ vs. centrality for $K^+$, and $K^-$ using the event plane method in $\sqrt{s_{\textrm{NN}}}=3$ GeV Au+Au collisions at STAR.

$v_3\{\Psi_1\}$ vs. rapidity for protons in three large centrality bins from a symmetric acceptance across midrapidity in $\sqrt{s_{\textrm{NN}}}=3$ GeV Au+Au collisions at STAR. Protons exhibit an increasingly negative slope as the centrality increases.

$v_3\{\Psi_1\}$ vs. rapidity for protons in three large centrality bins from a symmetric acceptance across midrapidity in $\sqrt{s_{\textrm{NN}}}=3$ GeV Au+Au collisions at STAR. Protons exhibit an increasingly negative slope as the centrality increases.

$v_3\{\Psi_1\}$ vs. rapidity for protons in three large centrality bins from only the backward region in $\sqrt{s_{\textrm{NN}}}=3$ GeV Au+Au collisions at STAR. Note that the $p_{\mathrm{T}}$ acceptance extends to a lower limit than in Fig. 6.

$v_3\{\Psi_1\}$ vs. rapidity for protons in three large centrality bins from only the backward region in $\sqrt{s_{\textrm{NN}}}=3$ GeV Au+Au collisions at STAR. Note that the $p_{\mathrm{T}}$ acceptance extends to a lower limit than in Fig. 6.

$v_3\{\Psi_1\}$ vs. $p_{\mathrm{T}}$ for protons in three large centrality bins in $\sqrt{s_{\textrm{NN}}}=3$ GeV Au+Au collisions at STAR. $v_3\{\Psi_1\}$ becomes increasingly negative as $p_{\mathrm{T}}$ and centrality increase.

$v_3\{\Psi_1\}$ vs. $p_{\mathrm{T}}$ for protons in three large centrality bins in $\sqrt{s_{\textrm{NN}}}=3$ GeV Au+Au collisions at STAR. $v_3\{\Psi_1\}$ becomes increasingly negative as $p_{\mathrm{T}}$ and centrality increase.

Correlation matrix for the measurement of STXS parameters in each of the 28 regions considered.

Fitted values for kappa_g and kappa_y.

Correlation matrix for the measurement of kappa_g and kappa_y.

Summary of the 68% CL confidence intervals for individual measurements of SMEFT parameters observed in data. In each case, SMEFT parameters other than the one measured are fixed to 0.

Results of the EV parameter measurement in data, in the linear and linear+quadratic parameterizations of the SMEFT. All the EVs parameters are free to vary in the fits. The ranges correspond to 68% CL confidence intervals.

Observed linear correlation coefficients of the EVs parameters in the linear parameterization.

Observed linear correlation coefficients of the EVs parameters in the linear+quadratic parameterization.

Cross-sections times H->yy branching ratio for ggF +bbH, VBF, VH, ttH, and tH production. The values are obtained from a simultaneous fit to all categories. The theory uncertainties in the predictions include uncertainties due to missing higher-order terms in the perturbative QCD calculations and choices of parton distribution functions and value of alpha_s, as well as the H->yy branching ratio uncertainty.

Best-fit values and uncertainties for STXS parameters in each of the 28 regions considered. The values for the gg->H process also include the contributions from bbH production.

Correlation matrix for the measurement of STXS parameters in each of the 33 regions considered.

Measured fiducial differential cross sections for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Measured fiducial differential cross sections for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the signal region, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $W$+jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Expected distributions of the MEM discriminant $P(S|X)$ in the SR, for the s-channel single-top signal, and for the $t\bar{t}$ and $W$+jets backgrounds, for MEM discriminant values larger than $2.0\times10^{-4}$. Each distribution is normalised to unity. The binning is the same as the optimised binning used in the signal extraction fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $W$+jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 3-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 4-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty bands indicate the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR before the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore not included. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$, after subtraction of all backgrounds. The fitted distribution for the simulation of the signal is shown together with the post-fit uncertainty in the backgrounds. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Pre-fit and post-fit event yields in the SR, for MEM discriminant values larger than $2.0\times10^{-4}$. The central value of the event yield for each process is calculated by summing the values of the discriminant bin contents, using the nominal expected yield for the pre-fit value, and the best-fit estimate for the post-fit value. The error includes statistical and systematic uncertainties summed in quadrature. All sources of systematic uncertainties are included, taking into account correlations and anti-correlations in the post-fit case. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore only included in the post-fit uncertainties.

Observed impact of the different sources of uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. The 'Systematic uncertainties' category combines all sources of systematic uncertainties. The statistical uncertainty is obtained by repeating the fit after having fixed all nuisance parameters, including the $t\bar{t}$ and $W$+jets normalisation factors. 'Total' gives the total uncertainty on the measurement.

Observed impact of the different sources of $t\bar{t}$ modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and 'ME/PS matching' to the matching of the ME to the parton shower.

Observed impact of the different sources of s-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of t-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of $tW$ modelling uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and '$t\bar{t}$ overlap' to the algorithm removing the overlap between $tW$ and $t\bar{t}$ production at NLO, as described in Section 7 in the paper.

Observed impact of the different sources of PDF uncertainties on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the ${E}_{T}^{miss}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the $m_{T}^{W}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Nuisance parameters ranked according to their post-fit impacts on the best-fit value of the ratio $\mu$ of the measured cross-section to the predicted cross-section. In the figure, only the 20 nuisance parameters with the largest post-fit impacts are shown. The empty (solid) blue rectangles illustrate the pre-fit (post-fit) impact on $\mu$, corresponding to the upper axis. The pre-fit (post-fit) impact of each nuisance parameter, $\Delta\mu$, is calculated as the difference in the fitted value of $\mu$ between the nominal fit and the fit when fixing the corresponding nuisance parameter to $\hat{\theta}\pm\Delta\theta$ ($\hat{\theta}\pm\Delta\hat{\theta}$), where $\hat{\theta}$ is the best-fit value of the nuisance parameter and $\Delta\theta$ ($\Delta\hat{\theta}$) is its pre-fit (post-fit) uncertainty. Several systematic uncertainties are split into different nuisance parameters, which are indicated by NP. JES (JER) indicates jet energy scale (resolution), and $\gamma$ indicates a nuisance parameter associated to the MC statistics in one of the 18 bins numbered from 0 to 17. The black points show the best-fit values of the nuisance parameters, with the error bars representing the post-fit uncertainties. Each nuisance parameter is shown wrt. its nominal value, $\theta_0$, and in units of its pre-fit uncertainty, except the free-floating normalisation factors of the $t\bar{t}$ and $W$+jets backgrounds, and the parameters associated to the MC statistics in each bin, for which the post-fit values and uncertainties are shown.

Correlation matrix of the nuisance parameters and of the ratio $\mu$ of the measured cross-section to the predicted cross-section. The correlations are given after the fit to data. In the figure, only the parameters which have a correlation of at least 0.2 with any other parameter are shown.

Distribution of the MEM discriminant $P(S|X)$ in the SR for MEM discriminant values larger than $2.0\times10^{-4}$, for the collision data used for the measurement, and for 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Measured values of the signal cross-section and of the $t\bar{t}$ and $W$+jets normalisation factors, obtained by statistical-only fits to the collision data used for the measurement, and to 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The central values and their statistical uncertainties are obtained by repeating the fit after having fixed all nuisance parameters, except the $t\bar{t}$ and $W$+jets normalisation factors, which are let free-floating (unlike for the statistical uncertainty on the cross-section quoted in the paper). The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Event yields of the signal and SM background processes in the six analysis regions after the fit to the data under the $t \rightarrow uX$ hypothesis assuming $m_X = 30$ GeV. Total includes signal and background.The quoted uncertainties take into account correlations and constraints of the nuisance parameters and include both the statistical and systematic uncertainties. Negative correlations between the $t\bar{t} +$ light, $t\bar{t} + \geq1b$ and $t\bar{t} + \geq1c$ modelling uncertainties can make the uncertainty in the total yields smaller than in the individual components.

Event yields of the signal and SM background processes in the six analysis regions after the fit to the data under the $t \rightarrow cX$ hypothesis assuming $m_X = 30$ GeV. Total includes signal and background.The quoted uncertainties take into account correlations and constraints of the nuisance parameters and include both the statistical and systematic uncertainties. Negative correlations between the $t\bar{t} +$ light, $t\bar{t} + \geq1b$ and $t\bar{t} + \geq1c$ modelling uncertainties can make the uncertainty in the total yields smaller than in the individual components.

Event acceptance times efficiency in percent for every $t\rightarrow uX$ and $t\rightarrow cX$ mass signal sample.

Cut flow for the scalar signal in the $t\rightarrow uX$ decay combining both quark and anti-quark samples. Shown for each signal are the corresponding mass, the number of generated events, the number of reconstructed ("Reco") events, the events that pass the lepton triggers, the events that have only one electron ("el") or only one muon ("mu") with p$_{\text{T}}$ larger than 27 GeV, the number of events with at least four jets with p$_{\text{T}}$ larger than 25 GeV, the number of events with at least three $b$-tagged jets at the 70% efficiency working point, and the number of events with at least two $b$-tagged jets at the 60% efficiency working point and at least another one at the 70%. The quoted yields do not include reweighting.

Cut flow for the scalar signal in the $t\rightarrow cX$ decay combining both quark and anti-quark samples. Shown for each signal are the corresponding mass, the number of generated events, the number of reconstructed ("Reco") events, the events that pass the lepton triggers, the events that have only one electron ("el") or only one muon ("mu") with p$_{\text{T}}$ larger than 27 GeV, the number of events with at least four jets with p$_{\text{T}}$ larger than 25 GeV, the number of events with at least three $b$-tagged jets at the 70% efficiency working point, and the number of events with at least two $b$-tagged jets at the 60% efficiency working point and at least another one at the 70%. The quoted yields do not include reweighting.

Leading tau Pt distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{lep}\tau_{had}$-2j region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Leading tau Pt distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{lep}\tau_{had}$-3j region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Leading tau Pt distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{\ell}\tau_{had}\tau_{had}$SS region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Leading tau Pt distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{had}\tau_{had}$-2j region. Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Leading tau Pt distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{had}\tau_{had}$-3j region. Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Leading tau Pt distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{had}\tau_{had}$-3jSS region. Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{\ell}\tau_{had}\tau_{had}$ region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{\ell}\tau_{had}$-1j region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{\ell}\tau_{had}$-2j region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{lep}\tau_{had}$-2j region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{lep}\tau_{had}$-3j region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{\ell}\tau_{had}\tau_{had}$SS region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{had}\tau_{had}$-2j region. Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{had}\tau_{had}$-3j region. Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{had}\tau_{had}$-3jSS region. Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{\ell}\tau_{had}\tau_{had}$ region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{\ell}\tau_{had}$-1j region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{\ell}\tau_{had}$-2j region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{h}\tau_{lep}\tau_{had}$-2j region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{h}\tau_{lep}\tau_{had}$-3j region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{\ell}\tau_{had}\tau_{had}$SS region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{h}\tau_{had}\tau_{had}$-2j region, Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{h}\tau_{had}\tau_{had}$-3j region, Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{h}\tau_{had}\tau_{had}$-3jSS region, Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{\ell}\tau_{had}\tau_{had}$ region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{\ell}\tau_{had}$-1j region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{\ell}\tau_{had}$-2j region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{h}\tau_{lep}\tau_{had}$-2j region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{h}\tau_{lep}\tau_{had}$-3j region,Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{\ell}\tau_{had}\tau_{had}$SS region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{h}\tau_{had}\tau_{had}$-2j region, Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{h}\tau_{had}\tau_{had}$-3j region, Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{h}\tau_{had}\tau_{had}$-3jSS region, Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

95% CL upper limits on $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ for the individual searches as well as their combination, assuming $\mathcal{B}(\mathrm{t}\to\mathrm{uH}) = 0$. The observed limits are compared with the expected (median) limits under the background-only hypothesis. The surrounding shaded bands correspond to the 68% and 95% CL intervals around the expected limits, denoted by $\pm 1\sigma$ and $\pm 2\sigma$, respectively.

95% CL upper limits on $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ for the individual searches as well as their combination, assuming $\mathcal{B}(\mathrm{t}\to\mathrm{cH}) = 0$. The observed limits are compared with the expected (median) limits under the background-only hypothesis. The surrounding shaded bands correspond to the 68% and 95% CL intervals around the expected limits, denoted by $\pm 1\sigma$ and $\pm 2\sigma$, respectively.

Observed upper limits at 95% CL on the branching fractions in the plane of $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ and $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$.

Expected upper limits at 95% CL on the branching fractions in the plane of $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ and $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$.

Expected $+2\sigma$ upper limits at 95% CL on the branching fractions in the plane of $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ and $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$.

Expected $+1\sigma$ upper limits at 95% CL on the branching fractions in the plane of $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ and $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$.

Expected $-1\sigma$ upper limits at 95% CL on the branching fractions in the plane of $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ and $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$.

Expected $-2\sigma$ upper limits at 95% CL on the branching fractions in the plane of $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ and $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$.

Observed upper limits at 95% CL on the anomalous couplings in the plane of $C_{\mathrm{c\phi}}$ and $C_{\mathrm{u\phi}}$.

Expected upper limits at 95% CL on the anomalous couplings in the plane of $C_{\mathrm{c\phi}}$ and $C_{\mathrm{u\phi}}$.

Expected $+2\sigma$ upper limits at 95% CL on the anomalous couplings in the plane of $C_{\mathrm{c\phi}}$ and $C_{\mathrm{u\phi}}$.

Expected $+1\sigma$ upper limits at 95% CL on the anomalous couplings in the plane of $C_{\mathrm{c\phi}}$ and $C_{\mathrm{u\phi}}$.

Expected $-1\sigma$ upper limits at 95% CL on the anomalous couplings in the plane of $C_{\mathrm{c\phi}}$ and $C_{\mathrm{u\phi}}$.

Expected $-2\sigma$ upper limits at 95% CL on the anomalous couplings in the plane of $C_{\mathrm{c\phi}}$ and $C_{\mathrm{u\phi}}$.

Predicted and observed yields in each of the analysis regions considered in leptonic channel.

Predicted and observed yields in each of the analysis regions considered in hadronic channel.

Absolute uncertainties on $\mathcal{B}(\mathrm{t}\to\mathrm{qH})$ obtained from the combined fit to the data.

Summary of 95% CL upper limits on $\mathcal{B}(\mathrm{t}\to\mathrm{qH})$, significance and best-fit branching ratio in the signal regions. The values in the tables are in the form of observed(expected).

The $m_{jj}$ distributions for the CRs and the BDT classifier response distribution for the SR after the fit in all regions. The dashed line shows the total background distribution before the fit. The vertical error bars on the data points correspond to the data's statistical uncertainty. Overflows are included in the last bin. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

The $m_{jj}$ distributions for the CRs and the BDT classifier response distribution for the SR after the fit in all regions. The dashed line shows the total background distribution before the fit. The vertical error bars on the data points correspond to the data's statistical uncertainty. Overflows are included in the last bin. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

The $m_{jj}$ distributions for the CRs and the BDT classifier response distribution for the SR after the fit in all regions. The dashed line shows the total background distribution before the fit. The vertical error bars on the data points correspond to the data's statistical uncertainty. Overflows are included in the last bin. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

Observed and expected event yields for the signal and all of the background processes considered in this analysis after the fit to the data in all of the regions. The uncertainty on the expected yield is the combination of statistical and systematic uncertainties obtained in the fit. The individual uncertainties can be correlated and do not necessarily add in quadrature to equal the total background uncertainty.

Summary of the event yield for processes in all regions, after the fit over all regions. The dashed line shows the total background distribution before the fit. The vertical error bars on the data points correspond to the data's statistical uncertainty. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

Impact of different components of systematic uncertainty on the measured cross section, without taking into account the correlations. The impact is calculated by fixing the value of the corresponding nuisance parameters to the values obtained in the fit used to measure the cross section, performing the fit, estimating the signal strength uncertainty and subtracting it from the nominal uncertainty in quadrature.

Fitted POI values for this analysis, the previous ATLAS analysis, and their combination. The first and second columns present the values obtained in the individual analyses. The third column presents the values obtained in the combination.

Observed and expected one-dimensional limits on dimension 8 aQGC parameters. Limits are obtained by setting all aQGCs parameters except one to zero. Unitarity is not preserved.

Observed and expected one-dimensional limits on dimension 8 aQGC parameters in the region, where unitarity is preserved. Cutoff scales in MC, $E_{c}$, are given for each parameter. Limits are obtained by setting all aQGCs parameters except one to zero.

The $E_{T}^{\gamma}$ distribution in the SR after the fit in the control regions. The red (green) line shows the expected number of events in the case of non-zero EFT coefficient $f_{T0}/\Lambda^4$ ($f_{M0}/\Lambda^4$) with the value shown in the legend. The vertical error bars on the data points correspond to the data statistical uncertainty. Overflows are included in the last bin. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{T0}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 600$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{T5}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 600$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{T8}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 600$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{T9}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 600$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{M0}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 400$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{M1}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 400$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{M2}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 400$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Correlation matrix of the parameters for the fit in all regions. Only parameters with absolute value of the correlation coefficient larger than 10 are shown.

Observed 95% CL limits on the production cross-section for scalar up-type LQs decaying into a top quark and a neutrino or a bottom quark and an electron.

Expected 95% CL limits on the production cross-section for scalar up-type LQs decaying into a top quark and a neutrino or a bottom quark and an electron.

Observed 95% CL limits on the production cross-section for scalar down-type LQs decaying into a bottom quark and a neutrino or a top quark and a muon.

Expected 95% CL limits on the production cross-section for scalar down-type LQs decaying into a bottom quark and a neutrino or a top quark and a muon.

Observed 95% CL limits on the production cross-section for scalar down-type LQs decaying into a bottom quark and a neutrino or a top quark and an electron.

Expected 95% CL limits on the production cross-section for scalar down-type LQs decaying into a bottom quark and a neutrino or a top quark and an electron.

Observed 95% CL limits on the production cross-section for vector up-type LQs in the Yang-Mills coupling scenario decaying into a top quark and a neutrino or a bottom quark and a muon.

Expected 95% CL limits on the production cross-section for vector up-type LQs in the Yang-Mills coupling scenario decaying into a top quark and a neutrino or a bottom quark and a muon.

Observed 95% CL limits on the production cross-section for vector up-type LQs in the Yang-Mills coupling scenario decaying into a top quark and a neutrino or a bottom quark and an electron.

Expected 95% CL limits on the production cross-section for vector up-type LQs in the Yang-Mills coupling scenario decaying into a top quark and a neutrino or a bottom quark and an electron.

Observed 95% CL limits on the production cross-section for vector up-type LQs in the minimal coupling scenario decaying into a top quark and a neutrino or a bottom quark and a muon.

Expected 95% CL limits on the production cross-section for vector up-type LQs in the minimal coupling scenario decaying into a top quark and a neutrino or a bottom quark and a muon.

Observed 95% CL limits on the production cross-section for vector up-type LQs in the minimal coupling scenario decaying into a top quark and a neutrino or a bottom quark and an electron.

Expected 95% CL limits on the production cross-section for vector up-type LQs in the minimal coupling scenario decaying into a top quark and a neutrino or a bottom quark and an electron.

Product of signal acceptance and efficiency in the training region for scalar up-type LQs decaying into top quarks and neutrinos or bottom quarks and muons depending on the signal mass, $m_{LQ}$, and $\mathcal{B}(LQ_{mix}^u\rightarrow b\mu)$.

Product of signal acceptance and efficiency in the training region for scalar up-type LQs decaying into top quarks and neutrinos or bottom quarks and electrons depending on the signal mass, $m_{LQ}$, and $\mathcal{B}(LQ_{mix}^u\rightarrow be)$.

Product of signal acceptance and efficiency in the training region for scalar down-type LQs decaying into top quarks and muons or bottom quarks and neutrinos depending on the signal mass, $m_{LQ}$, and $\mathcal{B}(LQ_{mix}^d\rightarrow t\mu)$.

Product of signal acceptance and efficiency in the training region for scalar down-type LQs decaying into top quarks and electrons or bottom quarks and neutrinos depending on the signal mass, $m_{LQ}$, and $\mathcal{B}(LQ_{mix}^d\rightarrow te)$.

Product of signal acceptance and efficiency in the training region for vector LQs in the Yang-Mills coupling scenario decaying into top quarks and neutrinos or bottom quarks and muons depending on the signal mass, $m_{LQ}$, and $\mathcal{B}(vLQ_{mix}^{YM}\rightarrow b\mu)$.

Product of signal acceptance and efficiency in the training region for vector LQs in the Yang-Mills coupling scenario decaying into top quarks and neutrinos or bottom quarks and electrons depending on the signal mass, $m_{LQ}$, and $\mathcal{B}(vLQ_{mix}^{YM}\rightarrow be)$.

Product of signal acceptance and efficiency in the training region for vector LQs in the minimal coupling scenario decaying into top quarks and neutrinos or bottom quarks and muons depending on the signal mass, $m_{LQ}$, and $\mathcal{B}(vLQ_{mix}^{min}\rightarrow b\mu)$.

Product of signal acceptance and efficiency in the training region for vector LQs in the minimal coupling scenario decaying into top quarks and neutrinos or bottom quarks and electrons depending on the signal mass, $m_{LQ}$, and $\mathcal{B}(vLQ_{mix}^{min}\rightarrow be)$.

Cut-flow for the four models containing scalar LQs at a mass of $m_{LQ}=1300$ GeV and $\mathcal{B}(LQ_{mix}\rightarrow q_3\ell)=0.5$.

Cut-flow for the four models containing vector LQs at a mass of $m_{LQ}=1300$ GeV and $\mathcal{B}(LQ_{mix}\rightarrow q_3\ell)=0.5$.