Measured fiducial cross section in all $\ell^+\ell^-\ell'^+\ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity uncertainty, the second is the luminosity uncertainty.

Cross section extrapolated to total phase space and all Z boson decays. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity uncertainty, the second is the luminosity uncertainty.

Missing transverse momentum distribution after SR3b selection, beside the $E_\mathrm{T}^\mathrm{miss}$ requirement. The results in the signal region correspond to the last inclusive bin. The systematic uncertainties include theory uncertainties for the backgrounds with prompt SS/3L and the full systematic uncertainties for data-driven backgrounds. For illustration the distribution for a benchmark SUSY scenario ($pp\to \tilde g\tilde g$, $\tilde g\to t\bar t\tilde\chi_1^0$, $m_{\tilde g}=1.2$ TeV, $m_{\tilde\chi_1^0}=0.7$ TeV) is also shown.

Observed exclusion limits on the $\tilde g$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde g\tilde g$ pair production with exclusive $\tilde g\to qq(\tilde\ell\ell/\tilde\nu\nu)$ decays. All limits are computed at 95% CL.

Expected exclusion limits on the $\tilde g$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde g\tilde g$ pair production with exclusive $\tilde g\to qq(\tilde\ell\ell/\tilde\nu\nu)$ decays. All limits are computed at 95% CL.

Upper limits on signal cross-sections as function of the $\tilde g$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde g\tilde g$ pair production with exclusive $\tilde g\to qq(\tilde\ell\ell/\tilde\nu\nu)$ decays, obtained using the signal efficiency and acceptance specific to each model. All limits are computed at 95% CL.

Observed exclusion limits on the $\tilde g$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde g\tilde g$ pair production with exclusive $\tilde g\to qqWZ\tilde\chi_1^0$ decays. All limits are computed at 95% CL.

Expected exclusion limits on the $\tilde g$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde g\tilde g$ pair production with exclusive $\tilde g\to qqWZ\tilde\chi_1^0$ decays. All limits are computed at 95% CL.

Upper limits on signal cross-sections as function of the $\tilde g$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde g\tilde g$ pair production with exclusive $\tilde g\to qqWZ\tilde\chi_1^0$ decays, obtained using the signal efficiency and acceptance specific to each model. All limits are computed at 95% CL.

Observed exclusion limits on the $\tilde b_1$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde b_1\tilde b_1^*$ pair production with exclusive $\tilde b_1\to t\tilde\chi_1^-$ decays. All limits are computed at 95% CL.

Expected exclusion limits on the $\tilde b_1$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde b_1\tilde b_1^*$ pair production with exclusive $\tilde b_1\to t\tilde\chi_1^-$ decays. All limits are computed at 95% CL.

Upper limits on signal cross-sections as function of the $\tilde b_1$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde b_1\tilde b_1^*$ pair production with exclusive $\tilde b_1\to t\tilde\chi_1^-$ decays, obtained using the signal efficiency and acceptance specific to each model. All limits are computed at 95% CL.

Observed exclusion limits on the $\tilde g$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde g\tilde g$ pair production with exclusive $\tilde g\to t\bar t\tilde\chi_1^0$ decays. All limits are computed at 95% CL.

Expected exclusion limits on the $\tilde g$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde g\tilde g$ pair production with exclusive $\tilde g\to t\bar t\tilde\chi_1^0$ decays. All limits are computed at 95% CL.

Upper limits on signal cross-sections as function of the $\tilde g$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde g\tilde g$ pair production with exclusive $\tilde g\to t\bar t\tilde\chi_1^0$ decays, obtained using the signal efficiency and acceptance specific to each model. All limits are computed at 95% CL.

SUSY scenario with $\tilde g\tilde g$ production and $\tilde g\to q\bar q(\tilde\ell\ell/\tilde\nu\nu)$ decay: signal acceptance (in %) in the signal region SR0b3j. The benchmark scenarios used to set exclusion limits are materialized by black dot markers. Acceptance and efficiency are defined as in appendix A of [JHEP 06 (2014) 124, arXiv: 1403.4853v1 [hep-ex]].

SUSY scenario with $\tilde g\tilde g$ production and $\tilde g\to q\bar q(\tilde\ell\ell/\tilde\nu\nu)$ decay: reconstruction efficiency (in %) in the signal region SR0b3j. The benchmark scenarios used to set exclusion limits are materialized by black dot markers. Acceptance and efficiency are defined as in appendix A of [JHEP 06 (2014) 124, arXiv: 1403.4853v1 [hep-ex]].

SUSY scenario with $\tilde g\tilde g$ production and $\tilde g\to q\bar qWZ\tilde\chi_1^0$ decay: signal acceptance (in %) in the signal region SR0b5j. The benchmark scenarios used to set exclusion limits are materialized by black dot markers. Acceptance and efficiency are defined as in appendix A of [JHEP 06 (2014) 124, arXiv: 1403.4853v1 [hep-ex]].

SUSY scenario with $\tilde g\tilde g$ production and $\tilde g\to q\bar qWZ\tilde\chi_1^0$ decay: reconstruction efficiency (in %) in the signal region SR0b5j. The benchmark scenarios used to set exclusion limits are materialized by black dot markers. Acceptance and efficiency are defined as in appendix A of [JHEP 06 (2014) 124, arXiv: 1403.4853v1 [hep-ex]].

SUSY scenario with $\tilde b_1\tilde b_1^*$ production and $\tilde b_1\to tW\tilde\chi_1^0$ decay: signal acceptance (in %) in the signal region SR1b. The benchmark scenarios used to set exclusion limits are materialized by black dot markers. Acceptance and efficiency are defined as in appendix A of [JHEP 06 (2014) 124, arXiv: 1403.4853v1 [hep-ex]].

SUSY scenario with $\tilde b_1\tilde b_1^*$ production and $\tilde b_1\to tW\tilde\chi_1^0$ decay: reconstruction efficiency (in %) in the signal region SR1b. The benchmark scenarios used to set exclusion limits are materialized by black dot markers. Acceptance and efficiency are defined as in appendix A of [JHEP 06 (2014) 124, arXiv: 1403.4853v1 [hep-ex]].

SUSY scenario with $\tilde g\tilde g$ production and $\tilde g\to t\bar t\tilde\chi_1^0$ decay: signal acceptance (in %) in the signal region SR3b. The benchmark scenarios used to set exclusion limits are materialized by black dot markers. Acceptance and efficiency are defined as in appendix A of [JHEP 06 (2014) 124, arXiv: 1403.4853v1 [hep-ex]].

SUSY scenario with $\tilde g\tilde g$ production and $\tilde g\to t\bar t\tilde\chi_1^0$ decay: reconstruction efficiency (in %) in the signal region SR3b. The benchmark scenarios used to set exclusion limits are materialized by black dot markers. Acceptance and efficiency are defined as in appendix A of [JHEP 06 (2014) 124, arXiv: 1403.4853v1 [hep-ex]].

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 10j50 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

Observed 95% CL limit for the pMSSM grid.

Observed 95% CL limit for the pMSSM grid when the signal cross section is increased by one standard deviation.

Observed 95% CL limit for the pMSSM grid when the signal cross section is decreased by one standard deviation.

Expected 95% CL limit for the pMSSM grid.

+1 sigma excursion of the expected 95% CL limit for the pMSSM grid.

-1 sigma excursion of the expected 95% CL limit for the pMSSM grid.

Observed 95% CL limit for the 2Step grid.

Observed 95% CL limit for the 2Step grid when the signal cross section is increased by one standard deviation.

Observed 95% CL limit for the 2Step grid when the signal cross section is decreased by one standard deviation.

Expected 95% CL limit for the 2Step grid.

+1 sigma excursion of the expected 95% CL limit for the 2Step grid.

-1 sigma excursion of the expected 95% CL limit for the 2Step grid.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j50 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j50 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j50 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 9j50 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 9j50 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 9j50 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 10j50 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 10j50 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 10j50 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 7j80 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 7j80 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 7j80 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

Degree of multijet closure for signal and vaidation regions with at no b-jet requirement. The solid lines are the pre-fit predicted numbers of events and the points are the observed numbers. The blue hatched band shows only the statistical (MC and data) uncertainty on the background estimate. The bins labelled in bold are signal regions, while the others are validation regions. The template closure uncertainty for each SR bin is given by the maximal deviation of data from prediction in any non-SR bin to its left on this plot (although those for 80 GeV regions are independent of deviations in 50 GeV regions).

Degree of multijet closure for signal and vaidation regions with at least 1 b-jet. The solid lines are the pre-fit predicted numbers of events and the points are the observed numbers. The blue hatched band shows only the statistical (MC and data) uncertainty on the background estimate. The bins labelled in bold are signal regions, while the others are validation regions. The template closure uncertainty for each SR bin is given by the maximal deviation of data from prediction in any non-SR bin to its left on this plot (although those for 80 GeV regions are independent of deviations in 50 GeV regions).

Degree of multijet closure for signal and vaidation regions with at least 2 b-jets. The solid lines are the pre-fit predicted numbers of events and the points are the observed numbers. The blue hatched band shows only the statistical (MC and data) uncertainty on the background estimate. The bins labelled in bold are signal regions, while the others are validation regions. The template closure uncertainty for each SR bin is given by the maximal deviation of data from prediction in any non-SR bin to its left on this plot (although those for 80 GeV regions are independent of deviations in 50 GeV regions).

Summary of all 15 signal regions (post-fit).

Signal region yielding the best-expected CLs value, the best expected CLs value, and the corresponding observed CLs value for the 2Step grid.

Signal region yielding the best-expected CLs value, the best expected CLs value, and the corresponding observed CLs value for the pMSSM grid.

95% CLs observed upper limit on model cross-section for 2-step signal points for the best-expected signal region.

Performance of the 8j50-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

The distribution of the missing transverse momentum is shown in soft-lepton 2-jet W+jets control regions after normalising the ttbar and W+jets background processes in the simultaneous fit.

Expected background yields as obtained in the background-only fits in all hard-lepton and soft-lepton validation together with observed data are given. Uncertainties in the fitted background estimates combine statistical (in the simulated event yields) and systematic uncertainties.

Expected background yields as obtained in the background-only fits in all hard-lepton and soft-lepton signal together with observed data are given. Uncertainties in the fitted background estimates combine statistical (in the simulated event yields) and systematic uncertainties.

Distributions of mt for the hard-lepton 4-jet low-x signal region. The requirement on the variable plotted is removed from the definitions of the signal regions, where the arrow indicates the position of the cut in the signal region. The lower panels of the plots show the ratio of the observed data to the total background prediction as derived in the background-only fit. The uncertainty bands plotted include all statistical and systematic uncertainties as discussed in Section 7. The component `Others' is the sum of Z+jets and ttbar+V. The last bin includes the overflow.

Distributions of met/meff for the 4-jet high-x signal region. The requirement on the variable plotted is removed from the definitions of the signal regions, where the arrow indicates the position of the cut in the signal region. The lower panels of the plots show the ratio of the observed data to the total background prediction as derived in the background-only fit. The uncertainty bands plotted include all statistical and systematic uncertainties as discussed in Section 7. The component `Others' is the sum of Z+jets and ttbar+V. The last bin includes the overflow.

Distributions of mt for the hard-lepton 5-jet signal region. The requirement on the variable plotted is removed from the definitions of the signal regions, where the arrow indicates the position of the cut in the signal region. The lower panels of the plots show the ratio of the observed data to the total background prediction as derived in the background-only fit. The uncertainty bands plotted include all statistical and systematic uncertainties as discussed in Section 7. The component `Others' is the sum of Z+jets and ttbar+V. The last bin includes the overflow.

Distributions of mt for the hard-lepton 6-jet signal region. The requirement on the variable plotted is removed from the definitions of the signal regions, where the arrow indicates the position of the cut in the signal region. The lower panels of the plots show the ratio of the observed data to the total background prediction as derived in the background-only fit. The uncertainty bands plotted include all statistical and systematic uncertainties as discussed in Section 7. The component `Others' is the sum of Z+jets and ttbar+V. The last bin includes the overflow.

Distributions of met for the soft-lepton 2-jet signal region. The requirement on the variable plotted is removed from the definitions of the signal regions, where the arrow indicates the position of the cut in the signal region. The lower panels of the plots show the ratio of the observed data to the total background prediction as derived in the background-only fit. The uncertainty bands plotted include all statistical and systematic uncertainties as discussed in Section 7. The component `Others' is the sum of Z+jets and ttbar+V. The last bin includes the overflow.

Distributions of met for the soft-lepton 5-jet signal region. The requirement on the variable plotted is removed from the definitions of the signal regions, where the arrow indicates the position of the cut in the signal region. The lower panels of the plots show the ratio of the observed data to the total background prediction as derived in the background-only fit. The uncertainty bands plotted include all statistical and systematic uncertainties as discussed in Section 7. The component `Others' is the sum of Z+jets and ttbar+V. The last bin includes the overflow.

The observed combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The expected combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The yellow band ($+ 1 \sigma$) of the combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models. The yellow band represents the $\pm 1 \sigma$ variation of the median expected limit due to the experimental and theoretical uncertainties.

The yellow band ($- 1 \sigma$) of the combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models. The yellow band represents the $\pm 1 \sigma$ variation of the median expected limit due to the experimental and theoretical uncertainties.

The observed combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The expected combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The yellow band ($+ 1 \sigma$) of the combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$. The yellow band represents the $\pm 1 \sigma$ variation of the median expected limit due to the experimental and theoretical uncertainties.

The yellow band ($- 1 \sigma$) of the combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$. The yellow band represents the $\pm 1 \sigma$ variation of the median expected limit due to the experimental and theoretical uncertainties.

The observed limits for the soft-lepton 2-jet signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The expected limits for the soft-lepton 2-jet signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The observed limits for the hard-lepton 4-jet low-x signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The expected limits for the hard-lepton 4-jet low-x signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The observed limits for the hard-lepton 5-jet signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The expected limits for the hard-lepton 5-jet signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The observed limits for the hard-lepton 6-jet signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The expected limits for the hard-lepton 6-jet signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The observed limits for the soft-lepton 5-jet signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The expected limits for the soft-lepton 5-jet signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The observed limits for the hard-lepton 4-jet low-x signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The expected limits for the hard-lepton 4-jet low-x signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The observed limits for the hard-lepton 4-jet high-x signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The expected limits for the hard-lepton 4-jet high-x signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The observed limits for the hard-lepton 5-jet signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The expected limits for the hard-lepton 5-jet signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The observed limits for the hard-lepton 6-jet signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The expected limits for the hard-lepton 6-jet signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

Number of generated events in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$.

Number of generated events in the (gluino, x) plane for the chargino = 60 GeV models.

Production cross-section in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$.

Production cross-section in the (gluino, x) plane for the chargino = 60 GeV models.

Acceptance times efficiency obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 4-jet low-x).

Acceptance times efficiency in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 4-jet high-x).

Acceptance times efficiency in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 5-jet).

Acceptance times efficiency in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 6-jet).

Acceptance times efficiency in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (soft-lepton 2-jet).

Acceptance times efficiency obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 4-jet low-x).

Acceptance times efficiency in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 4-jet high-x).

Acceptance times efficiency in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 5-jet).

Acceptance times efficiency in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 6-jet).

Acceptance times efficiency in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (soft-lepton 5-jet).

The observed CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 4-jet low-x).

The observed CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 4-jet high-x).

The observed CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 5-jet).

The observed CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 6-jet).

The observed CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (soft-lepton 2-jet).

The expected CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 4-jet low-x).

The expected CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 4-jet high-x).

The expected CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 5-jet).

The expected CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 6-jet).

The expected CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (soft-lepton 2-jet).

The observed CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 4-jet low-x).

The observed CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 4-jet high-x).

The observed CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 5-jet).

The observed CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 6-jet).

The observed CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (soft-lepton 5-jet).

The expected CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 4-jet low-x).

The expected CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 4-jet high-x).

The expected CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 5-jet).

The expected CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 6-jet).

The expected CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (soft-lepton 5-jet).

The signal region yielding in the best expected limit is indicated for every signal point used in the the gluino simplified models for the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$.

The signal region yielding in the best expected limit is indicated for every signal point used in the the gluino simplified models for the (gluino, x) mass plane where for the chargino = 60 GeV and $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

Model-dependent 95% CL upper limits on the visible cross-section in addition to the observed and expected exclusion limits for the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$.

Model-dependent 95% CL upper limits on the visible cross-section in addition to the observed and expected exclusion limits for the (gluino, x) mass plane where for the chargino = 60 GeV and $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

Simulated background event samples: the corresponding generator, parton shower, cross-section normalisation, PDF set and underlying-event tune are shown.

Overview of the selection criteria for the soft-lepton signal regions. The symbol $p_{T}^{l}$ refers to signal leptons.

Overview of the selection criteria for the hard-lepton signal regions. The symbol $p_{T}^{l}$ refers to signal leptons.

Background fit results for the hard-lepton and soft-lepton signal regions, for an integrated luminosity of 3.2 fb-1. Uncertainties in the fitted background estimates combine statistical (in the simulated event yields) and systematic uncertainties. The uncertainties in this table are symmetrised for propagation purposes but truncated at zero to remain within the physical boundaries.

Breakdown of upper limits. The columns show from left to right: the name of the respective signal region; the 95% confidence level (CL) upper limits on the visible cross-section and on the number of signal events the 95% CL upper limit on the number of signal events, given the expected number (and $\pm 1 \sigma$ variations on the expectation) of background events; the two-sided CLb value, i.e. the confidence level observed for the background-only hypothesis and the one-sided discovery p-value (p(s = 0)). The discovery p-values are capped to 0.5 in the case of observing less events than the fitted background estimates.

Table shows the data, fitted background and expected signal event counts for a benchmark signal point in each bin of the mt distribution shown in figure 5 (top left). The fit results are shown for an integrated luminosity of 3.2 fb-1.

Table shows the data, fitted background and expected signal event counts for a benchmark signal point in each bin of the met/meff distribution shown in figure 5 (top right). The fit results are shown for an integrated luminosity of 3.2 fb-1.

Table shows the data, fitted background and expected signal event counts for a benchmark signal point in each bin of the mt distribution shown in figure 5 (middle left). The fit results are shown for an integrated luminosity of 3.2 fb-1.

Table shows the data, fitted background and expected signal event counts for a benchmark signal point in each bin of the mt distribution shown in figure 5 (middle right). The fit results are shown for an integrated luminosity of 3.2 fb-1.

Table shows the data, fitted background and expected signal event counts for a benchmark signal point in each bin of the met distribution shown in figure 5 (bottom left). The fit results are shown for an integrated luminosity of 3.2 fb-1.

Table shows the data, fitted background and expected signal event counts for a benchmark signal point in each bin of the met distribution shown in figure 5 (bottom right). The fit results are shown for an integrated luminosity of 3.2 fb-1.

Cutflow table for the hard-lepton signal regions with representative target signal models. The weighted numbers are normalized to 3.2 fb-1 and rounded to the statistical error.

Cutflow table for the hard-lepton signal regions with representative target signal models. The weighted numbers are normalized to 3.2 fb-1 and rounded to the statistical error.

Exclusion limits on higgsino pair production divided by the theory cross-section.The results of the low-mass analysis are used below m(higgsino) = 300 GeV, while those of the high-mass analysis are used above. The figure shows the observed and expected 95% upper limits on the higgsino pair production cross-section as a function of m(higgsino).

Observed and expected 95% limits in the m(higgsino) vs BR(higgsino to higgs+gravitino) plane. The regions above the lines are excluded by the analyses.

The observed and expected 95% upper limits on the total pair production cross section for degenerate higgsinos as a function of m(higgsino) for the high-mass search. Only the high-mass analysis results are used in this figure.

The observed and expected 95% upper limits on the total pair production cross section for degenerate higgsinos as a function of m(higgsino) for the high-mass search, divided by the theory cross section. Only the high-mass analysis results are used in this figure.

The observed and expected 95% upper limits on the total pair production cross section for degenerate higgsinos as a function of m(higgsino) for the low-mass search. Only the low-mass analysis results are used in this figure.

The observed and expected 95% upper limits on the total pair production cross section for degenerate higgsinos as a function of m(higgsino) for the low-mass search, divided by the theory cross section. Only the low-mass analysis results are used in this figure.

Particle-level acceptance for the low-mass discovery signal regions low-SR-MET0-meff440 and low-SR-MET150-meff440, shown as a function of higgsino mass. The acceptance is defined as the fraction of signal events passing the particle-level event selection that emulates the detector-level selection. The acceptance calculation considers only those signal events where both higgsinos decay to Higgs bosons that subsequently both decay to b-quarks.

The experimental efficiency of the low-mass analysis, for the two discovery signal regions low-SR-MET0-meff440 and low-SR-MET150-meff440, as a function of higgsino mass. The experimental efficiency is defined as the number of events passing the detector-level event selection divided by the number of events passing the event selection for a perfect detector. The denominator is obtained by implementing particle-level event selection that emulate the detector-level selection. Such particle-level selection is not applied on the numerator.

Particle-level acceptance for the high-mass discovery signal regions SR-4b-meff1-A-disc and SR-3b-meff3-A, shown as a function of higgsino mass. The acceptance is defined as the fraction of signal events passing the particle-level event selection that emulates the detector-level selection. The acceptance calculation considers only those signal events where both higgsinos decay to Higgs bosons that subsequently both decay to b-quarks.

The experimental efficiency of the high-mass analysis, for the two discovery signal regions SR-4b-meff1-A-disc and SR-3b-meff3-A, as a function of higgsino mass. The experimental efficiency is defined as the number of events passing the detector-level event selection divided by the number of events passing the event selection for a perfect detector. The denominator is obtained by implementing particle-level event selection that emulate the detector-level selection. Such particle-level selection is not applied on the numerator.

Example cutflow for SR-3b-meff3-A.

Example cutflow for SR-4b-meff1-A-disc.

Cutflow for low-mass analysis for each signal mass point.

The $m_{jj}$ distributions for the CRs and the BDT classifier response distribution for the SR after the fit in all regions. The dashed line shows the total background distribution before the fit. The vertical error bars on the data points correspond to the data's statistical uncertainty. Overflows are included in the last bin. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

The $m_{jj}$ distributions for the CRs and the BDT classifier response distribution for the SR after the fit in all regions. The dashed line shows the total background distribution before the fit. The vertical error bars on the data points correspond to the data's statistical uncertainty. Overflows are included in the last bin. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

The $m_{jj}$ distributions for the CRs and the BDT classifier response distribution for the SR after the fit in all regions. The dashed line shows the total background distribution before the fit. The vertical error bars on the data points correspond to the data's statistical uncertainty. Overflows are included in the last bin. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

Observed and expected event yields for the signal and all of the background processes considered in this analysis after the fit to the data in all of the regions. The uncertainty on the expected yield is the combination of statistical and systematic uncertainties obtained in the fit. The individual uncertainties can be correlated and do not necessarily add in quadrature to equal the total background uncertainty.

Summary of the event yield for processes in all regions, after the fit over all regions. The dashed line shows the total background distribution before the fit. The vertical error bars on the data points correspond to the data's statistical uncertainty. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

Impact of different components of systematic uncertainty on the measured cross section, without taking into account the correlations. The impact is calculated by fixing the value of the corresponding nuisance parameters to the values obtained in the fit used to measure the cross section, performing the fit, estimating the signal strength uncertainty and subtracting it from the nominal uncertainty in quadrature.

Fitted POI values for this analysis, the previous ATLAS analysis, and their combination. The first and second columns present the values obtained in the individual analyses. The third column presents the values obtained in the combination.

Observed and expected one-dimensional limits on dimension 8 aQGC parameters. Limits are obtained by setting all aQGCs parameters except one to zero. Unitarity is not preserved.

Observed and expected one-dimensional limits on dimension 8 aQGC parameters in the region, where unitarity is preserved. Cutoff scales in MC, $E_{c}$, are given for each parameter. Limits are obtained by setting all aQGCs parameters except one to zero.

The $E_{T}^{\gamma}$ distribution in the SR after the fit in the control regions. The red (green) line shows the expected number of events in the case of non-zero EFT coefficient $f_{T0}/\Lambda^4$ ($f_{M0}/\Lambda^4$) with the value shown in the legend. The vertical error bars on the data points correspond to the data statistical uncertainty. Overflows are included in the last bin. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{T0}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 600$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{T5}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 600$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{T8}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 600$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{T9}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 600$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{M0}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 400$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{M1}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 400$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{M2}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 400$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Correlation matrix of the parameters for the fit in all regions. Only parameters with absolute value of the correlation coefficient larger than 10 are shown.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ and photon isolation cone radius $R=0.4$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ and photon isolation cone radius $R=0.4$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ and photon isolation cone radius $R=0.4$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ and photon isolation cone radius $R=0.2$.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ and isolation cone radius $0.2$ at NNLO QCD.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ at NNLO QCD.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $|\eta^{\gamma}|<0.6$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $0.6<|\eta^{\gamma}|<0.8$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $0.8<|\eta^{\gamma}|<1.37$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $1.56<|\eta^{\gamma}|<1.81$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $1.81<|\eta^{\gamma}|<2.01$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $2.01<|\eta^{\gamma}|<2.37$.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $|\eta^{\gamma}|<0.6$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $0.6<|\eta^{\gamma}|<0.8$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $0.8<|\eta^{\gamma}|<1.37$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $1.56<|\eta^{\gamma}|<1.81$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $1.81<|\eta^{\gamma}|<2.01$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $2.01<|\eta^{\gamma}|<2.37$ at NNLO QCD.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the signal region, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $W$+jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Expected distributions of the MEM discriminant $P(S|X)$ in the SR, for the s-channel single-top signal, and for the $t\bar{t}$ and $W$+jets backgrounds, for MEM discriminant values larger than $2.0\times10^{-4}$. Each distribution is normalised to unity. The binning is the same as the optimised binning used in the signal extraction fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $W$+jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 3-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 4-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty bands indicate the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR before the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore not included. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$, after subtraction of all backgrounds. The fitted distribution for the simulation of the signal is shown together with the post-fit uncertainty in the backgrounds. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Pre-fit and post-fit event yields in the SR, for MEM discriminant values larger than $2.0\times10^{-4}$. The central value of the event yield for each process is calculated by summing the values of the discriminant bin contents, using the nominal expected yield for the pre-fit value, and the best-fit estimate for the post-fit value. The error includes statistical and systematic uncertainties summed in quadrature. All sources of systematic uncertainties are included, taking into account correlations and anti-correlations in the post-fit case. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore only included in the post-fit uncertainties.

Observed impact of the different sources of uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. The 'Systematic uncertainties' category combines all sources of systematic uncertainties. The statistical uncertainty is obtained by repeating the fit after having fixed all nuisance parameters, including the $t\bar{t}$ and $W$+jets normalisation factors. 'Total' gives the total uncertainty on the measurement.

Observed impact of the different sources of $t\bar{t}$ modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and 'ME/PS matching' to the matching of the ME to the parton shower.

Observed impact of the different sources of s-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of t-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of $tW$ modelling uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and '$t\bar{t}$ overlap' to the algorithm removing the overlap between $tW$ and $t\bar{t}$ production at NLO, as described in Section 7 in the paper.

Observed impact of the different sources of PDF uncertainties on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the ${E}_{T}^{miss}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the $m_{T}^{W}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Nuisance parameters ranked according to their post-fit impacts on the best-fit value of the ratio $\mu$ of the measured cross-section to the predicted cross-section. In the figure, only the 20 nuisance parameters with the largest post-fit impacts are shown. The empty (solid) blue rectangles illustrate the pre-fit (post-fit) impact on $\mu$, corresponding to the upper axis. The pre-fit (post-fit) impact of each nuisance parameter, $\Delta\mu$, is calculated as the difference in the fitted value of $\mu$ between the nominal fit and the fit when fixing the corresponding nuisance parameter to $\hat{\theta}\pm\Delta\theta$ ($\hat{\theta}\pm\Delta\hat{\theta}$), where $\hat{\theta}$ is the best-fit value of the nuisance parameter and $\Delta\theta$ ($\Delta\hat{\theta}$) is its pre-fit (post-fit) uncertainty. Several systematic uncertainties are split into different nuisance parameters, which are indicated by NP. JES (JER) indicates jet energy scale (resolution), and $\gamma$ indicates a nuisance parameter associated to the MC statistics in one of the 18 bins numbered from 0 to 17. The black points show the best-fit values of the nuisance parameters, with the error bars representing the post-fit uncertainties. Each nuisance parameter is shown wrt. its nominal value, $\theta_0$, and in units of its pre-fit uncertainty, except the free-floating normalisation factors of the $t\bar{t}$ and $W$+jets backgrounds, and the parameters associated to the MC statistics in each bin, for which the post-fit values and uncertainties are shown.

Correlation matrix of the nuisance parameters and of the ratio $\mu$ of the measured cross-section to the predicted cross-section. The correlations are given after the fit to data. In the figure, only the parameters which have a correlation of at least 0.2 with any other parameter are shown.

Distribution of the MEM discriminant $P(S|X)$ in the SR for MEM discriminant values larger than $2.0\times10^{-4}$, for the collision data used for the measurement, and for 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Measured values of the signal cross-section and of the $t\bar{t}$ and $W$+jets normalisation factors, obtained by statistical-only fits to the collision data used for the measurement, and to 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The central values and their statistical uncertainties are obtained by repeating the fit after having fixed all nuisance parameters, except the $t\bar{t}$ and $W$+jets normalisation factors, which are let free-floating (unlike for the statistical uncertainty on the cross-section quoted in the paper). The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the High-pT jet SR for observed data events

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the High-pT jet SR for expected signal events in the strong gluino pair pair production model with m(gluino)=1.8 TeV, m(chi0)=0.2 TeV, tau(chi0)=0.1 ns

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the Trackless jet SR for observed data events

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the Trackless jet SR for expected signal events in the electroweak pair production model

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Exclusion limits at 95% CL on the production cross section in the electroweak pair production model.

Exclusion limits at 95% CL on the production cross section in the strong gluino pair production models and m(gluino)=2.4 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Exclusion limits at 95% CL on the production cross section in the strong gluino pair production models and m($ ilde{\chi}^0_1$)=1.25 TeV

Acceptance cutflow for the High-pT SR for representative points in the strong gluino pair production model. See additional resources for more information.

Acceptance cutflow for the Trackless SR for representative points in the electroweak pair production model. See additional resources for more information.

Acceptance cutflow for the Trackless SR for representative points in the electroweak pair production model with heavy-flavor quarks final state. See additional resources for more information.

Acceptance cutflow for the High-pT SR for representative points in the electroweak pair production model with heavy-flavor quarks final state. See additional resources for more information.

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R < 1150 mm

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R [1150, 3870] mm

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R > 3870 mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R < 1150 mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R [1150, 3870] mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R > 3870 mm

Reinterpretation Material: Vertex-level Efficiency for R < 22 mm

Reinterpretation Material: Vertex-level Efficiency for R [22, 25] mm

Reinterpretation Material: Vertex-level Efficiency for R [25, 29] mm

Reinterpretation Material: Vertex-level Efficiency for R [29, 38] mm

Reinterpretation Material: Vertex-level Efficiency for R [38, 46] mm

Reinterpretation Material: Vertex-level Efficiency for R [46, 73] mm

Reinterpretation Material: Vertex-level Efficiency for R [73, 84] mm

Reinterpretation Material: Vertex-level Efficiency for R [84, 111] mm

Reinterpretation Material: Vertex-level Efficiency for R [111, 120] mm

Reinterpretation Material: Vertex-level Efficiency for R [120, 145] mm

Reinterpretation Material: Vertex-level Efficiency for R [145, 180] mm

Reinterpretation Material: Vertex-level Efficiency for R [180, 300] mm

Cutflow (acceptance x efficiency) for the High-pT SR for representative points in the strong gluino pair production model. See additional resources for more information.

Cutflow (acceptance x efficiency) for the Trackless SR for representative points in the electroweak pair production model. See additional resources for more information.

Cutflow (acceptance x efficiency) for the Trackless SR for representative points in the electroweak pair production model with heavy-flavor quarks. See additional resources for more information.

Cutflow (acceptance x efficiency) for the High-pT SR for representative points in the electroweak pair production model with heavy-flavor quarks. See additional resources for more information.