Differential fiducial cross section of the Z boson $|y|$ in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the leading b-jet $|y|$ in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta \phi$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta y$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta R$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta \phi$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta y$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta R$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the invariant mass of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the Z boson $p_{\text{T}}$ in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $p_{\text{T}}$ of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the ratio between the $p_{\text{T}}$ and the invariant mass of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Predicted ratio of cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<1.37$.

Measured ratio of cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$.

Predicted ratio of cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$.

Measured ratio of cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.37$.

Predicted ratio of cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.37$.

Measured double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$.

Predicted double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$.

Measured double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<1.37$.

Predicted double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<1.37$.

Measured double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$.

Predicted double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$.

Measured double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.37$.

Predicted double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.37$.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

Measured fiducial cross section times leptonic branching ratio for W- production in the W- -> mu- nu final state.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> e+ e- final state.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> e+ nu final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> mu+ nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> e- nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> mu- nu final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> e+ e- final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Combined fiducial cross-section measurements for W+ boson production in the W+ -> l+ nu (l = e, mu) final state.

Combined fiducial cross-section measurements for W- boson production in the W- -> l- nu (l = e, mu) final state.

Combined fiducial cross-section measurements for W boson production in the W -> l nu (l = e, mu) final state.

Combined fiducial cross-section measurements for Z/gamma* production in the Z/gamma* -> l- l+ (l = e, mu) final state.

Combined total cross-section measurements for W+ boson production in the W+ -> l+ nu (l = e, mu) final state.

Combined total cross-section measurements for W- boson production in the W- -> l- nu (l = e, mu) final state.

Combined total cross-section measurements for W boson production in the W -> l nu (l = e, mu) final state.

Combined total cross-section measurements for Z/gamma* production in the Z/gamma* -> l- l+ (l = e, mu) final state.

Measured fiducial cross-section ratio R_{W+-/Z} = sigma (W+/- -> l+/- nu/nubar) / sigma (Z/gamma^* -> l+ l-) where l = e, mu.

Measured fiducial cross-section ratio R_{W+/W-} = sigma (W+ -> l+ nu) / sigma (W- -> l- nubar) where l = e, mu.

Measured charge asymmetry in W-boson production A_{l} = ( sigma (W+ -> l+ nu) - sigma (W- -> l- nubar) ) / ( sigma (W+ -> l+ nu) + sigma (W- -> l- nubar) ) where l = e, mu.

The ratio of measured W+ cross-sections in the electron and muon decay channels R_{W+} = sigma (W+ -> e+ nu) / sigma (W+ -> mu+ nu)

The ratio of measured W- cross-sections in the electron and muon decay channels R_{W-} = sigma (W- -> e- nu) / sigma (W- -> mu- nu)

The ratio of measured W cross-sections in the electron and muon decay channels R_{W} = sigma (W -> e nu) / sigma (W -> mu nu)

The ratio of measured Z/gamma^* cross-sections in the electron and muon decay channels R_{Z/gamma^*} = sigma (Z/gamma^* -> e+ e-) / sigma (Z/gamma^* -> mu+ mu-)

Correlation coefficients among (W- -> l- nubar), (W+ -> l+ nu), (Z/gamma^* -> l+ l-) where (l = e, mu) excluding the common normalisation uncertainty due to the luminosity calibration.

Correlations in the PT distribution.

Normalised fiducial cross section in bins of the Mass of the WZ.

Correlations in the Mass distribution.

Observed 90% C.L. lower limits on the mass scale, M*, of considered effective field theories as a function of mChi. For each operator, the values below the corresponding line are excluded.

Expected 95% C.L. upper limits on the cross section times branching fraction as a function of mChi. For each operator, the values above the corresponding line are excluded.

Observed 95% C.L. upper limits on the cross section times branching fraction as a function of mChi. For each operator, the values above the corresponding line are excluded.

The measured individual cross sections in the fiducial region and the combined cross sections for 4-muon and 4-electron final states at a centre-of-collision energy of 8 TeV.

The measured individual cross sections in the fiducial region and the combined cross sections for for 2-muon-2-electron final states at a centre-of-collision energy of 8 TeV.

The measured cross section for four-lepton final states at a centre-of-collision energy of 8 TeV.

The branching fraction for Z0 --> 4 LEPTON, summed over all final states, measured using both the 7 and 8 TeV datasets.

Observed and expected $E_T^{miss}$ distribution in soft dimuon signal region. The last bin includes the overflow.

Observed and expected $m_{eff}^{incl}$ distribution in hard single-lepton 3-jet signal region. The last bin includes the overflow.

Observed and expected $m_{eff}^{incl}$ distribution for hard single-lepton 5-jet signal region. The last bin includes the overflow.

Observed and expected $E_{T}^{miss}$ distribution for hard single-lepton 6-jet signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard same-flavour dilepton low-multiplicity signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard same-flavour dilepton 3-jet signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard opposite-flavour dilepton low-multiplicity signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard opposite-flavour dilepton 3-jet opposite-flavour signal region. The last bin includes the overflow.

Observed 95% exclusion contour for the mSUGRA/CMSSM model with $\tan\beta=30$, $A_{0}=-2m_{0}$ and $\mu > 0$.

Expected 95% exclusion contour for the mSUGRA/CMSSM model with $\tan\beta=30$, $A_{0}=-2m_{0}$ and $\mu > 0$.

Observed 95% exclusion contour for the bRPV MSUGRA/CMSSM model.

Expected 95% exclusion contour for the bRPV MSUGRA/CMSSM model.

Observed 95% exclusion contour for the natural gauge mediation with a stau NLSP model (nGM).

Expected 95% exclusion contour for the natural gauge mediation with a stau NLSP model (nGM).

Observed 95% exclusion contour for the non-universal higgs masses with gaugino mediation model (NUHMG).

Expected 95% exclusion contour for the non-universal higgs masses with gaugino mediation model (NUHMG).

Observed 95% exclusion contour for the minimal UED model from the combination of the hard dilepton and soft dilepton analyses.

Expected 95% exclusion contour for the minimal UED model from the combination of the hard dilepton and soft dilepton analyses.

Observed 95% exclusion contour for the minimal UED model from the hard dilepton analysis.

Expected 95% exclusion contour for the minimal UED model from the hard dilepton analysis.

Observed 95% exclusion contour for the minimal UED model from the soft dilepton analysis.

Expected 95% exclusion contour for the minimal UED model from the soft dilepton analysis.

Observed 95% exclusion contour for the simplified model with gluino-mediated top squark production where the top squark is assumed to decay exclusively via $\tilde{t} \rightarrow c \tilde{\chi}^{0}_{1}$.

Expected 95% exclusion contour for the simplified model with gluino-mediated top squark production, where the top squark is assumed to decay exclusively via $\tilde{t} \rightarrow c \tilde{\chi}^{0}_{1}$.

Observed 95% exclusion contour for the simplified model with gluino-mediated top squark production where the gluinos are assumed to decay exclusively through a virtual top squark, $\tilde{g} \rightarrow tt+\tilde{\chi}^{0}_{1}$.

Expected 95% exclusion contour for the simplified model with gluino-mediated top squark production where the gluinos are assumed to decay exclusively through a virtual top squark, $\tilde{g} \rightarrow tt+\tilde{\chi}^{0}_{1}$.

Observed 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the gluino simplified model from the hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the gluino simplified model from the hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the gluino simplified model from the soft single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the gluino simplified model from the soft single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the the first- and second-generation squark simplified model from the hard single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the the first- and second-generation squark simplified model from the hard single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the the first- and second-generation squark simplified model from the soft single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the the first- and second-generation squark simplified model from the soft single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the gluino simplified model from the hard single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the gluino simplified model from the hard single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the gluino simplified model from the soft single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the gluino simplified model from the soft single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the first- and second-generation squark simplified model from the combination of soft single-lepton and hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the first- and second-generation squark simplified model from the hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the first- and second-generation squark simplified model from the hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the first- and second-generation squark simplified model from the soft single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the first- and second-generation squark simplified model from the soft single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons from the combination of the hard dilepton and hard single-lepton analyses.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons from the combination of the hard dilepton and hard single-lepton analyses.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard single-lepton analysis.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard single-lepton analysis.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard dilepton analysis.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard dilepton analysis.

Observed 95% exclusion contour for the two-step first- and second-generation squark simplified model with sleptons from the hard dilepton analysis.

Expected 95% exclusion contour for the two-step first- and second-generation squark simplified model with sleptons from the hard dilepton analysis.

Observed 95% exclusion contour for the two-step gluino simplified model without sleptons from the hard single-lepton analysis.

Expected 95% exclusion contour for the two-step gluino simplified model without sleptons from the hard single-lepton analysis.

Number of generated events in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Production cross-section in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Number of generated events in the the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV. squark decaying to quark neutralino1 with varying x.

Production cross-section in the the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Number of generated evens in the minimal UED model.

Production cross-section in the minimal UED model in pb.

Number of generated events in the two-step first- and second-generation squark simplified model with sleptons.

Production cross-section in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for soft single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for soft single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for soft single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for soft single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for soft single-lepton 3-jet inclusive signal region in the gluino simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for the soft single-lepton 3-jet inclusive signal region in the gluino simplified model for the case in x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is varied and the LSP mass is set at 60 GeV. The chargino mass is parameterised using x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)).

Observed CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is varied and the LSP mass is set at 60 GeV. The chargino mass is parameterised using x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)).

Acceptance for soft dimuon signal region in the minimal UED model (mUED).

Efficiency for soft dimuon signal region in minimal UED model (mUED).

Acceptance for hard dilepton 3-jet opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton 3jet opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard dilepton 3-jet same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton 3-jet same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard dilepton low-multiplicity opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton low-multiplicity opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard dilepton low-multiplicity same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton low-multiplicity same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Best expected signal region in the minimal UED model (mUED).

Expected CLs from hard dilepton analysis in the two-step first- and second-generation squark simplified model with sleptons.

Observed CLs from the hard dilepton analysis in the two-step first- and second-generation squark simplified model with sleptons.

Expected CLs from the combination of the soft dimuon and hard dilepton analyses in the minimal UED model (mUED).

Observed CLs from the combination of the soft dimuon and hard dilepton analyses in the minimal UED model (mUED).

Acceptance for hard single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for hard single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for hard single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for hard single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for hard single-lepton 6-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for hard single-lepton 6-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for hard single-lepton 3-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for hard single-lepton 3-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Acceptance for hard single-lepton 5-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for hard single-lepton 5-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Acceptance for hard single-lepton 6-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for hard single-lepton 6-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% upper limit on the visible cross-section in the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% upper limit on the visible cross-section in the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% upper limit on the visible cross-section in the first- and second-generation squark simplified model with sleptons from the hard dilepton analysis.

Observed 95% upper limit on the visible cross-section in the minimal UED model (mUED) from the combination of the soft dimuon and hard dilepton analyses.

The distribution of ratio of cross sections for successive exclusive jet multiplicities n/(n-1). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of exclusive jet multiplicity, pT(jet1) > 150 GeV. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of ratio of cross sections for successive exclusive jet multiplicities, pT(jet1) > 150 GeV. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of Exclusive jet multiplicity, M(jj)>350, Dy(jj) >3.0. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of Ratio of successive exclusive jet multiplicities, M(jj)>350, Dy(jj) >3.0. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT (leading jet) [GeV]. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT (2nd jet) [GeV]. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT (3rd jet) [GeV]. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT (4th jet) [GeV]. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT(jet) Z+1jet exclusive. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT(2nd jet)/pT(leading jet)). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT(Z). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT(Z), Z+1jet, exclusive. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of |y| (leading jet). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of |y| (2nd jet). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of |y| (3rd jet). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of |y| (4th jet). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of Dy (jj). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of M(jj). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of DPhi (jj). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of DR (jj). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT(3rd jet), m(jj) > 350 GeV, Dy(jj) > 3.0. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of |y| (3rd jet), m(jj) > 350 GeV, Dy(jj) > 3.0. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of HT, the scalar pT sum of the jets and leptons. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of ST, the scalar pT sum of the jets. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.